SDLF1CRM-016T-1HA1

80-11-80106 WESTERN | Alldatasheet

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Document Number: 80-11-80106

951 SanDisk Drive, Milpitas, CA 95035

©2015 SanDisk Corporation. All rights reserved. www.SanDisk.com Product Specification Rev 3 • October CloudSpeed Eco and Ultra Gen. II 2.5” SATA Solid State Drive, Generic

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. - 1 - Legal Disclaimer The SanDisk Corporation general policy does not recommend the use of its products in life support applications wherein a failure or malfunction of the product may directly threaten life or injury. Without limitation to the foregoing, SanDisk shall not be liable for any loss, injury, or damage caused by use of its products in any of the following applications:

• Special applications such as military related equipment, nuclear reactor control, and aerospace.
• Control devices for transportation equipment, including automotive vehicles, trains, ships, and traffic equipment.
• Safety systems for disaster prevention and crime prevention.
• Medical-related equipment (including medical measurement devices). Accordingly, in any use of SanDisk products in life support systems or other applications where failure could cause damage, injury, or loss of life, the products should only be incorporated in systems designed with appropriate redundancy, fault tolerant, or back-up features. Per SanDisk Terms and Conditions of Sale, the user of SanDisk products in life support or other such applications assumes all risk of such use and agrees to indemnify, defend, and hold harmless SanDisk Corporation and its affiliates against all damages. Security safeguards, by their nature, are capable of circumvention. SanDisk cannot, and does not, guarantee that data will not be accessed by unauthorized persons, and SanDisk disclaims any warranties to that effect to the fullest extent permitted by law. This document and related material are for informational use only and are subject to change without prior notice. SanDisk Corporation assumes no responsibility for any errors that may appear in this document or related material, nor for any damages or claims resulting from the furnishing, performance, or use of this document or related material. Absent a written agreement signed by SanDisk Corporation or its authorized representative to the contrary, SanDisk Corporation explicitly disclaims any express and implied warranties and indemnities of any kind that may, or could, be associated with this document and related material, and any user of this document or related material agrees to such disclaimer as a precondition to receipt and usage hereof. EACH USER OF THIS DOCUMENT EXPRESSLY WAIVES ALL GUARANTIES AND WARRANTIES OF ANY KIND ASSOCIATED WITH THIS DOCUMENT AND/OR RELATED MATERIALS, WHETHER EXPRESSED OR IMPLIED, INCLUDING WITHOUT LIMITATION, ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE OR INFRINGEMENT, TOGETHER WITH ANY LIABILITY OF SANDISK CORPORATION AND ITS AFFILIATES UNDER ANY CONTROL, NEGLIGENCE, STRICT LIABILITY OF SANDISK CORPORATION AND ITS AFFILIATES UNDER ANY CONTRACT, PROFIT OR OTHER INCIDENTAL, PUNITIVE, INDIRECT, SPECIAL, OR CONSEQUENTIAL DAMAGES, INCLUDING WITHOUT LIMITATION PHYSICAL INJURY OR DEATH, PROPERTY DAMAGE, LOST DATA, OR COSTS OF PROCUREMENT OF SUBSTITUTE GOODS, TECHNOLOGY, OR SERVICES. This document and its contents, including diagrams, schematics, methodology, work product, and intellectual property rights described in, associated with, or implied by this document, are the sole and exclusive property of SanDisk Corporation and its applicable subsidiaries (“SanDisk”). No intellectual property license, expressed or implied, is granted by SanDisk associated with the document recipient's receipt, access and/or use of this document; SanDisk retains all rights hereto. No work for hire, nor any form of joint ownership, is granted or implied by the document recipient's receipt, access and/or use of this document. Any work requested (or implied by the document recipient to be requested) to SanDisk associated with this document and/or its contents, shall be the sole and exclusive property of SanDisk, except to the extent, if any, expressly agreed otherwise by SanDisk in writing referencing this document. This document, and SanDisk's communications to the user associated therewith, shall be treated as SanDisk's proprietary and confidential information, protected by the recipient as such, and used by the recipient only for the purpose authorized in writing by SanDisk. This document shall be covered as SanDisk's confidential information under all applicable nondisclosure agreements between the recipient and SanDisk. No part of this document may be reproduced, transmitted, transcribed, stored in a retrievable manner, or translated into any language or computer language, in any form or by any means, electronic, mechanical, magnetic, optical, chemical, manual, or otherwise, without the prior written consent of an officer of SanDisk Corporation. All parts of the SanDisk documentation are protected by copyright law and all rights are reserved. SanDisk and the SanDisk logo are registered trademarks of SanDisk Corporation, registered in the United States and other countries. Other brand names mentioned herein are for identification purposes only and may be the trademarks of their respective holder(s). Copyright 2015 SanDisk Corporation. All rights reserved.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. - 2 - Date

