SCAN16512A

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SCAN16512A Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs Literature Number: SNLS169A

October 21, 2011 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs General Description The SCAN16512A is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST).

Features

■ IEEE 1149.1 (JTAG) Compliant ■ 2.7V to 3.6V VCC Operation ■ TRI-STATE outputs for bus-oriented applications ■ Dual byte-wide data for bus applications ■ Power down high Impedance inputs and outputs ■ Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512A, SCANH162512A versions) ■ Optional 25Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512A, SCANH162512A versions) ■ Supports live insertion/withdrawal ■ Includes CLAMP and HIGHZ instructions Block Diagram 20075302 © 2011 National Semiconductor Corporation 200753 www.national.com

200753 Version 2 Revision 1 Print Date/Time: 2011/10/21 13:55:04

SCAN16512A Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs

A10-A17, A20-A27 Normal-function A-bus I/O ports. See function table for normal-mode logic. B10-B17, B20-B27 Normal-function B-bus I/O ports. See function table for normal-mode logic. CLKAB1, CLKBA1, CLKAB2, CLKBA2 Normal-function clock inputs.See function table for normal-mode logic. GND Ground VCC Supply Voltage LEAB1, LEBA1, LEAB2, LEBA2 Normal-function latch enables. See function table for normal-mode logic. OEAB1, OEBA1, OEAB2, OEBA2 Normal-function output enables. See function table for normal-mode logic. TDO The Test Data Output to support IEEE Std 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. TMS The Test Mode Select input to support IEEE Std 1149.1-1990. TMS directs the device through it's TAP controller states. An internal pull-up forces TMS high if left unconnected. TCK The Test Clock input to support IEEE Std 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. TDI The Test Data Input to support IEEE Std 1149.1-1990. TDI is the serial input to shift data through the instruction register or the selected data register. An internal pull-up resistor forces TDI high if left unconnected. TRST The Test Reset Input to support IEEE Std 1149.1-1990. TRST is the asynchronous reset pin which will force the TAP controller to it's initialization state when active. An internal pullup resistor forces TRST high if left unconnected. BGA Pinout 1 2 3 4 5 6 7 8 A A10 A12 A14 A16 A20 A22 A24 A26 B A11 A13 A15 A17 A21 A23 A25 A27 C TRST CLKAB1 LEAB1 OEAB1 GND CLKAB2 LEAB2 OEAB2 D TMS GND VCC GND VCC GND TDI TDO E TCK GND VCC VCC GND GND N/C VCC F CLKBA1 LEBA1 OEBA1 GND N/C CLKBA2 LEBA2 OEBA2 G B11 B13 B15 B17 B21 B23 B25 B27 H B10 B12 B14 B16 B20 B22 B24 B26 www.national.com 2

See NS Package Number SLC64A Truth Table Function Table (Note 1) Inputs Outputs OEAB LEAB CLKAB A B L L L X B0 (Note 2) L L ↑ L L L L ↑ H H L H X L L L H X H H H X X X Z H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial (HIGH or LOW, inputs may not float) Z = High Impedance Note 1: A-to-B data flow is shown. B-to-A data flow is similar, but uses OEBA, LEBA, and CLKBA. Note 2: Output level before the indicated steady-state input conditions were established. Functional Description In the normal mode, these devices are 16-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used as two 8-bit transceivers, or as one 16-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Acti- vating the TAP may affect the normal functional operation of the universal bus transceivers. When the TAP is activated, the test circuitry performs boundary-scan test operations ac- cording to the protocol described in IEEE Std 1149.1-1990. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB is LOW, the B outputs are active. When OEAB is HIGH, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs. Five dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), test clock (TCK), and test reset ( TRST). All testing and scan operations are syn- chronized to the TAP interface. For details about the sequence of boundary scan cells in the SCAN16512A, please refer to the BSDL (Boundary Scan De- scription Language) file available on our website. 3 www.national.com

