SCAN18541T

MNSCAN18541T-X NSC | Alldatasheet

Document overview

• Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
• PDF pages: 12

Technical content

Original Creation Date: 10/23/98 Last Update Date: 01/12/99 Last Major Revision Date: 11/30/98 MNSCAN18541T-X REV 1A0 MICROCIRCUIT DATA SHEET SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS General Description The SCAN18541T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). NS Part Numbers SCAN18541TFMQB Industry Part Number SCAN18541T Prime Die YJ541 Controlling Document 5962-93116 Processing MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 Subgrp Description Temp ( C) o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55

Features

• Dual Output enable signal per byte - TRI-STATE outputs for bus-oriented applications - 9-bit data busses for parity applications - Reduced-swing outputs source 24 mA/sink 48 mA. - Guaranteed to drive 50 Ohm transmission line to TTL input levels of 0.8V and 2.0V. - TTL compatible inputs - IEEE 1149.1 (JTAG) Compliant - Includes CLAMP and HIGH-Z instructions

(Absolute Maximum Ratings) Supply Voltage (Vcc) -0.5V to +7.0V DC Input Diode Current (Iik) -20 mA Vin = -0.5V +20 mA Vin = Vcc +0.5V DC Output Diode Current (Iok) -20 mA Vo = -0.5V +20 mA Vo = Vcc +0.5V DC Output Voltage (Vo) -0.5V to Vcc +0.5V DC Output Source/Sink Current (Io) + 70mA DC Vcc or Ground Current Per Output Pin + 70mA Junction Temperature (Tj) +175 C Ceramic Flatpack Thermal Resistance

5 C/Watt

Junction-To-Case (Theta JC)

65 C/Watt

Junction-To-Ambient (Theta JA) (1 Watt at no airflow) Storage Temperature

65 C to +150 C

+300 C (Soldering, 10 seconds) ESD Classification CLASS 3 Maximum Power Dissipation 750 mW Recommended Operating Conditions Supply Voltage (Vcc) 4.5V to 5.5V Input Voltage (Vi) 0V to Vcc Output Voltage (Vo) 0V to Vcc Operating Temperature -55 C to +125 C Minimum Input Edge Rate (dV/dt) Vin from 0.8V to 2.0V 125 mV/nS Vcc @ 4.5V 5.5V Maximum Output Current -24 mA High Level (IOH) 48 mA Low Level (IOL)

Electrical Characteristics

(The following conditions apply to all the following parameters, unless otherwise specified.) DC: 4.5V to 5.5V, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 3 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS IIH Input HIGH Current VCC=5.5V, VIH=5.5V 1, 3 INPUT 0.1 uA 1, 3 INPUT 0.9 uA 2, 3 IIHR Input HIGH Current VCC=5.5V, VIH=5.5V 1, 3 TDI/TMS 2.8 uA 1, 3 TDI/TMS 3.7 uA 2, 3 IIL Input LOW Current VCC=5.5V, VIL=0.0V 1, 3 INPUT -0.1 uA 1, 3 INPUT -0.9 uA 2, 3 IILR Maximum Input Leakage Current VCC=5.5V, VIL=0.0V 1, 3 TDI/TMS -160 -385 uA 1, 2, VOL Output LOW Voltage VCC=4.5V, IOL=50.0uA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT .10 V 1, 2, VCC=5.5V, IOL=50.0uA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT .10 V 1, 2, VCC=4.5V, IOL=48.0mA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT .55 V 1, 2, VCC=5.5V, IOL=48.0mA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT .55 V 1, 2, VIOL Output LOW Voltage VCC=5.5V, IOL=63.0mA, VIL=0.0V, VIH=5.5V 3, 5 OUTPUT 0.8 V 1, 2, VOH Output HIGH Voltage VCC=4.5V, IOL=-50.0uA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT 3.15 V 1, 2, VCC=5.5V, IOL=-50.0uA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT 4.15 V 1, 2, VCC=4.5V, IOL=-24.0mA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT 2.4 V 1, 2, VCC=5.5V, IOL=-24.0mA, VIL=0.8V, VIH=2.0V 1, 3 OUTPUT 2.4 V 1, 2, VIOH Output HIGH Voltage VCC=5.5V, IOL=-27.0mA, VIL=0.0V, VIH=5.5V 3, 5 OUTPUT 2.0 V 1, 2, ICC Supply Current VCC=5.5V, VIH=5.5V, TDI/TMS = VCC, VO = OPEN 1, 3 VCC uA 1, 3 VCC 168 uA 2, 3 ICCM (MAX) Supply Current VCC=5.5V, VIH=5.5V, TDI/TMS = Gnd, VO = OPEN 1, 3 VCC 750 uA 1, 3 VCC 930 uA 2, 3 ICCT Supply Current VCC=5.5V, VINH=3.4V, TDI/TMS = VCC 1, 3 VCC 2.0 mA 1, 2, ICCTR (MAX) Supply Current VCC=5.5V, VINH=3.4V, TDI/TMS Pin, Test one with the other floating 1, 3 VCC 2.15 mA 1, 2,