Revision History

Revision Section(s) Description October 2015 3 1.4.1 Reliability August 2015 2 5.1 Added Security Disable Password (F6) as a SATA command. July 2015 1 All Preliminary release. ESD Caution – Handling Static electricity may be discharged through this disk subsystem. In extreme cases, this may temporarily interrupt the operation or damage components. To prevent this, make sure you are working in an ESD-safe environment. For example, before handling the disk subsystem, touch a grounded device, such as a computer case.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 Table of Contents Contents Pages This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -3-

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 Table of Contents Contents Pages This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -4-

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -5-

1.0 General Description

1.1 Overview

The SanDisk CloudSpeed Eco™ and Ultra™ Gen. II solid state drive (SSD) are designed specifically to address the growing need for SSDs that are optimized for read intensive and mixed workload applications in enterprise server and cloud computing environments. Leveraging SanDisk’s proprietary Guardian Technology™ platform, tier-one OEM-enterprise firmware, proven power fail technology, and the latest generation of enterprise Multi-Level Cell (eMLC) NAND flash, the CloudSpeed Gen. II SSD offers all the features expected from an enterprise-class drive at the right value. Available in capacities of 480 GBytes, 960 GBytes, and 1,920 GBytes, the CloudSpeed Eco Gen. II SSD features a 6 Gigabits (Gbits)/sec Serial Advanced Technology Attachment (SATA) interface and provides up to 525/460 megabytes (MBytes)/sec sequential read/write and up to 75,000/13,000 Input/Output Operations Per Second (IOPS) random read/write performance. Available in capacities of 400 GBytes, 800 GBytes, and 1,600 GBytes, the CloudSpeed Ultra Gen. II SSD features a 6 Gigabits (Gbits)/sec Serial Advanced Technology Attachment (SATA) interface and provides up to 525/460 megabytes (MBytes)/sec sequential read/write and up to 75,000/30,000 Input/Output Operations Per Second (IOPS) random read/write performance. The CloudSpeed Gen. II is powered by SanDisk’s proprietary Guardian Technology platform, a comprehensive suite of innovative features comprised of FlashGuard™, DataGuard™, and EverGuard™ technologies. FlashGuard extends the native endurance of Multi-Level Cell (MLC) flash-based products. It combines Aggregated Flash Management, which treats all flash elements as a single system, and Advanced Signal Processing, which dynamically adjusts flash parameters throughout the life of the SSD. Using these features, with proprietary-enhanced error-correction techniques, FlashGuard technology provides the endurance enhancements required to enable the use of MLC flash in mission-critical enterprise applications. CloudSpeed Gen. II implements data path protection using a comprehensive set of features, including:

• ECC and parity protection on internal data path memories
• CRC protection on internal SATA link data paths
• ECC on data resident in flash
• Flexible Redundant Array of Independent Memory Elements (FRAME) and block-level flash data recovery/redundancy EverGuard protects against loss of user data in the event of unexpected power interruptions using a third-generation backup power circuit design and high-reliability discrete capacitors. SanDisk has built its reputation by providing proven technology and quality products to the most demanding Fortune 100 OEMs. SanDisk engineers its products to perform at the highest degree of reliability and compatibility.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -6-

