Microcontroller

PRM57L843ZWTT

Texas Instruments

Microcontroller Based on the ARM

Manufacturer: Texas Instruments

Document: 218 Pages / 8Mb

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PRODUCT□PREVIEW Product Folder Sample & Buy T echnical Documents Tools & Software Support & Community An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCT PREVIEW Information. Product in design phase of development. Subject to change or discontinuance without notice. RM57L843 SPNS215B – FEBRUARY 2014– REVISED JANUARY 2016 RM57L843Hercules™ MicrocontrollerBasedontheARM®Cortex®-RCore

1 Device Overview

1.1 Features

High-Performance Microcontroller for Safety- Critical Applications – Dual-Core Lockstep CPUs With ECC-Protected Caches – ECC on Flash and RAM Interfaces – Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs – Error Signaling Module (ESM) With Error Pin – Voltage and Clock Monitoring
ARM® Cortex® - R5F 32-Bit RISC CPU – 1.66 DMIPS/MHz With 8-Stage Pipeline – FPU With Single- and Double-Precision – 16-Region Memory Protection Unit (MPU) – 32KB of Instruction and 32KB of Data Caches With ECC – Open Architecture With Third-Party Support
Operating Conditions – Up to 330-MHz CPU Clock – Core Supply Voltage (VCC): 1.14 to 1.32 V – I/O Supply Voltage (VCCIO): 3.0 to 3.6 V
Integrated Memory – 4MB of Program Flash With ECC – 512KB of RAM With ECC – 128KB of Data Flash for Emulated EEPROM With ECC
16-Bit External Memory Interface (EMIF)
Hercules™ Common Platform Architecture – Consistent Memory Map Across Family – Real-Time Interrupt (RTI) Timer (OS Timer) – Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
VIM1 and VIM2 in Safety Lockstep Mode – Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
Direct Memory Access (DMA) Controller – 32 Channels and 48 Peripheral Requests – ECC Protection for Control Packet RAM – DMA Accesses Protected by Dedicated MPU
Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
Separate Nonmodulating PLL
IEEE 1149.1 JTAG, Boundary Scan, and ARM CoreSight™ Components
Advanced JTAG Security Module (AJSM)
Trace and Calibration Capabilities – ETM™ , RTP, DMM, POM
Multiple Communication Interfaces – 10/100 Mbps Ethernet MAC (EMAC)
IEEE 802.3 Compliant (3.3-V I/O Only)
Supports MII, RMII, and MDIO – Four CAN Controller (DCAN) Modules
64 Mailboxes, Each With ECC Protection
Compliant to CAN Protocol Version 2.0B – Two Inter-Integrated Circuit (I2C) Modules – Five Multibuffered Serial Peripheral Interface (MibSPI) Modules
MibSPI1: 256 Words With ECC Protection
Other MibSPIs: 128 Words With ECC Protection – Four UART (SCI) Interfaces, Two With Local Interconnect Network (LIN 2.1) Interface Support
Two Next Generation High-End Timer (N2HET) Modules – 32 Programmable Channels Each – 256-Word Instruction RAM With Parity – Hardware Angle Generator for Each N2HET – Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
Two 12-Bit Multibuffered Analog-to-Digital Converter (MibADC) Modules – MibADC1: 32 Channels Plus Control for up to

1024 Off-Chip Channels

– MibADC2: 25 Channels – 16 Shared Channels – 64 Result Buffers Each With Parity Protection

Enhanced Timing Peripherals – 7 Enhanced Pulse Width Modulator (ePWM) Modules – 6 Enhanced Capture (eCAP) Modules – 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
Three On-Die Temperature Sensors
Up to 145 Pins Available for General-Purpose I/O (GPIO)
16 Dedicated GPIO Pins With External Interrupt Capability
Packages – 337-Ball Grid Array (ZWT) [Green]

1.2 Applications

Industrial Safety Applications – Industrial Automation – Safe Programmable Logic Controllers (PLCs) – Power Generation and Distribution – Turbines and Windmills – Elevators and Escalators
Medical Applications – Ventilators – Defibrillators – Infusion and Insulin Pumps – Radiation Therapy – Robotic Surgery

1.3 Description

The RM57L843 device is part of the Hercules RM series of high-performance ARM® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of IEC 61508 functional safety applications. Start evaluating today with the Hercules RM57x LaunchPad Development Kit. The RM57L843 device has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os. The RM57L843 device is a high-performance microcontroller family for safety systems. The device has Built-In Self-Test (BIST) logic for the CPU, the N2HET coprocessors, and for on-chip SRAMs. The device supports ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os. The RM57L843 device integrates two ARM Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66 DMIPS/MHz, and can run up to 330 MHz providing up to 547 DMIPS. The device supports the little-endian [LE] format. The RM57L843 device has 4MB of integrated flash and 512KB of data RAM with single-bit error correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3-V supply input (the same level as the I/O supply) for all read, program, and erase operations. The SRAM supports read and write accesses in byte, halfword, and word modes. The RM57L843 device features peripherals for real-time control-based applications, including two Next Generation High-End Timer (N2HET) timing coprocessors with up to 64 total I/O terminals. The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or GPIO. The N2HET is especially well suited for applications requiring multiple sensor information or drive actuators with complex and accurate time pulses. The High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU. The Enhanced Pulse Width Modulator (ePWM) module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports both high-side and low- side PWM and deadband generation. With integrated trip zone protection and synchronization with the on- chip MibADC, the ePWM is ideal for digital motor control applications. The Enhanced Capture (eCAP) module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when not needed for capture applications. The Enhanced Quadrature Encoder Pulse (eQEP) module directly interfaces with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems. The device has two 12-bit-resolution MibADCs with 41 total channels and 64 words of parity-protected buffer RAM. The MibADC channels can be converted individually or by group for special conversion sequences. Sixteen channels are shared between the two MibADCs. Each MibADC supports three separate groupings. Each sequence can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired. One of the channels in MibADC1 and two of the channels in MibADC2 can be used to convert temperature measurements from the three on-chip temperature sensors.

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Device Overview Copyright © 2014–2016, Texas Instruments Incorporated The device has multiple communication interfaces: Five MibSPIs; four UART (SCI) interfaces, two with LIN support; four CANs; two I2C modules; and one Ethernet controller. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard (LIN 2.1) and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring. The Ethernet module supports MII, RMII, and Management Data I/O (MDIO) interfaces. The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps. The Frequency-Modulated Phase-Locked Loop (FMPLL) clock module multiplies the external frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the mapping between the available clock sources and the internal device clock domains. The device also has two External Clock Prescaler (ECP) modules. When enabled, the ECPs output a continuous external clock on the ECLK1 and ECLK2 balls. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency. The Direct Memory Access (DMA) controller has 32 channels, 48 peripheral requests, and ECC protection on its memory. An MPU is built into the DMA to protect memory against erroneous transfers. The Error Signaling Module (ESM) monitors on-chip device errors and determines whether an interrupt or external Error pin/ball (nERROR) is triggered when a fault is detected. The nERROR signal can be monitored externally as an indicator of a fault condition in the microcontroller. The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous memories or other slave devices. A Parameter Overlay Module (POM) is included to enhance the debugging capabilities of application code. The POM can reroute flash accesses to internal RAM or to the EMIF, thus avoiding the reprogramming steps necessary for parameter updates in flash. This capability is particularly helpful during real-time system calibration cycles. Several interfaces are implemented to enhance the debugging capabilities of application code. In addition to the built-in ARM Cortex-R5F CoreSight debug features, the Embedded Cross Trigger (ECT) supports the interaction and synchronization of multiple triggering events within the SoC. An External Trace Macrocell (ETM) provides instruction and data trace of program execution. For instrumentation purposes, a RAM Trace Port (RTP) module is implemented to support high-speed tracing of RAM and peripheral accesses by the CPU or any other master. A Data Modification Module (DMM) gives the ability to write external data into the device memory. Both the RTP and DMM have no or minimal impact on the program execution time of the application code. With integrated safety features and a wide choice of communication and control peripherals, the RM57L843 device is an ideal solution for high-performance real-time control applications with safety- critical requirements. (1) For more information on these devices, see Section 10, Mechanical Packaging and Orderable Information. Device Information(1) PART NUMBER PACKAGE BODY SIZE RM57L843ZWT NFBGA (337) 16.00 mm × 16.00 mm

PRODUCT□PREVIEW HTU1 HTU2 Peripheral Interconnect Subsystem CRC 1,2 PCR2 PCR3 EMAC Slaves DCAN1 DCAN2 DCAN3 LIN1/ SCI1 MibSPI4 MDIO MII MibSPI1 CAN1_RX CAN1_TX CAN2_RX CAN2_TX CAN3_RX CAN3_TX MIBSPI1_CLK MIBSPI1_SIMO[1:0] MIBSPI1_SOMI[1:0] MIBSPI1_nCS[5:0] MIBSPI1_nENA MibSPI2 MIBSPI2_CLK MIBSPI2_SIMO MIBSPI2_SOMI MIBSPI2_nCS[1:0] MIBSPI2_nENA MibSPI3 MIBSPI3_CLK MIBSPI3_SIMO MIBSPI3_SOMI MIBSPI3_nCS[5:0] MIBSPI3_nENA MIBSPI4_CLK MIBSPI4_SIMO MIBSPI4_SOMI MIBSPI4_nCS[5:0] MIBSPI4_nENA MibSPI5 MIBSPI5_SIMO[3:0] MIBSPI5_SOMI[3:0] MIBSPI5_nCS[5:0] MIBSPI5_nENA LIN1_RX LIN1_TX IOMM PMM Lockstep VIMs RTI DCC1 DMA MDCLK MDIO MII_RXD[3:0] MII_RXER MII_TXD[3:0] MII_TXEN MII_TXCLK MII_RXCLK MII_CRS MII_RXDV MII_COL EMIF EMIF_CLK EMIF_CKE EMIF_nCS[4:2] EMIF_nCS[0] EMIF_ADDR[21:0] EMIF_BA[1:0] EMIF_DATA[15:0] EMIF_nDQM[1:0] EMIF_nOE EMIF_nWE EMIF_nRAS EMIF_nCAS EMIF_nRW EMIF_nWAIT SYSnPORRST nRST ECLK[2:1] ESM eQEP 1,2 eQEPxA eQEPxB eQEPxS eQEPxI eCAP 1..6 eCAP[6:1] ePWM 1..7 nTZ[3:1] SYNCO SYNCI ePWMxA ePWMxB N2HET1 GION2HET2 GIOB[7:0]GIOA[7:0] N2HET1[31:0] N2HET1_PIN_nDISN2HET2_PIN_nDIS MibADC1 MibADC2 VSSADVCCAD ADREFHIADREFLO NMPU EMAC # 2 # 3 # 6 # 1always on Core/RAM Core # 5 Color Legend for Power Domains DCAN4 CAN4_RX CAN4_TX PCR1 LIN2/ SCI2 LIN2_RX LIN2_TX SCI3 SCI3_RX SCI3_TX SCI4 SCI4_RX SCI4_TX I2C1 I2C1_SDA I2C1_SCL I2C2 I2C2_SDA I2C2_SCL EMIF Slave CPU Interconnect Subsystem Dual Cortex -R5F CPUs in lockstep 32kB Icache & Dcache w / ECC POM 4MB Flash 128kB Flash for EEPROM Emulation w/ ECC 512kB SRAM ECC NMPU NMPU STC1 EPC SCM SYS DCC2 STC2 DMMDAP CCM- R5F RTP nTRST TMS TCK RTCKTDI TDODMMnENA DMMSYNC DMMCLK DMMDATA[15:0] TPIU RTPnENA RTPSYNCRTPCLK RTPDATA[15:0]ETMDATA[31:0 ETMTRACECTLETMTRACECLK ETMTRACECLKIN MIBSPI5_CLK N2HET2[31:0] AD1IN[15:8]/AD2IN[15:8] AD2EVT AD1IN[23:16]/AD2IN[7:0] AD1IN[7:0] AD1EVT AD2IN[24:16]AD1IN[31:24] nERROR uSCU AD1EXT_ENA AD1EXT_SEL[4:0] RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Device OverviewCopyright © 2014–2016, Texas Instruments Incorporated

1.4 Functional Block Diagram

Figure 1-1 shows the functional block diagram of the device. Figure 1-1. Functional Block Diagram

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Table of Contents Copyright © 2014–2016, Texas Instruments Incorporated Table of Contents

4.1 ZWT BGA Package Ball-Map (337 Terminal Grid

5.5 Switching Characteristics over Recommended

5.8 Input/Output Electrical Characteristics Over

5.9 Thermal Resistance Characteristics for the BGA

6 System Information and Electrical

6.12 ECC / Parity Protection for Accesses to peripheral

7 Peripheral Information and Electrical

7.4 Multibuffered 12-bit Analog-to-Digital Converter... 163

7.11 Multibuffered / Standard Serial Peripheral

2 Revision History

This data manual revision history highlights the technical changes made to the SPNS215A device-specific data manual to make it an SPNS215B revision. Changes from May 19, 2014 to January 31, 2016 (from A Revision (May 2014) to B Revision) Page

Global: Updated/Changed document title to include "Hercules™ Microcontroller Based on the ARM® Cortex®-R
Section 1.3 (Description): Updated/Changed DMA description to "48 peripheral requests" versus " 32 control
Section 4.1 (ZWT BGA Package Ball-Map (337 Terminal Grid Array)): Updated/Changed pin D8 from
GLOBAL: Updated/Changed all refs for 337-ZWT ball R7 to
GLOBAL: Updated/Changed all refs for 337-ZWT ball R8 to
Table 4-21 (ZWT Test and Debug Modules Interface): Added additional DESCRIPTION information on the
Table 4-22 (ZWT Flash Supply and Test Pads): Added additional DESCRIPTION information on the FLTP1 and
Section 5.1 (Absolute Maximum Ratings): Moved Storage temperature range, Tstg back to Absolute Maximum
Section 5.9 (Thermal Resistance Characteristics for BGA Package (ZWT)): Updated/Changed Thermal
Table 5-4 (Switching Characteristics for Output Timings versus Load Capacitance (CL)): Changed rise and fall
Table 6-6 (nRST Timing Requirements): Updated/Changed tv(RST) MIN value after nPORRST inactive to
Section 6.5.6 (N2HET STC / LBIST Self-Test Coverage): Updated/Changed the N2HET STC maximum clock
Table 6-16: Updated/Changed HCLK Special Considerations "Divided from GCLK1 ..." bullet from
Table 6-16: Updated/Changed VCLK3 Special Considerations "Can be HCLK1, HCLK/2, ..." bullet from "or
Table 6-18 (Clock Test Mode Options for Signals on ECLK1): Updated/Changed the SIGNAL ON ECLK1
Table 6-19 (Clock Test Mode Options for Signals on N2HET1[12]): Updated/Changed the SIGNAL ON
Table 6-19: Updated/Changed 0110 SIGNAL ON N2HET1[12] from "Reserved" to "Secondary PLL Valid Status" .. 87

Table 6-24 (Glitch Filter Timing Specifications): Updated/Changed the Glitch filter MIN timings from 500 to
Table 6-28 (CPU Interconnect Subsystem SDC Register Bit Field Mapping): Corrected the bit field location of
Table 6-30 (EEPROM Flash Bank): Updated/Changed the SECTOR NO. information to now show 0 through 31. . 102
Section 6.14.2 (Electrical and Timing Specifications): Updated/Changed EMIF Address pins from
Table 6-36 (EMIF Asynchronous Memory Switching Characteristics): Updated/Changed PARAMETER NO. 18
Table 6-36 Line 25, Changed td(EMWAITH-EMWEH) minimum from 3E-3 to 3E+3, changed maximum from 4E+3 to
Table 6-39 (Interrupt Request Assignments): Added TRM names in VIM Interrupt Sources to match [Channels:
Table 6-39 (Interrupt Request Assignments): Clarified GIO interrupt source names in VIM Interrupt Sources
Table 6-39 (Interrupt Request Assignments): Clarified N2HET interrupt source names in VIM Interrupt Sources
Table 6-45 (ESM Channel Assignments): Added TRM names in ESM ERROR SOURCES to match [Channels:
Table 6-55 (ETMTRACECLK Timing): Updated/Changed the ETM Clock high and low pulse width MIN values
Figure 7-3 (Synchronizing Time Bases Between N2HET1, N2HET2 and ePWMx Modules): Updated/Changed
Table 7-2 (Connection to ePWMx Modules for Device-Level Trip Zone Inputs): Added "filter width is 6 VCLK3
Table 7-8 (Device-Level Input Connection to eCAPx Modules): Added "filter width is 6 VCLK3 cycles" footnote.... 159
Table 7-12 (Device-Level Input Connection to eQEPx Modules): Added "filter width is 6 VCLK3 cycles" footnote.. 162

Section 9.1.1 (Development Support): Updated/Changed the JTAG-based emuators specified under Hardware
Section 9.2.1 (Related Documentation from Texas Instruments): Added link to silicon revision B errata document 207
Section 9.2.2 (Receiving Notification of Documentation Updates): Added subsection identifying the Product
Section 9.6.1 (Device Identification Code Register): Added the address of the device identification code register.. 208

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Device Comparison Copyright © 2014–2016, Texas Instruments Incorporated (1) For additional device variants, see www.ti.com/rm (2) This table reflects the maximum configuration for each peripheral. Some functions are multiplexed and not all pins are available at the same time. (3) Superset device (4) Total number of pins that can be used as general-purpose input or output when not used as part of a peripheral

3 Device Comparison

Table 3-1 lists the features of the RM57L843 devices. Table 3-1. RM57L843 Device Comparison(1)(2) FEATURES DEVICES Generic Part Number RM57L843ZWT(3) RM48L952ZWT(3) RM48L950PGE RM48L750PGE RM48L550ZWT RM48L550PGE RM46L852ZWT(3) Package 337 BGA 337 BGA 144 QFP 144 QFP 337 BGA 144 QFP 337 BGA CPU ARM Cortex-R5F ARM Cortex-R4F ARM Cortex- R4F ARM Cortex- R4F ARM Cortex- R4F ARM Cortex- R4F ARM Cortex-R4F Frequency (MHz) 330 220 200 200 200 200 220 Cache (KB) 32 I Flash (KB) 4096 3072 3072 2048 2048 2048 1280 RAM (KB) 512 256 256 256 192 192 192 Data Flash [EEPROM] (KB) 128 64 64 64 64 64 64 USB OHCI + Device – 2+0 or 1+1 2+0 or 1+1 2+0 or 1+1 2+0 or 1+1 2+0 or 1+1 2+0 or 1+1 EMAC 10/100 10/100 10/100 10/100 10/100 10/100 10/100 CAN 4 3 3 3 3 3 3 MibADC 12-bit (Ch) 2 (41ch) 2 (24ch) 2 (24ch) 2 (24ch) 2 (24ch) 2 (24ch) 2 (24ch) ePWM Channels 14 – – – – – 14 eCAP Channels 6 – – – – – 6 eQEP Channels 2 – – – – – 2 SCI (LIN) 4 (2 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) I2C 2 1 1 1 1 1 1 GPIO (INT)(4) 168 (with 16 interrupt capable) 144 (with 16 interrupt capable) 64 (with 4 interrupt capable) 64 (with 4 interrupt capable) 144 (with 16 interrupt capable) 64 (with 4 interrupt capable) 101 (with 16 interrupt capable) EMIF 16-bit data 16-bit data – – 16-bit data – 16-bit data ETM [Trace] (Data) (32) (32) – – 32-bit – – Operating Temperature –40ºC to 105ºC –40ºC to 105ºC –40ºC to 105ºC –40ºC to 105ºC –40ºC to 105ºC –40ºC to 105ºC –40ºC to 105ºC

PRODUCT□PREVIEW A B C D E F G H J K L M N P R T U V W

19 VSS VSS TMS N2HET1

[10] MIBSPI5 NCS[0] MIBSPI1 SIMO[0] MIBSPI1 NENA MIBSPI5 CLK MIBSPI5 SIMO[0] N2HET1 [28] DMM_ DATA[0] DCAN3RX AD1EVT AD1IN[15] AD2IN[15] AD1IN[22] AD2IN[06] AD1IN [06] AD1IN[11] AD2IN[11] AD2IN[24] VSSAD 19

18 VSS TCK TDO nTRST N2HET1

[08] MIBSPI1 CLK MIBSPI1 SOMI[0] MIBSPI5 NENA MIBSPI5 SOMI[0] N2HET1 [0] DMM_ DATA[1] DCAN3TX AD1IN[24] AD1IN[08] AD2IN[08] AD1IN[14] AD2IN[14] AD1IN[13] AD2IN[13] AD1IN [04] AD1IN [02] AD2IN[24] 18

17 TDI nRST EMIF_

ADDR[21] EMIF_ nWE MIBSPI5 SOMI[1] DMM_ CLK MIBSPI5 SIMO[3] MIBSPI5 SIMO[2] N2HET1 [31] EMIF_ nCS[3] EMIF_ nCS[2] EMIF_ nCS[4] EMIF_ nCS[0] AD1IN[25] AD1IN [05] AD1IN [03] AD1IN[10] AD2IN[10] AD1IN [01] AD1IN[09] AD2IN[09]

16 RTCK Reserved EMIF_

ADDR[20] EMIF_ BA[1] MIBSPI5 SIMO[1] DMM_ nENA MIBSPI5 SOMI[3] MIBSPI5 SOMI[2] DMM_ SYNC N2HET2 [08] N2HET2 [09] N2HET2 [10] N2HET2 [11] AD1IN[26] AD1IN[23] AD2IN[07] AD1IN[12] AD2IN[12] AD1IN[19] AD2IN[03] ADREFLO VSSAD 16

15 Reserved Reserved EMIF_

ADDR[19] EMIF_ ADDR[18] ETM DATA[06] ETM DATA[05] ETM DATA[04] ETM DATA[03] ETM DATA[02] ETM DATA[16] / EMIF_ DATA[0] ETM DATA[17] / EMIF_ DATA[1] ETM DATA[18] / EMIF_ DATA[2] ETM DATA[19] / EMIF_ DATA[3] AD1IN[27] AD1IN[28] AD1IN[21] AD2IN[05] AD1IN[20] AD2IN[04] ADREFHI VCCAD 15

14 N2HET1

[26] nERROR EMIF_ ADDR[17] EMIF_ ADDR[16] ETM DATA[07] VCCIO VCCIO VCCIO VCC VCC VCCIO VCCIO VCCIO VCCIO AD1IN[29] AD1IN[30] AD1IN[18] AD2IN[02] AD1IN [07] AD1IN [0] 14

13 N2HET1

[17] N2HET1 [19] EMIF_ ADDR[15] N2HET2 [04] ETM DATA[12] / EMIF_BA[ VCCIO VCCIO ETM DATA[01] AD1IN[31] AD1IN[17] AD2IN[01] AD1IN[16] AD2IN[0] AD2IN[16] 13

12 ECLK N2HET1

[04] EMIF_ ADDR[14] N2HET2 [05] ETM DATA[13] / EMIF_nOE VCCIO VSS VSS VCC VSS VSS VCCIO ETM DATA[0] MIBSPI5 NCS[3] AD2IN[19] AD2IN[18] AD2IN[17] 12

11 N2HET1

[14] N2HET1 [30] EMIF_ ADDR[13] N2HET2 [06] ETM DATA[14] / EMIF_ nDQM[1] VCCIO VSS VSS VSS VSS VSS VCCPLL ETM TRACE CTL AD2IN[20] AD2IN[21] AD2IN[22] AD2IN[23] 11

10 DCAN1TX DCAN1RX EMIF_

ADDR[12] ePWM1B ETM DATA[15] / EMIF_ nDQM[0] VCC VCC VSS VSS VSS VCC VCC ETM TRACE CLKOUT AD2EVT MIBSPI1 NCS[4] MIBSPI3 NCS[0] GIOB[3] 10

9 N2HET1

[27] Reserved EMIF_ ADDR[11] ePWM1A ETM DATA[08] / EMIF_ ADDR[5] VCC VSS VSS VSS VSS VSS VCCIO ETM TRACE CLKIN MDCLK MIBSPI1 NCS[5] MIBSPI3 CLK MIBSPI3 NENA 9

8 Reserved Reserved EMIF_

ADDR[10] N2HET2[1] ETM DATA[09] / EMIF_ ADDR[4] VCCP VSS VSS VCC VSS VSS VCCIO ETM DATA[31] / EMIF_ DATA[15] N2HET2 [23] MII_TXD [0] MIBSPI3 SOMI MIBSPI3 SIMO 8

7 LIN1RX LIN1TX EMIF_

ADDR[9] N2HET2 [2] ETM DATA[10] / EMIF_ ADDR[3] VCCIO VCCIO ETM DATA[30] / EMIF_ DATA[14] N2HET2 [22] MII_TX_ CLK N2HET1 [09] nPORRST 7

6 GIOA[4] MIBSPI5

NCS[1] EMIF_ ADDR[8] N2HET2 [0] ETM DATA[11] / EMIF_ ADDR[2] VCCIO VCCIO VCCIO VCCIO VCC VCC VCCIO VCCIO VCCIO ETM DATA[29] / EMIF_ DATA[13] N2HET2 [21] MII_RX_ DV N2HET1 [05] MIBSPI5 NCS[2] 6

5 GIOA[0] GIOA[5] EMIF_

ADDR[7] EMIF_ ADDR[1] ETM DATA[20] / EMIF_ DATA[4] ETM DATA[21] / EMIF_ DATA[5] ETM DATA[22] / EMIF_ DATA[6] FLTP2 FLTP1 ETM DATA[23] / EMIF_ DATA[7] ETM DATA[24] / EMIF_ DATA[8] ETM DATA[25] / EMIF_ DATA[9] ETM DATA[26] / EMIF_ DATA[10] ETM DATA[27] / EMIF_ DATA[11] ETM DATA[28] / EMIF_ DATA[12] N2HET2 [20] MII_RX_ ER MIBSPI3 NCS[1] N2HET1 [02] 5

4 N2HET1

[16] N2HET1 [12] EMIF_ ADDR[6] EMIF_ ADDR[0] MII_TXEN MDIO MII_TXD [3] N2HET1 [21] N2HET1 [23] N2HET2 [15] N2HET2 [16] N2HET2 [17] N2HET2 [18] N2HET2 [19] EMIF_ nCAS MII_ RXCLK MII_RXD [0] MII_CRS MII_COL 4

3 N2HET1

[29] N2HET1 [22] MIBSPI3 NCS[3] N2HET2 [12] N2HET1 [11] MIBSPI1 NCS[1] MIBSPI1 NCS[2] GIOA[6] MIBSPI1 NCS[3] EMIF_ CLK EMIF_ CKE N2HET1 [25] N2HET2 [7] EMIF_ nWAIT EMIF_ nRAS MII_RXD [1] MII_RXD [2] MII_RXD [3] N2HET1 [06] 3

2 VSS MIBSPI3

NCS[2] GIOA[1] N2HET2 [13] N2HET2 [3] GIOB[2] GIOB[5] DCAN2TX GIOB[6] GIOB[1] KELVIN_ GND GIOB[0] N2HET1 [13] N2HET1 [20] MIBSPI1 NCS[0] MII_TXD [2] TEST N2HET1 [1] VSS 2

1 VSS VSS GIOA[2] N2HET2

[14] GIOA[3] GIOB[7] GIOB[4] DCAN2RX N2HET1 [18] OSCIN OSCOUT GIOA[7] N2HET1 [15] N2HET1 [24] MII_TXD [1] N2HET1 [7] NHET1 [03] VSS VSS 1 A B C D E F G H J K L M N P R T U V W RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Terminal Configuration and FunctionsCopyright © 2014–2016, Texas Instruments Incorporated

4 Terminal Configuration and Functions

4.1 ZWT BGA Package Ball-Map (337 Terminal Grid Array)

Figure 4-1. ZWT Package Pinout. Top View Note: Balls can have multiplexed functions. See Section 4.2.2 for detailed information.

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Terminal Configuration and Functions Copyright © 2014–2016, Texas Instruments Incorporated

4.2 Terminal Functions

Table 4-1 through Table 4-26 identify the external signal names, the associated terminal numbers along with the mechanical package designator, the terminal type (Input, Output, I/O, Power, or Ground), whether the terminal has any internal pullup/pulldown, whether the terminal can be configured as a GIO, and a functional terminal description. The first signal name listed is the primary function for that terminal. The signal name in Bold is the function being described. For information on how to select between different multiplexed functions, see the Section 4.2.2, Multiplexing of this data manual along with the I/O Multiplexing Module (IOMM) chapter in the Technical Reference Manual (TRM) ( SPNU562). NOTE In the Terminal Functions tables below, the "Default Pull State" is the state of the pull applied to the terminal while nPORRST is low and immediately after nPORRST goes High. The default pull direction may change when software configures the pin for an alternate function. The "Pull Type" is the type of pull asserted when the signal name in bold is enabled for the given terminal by the IOMM control registers. All I/O signals except nRST are configured as inputs while nPORRST is low and immediately after nPORRST goes High. While nPORRST is low, the input buffers are disabled, and the output buffers are disabled with the default pulls enabled. All output-only signals have the output buffer disabled and the default pull enabled while nPORRST is low, and are configured as outputs with the pulls disabled immediately after nPORRST goes High.

4.2.1 ZWT Package

4.2.1.1 Multibuffered Analog-to-Digital Converters (MibADC)

Table 4-1. ZWT Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2) TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH

DESCRIPTION

AD1EVT/MII_RX_ER/RMII_RX_ER/nTZ1_1 N19 I/O Pulldown Programmable, 20 µA 2mA ZD ADC1 event trigger input, or GIO AD1IN[0] W14 Input - - - ADC1 Input AD1IN[1] V17 Input - - - ADC1 Input AD1IN[2] V18 Input - - - ADC1 Input AD1IN[3] T17 Input - - - ADC1 Input AD1IN[4] U18 Input - - - ADC1 Input AD1IN[5] R17 Input - - - ADC1 Input AD1IN[6] T19 Input - - - ADC1 Input AD1IN[7] V14 Input - - - ADC1 Input AD1IN[8]/AD2IN[8] P18 Input - - - ADC1/ADC2 shared Input AD1IN[9]/AD2IN[9] W17 Input - - - ADC1/ADC2 shared Input AD1IN[10]/AD2IN[10] U17 Input - - - ADC1/ADC2 shared Input AD1IN[11]/AD2IN[11] U19 Input - - - ADC1/ADC2 shared Input AD1IN[12]/AD2IN[12] T16 Input - - - ADC1/ADC2 shared Input AD1IN[13]/AD2IN[13] T18 Input - - - ADC1/ADC2 shared Input AD1IN[14]/AD2IN[14] R18 Input - - - ADC1/ADC2 shared Input AD1IN[15]/AD2IN[15] P19 Input - - - ADC1/ADC2 shared Input AD1IN[16]/AD2IN[0] V13 Input - - - ADC1/ADC2 shared Input AD1IN[17]/AD2IN[1] U13 Input - - - ADC1/ADC2 shared Input AD1IN[18]/AD2IN[2] U14 Input - - - ADC1/ADC2 shared Input AD1IN[19]/AD2IN[3] U16 Input - - - ADC1/ADC2 shared Input AD1IN[20]/AD2IN[4] U15 Input - - - ADC1/ADC2 shared Input AD1IN[21]/AD2IN[5] T15 Input - - - ADC1/ADC2 shared Input AD1IN[22]/AD2IN[6] R19 Input - - - ADC1/ADC2 shared Input AD1IN[23]/AD2IN[7] R16 Input - - - ADC1/ADC2 shared Input AD1IN[24] N18 Input - - - ADC1 Input

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Table 4-1. ZWT Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2) (continued) TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH AD1IN[25] P17 Input - - - ADC1 Input AD1IN[26] P16 Input - - - ADC1 Input AD1IN[27] P15 Input - - - ADC1 Input AD1IN[28] R15 Input - - - ADC1 Input AD1IN[29] R14 Input - - - ADC1 Input AD1IN[30] T14 Input - - - ADC1 Input AD1IN[31] T13 Input - - - ADC1 Input(1) AD2EVT T10 I/O Pulldown Programmable, 20 µA 2mA ZD ADC2 event trigger input, or GIO MIBSPI3NCS[0]/AD2EVT/eQEP1I V10(2) AD2IN[16] W13 Input - - - ADC2 Input AD2IN[17] W12 Input - - - ADC2 Input AD2IN[18] V12 Input - - - ADC2 Input AD2IN[19] U12 Input - - - ADC2 Input AD2IN[20] T11 Input - - - ADC2 Input AD2IN[21] U11 Input - - - ADC2 Input AD2IN[22] V11 Input - - - ADC2 Input AD2IN[23] W11 Input - - - ADC2 Input AD2IN[24] V19 Input - - - ADC2 Input AD2IN[24] W18 ADREFHI V15(3) Input - - - ADC high reference supply ADREFLO V16(3) Input - - - ADC low reference supply MIBSPI3SOMI/AD1EXT_ENA/ECAP2 V8 Output Pullup 20 µA 2mA ZD External Mux ENA MIBSPI5SOMI[3]/DMM_DATA[15]/I2C2_SCL/AD1EXT_ENA G16 MIBSPI3SIMO/AD1EXT_SEL[0]/ECAP3 W8 Output Pullup 20 µA 2mA ZD External Mux Select 0 MIBSPI5SIMO[1]/DMM_DATA[9]/AD1EXT_SEL[0] E16 MIBSPI3CLK/AD1EXT_SEL[1]/eQEP1A V9 Output Pullup 20 µA 2mA ZD External Mux Select 1 MIBSPI5SIMO[2]/DMM_DATA[10]/AD1EXT_SEL[1] H17 MIBSPI5SIMO[3]/DMM_DATA[11]/I2C2_SDA/AD1EXT_SEL[2] G17 Output Pullup 20 µA 2mA ZD External Mux Select 2 MIBSPI5SOMI[1]/DMM_DATA[13]/AD1EXT_SEL[3] E17 Output Pullup 20 µA 2mA ZD External Mux Select 3 MIBSPI5SOMI[2]/DMM_DATA[14]/AD1EXT_SEL[4] H16 Output Pullup 20 µA 2mA ZD External Mux Select 4

4.2.1.2 Enhanced High-End Timer Modules (N2HET)

Table 4-2. ZWT Enhanced High-End Timer Modules (N2HET) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET1[0]/MIBSPI4CLK/ePWM2B K18 I/O Pulldown Programmable, 20 µA 2 mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[1]/MIBSPI4NENA/N2HET2[8]/eQEP2A V2 I/O Pulldown Programmable, 20 µA 2 mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[2]/MIBSPI4SIMO/ePWM3A W5 I/O Pulldown Programmable, 20 µA 2 mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[3]/MIBSPI4NCS[0]/N2HET2[10]/eQEP2B U1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[4]/MIBSPI4NCS[1]/ePWM4B B12 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[5]/MIBSPI4SOMI/N2HET2[12]/ePWM3B V6 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[6]/SCI3RX/ePWM5A W3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[7]/MIBSPI4NCS[2]/N2HET2[14]/ePWM7B T1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[8]/MIBSPI1SIMO[1]/MII_TXD[3] E18 I/O Pulldown Programmable, 20 µA 8mA N2HET1 time input capture or output compare, or GIO N2HET1[9]/MIBSPI4NCS[3]/N2HET2[16]/ePWM7A V7 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[10]/MIBSPI4NCS[4]/MII_TX_CLK/nTZ1_3 D19 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ePWM1SYNCO E3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[12]/MIBSPI4NCS[5]/MII_CRS/RMII_CRS_DV B4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[13]/SCI3TX/N2HET2[20]/ePWM5B N2 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[14] A11 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[15]/MIBSPI1NCS[4]/N2HET2[22]/ECAP1 N1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[16]/ePWM1SYNCI/ePWM1SYNCO A4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-2. ZWT Enhanced High-End Timer Modules (N2HET) (continued) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET1[17]/EMIF_nOE/SCI4RX A13 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI1NCS[1]/MII_COL/N2HET1[17]/eQEP1S F3(1) N2HET1[18]/EMIF_RNW/ePWM6A J1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[19]/EMIF_nDQM[0]/SCI4TX B13 I/O Pulldown Programmable, 20 µA 2m A ZD N2HET1 time input capture or output compare, or GIOMIBSPI1NCS[2]/MDIO/N2HET1[19] G3(1) N2HET1[20]/EMIF_nDQM[1]/ePWM6B P2 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[21]/EMIF_nDQM[2] H4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI1NCS[3]/N2HET1[21]/nTZ1_3 J3(1) N2HET1[22]/EMIF_nDQM[3] B3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[23]/EMIF_BA[0] J4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI1NENA/MII_RXD[2]/N2HET1[23]/ECAP4 G19(1) N2HET1[24]/MIBSPI1NCS[5]/MII_RXD[0]/RMII_RXD[0] P1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[25] M3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI3NCS[1]/MDCLK/N2HET1[25] V5(1) N2HET1[26]/MII_RXD[1]/RMII_RXD[1] A14 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[27] A9 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI3NCS[2]/I2C1_SDA/N2HET1[27]/nTZ1_2 B2(1) N2HET1[28]/MII_RXCLK/RMII_REFCLK K19 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[29] A3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI3NCS[3]/I2C1_SCL/N2HET1[29]/nTZ1_1 C3(1) N2HET1[30]/MII_RX_DV/eQEP2S B11 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIO N2HET1[31] J17 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET1 time input capture or output compare, or GIOMIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/eQEP1B W9(1) N2HET2[0] D6 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOGIOA[2]/N2HET2[0]/eQEP2I C1(1) N2HET2[1]/N2HET1_NDIS D8 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_ADDR[0]/N2HET2[1] D4(1)

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Table 4-2. ZWT Enhanced High-End Timer Modules (N2HET) (continued) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET2[2]/N2HET2_NDIS D7 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOGIOA[3]/N2HET2[2] E1(1) N2HET2[3]/MIBSPI2CLK E2 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_ADDR[1]/N2HET2[3] D5(1) N2HET2[4] D13 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOGIOA[6]/N2HET2[4]/ePWM1B H3(1) N2HET2[5] D12 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_BA[1]/N2HET2[5] D16(1) N2HET2[6] D11 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOGIOA[7]/N2HET2[6]/ePWM2A M1(1) N2HET2[7]/MIBSPI2NCS[0] N3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_nCS[0]/RTP_DATA[15]/N2HET2[7] N17(1) N2HET2[8] K16 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[1]/MIBSPI4NENA/N2HET2[8]/eQEP2A V2(1) N2HET2[9] L16 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_nCS[3]/RTP_DATA[14]/N2HET2[9] K17(1) N2HET2[10] M16 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[3]/MIBSPI4NCS[0]/N2HET2[10]/eQEP2B U1(1) N2HET2[11] N16 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_ADDR[6]/RTP_DATA[13]/N2HET2[11] C4(1) N2HET2[12]/MIBSPI2NENA/MIBSPI2NCS[1] D3 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[5]/MIBSPI4SOMI/N2HET2[12]/ePWM3B V6(1) N2HET2[13]/MIBSPI2SOMI D2 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_ADDR[7]/RTP_DATA[12]/N2HET2[13] C5(1) N2HET2[14]/MIBSPI2SIMO D1 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[7]/MIBSPI4NCS[2]/N2HET2[14]/ePWM7B T1(1) N2HET2[15] K4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIOEMIF_ADDR[8]/RTP_DATA[11]/N2HET2[15] C6(1) N2HET2[16] L4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[9]/MIBSPI4NCS[3]/N2HET2[16]/ePWM7A V7(1) N2HET2[17] M4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-2. ZWT Enhanced High-End Timer Modules (N2HET) (continued) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET2[18] N4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ePWM1SYNCO E3(1) N2HET2[19]/LIN2RX P4 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO N2HET2[20]/LIN2TX T5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[13]/SCI3TX/N2HET2[20]/ePWM5B N2(1) N2HET2[21] T6 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO N2HET2[22] T7 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GION2HET1[15]/MIBSPI1NCS[4]/N2HET2[22]/ECAP1 N1(1) N2HET2[23] T8 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[24]/EMIF_DATA[8]/N2HET2[24]/MIBSPI5NCS[4] L5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[25]/EMIF_DATA[9]/N2HET2[25]/MIBSPI5NCS[5] M5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[26]/EMIF_DATA[10]/N2HET2[26] N5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[27]/EMIF_DATA[11]/N2HET2[27] P5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[28]/EMIF_DATA[12]/N2HET2[28]/GIOA[0] R5 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[29]/EMIF_DATA[13]/N2HET2[29]/GIOA[1] R6 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[30]/EMIF_DATA[14]/N2HET2[30]/GIOA[3] R7 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO ETMDATA[31]/EMIF_DATA[15]/N2HET2[31]/GIOA[4] R8 I/O Pulldown Programmable, 20 µA 2mA ZD N2HET2 time input capture or output compare, or GIO N2HET2[1]/N2HET1_NDIS D8 Input Pulldown Fixed, 20 µA 2mA ZD N2HET1 Disable N2HET2[2]/N2HET2_NDIS D7 Input Pulldown Fixed, 20 µA 2mA ZD N2HET2 Disable

4.2.1.3 RAM Trace Port (RTP)

Table 4-3. ZWT RAM Trace Port (RTP) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength Description Signal Name 337 ZWT EMIF_ADDR[21]/RTP_CLK C17 I/O Pulldown Programmable, 20 µA 8mA RTP packet clock, or GIO EMIF_ADDR[18]/RTP_DATA[0] D15 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[17]/RTP_DATA[1] C14 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[16]/RTP_DATA[2] D14 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[15]/RTP_DATA[3] C13 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[14]/RTP_DATA[4] C12 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[13]/RTP_DATA[5] C11 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[12]/RTP_DATA[6] C10 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_nCS[4]/RTP_DATA[7]/GIOB[5] M17 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[11]/RTP_DATA[8] C9 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[10]/RTP_DATA[9] C8 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[9]/RTP_DATA[10] C7 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[8]/RTP_DATA[11]/N2HET2[15] C6 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[7]/RTP_DATA[12]/N2HET2[13] C5 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[6]/RTP_DATA[13]/N2HET2[11] C4 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_nCS[3]/RTP_DATA[14]/N2HET2[9] K17 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_nCS[0]/RTP_DATA[15]/N2HET2[7] N17 I/O Pulldown Programmable, 20 µA 8mA RTP packet data, or GIO EMIF_ADDR[19]/RTP_nENA C15 I/O Pullup Programmable, 20 µA 8mA RTP packet handshake, or GIO EMIF_ADDR[20]/RTP_nSYNC C16 I/O Pullup Programmable, 20 µA 8mA RTP synchronization, or GIO

4.2.1.4 Enhanced Capture Modules (eCAP)

Table 4-4. ZWT Enhanced Capture Modules (eCAP) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET1[15]/MIBSPI1NCS[4]/N2HET2[22]/ECAP1 N1 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 1 I/O MIBSPI3SOMI/AD1EXT_ENA/ECAP2 V8 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 2 I/O MIBSPI3SIMO/AD1EXT_SEL[0]/ECAP3 W8 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 3 I/O MIBSPI1NENA/MII_RXD[2]/N2HET1[23]/ECAP4 G19 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 4 I/O MIBSPI5NENA/DMM_DATA[7]/MII_RXD[3]/ECAP5 H18 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 5 I/O MIBSPI1NCS[0]/MIBSPI1SOMI[1]/MII_TXD[2]/ECAP6 R2 I/O Pullup Fixed, 20 µA 8mA Enhanced Capture Module 6 I/O

4.2.1.5 Enhanced Quadrature Encoder Pulse Modules (eQEP)

Table 4-5. ZWT Enhanced Quadrature Encoder Pulse Modules (eQEP)(1) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength MIBSPI3CLK/AD1EXT_SEL[1]/eQEP1A V9 Input Pullup Fixed, 20 µA - Enhanced QEP1 Input A MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/eQEP1B W9 Input Pullup Fixed, 20 µA - Enhanced QEP1 Input B MIBSPI3NCS[0]/AD2EVT/eQEP1I V10 I/O Pullup Fixed, 20 µA 8mA Enhanced QEP1 Index MIBSPI1NCS[1]/MII_COL/N2HET1[17]/eQEP1S F3 I/O Pullup Fixed, 20 µA 8mA Enhanced QEP1 Strobe N2HET1[1]/MIBSPI4NENA/N2HET2[8]/eQEP2A V2 Input Pullup Fixed, 20 µA - Enhanced QEP2 Input A N2HET1[3]/MIBSPI4NCS[0]/N2HET2[10]/eQEP2B U1 Input Pullup Fixed, 20 µA - Enhanced QEP2 Input B GIOA[2]/N2HET2[0]/eQEP2I C1 I/O Pullup Fixed, 20 µA 8mA Enhanced QEP2 Index N2HET1[30]/MII_RX_DV/eQEP2S B11 I/O Pullup Fixed, 20 µA 8mA Enhanced QEP2 Strobe (1) These signals are double-synchronized and then optionally filtered with a 6-cycle VCLK4-based counter.

