MMA7660FC FREESCALE | Alldatasheet
Document overview
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Technical content
Datasheet sections
Features
- Digital Output (I 2C)
- 3mm x 3mm x 0.9mm DFN Package
- Low Power Current Consum ption: Off Mode: 0.4 µA, Standby Mode: 2 µA, Active Mode: 47 µA at 1 ODR
- Configurable Samples per Second from 1 to 120 samples a second.
- Low Voltage Operation: – Analog Voltage: 2.4 V - 3.6 V – Digital Voltage: 1.71 V - 3.6 V
- Auto-Wake/Sleep Feature for Low Power Consumption
- Tilt Orientation Detection for Portrait/Landscape Capability
- Gesture Detection Including Shake Detection and Tap Detection
- Robust Design, High Shocks Survivability (10,000 g)
- RoHS Compliant
- Halogen Free
- Environmentally Preferred Product
- Low Cost Typical Applications
- Mobile Phone/ PMP/PDA: Orientatio n Detection (Portrait/Landscape), Image Stability, Text Scroll, Motion Dialing, Tap to Mute
- Laptop PC: Anti-Theft
- Gaming: Motion Detection, Auto-Wake/Sleep For Low Power Consumption
- Digital Still Camera: Image Stability
ORDERING INFORMATION
Part Number Temperature Range Package Shipping MMA7660FCT –40 to +85°C DFN-10 Tray MMA7660FCR1 –40 to +85°C DFN-10 7” Tape & Reel
10 LEAD
MMA7660FC: XYZ-AXIS ACCELEROMETER ±1.5 g Bottom View Top View N/C DVDD DVSS SDA SCL RESERVED N/C AVDD AVSS INT 5 6 Figure 1. Pin Connections
Auto-Wake: Sleep Mode (uses AMSR sample rate in SR [0x08] register) Auto-Sleep: Run Mode (uses AWSR sample rate in SR [0x08] register) PMP: Portable Media Player PDA: Personal Digital Assistant DFN: Dual Flat No Lead ESD: Electro Static Discharge ODR: Output Data Rate MEMS: Microelectromechanical Systems
Figure 1. Pinout Table 1. Pin Description Figure 2. I2C Connection to MCU
1 RESERVED Connect to AVSS Input
2 N/C No Internal Connection, leave
3 AVDD Device Power Input
4 AVSS Device Ground Input
8 DVSS Digital I/O Ground Input
9 DVDD Digital I/O Power Input
10 N/C No Internal Connection,
from noise on the power supply.
Figure 3. Simplified Accelerometer Functional Block Diagram WARNING: This device is sensitive to electrostatic discharge. the user to protect the chip from ESD. A charge of over 2000 V can accumulate on the human body or associated test equipment. precautions should be followed to avoid exposing the device to discharges which may be detrimental to its performance. Table 2. Maximum Ratings Table 3. ESD And Latch-up Protection Characteristics
- These parameters are tested in production at final test.
- Assuming VDD power on slope is < 1 ms.
- A measure of the devices ability to reject an acceleration applied 90° from the true axis of sensitivity.
- Noise is defined as quantiles given to a sample size. These are the occurrences of noise: 94% = ±1 count, 5% = ±2 counts, and 1% = ±3
Table 4. Operating Characteristics
g-cell is a mechanical structure formed from semiconductor materials (polysilicon) using masking and etching processes. digital output that is proportional to acceleration. Figure 4. Simplified Transducer Physical Model
consumption options. The sensor is only capable of running in one of these modes at a time. analog supply. See Figure 5. In this mode, there is no analog supply and all I2C activity is ignored. the MODE (0x07) control register by accessing the mode bit in the Mode register. selected the power consumption will vary. Figure 5. State Machine of Modes Table 5. Modes Of Operation supply. I2C activity is ignored. desired. MMA7660FC's sensor measurement system is idle. Auto-Sleep, but not Auto-Wake.