1.2 Features

• Type: 2.5” SATA SSD
• Capacities:
• CloudSpeed Eco Gen. II: 480 GBytes, 960 GBytes, and 1,920 GBytes
• CloudSpeed Ultra Gen. II: 400 GBytes, 800 GBytes, and 1,600 GBytes
• Data Rates1:
• Sequential Read\\Write2: Up to 525/460 MBytes/sec
• Random Read\\Write3: — Up to 75,000/13,000 IOPS (CloudSpeed Eco Gen. II) — Up to 75,000/30,000 IOPS (CloudSpeed Ultra Gen. II)
• Operating Temperature4: 0 °C to 70 °C (internal)
• Compliance:
• RoHS
• Halogen-free
• Warranty: 5 years 1. Max performance is possible on the largest capacity point only. 2. Based on 128 KByte transfers. 3. Based on 4 KByte transfers. Final numbers are pending evaluation. 4. As measured by internal drive thermal sensors.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -7-

1.3 Unique Features

• Drive-specific SMART Attributes
• FlashGuard Technology
• Extended Endurance of MLC Flash
• Aggregated Flash Management
• Advanced Signal Processing
• Enhanced Error Correction
• DataGuard Technology
• Protects Against Data Corruption and Loss
• FRAME Technology
• EverGuard Technology
• Data Protection in the Event of Unanticipated Power Outages
• High-reliability Backup Power Circuitry
• Superior Reliability
• Full Die Recovery
• Temperature Throttling
• Field Upgradeable Firmware (Through the SATA Interface)

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -8- Item Item

1.4 Operational Characteristics

All listed values are typical unless otherwise stated. Table 1: Performance Characteristics Eco Performance Ultra Performance Sequential Read/Write (maximum) Up to 525/460 MBytes/sec Up to 525/460 MBytes/sec Random Read/Write IOPS (maximum) Up to 75,000/13,000 IOPS Up to 75,000/30,000 IOPS Response Time < 40 seconds5 < 40 seconds5

1.4.1 Reliability

Table 2: Reliability Characteristics Eco Value Ultra Value Data Reliability <1 unrecoverable error in 1018 bits read6 Data Retention 1 year @ 55 °C, 0% P/E cycles; 3 months @ 40 °C, 100% P/E cycles7 Endurance (Random Workload) 0.6 DWPD for 5 years8 1.8 DWPD for 5 years8 Mean Time Between Failures 2.0 million hours Power Cycles 5,000 5. Response time is measured from power on to ready for media access. 6. The JEDEC 64.8 specification requires 1 in 1016 for enterprise-class SSDs. 7. Three-month data retention is based on operating and storage temperatures not to exceed 40 °C. 8. Application must manage Drive Writes Per Day (DWPD) throughout the life of the drive to ensure the five-year lifetime for specific workloads. For details about how this is calculated, please reference SanDisk White Paper WP004, The Why and How of SSD Over Provisioning.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -9- Test Environmental Conditions Table 3: Environmental Test Condition Limits Altitude Operating -1,000 feet to 15,000 feet Shipping -1,000 feet to 40,000 feet Storage -1,000 feet to 40,000 feet Temperature and Humidity Operating Temperature: 0 °C to + 70 °C (internal) Humidity: 5% to 95% non-condensing, relative humidity NOTE: Warranty coverage is voided for drives that record temperatures in excess of 70 °C. Shipping/ Storage Temperature: -40 °C to + 85 °C Humidity: 5% to 95% non-condensing, relative humidity NOTE: Non-operational exposure to temperatures in excess of 40 °C for periods exceeding three months should be avoided. The three-month EOL data retention specification requires storage temperatures do not exceed 40 °C. If necessary, contact SanDisk for further information. Vibration – Random Operating 3.22 g rms, 5–1,000 Hz, 15 minutes per axis Non-operating 14.5 g rms, 2–1,000 Hz, 15 minutes per axis Vibration –Swept Sine Operating 1.0 g peak, 5–300 Hz, 0.5 g peak, 300–500 Hz, sweep rate 0.5 Hz/sec Non-operating 3.0 g peak, 5–200 Hz, 0.4 decades/min Shock Operating and Non-Operating 1000 g @ 1.0 msec, one shock along each axis (x, y, and z) in each direction total of 2 per axis (+/-x, y, and z)

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -10-

2.0 Product Description

The CloudSpeed Gen. II includes a NAND flash controller that provides a 6 Gbits/sec SATA interface to the host. Parallel access to multiple flash sites allows overlapped, multi-block access to rapidly complete data transfer requests. The controller continuously monitors drive temperature by polling an on-board thermal sensor, enabling notification to the host via a SMART trip in the event of an over-temperature condition. The backup power circuitry feature provides a holdup capacitor array to ensure data integrity during power fail scenarios.

