PUCC27624QDRQ1

UCC27624-Q1 TI | Alldatasheet

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Technical content

UCC27624-Q1 30-V, 5-A Dual-Channel Low-Side Gate Driver with –10-V Input Capability

1 Features

• Qualified for Automotive Applications
• AEC-Q100 Qualified – Device Temperature Grade 1 – Device HBM ESD Classification Level H1C – Device CDM ESD Classification Level C6
• Typical 5-A peak source and sink drive current for each channel
• Input and enable pins capable of handling –10 V
• Output capable of handling –2-V transients
• Absolute maximum VDD voltage: 30 V
• Wide VDD operating range from 4.5 V to 26 V with UVLO
• Hysteretic-logic thresholds for high noise immunity
• VDD independent input thresholds (TTL compatible)
• Fast propagation delays (17-ns typical)
• Fast rise and fall times (6-ns and 10-ns typical)
• 1-ns typical delay matching between the two channels
• Two channels can be paralleled for higher drive current
• SOIC8 and VSSOP8 PowerPAD™ package options
• Operating junction temperature range of –40°C to 150°C

2 Applications

• Automotive DC/DC Converters
• Switched-mode power supplies (SMPS)
• Power factor correction (PFC) circuits
• DC/DC converter
• Motor drives
• Solar power supplies
• Pulse transformer driver LOINA OUTA VDD OUTBGND CVDD Rg +– To Switch Node From Controller VBias ENB Rg To Switch NodeINB ENA Simplified Application Diagram

3 Description

The UCC27624-Q1 is a dual-channel, high-speed, low-side gate driver that effectively drives MOSFET, IGBT, SiC, and GaN power switches. UCC27624-Q1 has a typical peak drive strength of 5 A, which reduces rise and fall times of the power switches, lowers switching losses, and increases efficiency. The device's fast propagation delay (17-ns typical) yields better power stage efficiency by improving the deadtime optimization, pulse width utilization, control loop response, and transient performance of the system. UCC27624-Q1 can handle –10 V at its inputs, which improves robustness in systems with moderate ground bouncing. The inputs are independent of supply voltage and can be connected to most controller outputs for maximum control flexibility. An independent enable signal allows the power stage to be controlled independently of main control logic. In the event of a system fault, the gate driver can quickly shut-off by pulling enable low. Many high-frequency switching power supplies exhibit noise at the gate of the power device, which can get injected into the output pin on the gate driver and can cause the driver to malfunction. The device's transient reverse current and reverse voltage capability allow it to tolerate noise on the gate of the power device or pulse-transformer and avoid driver malfunction. The UCC27624-Q1 also features undervoltage lockout (UVLO) for improved system robustness. When there is not enough bias voltage to fully enhance the power device, the gate driver output is held low by the strong internal pull down MOSFET. Device Information PART NUMBER(1) PACKAGE BODY SIZE (NOM) UCC27624-Q1 SOIC (8) 4.90 mm × 3.91 mm UCC27624-Q1 VSSOP (8) 3.00 mm × 3.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. ADVANCE INFORMATION UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. ADVANCE INFORMATION for preproduction products; subject to change without notice.

11.2 Receiving Notification of Documentation Updates.. 25

12 Mechanical, Packaging, and Orderable

4 Revision History

NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision * (March 2022) to Revision A (May 2022) Page UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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5 Pin Configuration and Functions

Figure 5-1. D Package 8-Pin SOIC Top View ENB OUTA VDD OUTB ENA GND INA INB 4 5 Figure 5-2. DGN Package 8-Pin VSSOP Top View Table 5-1. Pin Functions PIN TYPE(1) DESCRIPTION NAME DGN D ENA 1 1 I Enable input for Channel A. Biasing ENA, LOW will disable Channel A output regardless of the state of INA. Pulling ENA, HIGH enables the Channel A output. If ENA is left floating, Channel A is enabled by default due to an internal pullup resistor. It is recommended to connect this pin to VDD if unused. ENB 8 8 I Enable input for Channel B. Biasing ENB, LOW disables Channel B output regardless of the state of INB. Pulling ENB, HIGH enables the Channel B output. If ENB is left floating, Channel B is enabled by default due to an internal pullup resistor. It is recommended to connect this pin to VDD if unused. GND 3 3 — Ground: All signals are referenced to this pin. INA 2 2 I Input to Channel A. INA is the non-inverting input of the UCC27624-Q1 device. OUTA is held LOW if INA is unbiased or floating by default due to an internal pulldown resistor. Connect this pin to GND if unused. INB 4 4 I Input to Channel B. INB is the non-inverting input of the UCC27624-Q1 device. OUTB is held LOW if INB is unbiased or floating by default due to an internal pulldown resistor. Connect this pin to GND if unused. OUTA 7 7 O Channel A Output OUTB 5 5 O Channel B Output VDD 6 6 I Bias supply input. Bypass this pin with two ceramic capacitors, generally ≥ 1 μF and 0.1 μF, which are referenced to GND pin of this device. Thermal Pad — — Connect to GND through large copper plane. This pad is not a low-impedance path to GND. (1) I = Input; O = Output www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 3 Product Folder Links: UCC27624-Q1

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1) (2) (3) MIN MAX UNIT Supply voltage, VDD –0.3 30 V Output Voltage, OUTA, OUTB DC –0.3 VDD +0.3 V 200ns Pulse –2 VDD +3 V Input Voltage INA, INB, ENA, ENB –10 30 V Operating junction temperature, TJ –40 150 °C Lead temperature Soldering, 10 sec. 300 Reflow 260 Storage temperature, Tstg –65 150 °C (1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime. (2) All voltages are with respect to GND unless otherwise noted. Currents are positive into, negative out of the specified terminal. See Section 6.4 of the datasheet for thermal limitations and considerations of packages. (3) These devices are sensitive to electrostatic discharge; follow proper device handling procedures.