Freescale Semiconductor 11 MMA7660FC CONFIGURABLE SAMPLES PER SECONDS AND INTERRUPT SETTINGS The device can be configured into 8 different samples per seconds including: 1 sample/second, 2 samples/second, 4 samples/second, 8 samples/second, 16 samples/second, 32 samples/second, 64 samples/second, and 120 samples/second, The user can specify the samples per second for their particular application, deciding on the trade off between power consumption and number of samples, this can be configured in the SR (0x08) register. Once the user configurable samples per second is chosen, the device will update the data for all 3 axes in the register at a resolution of 6-bits/axis. The user can choose to enable/disable any of the following interrupts in the INTSU (0x06) register: Front/Back Interrupt, Up/Down/Left/Right Interrupt, Tap Detection Interrupt, GINT (real-time motion tracking), Shake on X-axis, Shake on Y-axis, and Shake on Z-axis. If the GINT is enabled, real-time motion tracking can be configured to trigger an interrupt after every sensor data update: 1s (1 sample/second), 500 ms (2 samples/second), 250 ms (4 samples/second), 125 ms (8 samples/second), 62.5 ms (16 samples/second), 31.25 ms (32 samples/second), 15.625 ms (64 samples/second), or 8.36 ms (120 samples/ second). If any of the shake axis interrupts are enabled; excessive agitation, greater than 1.3 g, will trigger an interrupt. If either the Up/Down/Left/Right Interrupt or the Front/Back Interrupt is enabled, any change in orientation will generate an interrupt. When the Auto-Wake feature is enabled, and the Auto-Sleep counter elapses an interrupt will occur. When the device is in Auto-Sleep state, if a shake interrupt, tap interrupt, Delta G, or orientation detection interrupt occur, the device will go out of sleep state and into wake state. POWER SAVING FEATURES The MMA7660FC includes a range of user configurable power saving features. The device’s samples per second can be set over a wide range from 1 to 120 samples a second; the operating current is directly proportional to samples per second. The analog supply AVDD can be powered down to put the MMA7660FC into Off Mode, which typically draws 0.4 µA. The Auto-Wake/ Sleep feature can toggle the sampling rate from a higher user selected samples per second to a lower user selected samples per second, changing based on if motion is detected or not. The user can choose to use any of the above options to configure the part and make it have the optimal power consumption level for the desired application. TESTING THE LOGIC CHAIN MMA7660FC can be put into Test Mode, which disables accelerometer measurements and instead allows the user to write 6-bit values directly to the three axis data registers, thus simulating real time accelerometer measurements. The state machine will respond to these values according to the enabled features and functions, allowing them to be validated. NOTE: MMA7660FC does not include an accelerometer self test function, which is typically an electrostatic force applied to each axis to cause it to deflect. The Sensor employs both analog and digital filtering to ensure low noise and accurate output when using the part for Shake, Tap, or Orientation Detection. During Active Mode, the data is filtered and stored for each of the 3 axes at the specified following measurement intervals: 1s (1 sample/second), 500 ms (2 samples/second), 250 ms (4 samples/second), 125 ms (8 samples/second), 62.5 ms (16 samples/second), 31.25 ms (32 samples/second), 15.625 ms (64 samples/second), or 8.36 ms (120 samples/second) or indicated in AMSR [2:0]. The 6-bit measurement data is stored in the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers and is used to update the Shake, Alert, Tap, PoLa[2:0] (updates Up, Down, Left, and Right position), and BaFro[1:0] (updates Back and Front position) in the TILT (0x03) register used for orientation detection. The customer can configure the part by enabling a number of user- desired interrupts in the INTSU (0x06) register. Once the interrupts are enabled a change in filtered readings will cause an interrupt to occur depending on the output. The filters that are being used by this sensor is the analog filtering, digital noise filtering of measurements used for orientation detection and updated in the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers. The filtering method used is to oversample each axis by taking 32 readings, and then calculate the average for the output measurement data as a finite impulse response filter. NOTE: Sensor Measurements are NOT taken in Standby Mode or in Test Mode. Table 6. Feature Summary Table
- If FILT [2:0] = 000, then the new values for Left, Right, Up, Do wn, Back, and Front are updated in the TILT (0x03) register (PoLa [2:0] and BaFro [1:0]) after every reading without any further analysis.
- If FILT [2:0] = 001 – 111, then the sensor requires the computed values for Left, Right, Up, Down, Back, and Front to be the same from 1-7 consecutive readings (depending on the value in FILT [2:0], before updating the values stored in TILT (0x03) register (PoLa [2:0] and BaFro [1:0]). The debounce counter is reset after a mismatched reading or the TILT (0x03) register is updated (if the orientation condition is met).
