RDHA701CD10A2NK

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Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com RDHA701CD10A2NK Neutron and Total Ionizing Dose Test Report October 2009 International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance Program for MIL-PRF-38534.

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Table of Contents Appendix A – Electrical Data Appendix B – Radiation Test Specification Appendix C – Neutron Test Setup

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com INTRODUCTION This test report covers the neutron fluence and ionizing radiation tests performed on the RDHA701CD10A2NK which is a dual 1 amp Solid-State-Relay in a hermetic package. Neutron fluence and Total Ionizing Dose tests were performed to determine the effects displacement damage and ionizing radiation had on the device performance. On October 14 2009, International Rectifier characterized this device for ionizing radiation hardness and on October 23, 2009 International Rectifier characterized this device for neutron radiation hardness at the University of Massachusetts, Nuclear Reactor Laboratory Facility using their Fast Neutron Irradiator and Gamma Cave facilities. SUMMARY OF RESULTS All of the test samples passed the post radiation test requirements for fluence levels up to 1.0E12 n/cm2 and 100K Rad(Si). The results show a 50% average increase in the device’s turn on propagation delay and a 15% average decrease in the device’s turn off propagation delay after exposure to total ionizing dose and neutron radiation. No other significant changes in device performance were noted for either neutron or total ionizing radiation exposure. TEST METHOD The test methods used in the development of the Test Plan was MIL-STD-883, Methods 1017 Neutron Irradiation and 1019 Ionizing Radiation. These methods established the basic requirements for the performance and execution of the tests. TEST PLAN On October 14, 2009 two samples (serial numbers 237 and 252) were exposed to Total Ionizing Dose radiation under an “ON” biased condition and two samples (serial numbers 231 and 248) were exposed to Total Ionizing Dose radiation under an “OFF” biased condition. Serial number 256 was maintained as a control sample and was not exposed to any radiation. The same four samples (serial numbers 231, 237, 248, and 252) were exposed to neutron radiation on October 23, 2009 in an un-biased state with all device leads shorted in conductive foam and contained in a conductive bag. Post radiation testing of the devices occurred after the decay of radioactivity of the devices reached an acceptable safe level determined by the facilities personnel. The rate of decay was dependent on the amount of exposure to neutrons and the package materials. The devices were contained in a 20 +/- 10C environment to minimize the effects due to annealing. The Radiation Test Specification is included in Appendix B. The testing occurred in the following manner:

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Test Plan Outline

1.0 Purpose

The purpose of this test is to characterize and establish displacement damage and total ionizing dose radiation effects for International Rectifier’s dual solid state relay devices.

2.0 Test Responsibility

International Rectifier shall be responsible for conducting the tests, which shall be performed at the University of Massachusetts Research Reactor facility. International Rectifier shall be responsible for the final Test Report.

3.0 Test Facility

3.1 Nuclear Reactor

3.1.1 The University of Massachusetts Research Reactor shall be used to provide the necessary Neutron

beam and energy. University of Massachusetts Research Reactor (UMRR) shall provide adequate dosimetry for verification of the neutron beam parameters.

3.1.2 The University of Massachusetts Research Reactor shall be used to provide the source for Gamma

radiation. UMRR will also provide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation.

3.2 Test Equipment

The necessary test equipment including interface board, cables, power supplies, measurement system, etc. shall be provided by International Rectifier.

3.3 Sample Size

Five samples shall be randomly selected. One of which shall be maintained as a control. The samples used for the Total Ionizing Dose radiation exposure shall also be subjected to Neutron radiation exposure.

4.0 Test Device

4.1 The following device is planned for this characterization:

a. RDHA701CD10A2NK

4.2 All devices shall be subjected to a minimum of 96hrs of burn-in and verified for correct electrical

to arrival at UMRR. 4.3 One device shall be biased in the “ON” state and one device shall be biased in the “OFF” state during the Total Ionizing Dose irradiation. 4.4 The device leads will be shorted in conductive foam and all parts shall be contained inside a conductive ESD bag during Neutron irradiation.

5.0 Test Method

5.1 MIL-STD-883, Method 1017 shall be used to establish procedure for all Neutron testing described herein.

5.2 MIL-STD-883, Method 1019 shall be used to establish procedure for all Total Ionizing Dose testing

described herein.

6.0 Radiation Source

6.1 The nuclear reactor at Lowell, Mass is capable of providing fast neutron flux level > 1011 n/cm2 – s with relatively low thermal fluence and gamma irradiation. The Fast Neutron Irradiator (FNI) offers near uniform spectrum over a large cross-sectional area (12” x 12” x 6”). The dosimetry system used to verify the radiation exposure was P-32, ASTM E-265.

