MTIL113 MOTOROLA | Alldatasheet

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Technical content

1Motorola Optoelectronics Device Data /C0054/C0045/C0080/C0105/C0110 /C0068/C0073/C0080 /C0079/C0112/C0116/C0111/C0105/C0115/C0111/C0108/C0097/C0116/C0111/C0114/C0115 /C0068/C0097/C0114/C0108/C0105/C0110/C0103/C0116/C0111/C0110 /C0079/C0117/C0116/C0112/C0117/C0116 The MTIL113 device consists of a gallium arsenide infrared emitting diode optically coupled to a monolithic silicon photodarlington detector. This device is designed for use in applications requiring high collector output currents at lower input currents.

  • Higher Sensitivity to Low Input Drive Current
  • Meets or Exceeds All JEDEC Registered Specifications

Applications

  • Low Power Logic Circuits
  • Interfacing and coupling systems of different potentials and impedances
  • Telecommunications Equipment
  • Portable Electronics
  • Solid State Relays MAXIMUM RATINGS (TA = 25°C unless otherwise noted) Rating Symbol Value Unit INPUT LED Reverse Voltage VR 3 Volts Forward Current — Continuous IF 60 mA LED Power Dissipation @ TA = 25°C Derate above 25°C PD 100 1.41 mW mW/ °C OUTPUT DETECTOR Collector–Emitter Voltage VCEO 30 Volts Emitter–Collector Voltage VECO 5 Volts Collector–Base Voltage VCBO 30 Volts Collector Current — Continuous IC 125 mA Detector Power Dissipation @ TA = 25°C Derate above 25°C PD 150 1.76 mW mW/ °C TOTAL DEVICE Isolation Surge Voltage(2) (Peak ac Voltage, 60 Hz, 1 sec Duration) VISO 7500 Vac(pk) Total Device Power Dissipation @ TA = 25°C Derate above 25°C PD 250 2.94 mW mW/ °C Ambient Operating Temperature Range(3) TA –55 to +100 °C Storage Temperature Range(3) Tstg –55 to +150 °C Soldering Temperature (10 sec, 1/16″ from case) TL 260 °C 1. All Motorola 6–Pin devices exceed JEDEC specification and are 7500 Vac(pk). 2. Isolation surge voltage is an internal device dielectric breakdown rating. For this test, Pins 1 and 2 are common, and Pins 4, 5 and 6 are common. 3. Refer to Quality and Reliability Section in Opto Data Book for information on test conditions. Order this document by MTIL113/D /C0077/C0079/C0084/C0079/C0082/C0079/C0076/C0065 SEMICONDUCTOR TECHNICAL DATA /C0077/C0084/C0073/C0076/C0049/C0049/C0051 STANDARD THRU HOLE STYLE 1 PLASTIC SCHEMATIC PIN 1. LED ANODE 2. LED CATHODE 3. N.C. 4. EMITTER 5. COLLECTOR 6. BASE  Motorola, Inc. 1997

2 Motorola Optoelectronics Device Data

  1. Always design to the specified minimum/maximum electrical limits (where applicable).
  2. Current Transfer Ratio (CTR) = IC /IF x 100%.
  3. Pulse Test: Pulse Width = 300 µs, Duty Cycle /C0112 2%.
  4. For this test, Pins 1 and 2 are common and Pins 4, 5 and 6 are common.
  5. Isolation Surge Voltage, VISO, is an internal device dielectric breakdown rating.
  6. For test circuit setup and waveforms, refer to Figures 8 and 9.

Figure 1. Forward Voltage versus Forward Current Figure 2. Normalized Non–Saturated and

Figure 3. Normalized Non–Saturated and Saturated Figure 4. Normalized Collector–Base Photocurrent Figure 5. Non–Saturated and Saturated HFE versus Figure 6. Low to High Propagation Delay versus Figure 7. High to Low Propagation Delay versus

1.0 K/C0087

4 Motorola Optoelectronics Device Data

Figure 8. Switching Waveform Figure 9. Switching Schematic Opportunity/Affirmative Action Employer. Mfax is a trademark of Motorola, Inc.