4.2.1.6 Enhanced Pulse-Width Modulator Modules (ePWM)

Table 4-6. ZWT Enhanced Pulse-Width Modulator Modules (ePWM) TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH Output – – 8 mA Enhanced PWM1 Output A GIOA[5]/EXTCLKIN1/ePWM1A B5(1) ePWM1B D10 Output – – 8 mA Enhanced PWM1 Output B GIOA[6]/N2HET2[4]/ePWM1B H3(1) N2HET1[16]/ePWM1SYNCI/ePWM1SYNCO A4 Input Pulldown Fixed, 20 µA – External ePWM Sync Pulse Input N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ ePWM1SYNCO E3 Output Pulldown 20 µA 2mA ZD External ePWM Sync Pulse Output N2HET1[16]/ePWM1SYNCI/ePWM1SYNCO A4(1) GIOA[7]/N2HET2[6]/ePWM2A M1 Output Pulldown 20 µA 8 mA Enhanced PWM2 Output A N2HET1[0]/MIBSPI4CLK/ePWM2B K18 Output Pulldown 20 µA 8 mA Enhanced PWM2 Output B N2HET1[2]/MIBSPI4SIMO/ePWM3A W5 Output Pulldown 20 µA 8 mA Enhanced PWM3 Output A N2HET1[5]/MIBSPI4SOMI/N2HET2[12]/ePWM3B V6 Output Pulldown 20 µA 8 mA Enhanced PWM3 Output B MIBSPI5NCS[0]/DMM_DATA[5]/ePWM4A E19 Output Pulldown 20 µA 8 mA Enhanced PWM4 Output A N2HET1[4]/MIBSPI4NCS[1]/ePWM4B B12 Output Pulldown 20 µA 8 mA Enhanced PWM4 Output B N2HET1[6]/SCI3RX/ePWM5A W3 Output Pulldown 20 µA 8 mA Enhanced PWM5 Output A N2HET1[13]/SCI3TX/N2HET2[20]/ePWM5B N2 Output Pulldown 20 µA 8 mA Enhanced PWM5 Output B N2HET1[18]/EMIF_RNW/ePWM6A J1 Output – – 8 mA Enhanced PWM6 Output A N2HET1[20]/EMIF_nDQM[1]/ePWM6B P2 Output – – 8 mA Enhanced PWM6 Output B N2HET1[9]/MIBSPI4NCS[3]/N2HET2[16]/ePWM7A V7 Output – – 8 mA Enhanced PWM7 Output A N2HET1[7]/MIBSPI4NCS[2]/N2HET2[14]/ePWM7B T1 Output – – 8 mA Enhanced PWM7 Output B AD1EVT/MII_RX_ER/RMII_RX_ER/nTZ1_1 N19 Input Pulldown Fixed, 20 µA – Trip Zone 1 Input 1 MIBSPI3NCS[3]/I2C1_SCL/N2HET1[29]/nTZ1_1 C3(1) GIOB[7]/nTZ1_2 F1 Input Pulldown Fixed, 20 µA – Trip Zone 1 Input 2 MIBSPI3NCS[2]/I2C1_SDA/N2HET1[27]/nTZ1_2 B2(1) MIBSPI1NCS[3]/N2HET1[21]/nTZ1_3 J3 Input Pullup Fixed, 20 µA – Trip Zone 1 Input 3 N2HET1[10]/MIBSPI4NCS[4]/MII_TX_CLK/nTZ1_3 D19(1) (1) This is the secondary terminal at which the signal is also available. See Section 4.2.2.2 for more detail on how to select between the available terminals for input functionality.

4.2.1.7 Data Modification Module (DMM)

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-7. ZWT Data Modification Module (DMM) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength DMM_CLK F17 I/O Pullup Programmable, 20 µA 2mA ZD DMM clock, or GIO DMM_DATA[0] L19 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO DMM_DATA[1] L18 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5NCS[2]/DMM_DATA[2] W6 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5NCS[3]/DMM_DATA[3] T12 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5CLK/DMM_DATA[4]/MII_TXEN/RMII_TXEN H19 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5NCS[0]/DMM_DATA[5]/ePWM4A E19 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5NCS[1]/DMM_DATA[6] B6 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5NENA/DMM_DATA[7]/MII_RXD[3]/ECAP5 H18 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SIMO[0]/DMM_DATA[8]/MII_TXD[1]/RMII_TXD[1] J19 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SIMO[1]/DMM_DATA[9]/AD1EXT_SEL[0] E16 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SIMO[2]/DMM_DATA[10]/AD1EXT_SEL[1] H17 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SIMO[3]/DMM_DATA[11]/I2C2_SDA/AD1EXT_SEL[2] G17 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SOMI[0]/DMM_DATA[12]/MII_TXD[0]/RMII_TXD[0] J18 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SOMI[1]/DMM_DATA[13]/AD1EXT_SEL[3] E17 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SOMI[2]/DMM_DATA[14]/AD1EXT_SEL[4] H16 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO MIBSPI5SOMI[3]/DMM_DATA[15]/I2C2_SCL/AD1EXT_ENA G16 I/O Pullup Programmable, 20 µA 2mA ZD DMM data, or GIO DMM_nENA F16 I/O Pullup Programmable, 20 µA 2mA ZD DMM handshake, or GIO DMM_SYNC J16 I/O Pullup Programmable, 20 µA 2mA ZD DMM synchronization, or GIO

4.2.1.8 General-Purpose Input / Output (GIO)

Table 4-8. ZWT General-Purpose Input / Output (GIO) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength GIOA[0] A5 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMDATA[28]/EMIF_DATA[12]/N2HET2[28]/GIOA[0] R5(1) GIOA[1] C2 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMDATA[29]/EMIF_DATA[13]/N2HET2[29]/GIOA[1] R6(1) GIOA[2]/N2HET2[0]/eQEP2I C1 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable GIOA[3]/N2HET2[2] E1 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMDATA[30]/EMIF_DATA[14]/N2HET2[30]/GIOA[3] R7(1) GIOA[4] A6 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMDATA[31]/EMIF_DATA[15]/N2HET2[31]/GIOA[4] R8(1) GIOA[5]/EXTCLKIN1/ePWM1A B5 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMTRACECLKIN/EXTCLKIN2/GIOA[5] R9(1) GIOA[6]/N2HET2[4]/ePWM1B H3 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMTRACECLKOUT/GIOA[6] R10(1) GIOA[7]/N2HET2[6]/ePWM2A M1 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable ETMTRACECTL/GIOA[7] R11(1) GIOB[0] M2 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable GIOB[1] K2 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable GIOB[2]/DCAN4TX F2 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable GIOB[3]/DCAN4RX W10 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable EMIF_nCAS/GIOB[3] R4(1) GIOB[4] G1 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable EMIF_nCS[2]/GIOB[4] L17(1) GIOB[5] G2 I/O Pulldown Programmable, 20 µA 2mA ZD General-purpose I/O, external interrupt capable EMIF_nCS[4]/RTP_DATA[7]/GIOB[5] M17(1)

4.2.1.9 Controller Area Network Controllers (DCAN)

Table 4-9. ZWT Controller Area Network Controllers (DCAN) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength DCAN1RX B10 I/O Pullup Programmable, 20 µA 2mA ZD CAN1 receive, or GIO DCAN1TX A10 I/O Pullup Programmable, 20 µA 2mA ZD CAN1 transmit, or GIO DCAN2RX H1 I/O Pullup Programmable, 20 µA 2mA ZD CAN2 receive, or GIO DCAN2TX H2 I/O Pullup Programmable, 20 µA 2mA ZD CAN2 transmit, or GIO DCAN3RX M19 I/O Pullup Programmable, 20 µA 2mA ZD CAN3 receive, or GIO DCAN3TX M18 I/O Pullup Programmable, 20 µA 2mA ZD CAN3 transmit, or GIO GIOB[3]/DCAN4RX W10 I/O Pulldown Programmable, 20 µA 2mA ZD CAN4 receive, or GIO GIOB[2]/DCAN4TX F2 I/O Pulldown Programmable, 20 µA 2mA ZD CAN4 transmit, or GIO

4.2.1.10 Local Interconnect Network Interface Module (LIN)

Table 4-10. ZWT Local Interconnect Network Interface Module (LIN) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength LIN1RX A7 I/O Pullup Programmable, 20 µA 2mA ZD LIN receive, or GIO LIN1TX B7 I/O Pullup Programmable, 20 µA 2mA ZD LIN transmit, or GIO N2HET2[19]/LIN2RX P4 I/O Pulldown Programmable, 20 µA 2mA ZD LIN receive, or GIO N2HET2[20]/LIN2TX T5 I/O Pulldown Programmable, 20 µA 2mA ZD LIN transmit, or GIO

4.2.1.11 Standard Serial Communication Interface (SCI)

Table 4-11. ZWT Standard Serial Communication Interface (SCI) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET1[6]/SCI3RX/ePWM5A W3 I/O Pulldown Programmable, 20 µA 2mA ZD SCI receive, or GIO N2HET1[13]/SCI3TX/N2HET2[20]/ePWM5B N2 I/O Pulldown Programmable, 20 µA 2mA ZD SCI transmit, or GIO N2HET1[17]/EMIF_nOE/SCI4RX A13 I/O Pulldown Programmable, 20 µA 2mA ZD SCI receive, or GIO N2HET1[19]/EMIF_nDQM[0]/SCI4TX B13 I/O Pulldown Programmable, 20 µA 2mA ZD SCI transmit, or GIO

4.2.1.12 Inter-Integrated Circuit Interface Module (I2C)

Table 4-12. ZWT Inter-Integrated Circuit Interface Module (I2C) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength MIBSPI3NCS[3]/I2C1_SCL/N2HET1[29]/nTZ1_1 C3 I/O Pullup Programmable, 20 µA 2mA ZD I2C serial clock, or GIO MIBSPI3NCS[2]/I2C1_SDA/N2HET1[27]/nTZ1_2 B2 I/O Pullup Programmable, 20uA 2mA ZD I2C serial data, or GIO MIBSPI5SOMI[3]/DMM_DATA[15]/I2C2_SCL/AD1EXT_ENA G16 I/O Pullup Programmable, 20uA 2mA ZD I2C serial clock, or GIO MIBSPI5SIMO[3]/DMM_DATA[11]/I2C2_SDA/AD1EXT_SEL[2] G17 I/O Pullup Programmable, 20uA 2mA ZD I2C serial data, or GIO

4.2.1.13 Multibuffered Serial Peripheral Interface Modules (MibSPI)

Table 4-13. ZWT Multibuffered Serial Peripheral Interface Modules (MibSPI) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength Description Signal Name 337 ZWT MIBSPI1CLK F18 I/O Pullup Programmable, 20 µA 8mA MibSPI1 clock, or GIO MIBSPI1NCS[0]/MIBSPI1SOMI[1]/MII_TXD[2]/ECAP6 R2 I/O Pullup Programmable, 20 >µA 8mA MibSPI1 chip select, or GIO MIBSPI1NCS[1]/MII_COL/N2HET1[17]/eQEP1S F3 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 chip select, or GIO MIBSPI1NCS[2]/MDIO /N2HET1[19] G3 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 chip select, or GIO MIBSPI1NCS[3]/N2HET1[21]/nTZ1_3 J3 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 chip select, or GIO MIBSPI1NCS[4] U10 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 chip select, or GIO N2HET1[15]/MIBSPI1NCS[4]/N2HET2[22]/ECAP1 N1(1) MIBSPI1NCS[5] U9 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 chip select, or GIO N2HET1[24]/MIBSPI1NCS[5]/MII_RXD[0]/RMII_RXD[0] P1(1) MIBSPI1NENA/MII_RXD[2]/N2HET1[23]/ECAP4 G19 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI1 enable, or GIO MIBSPI1SIMO[0] F19 I/O Pullup Programmable, 20 µA 8mA MibSPI1 slave-in master-out, or GIO N2HET1[8]/MIBSPI1SIMO[1]/MII_TXD[3] E18 I/O Pulldown Programmable, 20 µA 8mA MibSPI1 slave-in master-out, or GIO MIBSPI1SOMI[0] G18 I/O Pullup Programmable, 20 µA 8mA MibSPI1 slave-out master-in, or GIO MIBSPI1NCS[0]/MIBSPI1SOMI[1]/MII_TXD[2]/ECAP6 R2 I/O Pullup Programmable, 20 µA 8mA MibSPI1 slave-out master-in, or GIO N2HET2[3]/MIBSPI2CLK E2 I/O Pulldown Programmable, 20 µA 8mA MibSPI2 clock, or GIO N2HET2[7]/MIBSPI2NCS[0] N3 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI2 chip select, or GIO N2HET2[12]/MIBSPI2NENA/MIBSPI2NCS[1] D3 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI2 chip select, or GIO N2HET2[12]/MIBSPI2NENA/MIBSPI2NCS[1] D3 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI2 enable, or GIO N2HET2[14]/MIBSPI2SIMO D1 I/O Pulldown Programmable, 20 µA 8mA MibSPI2 slave-in master-out, or GIO N2HET2[13]/MIBSPI2SOMI D2 I/O Pulldown Programmable, 20 µA 8mA MibSPI2 slave-out master-in, or GIO MIBSPI3CLK/AD1EXT_SEL[1]/eQEP1A V9 I/O Pullup Programmable, 20 µA 8mA MibSPI3 clock, or GIO MIBSPI3NCS[0]/AD2EVT/eQEP1I V10 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO MIBSPI3NCS[1]/MDCLK/N2HET1[25] V5 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO MIBSPI3NCS[2]/I2C1_SDA/N2HET1[27] /nTZ1_2 B2 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO MIBSPI3NCS[3]/I2C1_SCL/N2HET1[29] /nTZ1_1 C3 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ePWM1SYNCO E3 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/eQEP1B W9 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 chip select, or GIO MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/eQEP1B W9 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI3 enable, or GIO MIBSPI3SIMO/AD1EXT_SEL[0]/ECAP3 W8 I/O Pullup Programmable, 20 µA 8mA MibSPI3 slave-in master-out, or GIO MIBSPI3SOMI/AD1EXT_ENA/ECAP2 V8 I/O Pullup Programmable, 20 µA 8mA MibSPI3 slave-out master-in, or GIO N2HET1[0]/MIBSPI4CLK/ePWM2B K18 I/O Pulldown Programmable, 20 µA 8mA MibSPI4 clock, or GIO N2HET1[3]/MIBSPI4NCS[0]/N2HET2[10]/eQEP2B U1 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI4 chip select, or GIO

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-13. ZWT Multibuffered Serial Peripheral Interface Modules (MibSPI) (continued) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength Description Signal Name 337 ZWT N2HET1[4]/MIBSPI4NCS[1]/ePWM4B B12 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI4 chip select, or GIO N2HET1[7]/MIBSPI4NCS[2]/N2HET2[14]/ePWM7B T1 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI4 chip select, or GIO N2HET1[9]/MIBSPI4NCS[3]/N2HET2[16]/ePWM7A V7 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI4 chip select, or GIO N2HET1[10]/MIBSPI4NCS[4]/MII_TX_CLK/nTZ1_3 D19 I/O Pulldown Programmable, 20 µA 2mA ZD MibSPI4 chip select, or GIO N2HET1[12]/MIBSPI4NCS[5]/MII_CRS/RMII_CRS_DV B4 I/O Pulldown Programmable, 20 µA 4mA MibSPI4 chip select, or GIO N2HET1[1]/MIBSPI4NENA/N2HET2[8]/eQEP2A V2 I/O Pulldown Programmable, 20 µA 8mA MibSPI4 enable, or GIO N2HET1[2]/MIBSPI4SIMO/ePWM3A W5 I/O Pulldown Programmable, 20 µA 8mA MibSPI4 slave-in master-out, or GIO N2HET1[5]/MIBSPI4SOMI/N2HET2[12]/ePWM3B V6 I/O Pulldown Programmable, 20 µA 8mA MibSPI4 slave-out master-in, or GIO MIBSPI5CLK/DMM_DATA[4]/MII_TXEN/RMII_TXEN H19 I/O Pullup Programmable, 20 µA 8mA MibSPI5 clock, or GIO MIBSPI5NCS[0]/DMM_DATA[5]/ePWM4A E19 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO MIBSPI5NCS[1]/DMM_DATA[6] B6 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO MIBSPI5NCS[2]/DMM_DATA[2] W6 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO MIBSPI5NCS[3]/DMM_DATA[3] T12 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO ETMDATA[24]/EMIF_DATA[8]/N2HET2[24]/MIBSPI5NCS[4] L5 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO ETMDATA[25]/EMIF_DATA[9]/N2HET2[25]/MIBSPI5NCS[5] M5 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 chip select, or GIO MIBSPI5NENA/DMM_DATA[7] /MII_RXD[3]/ECAP5 H18 I/O Pullup Programmable, 20 µA 2mA ZD MibSPI5 enable, or GIO MIBSPI5SIMO[0]/DMM_DATA[8]/MII_TXD[1]/RMII_TXD[1] J19 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-in master-out, or GIO MIBSPI5SIMO[1]/DMM_DATA[9]/AD1EXT_SEL[0] E16 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-in master-out, or GIO MIBSPI5SIMO[2]/DMM_DATA[10]/AD1EXT_SEL[1] H17 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-in master-out, or GIO MIBSPI5SIMO[3]/DMM_DATA[11]/I2C2_SDA/AD1EXT_SEL[2] G17 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-in master-out, or GIO MIBSPI5SOMI[0]/DMM_DATA[12]/MII_TXD[0]/RMII_TXD[0] J18 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-out master-in, or GIO MIBSPI5SOMI[1]/DMM_DATA[13]/AD1EXT_SEL[3] E17 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-out master-in, or GIO MIBSPI5SOMI[2]/DMM_DATA[14]/AD1EXT_SEL[4] H16 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-out master-in, or GIO MIBSPI5SOMI[3]/DMM_DATA[15]/I2C2_SCL/AD1EXT_ENA G16 I/O Pullup Programmable, 20 µA 8mA MibSPI5 slave-out master-in, or GIO

4.2.1.14 Ethernet Controller

Table 4-14. ZWT Ethernet Controller: MDIO Interface Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength MDCLK T9 Output - - 8mA Serial clock output MIBSPI3NCS[1]/MDCLK/N2HET1[25] V5(1) MDIO F4 I/O Pulldown Fixed, 20 µA 8mA Serial data input/output MIBSPI1NCS[2]/MDIO/N2HET1[19] G3(1) Table 4-15. ZWT Ethernet Controller: Reduced Media Independent Interface (RMII) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength N2HET1[12]/MIBSPI4NCS[5]/MII_CRS/RMII_CRS_DV B4 Input Pulldown Fixed, 20 µA - RMII carrier sense and data valid N2HET1[28]/MII_RXCLK/RMII_REFCLK K19 Input Pulldown Fixed, 20 µA 8mA EMII synchronous reference clock for receive, transmit and control interface AD1EVT/MII_RX_ER/RMII_RX_ER/nTZ1_1 N19 Input Pulldown Fixed, 20 µA - RMII receive error N2HET1[24]/MIBSPI1NCS[5]/MII_RXD[0]/RMII_RXD[0] P1 Input Pulldown Fixed, 20 µA - RMII receive data N2HET1[26]/MII_RXD[1]/RMII_RXD[1] A14 Input Pulldown Fixed, 20 µA - RMII receive data MIBSPI5SOMI[0]/DMM_DATA[12]/MII_TXD[0]/RMII_TXD[0] J18 Output Pullup 20 µA 8mA RMII transmit data MIBSPI5SIMO[0]/DMM_DATA[8]/MII_TXD[1]/RMII_TXD[1] J19 Output Pullup 20 µA 8mA RMII transmit data MIBSPI5CLK/DMM_DATA[4]/MII_TXEN/RMII_TXEN H19 Output Pullup 20 µA 8mA RMII transmit enable

4.2.1.15 External Memory Interface (EMIF)

Table 4-17. External Memory Interface (EMIF)(2) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength EMIF_ADDR[0]/N2HET2[1] D4 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[1]/N2HET2[3] D5 Output Pulldown 20 µA 8mA EMIF address ETMDATA[11]/EMIF_ADDR[2] E6 Output - - 8mA EMIF address ETMDATA[10]/EMIF_ADDR[3] E7 Output - - 8mA EMIF address ETMDATA[9]/EMIF_ADDR[4] E8 Output - - 8mA EMIF address ETMDATA[8]/EMIF_ADDR[5] E9 Output - - 8mA EMIF address EMIF_ADDR[6]/RTP_DATA[13]/N2HET2[11] C4 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[7]/RTP_DATA[12]/N2HET2[13] C5 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[8]/RTP_DATA[11]/N2HET2[15] C6 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[9]/RTP_DATA[10] C7 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[10]/RTP_DATA[9] C8 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[11]/RTP_DATA[8] C9 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[12]/RTP_DATA[6] C10 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[13]/RTP_DATA[5] C11 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[14]/RTP_DATA[4] C12 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[15]/RTP_DATA[3] C13 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[16]/RTP_DATA[2] D14 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[17]/RTP_DATA[1] C14 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[18]/RTP_DATA[0] D15 Output Pulldown 20 µA 8mA EMIF address EMIF_ADDR[19]/RTP_nENA C15 Output Pullup 20 µA 8mA EMIF address EMIF_ADDR[20]/RTP_nSYNC C16 Output Pullup 20 µA 8mA EMIF address EMIF_ADDR[21]/RTP_CLK C17 Output Pulldown 20 µA 8mA EMIF address ETMDATA[12]/EMIF_BA[0] E13 Output Pulldown 20 µA 8mA EMIF bank address or address lineN2HET1[23]/EMIF_BA[0] J4(1) EMIF_BA[1]/N2HET2[5] D16 Output Pulldown 20 µA 8mA EMIF bank address or address line

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Table 4-17. External Memory Interface (EMIF)(2) (continued) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength EMIF_CKE L3 Output - - 8mA EMIF clock enable EMIF_CLK/ECLK2 K3 Output Pulldown 20 µA 8mA EMIF clock ETMDATA[16]/EMIF_DATA[0] K15 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[17]/EMIF_DATA[1] L15 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[18]/EMIF_DATA[2] M15 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[19]/EMIF_DATA[3] N15 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[20]/EMIF_DATA[4] E5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[21]/EMIF_DATA[5] F5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[22]/EMIF_DATA[6] G5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[23]/EMIF_DATA[7] K5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[24]/EMIF_DATA[8]/N2HET2[24]/MIBSPI5NCS[4] L5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[25]/EMIF_DATA[9]/N2HET2[25]/MIBSPI5NCS[5] M5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[26]/EMIF_DATA[10]/N2HET2[26] N5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[27]/EMIF_DATA[11]/N2HET2[27] P5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[28]/EMIF_DATA[12]/N2HET2[28]/GIOA[0] R5 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[29]/EMIF_DATA[13]/N2HET2[29]/GIOA[1] R6 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[30]/EMIF_DATA[14]/N2HET2[30]/GIOA[3] R7 I/O Pulldown Fixed, 20 µA 8mA EMIF data ETMDATA[31]/EMIF_DATA[15]/N2HET2[31]/GIOA[4] R8 I/O Pulldown Fixed, 20 µA 8mA EMIF data EMIF_nCAS/GIOB[3] R4 Output Pulldown 20 µA 8mA EMIF column address strobe EMIF_nCS[0]/RTP_DATA[15]/N2HET2[7] N17 Output Pulldown 20 µA 8mA EMIF chip select, synchronous EMIF_nCS[2]/GIOB[4] L17 Output Pulldown 20 µA 8mA EMIF chip select, asynchronous EMIF_nCS[3]/RTP_DATA[14]/N2HET2[9] K17 Output Pulldown 20 µA 8mA EMIF chip select, asynchronous EMIF_nCS[4]/RTP_DATA[7]/GIOB[5] M17 Output Pulldown 20 µA 8mA EMIF chip select, asynchronous ETMDATA[15]/EMIF_nDQM[0] E10 Output Pulldown 20 µA 8mA EMIF byte enable N2HET1[19]/EMIF_nDQM[0]/SCI4TX B13(1) ETMDATA[14]/EMIF_nDQM[1] E11 Output Pulldown 20 µA 8mA EMIF byte enable N2HET1[20]/EMIF_nDQM[1]/ePWM6B P2(1) N2HET1[21]/EMIF_nDQM[2] H4 Output Pulldown 20 µA 8mA EMIF byte enable N2HET1[22]/EMIF_nDQM[3] B3 Output Pulldown 20 µA 8mA EMIF byte enable

4.2.1.16 Embedded Trace Macrocell Interface for Cortex-R5F (ETM-R5)

Table 4-18. ZWT Embedded Trace Macrocell Interface for Cortex-R5F (ETM-R5) Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength ETMDATA[0] R12 Output Pulldown 20 µA 8mA ETM data ETMDATA[1] R13 Output Pulldown 20 µA 8mA ETM data ETMDATA[2] J15 Output Pulldown 20 µA 8mA ETM data ETMDATA[3] H15 Output Pulldown 20 µA 8mA ETM data ETMDATA[4] G15 Output Pulldown 20 µA 8mA ETM data ETMDATA[5] F15 Output Pulldown 20 µA 8mA ETM data ETMDATA[6] E15 Output Pulldown 20 µA 8mA ETM data ETMDATA[7] E14 Output Pulldown 20 µA 8mA ETM data ETMDATA[8]/EMIF_ADDR[5] E9 Output Pulldown 20 µA 8mA ETM data ETMDATA[9]/EMIF_ADDR[4] E8 Output Pulldown 20 µA 8mA ETM data ETMDATA[10]/EMIF_ADDR[3] E7 Output Pulldown 20 µA 8mA ETM data ETMDATA[11]/EMIF_ADDR[2] E6 Output Pulldown 20 µA 8mA ETM data ETMDATA[12]/EMIF_BA[0] E13 Output Pulldown 20 µA 8mA ETM data ETMDATA[13]/EMIF_nOE E12 Output Pulldown 20 µA 8mA ETM data ETMDATA[14]/EMIF_nDQM[1] E11 Output Pulldown 20 µA 8mA ETM data ETMDATA[15]/EMIF_nDQM[0] E10 Output Pulldown 20 µA 8mA ETM data ETMDATA[16]/EMIF_DATA[0] K15 Output Pulldown 20 µA 8mA ETM data ETMDATA[17]/EMIF_DATA[1] L15 Output Pulldown 20 µA 8mA ETM data ETMDATA[18]/EMIF_DATA[2] M15 Output Pulldown 20 µA 8mA ETM data ETMDATA[19]/EMIF_DATA[3] N15 Output Pulldown 20 µA 8mA ETM data ETMDATA[20]/EMIF_DATA[4] E5 Output Pulldown 20 µA 8mA ETM data ETMDATA[21]/EMIF_DATA[5] F5 Output Pulldown 20 µA 8mA ETM data ETMDATA[22]/EMIF_DATA[6] G5 Output Pulldown 20 µA 8mA ETM data ETMDATA[23]/EMIF_DATA[7] K5 Output Pulldown 20 µA 8mA ETM data ETMDATA[24]/EMIF_DATA[8]/N2HET2[24]/MIBSPI5NCS[4] L5 Output Pulldown 20 µA 8mA ETM data ETMDATA[25]/EMIF_DATA[9]/N2HET2[25]/MIBSPI5NCS[5] M5 Output Pulldown 20 µA 8mA ETM data ETMDATA[26]/EMIF_DATA[10]/N2HET2[26] N5 Output Pulldown 20 µA 8mA ETM data ETMDATA[27]/EMIF_DATA[11]/N2HET2[27] P5 Output Pulldown 20 µA 8mA ETM data ETMDATA[28]/EMIF_DATA[12]/N2HET2[28]/GIOA[0] R5 Output Pulldown 20 µA 8mA ETM data

4.2.1.17 System Module Interface

Table 4-19. ZWT System Module Interface Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength nERROR B14 Output Pulldown 20 µA 8mA ESM error (And of Error 1 and Error 2) GIOB[6]/nERROR J2 Output Pulldown 20 µA 8mA ESM error 1 nPORRST W7 Input Pulldown 100 µA - Power-on reset, cold reset nRST B17 I/O Pullup 100 µA 4mA System reset, warm reset

4.2.1.18 Clock Inputs and Outputs

Table 4-20. ZWT Clock Inputs and Outputs Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength Description Signal Name 337 ZWT ECLK1 A12 I/O Pulldown Programmable, 20 µA 2mA ZD/8mA External clock output, or GIO EMIF_CLK/ECLK2 K3 I/O Pulldown Programmable, 20 µA 2mA ZD/8mA External clock output, or GIO GIOA[5]/EXTCLKIN1/ePWM1A B5 Input Pulldown Fixed, 20 µA - External clock input ETMTRACECLKIN/EXTCLKIN2/GIOA[5] R9 Input Pullup Fixed, 20 µA - External clock input # 2 KELVIN_GND L2 Input - - - Kelvin ground for oscillator OSCIN K1 Input - - - From external crystal/resonator, or external clock input OSCOUT L1 Output - - - To external crystal/resonator

4.2.1.19 Test and Debug Modules Interface

Table 4-21. ZWT Test and Debug Modules Interface TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH nTRST D18 Input Pulldown 100 µA - JTAG test hardware reset TCK B18 Input Pulldown Fixed, 100 µA - JTAG test clock TDI A17 Input Pullup Fixed, 100 µA - JTAG test data in TDO C18 Output Pulldown Fixed, 100 µA 8mA JTAG test data out TEST U2 Input Pulldown Fixed, 100 µA - Test mode enable. This terminal must be connected to ground directly or through a pulldown resistor. TMS C19 Input Pullup Fixed, 100 µA - JTAG test mode select RTCK A16 Output - - 8mA JTAG return test clock

4.2.1.20 Flash Supply and Test Pads

Table 4-22. ZWT Flash Supply and Test Pads TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH VCCP F8 3.3-V Power – – – Flash pump supply FLTP1 J5 Input – – – Flash test pads. These terminals are reserved for TI use only. For proper operation these terminals must connect only to a test pad or not be connected at all [no connect (NC)]. FLTP2 H5 Input – – –

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com 4.2.1.21 Supply for Core Logic: 1.2-V Nominal Table 4-23. ZWT Supply for Core Logic: 1.2-V Nominal Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength VCC P10 1.2-V Power - - - Core supply VCC L6 - - - Core supply VCC K6 - - - Core supply VCC F9 - - - Core supply VCC F10 - - - Core supply VCC J14 - - - Core supply VCC K14 - - - Core supply VCC M10 - - - Core supply VCC K8 - - - Core supply VCC H10 - - - Core supply VCC K12 - - - Core supply

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 4.2.1.22 Supply for I/O Cells: 3.3-V Nominal Table 4-24. ZWT Supply for I/O Cells: 3.3-V Nominal Terminal Signal Type Default Pull State Pull Type Output Buffer Drive Strength VCCIO F11 3.3-V Power – – – Operating supply for I/Os VCCIO F12 – – – Operating supply for I/Os VCCIO F13 – – – Operating supply for I/Os VCCIO F14 – – – Operating supply for I/Os VCCIO G14 – – – Operating supply for I/Os VCCIO H14 – – – Operating supply for I/Os VCCIO L14 – – – Operating supply for I/Os VCCIO M14 – – – Operating supply for I/Os VCCIO N14 – – – Operating supply for I/Os VCCIO P14 – – – Operating supply for I/Os VCCIO P13 – – – Operating supply for I/Os VCCIO P12 – – – Operating supply for I/Os VCCIO P9 – – – Operating supply for I/Os VCCIO P8 – – – Operating supply for I/Os VCCIO P7 – – – Operating supply for I/Os VCCIO P6 – – – Operating supply for I/Os VCCIO N6 – – – Operating supply for I/Os VCCIO M6 – – – Operating supply for I/Os VCCIO J6 – – – Operating supply for I/Os VCCIO H6 – – – Operating supply for I/Os VCCIO G6 – – – Operating supply for I/Os VCCIO F6 – – – Operating supply for I/Os VCCIO F7 – – – Operating supply for I/Os

4.2.1.23 Ground Reference for All Supplies Except VCCAD

Table 4-25. ZWT Ground Reference for All Supplies Except VCCAD TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH DESCRIPTION SIGNAL NAME 337 ZWT VSS W1 Ground – – – Ground reference VSS V1 – – – Ground reference VSS W2 – – – Ground reference VSS B1 – – – Ground reference VSS A1 – – – Ground reference VSS A2 – – – Ground reference VSS A18 – – – Ground reference VSS A19 – – – Ground reference VSS B19 – – – Ground reference VSS M8 – – – Ground reference VSS M9 – – – Ground reference VSS M11 – – – Ground reference VSS M12 – – – Ground reference VSS L8 – – – Ground reference VSS L9 – – – Ground reference VSS L10 – – – Ground reference VSS L11 – – – Ground reference VSS L12 – – – Ground reference VSS K9 – – – Ground reference VSS K10 – – – Ground reference VSS K11 – – – Ground reference VSS J8 – – – Ground reference VSS J9 – – – Ground reference VSS J10 – – – Ground reference VSS J11 – – – Ground reference VSS J12 – – – Ground reference VSS H8 – – – Ground reference VSS H9 – – – Ground reference VSS H11 – – – Ground reference VSS H12 – – – Ground reference

4.2.1.24 Other Supplies

Table 4-26. Other Supplies TERMINAL SIGNAL TYPE DEFAULT PULL STATE PULL TYPE OUTPUT BUFFER DRIVE STRENGTH Supply for PLL: 1.2-V nominal VCCPLL P11 1.2-V Power – – – Core supply for PLL's

4.2.2 Multiplexing

This microcontroller has several interfaces and uses extensive multiplexing to bring out the functions as required by the target application. The multiplexing is mostly on the output signals. A few inputs are also multiplexed to allow the same input signal to be driven in from an alternative terminal. For more information on multiplexing, refer to the IOMM chapter of the device specific technical reference manual.

4.2.2.1 Output Multiplexing

Table 4-27. Output Multiplexing Address Offset 337 ZWT BALL DEFAULT FUNCTION Select Bit Alternate Function 1 Select Bit Alternate Function 2 Select Bit Alternate Function 3 Select Bit Alternate Function 4 Select Bit Alternate Function 5 Select Bit 0x110 N19 AD1EVT 0[0] MII_RX_ER 0[2] RMII_RX_ER 0[3] nTZ1_1 0[5] D4 EMIF_ADDR[0] 0[8] N2HET2[1] 0[10] D5 EMIF_ADDR[1] 0[16] N2HET2[3] 0[18] C4 EMIF_ADDR[6] 0[24] RTP_DATA[13] 0[25] N2HET2[11] 0[26] 0x114 C5 EMIF_ADDR[7] 1[0] RTP_DATA[12] 1[1] N2HET2[13] 1[2] C6 EMIF_ADDR[8] 1[8] RTP_DATA[11] 1[9] N2HET2[15] 1[10] C7 EMIF_ADDR[9] 1[16] RTP_DATA[10] 1[17] C8 EMIF_ADDR[10] 1[24] RTP_DATA[9] 1[25] 0x118 C9 EMIF_ADDR[11] 2[0] RTP_DATA[8] 2[1] C10 EMIF_ADDR[12] 2[8] RTP_DATA[6] 2[9] C11 EMIF_ADDR[13] 2[16] RTP_DATA[5] 2[17] C12 EMIF_ADDR[14] 2[24] RTP_DATA[4] 2[25] 0x11C C13 EMIF_ADDR[15] 3[0] RTP_DATA[3] 3[1] D14 EMIF_ADDR[16] 3[8] RTP_DATA[2] 3[9] C14 EMIF_ADDR[17] 3[16] RTP_DATA[1] 3[17] D15 EMIF_ADDR[18] 3[24] RTP_DATA[0] 3[25] 0x120 C15 EMIF_ADDR[19] 4[0] RTP_nENA 4[1] C16 EMIF_ADDR[20] 4[8] RTP_nSYNC 4[9] C17 EMIF_ADDR[21] 4[16] RTP_CLK 4[17] 0x124 0x12C Reserved 0x130 PINMMR8[23:0] are reserved D16 EMIF_BA[1] 8[24] 8[25] N2HET2[5] 8[26] 0x134 K3 RESERVED 9[0] EMIF_CLK 9[1] ECLK2 9[2] R4 EMIF_nCAS 9[8] GIOB[3] 9[10] N17 EMIF_nCS[0] 9[16] RTP_DATA[15] 9[17] N2HET2[7] 9[18] L17 EMIF_nCS[2] 9[24] GIOB[4] 9[26]

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-27. Output Multiplexing (continued) Address Offset 337 ZWT BALL DEFAULT FUNCTION Select Bit Alternate Function 1 Select Bit Alternate Function 2 Select Bit Alternate Function 3 Select Bit Alternate Function 4 Select Bit Alternate Function 5 Select Bit 0x138 K17 EMIF_nCS[3] 10[0] RTP_DATA[14] 10[1] N2HET2[9] 10[2] M17 EMIF_nCSl[4] 10[8] RTP_DATA[7] 10[9] GIOB[5] 10[10] R3 EMIF_nRAS 10[16] GIOB[6] 10[18] P3 EMIF_nWAIT 10[24] GIOB[7] 10[26] 0x13C D17 EMIF_nWE 11[0] EMIF_RNW 11[1] E9 ETMDATA[8] 11[8] EMIF_ADDR[5] 11[9] E8 ETMDATA[9] 11[16] EMIF_ADDR[4] 11[17] E7 ETMDATA[10] 11[24] EMIF_ADDR[3] 11[25] 0x140 E6 ETMDATA[11] 12[0] EMIF_ADDR[2] 12[1] E13 ETMDATA[12] 12[8] EMIF_BA[0] 12[9] E12 ETMDATA[13] 12[16] EMIF_nOE 12[17] E11 ETMDATA[14] 12[24] EMIF_nDQM[1] 12[25] 0x144 E10 ETMDATA[15] 13[0] EMIF_nDQM[0] 13[1] K15 ETMDATA[16] 13[8] EMIF_DATA[0] 13[9] L15 ETMDATA[17] 13[16] EMIF_DATA[1] 13[17] M15 ETMDATA[18] 13[24] EMIF_DATA[2] 13[25] 0x148 N15 ETMDATA[19] 14[0] EMIF_DATA[3] 14[1] E5 ETMDATA[20] 14[8] EMIF_DATA[4] 14[9] F5 ETMDATA[21] 14[16] EMIF_DATA[5] 14[17] G5 ETMDATA[22] 14[24] EMIF_DATA[6] 14[25] 0x14C K5 ETMDATA[23] 15[0] EMIF_DATA[7] 15[1] L5 ETMDATA[24] 15[8] EMIF_DATA[8] 15[9] N2HET2[24] 15[10] MIBSPI5NCS[4] 15[11] M5 ETMDATA[25] 15[16] EMIF_DATA[9] 15[17] N2HET2[25] 15[18] MIBSPI5NCS[5] 15[19] N5 ETMDATA[26] 15[24] EMIF_DATA[10] 15[25] N2HET2[26] 15[26] 0x150 P5 ETMDATA[27] 16[0] EMIF_DATA[11] 16[1] N2HET2[27] 16[2] R5 ETMDATA[28] 16[8] EMIF_DATA[12] 16[9] N2HET2[28] 16[10] GIOA[0] 16[11] R6 ETMDATA[29] 16[16] EMIF_DATA[13] 16[17] N2HET2[29] 16[18] GIOA[1] 16[19] R7 ETMDATA[30] 16[24] EMIF_DATA[14] 16[25] N2HET2[30] 16[26] GIOA[3] 16[27] 0x154 R8 ETMDATA[31] 17[0] EMIF_DATA[15] 17[1] N2HET2[31] 17[2] GIOA[4] 17[3] R9 ETMTRACECLKIN 17[8] EXTCLKIN2 17[9] GIOA[5] 17[11] R10 ETMTRACECLKOUT 17[16] GIOA[6] 17[19] R11 ETMTRACECTL 17[24] GIOA[7] 17[27]

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Table 4-27. Output Multiplexing (continued) Address Offset 337 ZWT BALL DEFAULT FUNCTION Select Bit Alternate Function 1 Select Bit Alternate Function 2 Select Bit Alternate Function 3 Select Bit Alternate Function 4 Select Bit Alternate Function 5 Select Bit 0x15C C1 GIOA[2] 19[0] N2HET2[0] 19[2] eQEP2I 19[5] E1 GIOA[3] 19[8] N2HET2[2] 19[10] B5 GIOA[5] 19[16] EXTCLKIN1 19[19] ePWM1A 19[21] H3 GIOA[6] 19[24] N2HET2[4] 19[26] ePWM1B 19[29] 0x160 M1 GIOA[7] 20[0] N2HET2[6] 20[2] ePWM2A 20[5] F2 GIOB[2] 20[8] DCAN4TX 20[11] W10 GIOB[3] 20[16] DCAN4RX 20[19] J2 GIOB[6] 20[24] nERROR 20[25] 0x164 F1 GIOB[7] 21[0] RESERVED 21[1] nTZ1_2 21[5] R2 MIBSPI1NCS[0] 21[8] MIBSPI1SOMI[1] 21[9] MII_TXD[2] 21[10] ECAP6 21[13] F3 MIBSPI1NCS[1] 21[16] MII_COL 21[18] N2HET1[17] 21[19] eQEP1S 21[21] G3 MIBSPI1NCS[2] 21[24] MDIO 21[26] N2HET1[19] 21[27] 0x168 J3 MIBSPI1NCS[3] 22[0] N2HET1[21] 22[3] nTZ1_3 22[5] G19 MIBSPI1NENA 22[8] MII_RXD[2] 22[10] N2HET1[23] 22[11] ECAP4 22[13] V9 MIBSPI3CLK 22[16] AD1EXT_SEL[1] 22[17] eQEP1A 22[21] V10 MIBSPI3NCS[0] 22[24] AD2EVT 22[25] eQEP1I 22[29] 0x16C V5 MIBSPI3NCS[1] 23[0] MDCLK 23[2] N2HET1[25] 23[3] B2 MIBSPI3NCS[2] 23[8] I2C1_SDA 23[9] N2HET1[27] 23[11] nTZ1_2 23[13] C3 MIBSPI3NCS[3] 23[16] I2C1_SCL 23[17] N2HET1[29] 23[19] nTZ1_1 23[21] W9 MIBSPI3NENA 23[24] MIBSPI3NCS[5] 23[25] N2HET1[31] 23[27] eQEP1B 23[29] 0x170 W8 MIBSPI3SIMO 24[0] AD1EXT_SEL[0] 24[1] ECAP3 24[5] V8 MIBSPI3SOMI 24[8] AD1EXT_ENA 24[9] ECAP2 24[13] H19 MIBSPI5CLK 24[16] DMM_DATA[4] 24[17] MII_TXEN 24[18] RMII_TXEN 24[19] E19 MIBSPI5NCS[0] 24[24] DMM_DATA[5] 24[25] ePWM4A 24[29] 0x174 B6 MIBSPI5NCS[1] 25[0] DMM_DATA[6] 25[1] W6 MIBSPI5NCS[2] 25[8] DMM_DATA[2] 25[9] T12 MIBSPI5NCS[3] 25[16] DMM_DATA[3] 25[17] H18 MIBSPI5NENA 25[24] DMM_DATA[7] 25[25] MII_RXD[3] 25[26] ECAP5 25[29] 0x178 J19 MIBSPI5SIMO[0] 26[0] DMM_DATA[8] 26[1] MII_TXD[1] 26[2] RMII_TXD[1] 26[3] E16 MIBSPI5SIMO[1] 26[8] DMM_DATA[9] 26[9] AD1EXT_SEL[0] 26[12] H17 MIBSPI5SIMO[2] 26[16] DMM_DATA[10] 26[17] AD1EXT_SEL[1] 26[20] G17 MIBSPI5SIMO[3] 26[24] DMM_DATA[11] 26[25] I2C2_SDA 26[26] AD1EXT_SEL[2] 26[28]

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments Incorporated Terminal Configuration and Functions Submit Documentation Feedback RM57L843 www.ti.com SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 Table 4-27. Output Multiplexing (continued) Address Offset 337 ZWT BALL DEFAULT FUNCTION Select Bit Alternate Function 1 Select Bit Alternate Function 2 Select Bit Alternate Function 3 Select Bit Alternate Function 4 Select Bit Alternate Function 5 Select Bit 0x17C J18 MIBSPI5SOMI[0] 27[0] DMM_DATA[12] 27[1] MII_TXD[0] 27[2] RMII_TXD[0] 27[3] E17 MIBSPI5SOMI[1] 27[8] DMM_DATA[13] 27[9] AD1EXT_SEL[3] 27[12] H16 MIBSPI5SOMI[2] 27[16] DMM_DATA[14] 27[17] AD1EXT_SEL[4] 27[20] G16 MIBSPI5SOMI[3] 27[24] DMM_DATA[15] 27[25] I2C2_SCL 27[26] AD1EXT_ENA 27[28] 0x180 K18 N2HET1[0] 28[0] MIBSPI4CLK 28[1] ePWM2B 28[5] V2 N2HET1[1] 28[8] MIBSPI4NENA 28[9] N2HET2[8] 28[11] eQEP2A 28[13] W5 N2HET1[2] 28[16] MIBSPI4SIMO 28[17] ePWM3A 28[21] U1 N2HET1[3] 28[24] MIBSPI4NCS[0] 28[25] N2HET2[10] 28[27] eQEP2B 28[29] 0x184 B12 N2HET1[4] 29[0] MIBSPI4NCS[1] 29[1] ePWM4B 29[5] V6 N2HET1[5] 29[8] MIBSPI4SOMI 29[9] N2HET2[12] 29[11] ePWM3B 29[13] W3 N2HET1[6] 29[16] SCI3RX 29[17] ePWM5A 29[21] T1 N2HET1[7] 29[24] MIBSPI4NCS[2] 29[25] N2HET2[14] 29[27] ePWM7B 29[29] 0x188 E18 N2HET1[8] 30[0] MIBSPI1SIMO[1] 30[1] MII_TXD[3] 30[2] V7 N2HET1[9] 30[8] MIBSPI4NCS[3] 30[9] N2HET2[16] 30[11] ePWM7A 30[13] D19 N2HET1[10] 30[16] MIBSPI4NCS[4] 30[17] MII_TX_CLK 30[18] RESERVED 30[19] nTZ1_3 30[21] E3 N2HET1[11] 30[24] MIBSPI3NCS[4] 30[25] N2HET2[18] 30[27] ePWM1SYNCO 30[29] 0x18C B4 N2HET1[12] 31[0] MIBSPI4NCS[5] 31[1] MII_CRS 31[2] RMII_CRS_DV 31[3] N2 N2HET1[13] 31[8] SCI3TX 31[9] N2HET2[20] 31[11] ePWM5B 31[13] N1 N2HET1[15] 31[16] MIBSPI1NCS[4] 31[17] N2HET2[22] 31[19] ECAP1 31[21] A4 N2HET1[16] 31[24] ePWM1SYNCI 31[27] ePWM1SYNCO 31[29] 0x190 A13 N2HET1[17] 32[0] EMIF_nOE 32[1] SCI4RX 32[2] J1 N2HET1[18] 32[8] EMIF_RNW 32[9] ePWM6A 32[13] B13 N2HET1[19] 32[16] EMIF_nDQM[0] 32[17] SCI4TX 32[18] P2 N2HET1[20] 32[24] EMIF_nDQM[1] 32[25] ePWM6B 32[29] 0x194 H4 N2HET1[21] 33[0] EMIF_nDQM[2] 33[1] B3 N2HET1[22] 33[8] EMIF_nDQM[3] 33[9] J4 N2HET1[23] 33[16] EMIF_BA[0] 33[17] P1 N2HET1[24] 33[24] MIBSPI1NCS[5] 33[25] MII_RXD[0] 33[26] RMII_RXD[0] 33[27] 0x198 A14 N2HET1[26] 34[0] MII_RXD[1] 34[2] RMII_RXD[1] 34[3] K19 N2HET1[28] 34[8] MII_RXCLK 34[10] RMII_REFCLK 34[11] RESERVED 34[12] B11 N2HET1[30] 34[16] MII_RX_DV 34[18] eQEP2S 34[21] D8 N2HET2[1] 34[24] N2HET1_NDIS 34[25]

PRODUCT□PREVIEW Copyright © 2014–2016, Texas Instruments IncorporatedTerminal Configuration and Functions Submit Documentation Feedback RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Table 4-27. Output Multiplexing (continued) Address Offset 337 ZWT BALL DEFAULT FUNCTION Select Bit Alternate Function 1 Select Bit Alternate Function 2 Select Bit Alternate Function 3 Select Bit Alternate Function 4 Select Bit Alternate Function 5 Select Bit 0x19C D7 N2HET2[2] 35[0] N2HET2_NDIS 35[1] D3 N2HET2[12] 35[8] MIBSPI2NENA 35[12] MIBSPI2NCS[1] 35[13] D2 N2HET2[13] 35[16] MIBSPI2SOMI 35[20] D1 N2HET2[14] 35[24] MIBSPI2SIMO 35[28] 0x1A0 P4 N2HET2[19] 36[0] LIN2RX 36[1] T5 N2HET2[20] 36[8] LIN2TX 36[9] T4 MII_RXCLK 36[16] RESERVED 36[20] U7 MII_TX_CLK 36[24] RESERVED 36[28] 0x1A4 E2 N2HET2[3] 37[0] MIBSPI2CLK 37[4] N3 N2HET2[7] 37[8] MIBSPI2NCS[0] 37[12]

4.2.2.1.1 Notes on Output Multiplexing

Table 4-27 lists the output signal multiplexing and control signals for selecting the desired functionality for each pad.