2.1 Functional Block Diagram

Figure 1: CloudSpeed Gen. II Block Diagram

2.2 Flash Management

The CloudSpeed Gen. II supports the following techniques for enhanced flash management:

• Static Wear Leveling: This feature eliminates overstressing flash media by spreading the data writes across all flash physical address space, including logical areas that are not written by the user.
• ECC: The CloudSpeed Gen. II utilizes advanced two-level BCH code and a FRAME data recovery algorithm. The drive activates this second tier of error correction if the ECC engine is unable to correct the data located in failed NAND pages.
• Bad-block Management: This feature tracks all manufacturing and run-time bad blocks of flash media and replaces them with new ones from the spare pool.
• Data Retention Management: As flash is used over the life of the drive, data retention capability declines. The CloudSpeed Gen. II incorporates multiple data-retention management techniques to ensure the highest data reliability and integrity, even toward the end of drive life.
• Minimal Write Amplification: Write amplification is defined as the ratio of total data written to the flash compared to the total data written by the host. This ratio varies continually as a function of workload. CloudSpeed Gen. II controllers utilize write optimization, effective wear leveling, intelligent bad-block management, and efficient recycling to deliver an unprecedented, low write amplification factor. This translates directly to higher and more stable performance over a longer life.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -11- Drive Capacity

2.3 Endurance

The CloudSpeed Gen. II provides the innovative FlashGuard technology feature to extract higher endurance from MLC flash. FlashGuard incorporates two important technology breakthroughs in the area of flash and SSD system management:

• Aggregated Flash Management
• Advanced Signal Processing

2.3.1 Aggregated Flash Management

SanDisk’s Aggregated Flash Management technology prolongs the life of SSDs by treating all flash elements in the SSD as a system instead of as a collection of discrete elements. Aggregating the management of the flash over multiple pages within a block and over multiple blocks within the SSD reduces the limitations imposed at the page and block levels, thus extending the life of the drive. FlashGuard treats each flash cell individually, thereby maximizing the effects of stronger flash elements (i.e., those that exhibit higher performance capability) while minimizing the effects of weaker elements. The capability of FlashGuard to distinguish between and take advantage of flash elements at the cellular level extends the endurance of the drive.

2.3.2 Advanced Signal Processing

The controller’s Advanced Signal Processing technology periodically monitors the flash and collects detailed performance statistics. This information is used to dynamically adjust the flash operating parameters for maximum endurance from the drive throughout its operational life. To further extend the life of the drive, FlashGuard incorporates a proprietary enhanced error correction technology that corrects more data errors than is possible with standard schemes.

2.4 Temperature Throttling

The CloudSpeed Gen. II supports temperature throttling to guarantee the life of the drive. With this feature, the drive throttles the drive performance based on a pre-configured temperature level of 65 °C, which is measured by the drive thermal sensor. When the critical temperature (65 °C) is reached, the drive throttles write performance and increments the Lifetime Thermal Throttle Activations SMART attribute (ID 244) counter. Performance remains throttled until the temperature falls to 63°C or below.

2.5 Mean Time Between Failures (MTBF)

The MTBF statistic for the CloudSpeed Gen. II is calculated based on the MIL-HDBK-217 standard MTBF Values. Table 4: MTBF Hours MTBF (Hours) All >2,000,000 NOTE: The throttling level varies depending on the current workload.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -12- Category

2.6 Regulatory Standards Compliance

Table 5: Regulatory Agency Approvals Country/ Region Compliance/Agency Standard Additional Information Safety USA UL UL 60950-1, Second Edition – – – Canada CSA CSA C22.2 No. 60950-1-07, Second Edition – – – Korea EMI KN22, KN24, CFR47 – – – Taiwan EMI CNS 13438 – – – SATA – – – SATA-IO SATA Revision 1.4 Interoperability Testing – – – RoHS European Union EU Directive 2011/65/EU EMC USA FCC FCC Part 15 Class B FCC Declaration of Conformity Canada Industry Canada ICES-0030 Class B IO Declaration of Conformity European Union EU Directive 2004/108/EC (EMC) EN 55022-2010 Class B CE Declaration of Conformity Korea KCC KN22:2009 Class B KN24:2009 KCC Certificate Taiwan BSMI CNS13438 (2006) BSMI Declaration of Conformity Australia ACMA AS/NZS CISPR22-2006, Class B C-Tick Declaration of Conformity