Figure 6. Orientation Detection Logic in 3-Dimensional Space Table 7. Orientation Detection Logic of when Interrupt will Occur
detects a fast transition that exceeds a user-defined threshold (PDET (0x09) register) for a set duration (PD (0x0A) register). will update at the 120 samples/second. process orientation detection data. Tap detection will resume when the TILT (0x03) register is read. change) which can not be detected by orientation detection. SHINTY , and/or SHINTZ in the INTSU (0x06) register. independently, but a common Shake bit in the TILT register is set when shake is detected in any one of the selected axes. Therefore when all three (SHINTX, SHINTY, and/or SHINTZ) are selected the sensor will not know what axis the shake occurred. detection monitoring starts again. high. The device can be programmed to continually cycle between Auto-Wake/Sleep. set, the device is powered on in, in sleep state. If the ASW bit is set, the device is powered on in, in wake state. Table 8. Auto-Wake/Sleep Truth Table
NOTE: To write to the registers the MODE bit in the MODE (0x07) register must be set to 0, placing the device in Standby Mode. Signed byte 6-bit 2’s complement data with allowable range of +31 to -32. XOUT[5] is 0 if the g direction is positive, 1 if the g direction is negative. Signed byte 6-bit 2’s complement data with allowable range of +31 to -32. YOUT[5] is 0 if the g direction is positive, 1 if the g direction is negative. Signed byte 6-bit 2’s complement data with allowable range of +31 to -32. ZOUT[5] is 0 if the g direction is positive, 1 if the g direction is negative. Table 9. User Register Summary
Freescale Semiconductor 15 MMA7660FC $03: Tilt Status (Read only) TILT BaFro[1:0] 00:Unknown condition of front or back 01: Front: Equipment is lying on its front 10: Back: Equipment is lying on its back PoLa[2:0] 000: Unknown condition of up or down or left or right 001: Left: Equipment is in landscape mode to the left 010: Right: Equipment is in landscape mode to the right 101: Down: Equipment standing vertically in inverted orientation 110: Up: Equipment standing vertically in normal orientation Tap 1: Equipment has detected a tap 0: Equipment has not detected a tap Alert 0: Register data is valid 1: The register was read at the same time as MMA7660FC was attempting to update the contents. Re-read the register Shake 0: Equipment is not experiencing shake in one or more of the axes enabled by SHINTX, SHINTY, and SHINTZ 1: Equipment is experiencing shake in one or more of the axes enabled by SHINTX, SHINTY, and SHINTZ Note: When entering active mode from standby mode, if the device is flat (±1g on Z-axis) the value for BaFro will be back (-1g) or front (+1g) but PoLa will be in unknown condition. if the device is being held in an Up/Down/Right/Left position, the PoLa value will be updated with current orientation, but BaFro will be in unknown condition. $04: Sample Rate Status Register (Read only) SRST AMSRS 0: Samples per second specified in AMSR[2:0] is not active 1: Samples per second specified in AMSR[2:0] is active AWSRS 0: Samples per second specified in AWSR[1:0] is not active 1: Samples per second specified in AWSR[1:0] is active $05: Sleep Count Register (Read/Write) SPCNT Writing to the SPCNT (0x05) register resets the internal sleep counter. SC[7:0] Sets the 8-bit maximum count value for the 8-bit internal sleep counter in Auto-Sleep. When the 8-bit internal sleep counter reaches the value set by SC[7:0], MMA7660FC will exit Auto-Sleep and switch to the samples per second specified in AWSR[1:0] of the SR (0x08) register. D7 D6 D5 D4 D3 D2 D1 D0 Shake Alert Tap PoLa[2] PoLa[1] PoLa[0] BaFro[1] BaFro[0] 0000000 0 D7 D6 D5 D4 D3 D2 D1 D0
000000 A W S R S A M S R S
S C [ 7 ]S C [ 6 ]S C [ 5 ]S C [ 4 ]S C [ 3 ]S C [ 2 ]S C [ 1 ]S C [ 0 ] 00000000
Freescale Semiconductor 16 MMA7660FC $06: Interrupt Setup Register INTSU FBINT 0: Front/Back position change does not cause an interrupt 1: Front/Back position change causes an interrupt PLINT 0: Up/Down/Right/Left position change does not cause an interrupt 1: Up/Down/Right/Left position change causes an interrupt PDINT 0: Successful tap detection does not cause an interrupt 1: Successful tap detection causes an interrupt ASINT 0: Exiting Auto-Sleep does not cause an interrupt 1: Exiting Auto-Sleep causes an interrupt GINT 0: There is not an automatic interrupt after every measurement 1: There is an automatic interrupt after every measurement, when g-cell readings are updated in XOUT, YOUT, ZOUT registers, regardless of whether the readings have changed or not. This interrupt does not affect the Auto-Sleep or Auto- Wake functions. SHINTX 0: Shake on the X-axis does not cause an interrupt or set the Shake bit in the TILT register 1: Shake detected on the X-axis causes an interrupt, and sets the Shake bit in the TILT register SHINTY 0: Shake on the Y-axis does not cause an interrupt or set the Shake bit in the TILT register 1: Shake detected on the Y-axis causes an interrupt, and sets the Shake bit in the TILT register SHINTZ 0: Shake on the Z-axis does not cause an interrupt or set the Shake bit in the TILT register 1: Shake detected on the Z-axis causes an interrupt, and sets the Shake bit in the TILT register. The active interrupt condition (IRQ = 0 if IAH = 0, IRQ = 1 if IAH = 1) is released during the acknowledge bit of the slave address transmission of the first subsequent I2C to MMA7660FC after the interrupt was asserted. D7 D6 D5 D4 D3 D2 D1 D0 SHINTX SHINTY SHINTZ GINT ASINT PDINT PLINT FBINT 00000000