6.2 ESD Ratings

V(ESD) Electrostatic discharge Human body model (HBM), per AEC Q100-002(1) ±2000 V Charged-device model (CDM), per AEC Q100-011 ±1000 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

6.3 Recommended Operating Conditions

over operating free-air temperature range. All voltages are with reference to GND (unless otherwise noted) MIN NOM MAX UNIT Supply voltage, VDD 4.5 12 26 V Input voltage, INA, INB, ENA, ENB –10 26 V Output Voltage, OUTA, OUTB 0 VDD V Operating junction temperature, TJ –40 150 °C

6.4 Thermal Information

8 PINS 8 PINS

RθJA Junction-to-ambient thermal resistance 48.9 126.4 °C/W RθJC(top) Junction-to-case (top) thermal resistance 71.8 67.0 RθJB Junction-to-board thermal resistance 22.3 69.9 ψJT Junction-to-top characterization parameter 2.6 19.2 ψJB Junction-to-board characterization parameter 22.3 69.1 RθJC(bot) Junction-to-case (bottom) thermal resistance 4.5 n/a UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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6.5 Electrical Characteristics

Unless otherwise noted, VDD = 12 V, TA = TJ = –40°C to 150°C, 1-µF capacitor from VDD to GND, no load on the output. Typical condition specifications are at 25°C. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT BIAS CURRENTS IVDDq VDD quiescent supply current VINx = 3.3 V, VDD = 3.4 V, ENx = VDD 300 450 μA IVDD VDD static supply current VINx = 3.3 V, ENx = VDD 0.6 1.0 mA IVDD VDD static supply current VINx = 0 V, ENx = VDD 0.7 1.0 mA IVDDO VDD operating current fSW = 1000 kHz, ENx = VDD, VINx = 0 V – 3.3 V PWM 3.2 3.8 mA IDIS VDD disable current VINx = 3.3 V, ENx = 0 V 0.8 1.1 mA UNDERVOLTAGE LOCKOUT (UVLO) VVDD_ON VDD UVLO rising threshold 3.8 4.1 4.4 V VVDD_OFF VDD UVLO falling threshold 3.5 3.8 4.1 V VVDD_HYS VDD UVLO hysteresis 0.3 V INPUT (INA, INB) VINx_H Input signal high threshold Output High, ENx = HIGH 1.8 2 2.3 V VINx_L Input signal low threshold Output Low, ENx = HIGH 0.8 1 1.2 V VINx_HYS Input signal hysteresis 1 V RINx INx pin pulldown resistor INx = 3.3 V 120 kΩ ENABLE (ENA, ENB) VENx_H Enable signal high threshold Output High, INx = HIGH 1.8 2 2.3 V VENx_L Enable signal low threshold Output Low, INx = HIGH 0.8 1 1.2 V VENx_HYS Enable signal hysteresis 1 V RENx EN pin pullup resistance ENx = 0 V 200 kΩ OUTPUTS (OUTA, OUTB) ISRC (1) Peak output source current VDD = 12 V, CVDD = 10 µF, CL = 0.1 µF, f = 1 kHz 5 A ISNK (1) Peak output sink current VDD = 12 V, CVDD = 10 µF, CL = 0.1 µF, f = 1 kHz –5 A ROH (2) Pullup resistance IOUT = –50 mA See Section 7.3.4. 5 8.5 Ω ROL Pulldown resistance IOUT = 50 mA 0.6 1.1 Ω (1) Parameter not tested in production. (2) Output pullup resistance in this table is a DC measurement that measures resistance of PMOS structure only (not N-channel structure). www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 5 Product Folder Links: UCC27624-Q1

6.6 Switching Characteristics

Unless otherwise noted, VDD = VEN = 12 V, TA = TJ = –40°C to 150°C, 1-µF capacitor from VDD to GND, no load on the output. Typical condition specifications are at 25°C (1). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tRx Rise time CLOAD = 1.8 nF, 20% to 80%, Vin = 0 V – 3.3 V 6 10 ns tFx Fall time CLOAD = 1.8 nF, 90% to 10%, Vin = 0 V – 3.3 V 10 14 ns tD1x Turn-on propagation delay CLOAD = 1.8 nF, VINx_H of the input rise to 10% of output rise, Vin = 0 V – 3.3 V, Fsw = 500 kHz, 50% duty cycle, TJ = 125°C 17 27 ns tD2x Turn-off propagation delay CLOAD = 1.8 nF, VINx_L of the input fall to 90% of output fall, Vin = 0 V – 3.3 V, Fsw = 500 kHz, 50% duty cycle, TJ = 125°C 17 27 ns tD3x Enable propagation delay CLOAD = 1.8 nF, VENx_H of the enable rise to 10% of output rise, Vin = 0 V – 3.3 V, Fsw = 500 kHz, 50% duty cycle, TJ = 125°C 17 27 ns tD4x Disable propagation delay CLOAD = 1.8 nF, VENx_L of the enable fall to 90% of output fall, Vin = 0 V – 3.3 V, Fsw = 500 kHz, 50% duty cycle, TJ = 125°C 17 27 ns tM Delay matching between two channels CLOAD = 1.8 nF, Vin = 0 V – 3.3 V, Fsw = 500 kHz, 50% duty cycle, INA = INB, |tRA – tRB|, |tFA – tFB| 1 2 ns tPWmin Minimum input pulse width CL = 1.8 nF, Vin = 0 V – 3.3 V, Fsw = 500 kHz, Vo > 1.5 V 10 15 ns (1) Switching parameters are not tested in production. UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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6.7 Timing Diagrams