DC PARAMETERS(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) DC: 4.5V to 5.5V, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 3 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS IOZH Output Leakage Current VCC=4.5V, VIL=4.5V, VIH (OE)=2.0V 1, 3 OUTPUT 0.5 uA 1, 3 OUTPUT uA 2, 3 VCC=5.5V, VIL=5.5V, VIH (OE)=2.0V 1, 3 OUTPUT 0.5 uA 1, 3 OUTPUT uA 2, 3 IOZL Output Leakage Current VCC=4.5V, VIL=0.0V, VIH (OE)=2.0V 1, 3 OUTPUT -0.5 uA 1, 3 OUTPUT -10.0 uA 2, 3 VCC=5.5V, VIL=0.0V, VIH (OE)=2.0V 1, 3 OUTPUT -0.5 uA 1, 3 OUTPUT -10.0 uA 2, 3 IOS Output Short Circuit Current VCC=5.5V, VIN=5.5V, VOUT=0.0V, IOS= -100mA 1, 3 OUTPUT V 1, 2, VIKL Clamp Diode Voltage VCC=4.5V, IKL=-18mA 1, 3 INPUT -1.2 V 1, 2, VIKH Clamp Diode Voltage VCC=4.5V, IKH=18mA 1, 3 INPUT 5.7 V 1, 2, CIN Input Pin Capacitance VCC=5.0V pF COUT Output Pin Capacitance VCC=5.0V pF CPD Power Dissipation Capacitance VCC=5.0V pF VILD Maximum LOW Dynamic Input Voltage Level VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 9 INPUT 0.8 V VIHD Minimum HIGH Dynamic Input Voltage Level VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 9 INPUT 2.0 V VOLP Maximum High Output Noise VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 8 INPUT 0.8 V VOLV Minimum Low Output Noise VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 8 INPUT -0.8 V VOHP Maximum Overshoot VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 8 INPUT VOH + 0.8 V VOHV Minimum Vcc Droop VCC=5.0V, LOAD: 50pF / 500 OHMS 6, 8 INPUT VOH - 0.8 V

AC Parameters: NORMAL OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0nS, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpLH Propagation Delay VCC=4.5V 4, 7 An/Bn - Bn/An 2.5 9.0 nS 4, 7 An/Bn - Bn/An 2.5 10.5 nS 10, 11 tpHL Propagation Delay VCC=4.5V 4, 7 An/Bn - Bn/An 2.5 9.0 nS 4, 7 An/Bn - Bn/An 2.5 10.5 nS 10, 11 tpZH Output Enable Time VCC=4.5V 4, 7 QE to An/Bn 2.0 10.0 nS 4, 7 QE to An/Bn 2.0 12.0 nS 10, 11 tpZL Output Enable Time VCC=4.5V 4, 7 QE to An/Bn 2.0 11.8 nS 4, 7 QE to An/Bn 2.0 14.0 nS 10, 11 tpHZ Output Disable Time VCC=4.5V 4, 7 QE to An/Bn 1.5 10.2 nS 4, 7 QE to An/Bn 1.5 11.2 nS 10, 11 tpLZ Output Disable Time VCC=4.5V 4, 7 QE to An/Bn 1.5 10.2 nS 4, 7 QE to An/Bn 1.5 11.2 nS 10, 11 TOSHL HL Data to Output VCC=4.5V Pin to Pin Skew 1.0 nS 9, 10, TOSLH LH Data to Output VCC=4.5V Pin to Pin Skew 1.0 nS 9, 10, AC Parameters: SCAN TEST OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. tpLH(1) Propagation Delay VCC=4.5V 4, 7 TCK to TDO 3.5 13.2 nS 4, 7 TCK to TDO 3.5 15.8 nS 10, 11