The pads default to the signal defined by the "Default Function" in Table 4-27.
The CTRL x columns in Table 4-27 contain a value of type x[y] which indicates the control register PINMMRx, bit y. It indicates the multiplexing control register and the bit that must be set in order to select the corresponding functionality to be output on any particular pad. – For example, consider the multiplexing on pin H3 for the 337-ZWT package: 337 ZWT BALL DEFAULT FUNCTION CTRL1 OPTION 2 CTRL2 OPTION 3 CTRL3 OPTION 4 CTRL4 OPTION 5 CTRL5 OPTION 6 CTRL6 H3 GIOA[6] 19[24] N2HET2[4] 19[26] ePWM1B 19[29] – When GIOA[6] is configured as an output pin in the GIO module control register, then the programmed output level appears on pin H3 by default. The PINMMR19[24] is set by default to indicate that the GIOA[6] signal is selected to be output. – If the application must output the N2HET2[4] signal on pin H3, it must clear PINMMR19[24] and set PINMMR19[26]. – Note that the pin is connected as input to both the GIO and N2HET2 modules. That is, there is no input multiplexing on this pin.
The base address of the IOMM module starts at 0xFFFF_1C00. The Output mux control registers with the first register PINMMR0 starts at the offset address 0x110 within the IOMM module.

4.2.2.2 Input Multiplexing

Some signals are connected to more than one terminals, so that the inputs for these signals can come from either of these terminals. A multiplexor is implemented to let the application choose the terminal that will be used for providing the input signal from among the available options. The input path selection is done based on two bits in the PINMMR control registers as listed in Table 4-28. Table 4-28. Input Multiplexing Address Offset Signal Name Default Terminal Terminal 1 Input Multiplex Control Alternate Terminal Terminal 2 Input Multiplex Control 250h AD2EVT T10 PINMMR80[0] V10 PINMMR80[1] 25Ch GIOA[0] A5 PINMMR83[24] R5 PINMMR83[25] 260h GIOA[1] C2 PINMMR84[0] R6 PINMMR84[1] GIOA[2] C1 PINMMR84[8] B15 PINMMR84[9] GIOA[3] E1 PINMMR84[16] R7 PINMMR84[17] GIOA[4] A6 PINMMR84[24] R8 PINMMR84[25] 264h GIOA[5] B5 PINMMR85[0] R9 PINMMR85[1] GIOA[6] H3 PINMMR85[8] R10 PINMMR85[9] GIOA[7] M1 PINMMR85[16] R11 PINMMR85[17] GIOB[0] M2 PINMMR85[24] B8 PINMMR85[25] 268h GIOB[1] K2 PINMMR86[0] B16 PINMMR86[1] GIOB[2] F2 PINMMR86[8] B9 PINMMR86[9] GIOB[3] W10 PINMMR86[16] R4 PINMMR86[17] GIOB[4] G1 PINMMR86[24] L17 PINMMR86[25] 26Ch GIOB[5] G2 PINMMR87[0] M17 PINMMR87[1] GIOB[6] J2 PINMMR87[8] R3 PINMMR87[9] GIOB[7] F1 PINMMR87[16] P3 PINMMR87[17] MDIO F4 PINMMR87[24] G3 PINMMR87[25] 270h MIBSPI1NCS[4] U10 PINMMR88[0] N1 PINMMR88[1] MIBSPI1NCS[5] U9 PINMMR88[8] P1 PINMMR88[9] 274h MII_COL W4 PINMMR89[16] F3 PINMMR89[17] MII_CRS V4 PINMMR89[24] B4 PINMMR89[25] 278h MII_RX_DV U6 PINMMR90[0] B11 PINMMR90[1] MII_RX_ER U5 PINMMR90[8] N19 PINMMR90[9] MII_RXCLK T4 PINMMR90[16] K19 PINMMR90[17] MII_RXD[0] U4 PINMMR90[24] P1 PINMMR90[25] 27Ch MII_RXD[1] T3 PINMMR91[0] A14 PINMMR91[1] MII_RXD[2] U3 PINMMR91[8] G19 PINMMR91[9] MII_RXD[3] V3 PINMMR91[16] H18 PINMMR91[17] MII_TX_CLK U7 PINMMR91[24] D19 PINMMR91[25] 280h N2HET1[17] A13 PINMMR92[0] F3 PINMMR92[1] N2HET1[19] B13 PINMMR92[8] G3 PINMMR92[9] N2HET1[21] H4 PINMMR92[16] J3 PINMMR92[17] N2HET1[23] J4 PINMMR92[24] G19 PINMMR92[25] 284h N2HET1[25] M3 PINMMR93[0] V5 PINMMR93[1] N2HET1[27] A9 PINMMR93[8] B2 PINMMR93[9] N2HET1[29] A3 PINMMR93[16] C3 PINMMR93[17] N2HET1[31] J17 PINMMR93[24] W9 PINMMR93[25]

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Terminal Configuration and FunctionsCopyright © 2014–2016, Texas Instruments Incorporated Table 4-28. Input Multiplexing (continued) Address Offset Signal Name Default Terminal Terminal 1 Input Multiplex Control Alternate Terminal Terminal 2 Input Multiplex Control 288h N2HET2[0] D6 PINMMR94[0] C1 PINMMR94[1] N2HET2[1] D8 PINMMR94[8] D4 PINMMR94[9] N2HET2[2] D7 PINMMR94[16] E1 PINMMR94[17] N2HET2[3] E2 PINMMR94[24] D5 PINMMR94[25] 28Ch N2HET2[4] D13 PINMMR95[0] H3 PINMMR95[1] N2HET2[5] D12 PINMMR95[8] D16 PINMMR95[9] N2HET2[6] D11 PINMMR95[16] M1 PINMMR95[17] N2HET2[7] N3 PINMMR95[24] N17 PINMMR95[25] 290h N2HET2[8] K16 PINMMR96[0] V2 PINMMR96[1] N2HET2[9] L16 PINMMR96[8] K17 PINMMR96[9] N2HET2[10] M16 PINMMR96[16] U1 PINMMR96[17] N2HET2[11] N16 PINMMR96[24] C4 PINMMR96[25] 294h N2HET2[12] D3 PINMMR97[0] V6 PINMMR97[1] N2HET2[13] D2 PINMMR97[8] C5 PINMMR97[9] N2HET2[14] D1 PINMMR97[16] T1 PINMMR97[17] N2HET2[15] K4 PINMMR97[24] C6 PINMMR97[25] 298h N2HET2[16] L4 PINMMR98[0] V7 PINMMR98[1] N2HET2[18] N4 PINMMR98[8] E3 PINMMR98[9] N2HET2[20] T5 PINMMR98[16] N2 PINMMR98[17] N2HET2[22] T7 PINMMR98[24] N1 PINMMR98[25] 29Ch nTZ1_1 N19 PINMMR99[0] C3 PINMMR99[1] nTZ1_2 F1 PINMMR99[8] B2 PINMMR99[9] nTZ1_3 J3 PINMMR99[16] D19 PINMMR99[17]

4.2.2.2.1 Notes on Input Multiplexing

The Terminal x Input Multiplex Control column in Table 4-28 lists the multiplexing control register and the bit that must be set in order to select the terminal for providing the input signal to the system. For example, N2HET2[22] can appears on two different terminals at terminal number T7 and N1. By default PINMMR98[24] is set and PINMMR98[25] is cleared to select T7 for providing N2HET2[22] to the system. If the application chooses to use N1 for providing N2HET2[22] then PINMMR98[24] must be cleared and PINMMR98[25] must be set.
Base address of the IOMM module starts at 0xFFFF_1C00. Input mux control registers with the first register PINMMR80 starts at the offset address 0x250 within the IOMM module.

4.2.2.2.2 General Rules for Multiplexing Control Registers

The PINMMR control registers can only be written in privileged mode. A write in a nonprivileged mode will generate an error response.
If the application writes all 9’s to any PINMMR control register, then the default functions are selected for the affected pads.
Each byte in a PINMMR control register is used to select the functionality for a given pad. If the application sets more than one bit within a byte for any pad, then the default function is selected for this pad.
Several bits in the PINMMR control registers are reserved and are not used to enable any functions. If the application sets only these bits and clears the other bits, then the default functions are selected for the affected pads.

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated grounds.

5 Specifications

5.1 Absolute Maximum Ratings(1)

Over Operating Free-Air Temperature Range MIN MAX UNIT Supply voltage VCC(2) –0.3 1.43 VVCCIO, VCCP(2) –0.3 4.6 VCCAD –0.3 6.25 Input voltage All input pins, with exception of ADC pins –0.3 4.6 V ADC input pins –0.3 6.25 Input clamp current: IIK (VI < 0 or VI > VCCIO) All pins, except AD1IN[31:0] and –20 20 mAIIK (VI < 0 or VI > VCCAD) AD1IN[31:0] and –10 10 Total –40 40 Operating free-air temperature (TA) –40 105 °C Operating junction temperature (TJ) –40 130 °C Storage temperature (Tstg) –65 150 °C

5.2 ESD Ratings

Electrostatic discharge (ESD) performance: Human Body Model (HBM) –2 2 kV Charged Device Model (CDM) All pins except corner balls –500 500 V Corner balls –750 750 V (1) POH represent device operation under the specified nominal conditions continuously for the duration of the calculated lifetime.

5.3 Power-On Hours (POH)

POH is a function of voltage and temperature. Usage at higher voltages and temperatures will result in a reduction in POH to achieve the same reliability performance. The POH information in Table 5-1 is provided solely for convenience and does not extend or modify the warranty provided under TI’s standard terms and conditions for TI Semiconductor Products. To avoid significant device degradation, the device POH must be limited to those listed in Table 5-1. To convert to equivalent POH for a specific temperature profile, see the Calculating Equivalent Power-on-Hours for Hercules Safety MCUs Application Report (SPNA207). Table 5-1. Power-On Hours Limits NOMINAL VCC VOLTAGE (V) JUNCTION TEMPERATURE (TJ) LIFETIME POH(1)

1.2 V 105 ºC 100K

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) All voltages are with respect to VSS, except VCCAD, which is with respect to VSSAD

5.4 Device Recommended Operating Conditions(1)

VCC Digital logic supply voltage (Core) 1.14 1.2 1.32 V VCCPLL PLL supply voltage 1.14 1.2 1.32 V VCCIO Digital logic supply voltage (I/O) 3 3.3 3.6 V VCCAD MibADC supply voltage 3 5.25 V VCCP Flash pump supply voltage 3 3.3 3.6 V VSS Digital logic supply ground 0 V VSSAD MibADC supply ground –0.1 0.1 V VADREFHI A-to-D high-voltage reference source VSSAD VCCAD V VADREFLO A-to-D low-voltage reference source VSSAD VCCAD V TA Operating free-air temperature –40 105 °C TJ Operating junction temperature –40 130 °C

PRODUCT□PREVIEW Data Waitstates RAM RWAIT Setting Flash (Main Memory) HCLK = 0MHz HCLK = 0MHz 90MHz45MHz 0 1 3 135MHz EWAIT Setting HCLK = 0MHz 1 64 150MHz 150MHz 150MHz EEPROM Flash (BUS2) 60MHz 90MHz 120MHz 45MHz 75MHz 3 8 135MHz105MHz RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Specifications Copyright © 2014–2016, Texas Instruments Incorporated

5.5 Switching Characteristics over Recommended Operating Conditions for Clock Domains

Table 5-2. Clock Domain Timing Specifications PARAMETER TEST CONDITIONS MIN MAX UNIT fOSC OSC - oscillator clock frequency using an external crystal 5 20 MHz fGCLK1 GCLK - R5F CPU clock frequency 330 MHz fGCLK2 GCLK - R5F CPU clock frequency 330 MHz fHCLK HCLK - System clock frequency 150 MHz fVCLK VCLK - Primary peripheral clock frequency 110 MHz fVCLK2 VCLK2 - Secondary peripheral clock frequency 110 MHz fVCLK3 VCLK3 - Secondary peripheral clock frequency 150 MHz fVCLKA1 VCLKA1 - Primary asynchronous peripheral clock frequency 110 MHz fVCLKA2 VCLKA2 - Secondary asynchronous peripheral clock frequency 110 MHz fVCLKA4 VCLKA4 - Secondary asynchronous peripheral clock frequency 110 MHz fRTICLK1 RTICLK1 - clock frequency fVCLK MHz fPROG/ERASE System clock frequency - flash programming/erase fHCLK MHz fECLK External Clock 1 110 MHz fETMCLKOUT ETM trace clock output 55 MHz fETMCLKIN ETM trace clock input 110 MHz fEXTCLKIN1 External input clock 1 110 MHz fEXTCLKIN2 External input clock 2 110 MHz Table 5-2 lists the maximum frequency of the CPU (GLKx), the level-2 memory (HCLK) and the peripheral clocks (VCLKx). It is not always possible to run each clock at its maximum frequency as GCLK must be an integral multiple of HCLK and HCLK must be an integral multiple of VCLKx. Depending on the system, the optimum performance may be obtained by maximizing either the CPU frequency, the level-two RAM interface, the level-two flash interface, or the peripherals.

5.6 Wait States Required - L2 Memories

Wait states are cycles the CPU must wait in order to retrieve data from the memories which have access times longer than a CPU clock. Memory wrapper, SCR interconnect and the CPU itself may introduce additional cycles of latency due to logic pipelining and synchronization. Therefore, the total latency cycles as seen by the CPU can be more than the number of wait states to cover the memory access time. Figure 5-1 shows only the number of programmable wait states needed for L2 flash memory at different frequencies. The number of wait states is correlated to HCLK frequency. The clock ratio between CPU clock (GCLKx) and HCLK can vary. Therefore, the total number of wait states in terms of GCLKx can be obtained by taking the programmed wait states multiplied by the clock ratio. There is no user programmable wait state for L2 SRAM access. L2 SRAM is clocked by HCLK and is limited to maximum 150 MHz. Figure 5-1. Wait States Scheme

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated L2 flash is clocked by HCLK and is limited to maximum 150 MHz. The L2 flash can support zero data wait state up to 45 MHz.

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The typical value is the average current for the nominal process corner and junction temperature of 25ºC. (2) The maximum ICC, value can be derated

linearly with voltage
by 1.7 mA/MHz for lower GCLK frequency when fGCLK= 3 * fHCLK= 3 * fVCLK
for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes. 283 - 0.2 e 0.018T JK (3) The maximum ICC, value can be derated
linearly with voltage
by 3.2 mA/MHz for lower GCLK frequency
for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes. 283 - 0.2 e 0.018T JK (4) LBIST and PBIST currents are for a short duration, typically less than 10 ms. They are usually ignored for thermal calculations for the device and the voltage regulator.

5.7 Power Consumption

Over Recommended Operating Conditions PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT ICC VCC digital supply and PLL current (operating mode) fGCLK = 330 MHz, fHCLK = 110 MHz, fVCLK = 110 MHz, fVCLK2 = 110 MHz, fVCLK3 = 110 MHz 595 880 (2) mA VCC digital supply and PLL current (LBIST mode, or PBIST mode) LBIST clock rate = 82.5 MHz 970 1350(3)(4) mA PBIST ROM clock frequency = 55 MHz ICCIO VCCIO digital supply current (operating mode) No DC load, VCCmax 15 mA ICCAD VCCAD supply current (operating mode) Single ADC operational, VCCADmax 15 mA Single ADC power down, VCCADmax 5 µA Both ADCs operational, VCCADmax 30 mA ICCREF HI ADREFHI supply current (operating mode) Single ADC operational, ADREFHImax 5 mA Both ADCs operational, ADREFHImax 10 mA ICCP VCCP pump supply current Read operation of two banks in parallel, VCCPmax 70 mA Read from two banks and program or erase another bank, VCCPmax 93 mA

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) Source currents (out of the device) are negative while sink currents (into the device) are positive. (2) This does not apply to the nPORRST pin.

5.8 Input/Output Electrical Characteristics Over Recommended Operating Conditions(1)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Vhys Input hysteresis All inputs 180 mV VIL Low-level input voltage All inputs(2) –0.3 0.8 V VIH High-level input voltage All inputs(2) 2 VCCIO + 0.3 V VOL Low-level output voltage IOL = IOLmax 0.2 * VCCIO VIOL = 50 µA, standard output mode 0.2 VOH High-level output voltage IOH = IOHmax 0.8 * VCCIO VIOH = 50 µA, standard output mode VCCIO – 0.3 IIC Input clamp current (I/O pins) VI < VSSIO – 0.3 or VI > VCCIO + 0.3 –3.5 3.5 mA II Input current (I/O pins) IIH Pulldown 20 µA VI = VCCIO 5 40 µA IIH Pulldown 100 µA VI = VCCIO 40 195 IIL Pullup 20 µA VI = VSS -40 –5 IIL Pullup 100 µA VI = VSS –195 –40 All other pins No pullup or pulldown –1 1 IOL Low-level output current Pins with output buffers of 8 mA drive strength VOLmax 8 mA Pins with output buffers of 4 mA drive strength Pins with output buffers of 2 mA drive strength IOH High-level output current Pins with output buffers of 8 mA drive strength VOLmin –8 mA Pins with output buffers of 4 mA drive strength Pins with output buffers of 2 mA drive strength CI Input capacitance 2 pF CO Output capacitance 3 pF

PRODUCT□PREVIEW VCCIO V IH VIH VIL Input tpw V IL RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report SPRA953

5.9 Thermal Resistance Characteristics for the BGA Package (ZWT)

Over operating free-air temperature range (unless otherwise noted) (1) °C / W RΘJA Junction-to-free air thermal resistance, still air (includes 5×5 thermal via cluster in 2s2p PCB connected to 1st ground plane) 14.3 RΘJB Junction-to-board thermal resistance (includes 5×5 thermal via cluster in 2s2p PCB connected to 1st ground plane) 5.49 RΘJC Junction-to-case thermal resistance (2s0p PCB) 5.02 ΨJT Junction-to-package top, still air (includes 5×5 thermal via cluster in 2s2p PCB connected to 1st ground plane) 0.29 ΨJB Junction-to-board, still air (includes 5×5 thermal via cluster in 2s2p PCB connected to 1st ground plane) 6.41 (1) tc(VCLK) = peripheral VBUS clock cycle time = 1 / f(VCLK) (2) The timing shown above is only valid for pin used in general-purpose input mode.

5.10 Timing and Switching Characteristics

5.10.1 Input Timings

Figure 5-2. TTL-Level Inputs Table 5-3. Timing Requirements for Inputs(1) MIN MAX UNIT tpw Input minimum pulse width tc(VCLK) + 10(2) ns tin_slew Time for input signal to go from VIL to VIH or from VIH to VIL 1 ns

5.10.2 Output Timings

Table 5-4. Switching Characteristics for Output Timings versus Load Capacitance (CL) PARAMETER MIN MAX UNIT Rise time, tr 8 mA low EMI pins CL = 15 pF 2.5 ns CL = 50 pF 4 CL = 100 pF 7.2 CL = 150 pF 12.5 Fall time, tf CL = 15 pF 2.5 ns CL = 50 pF 4 CL = 100 pF 7.2 CL = 150 pF 12.5 Rise time, tr 4 mA low EMI pins CL = 15 pF 5.6 ns CL = 50 pF 10.4 CL = 100 pF 16.8 CL = 150 pF 23.2 Fall time, tf CL = 15 pF 5.6 ns CL= 50 pF 10.4 CL = 100 pF 16.8 CL = 150 pF 23.2 Rise time, tr 2 mA-z low EMI pins CL = 15 pF 8 ns CL = 50 pF 15 CL = 100 pF 23 CL = 150 pF 33 Fall time, tf CL = 15 pF 8 ns CL = 50 pF 15 CL = 100 pF 23 CL = 150 pF 33 Rise time, tr Selectable 8mA / 2mA-z pins 8 mA mode CL = 15 pF 2.5 ns CL = 50 pF 4 CL = 100 pF 7.2 CL = 150 pF 12.5 Fall time, tf CL = 15 pF 2.5 ns CL = 50 pF 4 CL = 100 pF 7.2 CL = 150 pF 12.5 Rise time, tr 2 mA-z mode CL = 15 pF 8 ns CL = 50 pF 15 CL = 100 pF 23 CL = 150 pF 33 Fall time, tf CL = 15 pF 8 ns CL = 50 pF 15 CL = 100 pF 23 CL = 150 pF 33

PRODUCT□PREVIEW tftr VCCIO V OH VOH VOL VOL Output RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) This specification does not account for any output buffer drive strength differences or any external capacitive loading differences. Check for output buffer drive strength information on each signal. Figure 5-3. CMOS-Level Outputs Table 5-5. Timing Requirements for Outputs(1) MIN MAX UNIT td(parallel_out) Delay between low to high, or high to low transition of general-purpose output signals that can be configured by an application in parallel, for example, all signals in a GIOA port, or all N2HET1 signals, and so forth. 6 ns

6 System Information and Electrical Specifications

6.1 Device Power Domains

The device core logic is split up into multiple virtual power domains to optimize the power for a given application use case. This device has six logic power domains: PD1, PD2, PD3, PD4, PD5, and PD6. PD1 is a domain which cannot turn off of its clocks at once through the Power-Management Module (PMM). However, individual clock domain operating in PD1 can be individually enabled or disabled through the SYS.CDDIS register. Each of the other power domains can be turned ON, IDLE or OFF as per the application requirement through the PMM module. In this device, a power domain can operate in one of the three possible power states: ON, IDLE and OFF. ON state is the normal operating state where clocks are actively running in the power domain. When clocks are turned off, the dynamic current is removed from the power domain. In this device, both the IDLE and OFF states have the same power characteristic. When put into either the IDLE or the OFF state, only clocks are turned off from the power domain. Leakage current from the power domain still remains. Note that putting a power domain in the OFF state will not remove any leakage current in this device. In changing the power domain states, the user must poll the system status register to check the completion of the transition. From a programmer model perspective, all three power states are available from the PMM module. The actual management of the power domains and the hand-shaking mechanism is managed by the PMM. Refer to the Power Management Module (PMM) chapter of the device technical reference manual for more details.

6.2 Voltage Monitor Characteristics

A voltage monitor is implemented on this device. The purpose of this voltage monitor is to eliminate the requirement for a specific sequence when powering up the core and I/O voltage supplies.

6.2.1 Important Considerations

The voltage monitor does not eliminate the need of a voltage supervisor circuit to ensure that the device is held in reset when the voltage supplies are out of range.
The voltage monitor only monitors the core supply (VCC) and the I/O supply (VCCIO). The other supplies are not monitored by the VMON. For example, if the VCCAD or VCCP are supplied from a source different from that for VCCIO, then there is no internal voltage monitor for the VCCAD and VCCP supplies.

6.2.2 Voltage Monitor Operation

The voltage monitor generates the Power Good MCU signal (PGMCU) as well as the I/Os Power Good IO signal (PGIO) on the device. During power-up or power-down, the PGMCU and PGIO are driven low when the core or I/O supplies are lower than the specified minimum monitoring thresholds. The PGIO and PGMCU being low isolates the core logic as well as the I/O controls during power up or power down of the supplies. This allows the core and I/O supplies to be powered up or down in any order. When the voltage monitor detects a low voltage on the I/O supply, it will assert a power-on reset. When the voltage monitor detects an out-of-range voltage on the core supply, it asynchronously makes all output pins high impedance, and asserts a power-on reset. The I/O supply must be above the threshold for monitoring the core supply. The voltage monitor is disabled when the device enters a low power mode. The VMON also incorporates a glitch filter for the nPORRST input. Refer to Section 6.3.3.1 for the timing information on this glitch filter. Table 6-1. Voltage Monitoring Specifications PARAMETER MIN TYP MAX UNIT VMON Voltage monitoring thresholds VCC low - VCC level below this threshold is detected as too low. 0.75 0.9 1.13 VVCC high - VCC level above this threshold is detected as too high. 1.40 1.7 2.1 VCCIO low - VCCIO level below this threshold is detected as too low. 1.85 2.4 2.99

6.2.3 Supply Filtering

The VMON has the capability to filter glitches on the VCC and VCCIO supplies. Table 6-2 lists the characteristics of the supply filtering. Glitches in the supply larger than the maximum specification cannot be filtered. Table 6-2. VMON Supply Glitch Filtering Capability PARAMETER MIN MAX UNIT Width of glitch on VCC that can be filtered 250 1000 ns Width of glitch on VCCIO that can be filtered 250 1000 ns

6.3 Power Sequencing and Power-On Reset

6.3.1 Power-Up Sequence

There is no timing dependency between the ramp of the VCCIO and the VCC supply voltage. The power- up sequence starts with the I/O voltage rising above the minimum I/O supply threshold, (for more details, see Table 6-3), core voltage rising above the minimum core supply threshold and the release of power-on reset. The high-frequency oscillator will start up first and its amplitude will grow to an acceptable level. The oscillator start-up time is dependent on the type of oscillator and is provided by the oscillator vendor. The different supplies to the device can be powered up in any order. The device goes through the following sequential phases during power up. Table 6-3. Power-Up Phases Oscillator start-up and validity check 1024 oscillator cycles eFuse autoload 3650 oscillator cycles Flash pump power-up 250 oscillator cycles Flash bank power-up 1460 oscillator cycles Total 6384 oscillator cycles The CPU reset is released at the end of the above sequence and fetches the first instruction from address 0x00000000.

PRODUCT□PREVIEW

3.3 V VCCIOPORH

1.2 V VCCPORH VCCIOPORL V (1.2 V) V / V (3.3 V) CC CCIO CCP nPORRST 6 6 VCCPORL VIL(PORRST) V / VCCIO CCP VCC VCCPORL VIL(PORRST)VIL VIL VIL VCCIOPORH VCCPORH VCCIOPORL Note: There is no timing dependency between the ramp of the V and the V supply voltage; this is just an example.CCIO CC RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.3.2 Power-Down Sequence

The different supplies to the device can be powered down in any order.

6.3.3 Power-On Reset: nPORRST

This is the power-on reset. This reset must be asserted by an external circuitry whenever the I/O or core supplies are outside the specified recommended range. This signal has a glitch filter on it. It also has an internal pulldown. 6.3.3.1 nPORRST Electrical and Timing Requirements Table 6-4. Electrical Requirements for nPORRST NO. MIN MAX UNIT VCCPORL VCC low supply level when nPORRST must be active during power up 0.5 V VCCPORH VCC high supply level when nPORRST must remain active during power up and become active during power down 1.14 V VCCIOPORL VCCIO / VCCP low supply level when nPORRST must be active during power up 1.1 V VCCIOPORH VCCIO / VCCP high supply level when nPORRST must remain active during power up and become active during power down 3.0 V VIL(PORRST) Low-level input voltage of nPORRST VCCIO > 2.5 V 0.2 * VCCIO V Low-level input voltage of nPORRST VCCIO < 2.5 V 0.5 3 tsu(PORRST) Setup time, nPORRST active before VCCIO and VCCP > VCCIOPORL during power up 0 ms 6 th(PORRST) Hold time, nPORRST active after VCC > VCCPORH 1 ms 7 tsu(PORRST) Setup time, nPORRST active before VCC < VCCPORH during power down 2 µs 8 th(PORRST) Hold time, nPORRST active after VCCIO and VCCP > VCCIOPORH 1 ms 9 th(PORRST) Hold time, nPORRST active after VCC < VCCPORL 0 ms tf(nPORRST) Filter time nPORRST terminal; pulses less than MIN will be filtered out, pulses greater than MAX will generate a reset. Pulses greater than MIN but less than MAX may or may not generate a reset. 475 2000 ns Figure 6-1. nPORRST Timing Diagram

6.4 Warm Reset (nRST)

This is a bidirectional reset signal. The internal circuitry drives the signal low on detecting any device reset condition. An external circuit can assert a device reset by forcing the signal low. On this terminal, the output buffer is implemented as an open drain (drives low only). To ensure an external reset is not arbitrarily generated, TI recommends that an external pullup resistor is connected to this terminal. This terminal has a glitch filter. It also has an internal pullup

6.4.1 Causes of Warm Reset

Table 6-5. Causes of Warm Reset DEVICE EVENT SYSTEM STATUS FLAG Power-Up Reset Exception Status Register, bit 15 Oscillator fail Global Status Register, bit 0 PLL slip Global Status Register, bits 8 and 9 Watchdog exception Exception Status Register, bit 13 Debugger reset Exception Status Register, bit 11 CPU Reset (driven by the CPU STC) Exception Status Register, bit 5 Software Reset Exception Status Register, bit 4 External Reset Exception Status Register, bit 3 (1) Specified values do not include rise/fall times. For rise and fall timings, see Table 5-4. 6.4.2 nRST Timing Requirements Table 6-6. nRST Timing Requirements(1) MIN MAX UNIT tv(RST) Valid time, nRST active after nPORRST inactive 5032tc(OSC) ns Valid time, nRST active (all other System reset conditions) 32tc(VCLK) tf(nRST) Filter time nRST terminal; pulses less than MIN will be filtered out, pulses greater than MAX will generate a reset 475 2000 ns

6.5 ARM Cortex-R5F CPU Information

6.5.1 Summary of ARM Cortex-R5F CPU Features

The features of the ARM Cortex-R5F CPU include:

An integer unit with integral Embedded ICE-RT logic.
High-speed Advanced Microprocessor Bus Architecture (AMBA) Advanced eXtensible Interfaces (AXI) for Level two (L2) master and slave interfaces.
Floating-Point Coprocessor
Dynamic branch prediction with a global history buffer, and a 4-entry return stack
Low interrupt latency.
Nonmaskable interrupt.
Harvard Level one (L1) memory system with: – 32KB of instruction cache and 32KB of data cache implemented. Both Instruction and data cache have ECC support. – ARMv7-R architecture Memory Protection Unit (MPU) with 16 regions
Dual core logic for fault detection in safety-critical applications.
L2 memory interface: – Single 64-bit master AXI interface – 64-bit slave AXI interface to cache memories – 32-bit AXI_Peri ports to support low latency peripheral ports
Debug interface to a CoreSight Debug Access Port (DAP).
Performance Monitoring Unit (PMU).
Vectored Interrupt Controller (VIC) port.
AXI accelerator coherency port (ACP) supporting IO coherency with write-through cacheable regions
Ability to generate ECC on L2 data buses and parity of all control channels
Both CPU cores in lock-step
8 hardware breakpoints
8 watchpoints

6.5.2 Dual Core Implementation

The device has two Cortex-R5F cores, where the output signals of both CPUs are compared in the CCM- R5F unit. To avoid common mode impacts the signals of the CPUs to be compared are delayed by two clock cycles as shown in Figure 6-2.

PRODUCT□PREVIEW CPU Bus Compare PD Inactivity Monitor VIM Bus Compare Checker CPU Inactivity Monitor CPU1 (Main CPU) CPU2 (Checker CPU) 2 cycle delay VIM1 VIM2 2 cycle delay Inputs to CPU1 cpu2clk cpu1clkOutputs from CPU1 to the system Outputs from CPU2 to the system Safe values (values that will force the Z l to inactive states) CCM-R5F Compare errors ESM PDx PDy RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Figure 6-2. Dual Core Implementation

6.5.3 Duplicate Clock Tree After GCLK

The CPU clock domain is split into two clock trees, one for each CPU, with the clock of the second CPU running at the same frequency and in phase to the clock of CPU1. See Figure 6-2.

6.5.4 ARM Cortex-R5F CPU Compare Module (CCM) for Safety

CCM-R5F has two major functions. One is to compare the outputs of two Cortex-R5F processor cores and the VIM modules. The second function is inactivity monitoring, to detect any faulted transaction initiated by the checker core.

6.5.4.1 Signal Compare Operating Modes

The CCM-R5F module run in one of four operating modes - active compare lockstep, self-test, error forcing and self-test error forcing mode. To select an operating mode, a dedicated key must be written to the key register. CPU compare block and VIM compare block have separate key registers to select their operating modes. Status registers are also separate for these blocks.

6.5.4.1.1 Active Compare Lockstep Mode

In this mode the output signals of both CPUs and both VIMs are compared, and a difference in the outputs is indicated by the compare_error terminal. For more details about CPU and VIM lockstep comparison, refer to the device technical reference manual.

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated CCM-R5F also produces a signal to ESM GP1.92 to indicate its current status whether it is out of lockstep or is in self-test mode. This ensures that any lock step fault is reported to the CPU.

6.5.4.1.2 Self-Test Mode

In self-test mode the CCM-R5F is checked for faults, by applying internally generated, series of test patterns to look for any hardware faults inside the module. During self-test the compare error signal is deactivated. If a fault on the CCM-R5F module is detected, an error is shown on the selftest_error pin.

6.5.4.1.3 Error Forcing Mode

In error forcing mode a test pattern is applied to the CPU and VIM related inputs of the compare logic to force an error at the compare error signal of the compare unit. Error forcing mode is done separately for VIM signal compare block and CPU signal compare block. For each block, this mode is enabled by writing the key in corresponding block’s key register.

6.5.4.1.4 Self-Test Error Forcing Mode

In self-test error forcing mode an error is forced at the self-test error signal. The compare block is still running in lockstep mode and the key is switched to lockstep after one clock cycle. Table 6-7. CPU Compare Self-Test Cycles MODE NUMBER OF GCLK CYCLES Self-Test Mode 4947 Self-Test Error Forcing Mode 1 Error Forcing Mode 1 Table 6-8. VIM Compare Self-Test Cycles MODE NUMBER OF VCLK CYCLES Self-Test Mode 151 Self-Test Error Forcing Mode 1 Error Forcing Mode 1

6.5.4.2 Bus Inactivity Monitor

CCM-R5F also monitors the inputs to the interconnect coming from the checker Cortex-R5F core. The input signals to the interconnect are compared against their default clamped values. The checker core must not generate any bus transaction to the interconnect system as all bus transactions are carried out through the main CPU core. If any signal value is different from its clamped value, an error signal is generated. The error response in case of a detected transaction is sent to ESM. In addition to bus monitoring the checker CPU core, the CCM-R5F will also monitor several other critical signals from other masters residing in other power domains. This is to ensure an inadvertent bus transaction from an unused power domain can be detected. To enable detection of unwanted transaction from an unused master, the power domain in which the master to be monitored will need to be configured in OFF power state through the PMM module.

6.5.4.3 CPU Registers Initialization

To avoid an erroneous CCM-R5F compare error, the application software must ensure that the CPU registers of both CPUs are initialized with the same values before the registers are used, including function calls where the register values are pushed onto the stack. Example routine for CPU register initialization:

PRODUCT□PREVIEW .text .state32 .global __clearRegisters_ .asmfunc __clearRegisters_: mov r0, lr mov r1, #0x0000 mov r2, #0x0000 mov r3, #0x0000 mov r4, #0x0000 mov r5, #0x0000 mov r6, #0x0000 mov r7, #0x0000 mov r8, #0x0000 mov r9, #0x0000 mov r10, #0x0000 mov r11, #0x0000 mov r12, #0x0000 mov r1, #0x11 ; FIQ Mode = 10001 msr cpsr, r1 msr spsr, r1 mov lr, r0 mov r8, #0x0000 ; Registers R8 to R12 are also banked in FIQ mode mov r9, #0x0000 mov r10, #0x0000 mov r11, #0x0000 mov r12, #0x0000 mov r1, #0x13 ; SVC Mode = 10011 msr cpsr, r1 msr spsr, r1 mov lr, r0 mov r1, #0x17 ; ABT Mode = 10111 msr cpsr, r13 msr spsr, r13 mov lr, r0 mov r1, #0x12 ; IRQ Mode = 10010 msr cpsr, r13 msr spsr, r13 mov lr, r0 mov r1, #0x1B ; UDEF Mode = 11011 msr cpsr, r13 msr spsr, r13 mov lr, r0 mov r1, #0xDF ; System Mode = 11011111 msr cpsr, r13 msr spsr, r13 ; Floating Point Co-Processor Initialization. FPU needs to be enabled first. mrc p15, #0x00, r2, c1, c0, #0x02 orr r2, r2, #0xF00000 mcr p15, #0x00, r2, c1, c0, #0x02 mov r2, #0x40000000 fmxr fpexc, r2 fmdrr d0, r1, r1 fmdrr d1, r1, r1 fmdrr d2, r1, r1 fmdrr d3, r1, r1 fmdrr d4, r1, r1 fmdrr d5, r1, r1 fmdrr d6, r1, r1 fmdrr d7, r1, r1 fmdrr d8, r1, r1 fmdrr d9, r1, r1 fmdrr d10, r1, r1 fmdrr d11, r1, r1 fmdrr d12, r1, r1 fmdrr d13, r1, r1 fmdrr d14, r1, r1 fmdrr d15, r1, r1 bl $+4 bl $+4 bl $+4 bl $+4 bx r0 .endasmfunc RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.5.5 CPU Self-Test

The CPU STC (Self-Test Controller) is used to test the two Cortex-R5F CPU Cores using the Deterministic Logic BIST Controller as the test engine. The main features of the self-test controller are:

Ability to divide the complete test run into independent test intervals
Capable of running the complete test as well as running few intervals at a time
Ability to continue from the last executed interval (test set) as well as ability to restart from the beginning (First test set)
Complete isolation of the self-tested CPU core from rest of the system during the self-test run
Ability to capture the Failure interval number
Time-out counter for the CPU self-test run as a fail-safe feature

6.5.5.1 Application Sequence for CPU Self-Test

Configure clock domain frequencies. 2. Select number of test intervals to be run. 3. Configure the time-out period for the self-test run. 4. Enable self-test. 5. Wait for CPU reset. 6. In the reset handler, read CPU self-test status to identify any failures. 7. Retrieve CPU state if required. For more information see the device technical reference manual.

6.5.5.2 CPU Self-Test Clock Configuration

The maximum clock rate for the self-test is 110 MHz. The STCCLK is divided down from the CPU clock. This divider is configured by the STCCLKDIV register at address 0xFFFFE644. For more information see the device specific technical reference manual.

6.5.5.3 CPU Self-Test Coverage

The self-test, if enabled, is automatically applied to the entire processor group. Self-test will only start when nCLKSTOPPEDm is asserted which indicates the CPU cores and the ACP interface are in quiescent state. While the processor group is in self-test, other masters can still function normally including accesses to the system memory such as the L2 SRAM. Because uSCU is part of the processor group under self-test, the cache coherency checking will be bypassed. When the self-test is completed, reset is asserted to all logic subjected to self-test. After self-test is complete, software must invalidate the cache accordingly. The default value of the CPU LBIST clock prescaler is’divide-by-1’. A prescalar in the STC module can be used to configure the CPU LBIST frequency with respect to the CPU GCLK frequency. Table 6-9 lists the CPU test coverage achieved for each self-test interval. It also lists the cumulative test cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock period.

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-9. CPU Self-Test Coverage INTERVALS TEST COVERAGE, % TEST CYCLES 0 0 0 1 56.85 1629 2 64.19 3258 3 68.76 4887 4 71.99 6516 5 75 8145 6 76.61 9774 7 78.08 11403 8 79.2 13032 9 80.18 14661 10 81.03 16290 11 81.9 17919 12 82.58 19548 13 83.24 21177 14 83.73 22806 15 84.15 24435 16 84.52 26064 17 84.9 27693 18 85.26 29322 19 85.68 30951 20 86.05 32580 21 86.4 34209 22 86.68 35838 23 86.94 37467 24 87.21 39096 25 87.48 40725 26 87.74 42354 27 87.98 43983 28 88.18 45612 29 88.38 47241 30 88.56 48870 31 88.75 50499 32 88.93 52128 33 89.1 53757 34 89.23 55386 35 89.41 57015 36 89.55 58644 37 89.7 60273 38 89.83 61902 39 89.96 63531 40 90.1 65160

6.5.6 N2HET STC / LBIST Self-Test Coverage

Logic BIST self-test capability for N2HETs is available in this device. The STC2 can be configured to perform self-test for both N2HETs at the same time or one at the time. The default value of the N2HET LBIST clock prescaler is’divide-by-1’. However, the maximum clock rate for the N2HET STC / LBIST is VCLK/2. N2HET STC test should not be executed concurrently with CPU STC test. Table 6-10. N2HET Self-Test Coverage INTERVALS TEST COVERAGE, % TEST CYCLES 0 0 0 1 70.01 1365 2 77.89 2730 3 81.73 4095 4 84.11 5460 5 86.05 6825 6 87.78 8190 7 88.96 9555 8 89.95 10920 9 90.63 12285

PRODUCT□PREVIEW OSCIN OSCOUT (see Note A) Crystal (a) OSCIN OSCOUT (b) External (toggling 0 V to 3.3 V) Clock Signal Note A: The values of C1 and C2 should be provided by the resonator/crystal vendor. Kelvin_GND Note B: Kelvin_GND should not be connected to any other GND. (see Note B) RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.6 Clocks

6.6.1 Clock Sources

Table 6-11 lists the available clock sources on the device. Each of the clock sources can be enabled or disabled using the CSDISx registers in the system module. The clock source number in the table corresponds to the control bit in the CSDISx register for that clock source. Table 6-11 also lists the default state of each clock source. Table 6-11. Available Clock Sources CLOCK SOURCE # NAME DESCRIPTION DEFAULT STATE

0 OSCIN Main Oscillator Enabled

1 PLL1 Output From PLL1 Disabled

2 Reserved Reserved Disabled

3 EXTCLKIN1 External Clock Input #1 Disabled

4 CLK80K Low Frequency Output of Internal Reference Oscillator Enabled

5 CLK10M High Frequency Output of Internal Reference Oscillator Enabled

6 PLL2 Output From PLL2 Disabled

7 EXTCLKIN2 External Clock Input #2 Disabled

6.6.1.1 Main Oscillator

The oscillator is enabled by connecting the appropriate fundamental resonator/crystal and load capacitors across the external OSCIN and OSCOUT pins as shown in Figure 6-3. The oscillator is a single stage inverter held in bias by an integrated bias resistor. This resistor is disabled during leakage test measurement and low power modes. TI strongly encourages each customer to submit samples of the device to the resonator/crystal vendors for validation. The vendors are equipped to determine what load capacitors will best tune their resonator/crystal to the microcontroller device for optimum start-up and operation over temperature/voltage extremes. An external oscillator source can be used by connecting a 3.3V clock signal to the OSCIN terminal and leaving the OSCOUT terminal unconnected (open) as shown in Figure 6-3. Figure 6-3. Recommended Crystal/Clock Connection

6.6.1.1.1 Timing Requirements for Main Oscillator

Table 6-12. Timing Requirements for Main Oscillator MIN NOM MAX UNIT tc(OSC) Cycle time, OSCIN (when using a sine-wave input) 50 200 ns tc(OSC_SQR) Cycle time, OSCIN, (when input to the OSCIN is a square wave) 50 200 ns tw(OSCIL) Pulse duration, OSCIN low (when input to the OSCIN is a square wave) 15 ns tw(OSCIH) Pulse duration, OSCIN high (when input to the OSCIN is a square wave) 15 ns

PRODUCT□PREVIEW BIAS_EN Low-Power Oscillator LFEN LF_TRIM HFEN HF_TRIM CLK80K CLK10M CLK10M_V ALID nPORRST RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.6.1.2 Low-Power Oscillator

The Low-Power Oscillator (LPO) is comprised of two oscillators — HF LPO and LF LPO, in a single macro.