10% 90% VENx_H Low High Input tD3 tD4 UDG-11219 VENx_L Figure 6-1. Enable Function Enable Output 10% 90% Low High Input tD1 tD2 UDG-11219 VINx_L VINx_H Figure 6-2. Input-Output Operation www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: UCC27624-Q1

6.8 Typical Characteristics

Unless otherwise specified, VDD=12 V, INx = 3.3 V, ENx = 3.3 V, TJ = 25°C, no load Figure 6-3. Start-Up and Quiescent Current Frequency (kHz) IDDO (mA) 1 2 3 4 5 67 10 20 30 50 70100 200 500 1000 0.5 1.5 2.5 3.5 4.5 4.5VDD 12VDD 26VDD Figure 6-4. Operating Supply Current (Both Outputs Switching) VDD Voltage (V) VDD Static Current (mA) 0.4 0.45 0.5 0.55 0.6 0.65 0.7 0.75 0.8 ON OFF Figure 6-5. Static Supply Current (Outputs in DC On or Off Condition) Figure 6-6. Disable Current (EN = 0 V) Temperature (°C) UVLO Threshold (V) -40 -20 0 20 40 60 80 100 120 140 160 3.78 3.81 3.84 3.87 3.9 3.93 3.96 3.99 4.02 4.05 4.08 4.11 Rise Fall Figure 6-7. VDD UVLO Threshold VDD (V) Input Threshold (V) 0.8 1.2 1.4 1.6 1.8 2.2 Rise Fall Figure 6-8. Input Thresholds UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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CLOAD = 1.8 nF Figure 6-15. Output Fall Time vs VDD CLOAD = 1.8 nF Figure 6-16. Output Rise and Fall Time vs Temperature VDD (V) Turn-on/Rising Propagation Delay (ns) 16.5 17.5 18.5 19.5 20.5 CLOAD = 1.8 nF Figure 6-17. Input to Output Rising (Turn-On) Propagation Delay vs VDD VDD (V) Turn-off/Falling Propagation Delay (ns) 19.5 20.5 21.5 22.5 23.5 CLOAD = 1.8 nF Figure 6-18. Input to Output Falling (Turn-Off) Propagation Delay vs VDD CLOAD = 1.8 nF Figure 6-19. Input Propagation Delay vs Temperature VDD (V) Enable Propagation Delay (ns) 17.5 18.5 19.5 20.5 CLOAD = 1.8 nF Figure 6-20. Enable to Output Rising Propagation Delay UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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7 Detailed Description

7.1 Overview

The UCC27624-Q1 device represents TI's latest generation of dual-channel, low-side, high-speed, gate driver devices featuring 5-A source and sink current capability, fast switching characteristics, and a host of other features. UCC27624-Q1 Features and Benefits details the advantages of the gate driver's features, which combine to ensure efficient, robust, and reliable operation in high-frequency switching power circuits. The robust inputs of UCC27624-Q1 can handle –10 V, ensuring reliable operation in noisy environments. The driver has good transient handling capability on its output due to its reverse current handling, as well as rail-to-rail output drive, and a small propagation delay (typically 17 ns). With this built-in robustness, the UCC27624-Q1 device can also be directly connected to a gate drive transformer. The input threshold of UCC27624-Q1 is compatible with TTL low-voltage logic, which is fixed and independent of VDD supply voltage. The driver can also work with CMOS-based controllers as long as the threshold requirement is met. The 1-V typical hysteresis offers excellent noise immunity. Each channel has an enable pin, ENx, with a fixed TTL compatible threshold. The ENx pins are internally pulled up. Pulling ENx low disables the corresponding channel, while leaving ENx open provides normal operation. The ENx pins can be used as an additional input with the same performance as the INx pins. Table 7-1. UCC27624-Q1 Features and Benefits FEATURE BENEFIT –10-V IN and EN capability Enhanced signal reliability and device robustness in noisy environments that experience ground bounce on the gate driver 17-ns (typical) propagation delay Extremely low-pulse transmission distortion 1-ns (typical) delay matching between channels Ease of paralleling outputs for higher (two times) current capability. This helps when driving parallel-power switches. Expanded VDD operating range of 4.5 V to 26 V Flexibility in system design. Covers a wide range of power switches Expanded operating temperature range of –40°C to +150°C Flexibility in system design. System robustness improvement VDD UVLO protection Outputs are held low in UVLO condition, which ensures predictable, glitch-free operation at power-up and power-down. Outputs are held low when input pins (INx) are in floating condition. Protection feature, especially useful in passing abnormal condition tests during safety certification Outputs are enabled when enable pins (ENx) are in floating condition. Pin-to-pin compatibility with legacy devices from Texas Instruments in designs where Pin 1 and Pin 8 are "No Connect" pins Input and enable threshold with wide hysteresis Enhanced noise immunity while retaining compatibility with microcontroller logic-level input signals (3.3 V, 5 V) optimized for digital power Inputs independent of VDD System simplification, especially related to auxiliary bias supply architecture UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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7.2 Functional Block Diagram

Typical ENx pullup resistance is 200 kΩ and INx pulldown resistance is 120 kΩ.

