STC53C SUNTSU | Alldatasheet

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Ceramic SMT 4 Pad CMOS (VC)TCXO 5.0mm x 3.2mm Call: +1-949-783-7300 | Fax: +1-949-783-7301 Specifications are subject to change without notice. www.suntsu.com Suntsu Electronics, Inc. 142 TECHNOLOGY DR., SUITE 150 IRVINE, CA 92618

  • ±1.0ppm (Frequency Stability) Available
  • CMOS
  • (VC)TCXO
  • Tape and Reel
  • Base Stations
  • IP networking
  • Cellular and Cordless Phones Features Applications Frequency Range Freq. Stability vs. Supply Voltage Storage Temperature Freq. Stability vs. Op Temp. Supply Voltage (VDD) VDD ±5% Change

1 Year

See part numbering guide for options. See part numbering guide for options. MHz ppm ppm ppm +0.3 +1.0 +85 +125 -0.3 -1.0 -1.0 -40 -55 Current (IDD) Current Voltage (VC, VCTCXO) Freq. Stability vs. Aging See part numbering guide for options. Center Voltage: VDD*50% 3.3V mA V 3.465 VDD 3.135 +1.0 Operating Temperature ±5% Changeppm +0.3-0.3 Frequency Tolerance at +25ºC I hour after Reflowppm -1.5 +1.5 Pullability (VCTCXO) Output Logic LOW Level (VOL) Output Load (CMOS) Start-Up Time VC Input Impedance (VCTCXO) See part numbering guide for options. -85 ppm V pF ms kΩ dBc/Hz ±12.0 0.2*VDD ±5.0 100 Phase Noise (Typical) 10Hz Offset Phase Noise (Typical) 100Hz Offset Phase Noise (Typical) 1KHz Offset -115 -135 -145 dBc/Hz dBc/Hz dBc/Hz Symmetry (Duty Cycle) ns 5 Linearity (VCTCXO) % 10 -150dBc/Hz Rise (TR) And Fall (TF) Time Output Logic HIGH Level (VOH) V 0.8*VDD Freq. Stability vs. Load Phase Noise (Typical) 10KHz Offset Phase Noise (Typical) 100KHz Offset STC 53 C 33 R 48 V E - 19.440M Cage Code: 4GUT4 To customize your parameters contact a Suntsu representative. SUNTSU TCXO 5.0mm x 3.2mm CMOS Part Numbering Guide COMPLIANT FREQUENCY STABILITY FREQUENCY N : ±5.0ppm O : ±2.5ppm P : ±2.0ppm Q : ±1.5ppm R : ±1.0ppm 07 : 0°C - +70°C 16 : -10°C - +60°C 17 : -10°C - +70°C 27 : -20°C - +70°C 38 : -30°C - +85°C 48 : -40°C - +85°C MHz SUPPLY VOLTAGE 25 : 2.5V±5% 27 : 2.7V±5% 30 : 3.0V±5% 33 : 3.3V±5% PULLABILITY BLANK : TCXO E : ±12.0ppm F : ±8.0ppm G : ±5.0ppm TCXO/VCTCXO BLANK : TCXO V : VCTCXO OPERATING TEMPERATURE RANGE TypicalUnitsElectrical Parameters Maximum RemarksMinimum

Ceramic SMT 4 Pad CMOS (VC)TCXO 5.0mm x 3.2mm Call: +1-949-783-7300 | Fax: +1-949-783-7301 Specifications are subject to change without notice. www.suntsu.com Suntsu Electronics, Inc. 142 TECHNOLOGY DR., SUITE 150 IRVINE, CA 92618 All dimensions are in millimeters (mm) unless otherwise noted. Drawings are not to scale. Outline Drawing & Land Pattern Test Circuit (CMOS) Typical Phase Noise Performance (Measured By Agilent E5052A) Waveform (CMOS) Frequency - 19.440MHz Frequency - 40.000MHz

Ceramic SMT 4 Pad CMOS (VC)TCXO 5.0mm x 3.2mm Call: +1-949-783-7300 | Fax: +1-949-783-7301 Specifications are subject to change without notice. www.suntsu.com Suntsu Electronics, Inc. 142 TECHNOLOGY DR., SUITE 150 IRVINE, CA 92618 Typical Jitter Performance (Measured By Agilent E5052A) Tp (Time At 260°C. 20-40 Sec) TI (Time Above 217°C. 60-150Sec) Ts (Preheat Time. 60-180Sec) T 25°C to Peak (480Sec Max) Rup (Ramp Up, 3°C/Sec Max) Rdn (Ramp Down, 6°C/Sec Max) Temperature (°C) 260 217 200 150 Time (sec) Reflow Profile Part Marking Tape And Reel Dimensions 3,000pcs/Reel Frequency - 19.440MHz Frequency - 40.000MHz All dimensions are in millimeters (mm) unless otherwise noted. Drawings are not to scale.

Ceramic SMT 4 Pad CMOS (VC)TCXO 5.0mm x 3.2mm Call: +1-949-783-7300 | Fax: +1-949-783-7301 Specifications are subject to change without notice. www.suntsu.com Suntsu Electronics, Inc. 142 TECHNOLOGY DR., SUITE 150 IRVINE, CA 92618 Mechanical Shock Vibration MIL-STD-202, Method 213, Condition B MIL-STD-883, Method 2007, Condition A MIL-STD-883, Method 1010, Condition B MIL-STD-883, Method 1014, Condition A Moisture Resistance MIL-STD-883, Method 1004MIL-STD-883, Method 1014, Condition C Resistance to Solvents MIL-STD-202, Method 215MIL-STD-883, Method 2003 Temperature Cycling Fine Leak Test Gross Leak Test Solderability Resistance to Soldering Heat MIL-STD-202, Method 210, Condition KJ-STD-020, MSL 1Moisture Sensitivity Environmental Specifications Mechanical Specifications