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com

6.2 The Gamma Cave is an irradiation room inside this facility having an

equi-dimensional volume of 512 cubic feet. A wide range of dose rates, 1Gray (100 rad) per hour to 10,000 Gray (1 Mrad) per hour, is available with the CO60 source. Several small ports penetrate one shielding wall to provide access for instrumentation cables.

7.0 Record Keeping

7.1 The Reactor facility shall provide dosimetry data for the Fast Neutron Irradiator. IR will be responsible for collecting and compiling the test data. 7.2 The Reactor facility shall provide dosimetry data for the CO60. Each exposure run shall be cataloged with the appropriate lot number in order to maintain correlation to the appropriate data set. IR will be responsible for collecting and compiling the test data.

8.0 Test Procedure

International Rectifier shall control the following test procedure, based on Test Methods 1017 and 1019. The neutron fluence and total ionizing dose levels the product is exposed to shall be per this test plan. The facility personnel shall be responsible for loading and moving the device container in the Fast Neutron Irradiator. They shall also be responsible for loading, unloading, and moving the Cobalt source for the Total Ionizing Dose exposures. The Total Ionizing Dose exposure levels shall be 50K, 100K, and 150K Rad(Si). Total Ionizing Dose Test Procedure – Table 1 Step Description Conditions 1 Pre test all devices prior to radiation exposure.

2 Perform empty board continuity and leakage

verification on radiation bias board.

3 Load one device in the “ON” bias socket and one

device in the “OFF” bias socket on the radiation bias board.

4 Place radiation bias board in the test rack in the

Gamma Cave.

5 Turn on the bias power supplies and measure the

signals at the DUT sites for proper levels.

6 Secure the chamber and expose the samples to the

specified dose. Facilities personnel 50K Rad(Si) exposure step

7 Remove devices at completion of exposure time Facilities personnel

8 Test devices – Read and Record data – within 1 hour

of removal from the chamber

9 Repeat steps 2 thru 7 for exposure level 2

This exposure must start within 2 hours of the completion of the last exposure 50K Rad(Si) exposure step

10 Repeat steps 2 thru 7 for exposure level 2

This exposure must start within 2 hours of the completion of the last exposure 50K Rad(Si) exposure step

11 Place the “ON” bias sample back on the radiation bias

board under the same bias for a minimum of 24 hours at 24C +/-6C. Place the “OFF” bias sample back on the radiation bias board under the same bias for a minimum of 24 hours at 24C +/-6C. If the devices fail post exposure test they must be subject to extended room temperature anneal per Method 1019, 3.11

12 Test devices – Read and Record data – within 4 hours

13 Place the “ON” bias sample back on the radiation bias

board under the same bias for 168 hours +/-12 hours at 100C +5/-0C. Place the “OFF” bias sample back on the radiation bias board under the same bias for 168 hours Subject the devices to MOS accelerated anneal per Method 1019, 3.12

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com +/-12 hours at 100C +5/-0C.

14 Test devices – Read and Record data – within 4 hours

Please note the Total Ionizing Dose exposure steps are considered cumulative. The Neutron fluence total exposure levels shall be 1E11 n/cm 2, 6E11 n/cm2, and 1E12 n/cm2. Neutron Test Procedure - Table 2 Step Description Conditions 1 Pre test all devices prior to radiation exposure.

2 Place all devices in ESD safe bag all device pins are

placed in conductive foam.

3 Place devices into the shielded container Unbiased

4 Lower the container into the irra diation chamber Facilities personnel

5 Expose the devices to pre-determined level 1E11 n/cm 2 exposure step

6 Remove devices at completion of exposure time Facilities personnel

7 Allow devices to decay to safe level Facilities personnel

8 Test devices - Read and Record data

9 If product fails catastrophic stop, select new samples

and select a lower exposure step.

9 Repeat steps 2 thru 9 for exposure level 2 5E11 n/cm 2 exposure step

10 Repeat steps 2 thru 9 for exposure level 3 4E11 n/cm 2 exposure step

Please note the Neutron exposure steps are considered cumulative.