7.3 Feature Description

7.3.1 Operating Supply Current

The UCC27624-Q1 device features low quiescent I DD currents. The typical operating supply current in UVLO state and fully-on state (under static and switching conditions) are summarized in the Electrical Characteristics table. The lowest quiescent current (I DD) is achieved when the device is fully on and the outputs are in a static state (DC high or DC low). During this state, all of the internal logic circuits of the device are fully operational. The total supply current is the sum of the quiescent I DD current, the average I OUT current because of switching, and any current related to pullup resistors on the enable pins. Knowing the operating switching frequency (f SW) and the MOSFET gate charge (Q G) at the drive voltage being used, the average I OUT current can be calculated as product of QG and fSW. Typical Characteristics provides a complete characterization of the I DD current as a function of switching frequency at different V DD bias voltages. The linear variation and close correlation with the theoretical value of the average I OUT indicate a negligible shoot-through inside the gate driver device, displaying its high-speed characteristics.

7.3.2 Input Stage

The input pins of the UCC27624-Q1 gate driver device are based on a TTL compatible input threshold logic that is independent of the VDD supply voltage. With a high threshold of 2 V and a low threshold of 1 V, the logic level thresholds are conveniently driven with PWM control signals derived from 3.3-V and 5-V digital power controller devices. Wider hysteresis (1-V typical) offers enhanced noise immunity compared to traditional TTL logic implementations, where the hysteresis is typically less than 0.5 V. UCC27624-Q1 devices also feature tight control of the input pin threshold voltage levels, which eases system design considerations and ensures stable operation across temperature (refer to Typical Characteristics). The very low input capacitance on these pins reduces loading and increases switching speed. www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 13 Product Folder Links: UCC27624-Q1

The UCC27624-Q1 device features an important protection feature that holds the output of a channel low when the respective input pin is in a floating condition. This is achieved through the internal pulldown resistors to ground on both of the input pins (INA, INB), as shown in . The input pins can handle wide range of slew rate. In most power supply applications, the gate driver is either driven by the output of a digital controller or logic gates. Therefore, in most applications the input signal slew rate is fast and is no concern for the UCC27624 family of devices. The wide hysteresis offered in UCC27624-Q1 alleviates the concern of chattering compared to many other drivers that have very small hysteresis at the input. If limiting the rise or fall times to the power device is the primary goal, then an external gate resistor is highly recommended between the output of the driver and the gate of the switching power device. This external resistor has the additional benefit of reducing part of the gate-charge related power dissipation in the gate driver device package and transferring it into the external resistor itself. In short, some of the power gets dissipated in the gate resistor rather than inside of the gate driver. Additionally, the input pins of UCC27624-Q1 are capable of handling –10 V. This improves the system robustness in noisy (electrical) applications. This also enables the driver to directly connect to the output of a gate drive transformer without the use of rectifying diodes, which saves board space and BOM cost.

7.3.3 Enable Function

The enable function is an extremely beneficial feature in gate driver devices, especially for certain applications such as synchronous rectification where the driver outputs are disabled in light-load conditions to prevent negative current circulation and to improve light-load efficiency. The UCC27624-Q1 device is equipped with independent enable pins (ENx) for exclusive control of each driver channel operation. The enable pins are based on a non-inverting configuration (active-high operation). Thus, when ENx pins are driven high, the drivers are enabled and when ENx pins are driven low, the driver outputs are disabled. Similar to the input pins, the enable pins are also based on a TTL compatible threshold logic that is independent of the supply voltage and are effectively controlled using logic signals from 3.3-V or 5-V controllers. The UCC27624-Q1 device also features tight control of the enable-function threshold-voltage levels which eases system design considerations and ensures stable operation across temperature. The ENx pins are internally pulled up to VDD using pullup resistors, as a result of which the outputs of the device are enabled in the default state. Hence even if the ENx pins are left floating the driver output is enabled. Essentially, this floating allows the UCC27624-Q1 device to be pin-to-pin compatible with TI’s previous generation of drivers (UCC27324, UCC27424, UCC27524), where Pin 1 and Pin 8 are either ENx or N/C pins. If the channel A and channel B inputs and outputs are connected in parallel to increase the driver current capacity, ENA and ENB must be connected and driven together. The ENx pins of the UCC27624-Q1 are capable of handling –10 V, which improves system robustness in noisy (electrical) applications.