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -13- Parameter Parameter

3.0 Mechanical Specifications

3.1 Physical Specifications

Table 6: Physical Characteristics Value Height (Mounted) 7.17 mm (Maximum) Width 69.85 mm (Nominal) Length 100.20 mm (Nominal) Weight 63.00 g (Maximum)

3.2 Drive Mounting

Table 7: Measurements of Screws and Torque Value Screw Thread Type M3 x 0.5 metric Maximum Applied Torque 4.0 lbf-inch

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -14- Figure 2: CloudSpeed Gen. II Drive Dimensions (in mm) NOTE: The warranty is voided if the label is removed.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -15- Pin

4.0 Electrical Specifications

4.1 Electrical Interface

The CloudSpeed Gen. II includes a SATA 6 Gbits/sec interface (SATA 3 Gbits/sec and SATA 1.5 Gbits/sec compatible) that complies with SATA standard version 3.2.

4.1.1 CloudSpeed Interface Connector and Pinout Descriptions

The SATA connector on the CloudSpeed Gen. II includes a signal bay (S1 to S7) and a power bay (P1 to P15). The SATA connector can support both cabled and backplane plug-in connections. The connector complies with the Telcordia GR-78 standard (NEBS), meeting the minimum requirement of 30 μinches of gold over a nickel base of 50 μinches. Figure 3: SATA connector for CloudSpeed Gen. II Table 8: Signal Pinout Description Signal Name In/Out Signal Description S1 GND N/A 2nd mate S2 Dev Rx+ In Receive differential pair signal in + S3 Dev Rx- In Receive differential pair signal in - S4 GND N/A 2nd mate S5 Dev Tx- Out Transmit differential signal out - S6 Dev Tx+ Out Transmit differential signal out + S7 GND N/A 2nd mate Table 9: Power Pinout Descriptions Pin Signal Name In/Out Signal Description P1 V3.3 N/A 3.3 V power (not used) P2 V3.3 N/A 3.3 V power (not used) P3 V3.3 N/A 3.3 V power (not used) P4 GND In 1st mate P5 GND In 2nd mate P6 GND In 2nd mate P7 V5 In 5 V power, pre-charged, 2nd mate P8 V5 In 5 V power P9 V5 In 5 V power P10 GND In 2nd mate P11 Reserved In/Out Activity indicator

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -16- Symbol Symbol Table 9: Power Pinout Descriptions (Continued) Pin Signal Name In/Out Signal Description P12 GND In 1st mate P13 V12 N/A 12 V power (not used) P14 V12 N/A 12 V power (not used) P15 V12 N/A 12 V power (not used)

4.2 Remote LED

In compliance with the SATA standard, pin P11 on the SATA 15-pin power connector supports a remote LED. Because the signal is not suitable for directly driving an LED, a circuit external to the device must first buffer the signal. When connected, the remote LED indicates activity. Refer to the SATA standard for more details.

4.3 Thermal Sensor

The CloudSpeed Gen. II contains a thermal sensor on the printed circuit board. The drive polls the sensor for temperature information every 60 seconds, and the drive stores the highest and lowest readings in the drive logs. This temperature represents the temperature of the NAND, not the drive case.

4.4 Power

4.4.1 DC Noise and Ripple

Noise is a random fluctuation in an electrical signal. Ripple is the small unwanted residual periodic variation of the direct current (DC) output of a power supply that has been derived from an alternating current (AC) source. This ripple is due to the incomplete suppression of the alternating waveform within the power supply. Table 10: Noise and Ripple Summary Parameter Ratings Unit VNOISE 5 V noise and ripple (0 Hz to 80 MHz) 100 mVp-p

4.4.2 DC Input Voltage

Table 11: DC Input Voltage Summary Parmeter Ratings Unit VIN 5 V Supply Voltage ‐5% / +10% V