6.6.1.2.1 Features

The main features of the LPO are:

Supplies a clock at extremely low power to reduce power consumption. This is connected as clock source # 4 of the Global Clock Module.
Supplies a high-frequency clock for nontiming-critical systems. This is connected as clock source # 5 of the Global Clock Module.
Provides a comparison clock for the crystal oscillator failure detection circuit. Figure 6-4. LPO Block Diagram Figure 6-4 shows a block diagram of the internal reference oscillator. This is a low power oscillator (LPO) and provides two clock sources: one nominally 80 kHz and one nominally 10 MHz.

6.6.1.2.2 LPO Electrical and Timing Specifications

Table 6-13. LPO Specifications PARAMETER MIN TYP MAX UNIT Clock Detection Oscillator fail frequency - lower threshold, using untrimmed LPO output 1.375 2.4 4.875 MHz Oscillator fail frequency - higher threshold, using untrimmed LPO output 22 38.4 78 MHz LPO - HF oscillator Untrimmed frequency 5.5 9.6 19.5 MHz Trimmed frequency 8.0 9.6 11.0 MHz Start-up time from STANDBY (LPO BIAS_EN High for at least 900 µs) 10 µs Cold start-up time 900 µs LPO - LF oscillator Untrimmed frequency 36 85 180 kHz Start-up time from STANDBY (LPO BIAS_EN High for at least 900 µs) 100 µs Cold start-up time 2000 µs LPO Total ICC STANDBY current 20 µA

PRODUCT□PREVIEW /NR /1 to /64 OSCIN PLL INTCLK /OD /1 to /8 VCOCLK /R /1 to /32 post_ODCLK /NF /1 to /256 PLLCLK /NR2 /1 to /64 OSCIN PLL#2 INTCLK2 /OD2 /1 to /8 VCOCLK2 /R2 /1 to /32 post_ODCLK2 /NF2 /1 to /256 PLL2CLK fPLLCLK = (fOSCIN / NR) * NF / (OD * R) fPLL2CLK = (fOSCIN / NR2) * NF2 / (OD2 * R2) RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.6.1.3 Phase-Locked Loop (PLL) Clock Modules

The PLL is used to multiply the input frequency to some higher frequency. The main features of the PLL are:

Frequency modulation can be optionally superimposed on the synthesized frequency of PLL1. The frequency modulation capability of PLL2 is permanently disabled.
Configurable frequency multipliers and dividers.
Built-in PLL Slip monitoring circuit.
Option to reset the device on a PLL slip detection.

6.6.1.3.1 Block Diagram

Figure 6-5 shows a high-level block diagram of the two PLL macros on this microcontroller. PLLCTL1 and PLLCTL2 are used to configure the multiplier and dividers for the PLL1. PLLCTL3 is used to configure the multiplier and dividers for PLL2. Figure 6-5. ZWT PLLx Block Diagram

6.6.1.3.2 PLL Timing Specifications

Table 6-14. PLL Timing Specifications PARAMETER MIN MAX UNIT fINTCLK PLL1 Reference Clock frequency 1 20 MHz fpost_ODCLK Post-ODCLK – PLL1 Post-divider input clock frequency 400 MHz fVCOCLK VCOCLK – PLL1 Output Divider (OD) input clock frequency 550 MHz fINTCLK2 PLL2 Reference Clock frequency 1 20 MHz fpost_ODCLK2 Post-ODCLK – PLL2 Post-divider input clock frequency 400 MHz fVCOCLK2 VCOCLK – PLL2 Output Divider (OD) input clock frequency 550 MHz

6.6.1.4 External Clock Inputs

The device supports up to two external clock inputs. This clock input must be a square-wave input. The electrical and timing requirements for these clock inputs are specified below. Table 6-15. External Clock Timing and Electrical Specifications PARAMETER MIN MAX UNIT fEXTCLKx External clock input frequency 80 MHz tw(EXTCLKIN)H EXTCLK high-pulse duration 6 ns tw(EXTCLKIN)L EXTCLK low-pulse duration 6 ns viL(EXTCLKIN) Low-level input voltage –0.3 0.8 V viH(EXTCLKIN) High-level input voltage 2 VCCIO + 0.3 V

6.6.2 Clock Domains

6.6.2.1 Clock Domain Descriptions

Table 6-16 lists the device clock domains and their default clock sources. Table 6-16 also lists the system module control register that is used to select an available clock source for each clock domain. Table 6-16. Clock Domain Descriptions CLOCK DOMAIN CLOCK DISABLE BIT DEFAULT SOURCE SOURCE SELECTION REGISTER SPECIAL CONSIDERATIONS GCLK1 SYS.CDDIS.0 OSCIN SYS.GHVSRC[3:0]

This the main clock from which HCLK is divided down
In phase with HCLK
Is disabled separately from HCLK through the CDDISx registers bit 0
Can be divided by 1 up to 8 when running CPU self-test (LBIST) using the CLKDIV field of the STCCLKDIV register at address 0xFFFFE108 GCLK2 SYS.CDDIS.0 OSCIN SYS.GHVSRC[3:0]
Always the same frequency as GCLK1
2 cycles delayed from GCLK1
Is disabled along with GCLK1
Gets divided by the same divider setting as that for GCLK1 when running CPU self- test (LBIST) HCLK SYS.CDDIS.1 OSCIN SYS.GHVSRC[3:0]
Divided from GCLK1 through HCLKCNTLregister
Allowable clock ratio from 1:1 to 4:1
Is disabled through the CDDISx registers bit 1 VCLK SYS.CDDIS.2 OSCIN SYS.GHVSRC[3:0]
Divided down from HCLK through CLKCNTL register
Can be HCLK/1, HCLK/2,... or HCLK/16
Is disabled separately from HCLK through the CDDISx registers bit 2
HCLK:VCLK2:VCLK must be integer ratios of each other VCLK2 SYS.CDDIS.3 OSCIN SYS.GHVSRC[3:0]
Divided down from HCLK
Can be HCLK/1, HCLK/2,... or HCLK/16
Frequency must be an integer multiple of VCLK frequency
Is disabled separately from HCLK through the CDDISx registers bit 3 VCLK3 SYS.CDDIS.8 OSCIN SYS.GHVSRC[3:0]
Divided down from HCLK
Can be HCLK/1, HCLK/2,... or HCLK/16
Is disabled separately from HCLK through the CDDISx registers bit 8 VCLKA1 SYS.CDDIS.4 VCLK SYS.VCLKASRC[3:0]
Defaults to VCLK as the source
Is disabled through the CDDISx registers bit 4 VCLKA2 SYS.CDDIS.5 VCLK SYS.VCLKASRC[3:0]
Defaults to VCLK as the source
Is disabled through the CDDISx registers bit 5 VCLKA4 SYS.CDDIS.11 VCLK SYS.VCLKACON1[19:16]
Defaults to VCLK as the source
Is disabled through the CDDISx registers bit 11

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-16. Clock Domain Descriptions (continued) CLOCK DOMAIN CLOCK DISABLE BIT DEFAULT SOURCE SOURCE SELECTION REGISTER SPECIAL CONSIDERATIONS VCLKA4_DIVR SYS.VCLKACON1.20 VCLK SYS.VCLKACON1[19:16]

Divided down from VCLKA4 using the VCLKA4R field of the VCLKACON1 register
Frequency can be VCLKA4/1, VCLKA4/2, ..., or VCLKA4/8
Default frequency is VCLKA4/2
Is disabled separately through the VCLKA4_DIV_CDDIS bit in the VCLKACON1 register, if the VCLKA4 is not already disabled RTICLK1 SYS.CDDIS.6 VCLK SYS.RCLKSRC[3:0]
Defaults to VCLK as the source
If a clock source other than VCLK is selected for RTICLK1, then the RTICLK1 frequency must be less than or equal to VCLK/3
Application can ensure this by programming the RTI1DIV field of the RCLKSRC register, if necessary
Is disabled through the CDDISx registers bit 6

PRODUCT□PREVIEW HCLK1 (to SYSTEM) GCLK, GCLK2 (to CPU, CCM) GCM VCLK (VCLK to peripherals on PCR3) RTICLK1 (to RTI1, DWWD) /1, 2, 4, or 8 VCLK OSCIN Low Power Oscillator 10MHz 80kHz FMzPLL PLL # 2 VCLK /1,2,..1024 Phase_seg2 CAN Baud Rate Phase_seg1 VCLKA1 /1,2,..256 SPIx,MibSPIx /2,3..224 LIN, SCI SPI LIN / SCI /1,2..32 MibADCx ADCLK /1,2..65536 External Clock ECLK VCLK2 N2HETx HRP /1..64 LRP /20..25 Loop Resolution Clock High Baud Rate Baud Rate N2HETx TU VCLK2 Ethernet VCLKA4_DIVR (SSPLL) (SSPLL) EXTCLKIN1 EXTCLKIN2

7 VCLKA1 (to DCANx)

CLKSRC(7:0) VCLK VCLK3 EMIF VCLK3 (to EMIF, , ePWMx, and eQEPx) eCAPx Ethernet /1..16 VCLK_s (VCLK to system modules) * the frequency at this node must not exceed the maximum HCLK specifiation. /1,2..256 I2C I2C baud rate VCLKA2 NTU[1] NTU[0] NTU[2] NTU[3] RTI Reserved PLL#2 output EXTCLKIN1 Prop_seg DCANx VCLK2 (to N2HETx and HTUx) VCLKA4_DIVR_EMAC (to Ethernet, as alternate for MIIXCLK and/or MIIRXCLK) VCLKA4 is left open. CLKSRC(7:0) VCLK CLKSRC(7:0) VCLK CLKSRC(7:0) /1..16 /1..16 /1..16 /1..4 Reserved RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.6.2.2 Mapping of Clock Domains to Device Modules

Each clock domain has a dedicated functionality as shown in Figure 6-6. Figure 6-6. Device Clock Domains

PRODUCT□PREVIEW VCLKA4_SRC VCLK VCLKA4 (left open) /DIVR PLL2 post_ODCLK/8 PLL2 post_ODCLK/16 VCLKA4_DIVR_EMAC (to EMAC) RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.6.3 Special Clock Source Selection Scheme for VCLKA4_DIVR_EMAC

The MII interface requires VCLKA4_DIVR_EMAC to be 25 MHz and the RMII requires VCLKA4_DIVR_EAMC to be 50 MHz. These different frequencies are supported by adding special dedicated clock source selection options for the VCLKA4_DIVR_EMAC clock domain. This logic is shown in Figure 6-7. Figure 6-7. VCLKA4_DIVR Source Selection Options The PLL2 post_ODCLK is brought out as a separate output from the PLL wrapper module. There are two additional dividers implemented at the device-level to divide this PLL2 post_ODCLK by 8 and by 16. As shown in Figure 6-7, the VCLKA4_SRC configured through the system module VCLKACON1 control register is used to determine the clock source for the VCLKA4 and VCLKA4_DIVR. An additional multiplexor is implemented to select between the VCLKA4_DIVR and the two additional clock sources – PLL2 post_ODCLK/8 and post_ODCLK/16. Table 6-17 lists the VCLKA4_DIVR_EMAC clock source selections. Table 6-17. VCLKA4_DIVR_EMAC Clock Source Selection VCLKA4_SRC FROM VCLKACON1[19–16] CLOCK SOURCE FOR VCLKA4_DIVR_EMAC 0x0 OSCIN / VCLKA4R 0x1 PLL1CLK / VCLKA4R 0x2 Reserved 0x3 EXTCLKIN1 / VCLKA4R 0x4 LF LPO / VCLKA4R 0x5 HF LPO / VCLKA4R 0x6 PLL2CLK / VCLKA4R 0x7 EXTCLKIN2 / VCLKA4R 0x8–0xD VCLK 0xE PLL2 post_ODCLK/8 0xF PLL2 post_ODCLK/16

6.6.4 Clock Test Mode

The RM57Lx platform architecture defines a special mode that allows various clock signals to be brought out on to the ECLK1 terminal and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is very useful for debugging purposes and can be configured through the CLKTEST register in the system module. Table 6-18. Clock Test Mode Options for Signals on ECLK1 SEL_ECP_PIN = CLKTEST[4-0] SIGNAL ON ECLK1

00000 Oscillator Clock

00001 PLL1 Clock Output

00010 Reserved

00011 EXTCLKIN1

00100 Low-Frequency Low-Power Oscillator (LFLPO) Clock [CLK80K]

00101 High-Frequency Low-Power Oscillator (HFLPO) Clock [CLK10M]

00110 PLL2 Clock Output

00111 EXTCLKIN2

01000 GCLK1

01001 RTI1 Base

01010 Reserved

01011 VCLKA1

01100 VCLKA2

01101 Reserved

01110 VCLKA4_DIVR

01111 Flash HD Pump Oscillator

10000 Reserved

10001 HCLK

10010 VCLK

10011 VCLK2

10100 VCLK3

10101 Reserved

10110 Reserved

10111 EMAC Clock Output

11000 Reserved

11001 Reserved

11010 Reserved

11011 Reserved

11100 Reserved

11101 Reserved

11110 Reserved

11111 Reserved

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-19. Clock Test Mode Options for Signals on N2HET1[12] SEL_GIO_PIN = CLKTEST[11-8] SIGNAL ON N2HET1[12]

0000 Oscillator Valid Status

0001 PLL1 Valid Status

0010 Reserved

0011 Reserved

0100 Reserved

0101 HFLPO Clock Output Valid Status [CLK10M]

0110 PLL2 Valid Status

0111 Reserved

1000 LFLPO Clock Output Valid Status [CLK80K]

1001 Oscillator Valid status

1010 Oscillator Valid status

1011 Oscillator Valid status

1100 Oscillator Valid status

1101 Reserved

1110 VCLKA4

1111 Oscillator Valid status

PRODUCT□PREVIEW f[MHz]1. 375 4.875 22 78 fail lower threshold pass upper threshold fail RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.7 Clock Monitoring

The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low power oscillator (LPO). The LPO provides two different clock sources – a low frequency (CLK80K) and a high frequency (CLK10M). The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN frequency falls out of a frequency window, the CLKDET flags this condition in the global status register (GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the CLK10M clock (limp mode clock). The valid OSCIN frequency range is defined as: fCLK10M / 4 < fOSCIN < fCLK10M * 4.

6.7.1 Clock Monitor Timings

Figure 6-8. LPO and Clock Detection, Untrimmed CLK10M

6.7.2 External Clock (ECLK) Output Functionality

The ECLK1/ECLK2 terminal can be configured to output a prescaled clock signal indicative of an internal device clock. This output can be externally monitored as a safety diagnostic.

6.7.3 Dual Clock Comparators

The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of spec, an error signal is generated. For example, the DCC1 can be configured to use CLK10M as the reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration allows the DCC1 to monitor the PLL output clock when VCLK is using the PLL output as its source. An additional use of this module is to measure the frequency of a selectable clock source. For example, the reference clock is connected to Counter 0 and the signal to be measured is connected to Counter 1. Counter 0 is programmed with a start value of known time duration (measurement time) from the reference clock. Counter 1 is programmed with a maximum start value. Start both counter simultaneously. When Counter 0 decrements to zero, both counter will stop and an error signal is generated if Counter 1 does not reach zero. The frequency of the input signals can be calculated from the count value of Counter 1 and the measurement time.

6.7.3.1 Features

Takes two different clock sources as input to two independent counter blocks.
One of the clock sources is the known-good, or reference clock; the second clock source is the "clock under test."
Each counter block is programmable with initial, or seed values.
The counter blocks start counting down from their seed values at the same time; a mismatch from the expected frequency for the clock under test generates an error signal which is used to interrupt the CPU.

6.7.3.2 Mapping of DCC Clock Source Inputs

Table 6-20. DCC1 Counter 0 Clock Sources CLOCK SOURCE [3:0] CLOCK NAME Others Oscillator (OSCIN) 0x5 High frequency LPO 0xA Test clock (TCK) Table 6-21. DCC1 Counter 1 Clock Sources KEY [3:0] CLOCK SOURCE [3:0] CLOCK NAME Others – N2HET1[31] 0x0 Main PLL free-running clock output 0x1 PLL #2 free-running clock output 0x2 Low frequency LPO 0xA 0x3 High frequency LPO 0x4 Reserved 0x5 EXTCLKIN1 0x6 EXTCLKIN2 0x7 Reserved 0x8 - 0xF VCLK Table 6-22. DCC2 Counter 0 Clock Sources CLOCK SOURCE [3:0] CLOCK NAME Others Oscillator (OSCIN) 0xA Test clock (TCK) Table 6-23. DCC2 Counter 1 Clock Sources KEY [3:0] CLOCK SOURCE [3:0] CLOCK NAME Others – N2HET2[0] 0xA 0x1 PLL2_post_ODCLK/8 0x2 PLL2_post_ODCLK/16 0x3 - 0x7 Reserved 0x8 - 0xF VCLK

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The glitch filter design on the nPORRST signal is designed such that no size pulse will reset any part of the microcontroller (flash pump, I/O pins, etc.) without also generating a valid reset signal to the CPU.

6.8 Glitch Filters

A glitch filter is present on the following signals. Table 6-24. Glitch Filter Timing Specifications TERMINAL PARAMETER MIN MAX UNIT nPORRST tf(nPORRST) Filter time nPORRST terminal; pulses less than MIN will be filtered out, pulses greater than MAX will generate a reset(1) 475 2000 ns nRST tf(nRST) Filter time nRST terminal; pulses less than MIN will be filtered out, pulses greater than MAX will generate a reset 475 2000 ns TEST tf(TEST) Filter time TEST terminal; pulses less than MIN will be filtered out, pulses greater than MAX will pass through 475 2000 ns

PRODUCT□PREVIEW Flash (4MB) RAM (512KB) 0x00000000 0x003FFFFF 0x08000000 0x0807FFFF CRC10xFE000000 0xFEFFFFFF SYSTEM Peripherals - Frame 1 0xFFFFFFFF RAM - ECC0x08400000 0x0847FFFF RESERVED RESERVED RESERVED 0xF0000000 EMIF (16MB * 3) 0x60000000 0x6FFFFFFF CS2 RESERVED CS3 RESERVED CS4 Peripherals - Frame 2 0xFC000000 0xFCFFFFFF EMIF (128MB) 0x80000000 0x87FFFFFF CS0 RESERVED reserved Async RAM SDRAM 0x64000000 0x68000000 0x6C000000 Flash (Flash ECC, OTP and EEPROM accesses) 0xF047FFFF Peripherals - Frame 3 0xFFF80000 0xFFF7FFFF 0xFF000000 0xFB000000 0xFBFFFFFF CRC2 RESERVED R5F Cache0x30000000 0x33FFFFFF RESERVED RESERVED0x34000000 0x37FFFFFF RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.9 Device Memory Map

6.9.1 Memory Map Diagram

Figure 6-9 shows the device memory map. Figure 6-9. Memory Map

6.9.2 Memory Map Table

Table 6-25. Module Registers / Memories Memory Map TARGET NAME MEMORY SELECT ADDRESS RANGE FRAME SIZE ACTUAL SIZE RESPONSE FOR ACCESS TO UNIMPLEMENTED LOCATIONS IN FRAME START END Level 2 Memories Level 2 Flash Data Space 0x0000_0000 0x003F_FFFF 4MB 4MB Abort Level 2 RAM 0x0800_0000 0x083F_FFFF 4MB 512KB Abort Level 2 RAM ECC 0x0840_0000 0x087F_FFFF 4MB 512KB Accelerator Coherency Port Accelerator Coherency Port 0x0800_0000 0x087F_FFFF 8MB 512KB Abort Level 1 Cache Memories Cortex-R5F Data Cache Memory 0x3000_0000 0x30FF_FFFF 16MB 32KB Abort Cortex-R5F Instruction Cache Memory 0x3100_0000 0x31FF_FFFF 16MB 32KB External Memory Accesses EMIF Chip Select 2 (asynchronous) 0x6000_0000 0x63FF_FFFF 64MB 16MB Access to "Reserved" space will generate AbortEMIF Chip Select 3 (asynchronous) 0x6400_0000 0x67FF_FFFF 64MB 16MB EMIF Chip Select 4 (asynchronous) 0x6800_0000 0x6BFF_FFFF 64MB 16MB EMIF Chip Select 0 (synchronous) 0x8000_0000 0x87FF_FFFF 128MB 128MB Flash OTP, ECC, EEPROM Bank Customer OTP, Bank0 0xF000_0000 0xF000_1FFF 8KB 4KB Abort Customer OTP, Bank1 0xF000_2000 0xF000_3FFF 8KB 4KB Customer OTP, EEPROM Bank 0xF000_E000 0xF000_FFFF 8KB 1KB Customer OTP-ECC, Bank0 0xF004_0000 0xF004_03FF 1KB 512B Customer OTP-ECC, Bank1 0xF004_0400 0xF004_07FF 1KB 512B Customer OTP-ECC, EEPROM Bank 0xF004_1C00 0xF004_1FFF 1KB 128B TI OTP, Bank0 0xF008_0000 0xF008_1FFF 8KB 4KB TI OTP, Bank1 0xF008_2000 0xF008_3FFF 8KB 4KB TI OTP, EEPROM Bank 0xF008_E000 0xF008_FFFF 8KB 1KB TI OTP-ECC, Bank0 0xF00C_0000 0xF00C_03FF 1KB 512B TI OTP-ECC, Bank1 0xF00C_0400 0xF00C_07FF 1KB 512B Abort TI OTP-ECC, EEPROM Bank 0xF00C_1C00 0xF00C_1FFF 1KB 128B EEPROM Bank-ECC 0xF010_0000 0xF01F_FFFF 1MB 16KB EEPROM Bank 0xF020_0000 0xF03F_FFFF 2MB 128KB Flash Data Space ECC 0xF040_0000 0xF05F_FFFF 2MB 512KB Interconnect SDC MMR Interconnect SDC MMR 0xFA00_0000 0xFAFF_FFFF 16MB 16MB Registers/Memories under PCR2 (Peripheral Segment 2) CPPI Memory Slave (Ethernet RAM) PCS[41] 0xFC52_0000 0xFC52_1FFF 8KB 8KB Abort CPGMAC Slave (Ethernet Slave) PS[30]-PS[31] 0xFCF7_8000 0xFCF7_87FF 2KB 2KB No Error CPGMACSS Wrapper (Ethernet Wrapper) PS[29] 0xFCF7_8800 0xFCF7_88FF 256B 256B No Error Ethernet MDIO Interface PS[29] 0xFCF7_8900 0xFCF7_89FF 256B 256B No Error

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-25. Module Registers / Memories Memory Map (continued) TARGET NAME MEMORY SELECT ADDRESS RANGE FRAME SIZE ACTUAL SIZE RESPONSE FOR ACCESS TO UNIMPLEMENTED LOCATIONS IN FRAME START END Memories under User PCR3 (Peripheral Segment 3) MIBSPI5 RAM PCS[5] 0xFF0A_0000 0xFF0B_FFFF 128KB 2KB Abort for accesses above 2KB MIBSPI4 RAM PCS[3] 0xFF06_0000 0xFF07_FFFF 128KB 2KB Abort for accesses above 2KB MIBSPI3 RAM PCS[6] 0xFF0C_0000 0xFF0D_FFFF 128KB 2KB Abort for accesses above 2KB MIBSPI2 RAM PCS[4] 0xFF08_0000 0xFF09_FFFF 128KB 2KB Abort for accesses above 2KB MIBSPI1 RAM PCS[7] 0xFF0E_0000 0xFF0F_FFFF 128KB 4KB Abort for accesses above 4KB DCAN4 RAM PCS[12] 0xFF18_0000 0xFF19_FFFF 128KB 8KB Abort generated for accesses beyond offset 0x2000 DCAN3 RAM PCS[13] 0xFF1A_0000 0xFF1B_FFFF 128KB 8KB Abort generated for accesses beyond offset 0x2000 DCAN2 RAM PCS[14] 0xFF1C_0000 0xFF1D_FFFF 128KB 8KB Abort generated for accesses beyond offset 0x2000 DCAN1 RAM PCS[15] 0xFF1E_0000 0xFF1F_FFFF 128KB 8KB Abort generated for accesses beyond offset 0x2000. MIBADC2 RAM PCS[29] 0xFF3A_0000 0xFF3B_FFFF 128KB 8KB Wrap around for accesses to unimplemented address offsets lower than 0x1FFF. MIBADC1 RAM PCS[31] 0xFF3E_0000 0xFF3F_FFFF 128KB 8KB Wrap around for accesses to unimplemented address offsets lower than 0x1FFF. MIBADC1 Look-UP Table 384 bytes Look-Up Table for ADC1 wrapper. Starts at address offset 0x2000 and ends at address offset 0x217F. Wrap around for accesses between offsets 0x0180 and 0x3FFF. Abort generation for accesses beyond offset 0x4000. NHET2 RAM PCS[34] 0xFF44_0000 0xFF45_FFFF 128KB 16KB Wrap around for accesses to unimplemented address offsets lower than 0x3FFF. Abort generated for accesses beyond 0x3FFF. NHET1 RAM PCS[35] 0xFF46_0000 0xFF47_FFFF 128KB 16KB Wrap around for accesses to unimplemented address offsets lower than 0x3FFF. Abort generated for accesses beyond 0x3FFF. HET TU2 RAM PCS[38] 0xFF4C_0000 0xFF4D_FFFF 128KB 1KB Abort HET TU1 RAM PCS[39] 0xFF4E_0000 0xFF4F_FFFF 128KB 1KB Abort CoreSight Debug Components

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-25. Module Registers / Memories Memory Map (continued) TARGET NAME MEMORY SELECT ADDRESS RANGE FRAME SIZE ACTUAL SIZE RESPONSE FOR ACCESS TO UNIMPLEMENTED LOCATIONS IN FRAME START END CoreSight Debug ROM CSCS[0] 0xFFA0_0000 0xFFA0_0FFF 4KB 4KB Reads return zeros, writes have no effect Cortex-R5F Debug CSCS[1] 0xFFA0_1000 0xFFA0_1FFF 4KB 4KB Reads return zeros, writes have no effect ETM-R5 CSCS[2] 0xFFA0_2000 0xFFA0_2FFF 4KB 4KB Reads return zeros, writes have no effect CoreSight TPIU CSCS[3] 0xFFA0_3000 0xFFA0_3FFF 4KB 4KB Reads return zeros, writes have no effect POM CSCS[4] 0xFFA0_4000 0xFFA0_4FFF 4KB 4KB Reads return zeros, writes have no effect CTI1 CSCS[7] 0xFFA0_7000 0xFFA0_7FFF 4KB 4KB Reads return zeros, writes have no effect CTI3 CSCS[9] 0xFFA0_9000 0xFFA0_9FFF 4KB 4KB Reads return zeros, writes have no effect CTI4 CSCS[10] 0xFFA0_A000 0xFFA0_AFFF 4KB 4KB Reads return zeros, writes have no effect CSTF CSCS[11] 0xFFA0_B000 0xFFA0_BFFF 4KB 4KB Reads return zeros, writes have no effect Registers under PCR3 (Peripheral Segment 3) PCR3 registers PS[31:30] 0xFFF7_8000 0xFFF7_87FF 2KB 2KB Reads return zeros, writes have no effect HTU1 PS[22] 0xFFF7_A400 0xFFF7_A4FF 256B 256B Abort HTU2 PS[22] 0xFFF7_A500 0xFFF7_A5FF 256B 256B Abort NHET1 PS[17] 0xFFF7_B800 0xFFF7_B8FF 256B 256B Reads return zeros, writes have no effect NHET2 PS[17] 0xFFF7_B900 0xFFF7_B9FF 256B 256B Reads return zeros, writes have no effect GIO PS[16] 0xFFF7_BC00 0xFFF7_BCFF 256B 256B Reads return zeros, writes have no effect MIBADC1 PS[15] 0xFFF7_C000 0xFFF7_C1FF 512B 512B Reads return zeros, writes have no effect MIBADC2 PS[15] 0xFFF7_C200 0xFFF7_C3FF 512B 512B Reads return zeros, writes have no effect I2C1 PS[10] 0xFFF7_D400 0xFFF7_D4FF 256B 256B Reads return zeros, writes have no effect I2C2 PS[10] 0xFFF7_D500 0xFFF7_D5FF 256B 256B Reads return zeros, writes have no effect DCAN1 PS[8] 0xFFF7_DC00 0xFFF7_DDFF 512B 512B Reads return zeros, writes have no effect DCAN2 PS[8] 0xFFF7_DE00 0xFFF7_DFFF 512B 512B Reads return zeros, writes have no effect DCAN3 PS[7] 0xFFF7_E000 0xFFF7_E1FF 512B 512B Reads return zeros, writes have no effect DCAN4 PS[7] 0xFFF7_E200 0xFFF7_E3FF 512B 512B Reads return zeros, writes have no effect LIN1 PS[6] 0xFFF7_E400 0xFFF7_E4FF 256B 256B Reads return zeros, writes have no effect SCI3 PS[6] 0xFFF7_E500 0xFFF7_E5FF 256B 256B Reads return zeros, writes have no effect LIN2 PS[6] 0xFFF7_E600 0xFFF7_E6FF 256B 256B Reads return zeros, writes have no effect SCI4 PS[6] 0xFFF7_E700 0xFFF7_E7FF 256B 256B Reads return zeros, writes have no effect MibSPI1 PS[2] 0xFFF7_F400 0xFFF7_F5FF 512B 512B Reads return zeros, writes have no effect MibSPI2 PS[2] 0xFFF7_F600 0xFFF7_F7FF 512B 512B Reads return zeros, writes have no effect

PRODUCT□PREVIEW RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-25. Module Registers / Memories Memory Map (continued) TARGET NAME MEMORY SELECT ADDRESS RANGE FRAME SIZE ACTUAL SIZE RESPONSE FOR ACCESS TO UNIMPLEMENTED LOCATIONS IN FRAME START END MibSPI3 PS[1] 0xFFF7_F800 0xFFF7_F9FF 512B 512B Reads return zeros, writes have no effect MibSPI4 PS[1] 0xFFF7_FA00 0xFFF7_FBFF 512B 512B Reads return zeros, writes have no effect MibSPI5 PS[0] 0xFFF7_FC00 0xFFF7_FDFF 512B 512B Reads return zeros, writes have no effect System Modules Control Registers and Memories under PCR1 (Peripheral Segment 1) DMA RAM PPCS[0] 0xFFF8_0000 0xFFF8_0FFF 4KB 4KB Abort VIM RAM PPCS[2] 0xFFF8_2000 0xFFF8_2FFF 4KB 4KB Wrap around for accesses to unimplemented address offsets lower than 0x2FFF. RTP RAM PPCS[3] 0xFFF8_3000 0xFFF8_3FFF 4KB 4KB Abort Flash Wrapper PPCS[7] 0xFFF8_7000 0xFFF8_7FFF 4KB 4KB Abort eFuse Farm Controller PPCS[12] 0xFFF8_C000 0xFFF8_CFFF 4KB 4KB Abort Power Domain Control (PMM) PPSE[0] 0xFFFF_0000 0xFFFF_01FF 512B 512B Abort FMTM Note: This module is only used by TI during test PPSE[1] 0xFFFF_0400 0xFFFF_05FF 512B 512B Reads return zeros, writes have no effect STC2 (NHET1/2) PPSE[2] 0xFFFF_0800 0xFFFF_08FF 256B 256B Reads return zeros, writes have no effect SCM PPSE[2] 0xFFFF_0A00 0xFFFF_0AFF 256B 256B Abort EPC PPSE[3] 0xFFFF_0C00 0xFFFF_0FFF 1KB 1KB Abort PCR1 registers PPSE[4]–PPSE[5] 0xFFFF_1000 0xFFFF_17FF 2KB 2KB Reads return zeros, writes have no effect NMPU (PS_SCR_S) PPSE[6] 0xFFFF_1800 0xFFFF_19FF 512B 512B Abort NMPU (DMA Port A) PPSE[6] 0xFFFF_1A00 0xFFFF_1BFF 512B 512B Abort Pin Mux Control (IOMM) PPSE[7] 0xFFFF_1C00 0xFFFF_1FFF 2KB 1KB Reads return zeros, writes have no effect System Module - Frame 2 (see the TRM SPNU562) PPS[0] 0xFFFF_E100 0xFFFF_E1FF 256B 256B Reads return zeros, writes have no effect PBIST PPS[1] 0xFFFF_E400 0xFFFF_E5FF 512B 512B Reads return zeros, writes have no effect STC1 (Cortex-R5F) PPS[1] 0xFFFF_E600 0xFFFF_E6FF 256B 256B Reads return zeros, writes have no effect DCC1 PPS[3] 0xFFFF_EC00 0xFFFF_ECFF 256B 256B Reads return zeros, writes have no effect DMA PPS[4] 0xFFFF_F000 0xFFFF_F3FF 1KB 1KB Abort DCC2 PPS[5] 0xFFFF_F400 0xFFFF_F4FF 256B 256B Reads return zeros, writes have no effect ESM register PPS[5] 0xFFFF_F500 0xFFFF_F5FF 256B 256B Reads return zeros, writes have no effect CCM-R5F PPS[5] 0xFFFF_F600 0xFFFF_F6FF 256B 256B Reads return zeros, writes have no effect DMM PPS[5] 0xFFFF_F700 0xFFFF_F7FF 256B 256B Reads return zeros, writes have no effect L2RAMW PPS[6] 0xFFFF_F900 0xFFFF_F9FF 256B 256B Abort RTP PPS[6] 0xFFFF_FA00 0xFFFF_FAFF 256B 256B Reads return zeros, writes have no effect RTI + DWWD PPS[7] 0xFFFF_FC00 0xFFFF_FCFF 256B 256B Reads return zeros, writes have no effect VIM PPS[7] 0xFFFF_FD00 0xFFFF_FEFF 512B 512B Reads return zeros, writes have no effect System Module - Frame 1 (see the TRM SPNU562) PPS[7] 0xFFFF_FF00 0xFFFF_FFFF 256B 256B Reads return zeros, writes have no effect

6.9.3 Master/Slave Access Privileges

Table 6-26 and Table 6-27 list the access permissions for each bus master on the device. A bus master is a module that can initiate a read or a write transaction on the device. Each slave module on either the CPU Interconnect Subsystem or the Peripheral Interconnect Subsystem is listed in Table 6-27. An "Allowed" indicates that the module listed in the "Masters" column can access that slave module. Table 6-26. Bus Master / Slave Access Matrix for CPU Interconnect Subsystem MASTERS SLAVES ON CPU INTERCONNECT SUBSYSTEM L2 Flash OTP, ECC, EEPROM Bank L2 Flash L2 SRAM Cache Memory EMIF CPU Read Allowed Allowed Allowed Allowed Allowed CPU Write Not allowed Not allowed Allowed Allowed Allowed DMA PortA Allowed Allowed Allowed Not allowed Allowed POM Not allowed Not allowed Allowed Not allowed Allowed PS_SCR_M Allowed Allowed Allowed Not allowed Allowed ACP_M Not allowed Not Allowed Allowed Not allowed Not allowed Table 6-27. Bus Master / Slave Access Matrix for Peripheral Interconnect Subsystem MASTER ID TO PCRx MASTERS SLAVES ON PERIPHERAL INTERCONNECT SUBSYSTEM CRC1/CRC2 Resources Under PCR2 and PCR3 Resources Under PCR1 CPU Interconnect Subsystem SDC MMR Port (see Section 6.9.5 ) CPU Read Allowed Allowed Allowed Allowed CPU Write Allowed Allowed Allowed Allowed

1 Reserved – – – –

2 DMA PortB Allowed Allowed Allowed Not allowed

3 HTU1 Not allowed Not allowed Not allowed Not allowed

4 HTU2 Not allowed Not allowed Not allowed Not allowed

7 DMM Allowed Allowed Allowed Allowed

9 DAP Allowed Allowed Allowed Allowed

10 EMAC Not allowed Allowed Not allowed Not allowed

6.9.3.1 Special Notes on Accesses to Certain Slaves

By design only the CPU and debugger can have privileged write access to peripherals under the PCR1 segment. The other masters can only read from these registers. The master-id filtering check is implemented inside each PCR module of each peripheral segment and can be used to block certain masters from write accesses to certain peripherals. An unauthorized master write access detected by the PCR will result in the transaction being discarded and an error being generated to the ESM module. The device contains dedicated logic to generate a bus error response on any access to a module that is in a power domain that has been turned OFF.

6.9.4 MasterID to PCRx

The MasterID associated with each master port on the Peripheral Interconnect Subsystem contains a 4-bit value. The MasterID is passed along with the address and control signals to three PCR modules. PCR decodes the address and control signals to select the peripheral. In addition, it decodes this 4-bit MasterID value to perform memory protection. With 4-bit of MasterID, it allows the PCR to distinguish among 16 different masters to allow or disallow access to a given peripheral. Associated with each peripheral a 16-

PRODUCT□PREVIEW ID Decode Addr Decode MasterID Address/Control MasterID Protection Register N Peripheral Select N PCRx RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated bit MasterID access protection register is defined. Each bit grants or denies the permission of the corresponding binary coded decimal MasterID. For example, if bit 5 of the access permission register is set, it grants MasterID 5 to access the peripheral. If bit 7 is clear, it denies MasterID 7 to access the peripheral. Figure 6-10 shows the MasterID filtering scheme. Table 6-27 lists the MasterID of each master, which can access the PCRx. Figure 6-10. PCR MasterID Filtering

6.9.5 CPU Interconnect Subsystem SDC MMR Port

The CPU Interconnect Subsystem SDC MMR Port is a special slave to the Peripheral Interconnect Subsystem. It is memory mapped at starting address of 0xFA00_0000. Various status registers pertaining to the diagnostics of the CPU Interconnect Subsystem can be access through this slave port. The CPU Interconnect Subsystem contains built-in hardware diagnostic checkers which will constantly watch transactions flowing through the interconnect. There is a checker for each master and slave attached to the CPU Interconnect Subsystem. The checker checks the expected behavior against the generated behavior by the interconnect. For example, if the CPU issues a burst read request to the flash, the checker will ensure that the expected behavior is indeed a burst read request to the proper slave module. If the interconnects generates a transaction which is not a read, or not a burst or not to the flash as the destination, then the checker will flag it one of the registers. The detected error will also be signaled to the ESM module. Refer to the Interconnect chapter of the TRM SPNU562 for details on the registers.

PRODUCT□PREVIEW RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-28. CPU Interconnect Subsystem SDC Register Bit Field Mapping Register name bit 0 bit 1 bit 2 bit 3 bit 4 bit 5 bit 6 Remark ERR_GENERIC_PARITY PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved

Each bit indicates the transaction processing block inside the interconnect corresponding to the master that is detected by the interconnect checker to have a fault.
error related to parity mismatch in the incoming address ERR_UNEXPECTED_TRANS PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved
error related to unexpected transaction sent by the master ERR_TRANS_ID PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved • error related to mismatch on the transaction ID ERR_TRANS_SIGNATURE PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved • error related to mismatch on the transaction signature ERR_TRANS_TYPE PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved • error related to mismatch on the transaction type ERR_USER_PARITY PS_SCR_M POM DMA_PORTA Reserved CPU AXI-M ACP-M Reserved • error related to mismatch on the parity SERR_UNEXPECTED_MID L2 RAM Wrapper L2 Flash Wrapper Port A L2 Flash Wrapper Port B EMIF Reserved CPU AXi-S ACP-S
Each bit indicates the transaction processing block inside the interconnect corresponding to the slave that is detected by the interconnect checker to have a fault.
error related to mismatch on the master ID SERR_ADDR_DECODE L2 RAM Wrapper L2 Flash Wrapper Port A L2 Flash Wrapper Port B EMIF Reserved CPU AXi-S ACP-S
error related to mismatch on the most significant address bits SERR_USER_PARITY L2 RAM Wrapper L2 Flash Wrapper Port A L2 Flash Wrapper Port B EMIF Reserved CPU AXi-S ACP-S
error related to mismatch on the parity of the most significant address bits

PRODUCT□PREVIEW 100 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.9.6 Parameter Overlay Module (POM) Considerations

The Parameter Overlay Module (POM) is implemented as part of the L2FMC module. It is used to redirect flash memory accesses to external memory interfaces or internal SRAM. The POM has an OCP master port to redirect accesses. The POM MMRs are located in a separate block and read/writes will happen through the Debug APB port on the L2FMC. The POM master port is capable of read accesses only. Inside the CPU Subsystem SCR, the POM master port is connected to both the L2RAMW and EMIF slaves. The primary roles of the POM are:

The POM snoops the access on the two flash slave ports to determine if access should be remapped or not. It supports 32 regions among the two slave ports.
If access is to be remapped, then the POM kills the access to the flash bank, and instead redirects the access through its own master.
Upon obtaining response, the POM populates the response FIFO of the respective port so that the response is delivered back to the original requester.
The access is unaffected if the request is not mapped to any region, or if the POM is disabled.
The POM does not add any latency to the flash access when it is turned off.
The POM does not add any latency to the remapped access (except the latency, if any, associated with the getting the response from the an alternate slave)

PRODUCT□PREVIEW 101 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.10 Flash Memory

6.10.1 Flash Memory Configuration

Flash Bank: A separate block of logic consisting of 1 to 16 sectors. Each flash bank normally has a customer-OTP and a TI-OTP area. These flash sectors share input/output buffers, data paths, sense amplifiers, and control logic. Flash Sector: A contiguous region of flash memory which must be erased simultaneously due to physical construction constraints. Flash Pump: A charge pump which generates all the voltages required for reading, programming, or erasing the flash banks. Flash Module: Interface circuitry required between the host CPU and the flash banks and pump module. Table 6-29. Flash Memory Banks and Sectors MEMORY ARRAYS (OR BANKS) SECTOR NO. SEGMENT LOW ADDRESS HIGH ADDRESS BANK0 (2.0MB) 0 16KB 0x0000_0000 0x0000_3FFF 1 16KB 0x0000_4000 0x0000_7FFF 2 16KB 0x0000_8000 0x0000_BFFF 3 16KB 0x0000_C000 0x0000_FFFF 4 16KB 0x0001_0000 0x0001_3FFF 5 16KB 0x0001_4000 0x0001_7FFF 6 32KB 0x0001_8000 0x0001_FFFF 7 128KB 0x0002_0000 0x0003_FFFF 8 128KB 0x0004_0000 0x0005_FFFF 9 128KB 0x0006_0000 0x0007_FFFF 10 256KB 0x0008_0000 0x000B_FFFF 11 256KB 0x000C_0000 0x000F_FFFF 12 256KB 0x0010_0000 0x0013_FFFF 13 256KB 0x0014_0000 0x0017_FFFF 14 256KB 0x0018_0000 0x001B_FFFF 15 256KB 0x001C_0000 0x001F_FFFF BANK1 (2.0MB) 0 128KB 0x0020_0000 0x0021_FFFF 1 128KB 0x0022_0000 0x0023_FFFF 2 128KB 0x0024_0000 0x0025_FFFF 3 128KB 0x0026_0000 0x0027_FFFF 4 128KB 0x0028_0000 0x0029_FFFF 5 128KB 0x002A_0000 0x002B_FFFF 6 128KB 0x002C_0000 0x002D_FFFF 7 128KB 0x002E_0000 0x002F_FFFF 8 128KB 0x0030_0000 0x0031_FFFF 9 128KB 0x0032_0000 0x0033_FFFF 10 128KB 0x0034_0000 0x0035_FFFF 11 128KB 0x0036_0000 0x0037_FFFF 12 128KB 0x0038_0000 0x0039_FFFF 13 128KB 0x003A_0000 0x003B_FFFF 14 128KB 0x003C_0000 0x003D_FFFF 15 128KB 0x003E_0000 0x003F_FFFF

PRODUCT□PREVIEW MRC p15,#0,r1,c9,c12,#0 ;Enabling Event monitor states ORR r1, r1, #0x00000010 MCR p15,#0,r1,c9,c12,#0 ;Set 4th bit (‘X’) of PMNC register MRC p15,#0,r1,c9,c12,#0 102 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-30. EEPROM Flash Bank MEMORY ARRAYS (OR BANKS) SECTOR NO. SEGMENT LOW ADDRESS HIGH ADDRESS BANK7 (128KB) for EEPROM emulation 0 4KB 0xF020_0000 0xF020_0FFF 31 4KB 0xF021_F000 0xF021_FFFF

6.10.2 Main Features of Flash Module

Support for multiple flash banks for program and/or data storage
Simultaneous read accesses on two banks while performing program or erase operation on any other bank
Integrated state machines to automate flash erase and program operations
Software interface for flash program and erase operations
Pipelined mode operation to improve instruction access interface bandwidth
Support for Single Error Correction Double Error Detection (SECDED) block inside Cortex-R5F CPU
Support for a rich set of diagnostic features

6.10.3 ECC Protection for Flash Accesses

All accesses to the L2 program flash memory are protected by Single Error Correction Double Error Detection (SECDED) logic embedded inside the CPU. The flash module provides 8 bits of ECC code for 64 bits of instructions or data fetched from the flash memory. The CPU calculates the expected ECC code based on the 64 bits data received and compares it with the ECC code returned by the flash module. A single-bit error is corrected and flagged by the CPU, while a multibit error is only flagged. The CPU signals an ECC error through its Event bus. This signaling mechanism is not enabled by default and must be enabled by setting the 'X' bit of the Performance Monitor Control Register, c9. NOTE ECC is permanently enabled in the CPU L2 interface.