7.3.4 Output Stage

The UCC27624-Q1 device output stage features a unique architecture on the pullup structure, which delivers the highest peak source current when it is most needed, during the Miller plateau region of the power switch turn-on transition (when the power switch drain or collector voltage experiences dV/dt). The device output stage features a hybrid pullup structure using a parallel arrangement of N-Channel and P-Channel MOSFET devices. By turning on the N-Channel MOSFET during a narrow instant when the output changes state from low to high, the gate driver device is able to deliver a brief boost in the peak sourcing current enabling fast turn-on. The on-resistance of this N-channel MOSFET (RNMOS) is approximately 1.04 Ω when activated. UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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R R RNMOS ,Pull Up VDD ROH ROL Narrow Pulse at each Turn On Input Signal An Shoot- Through Circuitry Figure 7-1. UCC27624-Q1 Gate Driver Output Structure The ROH parameter is a DC measurement and it is representative of the on-resistance of the P-Channel device only. This is because the N-Channel device is held in the off state in DC condition and is turned-on only for a narrow instant when output changes state from low to high. Note that effective resistance of the UCC27624-Q1 pull-up stage during the turn-on instance is much lower than what is represented by ROH parameter. The pull-down structure in the UCC27624-Q1 device is simply comprised of a N-Channel MOSFET. The R OL parameter, which is also a DC measurement, is representative of the impedance of the pull-down stage in the device. Each output stage in the UCC27624-Q1 device is capable of supplying 5-A peak source and 5-A peak sink current pulses. The output voltage swings between VDD and GND providing rail-to-rail operation, thanks to the MOS-output stage which delivers very low dropout. The presence of the MOSFET-body diodes also offers low impedance to transient overshoots and undershoots. The outputs of these drivers are designed to withstand 5A of peak reverse current transients without damage to the device. The UCC27624-Q1 device is particularly suited for dual-polarity, symmetrical drive-gate transformer applications where the primary winding of transformer driven by OUTA and OUTB, with inputs INA and INB being driven complementary to each other. This is possible because of the extremely low dropout offered by the MOS output stage of these devices, both during high (V OH) and low (V OL) states along with the low impedance of the driver output stage. All of these allow alleviate concerns regarding transformer demagnetization and flux imbalance. The low propagation delays also ensure proper reset for high-frequency applications. For applications that have zero voltage switching during power MOSFET turn-on or turn-off interval, the driver supplies high-peak current for fast switching even though the miller plateau is not present. This situation often occurs in synchronous rectifier applications because the body diode is generally conducting before power MOSFET is switched on.

7.3.5 Low Propagation Delays and Tightly Matched Outputs

The UCC27624-Q1 driver device features a very small, 17-ns (typical) propagation delay between input and output, which offers the lowest level of pulse width distortion for high-frequency switching applications. For example, in synchronous rectifier applications, the SR MOSFETs are driven with very low distortion when a single driver device is used to drive the SR MOSFETs. Additionally, the driver devices also feature extremely accurate, 1-ns (typical) matched internal propagation delays between the two channels, which is beneficial for applications that require dual gate drives with critical timing. For example, in a PFC application, a pair of paralleled MOSFETs can be driven independently using each output channel, with the inputs of both channels driven by a common control signal from the PFC controller. In this case, the 1-ns delay matching ensures that the paralleled MOSFETs are driven in a simultaneous fashion, minimizing turn-on and turn-off delay differences. Another benefit of the tight matching between the two channels is that the two channels can be connected together to effectively double the drive current capability. That is, A and B channels may be combined into a single driver by connecting the INA and INB inputs together and the OUTA and OUTB outputs together; then, a single signal controls the paralleled power devices. www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 15 Product Folder Links: UCC27624-Q1

7.4 Device Functional Modes

Table 7-2. Device Logic Table ENA ENB INA INB UCC27624-Q1 OUTA OUTB H H L L L L H L H H L H L H H H L L Any Any L L Any Any Float Float L L Float Float L L L L H L H H L H L H H H UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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8 Application and Implementation

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality.

8.1 Application Information

High-current gate driver devices are required in switching power applications for a variety of reasons. In order to achieve fast switching of power devices and reduce associated switching-power losses, a powerful gate driver device is employed between the PWM output of control devices and the gates of the power semiconductor devices. Further, gate driver devices are indispensable when it is not feasible for the PWM controller device to directly drive the gates of the switching devices. With the advent of digital power, this situation is often encountered because the PWM signal from the digital controller is often a 3.3-V logic signal which is not capable of effectively turning ON a power switch. A level-shifting circuitry is required to boost the 3.3-V signal to the gate-drive voltage (such as 12 V) in order to fully turn ON the power device and minimize conduction losses. Traditional buffer-drive circuits based on NPN/PNP bipolar transistors in a totem-pole arrangement, as emitter-follower configurations, prove inadequate with digital power because the traditional buffer-drive circuits lack level-shifting capability. Gate driver devices effectively combine both the level-shifting and buffer-drive functions. Gate driver devices also find other needs ,such as minimizing the effect of high frequency switching noise by locating the high-current driver physically close to the power switch, driving gate-drive transformers and controlling floating power device gates, reducing power dissipation and thermal stress in controller devices by moving gate-charge power losses into the controller. Finally, emerging wide band-gap power device technologies, such as SiC MOSFETs and GaN switches, which are capable of supporting very high switching frequency operation, are driving special requirements in terms of gate-drive capability. These requirements include a wide operating voltage range (5 V to 26 V), low propagation delays, good delay matching, and availability in compact, low inductance packages with good thermal capability. In summary, gate driver devices are an extremely important component in switching power combining benefits of high performance, low cost, low component count, board space reduction, and simplified system design. www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 17 Product Folder Links: UCC27624-Q1

8.2 Typical Application

Figure 8-1. UCC27624-Q1 Typical Application Diagram

8.2.1 Design Requirements

When selecting and designing-in the gate driver device for an end application, some functional aspects must be considered and evaluated first, in order to make the most appropriate selection. Among these considerations are bias voltage, UVLO, drive current, and power dissipation.