4.4.3 Hot Plug

The CloudSpeed Gen. II supports a hot plug feature. Maximum average inrush current when drive is hot-plugged is less than 900 mA, using a 200 μsec sampling window. NOTE: INOISE + IRIPPLE < = 100 mA

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -17- Parameter Symbol

4.4.4 Power Consumption

Power is measured under the following conditions: VIN = 5.0 V and TAMB = 25 °C. Power measurements were taken on the highest capacity drive. Lower capacities will have lower drive power Table 12: Power Consumption Description Current (A) Typical12 Current (A) Maximum13 Power (W) Typical Power (W) Maximum Idle Transient (Peak)9 0.50 0.55 ––– ––– Average10 0.31 0.32 1.55 1.60 Startup11 Transient (Peak) 0.80 0.90 ––– ––– Average 0.37 0.42 1.85 2.10 Sequential Read Transient (Peak) 0.65 0.71 ––– ––– Average 0.57 0.60 2.85 2.95 Sequential Write Transient (Peak) 1.36 1.48 ––– ––– Average 0.80 0.85 4.00 4.10

4.4.5 Absolute Maximum Ratings

Exposure to conditions beyond limits listed in the following table may result in damage to the product. Table 13: Absolute Maximum Ratings Parameter Ratings (Max) Unit VMAX High 5 V Supply Voltage 5.7 V VMIN Low 5 V Supply Voltage -0.3 V TSTG_L Low Storage Temperature -40 °C TSTG_H High Storage Temperature 85 °C TOP High Internal Operating Temperature 70 °C 9. Transient power (peak) is mean power over any 200 μsec sampling window. 10. Average power is mean power over any 5 second sampling window. 11. Startup is measured from power on to ready for media access. 12. Typical is population mean. 13. Maximum values represent mean of population + 3 sigma.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -18-

5.0 Software Specifications

5.1 Enterprise SATA Implementation

SSD firmware implements all features required of enterprise drives. Table 14: Supported ATA Commands Command Name Op Code (Hex) Command Set (Category) Check Power Mode* E5 Power Management Data Set Management 06 General Download Microcode 92 General Execute Drive Diagnostic 90 General Flush Cache E7 General Flush Cache Extended (See Set Features Subcommands on page 20.) EA 48 Bit Address Identify Device EC General Idle* E3 Power Management Idle Immediate* E1 Power Management NOP 00 General Read Buffer PIO E4 General Read DMA C8 General Read DMA Extended 25 48 Bit Address Read DMA w/o Retries C9 General Read FPDMAQ 60 NCQ Read Log 2F GPL Read Log DMA Extension 47 48 Bit Address Read Long w/o Retries 23 General Read Multiple – PIO Multiple Read/Write C4 General Read Multiple Ext – PIO Multiple Read/ Write 29 48 Bit Address Read Native Max Address F8 HPA Read Native Max Address Extended 27 48 Bit Address Read Sectors – PIO 20 General Read Sectors Extended – PIO 24 48 Bit Address Read Sectors – PIO 21 General Read Verify Sectors 40 General Read Verify Sectors Extended – PIO 42 48 Bit Address Recalibrate 10 General Sanitize Device B4 General Security Erase Prepare F3 Security Security Erase Unit F4 Security Security Freeze Lock F5 Security Security Disable Password F6 Security Security Set Password F1 Security Security Unlock F2 Security Seek 70 General Send FPDMA Queued 65 NCQ

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -19- Table 14: Supported ATA Commands(Continued) Command Name Op Code (Hex) Command Set (Category) Set Features (See Set Features Subcommands on page 20.) EF General Set Max Address F9 HPA Set Max Address Extended 39 48 Bit Address Set Multiple Count - PIO Multiple Read/ Write C6 General Sleep* E6 Power Management SMART Operations B0 SMART Standby* E2 Power Management Standby Immediate* E0 Power Management Write Buffer DMA E8 General Write DMA CA General Write DMA Extended 35 48 Bit Address Write DMA w/o Retries CB General Write FPDMAQ 61 NCQ Write Log 3F GPL Write Log DMA Extended 57 48 Bit Address Write Long 32 General Write Long w/o Retries 33 General Write Multiple PIO Multiple Read/Write C5 General Write Multiple Extended - PIO Multiple Read/Write 39 48 Bit Address Write Sectors 30 General Write Sectors w/o Retries 31 General Write Sectors Extended - PIO 34 48 Bit Address Write Uncorrectable Extended 45 General * The SSD accepts these commands and returns a good status, but does not execute the commands.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -20- Word(s)

