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Tuesday, Feb 19, 2008 2:04 PM / Precision Low-Input Current Operational Amplifier (Internally Compensated) OP12 ASD0011410 Rev. F Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2008 Analog Devices, Inc. All rights reserved. +-IN +IN OUT NC NC NC TO-99 (J)

1.0 SCOPE

This specification documents the detail requ irements for space qualified product manufactured on Analog Devices, Inc.'s QML certified line per MIL-PRF-38535 Level V except as modified herein. The manufacturing flow described in th e STANDARD SPACE LEVEL PRODUCTS PROGRAM brochure is to be considered a part of this specification. http://www.analog.com/aerospace This data sheet specifically details the space grade version of this product. A more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog.com/OP12 2.0 Part Number. The complete part number(s) of this specification follow: Part Number Description OP12-903J Precision Low-Input Current Operational Amplifier 2.1 Case Outline. Letter Descriptive designator Case Outline (Lead Finish per MIL-PRF-38535) J MACY1-X8 8-Lead metal can (TO) Figure 1 - Terminal connections.

ASD0011410 Rev. F | Page 2 of 4 3.0 Absolute Maximum Ratings. (TA = 25°C, unless otherwise noted) Dice Junction Temperature (T Thermal resistance, junction to ambient ( ΘJA) NOTES: 1. The inputs are shunted with back-to-back diodes for over voltage protection. Therefore, excessive current will flow if a differential input voltage in excess of 1V is applied between the inputs without some limiting resistance. 2. For supply voltages less than ±15V, the absolute maximum input voltage is equal to the supply voltages.

4.0 Electrical Table:

VS = ±15V, RS = 50Ω Unless otherwise specified Sub- group Limit Min Limit Max Units Input Offset Voltage V OS 1 0.15 mV 2, 3 0.35 Input Offset Current I OS 1 0.20 nA 2, 3 0.40 Input Bias Current I B 1 ±2.0 2, 3 ±3.0 Input Voltage Range 1/ I VR 1, 2, 3 ±13 V Common-Mode Rejection CMR 1 104 dB VCM = ±13V 2, 3 100 Power Supply Rejection PSRR 1 7 μV/V VS = ±5V, ±15V 2, 3 10 Output Voltage Swing V O RL = 10kΩ 4, 5, 6 ±13 V RL = 5kΩ 4, 5, 6 ±10 Large-Signal Voltage Gain A VO RL = 10kΩ 4 80 V/mV V O = ±10V RL = 2kΩ 4 50 RL = 5kΩ 5, 6 40 Supply Current I SY V S = ±5V 1 0.6 mA No Load VS = ±15V 2, 3 0.6 1/ IVR is defined as the VCM range used for the CMR test.

ASD0011410 Rev. F | Page 3 of 4

4.1 Electrical Test Requirements:

Test Requirements Subgroups (in accordance with MIL-PRF-38535, Table III) Interim Electrical Parameters 1 Final Electrical Parameters 1, 2, 3, 4, 5, 6 1/ 2/ Group A Test Requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1 2/ Group D end-point electrical parameters 1 Group E end-point electrical parameters 1 1/ PDA applies to Subgroup 1. Delta's excluded from PDA. 2/ See Table III for delta parameters. See table I for conditions. 4.2 Table III. Burn-in test delta limits. Table III TEST BURN-IN LIFETEST DELTA TITLE LIMIT LIMIT LIMIT UNITS VOS ±0.15 ±0.225 0.075 mV

5.0 Life Test/Burn-In Circuit:

5.1 HTRB is not applicable for this drawing. 5.2 Burn-in is per MIL-STD-883 Method 1015 test condition A, B, or C. 5.3 Steady state life test is per MIL-STD-883 Method 1005.

ASD0011410 Rev. F | Page 4 of 4 Rev Description of Change Date A Initiate Feb. 29, 2000 B Add flatpack. Add radiation part number. Exclude Delta's from PDA. Delete reference to unused subgroups in table II. Update Table III. Aug. 21, 2001 C Update web address. Feb. 14, 2002 D Change Table I AC parameters fr om subgroups 1, 2, 3 to subgroups 9, 10, 11. (SINAD, THD, PS, Σ 2nd, and Σ 3nd. Jan. 9, 2003 E Delete burn-in circuit Aug. 5, 2003 F Update header/footer and add to 1.0 scope description. Feb. 15, 2008 © 2008 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective companies. Printed in the U.S.A. 02/08