8.2.2 Detailed Design Procedure

8.2.2.1 VDD and Undervoltage Lockout

The UCC27624-Q1 device has an internal undervoltage-lockout (UVLO) protection feature on the VDD pin supply circuit blocks. When VDD is rising and the level is still below UVLO threshold, this circuit holds the output low, regardless of the status of the inputs. The UVLO is typically 4 V with 300-mV typical hysteresis. This hysteresis prevents chatter when VDD supply voltages have noise, specifically at the lower end of the VDD operating range. UVLO hysteresis is also important to avoid any false tripping due to the bias noise generated because of fast switching transitions, where large peak currents are drawn from the bias supply bypass capacitors. The driver capability to operate at wide bias voltage range, along with good switching characteristics, is especially important in driving emerging power semiconductor devices, such as advanced low gate charge fast MOSFETs, GaN FETs, and SiC MOSFETs. At power-up, the UCC27624-Q1 driver device output remains low until the VDD voltage reaches the UVLO rising threshold, irrespective of the state of any other input pins such as INx and ENx. After the UVLO rising threshold, the magnitude of the OUT signal rises with VDD until steady-state VDD is reached. For the best high-speed circuit performance and to prevent noise problems because the device draws current from the VDD pin to bias all internal circuits, use two VDD bypass capacitors. Also, use surface mount, low ESR capacitors. A 0.1- μF ceramic capacitor should be located less than 1 mm from the VDD to GND pins of the gate-driver device. In addition, a larger capacitor ( ≥1 μF) must be connected in parallel (also as close to the driver IC as possible) to help deliver the high-current peaks required by the load. The parallel combination of capacitors presents a low impedance characteristic for the expected current levels and switching frequencies in the application. UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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Figure 8-2. Power-Up Sequence

8.2.2.2 Drive Current and Power Dissipation

The UCC27624-Q1 driver is capable of delivering 5 A of peak current to a switching power device gate (MOSFET, IGBT, SiC MOSFET, GaN FET) for a period of several-hundred nanoseconds at VDD = 12 V. High peak current is required to turn ON the device quickly. Then, to turn the device OFF, the driver is required to sink a similar amount of current to ground, which repeats at the operating switching frequency of the power device. The power dissipated in the gate driver device package depends on the following factors:

• Gate charge of the power MOSFET (usually a function of the drive voltage VGS, which is very close to input bias supply voltage VDD due to low VOH drop-out).
• Switching frequency
• External gate resistors Because UCC27624-Q1 features low-quiescent currents and internal logic to eliminate any shoot-through in the output driver stage, their effect on the power dissipation within the gate driver is very small compared to the losses due to switching of the power device. When a driver device is tested with a discrete capacitive load, calculating the power that is required from the bias supply is fairly simple. The following equation provides an example of the energy that must transfer from the bias supply to charge the capacitor. G LOAD DD 1E C V2/c61 (1) where
• CLOAD is the load capacitor.
• VDD is the bias voltage of the driver. There is an equal amount of energy dissipated when the capacitor is discharged. This leads to a total power loss, as shown in the following equation example. G LOAD DD SWP C V f/c61 (2) where
• fSW is the switching frequency. With VDD = 12 V, CLOAD = 10 nF and fSW = 300 kHz, the switching power loss is calculated as follows: GP 10 nF 12 V 300 kHz 0.432 W/c61 /c180 /c180 /c61 (3) www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 19 Product Folder Links: UCC27624-Q1

The switching load presented by a power MOSFET is converted to an equivalent capacitance by examining the gate charge required to switch the device. This gate charge includes the effects of the input capacitance plus the added charge needed to swing the drain voltage of the power device as it switches between the ON and OFF states. Most manufacturers provide specifications that provide the typical and maximum gate charge, in nC, to switch the device under specified conditions. Using the gate charge Q g, the power that must dissipate when charging a capacitor is determined, which by using the equivalence Q g = C LOADVDD is shown in the following equation. G LOAD DD SW g DD SWP C V f Q V f/c61 /c61 (4) Assuming that the UCC27624-Q1 device is driving power MOSFET with 60 nC of gate charge (Q g = 60 nC at VDD = 12 V) on each output, the gate charge related power loss is calculated using the equation below. GP 2 x 60 nC 12 V 300 kHz 0.432 W/c61 /c180 /c180 /c61 (5) This power PG is dissipated in the resistive elements of the circuit when the MOSFET turns on or turns off. Half of the total power is dissipated when the load capacitor is charged during turn-on, and the other half is dissipated when the load capacitor is discharged during turn-off. When no external gate resistor is employed between the driver and MOSFET/IGBT, this power is completely dissipated inside the driver package. With the use of external gate resistors, the power dissipation is shared between the internal resistance of driver and external gate resistor in accordance to the ratio of the resistances (more power dissipated in the higher resistance component). Based on this simplified analysis, the driver power dissipation during switching is calculated as follows: OFF ON SW G SW OFF GATE ON GATE R RP 0.5 Q VDD f R R R R /c230 /c246/c61 /c180 /c180 /c180 /c180 /c43 /c231 /c247 /c43 /c43/c232 /c248 (6) where

• ROFF = ROL
• RON (effective resistance of pull-up structure) The above equation is necessary when the external gate resistor is large enough to reduce the peak current of the driver. In addition to the above gate-charge related power dissipation, dissipation in the driver is related to the power associated with the quiescent bias current consumed by the device to bias all internal circuits such as input stage (with pullup and pulldown resistors), enable, and UVLO sections. As shown in the electrical characteristics table, the quiescent current is less than 1 mA. The power loss due to DC current consumption of the driver internal circuit can be calculated as below. Q DD DDP I V/c61 (7) Assuming total internal current consumption to be 0.6 mA (typical) at bias voltage of 12 V, the DC power loss in the driver is: QP 0.6 mA 12 V 7.2 mW/c61 /c180 /c61 (8) This power loss is insignificant compared to gate charge related power dissipation calculated earlier. With a 12-V supply, the bias current is estimated as follows, with an additional 0.6-mA overhead for the quiescent consumption: G DD DD P 0.432 WI ~ 0.036 AV 12 V/c61 /c61 (9) UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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If the gate driver is used with inductive load, then special attention should be paid to the ringing on each pin of the gate driver device. The ringing should not exceed the recommended operating rating of the pin.