AC Parameters: SCAN TEST OPERATION(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpHL(1) Propagation Delay VCC=4.5V 4, 7 TCK to TDO 3.5 13.2 nS 4, 7 TCK to TDO 3.5 15.8 nS 10, 11 tpZH(1) Output Enable Time VCC=4.5V 4, 7 TCK to TDO 3.0 14.5 nS 4, 7 TCK to TDO 3.0 17.0 nS 10, 11 tpZL(1) Output Enable Time VCC=4.5V 4, 7 TCK to TDO 3.0 14.5 nS 4, 7 TCK to TDO 3.0 17.0 nS 10, 11 tpHZ(1) Output Disable Time VCC=4.5V 4, 7 TCK to TDO 2.5 11.5 nS 4, 7 TCK to TDO 2.5 13.2 nS 10, 11 tpLZ(1) Output Disable Time VCC=4.5V 4, 7 TCK to TDO 2.5 11.5 nS 4, 7 TCK to TDO 2.5 13.2 nS 10, 11 tpLH(2) Propagation Delay VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 5.0 18.0 nS 4, 7 TCK to Data Out 5.0 21.7 nS 10, 11 tpHL(2) Propagation Delay VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 5.0 18.0 nS 4, 7 TCK to Data Out 5.0 21.7 nS 10, 11 tpLH(3) Propagation Delay VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 5.0 18.6 nS 4, 7 TCK to Data Out 5.0 21.2 nS 10, 11

AC Parameters: SCAN TEST OPERATION(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpHL(3) Propagation Delay VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 5.0 18.6 nS 4, 7 TCK to Data Out 5.0 21.2 nS 10, 11 tpLH(4) Propagation Delay VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 5.5 19.9 nS 4, 7 TCK to Data Out 5.5 23.0 nS 10, 11 tpHL(4) Propagation Delay VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 5.5 19.9 nS 4, 7 TCK to Data Out 5.5 23.0 nS 10, 11 tpLZ(2) Output Disable Time VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 4.0 16.4 nS 4, 7 TCK to Data Out 4.0 19.6 nS 10, 11 tpHZ(2) Output Disable Time VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 4.0 16.4 nS 4, 7 TCK to Data Out 4.0 19.6 nS 10, 11 tpLZ(3) Output Disable Time VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 5.0 19.5 nS 4, 7 TCK to Data Out 5.0 22.4 nS 10, 11 tpHZ(3) Output Disable Time VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 5.0 19.5 nS 4, 7 TCK to Data Out 5.0 22.4 nS 10, 11

AC Parameters: SCAN TEST OPERATION(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpLZ(4) Output Disable Time VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 5.0 19.9 nS 4, 7 TCK to Data Out 5.0 23.3 nS 10, 11 tpHZ(4) Output Disable Time VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 5.0 19.9 nS 4, 7 TCK to Data Out 5.0 23.3 nS 10, 11 tpZL(2) Output Enable Time VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 5.0 18.9 nS 4, 7 TCK to Data Out 5.0 22.6 nS 10, 11 tpZH(2) Output Enable Time VCC=4.5V During Update-DR state 4, 7 TCK to Data Out 5.0 18.9 nS 4, 7 TCK to Data Out 5.0 22.6 nS 10, 11 tpZL(3) Output Enable Time VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 6.5 22.4 nS 4, 7 TCK to Data Out 6.5 26.2 nS 10, 11 tpZH(3) Output Enable Time VCC=4.5V During Update-IR state 4, 7 TCK to Data Out 6.5 22.4 nS 4, 7 TCK to Data Out 6.5 26.2 nS 10, 11 tpZL(4) Output Enable Time VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 7.0 23.8 nS 4, 7 TCK to Data Out 7.0 27.4 nS 10, 11

