TA78L012AP

TA78L005AP_06 TOSHIBA | Alldatasheet

Document overview

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Technical content

Features

z Suitable for TTL, C2MOS power supply. z Internal short-circuit current limiting. z Internal thermal overload protection. z Maximum output current of 150 mA (Tj = 25°C). z Available in a plastic TO-92MOD package. Pin Assignment OUT 2 3 GND IN Marking side Marking Equivalent Circuit Weight: 0.36 g (Typ.) TA78L ***AP Lot No. (weekly code) A line indicates lead (Pb)-free package or lead (Pb)-free finish. Part No. (or abbreviation code)

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 2 Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit TA78L005AP TA78L006AP TA78L007AP TA78L075AP TA78L008AP TA78L009AP TA78L010AP TA78L012AP TA78L132AP TA78L015AP TA78L018AP TA78L020AP Input voltage TA78L024AP VIN V Power dissipation (Ta = 25°C) P D 800 mW Operating temperature Topr −30~85 °C Storage temperature Tstg −55~150 °C Junction temperature Tj 150 °C Thermal resistance Rth (j-a) 156 °C/W Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 3 TA78L005AP

Electrical Characteristics

(Unless otherwise specified, VIN = 10 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 4.8 5.0 5.2 V

7.0 V ≤ VIN ≤ 20 V ― 55 150

Line regulation Reg·line 1 T j = 25°C

8.0 V ≤ VIN ≤ 20 V ― 45 100

1.0 mA ≤ IOUT ≤ 100 mA ― 11 60 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 5.0 30 mV

7.0 V ≤ VIN ≤ 20 V,

1.0 mA ≤ IOUT ≤ 40 mA 4.75 ― 5.25 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 4.75 ― 5.25 V Quiescent current IB 1 Tj = 125°C ― ― 5.5 mA 8.0 V ≤ VIN ≤ 20 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 40 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 12 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

8.0 V ≤ VIN ≤ 18 V, Tj = 25°C 41 49 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.6 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 4 TA78L006AP (Unless otherwise specified, VIN = 11 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 5.76 6.0 6.24 V

8.1 V ≤ VIN ≤ 21 V ― 50 150

Line regulation Reg·line 1 T j = 25°C

9.0 V ≤ VIN ≤ 21 V ― 45 110

1.0 mA ≤ IOUT ≤ 100 mA ― 12 70 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 5.5 35 mV

8.1 V ≤ VIN ≤ 21 V,

1.0 mA ≤ IOUT ≤ 40 mA 5.7 ― 6.3 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 5.7 ― 6.3 V Quiescent current IB 1 Tj = 125°C ― ― 5.5 mA 9.0 V ≤ VIN ≤ 20 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 40 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 14 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

9.0 V ≤ VIN ≤ 19 V, Tj = 25°C 39 47 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.7 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 5 TA78L007AP (Unless otherwise specified, VIN = 12 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 6.72 7.0 7.28 V

9.2 V ≤ VIN ≤ 22 V ― 50 160

Line regulation Reg·line 1 T j = 25°C

10 V ≤ VIN ≤ 22 V ― 45 115

1.0 mA ≤ IOUT ≤ 100 mA ― 13 75 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 6.0 40 mV

9.2 V ≤ VIN ≤ 22 V,

1.0 mA ≤ IOUT ≤ 40 mA 6.65 ― 7.35 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 6.65 ― 7.35 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 10 V ≤ VIN ≤ 22 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 50 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 17 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

10 V ≤ VIN ≤ 20 V, Tj = 25°C 37 46 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.75 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 6 TA78L075AP (Unless otherwise specified, VIN = 13 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 7.21 7.5 7.79 V

9.8 V ≤ VIN ≤ 23 V ― 40 170

Line regulation Reg·line 1 T j = 25°C

10.5 V ≤ VIN ≤ 23 V ― 40 120

1.0 mA ≤ IOUT ≤ 100 mA ― 14 80 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 6.5 40 mV

9.8 V ≤ VIN ≤ 23 V,

1.0 mA ≤ IOUT ≤ 40 mA 7.125 ― 7.875 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 7.125 ― 7.875 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 10.5 V ≤ VIN ≤ 23 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 60 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 19 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