8.2.3 Application Curves

The figures below show the typical switching characteristics of the UCC27624-Q1 device used in high-voltage boost converter application. In this application, the UCC27624-Q1 is driving the IGBT switch that has a gate charge of 110 nC. VDD OUTB GND Input Logic CVDD VBias Vout Vin ENA INA To Load ENB OUTA INB From Controller LBoost Figure 8-3. UCC27624-Q1 Used to Drive IGBT in the Boost Converter Vin = 210 V, Vout = 235 V, Iout = 1.14 A, Fsw = 125 kHz, driver supply voltage = 15 V, gate resistor = 0 Ω Figure 8-4. Turn-On Propagation Delay Waveform Vin = 210 V, Vout = 235 V, Iout = 1.14 A, Fsw = 100 kHz, driver supply voltage = 15 V, gate resistor = 0 Ω Figure 8-5. Turn-Off Propagation Delay Waveform www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: UCC27624-Q1

9 Power Supply Recommendations

The bias supply voltage range for the UCC27624-Q1 device is rated to operate is from 4.5 V to 26 V. The lower end of this range is governed by the internal undervoltage-lockout (UVLO) protection feature on the V DD pin supply circuit blocks. If the driver is in a UVLO condition when the V DD pin voltage is below the VDD UVLO turn-on (rising) threshold, the UVLO protection feature holds the output low, regardless of the status of the inputs. The upper end of this range is driven by the 30-V absolute maximum voltage rating of the VDD pin of the device (which is a stress rating). It is necessary to have sufficient margin from the absolute maximum rating of the device to realize full operating life of the device. Therefore, the upper limit of recommended voltage of the VDD pin is 26 V. The UVLO protection feature also has a hysteresis function. This means, when the VDD pin bias voltage exceeds the rising threshold voltage, the device begins to operate normally. If the VDD bias voltage drops below the rising threshold while on, the device continues to deliver normal functionality unless the voltage drop exceeds the hysteresis specification of the falling threshold. Therefore, while operating at or near the 4.5-V, design engineer should ensure that the voltage ripple on the auxiliary power supply output is smaller than the hysteresis specification of the device. Otherwise, the device output may turn-off. During system shutdown, the device operation continues until the VDD pin voltage has dropped below the VDD turn-off (falling) threshold, which must be accounted for while evaluating system shutdown timing or sequencing requirements. At system startup, the device does not begin operation until the VDD pin voltage has exceeded VDD turn-on (rising) threshold. The quiescent current consumed by the internal circuit blocks of the device is supplied through the VDD pin. Although this fact is well known, recognizing that the charge for source current pulses delivered by the OUTA/B pin is also supplied through the same VDD pin capacitor, is important. As a result, every time a current is sourced out of the output pins, a corresponding current pulse is delivered into the device through the VDD pin. Thus, ensure that the local bypass capacitors are provided between the VDD and GND pins and locate them as close to the device pins as possible for the purpose of decoupling. A low ESR, ceramic surface mount capacitor is required. TI recommends having two capacitors: a 0.1- μF ceramic surface-mount capacitor placed less than 1 mm from the VDD pin of the device and another larger ceramic capacitor (≥1 μF) must be connected in parallel. UCC27624-Q1 is a high-current gate driver. If the gate driver is placed far from the switching power device, such as a MOSFET, then that could create a large inductive loop. A large inductive loop may cause excessive ringing on any and all pins of the gate driver. This may result in stress that exceeds device recommended ratings. Therefore, place the gate driver as close to the switching power device as possible. Also, use an external gate resistor to damp any ringing due to the high switching currents and board parasitic elements. UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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10 Layout

10.1 Layout Guidelines

Proper PCB layout is extremely important in a high-current fast-switching circuit to provide appropriate device operation and design robustness. The UCC27624-Q1 gate driver incorporates small propagation delays and powerful output stages capable of delivering large current peaks with very fast rise and fall times at the gate of power MOSFET to facilitate very quick voltage transitions. Very high di/dt causes unacceptable ringing if the trace lengths and impedances are not well controlled. The following circuit layout guidelines are recommended when designing with these high-speed drivers.

• Place the driver IC as close as possible to the power device in order to minimize the length of high-current traces between the driver IC output pins and the gate of the switching power device.
• Place the VDD bypass capacitors between VDD and GND as close as possible to the driver IC with minimal trace length to improve the noise filtering. These capacitors support high peak current being drawn from VDD pin, during turn-on of power MOSFET. The use of low inductance surface-mounted-device (SMD) components such as 50V rated X7R chip capacitors are highly recommended.
• The turn-on and turn-off current loop paths (driver device, power MOSFET and VDD bypass capacitor) must be minimized as much as possible in order to keep the stray inductance to a minimum. High dI/dt is established in these loops at two instances, namely during turn-on and turn-off transients, which induces significant voltage transients on the output pin of the driver device and Gate of the power MOSFET.
• Wherever possible, parallel the source and return traces to take advantage of flux cancellation.
• Separate power traces and signal traces, such as output and input signals.
• To minimize switch node transients and ringing, adding some gate resistance and/or snubbers on the power devices may be necessary. These measures may also reduce EMI.
• Star-point grounding is a good way to minimize noise coupling from one current loop to another. The GND of the driver is connected to the other circuit nodes such as source of power MOSFET and ground of PWM controller at one, single point. The connected paths must be as short as possible to reduce inductance and be as wide as possible to reduce resistance.
• Use a ground plane to provide noise shielding. Fast rise and fall times at OUT pin of the driver IC may corrupt the input signals of the driver IC. The ground plane must not be a conduction path for any high current (power stage) loop. Instead the ground plane must be connected to the star-point with one single trace to establish the ground potential. In addition to noise shielding, the ground plane can help in power dissipation as well
• External gate resistor and parallel diode-resistor combination may come in handy when replacing any gate driver IC with UCC27624-Q1 device in existing or new designs, specifically if they do not have the same drive strength. www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 23 Product Folder Links: UCC27624-Q1