6.10.4 Flash Access Speeds

For information on flash memory access speeds and the relevant wait states required, refer to Section 5.6.

PRODUCT□PREVIEW 103 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes programming 288 bits at a time at the maximum specified operating frequency.

6.10.5 Flash Program and Erase Timings

6.10.5.1 Flash Program and Erase Timings for Program Flash

Table 6-31. Timing Requirements for Program Flash MIN NOM MAX UNIT tprog(288bits) Wide Word (288 bits) programming time 40 300 µs tprog(Total) 4.0MB programming time(1) -40°C to 105°C 21.3 s 0°C to 60°C, for first 25 cycles 5.3 10.6 s terase Sector/Bank erase time -40°C to 105°C 0.3 4 s 0°C to 60°C, for first 25 cycles 100 ms twec Write/erase cycles with 15 year Data Retention requirement -40°C to 105°C 1000 cycles (1) This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes programming 72 bits at a time at the maximum specified operating frequency.

6.10.5.2 Flash Program and Erase Timings for Data Flash

Table 6-32. Timing Requirements for Data Flash MIN NOM MAX UNIT tprog(72bits) Wide Word (72 bits) programming time 47 300 µs tprog(Total) EEPROM Emulation (bank 7) 128KB programming time(1) -40°C to 105°C 2.6 s 0°C to 60°C, for first 25 cycles 775 1320 ms EEPROM Emulation (bank 7) Sector/Bank erase time terase(bank7) -40°C to 105°C 0.2 8 s 0°C to 60°C, for first 25 cycles 14 100 ms twec Write/erase cycles with 15 year Data Retention requirement -40°C to 105°C 100000 cycles

PRODUCT□PREVIEW 104 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.11 L2RAMW (Level 2 RAM Interface Module)

L2RAMW is the TMS570 level two RAM wrapper. Major features implemented in this device include:

Supports 512KB of L2 SRAMs
One 64-bit OCP interface
Built-in ECC generation and evaluation logic – The ECC logic is enabled by default. – When enabled, automatic ECC correction on write data from masters on any write sizes (8,16,32,64-bit) – Less than 64-bit write forces built in read-modify-write – When enabled, reads due to read-modify-write go through ECC correction before data merging with the incoming write data
Redundant address decoding. Same address decode logic block is duplicated and compared to each other
Data Trace – Support tracing of both read and write accesses through RTP module
Auto initialization of memory banks to known values for both data and their corresponding ECC checksum

6.11.1 L2 SRAM Initialization

The entire L2 SRAM can be globally initialized by setting the corresponding bit in SYS.MSINENA register. When initialized, the memory arrays are written with all zeros for the 64-bit data and the corresponding 8- bit ECC checksum. Hardware memory initialization eliminates ECC error when the CPU reads from an un- initialized memory location which can cause an ECC error. For more information see the device specific technical reference manual.

6.12 ECC / Parity Protection for Accesses to peripheral RAMs

Accesses to some peripheral RAMs are protected by either odd/even parity checking or ECC checking.. During a read access the parity or ECC is calculated based on the data read from the peripheral RAM and compared with the good parity or ECC value stored in the peripheral RAM for that peripheral. If any word fails the parity or ECC check, the module generates a ECC/parity error signal that is mapped to the Error Signaling Module. The module also captures the peripheral RAM address that caused the parity error. The parity or ECC protection for peripheral RAMs is not enabled by default and must be enabled by the application. Each individual peripheral contains control registers to enable the parity or ECC protection for accesses to its RAM. NOTE For peripherals with parity protection the CPU read access gets the actual data from the peripheral. The application can choose to generate an interrupt whenever a peripheral RAM parity error is detected.

PRODUCT□PREVIEW 105 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) March13N is the only algortihm recommended for application testing of RAM. (2) ATB RAM is part of the ETM module. PBIST testing of this RAM is limited to 85ºC or lower.

6.13 On-Chip SRAM Initialization and Testing

6.13.1 On-Chip SRAM Self-Test Using PBIST

6.13.1.1 Features

Extensive instruction set to support various memory test algorithms
ROM-based algorithms allow application to run TI production-level memory tests
Independent testing of all on-chip SRAM

6.13.1.2 PBIST RAM Groups

Table 6-33. PBIST RAM Grouping MEMORY RAM GROUP TEST CLOCK RGS RDS MEM TYPE BANKS TEST PATTERN (ALGORITHM) triple read slow read triple read fast read March 13N(1) two port (cycles) March 13N(1) single port (cycles) ALGO MASK 0x1 ALGO MASK 0x2 ALGO MASK 0x4 ALGO MASK 0x8 PBIST_ROM 1 GCM_PBIST_R OM 1 1 ROM 1 24578 8194 STC1_1_ROM_R5 2 GCM_PBIST_R OM 14 1 ROM 1 49154 16386 STC1_2_ROM_R5 3 GCM_PBIST_R OM 14 2 ROM 1 49154 16386 STC2_ROM_NHET 4 GCM_PBIST_R OM 15 1 ROM 1 46082 15362 AWM1 5 GCM_VCLKP 2 1 2P 1 4210 DCAN1 6 GCM_VCLKP 3 1..6 2P 2 25260 DCAN2 7 GCM_VCLKP 4 1..6 2P 2 25260 DMA 8 GCM_HCLK 5 1..6 2P 2 37740 HTU1 9 GCM_VCLK2 6 1..6 2P 2 6540 MIBSPI1 10 GCM_VCLKP 8 1..4 2P 2 66760 MIBSPI2 11 GCM_VCLKP 9 1..4 2P 2 33480 MIBSPI3 12 GCM_VCLKP 10 1..4 2P 2 33480 NHET1 13 GCM_VCLK2 11 1..12 2P 4 50520 VIM 14 GCM_VCLK 12 1..2 2P 1 16740 Reserved 15 - - - - - - RTP 16 GCM_HCLK 16 1..12 2P 4 50520 ATB(2) 17 GCM_GCLK1 17 1..16 2P 8 133920 AWM2 18 GCM_VCLKP 18 1 2P 1 4210 DCAN3 19 GCM_VCLKP 19 1..6 2P 2 25260 DCAN4 20 GCM_VCLKP 20 1..6 2P 2 25260 HTU2 21 GCM_VCLK2 21 1..6 2P 2 6540 MIBSPI4 22 GCM_VCLKP 22 1..4 2P 2 33480 MIBSPI5 23 GCM_VCLKP 23 1..4 2P 2 33480 NHET2 24 GCM_VCLK2 24 1..12 2P 4 50520 Reserved 26 GCM_VCLKP 26 1..8 2P 4 33680 CPGMAC_STATE_R XADDR 27 GCM_VCLK3 27 1..3 2P 2 6390 CPGMAC_STAT_FIF O 28 GCM_VCLK3 27 4..6 2P 3 8730 L2RAMW 29 GCM_HCLK 7

1 SP 4

6 SP 4

PRODUCT□PREVIEW 106 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-33. PBIST RAM Grouping (continued) MEMORY RAM GROUP TEST CLOCK RGS RDS MEM TYPE BANKS TEST PATTERN (ALGORITHM) triple read slow read triple read fast read March 13N(1) two port (cycles) March 13N(1) single port (cycles) ALGO MASK 0x1 ALGO MASK 0x2 ALGO MASK 0x4 ALGO MASK 0x8 L2RAMW 30 GCM_HCLK 32

11 SP 4

16 SP 4

21 SP 4

26 SP 4

R5_ICACHE 31 GCM_GCLK1 40 R5_DCACHE 32 GCM_GCLK1 41 Reserved 33 GCM_GCLK2 43 Reserved 34 GCM_GCLK2 44 Reserved 35 GCM_VCLKP 26 9..11 SP 3 149910 CPGMAC_CPPI 36 GCM_VCLK3 27 7 SP 1 133170 R5_DCACHE_Dirty 37 GCM_GCLK1 42 2 SP 1 16690 Reserved 38 - - - - - - There are several memory testing algorithms stored in the PBIST ROM. However, TI only recommends the March13N algorithm for application testing of RAM. The PBIST ROM clock frequency is limited to the maximum frequency of 82.5 MHz. The PBIST ROM clock is divided down from HCLK. The divider is selected by programming the ROM_DIV field of the Memory Self-Test Global Control Register (MSTGCR) at address 0xFFFFFF58.

PRODUCT□PREVIEW 107 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) If parity protection is enabled for the peripheral SRAM modules, then the parity bits will also be initialized along with the SRAM modules. (2) If ECC protection is enabled for the CPU data RAM or peripheral SRAM modules, then the auto-initialization process also initializes the corresponding ECC space. (3) The L2 SRAM from range 128KB to 512KB is divided into 8 memory regions. Each region has an associated control bit to enable auto- initialization. (4) The MibSPIx modules perform an initialization of the transmit and receive RAMs as soon as the multibuffered mode is enabled. This is independent of whether the application has already initialized these RAMs using the auto-initialization method or not. The MibSPIx modules must be released from reset by writing 1 to their SPIGCR0 registers before starting auto-initialization on their respective RAMs.

6.13.2 On-Chip SRAM Auto Initialization

This microcontroller allows some of the on-chip memories to be initialized through the Memory Hardware Initialization mechanism in the System module. This hardware mechanism allows an application to program the memory arrays with error detection capability to a known state based on their error detection scheme (odd/even parity or ECC). The MINITGCR register enables the memory initialization sequence, and the MSINENA register selects the memories that are to be initialized. For more information on these registers see the device specific technical reference manual. The mapping of the different on-chip memories to the specific bits of the MSINENA registers is provided in Table 6-34. Table 6-34. Memory Initialization(1)(2) CONNECTING MODULE ADDRESS RANGE SYS.MSINENA Register Bit # L2RAMW.MEMINT_ENA Register Bit #(3) BASE ADDRESS ENDING ADDRESS L2 SRAM 0x08000000 0x0800FFFF 0 0 L2 SRAM 0x08010000 0x0801FFFF 0 1 L2 SRAM 0x08020000 0x0802FFFF 0 2 L2 SRAM 0x08030000 0x0803FFFF 0 3 L2 SRAM 0x08040000 0x0804FFFF 0 4 L2 SRAM 0x08050000 0x0805FFFF 0 5 L2 SRAM 0x08060000 0x0806FFFF 0 6 L2 SRAM 0x08070000 0x0807FFFF 0 7 MIBSPI5 RAM(4) 0xFF0A0000 0xFF0BFFFF 12 n/a MIBSPI4 RAM(4) 0xFF060000 0xFF07FFFF 19 n/a MIBSPI3 RAM(4) 0xFF0C0000 0xFF0DFFFF 11 n/a MIBSPI2 RAM(4) 0xFF080000 0xFF09FFFF 18 n/a MIBSPI1 RAM(4) 0xFF0E0000 0xFF0FFFFF 7 n/a DCAN4 RAM 0xFF180000 0xFF19FFFF 20 n/a DCAN3 RAM 0xFF1A0000 0xFF1BFFFF 10 n/a DCAN2 RAM 0xFF1C0000 0xFF1DFFFF 6 n/a DCAN1 RAM 0xFF1E0000 0xFF1FFFFF 5 n/a MIBADC2 RAM 0xFF3A0000 0xFF3BFFFF 14 n/a MIBADC1 RAM 0xFF3E0000 0xFF3FFFFF 8 n/a NHET2 RAM 0xFF440000 0xFF45FFFF 15 n/a NHET1 RAM 0xFF460000 0xFF47FFFF 3 n/a HET TU2 RAM 0xFF4C0000 0xFF4DFFFF 16 n/a HET TU1 RAM 0xFF4E0000 0xFF4FFFFF 4 n/a DMA RAM 0xFFF80000 0xFFF80FFF 1 n/a VIM RAM 0xFFF82000 0xFFF82FFF 2 n/a

PRODUCT□PREVIEW 108 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated NOTE Peripheral memories not listed in the table either do not support auto-initialization or have implemented auto-initialization controlled directly by their respective peripherals.

PRODUCT□PREVIEW EMIF_nCS[3:2] EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_nOE EMIF_DA T A[15:0] EMIF_nWE EMIF_nDQM[1:0] 3029 109 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.14 External Memory Interface (EMIF)

6.14.1 Features

The EMIF includes many features to enhance the ease and flexibility of connecting to external asynchronous memories or SDRAM devices. The EMIF features includes support for:

3 addressable chip select for asynchronous memories of up to 32KB each
1 addressable chip select space for SDRAMs up to 128MB
8 or 16-bit data bus width
Programmable cycle timings such as setup, strobe, and hold times as well as turnaround time
Select strobe mode
Extended Wait mode
Data bus parking

6.14.2 Electrical and Timing Specifications

6.14.2.1 Read Timing (Asynchronous RAM)

Figure 6-11. Asynchronous Memory Read Timing

PRODUCT□PREVIEW EMIF_nCS[3:2] EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_nWE EMIF_DAT A[15:0] EMIF_nOE EMIF_nDQM[1:0] EMIF_nCS[3:2] 1 1 Asserted Deasserted EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_DA T A[15:0] EMIF_nOE EMIF_WAIT SETUP Extended Due to EMIF_WAIT STROBE HOLD STROBE 110 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Figure 6-12. EMIFnWAIT Read Timing Requirements

6.14.2.2 Write Timing (Asynchronous RAM)

Figure 6-13. Asynchronous Memory Write Timing

PRODUCT□PREVIEW EMIF_nCS[3:2] Asserted EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_DA T A[15:0] EMIF_nWE EMIF_WAIT SETUP Extended Due to EMIF_WAIT Deasserted STROBE STROBE HOLD 111 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) E = EMIF_CLK period in ns. (2) Setup before end of STROBE phase (if no extended wait states are inserted) by which EMIFnWAIT must be asserted to add extended wait states. Figure 6-12 and Figure 6-14 describe EMIF transactions that include extended wait states inserted during the STROBE phase. However, cycles inserted as part of this extended wait period should not be counted; the 4E requirement is to the start of where the HOLD phase would begin if there were no extended wait cycles. Figure 6-14. EMIFnWAIT Write Timing Requirements

6.14.2.3 EMIF Asynchronous Memory Timing

Table 6-35. EMIF Asynchronous Memory Timing Requirements(1) NO. MIN NOM MAX UNIT Reads and Writes 2 tw(EM_WAIT) Pulse duration, EMIFnWAIT assertion and deassertion 2E ns Reads 12 tsu(EMDV-EMOEH) Setup time, EMIFDATA[15:0] valid before EMIFnOE high 11 ns 13 th(EMOEH-EMDIV) Hold time, EMIFDATA[15:0] valid after EMIFnOE high 0.5 ns 14 tsu(EMOEL-EMWAIT) Setup Time, EMIFnWAIT asserted before end of Strobe Phase(2) 4E+14 ns Writes 28 tsu(EMWEL-EMWAIT) Setup Time, EMIFnWAIT asserted before end of Strobe Phase(2) 4E+14 ns (1) TA = Turn around, RS = Read setup, RST = Read strobe, RH = Read hold, WS = Write setup, WST = Write strobe, WH = Write hold, MEWC = Maximum external wait cycles. These parameters are programmed through the Asynchronous Bank and Asynchronous Wait Cycle Configuration Registers. These support the following ranges of values: TA[4–1], RS[16–1], RST[64–1], RH[8–1], WS[16–1], WST[64–1], WH[8–1], and MEWC[1–256]. See the EMIF chapter of the TRM SPNU562 for more information. (2) E = EMIF_CLK period in ns. (3) EWC = external wait cycles determined by EMIFnWAIT input signal. EWC supports the following range of values. EWC[256–1]. Note that the maximum wait time before time-out is specified by bit field MEWC in the Asynchronous Wait Cycle Configuration Register. See the EMIF chapter of the TRM SPNU562 for more information. Table 6-36. EMIF Asynchronous Memory Switching Characteristics(1)(2)(3) NO. PARAMETER MIN TYP MAX UNIT Reads and Writes 1 td(TURNAROUND) Turn around time (TA)*E -3 (TA)*E (TA)*E + 3 ns Reads 3 tc(EMRCYCLE) EMIF read cycle time (EW = 0) (RS+RST+RH)*E-3 (RS+RST+RH)*E (RS+RST+RH)*E + 3 ns EMIF read cycle time (EW = 1) (RS+RST+RH+ EWC)*E -3 (RS+RST+RH+ EWC)*E (RS+RST+RH+ EWC)*E + 3 ns

PRODUCT□PREVIEW 112 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-36. EMIF Asynchronous Memory Switching Characteristics(1)(2)(3) (continued) NO. PARAMETER MIN TYP MAX UNIT 4 tsu(EMCEL-EMOEL) Output setup time, EMIF_nCS[4:2] low to EMIF_nOE low (SS = 0) (RS)*E-3 (RS)*E (RS)*E+3 ns Output setup time, EMIFnCS[4:2] low to EMIF_nOE low (SS = 1) –3 0 3 ns 5 th(EMOEH-EMCEH) Output hold time, EMIF_nOE high to EMIF_nCS[4:2] high (SS = 0) (RH)*E -4 (RH)*E (RH)*E + 3 ns Output hold time, EMIF_nOE high to EMIF_nCS[4:2] high (SS = 1) –4 0 3 ns 6 tsu(EMBAV-EMOEL) Output setup time, EMIF_BA[1:0] valid to EMIF_nOE low (RS)*E-3 (RS)*E (RS)*E+3 ns 7 th(EMOEH-EMBAIV) Output hold time, EMIF_nOE high to EMIF_BA[1:0] invalid (RH)*E-4 (RH)*E (RH)*E+3 ns 8 tsu(EMBAV-EMOEL) Output setup time, EMIF_ADDR[21:0] valid to EMIF_nOE low (RS)*E-3 (RS)*E (RS)*E+3 ns 9 th(EMOEH-EMAIV) Output hold time, EMIF_nOE high to EMIF_ADDR[21:0] invalid (RH)*E-4 (RH)*E (RH)*E+3 ns 10 tw(EMOEL) EMIF_nOE active low width (EW = 0) (RST)*E-3 (RST)*E (RST)*E+3 ns EMIF_nOE active low width (EW = 1) (RST+EWC) *E-3 (RST+EWC)*E (RST+EWC) *E+3 ns 11 td(EMWAITH-EMOEH) Delay time from EMIF_nWAIT deasserted to EMIF_nOE high 3E-3 4E 4E+5 ns 29 tsu(EMDQMV-EMOEL) Output setup time, EMIF_nDQM[1:0] valid to EMIF_nOE low (RS)*E-5 (RS)*E (RS)*E+3 ns 30 th(EMOEH-EMDQMIV) Output hold time, EMIF_nOE high to EMIF_nDQM[1:0] invalid (RH)*E-4 (RH)*E (RH)*E+5 ns Writes 15 tc(EMWCYCLE) EMIF write cycle time (EW = 0) (WS+WST+WH)* E-3 (WS+WST+WH)*E (WS+WST+WH)* E+3 ns EMIF write cycle time (EW = 1) (WS+WST+WH+ EWC)*E -3 (WS+WST+WH+ EWC)*E (WS+WST+WH+ EWC)*E + 3 ns 16 tsu(EMCEL-EMWEL) Output setup time, EMIF_nCS[4:2] low to EMIF_nWE low (SS = 0) (WS)*E -3 (WS)*E (WS)*E + 3 ns Output setup time, EMIF_nCS[4:2] low to EMIF_nWE low (SS = 1) –3 0 3 ns 17 th(EMWEH-EMCEH) Output hold time, EMIF_nWE high to EMIF_nCS[4:2] high (SS = 0) (WH)*E-3 (WH)*E (WH)*E+3 ns Output hold time, EMIF_nWE high to EMIF_CS[4:2] high (SS = 1) –3 0 3 ns 18 tsu(EMDQMV-EMWEL) Output setup time, EMIF_nDQM[1:0] valid to EMIF_nWE low (WS)*E-3 (WS)*E (WS)*E+3 ns 19 th(EMWEH-EMDQMIV) Output hold time, EMIF_nWE high to EMIF_nDQM[1:0] invalid (WH)*E-3 (WH)*E (WH)*E+3 ns 20 tsu(EMBAV-EMWEL) Output setup time, EMIF_BA[1:0] valid to EMIF_nWE low (WS)*E-3 (WS)*E (WS)*E+3 ns 21 th(EMWEH-EMBAIV) Output hold time, EMIF_nWE high to EMIF_BA[1:0] invalid (WH)*E-3 (WH)*E (WH)*E+3 ns 22 tsu(EMAV-EMWEL) Output setup time, EMIF_ADDR[21:0] valid to EMIF_nWE low (WS)*E-3 (WS)*E (WS)*E+3 ns 23 th(EMWEH-EMAIV) Output hold time, EMIF_nWE high to EMIF_ADDR[21:0] invalid (WH)*E-3 (WH)*E (WH)*E+3 ns 24 tw(EMWEL) EMIF_nWE active low width (EW = 0) (WST)*E-3 (WST)*E (WST)*E+3 ns EMIF_nWE active low width (EW = 1) (WST+EWC) *E-3 (WST+EWC)*E (WST+EWC) *E+3 ns 25 td(EMWAITH-EMWEH) Delay time from EMIF_nWAIT deasserted to EMIF_nWE high 3E+3 4E 4E+14 ns 26 tsu(EMDV-EMWEL) Output setup time, EMIF_DATA[15:0] valid to EMIF_nWE low (WS)*E-3 (WS)*E (WS)*E+3 ns 27 th(EMWEH-EMDIV) Output hold time, EMIF_nWE high to EMIF_DATA[15:0] invalid (WH)*E-3 (WH)*E (WH)*E+3 ns

PRODUCT□PREVIEW EMIF_CLK EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_DAT A[15:0] 2 2 1 1 17 18

2 EM_CLK Delay

EMIF_nCS[0] EMIF_nDQM[1:0] EMIF_nRAS EMIF_nCAS EMIF_nWE 113 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.14.2.4 Read Timing (Synchronous RAM)

Figure 6-15. Basic SDRAM Read Operation

PRODUCT□PREVIEW EMIF_CLK EMIF_BA[1:0] EMIF_ADDR[21:0] EMIF_DA T A[15:0] 2 2 1 1 BASIC SDRAM WRITE OPERA TION EMIF_CS[0] EMIF_DQM[1:0] EMIF_nRAS EMIF_nCAS EMIF_nWE 114 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.14.2.5 Write Timing (Synchronous RAM)

Figure 6-16. Basic SDRAM Write Operation EMIF Synchronous Memory Timing Table 6-37. EMIF Synchronous Memory Timing Requirements NO. Parameter MIN MAX Unit 19 tsu(EMIFDV-EM_CLKH) Input setup time, read data valid on EMIF_DATA[15:0] before EMIF_CLK rising 1 ns 20 th(CLKH-DIV) Input hold time, read data valid on EMIF_DATA[15:0] after EMIF_CLK rising 2.2 ns Table 6-38. EMIF Synchronous Memory Switching Characteristics NO. Parameter MIN MAX Unit 1 tc(CLK) Cycle time, EMIF clock EMIF_CLK 10 ns 2 tw(CLK) Pulse width, EMIF clock EMIF_CLK high or low 3 ns 3 td(CLKH-CSV) Delay time, EMIF_CLK rising to EMIF_nCS[0] valid 7 ns 4 toh(CLKH-CSIV) Output hold time, EMIF_CLK rising to EMIF_nCS[0] invalid 1 ns 5 td(CLKH-DQMV) Delay time, EMIF_CLK rising to EMIF_nDQM[1:0] valid 7 ns 6 toh(CLKH-DQMIV) Output hold time, EMIF_CLK rising to EMIF_nDQM[1:0] invalid 1 ns

PRODUCT□PREVIEW 115 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-38. EMIF Synchronous Memory Switching Characteristics (continued) NO. Parameter MIN MAX Unit 7 td(CLKH-AV) Delay time, EMIF_CLK rising to EMIF_ADDR[21:0] and EMIF_BA[1:0] valid 7 ns 8 toh(CLKH-AIV) Output hold time, EMIF_CLK rising to EMIF_ADDR[21:0] and EMIF_BA[1:0] invalid 1 ns 9 td(CLKH-DV) Delay time, EMIF_CLK rising to EMIF_DATA[15:0] valid 7 ns 10 toh(CLKH-DIV) Output hold time, EMIF_CLK rising to EMIF_DATA[15:0] invalid 1 ns 11 td(CLKH-RASV) Delay time, EMIF_CLK rising to EMIF_nRAS valid 7 ns 12 toh(CLKH-RASIV) Output hold time, EMIF_CLK rising to EMIF_nRAS invalid 1 ns 13 td(CLKH-CASV) Delay time, EMIF_CLK rising to EMIF_nCAS valid 7 ns 14 toh(CLKH-CASIV) Output hold time, EMIF_CLK rising to EMIF_nCAS invalid 1 ns 15 td(CLKH-WEV) Delay time, EMIF_CLK rising to EMIF_nWE valid 7 ns 16 toh(CLKH-WEIV) Output hold time, EMIF_CLK rising to EMIF_nWE invalid 1 ns 17 tdis(CLKH-DHZ) Delay time, EMIF_CLK rising to EMIF_DATA[15:0] tri-stated 7 ns 18 tena(CLKH-DLZ) Output hold time, EMIF_CLK rising to EMIF_DATA[15:0] driving 1 ns

PRODUCT□PREVIEW VIM1 VIM2 Interrupt Requests PCR R5F-0 R5F-1 nIRQ/nFIQ/IRQVECADDR 2 cyc delay CCM-R5F ESM 2 cyc delay Cortex-R5 Processor Group 2 cyc delay 2 cyc delay 116 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.15 Vectored Interrupt Manager

There are two on-chip Vector Interrupt Manager (VIM) modules. The VIM module provides hardware assistance for prioritizing and controlling the many interrupt sources present on a device. Interrupts are caused by events outside of the normal flow of program execution. Normally, these events require a timely response from the CPU; therefore, when an interrupt occurs, the CPU switches execution from the normal program flow to an interrupt service routine (ISR).

6.15.1 VIM Features

The VIM module has the following features:

Supports 128 interrupt channels
Provides programmable priority for the request lines
Manages interrupt channels through masking
Prioritizes interrupt channels to the CPU
Provides the CPU with the address of the interrupt service routine (ISR) for each interrupt The two VIM modules are in lockstep. These two VIM modules are memory mapped to the same address space. From a programmer’s model point of view it is only one VIM module. Writes to VIM1 registers and memory will be broadcasted to both VIM1 and VIM2. Reads from VIM1 will only read the VIM1 registers and memory. All interrupt requests which go to the VIM1 module will also go to the VIM2 module. Because the VIM1 and VIM2 have the identical setup, both will result in the same output behavior responding to the same interrupt requests. The second VIM module acts as a diagnostic checker module against the first VIM module. The output signals of the two VIM modules are routed to CCM-R5F module and are compared constantly. Mis-compare detected will be signaled as an error to the ESM module. The lockstep VIM pair takes care of the interrupt generation to the lockstep R5F pair.

6.15.2 Interrupt Generation

To avoid common mode failures the input and output signals of the two VIMs are delayed in a different way as shown in Figure 6-17. Figure 6-17. Interrupt Generation

PRODUCT□PREVIEW 117 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.15.3 Interrupt Request Assignments

Table 6-39. Interrupt Request Assignments MODULES VIM INTERRUPT SOURCES DEFAULT VIM INTERRUPT CHANNEL ESM ESM High level interrupt (NMI) 0 Reserved Reserved 1 RTI RTI1 compare interrupt 0 2 RTI RTI1 compare interrupt 1 3 RTI RTI1 compare interrupt 2 4 RTI RTI1 compare interrupt 3 5 RTI RTI1 overflow interrupt 0 6 RTI RTI1 overflow interrupt 1 7 RTI RTI1 timebase 8 GIO GIO high level interrupt 9 NHET1 NHET1 high level interrupt (priority level 1) 10 HET TU1 HET TU1 level 0 interrupt 11 MIBSPI1 MIBSPI1 level 0 interrupt 12 LIN1 LIN1 level 0 interrupt 13 MIBADC1 MIBADC1 event group interrupt 14 MIBADC1 MIBADC1 sw group 1 interrupt 15 DCAN1 DCAN1 level 0 interrupt 16 MIBSPI2 MIBSPI2 level 0 interrupt 17 Reserved Reserved 18 CRC1 CRC1 Interrupt 19 ESM ESM Low level interrupt 20 SYSTEM Software interrupt for Cortex-R5F (SSI) 21 CPU Cortex-R5F PMU Interrupt 22 GIO GIO low level interrupt 23 NHET1 NHET1 low level interrupt (priority level 2) 24 HET TU1 HET TU1 level 1 interrupt 25 MIBSPI1 MIBSPI1 level 1 interrupt 26 LIN1 LIN1 level 1 interrupt 27 MIBADC1 MIBADC1 sw group 2 interrupt 28 DCAN1 DCAN1 level 1 interrupt 29 MIBSPI2 MIBSPI2 level 1 interrupt 30 MIBADC1 MIBADC1 magnitude compare interrupt 31 Reserved Reserved 32 DMA FTCA interrupt 33 DMA LFSA interrupt 34 DCAN2 DCAN2 level 0 interrupt 35 DMM DMM level 0 interrupt 36 MIBSPI3 MIBSPI3 level 0 interrupt 37 MIBSPI3 MIBSPI3 level 1 interrupt 38 DMA HBCA interrupt 39 DMA BTCA interrupt 40 EMIF AEMIFINT 41 DCAN2 DCAN2 level 1 interrupt 42 DMM DMM level 1 interrupt 43 DCAN1 DCAN1 IF3 interrupt 44

PRODUCT□PREVIEW 118 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-39. Interrupt Request Assignments (continued) MODULES VIM INTERRUPT SOURCES DEFAULT VIM INTERRUPT CHANNEL DCAN3 DCAN3 level 0 interrupt 45 DCAN2 DCAN2 IF3 interrupt 46 FPU FPU interrupt of Cortex-R5F 47 Reserved Reserved 48 MIBSPI4 MIBSPI4 level 0 interrupt 49 MIBADC2 MibADC2 event group interrupt 50 MIBADC2 MibADC2 sw group1 interrupt 51 Reserved Reserved 52 MIBSPI5 MIBSPI5 level 0 interrupt 53 MIBSPI4 MIBSPI4 level 1 interrupt 54 DCAN3 DCAN3 level 1 interrupt 55 MIBSPI5 MIBSPI5 level 1 interrupt 56 MIBADC2 MibADC2 sw group2 interrupt 57 Reserved Reserved 58 MIBADC2 MibADC2 magnitude compare interrupt 59 DCAN3 DCAN3 IF3 interrupt 60 L2FMC FSM_DONE interrupt 61 Reserved Reserved 62 NHET2 NHET2 level 0 interrupt 63 SCI3 SCI3 level 0 interrupt 64 NHET TU2 NHET TU2 level 0 interrupt 65 I2C1 I2C level 0 interrupt 66 Reserved Reserved 67-72 NHET2 NHET2 level 1 interrupt 73 SCI3 SCI3 level 1 interrupt 74 NHET TU2 NHET TU2 level 1 interrupt 75 Ethernet C0_MISC_PULSE 76 Ethernet C0_TX_PULSE 77 Ethernet C0_THRESH_PULSE 78 Ethernet C0_RX_PULSE 79 HWAG1 HWA_INT_REQ_H 80 HWAG2 HWA_INT_REQ_H 81 DCC1 DCC1 done interrupt 82 DCC2 DCC2 done interrupt 83 SYSTEM Reserved 84 PBIST PBIST Done 85 Reserved Reserved 86-87 HWAG1 HWA_INT_REQ_L 88 HWAG2 HWA_INT_REQ_L 89 ePWM1INTn ePWM1 Interrupt 90 ePWM1TZINTn ePWM1 Trip Zone Interrupt 91 ePWM2INTn ePWM2 Interrupt 92 ePWM2TZINTn ePWM2 Trip Zone Interrupt 93 ePWM3INTn ePWM3 Interrupt 94 ePWM3TZINTn ePWM3 Trip Zone Interrupt 95 ePWM4INTn ePWM4 Interrupt 96 ePWM4TZINTn ePWM4 Trip Zone Interrupt 97

PRODUCT□PREVIEW 119 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-39. Interrupt Request Assignments (continued) MODULES VIM INTERRUPT SOURCES DEFAULT VIM INTERRUPT CHANNEL ePWM5INTn ePWM5 Interrupt 98 ePWM5TZINTn ePWM5 Trip Zone Interrupt 99 ePWM6INTn ePWM6 Interrupt 100 ePWM6TZINTn ePWM6 Trip Zone Interrupt 101 ePWM7INTn ePWM7 Interrupt 102 ePWM7TZINTn ePWM7 Trip Zone Interrupt 103 eCAP1INTn eCAP1 Interrupt 104 eCAP2INTn eCAP2 Interrupt 105 eCAP3INTn eCAP3 Interrupt 106 eCAP4INTn eCAP4 Interrupt 107 eCAP5INTn eCAP5 Interrupt 108 eCAP6INTn eCAP6 Interrupt 109 eQEP1INTn eQEP1 Interrupt 110 eQEP2INTn eQEP2 Interrupt 111 Reserved Reserved 112 DCAN4 DCAN4 Level 0 interrupt 113 I2C2 I2C2 interrupt 114 LIN2 LIN2 level 0 interrupt 115 SCI4 SCI4 level 0 interrupt 116 DCAN4 DCAN4 Level 1 interrupt 117 LIN2 LIN2 level 1 interrupt 118 SCI4 SCI4 level 1 interrupt 119 DCAN4 DCAN4 IF3 Interrupt 120 CRC2 CRC2 Interrupt 121 Reserved Reserved 122 Reserved Reserved 123 EPC EPC FIFO FULL or CAM FULL interrupt 124 Reserved Reserved 125-127 NOTE Address location 0x00000000 in the VIM RAM is reserved for the phantom interrupt ISR entry; therefore only request channels 0..126 can be used and are offset by 1 address in the VIM RAM. NOTE The EMIF_nWAIT signal has a pull-up on it. The EMIF module generates a "Wait Rise" interrupt whenever it detects a rising edge on the EMIF_nWAIT signal. This interrupt condition is indicated as soon as the device is powered up. This can be ignored if the EMIF_nWAIT signal is not used in the application. If the EMIF_nWAIT signal is actually used in the application, then the external slave memory must always drive the EMIF_nWAIT signal such that an interrupt is not caused due to the default pull-up on this signal. NOTE The lower-order interrupt channels are higher priority channels than the higher-order interrupt channels.

PRODUCT□PREVIEW CAM FIFO FIFO FIFO FIFO CPU0□Correctable□Error CPU□SCR□Correctable□ECC□for□DMA I/F L2RAMW□RMW□Correctable□Error Lookup FSM Err□Gen Err□Stat ESMCorrectable□Error□Capture□Block CPU□SCR□Uncorrectable□ECC□for□DMA I/F CPU□SCR□Uncorrectable□ECC□for□PS_SCR_M□I/F Err□Gen Uncorrectable□Error□Capture□Block UERR Addr□Reg UERR Addr□Reg Err□Stat Err□Stat EPC□Module Correctable□Error□Event□Source Unorrectable□Error□Event□Source ch0 ch2 ch3 ch4 ch0 ch1 120 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated NOTE The application can change the mapping of interrupt sources to the interrupt channels through the interrupt channel control registers (CHANCTRLx) inside the VIM module.

6.16 ECC Error Event Monitoring and Profiling

This device includes an Error Profiling Controller (EPC) module. The main goal of this module is to enable the system to tolerate a certain amount of ECC correctable errors on the same address repeatedly in the memory system with minimal runtime overhead. Main features implemented in this device are described below.

Capture the address of correctable ECC faults from different sources (ex. CPU, L2RAM, Interconnect) into a 16- entry CAM (Content Addressable Memory).
For correctable faults, the error handling depends on the below conditions: – if the incoming address is already in the 16-entry CAM, discard the fail. No error generated to ESM – if the address is not in the CAM list, and the CAM has empty entries, add the address into the CAM list. In addition, raise the error signal to the ESM group 1 if enabled. – if the address is not in the CAM list, and the CAM has no empty entries, always raise a signal to the ESM group 1.
A 4-entry FIFO to store correctable error events and addresses for each IP interface.
For uncorrectable faults of non-CPU access, capture the address and raise a signal to the ESM group 2.
The CAM is implemented in memory mapped registers. The CPU can read and write to any entry for diagnostic test as if a real CAM memory macro. Figure 6-18. EPC Block Diagram

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6.16.1 EPC Module Operation

6.16.1.1 Correctable Error Handling

When a correctable error is detected in the system by an IP, it sends the error signal along with the error address to EPC module. The EPC module will scan this error address in the 16-entry CAM. If there is a match then the address is discard and no error is generated to ESM by the ECP. It takes one cycle to scan one address at a time through the CAM. The idea is to allow the system to tolerate a correctable error occurring on the same address because this error has been handled before by the CPU. This error scenario is particularly frequent when the software is in a for loop fetching the same address. Because there are multiple IPs which can simultaneously detect correctable errors in the system, the EPC employs a 4-entry FIFO per IP interface so that error addresses are not lost. If an address is not matched in the CAM then it depends if there is empty entry in the CAM. If there is an empty entry then the new address is stored into the empty entry. For each entry there is a 4-bit valid key. When a new address is stored the 4-bit key is updated with "1010". It is programmable to generate a correctable error to the ESM if the address is not matched and there is an empty CAM entry. Once CPU is interrupted, it can choose to evaluate the error address and handle it accordingly. The software can also invalidate the entry by writing "0101". If an dress is not matched and there is no empty entry in the CAM then the correctable error is immediately sent to the ESM. The new error address is lost if there is no empty entry left in the CAM.

6.16.1.2 Uncorrectable Error Handling

Uncorrectable errors reported by the IP (non-CPU access) are immediately captured for their error addresses and update to the uncorrectable error status register. For more information see the device specific technical reference guide SPNU562.