Features

5.2 Device Identification Information

Table 15: Identify Device Information Data Description 0 5A0Ch General configuration; bit-significant information 59 0xF500 Sanitize Information 76 0x950E Serial ATA capabilities 77 0x0066 Reserved for future Serial ATA capabilities 81 0x0039 Minor version number 85 0x7069 Command set/feature supported 106 0x6003 Physical/Logical sector size 119 0x405C Commands and feature sets supported 120 0x401C Commands and feature sets supported 206 0x003D SCT command transport 209 0x4000 Alignment of logical blocks within a larger physical block 255 0x04A5 Integrity Word

5.3 Set Features Subcommands

Table 16: Set Features Subcommands Decimal Description 02 2 Enable Write Cache 10 16 Enable Use of Serial ATA Features 55 85 Disable Read Look Ahead 82 130 Disable Write Cache 90 144 Disable Use of Serial ATA Features AA 170 Enable Read Look Ahead

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -21-

5.4 Supported SMART Operations

Self-Monitoring Analysis and Reporting Technology (SMART) attributes provide diagnostic information regarding drive operation. SMART alerts the host to potential drive problems, allowing system operators to assess the situation and back up data prior to an operational failure. With SMART, the CloudSpeed Gen. II continually monitors a number of key internal operating parameters to identify performance changes that could be a sign of impending drive failure. When the drive detects such a condition, the drive alerts the host system of a reduction in reliability or performance. Table 17: Supported SMART Attributes Attr ID (Decimal) Threshold (Decimal) Name Values Indicates: N/A Lifetime Reallocated Erase Block Count The total number of erase blocks added to the defect list after manufacturing. Normalized Value: Set to 64h Worst: Set to 64h Raw Data: Range between 0 and 0xFFFFFFFF N/A Lifetime Power on Hours (POH) 1-100 (Normalized) The total number of hours the drive has had power applied to it since the date of manufacture (DOM). The value is updated hourly. The attribute tracks the number of seconds since the last hour update. Normalized Value: Range is 100d - 1. For every tenth of a year, this field will decrement by one. Worst: Same as normalized value Raw Data: [5:8]: Number of hours since manufacture [9:11]: Number of seconds since the last whole hour Lifetime UECC Count It is from the variable recovery_fail_count, which is a count of pages that saw a recover failure. The counter increases if the drive sees a read error that is unrecoverable with FRAME, for example, the data was lost. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Range between 0 and 0xFFFFFFFF N/A Lifetime Write Amplification Factor Write amplification is supported as a rate which means data needs to be flowing for the value to be displayed. The variables flash_lp_writes and host_lp_writes maintained by FTL are used to create a lifetime write amplification factor. Normalized Value: Set to a fixed value of 64h Worst: Set to 64h Raw Data: The value should be around C8h, but is expected to be less than 1F4h N/A Trailing Hour Write Amplification Factor The trailing hour write amplification is updated once an hour using the variables flash_lp_writes and host_lp_writes maintained by FTL. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: The value should be around C8h, but is expected to be less than 1F4h 170 N/A Reserve Erase Block Count This is the number of reserved erase blocks remaining. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: The value ranges from 26,956 to 0 for 1,920 GBytes, 12,478 to 0 for 960 GBytes, and 6,739 to 0 for 480 GBytes.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -22- Table 17: Supported SMART Attributes (Continued) Attr ID (Decimal) Threshold (Decimal) Name Values Indicates: 175 N/A Lifetime Die Failure Count Die failures are not tracked and they are not recognized. The drive sees a die failure as a number of block failures. This is supported in the sense that field exists in the SMART read data, but the raw data bytes are set to a fixed value of zero. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Set to a fixed value of zero 183 N/A Lifetime Link Rate Downgrade Count At power-up, the drive detects the SATA link rate. If, after a COMRESET, the link rate drops the counter is incremented by one. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Set to a fixed value of lifetime_sata_link_downgrades. Value will start at zero and count up. 191 N/A Clean Lifetime Shutdown Count on Power Loss There can only be clean power downs. FTL maintains a count of power downs. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Starts at zero (or a low value) and increases by one for each power down 192 N/A Unclean Lifetime Shutdown Count on Power Loss 0-100 (Normalized) There are no unclean power downs. This is set to zero. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Usage: Fixed value of zero 194 Current Temperature, Lifetime Maximum Temperature Temperature is tracked and the maximum temperature is maintained. The threshold is 70 °C Normalize Value: 100 – (temperature) Worst: 100 (highest temperature) Raw Data: [5:6]: Current temperature (°C) [7]: Lowest temperature recorded over the lifetime of the drive (°C) [8]: Highest temperature recorded over the lifetime of the drive (°C) 196 N/A Lifetime Retired Block Count This is the total number of erase blocks added to the defect list after manufacturing. Normalized Value: Set to 64h Worst: Set to 64h Raw Data: Range between 0 and 0xFFFFFFFF 211 N/A Lifetime Read Disturb Reallocation Events This is supported using FTL variable read_disturb_recycled_sbs_nv. Normalize Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Range between 0 and 0xFFFFFFFF. This starts at zero and increases. 233 N/A Lifetime NAND Writes The number of lifetime NAND writes since the date of manufacture. The count increments in units of 64 GBytes. Normalize Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Set to a value of zero 235 N/A Capacitor Health The drive is not able to measure capacitor health. This value is fixed at zero. Normalize Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Set to a value of zero