9.0 Test Report

The Test Report shall include the following information. a. Device type(s), serial numbers, wafer lot identification (per active component) b. Test dates c. Facility, source type d. Fluence e. Certificate of Exposure f. Bias conditions g. Comments and observations h. Pre and Post Electrical data i. Summary descriptive including graphs

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com TEST FACILITY The University of Massachusetts, Lowell, Nuclear Research Reactor is a 1 Mega-Watt, Uranium235 enhanced core reactor. The Fast Neutron Irradiation (FNI) chamber (see Figure 1) is designed to give a fast flux level from 1010 to 1016 n/cm2-s with relatively low thermal fluence and gamma dose rates. It is also designed to provide a 1MeV equivalent flux over the effective range. Figure 1 REACTOR FUEL LEAD/BORON SHIELDING FLUX FILTERIRRADIATION CHAMBER LEAD/ VOID

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Test Results The pre and post radiation test results are s hown graphically in Figures 2 thru 5. As outlined in the Test Plan, f our devices (serial numbers 231, 237, 248, and 252) were exposed to total ionizing dose and then neutron radiation. The devices were tested after the completion of each radiation exposure. The average of the result s for each selected parameter is displayed in the following graphs for the exposed parts and the unexposed part (control sample). There were no catastrophic failures for any device. Output Leakage Current: The graph displays the results of all the r adiation exposures in the order they were preformed. The radiation exposures the devi ce was subject to had minimal effect on the device output leakage current. RDHA710FR10A1NK Total Ionizing Dose and Neutron Radiation E xposure Results 0.05 0.1 0.15 0.2 0.25 0 50000 (Rad(Si) 100000 (Rad(Si) 150000 (Rad(Si) Post 100C Anneal 1E+11 (n/cm2) 6E+11 (n/cm2) 1E+12 (n/cm2) Radiation E xposure (uA) Output Leakage Current-A Control Total Ionizing Dose Neutron Fluence Figure 2

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Turn On Delay: The graph displays the results of all the radiation exposures in the order they were preformed. The total ionizing dose exposure caused a 50% increase in the turn on delay for the device. The subsequent 100C anneal test shifted this parameter back down by 25%. The neutron exposures at 6e+11 and 1e+12 n/cm2 caused this parameter to increase back to the same level it was at after the 150K total dose exposure. The product is still well within the 4ms maximum limits for this parameter after all the exposures were complete. RDHA710FR10A1NK Total Ionizing Dose and Neutron Radiation E xposure Results 0.05 0.1 0.15 0.2 0.25 0 50000 (Rad(Si) 100000 (Rad(Si) 150000 (Rad(Si) Post 100C Anneal 1E+11 (n/cm2) 6E+11 (n/cm2) 1E+12 (n/cm2) Radiation E xposure (ms) Ton-A @ 10ma Control Total Ionizing Dose Neutron Fluence Figure 3

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Turn Off Delay: The graph displays the results of all the radiation exposures in the order they were preformed. The radiation exposure caused a 15% decrease in the turn off delay for the device. RDHA710FR10A1NK Total Ionizing Dose and Neutron Radiation Exposure Results 0.5 0.75 1.25 1.5 0 50000 (Rad(Si) 100000 (Rad(Si) 150000 (Rad(Si) Post 100C Anneal 1E+11 (n/cm2) 6E+11 (n/cm2) 1E+12 (n/cm2) Radiation E xposure (ms) Toff-A @ 10ma Control Total Ionizing Dose Neutron Fluence Figure 4

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com RDS(on): The graph displays the results of all the r adiation exposures in the order they were preformed. No significant shifts in this parameter were reco rded after any of the radiation exposures. RDHA710FR10A1NK Total Ionizing Dose and Neutron Radiation E xposure Results 0.05 0.1 0.15 0.2 0.25 0 50000 (Rad(Si) 100000 (Rad(Si) 150000 (Rad(Si) Post 100C Anneal 1E+11 (n/cm2) 6E+11 (n/cm2) 1E+12 (n/cm2) Radiation E xposure (ohms) RDSon-A @ 1A Control Total Ionizing Dose Neutron Fluence Figure 5 CONCLUSION The radiation tests performed on the RDHA701CD10A2NK demonstrate hardness to a combined total dose ionizing radiation exposure of 100K Rad(Si) and neutron radiation exposure of 1.0E12 n/cm2 with minimal effect on its overall performance and the results show it to meet all the post radiation test requirements.