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6.17 DMA Controller

The DMA controller is used to transfer data between two locations in the memory map in the background of CPU operations. Typically, the DMA is used to:

Transfer blocks of data between external and internal data memories
Restructure portions of internal data memory
Continually service a peripheral

6.17.1 DMA Features

64-bit OCP protocol to perform bus master accesses
INCR-4 64-bit burst accesses
Multithreading architecture allowing data of two different channel transfers to be interleaved during nonburst accesses
2-port configuration for parallel bus master
Channels can be assigned to either high priority queue or low priority queue. Within each queue, fixed or round- robin priorities can be serviced
Built-in ECC generation and evaluation logic for internal RAM storing channel transfer information
Supports multiple interrupt outputs for mapping to multiple interrupt controllers in multicore systems
48 requests can be mapped to any 32 channels
Supports LE endianess
External ECC Gen/Eval block of DMA support ECC generation for data transactions, and parity for address, and control signals (following Cortex-R5F standard)
8 MPU regions
Channel chaining capability
Hardware and Software DMA requests
8-, 16-, 32-, or 64-bit transactions supported
Multiple addressing modes for source/destination (fixed, increment, offset)
Auto-initiation

6.17.2 DMA Transfer Port Assignment

There are two ports, port A and port B attached to the DMA controller. When configuring a DMA channel for a transfer, the application must also specify the port associated with the transfer source and destination. Table 6-40 lists the mapping between each port and the resources. For example, if a transfer is to be made from the the flash to the SRAM, the application will need configure the desired DMA channel in the PARx register to select port A as the target for both the source and destination. If a transfer is to be made from the SRAM to a peripheral or a peripheral memory, the application will need to configure the desired DMA channel in the PARx register to select port A for read and port B for write. Likewise, if a transfer is from a peripheral to the SRAM then the PARx will be configured to select port B for read and port A for write. Table 6-40. DMA Port Assignment TARGET NAME ACCESS PORT OF DMA Flash Port A SRAM Port A EMIF Port A Flash OTP/ECC/EEPROM Port A All other targets (peripherals, peripheral memories) Port B

PRODUCT□PREVIEW 123 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) SPI1, SPI2, SPI3, SPI4, SPI5 receive in compatibility mode (2) SPI1, SPI2, SPI3, SPI4, SPI5 transmit in compatibility mode

6.17.3 Default DMA Request Map

The DMA module on this microcontroller has 32 channels and up to 48 hardware DMA requests. The module contains DREQASIx registers which are used to map the DMA requests to the DMA channels. By default, channel 0 is mapped to request 0, channel 1 to request 1, and so on. Some DMA requests have multiple sources, see Table 6-41. The application must ensure that only one of these DMA request sources is enabled at any time. Table 6-41. DMA Request Line Connection MODULES DMA REQUEST SOURCES DMA REQUEST MIBSPI1 MIBSPI11 DMAREQ[0] MIBSPI1 MIBSPI10 DMAREQ[1] MIBSPI2 MIBSPI21 DMAREQ[2] MIBSPI2 MIBSPI20 DMAREQ[3] MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[2] / MIBSPI3[2] / DCAN2 IF3 DMAREQ[4] MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[3] / MIBSPI3[3] / DCAN2 IF2 DMAREQ[5] DCAN1 / MIBSPI5 DCAN1 IF2 / MIBSPI5[2] DMAREQ[6] MIBADC1 / MIBSPI5 MIBADC1 event / MIBSPI5[3] DMAREQ[7] MIBSPI1 / MIBSPI3 / DCAN1 MIBSPI1[4] / MIBSPI3[4] / DCAN1 IF1 DMAREQ[8] MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[5] / MIBSPI3[5] / DCAN2 IF1 DMAREQ[9] MIBADC1 / MIBSPI5 MIBADC1 G1 / MIBSPI5[4] DMAREQ[10] MIBADC1 / MIBSPI5 MIBADC1 G2 / MIBSPI5[5] DMAREQ[11] RTI1 / MIBSPI1 / MIBSPI3 RTI1 DMAREQ0 / MIBSPI1[6] / MIBSPI3[6] DMAREQ[12] RTI1 / MIBSPI1 / MIBSPI3 RTI1 DMAREQ1 / MIBSPI1[7] / MIBSPI3[7] DMAREQ[13] MIBSPI3 / MibADC2 / MIBSPI5 MIBSPI31 / MibADC2 event / MIBSPI5[6] DMAREQ[14] MIBSPI3 / MIBSPI5 MIBSPI30 / MIBSPI5[7] DMAREQ[15] MIBSPI1 / MIBSPI3 / DCAN1 / MibADC2 MIBSPI1[8] / MIBSPI3[8] / DCAN1 IF3 / MibADC2 G1 DMAREQ[16] MIBSPI1 / MIBSPI3 / DCAN3 / MibADC2 MIBSPI1[9] / MIBSPI3[9] / DCAN3 IF1 / MibADC2 G2 DMAREQ[17] RTI1 / MIBSPI5 RTI1 DMAREQ2 / MIBSPI5[8] DMAREQ[18] RTI1 / MIBSPI5 RTI1 DMAREQ3 / MIBSPI5[9] DMAREQ[19] NHET1 / NHET2 / DCAN3 NHET1 DMAREQ[4] / NHET2 DMAREQ[4] / DCAN3 IF2 DMAREQ[20] NHET1 / NHET2 / DCAN3 NHET1 DMAREQ[5] / NHET2 DMAREQ[5] / DCAN3 IF3 DMAREQ[21] MIBSPI1 / MIBSPI3 / MIBSPI5 MIBSPI1[10] / MIBSPI3[10] / MIBSPI5[10] DMAREQ[22] MIBSPI1 / MIBSPI3 / MIBSPI5 MIBSPI1[11] / MIBSPI3[11] / MIBSPI5[11] DMAREQ[23] NHET1 / NHET2 / MIBSPI5 NHET1 DMAREQ[6] / NHET2 DMAREQ[6] / MIBSPI5[12] DMAREQ[24] NHET1 / NHET2 / MIBSPI5 NHET1 DMAREQ[7] / NHET2 DMAREQ[7] / MIBSPI5[13] DMAREQ[25] CRC1 / MIBSPI1 / MIBSPI3 CRC1 DMAREQ[0] / MIBSPI1[12] / MIBSPI3[12] DMAREQ[26] CRC1 / MIBSPI1 / MIBSPI3 CRC1 DMAREQ[1] / MIBSPI1[13] / MIBSPI3[13] DMAREQ[27] LIN1 / MIBSPI5 LIN1 receive / MIBSPI5[14] DMAREQ[28] LIN1 / MIBSPI5 LIN1 transmit / MIBSPI5[15] DMAREQ[29] MIBSPI1 / MIBSPI3 / SCI3 / MIBSPI5 MIBSPI1[14] / MIBSPI3[14] / SCI3 receive / MIBSPI51 DMAREQ[30] MIBSPI1 / MIBSPI3 / SCI3 / MIBSPI5 MIBSPI1[15] / MIBSPI3[15] / SCI3 transmit / MIBSPI50 DMAREQ[31] I2C2 / ePWM1 / MIBSPI2 / MIBSPI4 / GIOA I2C2 receive / ePWM1_SOCA / MIBSPI2[2] / MIBSPI4[2] / GIOA[0] DMAREQ[32] I2C2 / ePWM 1 / MIBSPI2 / MIBSPI4 / GIOA I2C2 transmit / ePWM1_SOCB / MIBSPI2[3] / MIBSPI4[3] / GIOA[1] DMAREQ[33] ePWM2 / MIBSPI2 / MIBSPI4 / GIOA ePWM2_SOCA / MIBSPI2[4] / MIBSPI4[4] / GIOA[2] DMAREQ[34] ePWM2 / MIBSPI2 / MIBSPI4 / GIOA ePWM2_SOCB / MIBSPI2[5] / MIBSPI4[5] / GIOA[3] DMAREQ[35] ePWM3 / MIBSPI2 / MIBSPI4 / GIOA ePWM3_SOCA / MIBSPI2[6] / MIBSPI4[6] / GIOA[4] DMAREQ[36] ePWM3 / MIBSPI2 / MIBSPI4 / GIOA ePWM3_SOCB / MIBSPI2[7] / MIBSPI4[7] / GIOA[5] DMAREQ[37] CRC2 / ePWM4 / MIBSPI2 / MIBSPI4 / GIOA CRC2 DMAREQ[0] / ePWM4_SOCA / MIBSPI2[8] / MIBSPI4[8] / GIOA[6] DMAREQ[38] CRC2 / ePWM4 / MIBSPI2 / MIBSPI4 / GIOA CRC2 DMAREQ[1] / ePWM4_SOCB / MIBSPI2[9] / MIBSPI4[9] / GIOA[7] DMAREQ[39] LIN2 / ePWM5 / MIBSPI2 / MIBSPI4 / GIOB LIN2 receive / ePWM5_SOCA / MIBSPI2[10] / MIBSPI4[10] / GIOB[0] DMAREQ[40] LIN2 / ePWM5 / MIBSPI2 / MIBSPI4 / GIOB LIN2 transmit / ePWM5_SOCB / MIBSPI2[11] / MIBSPI4[11] / GIOB[1] DMAREQ[41]

PRODUCT□PREVIEW 124 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-41. DMA Request Line Connection (continued) MODULES DMA REQUEST SOURCES DMA REQUEST SCI4 / ePWM6 / MIBSPI2 / MIBSPI4 / GIOB SCI4 receive / ePWM6_SOCA / MIBSPI2[12] / MIBSPI4[12] / GIOB[2] DMAREQ[42] SCI4 / ePWM6 / MIBSPI2 / MIBSPI4 / GIOB SCI4 transmit / ePWM6_SOCB / MIBSPI2[13] / MIBSPI4[13] / GIOB[3] DMAREQ[43] ePWM7 / MIBSPI2 / MIBSPI4 / GIOB ePWM7_SOCA / MIBSPI2[14] / MIBSPI4[14] / GIOB[4] DMAREQ[44] ePWM7 / MIBSPI2 / MIBSPI4 / GIOB / DCAN4 ePWM7_SOCB / MIBSPI2[15] / MIBSPI4[15] / GIOB[5] / DCAN4 IF1 DMAREQ[45] GIOB / DCAN4 GIOB[6] / DCAN4_IF2 DMAREQ[46] GIOB / DCAN4 GIOB[7] / DCAN4_IF3 DMAREQ[47]

PRODUCT□PREVIEW GIOA[0] I2C2 receive EPWM1_SOCA MIBSPI2[2] MIBSPI4[2] DMAREQ[32] DMA PINMMR175[0] DMAREQ[47] 125 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.17.4 Using a GIO terminal as a DMA Request Input

Each GIO terminal can also directly be used as DMA request input as listed in Table 6-41. The polarity of the GIO terminal to trigger a DMA request can be selected inside the DMA module. To use the GIO terminal as a DMA request input, the corresponding select bit must be set to low. See Figure 6-19 for an illustration. For more information see the technical reference guide SPNU562. Figure 6-19. Using a GIO terminal as a DMA Request Input Table 6-42. GIO DMA Request Disable Mapping GIO TERMINAL GIO DMA REQUEST SELECT BIT GIOA[0] PINMMR175[0] GIOA[1] PINMMR175[8] GIOA[2] PINMMR175[16] GIOA[3] PINMMR175[24] GIOA[4] PINMMR176[0] GIOA[5] PINMMR176[8] GIOA[6] PINMMR176[16] GIOA[7] PINMMR176[24] GIOB[0] PINMMR177[0] GIOB[1] PINMMR177[8] GIOB[2] PINMMR177[16] GIOB[3] PINMMR177[24] GIOB[4] PINMMR178[0] GIOB[5] PINMMR178[8] GIOB[6] PINMMR178[16] GIOB[7] PINMMR178[24]

PRODUCT□PREVIEW RTICLK External control CAP event□source□0 CAP event□source□1 =Up□counter Capture up□counter Compare up□counter Free□running□counter Capture RTIFRCx free□running□counter RTICAFRCx OVLINTxRTICPUCx RTIUCx RTICAUCx To□Compare UnitNTU0 NTU1 NTU2 NTU3 126 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.18 Real-Time Interrupt Module

The real-time interrupt (RTI) module provides timer functionality for operating systems and for benchmarking code. The RTI module can incorporate several counters that define the timebases needed for scheduling an operating system. The timers also allow you to benchmark certain areas of code by reading the values of the counters at the beginning and the end of the desired code range and calculating the difference between the values.

6.18.1 Features

The RTI module has the following features:

Two independent 64 bit counter blocks
Four configurable compares for generating operating system ticks or DMA requests. Each event can be driven by either counter block 0 or counter block 1.
Fast enabling/disabling of events
Two time-stamp (capture) functions for system or peripheral interrupts, one for each counter block

6.18.2 Block Diagrams

Figure 6-20 shows a high-level block diagram for one of the two 64-bit counter blocks inside the RTI module. Both the counter blocks are identical except the Network Time Unit (NTUx) inputs are only available as time base inputs for the counter block 0. Figure 6-20. Counter Block Diagram

PRODUCT□PREVIEW 31 0 Compare control INTy DMAREQyCompare Update compare From counter block 0 From counter block 1 RTIUDCPy RTICOMPy 31 0 127 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Figure 6-21. Compare Block Diagram

6.18.3 Clock Source Options

The RTI module uses the RTI1CLK clock domain for generating the RTI time bases. The application can select the clock source for the RTI1CLK by configuring the RCLKSRC register in the System module at address 0xFFFFFF50. The default source for RTI1CLK is VCLK. For more information on clock sources see Table 6-11 and Table 6-16.

6.18.4 Network Time Synchronization Inputs

The RTI module supports 4 Network Time Unit (NTU) inputs that signal internal system events, and which can be used to synchronize the time base used by the RTI module. On this device, these NTU inputs are connected as shown below. Table 6-43. Network Time Synchronization Inputs NTU INPUT SOURCE

0 Reserved

1 Reserved

2 PLL2 Clock output

3 EXTCLKIN1 clock input

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6.19 Error Signaling Module

The Error Signaling Module (ESM) manages the various error conditions on the TMS570LCx microcontroller. The error condition is handled based on a fixed severity level assigned to it. Any severe error condition can be configured to drive a low level on a dedicated device terminal called nERROR. This can be used as an indicator to an external monitor circuit to put the system into a safe state.

6.19.1 Features

The features of the Error Signaling Module are:

160 interrupt/error channels are supported, divided into 3 different groups – 96 channels with maskable interrupt and configurable error terminal behavior – 32 error channels with nonmaskable interrupt and predefined error terminal behavior – 32 channels with predefined error terminal behavior only
Error terminal to signal severe device failure
Configurable timebase for error signal
Error forcing capability

6.19.2 ESM Channel Assignments

The Error Signaling Module (ESM) integrates all the device error conditions and groups them in the order of severity. Group1 is used for errors of the lowest severity while Group3 is used for errors of the highest severity. The device response to each error is determined by the severity group to which the error is connected. Table 6-45 lists the channel assignment for each group. Table 6-44. ESM Groups ERROR GROUP INTERRUPT CHARACTERISTICS INFLUENCE ON ERROR TERMINAL Group1 maskable, low or high priority configurable Group2 nonmaskable, high priority fixed Group3 no interrupt generated fixed Table 6-45. ESM Channel Assignments ESM ERROR SOURCES GROUP CHANNELS Group1 Reserved Group1 0 MibADC2 - parity Group1 1 DMA - MPU error for CPU (DMAOCP_MPVINT(0)) Group1 2 DMA - ECC uncorrectable error Group1 3 EPC - Correctable Error Group1 4 Reserved Group1 5 L2FMC - correctable error (implicit OTP read). Group1 6 NHET1 - parity Group1 7 HET TU1/HET TU2 - parity Group1 8 HET TU1/HET TU2 - MPU Group1 9 PLL1 - slip Group1 10 LPO Clock Monitor - interrupt Group1 11 Reserved Group1 12 Reserved Group1 13 Reserved Group1 14

PRODUCT□PREVIEW 129 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-45. ESM Channel Assignments (continued) ESM ERROR SOURCES GROUP CHANNELS VIM RAM - ECC uncorrectable error Group1 15 Reserved Group1 16 MibSPI1 - ECC uncorrectable error Group1 17 MibSPI3 - ECC uncorrectable error Group1 18 MibADC1 - parity Group1 19 DMA - Bus Error Group1 20 DCAN1 - ECC uncorrectable error Group1 21 DCAN3 - ECC uncorrectable error Group1 22 DCAN2 - ECC uncorrectable error Group1 23 MibSPI5 - ECC uncorrectable error Group1 24 Reserved Group1 25 L2RAMW - correctable error Group1 26 Cortex-R5F CPU - self-test Group1 27 Reserved Group1 28 Reserved Group1 29 DCC1 - error Group1 30 CCM-R5F - self-test Group1 31 Reserved Group1 32 Reserved Group1 33 NHET2 - parity Group1 34 Reserved Group1 35 Reserved Group1 36 IOMM - Mux configuration error Group1 37 Power domain compare error Group1 38 Power domain self-test error Group1 39 eFuse farm – EFC error Group1 40 eFuse farm - self-test error Group1 41 PLL2 - slip Group1 42 Ethernet Controller master interface Group1 43 Reserved Group1 44 Reserved Group1 45 Cortex-R5F Core - cache correctable error event Group1 46 ACP d-cache invalidate Group1 47 Reserved Group1 48 MibSPI2 - ECC uncorrectable error Group1 49 MibSPI4 - ECC uncorrectable error Group1 50 DCAN4 - ECC uncorrectable error Group1 51 CPU Interconnect Subsystem - Global error Group1 52 CPU Interconnect Subsystem - Global Parity Error Group1 53 NHET1/2 - self-test error Group1 54 NMPU - EMAC MPU Error Group1 55 Reserved Group1 56 Reserved Group1 57 Reserved Group1 58 Reserved Group1 59 Reserved Group1 60 NMPU - PS_SCR_S MPU Error Group1 61

PRODUCT□PREVIEW 130 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-45. ESM Channel Assignments (continued) ESM ERROR SOURCES GROUP CHANNELS DCC2 - error Group1 62 Reserved Group1 63 Reserved Group1 64 Reserved Group1 65 Reserved Group1 66 Reserved Group1 67 Reserved Group1 68 NMPU - DMA Port A MPU Error Group1 69 DMA - Transaction Bus Parity Error Group1 70 Reserved Group1 71 Reserved Group1 72 DCAN1 - ECC single bit error Group1 73 DCAN2 - ECC single bit error Group1 74 DCAN3 - ECC single bit error Group1 75 DCAN4 - ECC single bit error Group1 76 MIBSPI1 - ECC single bit error Group1 77 MIBSPI2 - ECC single bit error Group1 78 MIBSPI3 - ECC single bit error Group1 79 MIBSPI4 - ECC single bit error Group1 80 MIBSPI5 - ECC single bit error Group1 81 DMA - ECC single bit error Group1 82 VIM - ECC single bit error Group1 83 EMIF 64-bit Bridge I/F ECC uncorrectable error Group1 84 EMIF 64-bit Bridge I/F ECC single bit error Group1 85 Reserved Group1 86 Reserved Group1 87 DMA - Register Soft Error Group1 88 L2FMC - Register Soft Error Group1 89 SYS - Register Soft Error Group1 90 SCM - Time-out Error Group1 91 CCM-R5F - Operating status Group1 92 Reserved Group1 93-95 Group2 Reserved Group2 0 Reserved Group2 1 CCM-R5F - CPU compare error Group2 2 Cortex-R5F Core - All fatal bus error events Group2 3Event Reference Event Description EVNTBUSm bit 0x71 Bus ECC 48 Reserved Group2 4 Reserved Group2 5 Reserved Group2 6 L2RAMW - Uncorrectable error type B Group2 7 Reserved Group2 8 Reserved Group2 9 Reserved Group2 10 Reserved Group2 11

PRODUCT□PREVIEW 131 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-45. ESM Channel Assignments (continued) ESM ERROR SOURCES GROUP CHANNELS Reserved Group2 12 Reserved Group2 13 Reserved Group2 14 Reserved Group2 15 Reserved Group2 16 L2FMC - parity error

Mcmd parity error on Idle command
POM idle state parity error
Port A/B Idle state parity error Group2 17 Reserved Group2 18 L2FMC - double bit ECC error-error due to implicit OTP reads Group2 19 Reserved Group2 20 EPC - Uncorrectable Error Group2 21 Reserved Group2 22 Reserved Group2 23 RTI_WWD_NMI Group2 24 CCM-R5F VIM compare error Group2 25 CPU1 AXIM Bus Monitor failure Group2 26 Reserved Group2 27 CCM-R5F - Power Domain monitor error Group2 28 Reserved Group2 29 Reserved Group2 30 Reserved Group2 31 Group3 Reserved Group3 0 eFuse Farm - autoload error Group3 1 Reserved Group3 2 L2RAMW - double bit ECC uncorrectable error Group3 3 Reserved Group3 4 Reserved Group3 5 Reserved Group3 6 Reserved Group3 7 Reserved Group3 8 Cortex-R5F Core - All fatal events (OR of: Group3 9 Event Reference Value Event Description EVNTBUSm Bit 0x60 Data Cache 33 0x61 Data Cache tag/dirty 34 Reserved Group3 10 Reserved Group3 11 CPU Interconnect Subsystem - Diagnostic Error Group3 12 L2FMC - uncorrectable error due to:
address parity/internal parity error
address tag
internal switch time-out Group3 13 L2RAMW - Uncorrectable error Type A Group3 14 L2RAMW - Address/Control parity error Group3 15 Reserved Group3 16

PRODUCT□PREVIEW 132 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-45. ESM Channel Assignments (continued) ESM ERROR SOURCES GROUP CHANNELS Reserved Group3 17 Reserved Group3 18 Reserved Group3 19 Reserved Group3 20 Reserved Group3 21 Reserved Group3 22 Reserved Group3 23 Reserved Group3 24

PRODUCT□PREVIEW 133 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) The Undefined Instruction TRAP is NOT detectable outside the CPU. The trap is taken only if the instruction reaches the execute stage of the CPU.

6.20 Reset / Abort / Error Sources

Table 6-46. Reset/Abort/Error Sources ERROR SOURCE SYSTEM MODE ERROR RESPONSE ESM HOOKUP group.channel CPU TRANSACTIONS Precise write error (NCNB/Strongly Ordered) User/Privilege Precise Abort (CPU) n/a Precise read error (NCB/Device or Normal) User/Privilege Precise Abort (CPU) n/a Imprecise write error (NCB/Device or Normal) User/Privilege Imprecise Abort (CPU) n/a Illegal instruction User/Privilege Undefined Instruction Trap (CPU)(1) n/a MPU access violation User/Privilege Abort (CPU) n/a Correctable error User/Privilege ESM 1.4 Uncorrectable error User/Privilege ESM => NMI 2.21 LEVEL 2 SRAM CPU Write ECC single error (correctable) User/Privilege ESM 1.26 ECC double bit error: Read-Modify-Write (RMW) ECC double error CPU Write ECC double error User/Privilege Bus Error, ESM => nERROR 3.3 Uncorrectable error Type A: Write SECDED malfunction error Redundant address decode error Read SECDED malfunction error User/Privilege Bus Error, ESM => nERROR 3.14 Uncorrectable error type B: Memory scrubbing SECDED malfunction error Memory scrubbing Redundant address decode error Memory scrubbing adress/control parity error Write data merged mux diagnostic error Write SECDED malfunction diagnostic error Read SECDED malfunction diagnostic error Write ECC correctable and uncorrectable diagnostic error Read ECC correctable and uncorrectable diagnostic error Write data merged mux error Redundant address decode diagnostic error Command parity error on idle User/Privilege ESM => NMI 2.7 Address/Control parity error User/Privilege Bus Error, ESM => nERROR 3.15 Level 2 RAM illegal address error Memory initialization error User/Privilege Bus Error n/a FLASH L2FMC correctable error - single bit ECC error for implicit OTP read User/Privilege ESM 1.6 L2FMC uncorrectable error - double bit ECC error for implicit OTP read User/Privilege ESM => NMI 2.19 L2FMC fatal uncorrectable error: address parity error/internal parity error address tag error Internal switch time-out User/Privilege Bus Error, ESM => nERROR 3.13 L2FMC parity error: Mcmd parity error on Idle command POM idle state parity error Port A/B Idle state parity error User/Privilege ESM => NMI 2.17 L2FMC nonfatal uncorrectable error: Response error on POM Response parity error on POM Bank accesses during special operation (program/erase) by the FSM Bank/Pump in sleep Unimplemented special/unavailable space User/Privilege Bus Error n/a L2FMC register soft error. User/Privilege ESM 1.89

PRODUCT□PREVIEW 134 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-46. Reset/Abort/Error Sources (continued) ERROR SOURCE SYSTEM MODE ERROR RESPONSE ESM HOOKUP group.channel DMA TRANSACTIONS Memory access permission violation User/Privilege ESM 1.2 Memory ECC uncorrectable error User/Privilege ESM 1.3 Transaction Error: that is, Bus Parity Error User/Privilege ESM 1.70 Memory ECC single bit error User/Privilege ESM 1.82 DMA register soft error User/Privilege ESM 1.88 DMA bus error User/Privilege ESM 1.20 EMIF_ECC 64-bit Bridge I/F ECC uncorrectable error User/Privilege ESM 1.84 64-bit Bridge I/F ECC single error User/Privilege ESM 1.85 HET TU1 (HTU1) NCNB (Strongly Ordered) transaction with slave error response User/Privilege Interrupt => VIM n/a External imprecise error (Illegal transaction with ok response) User/Privilege Interrupt => VIM n/a Memory access permission violation User/Privilege ESM 1.9 Memory parity error User/Privilege ESM 1.8 HET TU2 (HTU2) NCNB (Strongly Ordered) transaction with slave error response User/Privilege Interrupt => VIM n/a External imprecise error (Illegal transaction with ok response) User/Privilege Interrupt => VIM n/a Memory access permission violation User/Privilege ESM 1.9 Memory parity error User/Privilege ESM 1.8 N2HET1 Memory parity error User/Privilege ESM 1.7 N2HET2 Memory parity error User/Privilege ESM 1.34 MibSPI MibSPI1 memory ECC uncorrectable error User/Privilege ESM 1.17 MibSPI2 memory ECC uncorrectable error User/Privilege ESM 1.49 MibSPI3 memory ECC uncorrectable error User/Privilege ESM 1.18 MibSPI4 memory ECC uncorrectable error User/Privilege ESM 1.50 MibSPI5 memory ECC uncorrectable error User/Privilege ESM 1.24 MibSPI1 memory ECC single error User/Privilege ESM 1.77 MibSPI2 memory ECC single error User/Privilege ESM 1.78 MibSPI3 memory ECC single error User/Privilege ESM 1.79 MibSPI4 memory ECC single error User/Privilege ESM 1.80 MibSPI5 memory ECC single error User/Privilege ESM 1.81 MibADC MibADC1 Memory parity error User/Privilege ESM 1.19 MibADC2 Memory parity error User/Privilege ESM 1.1 DCAN DCAN1 memory ECC uncorrectable error User/Privilege ESM 1.21 DCAN2 memory ECC uncorrectable error User/Privilege ESM 1.23 DCAN3 memory ECC uncorrectable error User/Privilege ESM 1.22 DCAN4 memory ECC uncorrectable error User/Privilege ESM 1.51 DCAN1 memory ECC single error User/Privilege ESM 1.73 DCAN2 memory ECC single error User/Privilege ESM 1.74 DCAN3 memory ECC single error User/Privilege ESM 1.75

PRODUCT□PREVIEW 135 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-46. Reset/Abort/Error Sources (continued) ERROR SOURCE SYSTEM MODE ERROR RESPONSE ESM HOOKUP group.channel (2) Oscillator fail/PLL slip can be configured in the system register (SYS.PLLCTL1) to generate a reset. DCAN4 memory ECC single error User/Privilege ESM 1.76 PLL PLL1 slip error User/Privilege ESM 1.10 PLL2 slip error User/Privilege ESM 1.42 Clock Monitor Clock monitor interrupt User/Privilege ESM 1.11 DCC DCC1 error User/Privilege ESM 1.30 DCC2 error User/Privilege ESM 1.62 CCM-R5F Self-test failure User/Privilege ESM 1.31 CPU Bus Compare failure User/Privilege ESM => NMI 2.2 VIM Bus Compare failure User/Privilege ESM => NMI 2.25 Power Domain Monitor failure User/Privilege ESM => NMI 2.28 CCM-R5F operating status (asserted when not in lockstep or CCM-R5F is in self-test mode) User/Privilege ESM 1.92 EPC (Error Profiling Controller) Correctable Error User/Privilege ESM 1.4 Uncorrectable Error User/Privilege ESM => NMI 2.21 SCM (SCR Control module) Time-out Error User/Privilege ESM 1.91 Ethernet master interface Any error reported by slave being accessed User/Privilege ESM 1.43 VIM Memory ECC uncorrectable error User/Privilege ESM 1.15 Memory ECC single bit error User/Privilege ESM 1.83 Voltage Monitor VMON out of voltage range n/a Reset n/a Self-Test (LBIST) Cortex-R5F CPU self-test (LBIST) error User/Privilege ESM 1.27 NHET Self-test (LBIST) error User/Privilege ESM 1.54 IOMM (terminal multiplexing control) Mux configuration error User/Privilege ESM 1.37 Power Domain Control Power Domain control access privilege error User Imprecise Abort (CPU) n/a PSCON compare error User/Privilege ESM 1.38 PSCON self-test error User/Privilege ESM 1.39 Efuse farm eFuse farm autoload error User/Privilege ESM 3.1 eFuse farm error User/Privilege ESM 1.40 eFuse farm self-test error User/Privilege ESM 1.41 WIndowed Watchdog WWD Nonmaskable Interrupt Exception n/a ESM 2.24 Errors Reflected in the SYSESR Register Power-Up Reset n/a Reset n/a Oscillator fail / PLL slip(2) n/a Reset n/a

PRODUCT□PREVIEW 136 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-46. Reset/Abort/Error Sources (continued) ERROR SOURCE SYSTEM MODE ERROR RESPONSE ESM HOOKUP group.channel Watchdog exception n/a Reset n/a CPUx Reset n/a Reset n/a Software Reset n/a Reset n/a External Reset n/a Reset n/a Register Soft Error User/Privilege ESM 1.90 CPU Interconnect Subsystem Diagnostic error User/Privilege ESM => Error terminal 3.12 Global error User/Privilege ESM 1.52 Global Parity error User/Privilege ESM 1.53 NMPU for EMAC MPU Access violation error User/Privilege ESM 1.55 NMPU for PS_SCR_S MPU Access violation error User/Privilege ESM 1.61 NMPU for DMA Port A MPU Access violation error User/Privilege ESM 1.69 PCR1 MasterID filtering MPU Access violation error User/Privilege Bus Error n/a PCR2 MasterID filtering MPU Access violation error User/Privilege Bus Error n/a PCR3 MasterID filtering MPU Access violation error User/Privilege Bus Error n/a

PRODUCT□PREVIEW RESET Down Counter Down CounterDown Counter DWWD PreloadDWWD Preload Digital Windowed Watch Dog Digital Windowed Watch Dog 100% Window Window OpenWindow Open Window Open Window Open 50% Window 25% Window 12.5% Window 6.25% Window 3.125% Window INTERRUPT ESM Digital Windowed Watch Dog Window Open Window Open Window Open Window Open W Open W Open Op Op O O O O 137 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.21 Digital Windowed Watchdog

This device includes a digital windowed watchdog (DWWD) module that protects against runaway code execution. The DWWD module allows the application to configure the time window within which the DWWD module expects the application to service the watchdog. A watchdog violation occurs if the application services the watchdog outside of this window, or fails to service the watchdog at all. The application can choose to generate a system reset or a nonmaskable interrupt to the CPU in case of a watchdog violation. The watchdog is disabled by default and must be enabled by the application. Once enabled, the watchdog can only be disabled upon a system reset. Figure 6-22. Digital Windowed Watchdog Example

PRODUCT□PREVIEW TRST TMS TCK TDI TDO RTCK ICEPICK_C Boundary Scan BSR/BSDL Boundary Scan I/F Debug Tap 0 DAP Debug APB APB Mux AHB-AP POM Test Tap 0 eFuse Farm Debug Tap 2 AJSM Test Tap 1 PSCON R5F CPU R5F ETM Debug ROM CTI1 CTI3 CTI4 CTM1 CTM2 CSTF TPIU PS_SCR OCP2_ BVUSP VBUSP2 APBv3 PCR3 Debug Tap 1 RTP DMM 138 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.22 Debug Subsystem

6.22.1 Block Diagram

The device contains an ICEPICK module to allow JTAG access to the scan chains. Figure 6-23. Debug Subsystem Block Diagram

PRODUCT□PREVIEW CTI1 Reserved CTI3 CTI4 CTM1 CTM2 ch0 ch1 ch2 ch3 ch0 ch1 ch2 ch3 tieoff tieoff 139 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.22.2 Debug Components Memory Map

Table 6-47. Debug Components Memory Map MODULE NAME FRAME CHIP SELECT FRAME ADDRESS RANGE FRAME SIZE ACTUAL SIZE RESPONSE FOR ACCESS TO UNIMPLEMENTED LOCATIONS IN FRAMESTART END CoreSight Debug ROM CSCS0 0xFFA0_0000 0xFFA0_0FFF 4KB 4KB Reads return zeros, writes have no effect Cortex-R5F Debug CSCS1 0xFFA0_1000 0xFFA0_1FFF 4KB 4KB Reads return zeros, writes have no effect ETM-R5 CSCS2 0xFFA0_2000 0xFFA0_2FFF 4KB 4KB Reads return zeros, writes have no effect CoreSight TPIU CSCS3 0xFFA0_3000 0xFFA0_3FFF 4KB 4KB Reads return zeros, writes have no effect POM CSCS4 0xFFA0_4000 0xFFA0_4FFF 4KB 4KB Reads return zeros, writes have no effect CTI1 CSCS7 0xFFA0_7000 0xFFA0_7FFF 4KB 4KB Reads return zeros, writes have no effect CTI3 CSCS9 0xFFA0_9000 0xFFA0_9FFF 4KB 4KB Reads return zeros, writes have no effect CTI4 CSCS10 0xFFA0_A000 0xFFA0_AFFF 4KB 4KB Reads return zeros, writes have no effect CSTF CSCS11 0xFFA0_B000 0xFFA0_BFFF 4KB 4KB Reads return zeros, writes have no effect

6.22.3 Embedded Cross Trigger

The Embedded Cross Trigger (ECT) is a modular component that supports the interaction and synchronization of multiple triggering events within a SoC. The ECT consists of two modules:

A (Cross Trigger Interface) CTI. The CTI provides the interface between a component or subsystem and the Cross Trigger Matrix (CTM).
A CTM. The CTM combines the trigger requests generated from CTIs and broadcasts them to all CTIs as channel triggers. This enables subsystems to interact, cross trigger, with one another. Figure 6-24. CTI/CTM Integration

PRODUCT□PREVIEW ETM-R5 EXTOUT[1:0] TRIGSBYP ASS TRIGGER TRIGGERACK EXTIN[1:0] ETMDBGRQ EDBGRQ DBTRIGGER DBGREST ART DBGREST ARTED COMMRX COMMTX nPMUIRQ nIRQ R5F CTI1 CTITRIGIN[3:2] CTITRIGIN[6] CTITRIGINACK[6] CTITRIGOUT[2:1] TIHSBYP ASS[2:1] CTITRIGOUT ACK[2:1] CTITRIOUT[0] CTITRIGIN[0] TIHSBYP ASS[7] CTITRIGOUT[7] CTITRIGOUT ACK[7] CTITRIGIN[4] CTITRIGIN[5] CTITRIGIN[1] CTITRIGOUT]3] TIHSBYP ASS[3] CTITRIGOUT ACK[3] nIRQ from VIM CTITRIGOUT ACK[0] TIHSBYP ASS[0]0 CTITRIGINACK[0] GCLK1 GCLK1 CTITRIGIN[7] 140 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Figure 6-25. CTI1 Mapping NOTE ETM-R5, Cortex-R5F and CTI1 run at same frequency. Table 6-48. CTI1 Mapping CTI TRIGGER Module Signal Trigger Input 0 From Cortex-R5F DBTRIGGER Trigger Input 1 From Cortex-R5F nPMUIRQ Trigger Input 2 From ETM-R5 EXTOUT[0] Trigger Input 3 From ETM-R5 EXTOUT[1] Trigger Input 4 From Cortex-R5F COMMRX

PRODUCT□PREVIEW CTI3 TIHSBYP ASS[7:2] CTITRIGOUT ACK[7:2] CTITRIGOUT[1]FLUSHIN CTITRIGOUT[0]TRIGIN TPIU CTITRIGOUT ACK[1]FLUSHINACK CTITRIGOUT ACK[0]TRIGINACK 141 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-48. CTI1 Mapping (continued) CTI TRIGGER Module Signal Trigger Input 5 From Cortex-R5F COMMTX Trigger Input 6 From ETM-R5 TRIGGER Trigger Input 7 From Cortex-R5F DBTRIGGER Trigger Output 0 To Cortex-R5F EDBGRQ Trigger Output 1 To ETM-R5 EXTIN[0] Trigger Output 2 To ETM-R5 EXTIN[1] Trigger Output 3 To Cortex-R5F nIRQ Trigger Output 4 Reserved Trigger Output 5 Reserved Trigger Output 6 Reserved Trigger Output 7 To Cortex-R5F DBGRESTARTED Figure 6-26. CTI3 Mapping NOTE TPIU and CTI3 run at different frequencies. Table 6-49. CTI3 Mapping CTI TRIGGER Module Signal Trigger Input 0 Reserved Trigger Input 1 Reserved Trigger Input 2 Reserved Trigger Input 3 Reserved Trigger Input 4 Reserved Trigger Input 5 Reserved Trigger Input 6 Reserved Trigger Input 7 Reserved Trigger Output 0 To TPIU TRIGIN Trigger Output 1 To TPIU FLUSHIN Trigger Output 2 Reserved Trigger Output 3 Reserved Trigger Output 4 Reserved Trigger Output 5 Reserved

PRODUCT□PREVIEW CTI4 CTITRIGIN[1] CTITRIGOUT[1] CTITRIGOUT[0] CTITRIGOUTACK[7:4]0 CTITRIGIN[0] CTITRIGIN[3] CTITRIGIN[2] CTITRIGIN[4] DMA_DBGREQ NHET1_DBGREQ NHET2_DBGREQ HTU1_DBGREQ HTU2_DBGREQ CTITRIGOUT[2] SYS_MODULE_TRIGGER USER_PERIPHERAL_TRIGGER1 USER_PERIPHERAL_TRIGGER2 Sync_Input Sync_Input Sync_Input CTITRIGOUTACK[1] CTITRIGOUTACK[0] CTITRIGOUTACK[2] CTITRIGOUT[3]USER_PERIPHERAL_TRIGGER3 Sync_Input CTITRIGOUTACK[3] Sync_OutputPulse□Creator Sync_OutputPulse□Creator Sync_OutputPulse□Creator Sync_OutputPulse□Creator Sync_OutputPulse□Creator CTITRIGINACK[0] CTITRIGINACK[1] CTITRIGINACK[2] CTITRIGINACK[3] CTITRIGINACK[4] CTITRIGIN[5] CTITRIGIN[6] CTITRIGIN[7] CTITRIGOUT[4]IcePick□Debug_Attention Sync_Input CTITRIGOUTACK[4] 142 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 6-49. CTI3 Mapping (continued) CTI TRIGGER Module Signal Trigger Output 6 Reserved Trigger Output 7 Reserved Figure 6-27. CTI4 Mapping Table 6-50. CTI4 Mapping CTI TRIGGER Module Signal Trigger Input 0 From DMA_DBGREQ Trigger Input 1 From N2HET1_DBGREQ Trigger Input 2 From N2HET2_DBGREQ Trigger Input 3 From HTU1_DBGREQ Trigger Input 4 From HTU2_DBGREQ Trigger Input 5 From DMA_DBGREQ Trigger Input 6 From N2HET1_DBGREQ or HTU1_DBGREQ Trigger Input 7 From N2HET2_DBGREQ or HTU2_DBGREQ Trigger Output 0 To SYS_MODULE_TRIGGER Trigger Output 1 To USER_PERIPHERAL_TRIGGER1 Trigger Output 2 To USER_PERIPHERAL_TRIGGER2 Trigger Output 3 To USER_PERIPHERAL_TRIGGER3

PRODUCT□PREVIEW 143 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 6-50. CTI4 Mapping (continued) CTI TRIGGER Module Signal Trigger Output 4 To IcePick Debug_Attention Trigger Output 5 Reserved Trigger Output 6 Reserved Trigger Output 7 Reserved Table 6-51. Peripheral Suspend Generation TRIGGER OUTPUT MODULE SIGNAL CONNECTED DESCRIPTION SYS_MODULE_TRIGGER L2FMC_CPU_EMUSUSP L2FMC Wrapper Suspend CCM_R5_CPU_EMUSUSP CCM_R5 module suspend CRC_CPU_EMUSUSP CRC1 / CRC2 module suspend SYS_CPU_EMUSUSP SYS module Suspend USER_PERIPHERAL_TRIGGER1 DMA_SUSPEND DMA Suspend RTI_CPU_SUSPEND RTI1 / RTI2 Suspend AWM_CPU_SUSPEND AWM1 / AWM2 Suspend HTU_CPU_EMUSUSP HTU1 / HTU2 Suspend SCI_CPU_EMUSUSP SCI3 / SCI4 Suspend LIN_CPU_EMUSUSP LIN1 / LIN2 Suspend I2C_CPU_EMUSUSP I2C1 / I2C2 Suspend EMAC_CPU_EMUSUSP EMAC Suspend EQEP_CPU_EMUSUSP EQEP Suspend ECAP_CPU_EMUSUSP ECAP Suspend DMM_CPU_EMUSUSP DMM Suspend DCC_CPU_EMUSUSP DCC1 / DCC2 Suspend USER_PERIPHERAL_TRIGGER2 DCAN_CPU_EMUSUSP DCAN1 / DCAN2 / DCAN3 / DCAN4 Suspend USER_PERIPHERAL_TRIGGER3 ePWM_CPU_EMUSUSP ePWM1..7 Trip Zone TZ6n and ePWM1..7 Suspend

6.22.4 JTAG Identification Code

The JTAG ID code for this device is the same as the device ICEPick Identification Code.

Silicon revision A -- 0x0B95A02F
Silicon revision B -- 0x1B95A02F

6.22.5 Debug ROM

The Debug ROM stores the location of the components on the Debug APB bus (see Table 6-52). Table 6-52. Debug ROM Table ADDRESS DESCRIPTION VALUE 0x000 Cortex-R5F 0x00001003 0x004 ETM-R5 0x00002003 0x008 TPIU 0x00003003 0x00C POM 0x00004003 0x018 CTI1 0x00007003 0x020 CTI3 0x00009003 0x024 CTI4 0x0000A003 0x028 CSTF 0x0000B003 0x02C end of table 0x00000000

PRODUCT□PREVIEW 1 1 TMS TDI TDO RTCK TCK 144 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) Timings for TDO are specified for a maximum of 50-pF load on TDO.

6.22.6 JTAG Scan Interface Timings

Table 6-53. JTAG Scan Interface Timing(1) NO. PARAMETER MIN MAX UNIT fTCK TCK frequency (at HCLKmax) 12 MHz fRTCK RTCK frequency (at TCKmax and HCLKmax) 10 MHz 1 td(TCK -RTCK) Delay time, TCK to RTCK 24 ns 2 tsu(TDI/TMS - RTCKr) Setup time, TDI, TMS before RTCK rise (RTCKr) 26 ns 3 th(RTCKr -TDI/TMS) Hold time, TDI, TMS after RTCKr 0 ns 4 th(RTCKr -TDO) Hold time, TDO after RTCKf 0 ns 5 td(TCKf -TDO) Delay time, TDO valid after RTCK fall (RTCKf) 12 ns Figure 6-28. JTAG Timing

PRODUCT□PREVIEW H L H L H L L H .□.□. .□.□. 128-bit□comparator H L L H H L L H UNLOCK Flash□Module□Output OTP Contents Unlock□By□Scan Register Internal□Tie-Offs (example□only) (example) L H H L LInternal□Tie-Offs (example□only) L H H 145 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

6.22.7 Advanced JTAG Security Module

This device includes a an Advanced JTAG Security Module (AJSM) module. The AJSM provides maximum security to the memory content of the device by letting users secure the device after programming. Figure 6-29. AJSM Unlock The device is unsecure by default by virtue of a 128-bit visible unlock code programmed in the OTP address 0xF0000000. The OTP contents are XOR-ed with the contents of the "Unlock By Scan" register. The outputs of these XOR gates are again combined with a set of secret internal tie-offs. The output of this combinational logic is compared against a secret hard-wired 128-bit value. A match results in the UNLOCK signal being asserted, so that the device is now unsecure. A user can secure the device by changing at least 1 bit in the visible unlock code from 1 to 0. Changing a 0 to 1 is not possible because the visible unlock code is stored in the One Time Programmable (OTP) flash region. Also, changing all 128 bits to zeros is not a valid condition and will permanently secure the device. Once secured, a user can unsecure the device by scanning an appropriate value into the "Unlock By Scan" register of the AJSM. The value to be scanned is such that the XOR of the OTP contents and the Unlock-By-Scan register contents results in the original visible unlock code. The Unlock-By-Scan register is reset only upon asserting power-on reset (nPORRST). A secure device only permits JTAG accesses to the AJSM scan chain through the Secondary Tap 2 of the ICEPick module. All other secondary taps, test taps, and the boundary scan interface are not accessible in this state.

PRODUCT□PREVIEW tr(ETM) th(ETM) tl(ETM) tf(ETM) tcyc(ETM) 146 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.22.8 Embedded Trace Macrocell (ETM-R5)

The device contains a ETM-R5 module with a 32-bit internal data port. The ETM-R5 module is connected to a TPIU with a 32-bit data bus; the TPIU provides a 35-bit (32-bit data, 3-bit control) external interface for trace. The ETM-R5 is CoreSight compliant and follows the ETM v3 specification; for more details see ARM CoreSight ETM-R5 TRM specification.

6.22.8.1 ETM TRACECLKIN Selection

The ETM clock source can be selected as either VCLK or the external ETMTRACECLKIN terminal. The selection is done by the EXTCTLOUT[1:0] control bits of the TPIU; the default is '00'. The address of this register is TPIU base address + 0x404. Before you begin accessing TPIU registers, TPIU should be unlocked through CoreSight key and 1 or 2 should be written to this register. Table 6-54. TPIU / TRACECLKIN Selection EXTCTLOUT[1:0] TPIU/TRACECLKIN 00 tied-zero

01 VCLK

10 ETMTRACECLKIN

6.22.8.2 Timing Specifications

Figure 6-30. ETMTRACECLKOUT Timing Table 6-55. ETMTRACECLK Timing PARAMETER MIN MAX DESCRIPTION tcyc(ETM) 18.18 ns Clock period tl(ETM) 6 ns Low pulse width th(ETM) 6 ns High pulse width tr(ETM) 3 ns Clock and data rise time tf(ETM) 3 ns Clock and data fall time

PRODUCT□PREVIEW tsu(ETM) th(ETM) ETMTRACECLK ETMDA T A tsu(ETM) th(ETM) 147 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback System Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Figure 6-31. ETMDATA Timing Table 6-56. ETMDATA Timing Parameter MIN Description tsu(ETM) 2.5 ns Data setup time th(ETM) 1.5 ns Data hold time NOTE The ETMTRACECLK and ETMDATA timing is based on a 15pF load and for ambient temperature lower than 85°C.

PRODUCT□PREVIEW tcyc(RTP) tr tfth(RTP) tl(RTP) 148 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.22.9 RAM Trace Port (RTP)

The RTP provides the ability to datalog the RAM contents of the RM57Dx devices or accesses to peripherals without program intrusion. It can trace all data write or read accesses to internal RAM. In addition, it provides the capability to directly transfer data to a FIFO to support a CPU-controlled transmission of the data. The trace data is transmitted over a dedicated external interface.

6.22.9.1 Features

The RTP offers the following features:

Two modes of operation - Trace Mode and Direct Data Mode – Trace Mode
Nonintrusive data trace on write or read operation
Visibility of RAM content at any time on external capture hardware
Trace of peripheral accesses
2 configurable trace regions for each RAM module to limit amount of data to be traced
FIFO to store data and address of data of multiple read/write operations
Trace of CPU and/or DMA accesses with indication of the master in the transmitted data packet – Direct Data Mode
Directly write data with the CPU or trace read operations to a FIFO, without transmitting header and address information
Dedicated synchronous interface to transmit data to external devices
Free-running clock generation or clock stop mode between transmissions
Up to 100 Mbit per sec/terminal transfer rate for transmitting data
Pins not used in functional mode can be used as GIOs

6.22.9.2 Timing Specifications

Figure 6-32. RTPCLK Timing Table 6-57. RTPCLK Timing PARAMETER MIN MIN UNIT tcyc(RTP) Clock period 9.09 (= 110 MHz) ns th(RTP) High pulse width ((tcyc(RTP))/2) - ((tr+tf)/2) ns tl(RTP) Low pulse width ((tcyc(RTP))/2) - ((tr+tf)/2) ns

PRODUCT□PREVIEW DMMSYNC DMMCLK DMMDA T A tssu(DMM) tsh(DMM) tdsu(DMM) tdh(DMM) tcyc(DMM) tr tfth(DMM) tl(DMM) 150 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.22.10 Data Modification Module (DMM)

The Data Modification Module (DMM) provides the capability to modify data in the entire 4 GB address space of the RM57Dx devices from an external peripheral, with minimal interruption of the application.