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -23- Table 17: Supported SMART Attributes (Continued) Attr ID (Decimal) Threshold (Decimal) Name Values Indicates: 241 N/A Lifetime User Writes The total number of data bytes written to the drive since date of manufacture. The count increments in units of 64 GBytes. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Range between 0 and 0xFFFFFFF 242 N/A Lifetime User Reads The total number of data bytes read from the drive since date of manufacture. The count increments in units of 64 GBytes. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Range between 0 and 0xFFFFFFF 244 N/A Lifetime Thermal Throttle Activations The variable increases each time thermal throttling is activated. Normalized Value: Set to a fixed value of 64h Worst: Set to a fixed value of 64h Raw Data: Range between 0 and 0xFFFFFFF 245 Percentage of Drive Life Remaining The percentage of drive life remaining. Normalized Value: Data range is 100 to 0 Worst: 100-0 Raw Data: Data is 100-0 (percent completely used) 253 SPI Tests Remaining Header sections of SPI firmware areas are read and checksum computed. If the checksum is not correct, the SPI is corrupt and a SMART trip will occur. Normalized Value: 100 or 0 Worst: 100 or 0 Raw Data: Normal value is 0. A non-zero value indicates and error condition.

CloudSpeed Eco and Ultra Gen. II Product Specification | Rev 3 Document Number: 80-11-80106 This document or item is part of a SanDisk-developed design for a standard SanDisk product, and is not custom material. © 2015 SanDisk Corporation. -24- Part Number

6.0 Warranty and Part Numbers

6.1 Warranty

The CloudSpeed Gen. II is designed for high performance computing environments. The CloudSpeed Gen. II is warranted per product for 5 years for defects in material and workmanship and for its rated endurance specified in DWPD. The drive will make no attempt to limit application performance to meet the DWPD constraint. Configurable SMART warnings are provided to help the application designer manage drive wear-out, including the percentage of drive life used, lifetime remaining, and write amplification SMART attributes.

6.2 Part Numbering Information

Table 18: Part Numbering Information Product Drive Capacity LBAs SDLF1DAR-480G-1HA1 CloudSpeed Eco Gen. II 480 GBytes 937,703,088 SDLF1DAR-960G-1HA1 CloudSpeed Eco Gen. II 960 GBytes 1,875,385,008 SDLF1CRR-019T-1HA1 CloudSpeed Eco Gen. II 1,920 GBytes 3,750,748,848 SDLF1DAM-400G-1HA1 CloudSpeed Ultra Gen. II 400 GBytes 781,422,768 SDLF1DAM-800G-1HA1 CloudSpeed Ultra Gen. II 800 GBytes 1,562,824,368 SDLF1CRM-016T-1HA1 CloudSpeed Ultra Gen. II 1,600 GBytes 3,125,627,568