Absolute Maximum Ratings (Note 3) Supply Voltage (VCC) −0.5V to +4.6V DC Input Diode Current (IIK) V I = −0.5V −50 mA DC Output Diode Current (IOK) V O = −0.5V −50 mA DC Input Voltage (VI) −0.5V to 4.6V DC Output Voltage (VO) −0.5V to 4.6V DC Output Source/Sink Current (IO) ±50 mA DC VCC or Ground Current Per Supply Pin ±100 mA Junction Temperature +150°C Storage Temperature −65°C to +150°C Lead Temperature (Solder, 4sec) 64L BGA 220 °C Thermal Resistance BGA θJA 62°C/W Package Derating 16.1mW/°C above 25°C ESD (Min) 2000V Recommended Operating Conditions Supply Voltage (VCC) SCAN16512A 2.7V to 3.6V Input Voltage (VI) 0V to 3.6V Output Voltage (VO) 0V to 3.6V Operating Temperature (TA) Industrial −40°C to +85°C Note 3: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of SCAN circuits outside databook specifications. Symbol Parameter VCC (V) Industrial Units ConditionsTA = −40°C to +85°C Min Max VIH Minimum High Input Voltage 2.7 2.0 V VOUT = 0.1V 3.6 2.0 or VCC −0.1V VIL Maximum Low Input Voltage 2.7 0.8 V VOUT = 0.1V 3.6 0.8 or VCC −0.1V VOH Minimum High Output Voltage All Outputs, All Options 2.7 2.5 V IOUT = −100 μA 3.6 3.4 Minimum High Output Voltage TDO Outputs, All Options 2.7 2.2 V VIN = VIL or VIH, IOH = −12mA 3.0 2.2 V VIN = VIL or VIH IOH = −24mA Minimum High Output Voltage A and B Ports: SCAN16512A and SCANH16512A options 2.7 2.2 V VIN = VIL or VIH IOH = −12mA 3.0 2.2 V VIN = VIL or VIH IOH = −24mA Minimum High Output Voltage A and B Ports: SCAN162512A and SCANH162512A options (25Ω series resistor options) 2.7 2.2 V VIN = VIL or VIH IOH = -4mA 3.0 2.2 V VIN = VIL or VIH IOH = -12mA www.national.com 4

(V) Industrial Units ConditionsTA = −40°C to +85°C Min Max VOL Maximum Low Output Voltage All Outputs, All Options 2.7 0.2 V IOUT = 100 μA 3.6 0.2 Maximum Low Output Voltage TDO Outputs, All Options 2.7 0.4 V VIN = VIL or VIH, IOL = 12mA 3.0 0.55 V VIN = VIL or VIH, IOL = 24mA Maximum Low Output Voltage A and B Ports: SCAN16512A and SCANH16512A Options 2.7 0.4 V VIN = VIL or VIH, IOL = 12mA 3.0 0.55 V VIN = VIL or VIH, IOL = 24mA Maximum Low Output Voltage A and B Ports: SCAN162512A and SCANH162512A Options (25Ω series resistor options) 2.7 0.4 V VIN = VIL or VIH, IOL = 4mA 3.0 0.6 V VIN = VIL or VIH, IOL = 12mA IIN Maximum Input Leakage Current 3.6 ±5.0 μA VI = VCC, GND IILR Input Low Current 3.6 -20 -250 μA VIN = GND IOZ Maximum I/O Leakage Current 3.6 ±10.0 VI (OE) = VIL, VIH μA VI = VCC, GND VO = VCC, GND II(HOLD) Bus Hold Input Minimum Drive Hold Current (Note 4) 2.7 ±35 μA VI = 0.8V or 2.0V 3.6 ±500 VI = 0 to 3.6V VIKL Input Clamp Diode Voltage 2.7 -1.5 V IIN = -18mA IOFF Power-off Leakage Current 0.0 ±10.0 μA VO = VCC, GND ICC Maximum Quiescent Supply Current 3.6 20 μA ICCt Maximum ICC Per Input 3.6 0.5 mA VI = VCC–0.6V Note 4: Applies to devices with Bus Hold feature only. 5 www.national.com

Applies to SCAN16512A and SCANH16512A options, CL = 30pF, RL = 500Ω to GND Symbol Parameter VCC (V) Industrial UnitsTA = 25°C Typical Limits VOLP Quiet Output Maximum Dynamic VOL (Note 5) 3.3 1.2 V VOLV Quiet Output Minimum Dynamic VOL (Note 5) 3.3 -1.5 V VOHP Quiet Output Maximum Dynamic VOH (Note 6) 3.3 VOH + 0.9 V VOHV Quiet Output Minimum Dynamic VOH (Note 6) 3.3 VOH - 1.5 V Noise Specifications Applies to SCAN162512A and SCANH162512A options, CL = 30pF, RL = 500Ω to GND Symbol Parameter VCC (V) Industrial UnitsTA = 25°C Typical Limits VOLP Quiet Output Maximum Dynamic VOL (Note 5) 3.3 0.5 V VOLV Quiet Output Minimum Dynamic VOL (Note 5) 3.3 -0.4 V VOHP Quiet Output Maximum Dynamic VOH (Note 6) 3.3 VOH + 0.5 V VOHV Quiet Output Minimum Dynamic VOH (Note 6) 3.3 VOH - 0.5 V Note 5: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a LOW (VOL) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a LOW (VOL) state. Note 6: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a HIGH (VOH) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a HIGH (VOH) state. www.national.com 6

Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN16512A, SCANH16512A Units TA = −40°C to +85°C CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 5.5 ns tPHL A to B, B to A 5.5 tPLH, Propagation Delay 6.0 ns tPHL CLKAB to B, CLKBA to A 6.0 tPLH, Propagation Delay 6.0 ns tPHL LEAB to B, LEBA to A 6.0 tPLZ, Disable Time, OEAB to B, OEBA to A 7.5 ns tPHZ 7.5 tPZL, Enable Time, OEAB to B, OEBA to A 7.5 ns tPZH 7.5 Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN162512A Units TA = −40°C to +85°C CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 6.0 ns tPHL A to B, B to A 6.0 tPLH, Propagation Delay 6.5 ns tPHL CLKAB to B, CLKBA to A 6.5 tPLH, Propagation Delay 6.5 ns tPHL LEAB to B, LEBA to A 6.5 tPLZ, Disable Time, OEAB to B, OEBA to A 8.0 ns tPHZ 8.0 tPZL, Enable Time, OEAB to B, OEBA to A 8.0 ns tPZH 8.0 7 www.national.com

Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCANH162512A Units TA = −40°C to +85°C CL = 30 pF RL = 500Ω to GND Min Max tPLH, Propagation Delay 6.0 ns tPHL A to B, B to A 6.0 tPLH, Propagation Delay 6.5 ns tPHL CLKAB to B, CLKBA to A 6.5 tPLH, Propagation Delay 6.5 ns tPHL LEAB to B, LEBA to A 6.5 tPLZ, Disable Time, OEAB to B, OEBA to A 8.0 ns tPHZ 8.0 tPZL, Enable Time, OEAB to B, OEBA to A 8.0 ns tPZH 8.0 AC Operating Requirements Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options Units TA = −40°C to +85°C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS Setup Time, A to CLKAB or B to CLKBA 1.5 ns tH Hold Time, A to CLKAB or B to CLKBA 2.0 ns tS Setup Time, A to LEAB or B to LEBA 1.5 ns tH Hold Time, A to LEAB or B to LEBA 2.5 ns tW Pulse Width, CLKAB or CLKBA, high or low 2.0 ns tW Pulse Width, LEAB or LEBA high 2.0 ns fmax Maximum CLKAB or CLKBA Clock Frequency 250 MHz AC Operating Requirements can Test Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options Units TA = −40°C to +85°C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS Setup Time, H or L, TMS to TCK 2.0 ns tH Hold Time, H or L, TCK to TMS 1.0 ns tS Setup Time, H or L, TDI to TCK 1.0 ns tH Hold Time, H or L, TCK to TDI 2.0 ns tW Pulse Width TCK High or Low 10 ns tW Pulse Width TRST, Low 2.5 ns fmax Maximum TCK Clock Frequency 25 MHz tREC Recovery Time, TRST to TCK 2.0 ns www.national.com 8

FIGURE 1. AC Test Circuit (CL includes probe and jig capacitance) FIGURE 2. Timing Waveforms

Capacitance and I/O Characteristics Refer to National's website for IBIS models at http://www.national.com/scan Device ID Register Ordering Code Features Device ID Manufacturer & LSB SCAN16512ASM No bus hold, no series resistor FC30 01F SCANH16512ASM With bus hold only FC31 01F SCAN162512ASM With 25Ω series resistors in outputs FC32 01F SCANH162512ASM With 25Ω series resistors and bus hold FC33 01F www.national.com 10

Physical Dimensions inches (millimeters) unless otherwise noted 64-Lead Ball Grid Array Package Order Number SCAN16512ASM, SCANH16512ASM, SCAN162512ASM, SCANH162512ASM 11 www.national.com

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