MRF6S19200HR3 FREESCALE | Alldatasheet
Document overview
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- PDF pages: 12
Technical content
Features
- 100% PAR Tested for Guaranteed Output Power Capability
- Characterized with Series Equivalent Large-Signal Impedance Parameters
- Internally Matched for Ease of Use
- Integrated ESD Protection
- Greater Negative Gate-Source Voltage Range for Improved Class C Operation
- Optimized for Doherty Applications
- RoHS Compliant
- In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
Table 1. Maximum Ratings Table 2. Thermal Characteristics
- Continuous use at maximum temperature will affect MTTF.
- MTTF calculator available at http://www.freescale.com/rf . Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product. Select Documentation/Application Notes - AN1955. © Freescale Semiconductor, Inc., 2008. All rights reserved.
Table 3. ESD Protection Characteristics Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted) CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset.
- Part internally matched both on input and output. (continued)
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted) (continued)
Figure 1. MRF6S19200HR3(HSR3) Test Circuit Schematic Table 5. MRF6S19200HR3(HSR3) Test Circuit Component Designations and Values
Figure 2. MRF6S19200HR3(HSR3) Test Circuit Component Layout
Figure 3. Output Peak-to-Average Ratio Compression (PARC) Broadband Performance @ Pout = 56 Watts Avg. Figure 4. Output Peak-to-Average Ratio Compression (PARC) Broadband Performance @ Pout = 87 Watts Avg. Figure 5. Two-Tone Power Gain versus Figure 6. Third Order Intermodulation Distortion
3.84 MHz Channel Bandwidth
Figure 12. MTTF versus Junction Temperature is operated at VDD = 28 Vdc, Pout = 56 W Avg., and ηD = 29.5%. Figure 13. CCDF W-CDMA 3GPP , Test Model 1,
64 DPCH, 50% Clipping, Single-Carrier Test Signal
Channel Bandwidth @ ±5 MHz Offset.
3.84 MHz
Figure 14. Single-Carrier W-CDMA Spectrum
Figure 15. Series Equivalent Source and Load Impedance
MRF6S19200HR3 MRF6S19200HSR3 PACKAGE DIMENSIONS NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M−1994. 2. CONTROLLING DIMENSION: INCH. 3. DELETED 4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY. DIM MIN MAX MIN MAX MILLIMETERSINCHES A 1.335 1.345 33.91 34.16 B 0.380 0.390 9.65 9.91 C 0.125 0.170 3.18 4.32 D 0.495 0.505 12.57 12.83 E 0.035 0.045 0.89 1.14 F 0.003 0.006 0.08 0.15 G 1.100 BSC 27.94 BSC H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33 N 0.772 0.788 19.60 20.00 Q .118 .138 3.00 3.51 R 0.365 0.375 9.27 9.53 STYLE 1: PIN 1. DRAIN 2. GATE 3. SOURCE D G K C E H S F S 0.365 0.375 9.27 9.52 M 0.774 0.786 19.66 19.96 aaa 0.005 REF 0.127 REF bbb 0.010 REF 0.254 REF ccc 0.015 REF 0.381 REF Q2X MAMbbb B MT MAMbbb B MT B B (FLANGE) SEATING PLANE MAMccc B MT MAMbbb B MT AA (FLANGE) T N (LID) M (INSULATOR) MAMaaa B MT (INSULATOR) R MAMccc B MT (LID) CASE 465-06 ISSUE G NI-780 MRF6S19200HR3 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M−1994. 2. CONTROLLING DIMENSION: INCH. 3. DELETED 4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY FROM PACKAGE BODY. DIM MIN MAX MIN MAX MILLIMETERSINCHES A 0.805 0.815 20.45 20.70 B 0.380 0.390 9.65 9.91 C 0.125 0.170 3.18 4.32 D 0.495 0.505 12.57 12.83 E 0.035 0.045 0.89 1.14 F 0.003 0.006 0.08 0.15 H 0.057 0.067 1.45 1.70 K 0.170 0.210 4.32 5.33 M 0.774 0.786 19.61 20.02 R 0.365 0.375 9.27 9.53 STYLE 1: PIN 1. DRAIN 2. GATE 5. SOURCE D K C E H F U (FLANGE) Z (LID) bbb 0.010 REF 0.254 REF ccc 0.015 REF 0.381 REF aaa 0.005 REF 0.127 REF S 0.365 0.375 9.27 9.52 N 0.772 0.788 19.61 20.02 MAMbbb B MT B B (FLANGE) SEATING PLANE MAMccc B MT MAMbbb B MT A A (FLANGE) T N (LID) M (INSULATOR) MAMccc B MT MAMaaa B MT R (LID) S (INSULATOR) CASE 465A-06 ISSUE H NI-780S MRF6S19200HSR3
MRF6S19200HR3 MRF6S19200HSR3 RF Device Data Freescale Semiconductor PRODUCT DOCUMENTATION Refer to the following documents to aid your design process. Application Notes
- AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins
- EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document. Revision Date Description 0 Mar. 2008 • Initial Release of Data Sheet
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