6.22.10.1 Features

The DMM module has the following features:

Acts as a bus master, thus enabling direct writes to the 4GB address space without CPU intervention
Writes to memory locations specified in the received packet (leverages packets defined by trace mode of the RAM trace port (RTP) module
Writes received data to consecutive addresses, which are specified by the DMM module (leverages packets defined by direct data mode of RTP module)
Configurable port width (1, 2, 4, 8, 16 pins)
Up to 100 Mbit/s terminal data rate
Unused pins configurable as GIO pins

6.22.10.2 Timing Specifications

Figure 6-35. DMMCLK Timing Table 6-60. DMMCLK Timing Parameter MIN Description tcyc(DMM) 9.09ns Clock period th(DMM) ((tcyc(DMM))/2) - ((tr+tf)/2) High pulse width tl(DMM) ((tcyc(DMM))/2) - ((tr+tf)/2) Low pulse width Figure 6-36. DMMDATA Timing

PRODUCT□PREVIEW TRST TMS TCK TDI TDO RTCK IC EPICK Boundary BSDL Boundary Scan Interface Scan Device Pins (conceptual) TDI TDO 152 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback System Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

6.22.11 Boundary Scan Chain

The device supports BSDL-compliant boundary scan for testing pin-to-pin compatibility. The boundary scan chain is connected to the Boundary Scan Interface of the ICEPICK module (see Figure 6-38). Figure 6-38. Boundary Scan Implementation (Conceptual Diagram) Data is serially shifted into all boundary-scan buffers through TDI, and out through TDO.

PRODUCT□PREVIEW TZ1/2/3n SOCA1, SOCB1 EPWM1INTn EPWM1TZINTn EQEP1ERR / EQEP2ERR / EQEP1ERR or EQEP2ERR Debug Mode Entry OSC FAIL or PLL Slip IOMUX EPWMSYNCI ePWM1 eCAP1 EPWM1A EPWM1B EPWM2/3/4/5/6A EPWM2/3/4/5/6B ePWM7 EPWM7A ECAP1 Pulse Stretch,

8 VCLK3

(after stretch) ADC Wrapper VBus32 / VBus32DP EPWM1ENCLK TBCLKSYNC VIM VCLK3, SYS_nRST EPWM2/3/4/5/6ENCLK TBCLKSYNC EPWM7ENCLK TBCLKSYNC ECAP1INTn ePWM 2/3/4/5/6 VIM EQEP1 + EQEP2 EPWM7B CPU System Module TZ6n TZ5n TZ4n VCLK3, SYS_nRST TZ1/2/3n TZ1/2/3n Debug Mode Entry OSC FAIL or PLL Slip TZ6n TZ5n TZ4n Debug Mode Entry OSC FAIL or PLL SLip TZ6n TZ5n TZ4n SOCA2/3/4/5/6 SOCB2/3/4/5/6 EPWM2/3/4/5/6INTn EPWM2/3/4/5/6TZINTn EPWM7INTn EPWM7TZINTn VBus32 VBus32 VCLK3, SYS_nRST VBus32 VIM ADC Wrapper VIM EQEP1 + EQEP2 CPU System Module VIM ADC Wrapper VIM EQEP1 + EQEP2 CPU System Module VIM Mux Selector Mux Selector EQEP1ERR / EQEP2ERR / EQEP1ERR or EQEP2ERR EQEP1ERR / EQEP2ERR / EQEP1ERR or EQEP2ERR SOCA7, SOCB7Mux Selector NHET1_LOOP_SYNC EPWM1SYNCO (before stretch) SYNCI SYNCO see Note A see Note A see Note A 153 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7 Peripheral Information and Electrical Specifications

7.1 Enhanced Translator PWM Modules (ePWM)

Figure 7-1 shows the connections between the seven ePWM modules (ePWM1,2,3,4,5,6,7) on the device. A. For more detail on the ePWMx input synchronization selection, see Figure 7-2. Figure 7-1. ePWMx Module Interconnections

PRODUCT□PREVIEW TZxn (x = 1, 2, or 3) ePWMx double sync (x = 1 through 7) 6 VCLK3 Cycles Filter 154 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Figure 7-2 shows the detailed input synchronization selection (asynchronous, double-synchronous, or double synchronous + filter width) for ePWMx. Figure 7-2. ePWMx Input Synchronization Selection Detail 7.1.1 ePWM Clocking and Reset Each ePWM module has a clock enable (ePWMxENCLK) which is controlled by its respective Peripheral Power Down bit in the PSPWRDWNCLRx register of the PCR2 module. To properly reset the peripherals, the peripherals must be released from reset by setting the PENA bit of the CLKCNTL register in the system module. In additional, the peripherals must be released from their power down state by clearing their respective bit in the PSPWRDWNCLRx register. By default after reset, the peripherals are in power down state. Table 7-1. ePWMx Clock Enable Control ePWM MODULE INSTANCE CONTROL REGISTER TO ENABLE CLOCK DEFAULT VALUE ePWM1 PSPWRDWNCLR3[16] 1 ePWM2 PSPWRDWNCLR3[17] 1 ePWM3 PSPWRDWNCLR3[18] 1 ePWM4 PSPWRDWNCLR3[19] 1 ePWM5 PSPWRDWNCLR3[12] 1 ePWM6 PSPWRDWNCLR3[13] 1 ePWM7 PSPWRDWNCLR3[14] 1

7.1.2 Synchronization of ePWMx Time Base Counters

A time-base synchronization scheme connects all of the ePWM modules on a device. Each ePWM module has a synchronization input (EPWMxSYNCI) and a synchronization output (EPWMxSYNCO). The input synchronization for the first instance (ePWM1) comes from an external pin. Figure 7-1 shows the synchronization connections for all the ePWMx modules. Each ePWM module can be configured to use or ignore the synchronization input. Refer the ePWM module user guide for more information.

PRODUCT□PREVIEW N2HET1 N2HET2 ePWM1

2 VCLK3 cycles

EXT_LOOP_SYNCN2HET1_LOOP_SYNC double sync PINMMR165[24]=0 and PINMMR165[25]=1

6 VCLK3

7.1.3 Synchronizing all ePWM Modules to the N2HET1 Module Time Base

The connection between the NHET1_LOOP_SYNC and the SYNCI input of ePWM1 module is implemented as shown in Figure 7-3. Figure 7-3. Synchronizing Time Bases Between N2HET1, N2HET2 and ePWMx Modules

7.1.4 Phase-Locking the Time-Base Clocks of Multiple ePWM Modules

The TBCLKSYNC bit can be used to globally synchronize the time-base clocks of all enabled ePWM modules on a device. This bit is implemented as PINMMR166[1] register bit 1. When TBCLKSYNC = 0, the time-base clock of all ePWM modules is stopped. This is the default condition. When TBCLKSYNC = 1, all ePWM time-base clocks are started with the rising edge of TBCLK aligned. For perfectly synchronized TBCLKs, the prescaler bits in the TBCTL register of each ePWM module must be set identically. The proper procedure for enabling the ePWM clocks is as follows:

Each ePWM is individually associated with a power down bit in the PSPWRDWNCLRx register of the PCR2 module. Enable the individual ePWM module clocks (if disable) using the control registers in the PCR2.
Configure TBCLKSYNC = 0. This will stop the time-base clock within any enabled ePWM module.
Configure the prescaler values and desired ePWM modes.
Configure TBCLKSYNC = 1. 7.1.5 ePWM Synchronization with External Devices The output sync from ePWM1 Module is also exported to the IO Mux such that multiple devices can be synchronized together. The signal pulse must be stretched by 8 VCLK3 cycles before being exported on the IO Mux pin as the ePWMSYNCO signal.

PRODUCT□PREVIEW 156 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The filter width is 6 VCLK3 cycles. 7.1.6 ePWM Trip Zones The ePWMx modules have 6 trip zone inputs each. These are active-low signals. The application can control the ePWMx module response to each of the trip zone input separately. The timing requirements from the assertion of the trip zone inputs to the actual response are specified in the electrical and timing section of this document.

7.1.6.1 Trip Zones TZ1n, TZ2n, TZ3n

These 3 trip zone inputs are driven by external circuits and are connected to device-level inputs. These signals are either connected asynchronously to the ePWMx trip zone inputs, or double-synchronized with VCLK3, or double-synchronized and then filtered with a 6-cycle VCLK3-based counter before connecting to the ePWMx. By default, the trip zone inputs are asynchronously connected to the ePWMx modules. Table 7-2. Connection to ePWMx Modules for Device-Level Trip Zone Inputs TRIP ZONE INPUT CONTROL FOR ASYNCHRONOUS CONNECTION TO ePWMx CONTROL FOR DOUBLE-SYNCHRONIZED CONNECTION TO ePWMx CONTROL FOR DOUBLE-SYNCHRONIZED AND FILTERED CONNECTION(1) TO ePWMx TZ1n PINMMR172[16] = 1 PINMMR172[16] = 0 AND PINMMR172[17] = 1 PINMMR172[16] = 0 AND PINMMR172[17] = 0 AND PINMMR172[18] = 1 TZ2n PINMMR172[24] = 1 PINMMR172[24] = 0 AND PINMMR172[25] = 1 PINMMR172[24] = 0 AND PINMMR172[25] = 0 AND PINMMR172[26] = 1 TZ3n PINMMR173[0] = 1 PINMMR173[0] = 0 AND PINMMR173[1] = 1 PINMMR173[0] = 0 AND PINMMR173[1] = 0 AND PINMMR173[2] = 1

7.1.6.2 Trip Zone TZ4n

This trip zone input is dedicated to eQEPx error indications. There are 2 eQEP modules on this device. Each eQEP module indicates a phase error by driving its EQEPxERR output High. The following control registers allow the application to configure the trip zone input (TZ4n) to each ePWMx module based on the application’s requirements. Table 7-3. TZ4n Connections for ePWMx Modules ePWMx CONTROL FOR TZ4n = NOT(EQEP1ERR OR EQEP2ERR) CONTROL FOR TZ4n = NOT(EQEP1ERR) CONTROL FOR TZ4n = NOT(EQEP2ERR) ePWM1 PINMMR167[0] = 1 PINMMR167[0] = 0 AND PINMMR167[1] = 1 PINMMR167[0] = 0 AND PINMMR167[1] = 0 AND PINMMR167[2] = 1 ePWM2 PINMMR167[8] PINMMR167[8] = 0 AND PINMMR167[9] = 1 PINMMR167[8] = 0 AND PINMMR167[9] = 0 AND PINMMR167[10] = 1 ePWM3 PINMMR167[16] PINMMR167[16] = 0 AND PINMMR167[17] = 1 PINMMR167[16] = 0 AND PINMMR167[17] = 0 AND PINMMR167[18] = 1 ePWM4 PINMMR167[24] PINMMR167[24] = 0 AND PINMMR167[25] = 1 PINMMR167[24] = 0 AND PINMMR167[25] = 0 AND PINMMR167[26] = 1 ePWM5 PINMMR168[0] PINMMR168[0] = 0 AND PINMMR168[1] = 1 PINMMR168[0] = 0 AND PINMMR168[1] = 0 AND PINMMR168[2] = 1 ePWM6 PINMMR168[8] PINMMR168[8] = 0 AND PINMMR168[9] = 1 PINMMR168[8] = 0 AND PINMMR168[9] = 0 AND PINMMR168[10] = 1 ePWM7 PINMMR168[16] PINMMR168[16] = 0 AND PINMMR168[17] = 1 PINMMR168[16] = 0 AND PINMMR168[17] = 0 AND PINMMR168[18] = 1 NOTE The EQEPxERR signal is an active high signal coming out of EQEPx module. As listed in Table 7-3, the selected combination of the EQEPxERR signals must be inverted before connecting to the TZ4n input of the ePWMx modules.

PRODUCT□PREVIEW 157 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) The filter width is 6 VCLK3 cycles.

7.1.6.3 Trip Zone TZ5n

This trip zone input is dedicated to a clock failure on the device. That is, this trip zone input is asserted whenever an oscillator failure or a PLL slip is detected on the device. The applciation can use this trip zone input for each ePWMx module in order to prevent the external system from going out of control when the device clocks are not within expected range (system running at limp clock). The oscillator failure and PLL slip signals used for this trip zone input are taken from the status flags in the system module. These are level signals are are set until cleared by the application.

7.1.6.4 Trip Zone TZ6n

This trip zone input to the ePWMx modules is dedicated to a debug mode entry of the CPU. If enabled, the user can force the PWM outputs to a known state when the emulator stops the CPU. This prevents the external system from going out of control when the CPU is stopped. NOTE There is a signal called DBGACK that the CPU drives when it enters debug mode. This signal must be inverted and used as the Debug Mode Entry signal for the trip zone input.

7.1.7 Triggering of ADC Start of Conversion Using ePWMx SOCA and SOCB Outputs

A special scheme is implemented to select the actual signal used for triggering the start of conversion on

7.1.8 Enhanced Translator-Pulse Width Modulator (ePWMx) Timings

Table 7-4. ePWMx Timing Requirements TEST CONDITIONS MIN MAX UNIT tw(SYNCIN) Synchronization input pulse width Asynchronous 2 tc(VCLK3) cycles Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width(1) cycles Table 7-5. ePWMx Switching Characteristics PARAMETER TEST CONDITIONS MIN MAX UNIT tw(PWM) Pulse duration, ePWMx output high or low 33.33 ns tw(SYNCOUT) Synchronization Output Pulse Width 8 tc(VCLK3) cycles td(PWM)tza Delay time, trip input active to PWM forced high, OR Delay time, trip input active to PWM forced low no pin load 25 ns td(TZ-PWM)HZ Delay time, trip input active to PWM Hi-Z 20 ns (1) The filter width is 6 VCLK3 cycles. Table 7-6. ePWMx Trip-Zone Timing Requirements TEST CONDITIONS MIN MAX UNIT tw(TZ) Pulse duration, TZn input low Asynchronous 2 * TBePWMx cycles Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width(1) cycles

PRODUCT□PREVIEW IOMUX EPWM1SYNCO eCAP1 eCAP ECAP1INTn ECAP1ENCLK VCLK3, SYS_nRST ECAP2ENCLK eCAP 2/3/4/5 VCLK3, SYS_nRST ECAP2INTn ECAP6INTn VBus32 VBus32 VIM VIM VIM ECAP1 ECAP1SYNCI ECAP1SYNCO ECAP2SYNCI ECAP2SYNCO ECAP2 ECAP6ENCLK VCLK3, SYS_nRST VBus32 ECAP6 ECAP6SYNCI ECAP6SYNCO see Note A see Note A see Note A 158 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

7.2 Enhanced Capture Modules (eCAP)

Figure 7-4 shows how the eCAP modules are interconnected on this microcontroller. A. For more detail on the eCAPx input synchronization selection, see Figure 7-5. Figure 7-4. eCAP Module Connections

PRODUCT□PREVIEW ECAPx eCAPx double sync (x = 1 through 6) 6 VCLK3 Cycles Filter 159 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Figure 7-5 shows the detailed input synchronization selection (asynchronous, double-synchronous, or double synchronous + filter width) for eCAPx. Figure 7-5. eCAPx Input Synchronization Selection Detail

7.2.1 Clock Enable Control for eCAPx Modules

Each of the ECAPx modules has a clock enable (ECAPxENCLK) which is controlled by its respective Peripheral Power Down bit in the PSPWRDWNCLRx register of the PCR2 module. To properly reset the peripherals, the peripherals must be released from reset by setting the PENA bit of the CLKCNTL register in the system module. In additional, the peripherals must be released from their power down state by clearing their respective bit in the PSPWRDWNCLRx register. By default after reset, the peripherals are in power down state. Table 7-7. eCAPx Clock Enable Control ePWM MODULE INSTANCE CONTROL REGISTER TO ENABLE CLOCK DEFAULT VALUE eCAP1 PSPWRDWNCLR3[15] 1 eCAP2 PSPWRDWNCLR3[8] 1 eCAP3 PSPWRDWNCLR3[9] 1 eCAP4 PSPWRDWNCLR3[10] 1 eCAP5 PSPWRDWNCLR3[11] 1 eCAP6 PSPWRDWNCLR3[4] 1 (1) The filter width is 6 VCLK3 cycles.

7.2.2 PWM Output Capability of eCAPx

When not used in capture mode, each of the eCAPx modules can be used as a single-channel PWM output. This is called the auxiliary PWM (APWM) mode of operation of the eCAP modules. Refer the eCAP module user guide for more information.

7.2.3 Input Connection to eCAPx Modules

The input connection to each of the eCAP modules can be selected between a double-VCLK3- synchronized input or a double-VCLK3-synchronized and filtered input, as listed in Table 7-8. Table 7-8. Device-Level Input Connection to eCAPx Modules INPUT SIGNAL CONTROL FOR DOUBLE-SYNCHRONIZED CONNECTION TO eCAPx CONTROL FOR DOUBLE-SYNCHRONIZED AND FILTERED CONNECTION(1) TO eCAPx eCAP1 PINMMR169[0] = 1 PINMMR169[0] = 0 AND PINMMR169[1] = 1 eCAP2 PINMMR169[8] = 1 PINMMR169[8] = 0 AND PINMMR169[9] = 1 eCAP3 PINMMR169[16] = 1 PINMMR169[16] = 0 AND PINMMR169[17] = 1 eCAP4 PINMMR169[24] = 1 PINMMR169[24] = 0 AND PINMMR169[25] = 1 eCAP5 PINMMR170[0] = 1 PINMMR170[0] = 0 AND PINMMR170[1] = 1 eCAP6 PINMMR170[8] = 1 PINMMR170[8] = 0 AND PINMMR170[9] = 1

PRODUCT□PREVIEW 160 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The filter width is 6 VCLK3 cycles.

7.2.4 Enhanced Capture Module (eCAP) Timings

Table 7-9. eCAPx Timing Requirements TEST CONDITIONS MIN MAX UNIT tw(CAP) Capture input pulse width Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width(1) cycles Table 7-10. eCAPx Switching Characteristics PARAMETER TEST CONDITIONS MIN MAX UNIT tw(APWM) Pulse duration, APWMx output high or low 20 ns

PRODUCT□PREVIEW EQEPxA or EQEPxB (x = 1 or 2) eQEPx double sync (x = 1 or 2) 6 VCLK3 Cycles Filter EQEP1A VIM EQEP1INTn EQEP1 Module IO Mux EQEP1ENCLK EQEP1IO EQEP1I VBus32 VCLK3 SYS_nRST EQEP1B EQEP1IOE EQEP1SO EQEP1S EQEP1SOE EQEP1ERR EPWM1/../7 TZ4n EQEP2A VIM EQEP2INTn EQEP2 Module EQEP2ENCLK EQEP2IO EQEP2I VBus32 VCLK3 SYS_nRST EQEP2B EQEP2IOE EQEP2SO EQEP2S EQEP2SOE EQEP2ERR Connection Selection Mux see Note A see Note A 161 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.3 Enhanced Quadrature Encoder (eQEP)

Figure 7-6 shows the eQEP module interconnections on the device. A. For more detail on the eQEPx input synchronization selection, see Figure 7-7. Figure 7-6. eQEP Module Interconnections Figure 7-7 shows the detailed input synchronization selection (asynchronous, double-synchronous, or double synchronous + filter width) for eQEPx. Figure 7-7. eQEPx Input Synchronization Selection Detail

7.3.1 Clock Enable Control for eQEPx Modules

Each of the EQEPx modules has a clock enable (EQEPxENCLK) which is controlled by its respective Peripheral Power Down bit in the PSPWRDWNCLRx register of the PCR2 module. To properly reset the peripherals, the peripherals must be released from reset by setting the PENA bit of the CLKCNTL register in the system module. In additional, the peripherals must be released from their power down state by clearing their respective bit in the PSPWRDWNCLRx register. By default after reset, the peripherals are in power down state. Table 7-11. eQEPx Clock Enable Control ePWM MODULE INSTANCE CONTROL REGISTER TO ENABLE CLOCK DEFAULT VALUE eQEP1 PSPWRDWNCLR3[5] 1 eQEP2 PSPWRDWNCLR3[6] 1

PRODUCT□PREVIEW 162 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The filter width is 6 VCLK3 cycles.

7.3.2 Using eQEPx Phase Error to Trip ePWMx Outputs

The eQEP module sets the EQEPERR signal output whenever a phase error is detected in its inputs EQEPxA and EQEPxB. This error signal from both the eQEP modules is input to the connection selection multiplexor. This multiplexor is defined in Table 7-3. As shown in Figure 7-6, the output of this selection multiplexor is inverted and connected to the TZ4n trip-zone input of all ePWMx modules. This connection allows the application to define the response of each ePWMx module on a phase error indicated by the eQEP modules.

7.3.3 Input Connection to eQEPx Modules

The input connection to each of the eQEP modules can be selected between a double-VCLK3- synchronized input or a double-VCLK3-synchronized and filtered input, as listed in Table 7-12. Table 7-12. Device-Level Input Connection to eQEPx Modules INPUT SIGNAL CONTROL FOR DOUBLE-SYNCHRONIZED CONNECTION TO eQEPx CONTROL FOR DOUBLE-SYNCHRONIZED AND FILTERED CONNECTION(1) TO eQEPx eQEP1A PINMMR170[16] = 1 PINMMR170[16] = 0 and PINMMR170[17] = 1 eQEP1B PINMMR170[24] = 1 PINMMR170[24] = 0 and PINMMR170[25] = 1 eQEP1I PINMMR171[0] = 1 PINMMR171[0] = 0 and PINMMR171[1] = 1 eQEP1S PINMMR171[8] = 1 PINMMR171[8] = 0 and PINMMR171[9] = 1 eQEP2A PINMMR171[16] = 1 PINMMR171[16] = 0 and PINMMR171[17] = 1 eQEP2B PINMMR171[24] = 1 PINMMR171[24] = 0 and PINMMR171[25] = 1 eQEP2I PINMMR172[0] = 1 PINMMR172[0] = 0 and PINMMR172[1] = 1 eQEP2S PINMMR172[8] = 1 PINMMR172[8] = 0 and PINMMR172[9] = 1 (1) The filter width is 6 VCLK3 cycles.

7.3.4 Enhanced Quadrature Encoder Pulse (eQEPx) Timing

Table 7-13. eQEPx Timing Requirements(1) TEST CONDITIONS MIN MAX UNIT tw(QEPP) QEP input period Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width cycles tw(INDEXH) QEP Index Input High Time Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width cycles tw(INDEXL) QEP Index Input Low Time Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width cycles tw(STROBH) QEP Strobe Input High Time Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width cycles tw(STROBL) QEP Strobe Input Low Time Synchronous 2 tc(VCLK3) cycles Synchronous, with input filter 2 tc(VCLK3) + filter width cycles Table 7-14. eQEPx Switching Characteristics PARAMETER MIN MAX UNIT td(CNTR)xin Delay time, external clock to counter increment 4 tc(VCLK3) cycles td(PCS-OUT)QEP Delay time, QEP input edge to position compare sync output 6 tc(VCLK3) cycles

PRODUCT□PREVIEW 163 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.4 Multibuffered 12-bit Analog-to-Digital Converter

The multibuffered A-to-D converter (MibADC) has a separate power bus for its analog circuitry that enhances the A-to-D performance by preventing digital switching noise on the logic circuitry which could be present on VSS and VCC from coupling into the A-to-D analog stage. All A-to-D specifications are given with respect to ADREFLO unless otherwise noted. Table 7-15. MibADC Overview DESCRIPTION VALUE Resolution 12 bits Monotonic Assured Output conversion code 00h to FFFh [00 for VAI ≤ ADREFLO; FFF for VAI ≥ ADREFHI]

7.4.1 MibADC Features

10-/12-bit resolution
ADREFHI and ADREFLO pins (high and low reference voltages)
Total Sample/Hold/Convert time: 600 ns Typical Minimum at 30 MHz ADCLK
One memory region per conversion group is available (event, group 1, group 2)
Allocation of channels to conversion groups is completely programmable
Memory regions are serviced either by interrupt or by DMA
Programmable interrupt threshold counter is available for each group
Programmable magnitude threshold interrupt for each group for any one channel
Option to read either 8-, 10-, or 12-bit values from memory regions
Single or continuous conversion modes
Embedded self-test
Embedded calibration logic
Enhanced power-down mode – Optional feature to automatically power down ADC core when no conversion is in progress
External event pin (ADEVT) programmable as general-purpose I/O

7.4.2 Event Trigger Options

The ADC module supports three conversion groups: Event Group, Group1 and Group2. Each of these three groups can be configured to be hardware event-triggered. In that case, the application can select from among eight event sources to be the trigger for a group's conversions.

7.4.2.1 MIBADC1 Event Trigger Hookup

Table 7-16. ADC1 Trigger Event Selection Group Source Select, G1SRC, G2SRC or EVSRC Event # PINMMR161[0] PINMMR161[1] Control Option A Control Option B Trigger Source 000 1 x x NA NA AD1EVT 001 2 1 0 PINMMR161[8] = x PINMMR161[9] = x N2HET1[8] 0 1 PINMMR161[8] = 1 PINMMR161[9] = 0 N2HET2[5] 0 1 PINMMR161[8] = 0 PINMMR161[9] = 1 e_TPWM_B 010 3 1 0 NA NA N2HET1[10] 0 1 NA NA N2HET1[27] 011 4 1 0 PINMMR161[16] = x PINMMR161[17] = x RTI1 Comp0 0 1 PINMMR161[16] = 1 PINMMR161[17] = 0 RTI1 Comp0 0 1 PINMMR161[16] = 0 PINMMR161[17] = 1 e_TPWM_A1 100 5 1 0 NA NA N2HET1[12] 0 1 NA NA N2HET1[17]

PRODUCT□PREVIEW 164 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 7-16. ADC1 Trigger Event Selection (continued) Group Source Select, G1SRC, G2SRC or EVSRC Event # PINMMR161[0] PINMMR161[1] Control Option A Control Option B Trigger Source 101 6 1 0 PINMMR161[24] = x PINMMR161[25] = x N2HET1[14] 0 1 PINMMR161[24] = 1 PINMMR161[25] = 0 N2HET1[19] 0 1 PINMMR161[24] = 0 PINMMR161[25] = 1 N2HET2[1] 110 7 1 0 PINMMR162[0] = x PINMMR162[1] = x GIOB[0] 0 1 PINMMR162[0] = 1 PINMMR162[1] = 0 N2HET1[11] 0 1 PINMMR162[0] = 0 PINMMR162[1] = 1 ePWM_A2 111 8 1 0 PINMMR162[8] = x PINMMR162[9] = x GIOB[1] 0 1 PINMMR162[8] = 1 PINMMR162[9] = 0 N2HET2[13] 0 1 PINMMR162[8] = 0 PINMMR162[9] = 1 ePWM_AB NOTE For ADEVT trigger source, the connection to the MibADC1 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by configuring ADEVT as an output function on to the pad (through the mux control), or by driving the ADEVT signal from an external trigger source as input. If the mux control module is used to select different functionality instead of the ADEVT signal, then care must be taken to disable ADEVT from triggering conversions; there is no multiplexing on the input connection. NOTE For N2HETx trigger sources, the connection to the MibADC1 module trigger input is made from the input side of the output buffer (at the N2HETx module boundary). This way, a trigger condition can be generated even if the N2HETx signal is not selected to be output on the pad. NOTE For the RTI compare 0 interrupt source, the connection is made directly from the output of the RTI module. That is, the interrupt condition can be used as a trigger source even if the actual interrupt is not signaled to the CPU.

7.4.2.2 MIBADC2 Event Trigger Hookup

Table 7-17. ADC2 Trigger Event Selection Group Source Select, G1SRC, G2SRC or EVSRC Event # PINMMR161[0] PINMMR161[1] Control Option A Control Option B Trigger Source 000 1 x x NA NA AD2EVT 001 2 1 0 PINMMR162[16] = x PINMMR162[17] = x N2HET1[8] 0 1 PINMMR162[16] = 1 PINMMR162[17] = 0 N2HET2[5] 0 1 PINMMR162[16] = 0 PINMMR162[17] = 1 e_TPWM_B 010 3 1 0 NA NA N2HET1[10] 0 1 NA NA N2HET1[27] 011 4 1 0 PINMMR162[24] = x PINMMR162[25] = x RTI1 Comp0 0 1 PINMMR162[24] = 1 PINMMR162[25] = 0 RTI1 Comp0 0 1 PINMMR162[24] = 0 PINMMR162[25] = 1 e_TPWM_A1 100 5 1 0 NA NA N2HET1[12] 0 1 NA NA N2HET1[17]

PRODUCT□PREVIEW 165 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 7-17. ADC2 Trigger Event Selection (continued) Group Source Select, G1SRC, G2SRC or EVSRC Event # PINMMR161[0] PINMMR161[1] Control Option A Control Option B Trigger Source 101 6 1 0 PINMMR163[0] = x PINMMR163[0] = x N2HET1[14] 0 1 PINMMR163[0] = 1 PINMMR163[0] = 0 N2HET1[19] 0 1 PINMMR163[0] = 0 PINMMR163[0] = 1 N2HET2[1] 110 7 1 0 PINMMR163[8] = x PINMMR163[8] = x GIOB[0] 0 1 PINMMR163[8] = 1 PINMMR163[8] = 0 N2HET1[11] 0 1 PINMMR163[8] = 0 PINMMR163[8] = 1 ePWM_A2 111 8 1 0 PINMMR163[16] = x PINMMR163[16] = x GIOB[1] 0 1 PINMMR163[16] = 1 PINMMR163[16] = 0 N2HET2[13] 0 1 PINMMR163[16] = 0 PINMMR163[16] = 1 ePWM_AB NOTE For AD2EVT trigger source, the connection to the MibADC2 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by configuring AD2EVT as an output function on to the pad (through the mux control), or by driving the AD2EVT signal from an external trigger source as input. If the mux control module is used to select different functionality instead of the AD2EVT signal, then care must be taken to disable AD2EVT from triggering conversions; there is no multiplexing on the input connections. NOTE For N2HETx trigger sources, the connection to the MibADC2 module trigger input is made from the input side of the output buffer (at the N2HETx module boundary). This way, a trigger condition can be generated even if the N2HETx signal is not selected to be output on the pad. NOTE For the RTI compare 0 interrupt source, the connection is made directly from the output of the RTI module. That is, the interrupt condition can be used as a trigger source even if the actual interrupt is not signaled to the CPU.

7.4.2.3 Controlling ADC1 and ADC2 Event Trigger Options Using SOC Output from ePWM Modules

As shown in Figure 7-8, the ePWMxSOCA and ePWMxSOCB outputs from each ePWM module are used to generate 4 signals – B, A1, A2 and AB, that are available to trigger the ADC based on the application requirement.

PRODUCT□PREVIEW EPWM2 module EPWM2SOCA EPWM2SOCB EPWM1 module EPWM1SOCA EPWM1SOCB EPWM3 module EPWM3SOCA EPWM3SOCB EPWM4 module EPWM4SOCA EPWM4SOCB EPWM5 module EPWM5SOCA EPWM5SOCB EPWM6 module EPWM6SOCA EPWM6SOCB EPWM7SOCA EPWM7SOCB EPWM7 module ePWM_B ePWM_A1 ePWM_A2 ePWM_AB SOCAEN,□SOCBEN□bits inside□ePWMx□modules Controlled□by□PINMMR 166 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Figure 7-8. ADC Trigger Source Generation from ePWMx

PRODUCT□PREVIEW ePWM1 0 0 From switch on SOC2A when PINMMR164[8] = 0 SOC1A PINMMR164[0] EPWM1SOCA From switch on SOC2A when PINMMR164[8] = 1 0 0 167 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 7-18. Control Bit to SOC Output Control Bit SOC Output PINMMR164[0] SOC1A_SEL PINMMR164[8] SOC2A_SEL PINMMR164[16] SOC3A_SEL PINMMR164[24] SOC4A_SEL PINMMR165[0] SOC5A_SEL PINMMR165[8] SOC6A_SEL PINMMR165[16] SOC7A_SEL The SOCA output from each ePWM module is connected to a "switch" shown in Figure 7-8. This switch is implemented by using control registers in the PINMMR module. An example of the implementation is shown for the switch on SOC1A. The switches on the other SOCA signals are implemented in the same way. Figure 7-9. ePWM1SOCA Switch Implementation The logic equations for the 4 outputs from the combinational logic shown in Figure 7-8 are: ePWM_B = SOC1B or SOC2B or SOC3B or SOC4B or SOC5B or SOC6B or SOC7B ePWM_A1 = [ SOC1A and not(SOC1A_SEL) ] or [ SOC2A and not(SOC2A_SEL) ] or [ SOC3A and not(SOC3A_SEL) ] or [ SOC4A and not(SOC4A_SEL) ] or [ SOC5A and not(SOC5A_SEL) ] or [ SOC6A and not(SOC6A_SEL) ] or [ SOC7A and not(SOC7A_SEL) ] ePWM_A2 = [ SOC1A and SOC1A_SEL ] or [ SOC2A and SOC2A_SEL ] or [ SOC3A and SOC3A_SEL ] or [ SOC4A and SOC4A_SEL ] or [ SOC5A and SOC5A_SEL ] or [ SOC6A and SOC6A_SEL ] or [ SOC7A and SOC7A_SEL ] ePWM_AB = B or A2

PRODUCT□PREVIEW 168 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) For VCCAD and VSSAD recommended operating conditions, see Section 5.4. (2) Input currents into any ADC input channel outside the specified limits could affect conversion results of other channels.

7.4.3 ADC Electrical and Timing Specifications

Table 7-19. MibADC Recommended Operating Conditions PARAMETER MIN MAX UNIT ADREFHI A-to-D high-voltage reference source ADREFLO VCCAD(1) V ADREFLO A-to-D low-voltage reference source VSSAD(1) ADREFHI V VAI Analog input voltage ADREFLO ADREFHI V IAIC Analog input clamp current(2) (VAI < VSSAD – 0.3 or VAI > VCCAD + 0.3) - 2 2 mA (1) For ICCAD and ICCREFHI see Section 5.7. (2) If a shared channel is being converted by both ADC converters at the same time, the on-state leakage is doubled. Table 7-20. MibADC Electrical Characteristics Over Full Ranges of Recommended Operating Conditions(1) PARAMETER DESCRIPTION/CONDITIONS MIN NOM MAX UNIT Rmux Analog input mux on- resistance See Figure 7-10 250 Ω Rsamp ADC sample switch on- resistance See Figure 7-10 250 Ω Cmux Input mux capacitance See Figure 7-10 16 pF Csamp ADC sample capacitance See Figure 7-10 13 pF IAIL Analog off-state input leakage current VCCAD = 3.6V VSSAD ≤ VIN < VSSAD + 100mV -300 200 nA VSSAD + 100mV ≤ VIN ≤ VCCAD - 200mV -200 200 nA VCCAD - 200mV < VIN ≤ VCCAD -200 500 nA IAIL Analog off-state input leakage current VCCAD = 5.25V VSSAD ≤ VIN < VSSAD + 300mV -1000 250 nA VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV -250 250 nA VCCAD - 300mV < VIN ≤ VCCAD -250 1000 nA IAOSB (2) Analog on-state input bias current VCCAD = 3.6V VSSAD ≤ VIN < VSSAD + 100mV -10 2 µA VSSAD + 100mV < VIN < VCCAD - 200mV -4 2 µA VCCAD - 200mV < VIN < VCCAD -4 16 µA IAOSB (2) Analog on-state input bias current VCCAD = 5.25V VSSAD ≤ VIN < VSSAD + 300mV -12 3 µA VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV -5 3 µA VCCAD - 300mV < VIN ≤ VCCAD -5 18 µA

PRODUCT□PREVIEW VS1 On-State Bias Current Off-State Leakages VS2 VS24 IAOSB IAIL IAIL Rext Rext Rext Pin Smux Rmux Pin Smux Rmux Pin Smux Rmux Ssamp Rsamp Csamp Cext IAIL IAIL IAIL IAIL Cmux Cext Cext 169 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) The MibADC clock is the ADCLK, generated by dividing down the VCLK1 by a prescale factor defined by the ADCLOCKCR register bits 4:0. (2) The sample and hold time for the ADC conversions is defined by the ADCLK frequency and the AD<GP>SAMP register for each conversion group. The sample time must be determined by accounting for the external impedance connected to the input channel as well as the ADC’s internal impedance. (3) This is the minimum sample/hold and conversion time that can be achieved. These parameters are dependent on many factors, e.g the prescale settings. Figure 7-10. MibADC Input Equivalent Circuit Table 7-21. MibADC Timing Specifications PARAMETER MIN NOM MAX UNIT tc(ADCLK) (1) Cycle time, MibADC clock 0.033 µs td(SH) (2) Delay time, sample and hold time 0.2 µs 12-BIT MODE td©) Delay time, conversion time 0.4 µs td(SHC) (3) Delay time, total sample/hold and conversion time 0.6 µs 10-BIT MODE td©) Delay time, conversion time 0.33 µs td(SHC) (3) Delay time, total sample/hold and conversion time 0.53 µs

PRODUCT□PREVIEW 170 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) 1 LSB = (ADREFHI – ADREFLO)/ 212 for 12-bit mode (2) 1 LSB = (ADREFHI – ADREFLO)/ 210 for 10-bit mode Table 7-22. MibADC Operating Characteristics Over 3.0 V to 3.6 V Operating Conditions(1)(2) PARAMETER DESCRIPTION/CONDITIONS MIN NOM MAX UNIT CR Conversion range over which specified accuracy is maintained ADREFHI - ADREFLO 3 3.6 V ZSET Zero Scale Offset Difference between the first ideal transition (from code 000h to 001h) and the actual transition 10-bit mode

1 LSB

2 LSB

FSET Full Scale Offset Difference between the range of the measured code transitions (from first to last) and the range of the ideal code transitions 10-bit mode

3 LSB

Difference between the actual step width and the ideal value. (See Figure 7-11) 10-bit mode -1 1.5 LSB 12-bit mode -1 2 LSB EINL Integral nonlinearity error Maximum deviation from the best straight line through the MibADC. MibADC transfer characteristics, excluding the quantization error. 10-bit mode -2 2 LSB 12-bit mode -2 2 LSB ETOT Total unadjusted error (after calibration) Maximum value of the difference between an analog value and the ideal midstep value. 10-bit mode -2 2 LSB 12-bit mode -4 4 LSB (1) 1 LSB = (ADREFHI – ADREFLO)/ 212 for 12-bit mode (2) 1 LSB = (ADREFHI – ADREFLO)/ 210 for 10-bit mode Table 7-23. MibADC Operating Characteristics Over 3.6 V to 5.25 V Operating Conditions(1)(2) PARAMETER DESCRIPTION/CONDITIONS MIN NOM MAX UNIT CR Conversion range over which specified accuracy is maintained ADREFHI - ADREFLO 3.6 5.25 V ZSET Zero Scale Offset Difference between the first ideal transition (from code 000h to 001h) and the actual transition 10-bit mode FSET Full Scale Offset Difference between the range of the measured code transitions (from first to last) and the range of the ideal code transitions 10-bit mode Difference between the actual step width and the ideal value. (See Figure 7-11) 10-bit mode -1 1.5 LSB 12-bit mode -1 3 LSB EINL Integral nonlinearity error Maximum deviation from the best straight line through the MibADC. MibADC transfer characteristics, excluding the quantization error. 10-bit mode -2 2 LSB 12-bit mode -4.5 2 LSB ETOT Total unadjusted error (after calibration) Maximum value of the difference between an analog value and the ideal midstep value. 10-bit mode -2 2 LSB 12-bit mode -6 5 LSB

PRODUCT□PREVIEW Differential Linearity Error (–½ LSB) Error (–½ LSB) 0 ... 110 0 ... 101 0 ... 100 0 ... 011 0 ... 010 0 ... 001 0 ... 000 0 1 2 3 4 5 Digital Output Code Analog Input Value (LSB) NOTE A: 1 LSB = (AD – AD )/2REFHI REFLO 171 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.4.4 Performance (Accuracy) Specifications

7.4.4.1 MibADC Nonlinearity Errors

The differential nonlinearity error shown in Figure 7-11 (sometimes referred to as differential linearity) is the difference between an actual step width and the ideal value of 1 LSB. Figure 7-11. Differential Nonlinearity (DNL) Error

PRODUCT□PREVIEW 0 ... 111 0 ... 101 0 ... 100 0 ... 011 0 ... 010 0 ... 001 0 ... 000 0 1 2 3 4 5 Digital Output Code Analog Input Value (LSB) 0 ... 110 6 7 At Transition (–½ LSB) At Transition 001/010 (–1/4 LSB) Actual Transition Ideal Transition End-Point Lin. Error NOTE A: 1 LSB = (AD – AD )/2REFHI REFLO 172 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated The integral nonlinearity error shown in Figure 7-12 (sometimes referred to as linearity error) is the deviation of the values on the actual transfer function from a straight line. Figure 7-12. Integral Nonlinearity (INL) Error

PRODUCT□PREVIEW 0 ... 111 0 ... 101 0 ... 100 0 ... 011 0 ... 010 0 ... 001 0 ... 000 0 1 2 3 4 5 Digital Output Code Analog Input Value (LSB) 0 ... 110 6 7 Total Error At Step Total Error At Step 0 ... 101 (–1 1/4 LSB) NOTE A: 1 LSB = (AD – AD )/2REFHI REFLO 173 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.4.4.2 MibADC Total Error

The absolute accuracy or total error of an MibADC as shown in Figure 7-13 is the maximum value of the difference between an analog value and the ideal midstep value. Figure 7-13. Absolute Accuracy (Total) Error

PRODUCT□PREVIEW 174 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

7.5 General-Purpose Input/Output

The GPIO module on this device supports two ports, GIOA and GIOB. The I/O pins are bidirectional and bit-programmable. Both GIOA and GIOB support external interrupt capability.

7.5.1 Features

The GPIO module has the following features:

Each IO pin can be configured as: – Input – Output – Open Drain
The interrupts have the following characteristics: – Programmable interrupt detection either on both edges or on a single edge (set in GIOINTDET) – Programmable edge-detection polarity, either rising or falling edge (set in GIOPOL register) – Individual interrupt flags (set in GIOFLG register) – Individual interrupt enables, set and cleared through GIOENASET and GIOENACLR registers respectively – Programmable interrupt priority, set through GIOLVLSET and GIOLVLCLR registers
Internal pullup/pulldown allows unused I/O pins to be left unconnected

PRODUCT□PREVIEW N2HETx 175 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.6 Enhanced High-End Timer (N2HET)

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, using a reduced instruction set, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse width modulated outputs, capture or compare inputs, or general-purpose I/O.. It is especially well suited for applications requiring multiple sensor information and drive actuators with complex and accurate time pulses.

7.6.1 Features

The N2HET module has the following features:

Programmable timer for input and output timing functions
Reduced instruction set (30 instructions) for dedicated time and angle functions
256 words of instruction RAM protected by parity
User defined number of 25-bit virtual counters for timer, event counters and angle counters
7-bit hardware counters for each pin allow up to 32-bit resolution in conjunction with the 25-bit virtual counters
Up to 32 pins usable for input signal measurements or output signal generation
Programmable suppression filter for each input pin with adjustable limiting frequency
Low CPU overhead and interrupt load
Efficient data transfer to or from the CPU memory with dedicated High-End-Timer Transfer Unit (HTU) or DMA
Diagnostic capabilities with different loopback mechanisms and pin status readback functionality

7.6.2 N2HET RAM Organization

The timer RAM uses 4 RAM banks, where each bank has two port access capability. This means that one RAM address may be written while another address is read. The RAM words are 96-bits wide, which are split into three 32-bit fields (program, control, and data).

7.6.3 Input Timing Specifications

The N2HET instructions PCNT and WCAP impose some timing constraints on the input signals. Figure 7-14. N2HET Input Capture Timings

PRODUCT□PREVIEW NHET_LOOP_SYNC EXT_LOOP_SYNC EXT_LOOP_SYNC NHET_LOOP_SYNC N2HET1 N2HET2 176 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated Table 7-24. Dynamic Characteristics for the N2HET Input Capture Functionality PARAMETER MIN MAX UNIT

1 Input signal period, PCNT or WCAP for rising edge

to rising edge (HRP) (LRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns

2 Input signal period, PCNT or WCAP for falling edge

to falling edge (HRP) (LRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns

3 Input signal high phase, PCNT or WCAP for rising

edge to falling edge 2 (HRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns

4 Input signal low phase, PCNT or WCAP for falling

edge to rising edge 2 (HRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns

7.6.4 N2HET1-N2HET2 Interconnections

In some applications the N2HET resolutions must be synchronized. Some other applications require a single time base to be used for all PWM outputs and input timing captures. The N2HET provides such a synchronization mechanism. The Clk_master/slave (HETGCR.16) configures the N2HET in master or slave mode (default is slave mode). A N2HET in master mode provides a signal to synchronize the prescalers of the slave N2HET. The slave N2HET synchronizes its loop resolution to the loop resolution signal sent by the master. The slave does not require this signal after it receives the first synchronization signal. However, anytime the slave receives the resynchronization signal from the master, the slave must synchronize itself again.. Figure 7-15. N2HET1 – N2HET2 Synchronization Hookup

PRODUCT□PREVIEW N2HET1 N2HET2 IOMM□mux□control□signal□x N2HET1[1]□/□N2HET2[8] N2HET1[1] N2HET2[8] N2HET1[3]□/□N2HET2[10] N2HET1[5]□/□N2HET2[12] N2HET1[7]□/□N2HET2[14] N2HET1[9]□/□N2HET2[16] N2HET1 N2HET2 IOMM□mux□control□signal□x N2HET1[11]□/□N2HET2[18] N2HET1[11] N2HET2[18] 177 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated

7.6.5 N2HET Checking

7.6.5.1 Internal Monitoring

To assure correctness of the high-end timer operation and output signals, the two N2HET modules can be used to monitor each other’s signals as shown in Figure 7-16. The direction of the monitoring is controlled by the I/O multiplexing control module. Figure 7-16. N2HET Monitoring

7.6.5.2 Output Monitoring using Dual Clock Comparator (DCC)

N2HET1[31] is connected as a clock source for counter 1 in DCC1. This allows the application to measure the frequency of the pulse-width modulated (PWM) signal on N2HET1[31]. Similarly, N2HET2[0] is connected as a clock source for counter 1 in DCC2. This allows the application to measure the frequency of the pulse-width modulated (PWM) signal on N2HET2[0]. Both N2HET1[31] and N2HET2[0] can be configured to be internal-only channels. That is, the connection to the DCC module is made directly from the output of the N2HETx module (from the input of the output buffer).