11 V ≤ VIN ≤ 21 V, Tj = 25°C 37 45 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.75 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 7 TA78L008AP (Unless otherwise specified, VIN = 14 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 7.7 8.0 8.3 V

10.5 V ≤ VIN ≤ 23 V ― 20 175

Line regulation Reg·line 1 T j = 25°C

11 V ≤ VIN ≤ 23 V ― 12 125

1.0 mA ≤ IOUT ≤ 100 mA ― 15 80 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 7.0 40 mV

10.5 V ≤ VIN ≤ 23 V,

1.0 mA ≤ IOUT ≤ 40 mA 7.6 ― 8.4 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 7.6 ― 8.4 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 11 V ≤ VIN ≤ 23 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 60 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 20 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

12 V ≤ VIN ≤ 23 V, Tj = 25°C 37 45 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.8 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 8 TA78L009AP (Unless otherwise specified, VIN = 15 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 8.64 9.0 9.36 V

11.4 V ≤ VIN ≤ 24 V ― 80 200

Line regulation Reg·line 1 T j = 25°C

12 V ≤ VIN ≤ 24 V ― 20 160

1.0 mA ≤ IOUT ≤ 100 mA ― 17 90 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 8.0 45 mV

11.4 V ≤ VIN ≤ 24 V,

1.0 mA ≤ IOUT ≤ 40 mA 8.55 ― 9.45 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 8.55 ― 9.45 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 12 V ≤ VIN ≤ 24 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 65 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 21 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

12 V ≤ VIN ≤ 24 V, Tj = 25°C 36 44 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.85 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 9 TA78L010AP (Unless otherwise specified, VIN = 16 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 9.6 10 10.4 V

12.5 V ≤ VIN ≤ 25 V ― 80 230

Line regulation Reg·line 1 T j = 25°C

13 V ≤ VIN ≤ 25 V ― 30 170

1.0 mA ≤ IOUT ≤ 100 mA ― 18 90 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 8.5 45 mV

12.5 V ≤ VIN ≤ 25 V,

1.0 mA ≤ IOUT ≤ 40 mA 9.5 ― 10.5 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 9.5 ― 10.5 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 13 V ≤ VIN ≤ 25 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 70 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 22 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

13 V ≤ VIN ≤ 24 V, Tj = 25°C 36 43 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −0.9 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 10 TA78L012AP (Unless otherwise specified, VIN = 19 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 11.5 12 12.5 V

14.5 V ≤ VIN ≤ 27 V ― 120 250

Line regulation Reg·line 1 T j = 25°C

16 V ≤ VIN ≤ 27 V ― 100 200

1.0 mA ≤ IOUT ≤ 100 mA ― 20 100 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 10 50 mV

14.5 V ≤ VIN ≤ 27 V,

1.0 mA ≤ IOUT ≤ 40 mA 11.4 ― 12.6 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 11.4 ― 12.6 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 16 V ≤ VIN ≤ 27 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 80 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 24 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

15 V ≤ VIN ≤ 25 V, Tj = 25°C 36 41 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −1.0 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 11 TA78L132AP (Unless otherwise specified, VIN = 21 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 12.67 13.2 13.73 V

16 V ≤ VIN ≤ 28 V ― 125 270

Line regulation Reg·line 1 T j = 25°C

17 V ≤ VIN ≤ 28 V ― 105 225

1.0 mA ≤ IOUT ≤ 100 mA ― 22 120 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 11 60 mV

16 V ≤ VIN ≤ 28 V,

1.0 mA ≤ IOUT ≤ 40 mA 12.54 ― 13.86 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 12.54 ― 13.86 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 17 V ≤ VIN ≤ 28 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 90 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 28 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

17 V ≤ VIN ≤ 27 V, Tj = 25°C 34 41 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −1.2 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 12 TA78L015AP (Unless otherwise specified, VIN = 23 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 14.4 15 15.6 V

17.5 V ≤ VIN ≤ 30 V ― 130 300

Line regulation Reg·line 1 T j = 25°C

20 V ≤ VIN ≤ 30 V ― 110 250

1.0 mA ≤ IOUT ≤ 100 mA ― 25 150 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 12 75 mV