10.2 Layout Example

(bypass capacitor) Figure 10-1. UCC27624-Q1 Layout Example

10.3 Thermal Considerations

The useful range of a driver is greatly affected by the drive power requirements of the load and the thermal characteristics of the device package. In order for a gate driver device to be useful over a particular temperature range, the package must allow for the efficient removal of the heat produced, while keeping the junction temperature within the specified limit. For detailed information regarding the thermal information table, please refer to the Semiconductor and IC Package Thermal Metrics Application Note (SPRA953). Among the different package options available for the UCC27624-Q1 device, power dissipation capability of the DGN package is of particular mention. The VSSOP-8 (DGN) package offers thermal pad for removing the heat from the semiconductor junction through the bottom of the package. This pad is soldered to the copper on the printed circuit board directly underneath the device package, reducing the thermal resistance to a very low value. This allows a significant improvement in heat-sinking over the D package. The printed circuit board must be designed with thermal lands and thermal vias to complete the heat removal subsystem. Note that the exposed pads in the VSSOP-8 package are not directly connected to any leads of the package, however, PowerPAD is thermally connected to the substrate of the device. TI recommends to externally connect the exposed pads to GND pin of the driver IC in PCB layout. UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 www.ti.com ADVANCE INFORMATION

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11 Device and Documentation Support

11.1 Third-Party Products Disclaimer

TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.

11.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Subscribe to updates to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

11.3 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

11.4 Trademarks

PowerPAD™ is a trademark of Texas Instruments. TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners.

11.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

11.6 Glossary

TI Glossary This glossary lists and explains terms, acronyms, and definitions.

12 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. www.ti.com UCC27624-Q1 SLUSES4A – MARCH 2022 – REVISED MAY 2022 ADVANCE INFORMATION Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 25 Product Folder Links: UCC27624-Q1

www.ti.com 12-Jun-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead finish/ Ball material (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples PUCC27624QDRQ1 ACTIVE SOIC D 8 3000 TBD Call TI Call TI -40 to 150 Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF UCC27624-Q1 : Addendum-Page 1

www.ti.com 12-Jun-2022

• Catalog : UCC27624 NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product Addendum-Page 2

www.ti.com PACKAGE OUTLINE C .228-.244 TYP [5.80-6.19] .069 MAX [1.75] 6X .050 [1.27] 8X .012-.020 [0.31-0.51] .150 [3.81] .005-.010 TYP [0.13-0.25] 0 - 8 .004-.010 [0.11-0.25] .010 [0.25].016-.050 [0.41-1.27] 4X (0 -15 ) A .189-.197 [4.81-5.00] NOTE 3 B .150-.157 [3.81-3.98] NOTE 4 4X (0 -15 ) (.041) [1.04] SOIC - 1.75 mm max heightD0008A SMALL OUTLINE INTEGRATED CIRCUIT 4214825/C 02/2019 NOTES: 1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not exceed .006 [0.15] per side. 4. This dimension does not include interlead flash. 5. Reference JEDEC registration MS-012, variation AA. 1 8 .010 [0.25] C A B PIN 1 ID AREA SEATING PLANE .004 [0.1] C SEE DETAIL A DETAIL A TYPICAL SCALE 2.800

www.ti.com EXAMPLE BOARD LAYOUT .0028 MAX [0.07] ALL AROUND .0028 MIN [0.07] ALL AROUND (.213) [5.4] 6X (.050 ) [1.27] 8X (.061 ) [1.55] 8X (.024) [0.6] (R.002 ) TYP [0.05] SOIC - 1.75 mm max heightD0008A SMALL OUTLINE INTEGRATED CIRCUIT 4214825/C 02/2019 NOTES: (continued) 6. Publication IPC-7351 may have alternate designs. 7. Solder mask tolerances between and around signal pads can vary based on board fabrication site. METAL SOLDER MASK OPENING NON SOLDER MASK DEFINED SOLDER MASK DETAILS EXPOSED METAL OPENING SOLDER MASK METAL UNDER SOLDER MASK SOLDER MASK DEFINED EXPOSED METAL LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE:8X SYMM 4 5 SEE DETAILS SYMM

www.ti.com EXAMPLE STENCIL DESIGN 8X (.061 ) [1.55] 8X (.024) [0.6] 6X (.050 ) [1.27] (.213) [5.4] (R.002 ) TYP [0.05] SOIC - 1.75 mm max heightD0008A SMALL OUTLINE INTEGRATED CIRCUIT 4214825/C 02/2019 NOTES: (continued) 8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. 9. Board assembly site may have different recommendations for stencil design. SOLDER PASTE EXAMPLE BASED ON .005 INCH [0.125 MM] THICK STENCIL SCALE:8X SYMM SYMM 4 5

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