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Appendix A Electrical Data

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Electrical Test Data (Pre-radiation) – 10/13/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial # Electrical Test Data (Post 50K Rad(Si) exposure) – 10/14/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial #

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Electrical Test Data (Post 100K Rad(Si) exposure) – 10/14/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial # Electrical Test Data (Post 150K Rad(Si) exposure) – 10/14/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial #

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Electrical Test Data (Post 100C Anneal – 168hrs) – 10/23/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial # Electrical Test Data (Post 1e11 n/cm2 exposure) – 10/23/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial #

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Electrical Test Data (Post 6e11 n/cm2 exposure) – 10/23/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial # Electrical Test Data (Post 1e12 n/cm2 exposure) – 10/23/2009 Test Name Output Leakage Current- A VR-A 10uA VF-A 10mA VF-A 20mA Ton- A @ 10ma Toff-A 10ma RDSon- A @ 1A Output Leakage Current- B VR-B 10uA VF-B 10mA VF-B 20mA Ton- B @ 10ma Toff-B 10ma RDSon- B @ 1A Test Lower Upper Units uA V V V ms ms ohm uA V V V ms ms ohm Serial #

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Appendix B Radiation Test Specification

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Automatic Test Tester: Eagle ETS-564 Table 1: Pre Radiation Tests, 25C only Prog. Ref. Test Symbol Test Conditions Rad Level: Notes MIN MAX Units A Leakage Current Off IO [leak] IF=0mA, Vout=100V Pre Rad 1 --- 10.0 uA A Input Reverse Voltage V R IR = 10uA Pre Rad 1 5.0 32.0 V A Input Forward Voltage VF1 IF=10mA Pre Rad 1 1.10 1.75 V A Input Forward Voltage VF2 IF=20mA Pre Rad 1 1.15 1.80 V A Drain to Source Resistance Rds(on) IF = 10mA, Iout = 1A, PW >= 200mS Pre Rad 1 --- 0.40 Ohm A Time On Ton Vout = 28.0V, Iout = 1A, IF = 0 to 10mA, PW = 15ms Pre Rad 1 --- 4.0 ms A Time Off Toff Vout = 28.0V, Iout = 1A, IF = 10 to 0mA, PW = 15ms Pre Rad 1 --- 2.0 ms Automatic Test Tester: Eagle ETS-564 Table 2: Post Radiation Tests, 25C only Prog. Ref. Test Symbol Test Conditions Rad Level: Notes MIN MAX Units B Leakage Current Off IO [leak] IF=0mA, Vout=100V Post Rad 1 --- 10.0 uA B Input Reverse Voltage V R IR = 10uA Post Rad 1 5.0 32.0 V B Input Forward Voltage VF1 IF=10mA Post Rad 1 1.10 1.75 V B Input Forward Voltage VF2 IF=20mA Post Rad 1 1.15 1.80 V B Drain to Source Resistance Rds(on) IF = 10mA, Iout = 1A, PW >= 200mS Post Rad 1 --- 0.40 Ohm B Time On Ton Vout = 28.0V, Iout = 1A, IF = 0 to 10mA, PW = 15ms Post Rad 1 --- 4.0 ms B Time Off Toff Vout = 28.0V, Iout = 1A, IF = 10 to 0mA, PW = 15ms Post Rad 1 --- 2.0 ms Note 1: All tests are performed on each switch in the product.

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Fast Neutron Irradiator Facility @ UMass, Lowell Bias Conditions All pins shor ted in conductive foam. Parts inside an ESD conductive bag. Fluence Step Profile 1.0E+11, 5.0E+11, 4.0E+11 Equivalent Fluence 1MeV (neutrons/cm Test Temperature 20C +/-10C Test Procedure T030061G 2. Performed on four samples that are exposed to Total Dose. The steps are cumulative. 3. All handling guidelines for neutron irradiated product outlined in T030061G must be followed for this multiple exposure test. Fluence steps are considered cumulative. Total Dose Radiation Requirements High Dose Rate Bias Conditions IF = 7mA, Vout =0V On Bias IF = 0mA, Vout=80V Off Bias Dose Step Profile 50K, 50K, 50K 50K, 50K, 50K Dose Rate Range 50 to 300 Rad(Si)/Sec 50 to 300 Rad(Si)/Sec Board Number 09-128-TF 09-128-TF Program Card Number N/A N/A Chamber Gamma Cave Gamma Cave Test Temperature 25C +/-5C 25C +/-5C 4. 100C Post Radiation Anneal step is required for this product. ON BIAS 500 1/4W 1% RDHA701CD10A2NK 4 5 500 1/4W 1% +5V +5V

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com OFF BIAS RDHA701CD10A2NK 4 5 +80V +80V

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Appendix C Neutron Test Set Up

Neutron and Total Ionizing Dose Test Report RDHA701CD10A2NK October 2009 205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com Neutron Irradiation Set Up 1. Devices are placed into the aluminum / boron container. 2. The container is then lower ed into the irradiation chamber. 3. At the completion of the run time, remo ve container from the radiation chamber. 4. Allow devices to decay (radioactive) to an acceptable safe level before testing. 5. Repeat process as required.