17.5 V ≤ VIN ≤ 30 V,

1.0 mA ≤ IOUT ≤ 40 mA 14.25 ― 15.75 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 14.25 ― 15.75 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 20 V ≤ VIN ≤ 30 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 90 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 30 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz, 18.5 V ≤ VIN ≤ 28.5 V, Tj = 25°C 34 40 ― dB Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −1.3 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 13 TA78L018AP (Unless otherwise specified, VIN = 27 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 17.3 18 18.7 V

21.4 V ≤ VIN ≤ 33 V ― 32 325

Line regulation Reg·line 1 T j = 25°C

22 V ≤ VIN ≤ 33 V ― 27 275

1.0 mA ≤ IOUT ≤ 100 mA ― 30 170 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 15 75 mV

21.4 V ≤ VIN ≤ 33 V,

1.0 mA ≤ IOUT ≤ 40 mA 17.1 ― 18.9 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 17.1 ― 18.9 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 22 V ≤ VIN ≤ 33 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 150 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 45 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

23 V ≤ VIN ≤ 33 V, Tj = 25°C 32 38 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −1.5 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 14 TA78L020AP (Unless otherwise specified, VIN = 29 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 19.2 20 20.8 V

23.5 V ≤ VIN ≤ 35 V ― 33 330

Line regulation Reg·line 1 T j = 25°C

24 V ≤ VIN ≤ 35 V ― 28 285

1.0 mA ≤ IOUT ≤ 100 mA ― 33 180 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 17 90 mV

23.5 V ≤ VIN ≤ 35 V,

1.0 mA ≤ IOUT ≤ 40 mA 19.0 ― 21.0 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 19.0 ― 21.0 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 24 V ≤ VIN ≤ 35 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 170 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 49 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

25 V ≤ VIN ≤ 35 V, Tj = 25°C 31 37 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −1.7 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 15 TA78L024AP (Unless otherwise specified, VIN = 33 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C 23 24 25 V

27.5 V ≤ VIN ≤ 38 V ― 35 350

Line regulation Reg·line 1 T j = 25°C

28 V ≤ VIN ≤ 38 V ― 30 300

1.0 mA ≤ IOUT ≤ 100 mA ― 40 200 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 20 100 mV

27.5 V ≤ VIN ≤ 38 V,

1.0 mA ≤ IOUT ≤ 40 mA 22.8 ― 25.2 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA 22.8 ― 25.2 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA 28 V ≤ VIN ≤ 38 V ― ― 1.5 Quiescent current change ΔIB 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 200 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 56 ― mV/kh Ripple rejection R.R. 3 f = 120 Hz,

29 V ≤ VIN ≤ 39 V, Tj = 25°C 31 35 ― dB

Dropout voltage VD 1 T j = 25°C, IOUT = 150 mA ― 1.7 ― V Average temperature coefficient of output voltage T CVO 1 I OUT = 5 mA ― −2.0 ― mV/°C

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 16 Test Circuit 1/Standard Application Test Circuit 2 V NO Test Circuit 3 R.R.

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 17

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 18

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 19 Precautions for Use Destruction of the IC may occur if high voltage in excess of the IC output voltage (typ. value) is applied to the IC output terminal. In this case, connect a Zener diode between the output terminal and GND to prevent any application of excessive voltage. In particular, in a current boosting circuit such as that shown in Application Circuit Example (2), if the input voltage is suddenly applied by stages and furthermore, load is light, excessive voltage may be applied transiently to the output terminal of the IC. In such a case, it may become necessary to increase the capacity of the output capacitor as appropriate, use a smaller R1 (a resistor for bypassing IC bias current) or gradually raise the input voltage in addition to using a Zener diode as mentioned above. Application Circuits (1) Standard Application (2) A. Current Boost Voltage Regulator B. Short-Circuit Protection (3) Current Regulator

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 20 (4) Voltage Boost Regulator (5) Negative Regulator (6) Positive and Negative Regulator

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 21 Package Dimensions

TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 2006-11-02 22 RESTRICTIONS ON PRODUCT USE 20070701-EN

• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity an d vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA produc ts, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIB A products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconduct or Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.
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