PRODUCT□PREVIEW 178 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated For more information on DCC see Section 6.7.3.

7.6.6 Disabling N2HET Outputs

Some applications require the N2HET outputs to be disabled under some fault condition. The N2HET module provides this capability through the "Pin Disable" input signal. This signal, when driven low, causes the N2HET outputs identified by a programmable register (HETPINDIS) to be tri-stated. Refer to the IOMM chapter in the device specific technical reference manual for more details on the "N2HET Pin Disable" feature. GIOA[5] is connected to the "Pin Disable" input for N2HET1, and GIOB[2] is connected to the "Pin Disable" input for N2HET2.

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7.6.7 High-End Timer Transfer Unit (HET-TU)

A High End Timer Transfer Unit (HET-TU) can perform DMA type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HET-TU.

7.6.7.1 Features

CPU and DMA independent
Master Port to access system memory
8 control packets supporting dual buffer configuration
Control packet information is stored in RAM protected by parity
Event synchronization (HET transfer requests)
Supports 32 or 64 bit transactions
Addressing modes for HET address (8 byte or 16 byte) and system memory address (fixed, 32 bit or 64bit)
One shot, circular and auto switch buffer transfer modes
Request lost detection

7.6.7.2 Trigger Connections

Table 7-25. HET TU1 Request Line Connection Modules Request Source HET TU1 Request N2HET1 HTUREQ[0] HET TU1 DCP[0] N2HET1 HTUREQ[1] HET TU1 DCP[1] N2HET1 HTUREQ[2] HET TU1 DCP[2] N2HET1 HTUREQ[3] HET TU1 DCP[3] N2HET1 HTUREQ[4] HET TU1 DCP[4] N2HET1 HTUREQ[5] HET TU1 DCP[5] N2HET1 HTUREQ[6] HET TU1 DCP[6] N2HET1 HTUREQ[7] HET TU1 DCP[7] Table 7-26. HET TU2 Request Line Connection Modules Request Source HET TU2 Request N2HET2 HTUREQ[0] HET TU2 DCP[0] N2HET2 HTUREQ[1] HET TU2 DCP[1] N2HET2 HTUREQ[2] HET TU2 DCP[2] N2HET2 HTUREQ[3] HET TU2 DCP[3] N2HET2 HTUREQ[4] HET TU2 DCP[4] N2HET2 HTUREQ[5] HET TU2 DCP[5] N2HET2 HTUREQ[6] HET TU2 DCP[6] N2HET2 HTUREQ[7] HET TU2 DCP[7]

PRODUCT□PREVIEW 180 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) These values do not include rise/fall times of the output buffer.

7.7 Controller Area Network (DCAN)

The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 megabit per second (Mbps). The DCAN is ideal for applications operating in noisy and harsh environments (e.g., automotive and industrial fields) that require reliable serial communication or multiplexed wiring.

7.7.1 Features

Features of the DCAN module include:

Supports CAN protocol version 2.0 part A, B
Bit rates up to 1 MBit/s
The CAN kernel can be clocked by the oscillator for baud-rate generation.
64 mailboxes on each DCAN
Individual identifier mask for each message object
Programmable FIFO mode for message objects
Programmable loop-back modes for self-test operation
Automatic bus on after Bus-Off state by a programmable 32-bit timer
Message RAM protected by ECC
Direct access to Message RAM during test mode
CAN Rx / Tx pins configurable as general purpose IO pins
Message RAM Auto Initialization
DMA support For more information on the DCAN see the device specific technical reference manual.

7.7.2 Electrical and Timing Specifications

Table 7-27. Dynamic Characteristics for the DCANx TX and RX pins Parameter MIN MAX Unit td(CANnTX) Delay time, transmit shift register to CANnTX pin(1) 15 ns td(CANnRX) Delay time, CANnRX pin to receive shift register 5 ns

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7.8 Local Interconnect Network Interface (LIN)

The SCI/LIN module can be programmed to work either as an SCI or as a LIN. The core of the module is an SCI. The SCI’s hardware features are augmented to achieve LIN compatibility. The SCI module is a universal asynchronous receiver-transmitter that implements the standard nonreturn to zero format. The SCI can be used to communicate, for example, through an RS-232 port or over a K- line. The LIN standard is based on the SCI (UART) serial data link format. The communication concept is single-master/multiple-slave with a message identification for multicast transmission between any network nodes.

7.8.1 LIN Features

The following are features of the LIN module:

Compatible to LIN 1.3, 2.0 and 2.1 protocols
Multibuffered receive and transmit units DMA capability for minimal CPU intervention
Identification masks for message filtering
Automatic Master Header Generation – Programmable Synch Break Field – Synch Field – Identifier Field
Slave Automatic Synchronization – Synch break detection – Optional baudrate update – Synchronization Validation
231 programmable transmission rates with 7 fractional bits
Error detection
2 Interrupt lines with priority encoding

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7.9 Serial Communication Interface (SCI)

7.9.1 Features

Standard universal asynchronous receiver-transmitter (UART) communication
Supports full- or half-duplex operation
Standard nonreturn to zero (NRZ) format
Double-buffered receive and transmit functions
Configurable frame format of 3 to 13 bits per character based on the following: – Data word length programmable from one to eight bits – Additional address bit in address-bit mode – Parity programmable for zero or one parity bit, odd or even parity – Stop programmable for one or two stop bits
Asynchronous or isosynchronous communication modes
Two multiprocessor communication formats allow communication between more than two devices.
Sleep mode is available to free CPU resources during multiprocessor communication.
The 24-bit programmable baud rate supports 224 different baud rates provide high accuracy baud rate selection.
Four error flags and Five status flags provide detailed information regarding SCI events.
Capability to use DMA for transmit and receive data.

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7.10 Inter-Integrated Circuit (I2C)

The inter-integrated circuit (I2C) module is a multimaster communication module providing an interface between the RM4x microcontroller and devices compliant with Philips Semiconductor I2C-bus specification version 2.1 and connected by an I2C-bus. This module will support any slave or master I2C compatible device.

7.10.1 Features

The I2C has the following features:

Compliance to the Philips I2C bus specification, v2.1 (The I2C Specification, Philips document number 9398 393 40011) – Bit/Byte format transfer – 7-bit and 10-bit device addressing modes – General call – START byte – Multimaster transmitter/ slave receiver mode – Multimaster receiver/ slave transmitter mode – Combined master transmit/receive and receive/transmit mode – Transfer rates of 10 kbps up to 400 kbps (Phillips fast-mode rate)
Free data format
Two DMA events (transmit and receive)
DMA event enable/disable capability
Seven interrupts that can be used by the CPU
Module enable/disable capability
The SDA and SCL are optionally configurable as general purpose I/O
Slew rate control of the outputs
Open drain control of the outputs
Programmable pullup/pulldown capability on the inputs
Supports Ignore NACK mode NOTE This I2C module does not support:
High-speed (HS) mode
C-bus compatibility mode
The combined format in 10-bit address mode (the I2C sends the slave address second byte every time it sends the slave address first byte)

PRODUCT□PREVIEW SDA SCL tw(SDAH) tw(SCLL) tw(SCLH) tw(SP) th(SCLL-SDAL) th(SDA-SCLL) th(SCLL-SDAL) tsu(SCLH-SDAL) tf(SCL)tc(SCL) tr(SCL) tsu(SCLH-SDAH) Stop Start Repeated Start Stop tsu(SDA-SCLH) 184 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The I2C pins SDA and SCL do not feature fail-safe I/O buffers. These pins could potentially draw current when the device is powered down. (2) The maximum th(SDA-SCLL) for I2C bus devices has only to be met if the device does not stretch the low period (tw(SCLL)) of the SCL signal. (3) Cb = The total capacitance of one bus line in pF.

7.10.2 I2C I/O Timing Specifications

Table 7-28. I2C Signals (SDA and SCL) Switching Characteristics(1) PARAMETER STANDARD MODE FAST MODE UNIT MIN MAX MIN MAX tc(I2CCLK) Cycle time, Internal Module clock for I2C, prescaled from VCLK 75.2 149 75.2 149 ns f(SCL) SCL Clock frequency 0 100 0 400 kHz tc(SCL) Cycle time, SCL 10 2.5 µs tsu(SCLH-SDAL) Setup time, SCL high before SDA low (for a repeated START condition) 4.7 0.6 µs th(SCLL-SDAL) Hold time, SCL low after SDA low (for a repeated START condition) 4 0.6 µs tw(SCLL) Pulse duration, SCL low 4.7 1.3 µs tw(SCLH) Pulse duration, SCL high 4 0.6 µs tsu(SDA-SCLH) Setup time, SDA valid before SCL high 250 100 ns th(SDA-SCLL) Hold time, SDA valid after SCL low (for I2C bus devices) 0 3.45(2) 0 0.9 µs tw(SDAH) Pulse duration, SDA high between STOP and START conditions 4.7 1.3 µs tsu(SCLH-SDAH) Setup time, SCL high before SDA high (for STOP condition) 4.0 0.6 µs tw(SP) Pulse duration, spike (must be suppressed) 0 50 ns Cb (3) Capacitive load for each bus line 400 400 pF Figure 7-17. I2C Timings

PRODUCT□PREVIEW 185 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated NOTE

A device must internally provide a hold time of at least 300 ns for the SDA signal (referred to the VIHmin of the SCL signal) to bridge the undefined region of the falling edge of SCL.
The maximum th(SDA-SCLL) has only to be met if the device does not stretch the LOW period (tw(SCLL)) of the SCL signal.
A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement tsu(SDA-SCLH) ≥ 250 ns must then be met. This will automatically be the case if the device does not stretch the LOW period of the SCL signal. If such a device does stretch the LOW period of the SCL signal, it must output the next data bit to the SDA line tr max + tsu(SDA-SCLH).
Cb = total capacitance of one bus line in pF. If mixed with fast-mode devices, faster fall- times are allowed.

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7.11 Multibuffered / Standard Serial Peripheral Interface

The MibSPI is a high-speed synchronous serial input/output port that allows a serial bit stream of programmed length (2 to 16 bits) to be shifted in and out of the device at a programmed bit-transfer rate. Typical applications for the SPI include interfacing to external peripherals, such as I/Os, memories, display drivers, and analog-to-digital converters.

7.11.1 Features

Both Standard and MibSPI modules have the following features:

16-bit shift register
Receive buffer register
11-bit baud clock generator
SPICLK can be internally-generated (master mode) or received from an external clock source (slave mode)
Each word transferred can have a unique format
SPI I/Os not used in the communication can be used as digital input/output signals Table 7-29. MibSPI Configurations MibSPIx/SPIx I/Os MibSPI1 MIBSPI1SIMO[1:0], MIBSPI1SOMI[1:0], MIBSPI1CLK, MIBSPI1nCS[5:0], MIBSPI1nENA MibSPI3 MIBSPI3SIMO, MIBSPI3SOMI, MIBSPI3CLK, MIBSPI3nCS[5:0], MIBSPI3nENA MibSPI5 MIBSPI5SIMO[3:0], MIBSPI5SOMI[3:0], MIBSPI5CLK, MIBSPI5nCS[5:0], MIBSPI5nENA MibSPI2 MIBSPI2SIMO,MIBSPI2SOMI,MIBSPI2CLK,MIBSPI2nCS[1:0],MIBSPI2nENA MibSPI4 MIBSPI4SIMO,MIBSPI4SOMI,MIBSPI4CLK,MIBSPI4nCS[5:0],MIBSPI4nENA

7.11.2 MibSPI Transmit and Receive RAM Organization

The Multibuffer RAM is comprised of 256 buffers for MibSPI1 and 128 buffers for all other MibSPI. Each entry in the Multibuffer RAM consists of 4 parts: a 16-bit transmit field, a 16-bit receive field, a 16-bit control field and a 16-bit status field. The Multibuffer RAM can be partitioned into multiple transfer groups with a variable number of buffers each. Multibuffered RAM Transfer Groups MibSPIx/SPIx MODULES NO OF CHIP SELECTS MIBSPIxnCS[x] NO. OF RAM BUFFERS NO. OF TRANSFER GROUPS MibSPI1 6 MIBSPI1nCS[5:0] 256 8 MibSPI2 2 MIBSPI2nCS[1:0] 128 8 MibSPI3 6 MIBSPI3nCS[5:0] 128 8 MibSPI4 6 MIBSPI4nCS[5:0] 128 8 MibSPI5 6 MIBSPI5nCS[5:0] 128 8

7.11.3 MibSPI Transmit Trigger Events

Each of the transfer groups can be configured individually. For each of the transfer groups a trigger event and a trigger source can be chosen. A trigger event can be for example a rising edge or a permanent low level at a selectable trigger source. For example, up to 15 trigger sources are available which can be used by each transfer group.

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7.11.3.1 MIBSPI1 Event Trigger Hookup

Table 7-30. MIBSPI1 Event Trigger Hookup Event # TGxCTRL TRIGSRC[3:0] Trigger Disabled 0000 No trigger source EVENT0 0001 GIOA[0] EVENT1 0010 GIOA[1] EVENT2 0011 GIOA[2] EVENT3 0100 GIOA[3] EVENT4 0101 GIOA[4] EVENT5 0110 GIOA[5] EVENT6 0111 GIOA[6] EVENT7 1000 GIOA[7] EVENT8 1001 N2HET1[8] EVENT9 1010 N2HET1[10] EVENT10 1011 N2HET1[12] EVENT11 1100 N2HET1[14] EVENT12 1101 N2HET1[16] EVENT13 1110 N2HET1[18] EVENT14 1111 Intern Tick counter NOTE For N2HET1 trigger sources, the connection to the MibSPI1 module trigger input is made from the input side of the output buffer (at the N2HET1 module boundary). This way, a trigger condition can be generated even if the N2HET1 signal is not selected to be output on the pad. NOTE For GIOx trigger sources, the connection to the MibSPI1 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving the GIOx pin from an external trigger source. If the mux control module is used to select different functionality instead of the GIOx signal, then care must be taken to disable GIOx from triggering MibSPI1 transfers; there is no multiplexing on the input connections.

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7.11.3.2 MIBSPI2 Event Trigger Hookup

Table 7-31. MIBSPI2 Event Trigger Hookup Event # TGxCTRL TRIGSRC[3:0] Trigger Disabled 0000 No trigger source EVENT0 0001 GIOA[0] EVENT1 0010 GIOA[1] EVENT2 0011 GIOA[2] EVENT3 0100 GIOA[3] EVENT4 0101 GIOA[4] EVENT5 0110 GIOA[5] EVENT6 0111 GIOA[6] EVENT7 1000 GIOA[7] EVENT8 1001 N2HET1[8] EVENT9 1010 N2HET1[10] EVENT10 1011 N2HET1[12] EVENT11 1100 N2HET1[14] EVENT12 1101 N2HET1[16] EVENT13 1110 N2HET1[18] EVENT14 1111 Intern Tick counter NOTE For N2HET1 trigger sources, the connection to the MibSPI1 module trigger input is made from the input side of the output buffer (at the N2HET1 module boundary). This way, a trigger condition can be generated even if the N2HET1 signal is not selected to be output on the pad. NOTE For GIOx trigger sources, the connection to the MibSPI1 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving the GIOx pin from an external trigger source. If the mux control module is used to select different functionality instead of the GIOx signal, then care must be taken to disable GIOx from triggering MibSPI1 transfers; there is no multiplexing on the input connections.

7.11.3.3 MIBSPI3 Event Trigger Hookup

Table 7-32. MIBSPI3 Event Trigger Hookup Event # TGxCTRL TRIGSRC[3:0] Trigger Disabled 0000 No trigger source EVENT0 0001 GIOA[0] EVENT1 0010 GIOA[1] EVENT2 0011 GIOA[2] EVENT3 0100 GIOA[3] EVENT4 0101 GIOA[4] EVENT5 0110 GIOA[5] EVENT6 0111 GIOA[6] EVENT7 1000 GIOA[7] EVENT8 1001 H2ET1[8]

PRODUCT□PREVIEW 189 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 7-32. MIBSPI3 Event Trigger Hookup (continued) Event # TGxCTRL TRIGSRC[3:0] Trigger EVENT9 1010 N2HET1[10] EVENT10 1011 N2HET1[12] EVENT11 1100 N2HET1[14] EVENT12 1101 N2HET1[16] EVENT13 1110 N2HET1[18] EVENT14 1111 Intern Tick counter NOTE For N2HET1 trigger sources, the connection to the MibSPI3 module trigger input is made from the input side of the output buffer (at the N2HET1 module boundary). This way, a trigger condition can be generated even if the N2HET1 signal is not selected to be output on the pad. NOTE For GIOx trigger sources, the connection to the MibSPI3 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving the GIOx pin from an external trigger source. If the mux control module is used to select different functionality instead of the GIOx signal, then care must be taken to disable GIOx from triggering MibSPI3 transfers; there is no multiplexing on the input connections.

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7.11.3.4 MIBSPI4 Event Trigger Hookup

Table 7-33. MIBSPI4 Event Trigger Hookup Event # TGxCTRL TRIGSRC[3:0] Trigger Disabled 0000 No trigger source EVENT0 0001 GIOA[0] EVENT1 0010 GIOA[1] EVENT2 0011 GIOA[2] EVENT3 0100 GIOA[3] EVENT4 0101 GIOA[4] EVENT5 0110 GIOA[5] EVENT6 0111 GIOA[6] EVENT7 1000 GIOA[7] EVENT8 1001 N2HET1[8] EVENT9 1010 N2HET1[10] EVENT10 1011 N2HET1[12] EVENT11 1100 N2HET1[14] EVENT12 1101 N2HET1[16] EVENT13 1110 N2HET1[18] EVENT14 1111 Intern Tick counter NOTE For N2HET1 trigger sources, the connection to the MibSPI1 module trigger input is made from the input side of the output buffer (at the N2HET1 module boundary). This way, a trigger condition can be generated even if the N2HET1 signal is not selected to be output on the pad. NOTE For GIOx trigger sources, the connection to the MibSPI1 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving the GIOx pin from an external trigger source. If the mux control module is used to select different functionality instead of the GIOx signal, then care must be taken to disable GIOx from triggering MibSPI1 transfers; there is no multiplexing on the input connections.

7.11.3.5 MIBSPI5 Event Trigger Hookup

Table 7-34. MIBSPI5 Event Trigger Hookup Event # TGxCTRL TRIGSRC[3:0] Trigger Disabled 0000 No trigger source EVENT0 0001 GIOA[0] EVENT1 0010 GIOA[1] EVENT2 0011 GIOA[2] EVENT3 0100 GIOA[3] EVENT4 0101 GIOA[4] EVENT5 0110 GIOA[5] EVENT6 0111 GIOA[6] EVENT7 1000 GIOA[7] EVENT8 1001 N2HET1[8]

PRODUCT□PREVIEW 191 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Table 7-34. MIBSPI5 Event Trigger Hookup (continued) EVENT9 1010 N2HET1[10] EVENT10 1011 N2HET1[12] EVENT11 1100 N2HET1[14] EVENT12 1101 N2HET1[16] EVENT13 1110 N2HET1[18] EVENT14 1111 Intern Tick counter NOTE For N2HET1 trigger sources, the connection to the MibSPI5 module trigger input is made from the input side of the output buffer (at the N2HET1 module boundary). This way, a trigger condition can be generated even if the N2HET1 signal is not selected to be output on the pad. NOTE For GIOx trigger sources, the connection to the MibSPI5 module trigger input is made from the output side of the input buffer. This way, a trigger condition can be generated either by selecting the GIOx pin as an output pin + selecting the pin to be a GIOx pin, or by driving the GIOx pin from an external trigger source. If the mux control module is used to select different functionality instead of the GIOx signal, then care must be taken to disable GIOx from triggering MibSPI5 transfers; there is no multiplexing on the input connections.

PRODUCT□PREVIEW 192 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is cleared. (2) tc(VCLK) = interface clock cycle time = 1 / f(VCLK) (3) For rise and fall timings, see Table 5-4. (4) When the SPI is in Master mode, the following must be true: For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns. The external load on the SPICLK pin must be less than 60pF. (5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17). (6) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register

7.11.4 MibSPI/SPI Master Mode I/O Timing Specifications

Table 7-35. SPI Master Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = output, SPISIMO = output, and SPISOMI = input)(1)(2)(3) NO. Parameter MIN MAX Unit 1 tc(SPC)M Cycle time, SPICLK(4) 40 256tc(VCLK) ns 2(5) tw(SPCH)M Pulse duration, SPICLK high (clock polarity = 0) 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 ns tw(SPCL)M Pulse duration, SPICLK low (clock polarity = 1) 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 3(5) tw(SPCL)M Pulse duration, SPICLK low (clock polarity = 0) 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 ns tw(SPCH)M Pulse duration, SPICLK high (clock polarity = 1) 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 4(5) td(SPCH-SIMO)M Delay time, SPISIMO valid before SPICLK low (clock polarity = 0) 0.5tc(SPC)M – 6 ns td(SPCL-SIMO)M Delay time, SPISIMO valid before SPICLK high (clock polarity = 1) 0.5tc(SPC)M – 6 5(5) tv(SPCL-SIMO)M Valid time, SPISIMO data valid after SPICLK low (clock polarity = 0) 0.5tc(SPC)M – tf(SPC) – 4 ns tv(SPCH-SIMO)M Valid time, SPISIMO data valid after SPICLK high (clock polarity = 1) 0.5tc(SPC)M – tr(SPC) – 4 6(5) tsu(SOMI-SPCL)M Setup time, SPISOMI before SPICLK low (clock polarity = 0) tf(SPC) + 2.2 ns tsu(SOMI-SPCH)M Setup time, SPISOMI before SPICLK high (clock polarity = 1) tr(SPC) + 2.2 7(5) th(SPCL-SOMI)M Hold time, SPISOMI data valid after SPICLK low (clock polarity = 0) 10 ns th(SPCH-SOMI)M Hold time, SPISOMI data valid after SPICLK high (clock polarity = 1) 8(6) tC2TDELAY Setup time CS active until SPICLK high (clock polarity = 0) CSHOLD = 0 C2TDELAY*tc(VCLK) + 2*tc(VCLK) - tf(SPICS) + tr(SPC) – 7 (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tr(SPC) + 5.5 ns CSHOLD = 1 C2TDELAY*tc(VCLK) + 3*tc(VCLK) - tf(SPICS) + tr(SPC) – 7 (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tr(SPC) + 5.5 Setup time CS active until SPICLK low (clock polarity = 1) CSHOLD = 0 C2TDELAY*tc(VCLK) + 2*tc(VCLK) - tf(SPICS) + tf(SPC) – 7 (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tf(SPC) + 5.5 ns CSHOLD = 1 C2TDELAY*tc(VCLK) + 3*tc(VCLK) - tf(SPICS) + tf(SPC) – 7 (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tf(SPC) + 5.5 9(6) tT2CDELAY Hold time SPICLK low until CS inactive (clock polarity = 0) 0.5*tc(SPC)M + T2CDELAY*tc(VCLK) + tc(VCLK) - tf(SPC) + tr(SPICS) - 7 0.5*tc(SPC)M + T2CDELAY*tc(VCLK) + tc(VCLK) - tf(SPC) + tr(SPICS) + 11 ns Hold time SPICLK high until CS inactive (clock polarity = 1) 0.5*tc(SPC)M + T2CDELAY*tc(VCLK) + tc(VCLK) - tr(SPC) + tr(SPICS) - 7 0.5*tc(SPC)M + T2CDELAY*tc(VCLK) + tc(VCLK) - tr(SPC) + tr(SPICS) + 11 ns 10 tSPIENA SPIENAn Sample point (C2TDELAY+1) * tc(VCLK) - tf(SPICS) – 29 (C2TDELAY+1)*tc(VCLK) ns 11 tSPIENAW SPIENAn Sample point from write to buffer (C2TDELAY+2)*tc(VCLK) ns

PRODUCT□PREVIEW 194 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is set. (2) tc(VCLK) = interface clock cycle time = 1 / f(VCLK) (3) For rise and fall timings, see the Table 5-4. (4) When the SPI is in Master mode, the following must be true: For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns. The external load on the SPICLK pin must be less than 60pF. (5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17). (6) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register Table 7-36. SPI Master Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = output, SPISIMO = output, and SPISOMI = input)(1)(2)(3) NO. Parameter MIN MAX Unit 1 tc(SPC)M Cycle time, SPICLK (4) 40 256tc(VCLK) ns 2(5) tw(SPCH)M Pulse duration, SPICLK high (clock polarity = 0) 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 ns tw(SPCL)M Pulse duration, SPICLK low (clock polarity = 1) 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 3(5) tw(SPCL)M Pulse duration, SPICLK low (clock polarity = 0) 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 ns tw(SPCH)M Pulse duration, SPICLK high (clock polarity = 1) 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 4(5) tv(SIMO-SPCH)M Valid time, SPICLK high after SPISIMO data valid (clock polarity = 0.5tc(SPC)M – 6 ns tv(SIMO-SPCL)M Valid time, SPICLK low after SPISIMO data valid (clock polarity = 0.5tc(SPC)M – 6 5(5) tv(SPCH-SIMO)M Valid time, SPISIMO data valid after SPICLK high (clock polarity = 0) 0.5tc(SPC)M – tr(SPC) – 4 ns tv(SPCL-SIMO)M Valid time, SPISIMO data valid after SPICLK low (clock polarity = 1) 0.5tc(SPC)M – tf(SPC) – 4 6(5) tsu(SOMI-SPCH)M Setup time, SPISOMI before SPICLK high (clock polarity = 0) tr(SPC) + 2.2 ns tsu(SOMI-SPCL)M Setup time, SPISOMI before SPICLK low (clock polarity = 1) tf(SPC) + 2.2 7(5) tv(SPCH-SOMI)M Valid time, SPISOMI data valid after SPICLK high (clock polarity = 0) 10 ns tv(SPCL-SOMI)M Valid time, SPISOMI data valid after SPICLK low (clock polarity = 1) 8(6) tC2TDELAY Setup time CS active until SPICLK high (clock polarity = CSHOLD = 0 0.5*tc(SPC)M + (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tr(SPC) – 7 0.5*tc(SPC)M + (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tr(SPC) + 5.5 ns CSHOLD = 1 0.5*tc(SPC)M + (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tr(SPC) – 7 0.5*tc(SPC)M + (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tr(SPC) + 5.5 Setup time CS active until SPICLK low (clock polarity = CSHOLD = 0 0.5*tc(SPC)M + (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tf(SPC) – 7 0.5*tc(SPC)M + (C2TDELAY+2) * tc(VCLK) - tf(SPICS) + tf(SPC) + 5.5 ns CSHOLD = 1 0.5*tc(SPC)M + (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tf(SPC) – 7 0.5*tc(SPC)M + (C2TDELAY+3) * tc(VCLK) - tf(SPICS) + tf(SPC) + 5.5 9(6) tT2CDELAY Hold time SPICLK low until CS inactive (clock polarity = 0) T2CDELAY*tc(VCLK) + tc(VCLK) - tf(SPC) + tr(SPICS) - T2CDELAY*tc(VCLK) + tc(VCLK) - tf(SPC) + tr(SPICS) + ns Hold time SPICLK high until CS inactive (clock polarity = 1) T2CDELAY*tc(VCLK) + tc(VCLK) - tr(SPC) + tr(SPICS) - T2CDELAY*tc(VCLK) + tc(VCLK) - tr(SPC) + tr(SPICS) + ns 10 tSPIENA SPIENAn Sample Point (C2TDELAY+1)* tc(VCLK) - tf(SPICS) – 29 (C2TDELAY+1)*tc(VCLK) ns 11 tSPIENAW SPIENAn Sample point from write to buffer (C2TDELAY+2)*tc(VCLK) ns

PRODUCT□PREVIEW 196 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is cleared. (2) If the SPI is in slave mode, the following must be true: tc(SPC)S ≥ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8]. (3) For rise and fall timings, see Table 5-4. (4) tc(VCLK) = interface clock cycle time = 1 /f(VCLK) (5) When the SPI is in Slave mode, the following must be true: For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns. (6) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).

7.11.5 SPI Slave Mode I/O Timings

Table 7-37. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = input, SPISIMO = input, and SPISOMI = output)(1)(2)(3)(4) NO. Parameter MIN MAX Unit 1 tc(SPC)S Cycle time, SPICLK(5) 40 ns 2(6) tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 0) 14 ns tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 1) 14 3(6) tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 0) 14 ns tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 1) 14 4(6) td(SPCH-SOMI)S Delay time, SPISOMI valid after SPICLK high (clock polarity = 0) trf(SOMI) + 20 ns td(SPCL-SOMI)S Delay time, SPISOMI valid after SPICLK low (clock polarity = 1) trf(SOMI) + 20 5(6) th(SPCH-SOMI)S Hold time, SPISOMI data valid after SPICLK high (clock polarity =0) 2 ns th(SPCL-SOMI)S Hold time, SPISOMI data valid after SPICLK low (clock polarity =1) 6(6) tsu(SIMO-SPCL)S Setup time, SPISIMO before SPICLK low (clock polarity = 4 ns tsu(SIMO-SPCH)S Setup time, SPISIMO before SPICLK high (clock polarity = 7(6) th(SPCL-SIMO)S Hold time, SPISIMO data valid after SPICLK low (clock polarity = 0) 2 ns th(SPCH-SIMO)S Hold time, SPISIMO data valid after S PICLK high (clock polarity = 1) 8 td(SPCL-SENAH)S Delay time, SPIENAn high after last SPICLK low (clock polarity = 0) 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn)+ ns td(SPCH-SENAH)S Delay time, SPIENAn high after last SPICLK high (clock polarity = 1) 1.5tc(VCLK) 2.5tc(VCLK)+ tr(ENAn) + 9 td(SCSL-SENAL)S Delay time, SPIENAn low after SPICSn low (if new data has been written to the SPI buffer) tf(ENAn) tc(VCLK)+tf(ENAn)+27 ns

PRODUCT□PREVIEW 198 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated (1) The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is set. (2) If the SPI is in slave mode, the following must be true: tc(SPC)S ≤ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8]. (3) For rise and fall timings, see Table 5-4. (4) tc(VCLK) = interface clock cycle time = 1 /f(VCLK) (5) When the SPI is in Slave mode, the following must be true: For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns. (6) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17). Table 7-38. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = input, SPISIMO = input, and SPISOMI = output)(1)(2)(3)(4) NO. Parameter MIN MAX Unit 1 tc(SPC)S Cycle time, SPICLK(5) 40 ns 2(6) tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 0) 14 ns tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 1) 14 3(6) tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 0) 14 ns tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 1) 14 4(6) td(SOMI-SPCL)S Dealy time, SPISOMI data valid after SPICLK low (clock polarity = 0) trf(SOMI) + 20 ns td(SOMI-SPCH)S Delay time, SPISOMI data valid after SPICLK high (clock polarity = 1) trf(SOMI) + 20 5(6) th(SPCL-SOMI)S Hold time, SPISOMI data valid after SPICLK high (clock polarity =0) 2 ns th(SPCH-SOMI)S Hold time, SPISOMI data valid after SPICLK low (clock polarity =1) 6(6) tsu(SIMO-SPCH)S Setup time, SPISIMO before SPICLK high (clock polarity = 0) 4 ns tsu(SIMO-SPCL)S Setup time, SPISIMO before SPICLK low (clock polarity = 1) 7(6) tv(SPCH-SIMO)S High time, SPISIMO data valid after SPICLK high (clock polarity = 0) 2 ns tv(SPCL-SIMO)S High time, SPISIMO data valid after SPICLK low (clock polarity = 1) 8 td(SPCH-SENAH)S Delay time, SPIENAn high after last SPICLK high (clock polarity = 0) 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn) + 22 ns td(SPCL-SENAH)S Delay time, SPIENAn high after last SPICLK low (clock polarity = 1) 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn) + 22 9 td(SCSL-SENAL)S Delay time, SPIENAn low after SPICSn low (if new data has been written to the SPI buffer) tf(ENAn) tc(VCLK)+tf(ENAn)+ 27 ns 10 td(SCSL-SOMI)S Delay time, SOMI valid after SPICSn low (if new data has been written to the SPI buffer) tc(VCLK) 2tc(VCLK)+trf(SOMI)+ 28 ns

PRODUCT□PREVIEW 1 2 MII_RX_CLK MII_RXD[3:0] MII_RX_DV MII_RX_ER V ALID 200 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

7.12 Ethernet Media Access Controller

The Ethernet Media Access Controller (EMAC) provides an efficient interface between the device and the network. The EMAC supports both 10Base-T and 100Base-TX, or 10 Mbits/second (Mbps) and 100 Mbps in either half- or full-duplex mode, with hardware flow control and quality of service (QoS) support. The EMAC controls the flow of packet data from the device to the PHY. The MDIO module controls PHY configuration and status monitoring. Both the EMAC and the MDIO modules interface to the device through a custom interface that allows efficient data transmission and reception. This custom interface is referred to as the EMAC control module, and is considered integral to the EMAC/MDIO peripheral. The control module is also used to multiplex and control interrupts.

7.12.1 Ethernet MII Electrical and Timing Specifications

Figure 7-26. MII Receive Timing Table 7-39. MII Receive Timing Parameter Description MIN MAX tsu(GMIIMRXD) Setup time, GMIIMRXD to GMIIMRCLK rising edge 8ns tsu(GMIIMRXDV) Setup time, GMIIMRXDV to GMIIMRCLK rising edge 8ns tsu(GMIIMRXER) Setup time, GMIIMRXER to GMIIMRCLK rising edge 8ns th(GMIIMRXD) Hold time, GMIIMRXD valid after GMIIRCLK rising edge 8ns th(GMIIMRXDV) Hold time, GMIIMRXDV valid after GMIIRCLK rising edge 8ns th(GMIIMRXER) Hold time, GMIIMRXDV valid after GMIIRCLK rising edge 8ns

PRODUCT□PREVIEW MII_TX_CLK MII_TXD[3:0] MII_TXEN V ALID 201 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated Figure 7-27. MII Transmit Timing Table 7-40. MII Transmit Timing Parameter Description MIN MAX td(GMIIMTXD) Delay time, GMIIMTCLK rising edge to GMIIMTXD 5ns 25ns td(GMIIMTXEN) Delay time, GMIIMTCLK rising edge to GMIIMTXEN 5ns 25ns

PRODUCT□PREVIEW RMII_REFCLK RMII_TXEN RMII_TXD[1:0] RMII_RXD[1:0] RMII_CRS_DV RMII_RX_ER 1 1 202 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Peripheral Information and Electrical Specifications Copyright © 2014–2016, Texas Instruments Incorporated

7.12.2 Ethernet RMII Timing

Figure 7-28. RMII Timing Diagram Table 7-41. RMII Timing Requirements NO. Parameter Value Unit MIN NOM MAX 1 tc(REFCLK) Cycle time, RMII_REF_CLK - 20 - ns 2 tw(REFCLKH) Pulse width, RMII_REF_CLK High 7 - 13 ns 3 tw(REFCLKL) Pulse width, RMII_REF_CLK Low 7 - 13 ns 6 tsu(RXD-REFCLK) Input setup time, RMII_RXD valid before RMII_REF_CLK High 4 - - ns 7 th(REFCLK-RXD) Input hold time, RMII_RXD valid after RMII_REF_CLK High 2 - - ns 8 tsu(CRSDV-REFCLK) Input setup time, RMII_CRSDV valid before RMII_REF_CLK High 4 - - ns 9 th(REFCLK-CRSDV) Input hold time, RMII_CRSDV valid after RMII_REF_CLK High 2 - - ns 10 tsu(RXER-REFCLK) Input setup time, RMII_RXER valid before RMII_REF_CLK High 4 - - ns 11 th(REFCLK-RXER) Input hold time, RMII_RXER valid after RMII_REF_CLK High 2 - - ns 4 td(REFCLK-TXD) Output delay time, RMII_REF_CLK High to RMII_TXD valid 2 - 16 ns 5 td(REFCLK-TXEN) Output delay time, RMII_REF_CLK High to RMII_TX_EN valid 2 - 16 ns

PRODUCT□PREVIEW MDCLK MDIO (output) MDCLK MDIO (input) 203 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Peripheral Information and Electrical SpecificationsCopyright © 2014–2016, Texas Instruments Incorporated (1) This is a discrepancy to IEEE 802.3, but is compatible with many PHY devices.

7.12.3 Management Data Input/Output (MDIO)

Figure 7-29. MDIO Input Timing Table 7-42. MDIO Input Timing Requirements NO. Parameter Value Unit MIN MAX 1 tc(MDCLK) Cycle time, MDCLK 400 - ns 2 tw(MDCLK) Pulse duration, MDCLK high/low 180 - ns 3 tt(MDCLK) Transition time, MDCLK - 5 ns 4 tsu(MDIO-MDCLKH) Setup time, MDIO data input valid before MDCLK High 12(1) - ns 5 th(MDCLKH-MDIO) Hold time, MDIO data input valid after MDCLK High 1 - ns Figure 7-30. MDIO Output Timing Table 7-43. MDIO Output Timing Requirements NO. Parameter Value Unit MIN MAX 1 tc(MDCLK) Cycle time, MDCLK 400 - ns 7 td(MDCLKL-MDIO) Delay time, MDCLK low to MDIO data output valid 0 100 ns

PRODUCT□PREVIEW 204 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Applications, Implementation, and Layout Copyright © 2014–2016, Texas Instruments Incorporated

8 Applications, Implementation, and Layout

Information in the following sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.

8.1 TI LaunchPad™

RM57L LaunchPad — This product can be used as a reference design. It includes schematics and layout information.

PRODUCT□PREVIEW 205 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Device and Documentation SupportCopyright © 2014–2016, Texas Instruments Incorporated

9 Device and Documentation Support

9.1 Device Support

9.1.1 Development Support

Texas Instruments (TI) offers an extensive line of development tools for the Hercules™ Safety generation of MCUs, including tools to evaluate the performance of the processors, generate code, develop algorithm implementations, and fully integrate and debug software and hardware modules. The following products support development of Hercules™ -based applications: Software Development Tools

Code Composer Studio™ Integrated Development Environment (IDE) – C/C++ Compiler – Code generation tools – Assembler/Linker – Cycle Accurate Simulator
Application algorithms
Sample applications code Hardware Development Tools
Development and evaluation boards
JTAG-based emulators - XDS100 v2, XDS200, XDS560™ v2 emulator
Flash programming tools
Power supply
Documentation and cables

9.1.2 Device and Development-Support Tool Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all devices.Each device has one of three prefixes: X, P, or null (no prefix) (for example, xRM46L852). These prefixes represent evolutionary stages of product development from engineering prototypes through fully qualified production devices/tools. Device development evolutionary flow: x Experimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow. P Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical specifications. null Fully-qualified production device. x and P devices and TMDX development-support tools are shipped against the following disclaimer: "Developmental product is intended for internal evaluation purposes." Production devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies. Predictions show that prototype devices have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used. Figure 9-1 shows the numbering and symbol nomenclature for the RM57L843.

PRODUCT□PREVIEW RM 5 7 L 8 4 3 B ZWT T R Prefix: X = Experimental Device P = Prototype Device (Removed when Qualified) RM = Real Time Microcontroller CPU: 5 = ARM Cortex-R5F Flash Size: 8 = 4MB flash RAM Size: Peripheral Set: Series Number Architecture: L = Dual CPUs in Lockstep With Caches Shipping Options: R = Tape and Reel Temperature Range: T = –40 C to 105 C o o Package Type: ZWT = 337-Pin Plastic BGA With Pb-Free Solder Ball Die Revision: Blank = Die Revision A B = Die Revision B 4 = 512KB RAM 3 = Ethernet 206 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Device and Documentation Support Copyright © 2014–2016, Texas Instruments Incorporated Figure 9-1. RM57L843 Device Numbering Conventions

PRODUCT□PREVIEW 207 RM57L843 www.ti.com SPNS215B – FEBRUARY 2014–REVISED JANUARY 2016 Submit Documentation Feedback Device and Documentation SupportCopyright © 2014–2016, Texas Instruments Incorporated

9.2 Documentation Support

9.2.1 Related Documentation from Texas Instruments

The following documents describe the RM57L843 microcontroller.. SPNU562 RM57x 16/32-Bit RISC Flash Microcontroller Technical Reference Manual details the integration, the environment, the functional description, and the programming models for each peripheral and subsystem in the device. SPNZ214 RM57x Microcontroller, Silicon Revision A, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision(s). SPNZ233 RM57x Microcontroller, Silicon Revision B, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision(s).

9.2.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates— including silicon errata— go to the product folder for this device, RM57L843. In the upper right-hand corner, click the "Alert me" button. This registers you to receive a weekly digest of product information that has changed (if any). For change details, check the revision history of any revised document.

9.2.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help developers get started with Embedded Processors from Texas Instruments and to foster innovation and growth of general knowledge about the hardware and software surrounding these devices.

9.3 Trademarks

Hercules, LaunchPad, Code Composer Studio, XDS560, E2E are trademarks of Texas Instruments. ETM is a trademark of ARM Limited. ARM, Cortex are registered trademarks of ARM Limited (or its subsidiaries) in the EU and/or elsewhere. All rights reserved. CoreSight is a trademark of ARM Limited (or its subsidiaries) in the EU and/or elsewhere. All rights reserved.. All other trademarks are the property of their respective owners.

9.4 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

9.5 Glossary

TI Glossary This glossary lists and explains terms, acronyms, and definitions.

PRODUCT□PREVIEW 208 RM57L843 SPNS215B –FEBRUARY 2014– REVISED JANUARY 2016 www.ti.com Submit Documentation Feedback Device and Documentation Support Copyright © 2014–2016, Texas Instruments Incorporated

9.6 Device Identification

9.6.1 Device Identification Code Register

The device identification code register is memory mapped to address FFFF FFF0h and identifies several aspects of the device including the silicon version. The details of the device identification code register are provided in Table 9-1. The device identification code register value for this device is:

Rev A = 0x8044AD05
Rev B = 0x8044AD0D 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 CP-15 UNIQUE ID TECH R-1 R-00000000100010 R-0 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 TECH I/O VOLTAGE PERIPH PARITY FLASH ECC RAM ECC VERSION 1 0 1 R-101 R-0 R-1 R-10 R-1 R-00000 R-1 R-0 R-1 LEGEND: R/W = Read/Write; R = Read only; -n = value after reset Figure 9-2. Device ID Bit Allocation Register Table 9-1. Device ID Bit Allocation Register Field Descriptions Bit Field Value Description

31 CP15 Indicates the presence of coprocessor 15

1 CP15 present

30-17 UNIQUE ID 100011 Silicon version (revision) bits. This bitfield holds a unique number for a dedicated device configuration (die). 16-13 TECH Process technology on which the device is manufactured.

0101 F021

12 I/O VOLTAGE I/O voltage of the device. 0 I/O are 3.3v

11 PERIPHERAL

1 Parity on peripheral memories

10 Program memory with ECC

8 RAM ECC Indicates if RAM ECC is present.

1 ECC implemented

2-0 101 The platform family ID is always 0b101

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9.6.2 Die Identification Registers

The two die ID registers at addresses 0xFFFFFF7C and 0xFFFFFF80 form a 64-bit die id with the information as listed in Table 9-2. Table 9-2. Die-ID Registers Item # of Bits Bit Location X Coord. on Wafer 12 0xFFFFFF7C[11:0] Y Coord. on Wafer 12 0xFFFFFF7C[23:12] Wafer # 8 0xFFFFFF7C[31:24] Lot # 24 0xFFFFFF80[23:0] Reserved 8 0xFFFFFF80[31:24]

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9.7 Module Certifications

The following communications modules have received certification of adherence to a standard.

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9.7.1 DCAN Certification

Figure 9-3. DCAN Certification

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9.7.2 LIN Certification

9.7.2.1 LIN Master Mode

Figure 9-4. LIN Certification - Master Mode

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9.7.2.2 LIN Slave Mode - Fixed Baud Rate

Figure 9-5. LIN Certification - Slave Mode - Fixed Baud Rate

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9.7.2.3 LIN Slave Mode - Adaptive Baud Rate

Figure 9-6. LIN Certification - Slave Mode - Adaptive Baud Rate

10 Mechanical Data

10.1 Packaging Information

The following packaging information reflects the most current released data available for the designated device(s). This data is subject to change without notice and without revision of this document.

www.ti.com 1-Feb-2016 Addendum-Page 1 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/Ball Finish (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples PRM57L843ZWTT PREVIEW NFBGA ZWT 337 1 TBD Call TI Call TI -40 to 105 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

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Product Information

PRM57L843ZWTT specifications and overview.

Summary

Microcontroller Based on the ARM

Description

Microcontroller Based on the ARM

Source title PRM57L843ZWTT Datasheet(PDF) - Texas Instruments

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