AC Parameters: SCAN TEST OPERATION(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS GUARANTEED BUT NOT TESTED. SYMBOL PARAMETER CONDITIONS NOTES PIN- NAME MIN MAX UNIT SUB- GROUPS tpZH(4) Output Enable Time VCC=4.5V During Test Logic Reset 4, 7 TCK to Data Out 7.0 23.8 nS 4, 7 TCK to Data Out 7.0 27.4 nS 10, 11 Tset (H/L)(1) Setup Time VCC=4.5V Data to TCK 3.0 nS 9, 10, Thold(L/H) (1) Hold Time VCC=4.5V Data to TCK 4.5 nS Data to TCK 5.0 nS 10, 11 Tset (L/H)(2) Setup Time VCC=4.5V AOE or BOE to TCK 3.0 nS 9, 10, Thold(L/H) (2) Hold Time VCC=4.5V TCK to AOE or BOE 4.5 nS 9, 10, Tset (L/H)(3) Setup Time VCC=4.5V Internal AOE, BOE to TCK 3.0 nS 9, 10, Thold(L/H) (3) Hold Time VCC=4.5V TCK to Internal AOE, BOE 3.0 nS 9, 10, Tset (L/H)(4) Setup Time VCC=4.5V TMS to TCK 8.0 nS 9, 10, Thold(L/H) (4) Hold Time VCC=4.5V TCK to TMS 2.0 nS 9, 10, Tset (L/H)(5) Setup Time VCC=4.5V TDI to TCK 4.0 nS 9, 10, Thold(L/H) (5) Hold Time VCC=4.5V TCK to TDI 4.5 nS 9, 10, Tw Pulse Width VCC=4.5V TCK (H) 12.0 nS 9, 10, VCC= 4.5V TCK (L) 5.0 nS 9, 10, Fmax Maximum Clock Frequency VCC= 4.5V TCK Mhz 9, 10, Tpu Power Up to TCK VCC= 4.5V Wait Time 100 nS 9, 10, Tpd Power Down Delay VCC= 0.0V 100 mS 9, 10, Note 1: SCREEN TESTED 100% ON EACH DEVICE AT +25 C & +125 C TEMPERATURE, SUBGROUPS 1, 2, 7 & Note 2: SCREEN TESTED 100% ON EACH DEVICE AT +25 C TEMPERATURE ONLY, SUBGROUP A9.

(Continued) Note 3: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25 C & +125 C TEMPERATURE, SUBGROUPS A1, 2, 7 & 8. Note 4: SAMPLE TESTED (MEHTOD 5005, TABLE 1) ON EACH MFG. LOT AT +25 C & +125 C TEMPERATURE, SUBGROUPS A9 & 10. Note 5: TRANSMISSION LINE DRIVING TEST, GUARDBANDED LIMITS SET FOR +25 C, 2 MSEC DURATION MAX. Note 6: GUARANTEED BUT NOT TESTED. (DESIGN CHARACTERIZATION DATA ONLY). Note 7: +25 C & +125 C MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MINIMUM LIMITS. Note 8: MAX NUMBER OF OUTPUTS DEFINED AS (N). DATA INPUTS ARE DRIVEN 0V TO 3V. ONE OUTPUT AT VOL. Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3V. INPUT-UNDER-TEST SWITCHING: 3V TO THRESHOLD(VILD), 0V TO THRESHOLD(VIHD), FREQ = 1MHZ.

Revision History

ECN # Rel Date Originator Changes 1A0 M0003126 01/12/99 Donald B. Miller Archive Table I, SCAN18541T Rev. C0.1. Release to MDS MNSCAN18541T-X Rev 1A0.