the Mode register resets sleep timing. NOTE: The device must be placed in Standby Mode to change the value of the registers. Active mode, set MMA766FC to Standby Mode (MODE = TON = 0), then enter Test Mode (MODE = 0, TON = 1). per second specified in AMSR[2:0] of the SR (0x08) register. Existing state of MODE bit must be 0, to write TON = 1. Device must be in Standby Mode. status and generate interrupts just like Active Mode. second specified in AWSR[1:0] of the SR (0x08) register. per second specified in AMSR[2:0] of the SR (0x08) register. second specified in AMSR[2:0] of the SR (0x08) register. 256 times the prescaled clock (see Table 12). the prescaled clock (see Table 12). transmission of the first subsequent I2C to the device after the interrupt was asserted. Table 10. Modes
NOTE: If interrupts are enabled, interrupts will behave normally in all conditions stated in Table 11. Table 12. Sleep Counter Timeout Ranges Table 11. ASE/AWE Conditions
1 SPS 1 s 256 s 16 s 4096 s
Freescale Semiconductor 19 MMA7660FC AMSR[2:0] NAME DESCRIPTION
000 AMPD Tap Detection Mode and 120 Samples/Second Active and Auto-Sleep Mode
Tap Detection Sampling Rate: The device takes readings continually at a rate of nominally 3846 g-cell measurements a second. It then filters these high speed measurements by maintaining continuous rolling averages of the current and last g-cell measurements. The averages are updated every 260 µs to track fast moving accelerations. Tap detection: itself compares the two filtered axis responses (fast and slow) described above for each axis. The absolute (unsigned) difference between the fast and slow axis responses is compared against the tap detection delta threshold value PDTH[4:0] in the PDET (0x09) register. For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 8.36 ms in Active Mode and Auto-Sleep. The update rate is 120 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
001 AM64 64 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 15.625 ms in Active Mode and Auto-Sleep. The update rate is 64 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
010 AM32 32 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 31.25 ms in Active Mode and Auto-Sleep. The update rate is 32 samples per second. These measurements update XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
011 AM16 16 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 62.5 ms in Active Mode and Auto-Sleep. The update rate is 16 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
100 AM8 8 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 125 ms in Active Mode and Auto-Sleep. The update rate is 8 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
101 AM4 4 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 250 ms in Active Mode and Auto-Sleep. The update rate is 4 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
110 AM2 2 Samples/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 500 ms in Active Mode and Auto-Sleep. The update rate is 2 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
111 AM1 1 Sample/Second Active and Auto-Sleep Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 1000 ms in Active Mode and Auto-Sleep. The update rate is 1 sample per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
Freescale Semiconductor 20 MMA7660FC AWSR[1:0] NAME DESCRIPTION
00 AW32 32 Samples/Second Auto-Wake Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 31.25 ms in Auto-Wake. The update rate is 32 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
01 AW16 16 Samples/Second Auto-Wake Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 62.5 ms in Auto-Wake. The update rate is 16 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
10 AW8 8 Samples/Second Auto-Wake Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 125 ms in Auto-Wake. The update rate is 8 samples per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also.
11 AW1 1 Sample/Second Auto-Wake Mode
For portrait/landscape detection: The device takes and averages 32 g-cell measurements every 1000 ms in Auto-Wake. The update rate is 1 sample per second. These measurements update the XOUT (0x00), YOUT (0x01), and ZOUT (0x02) registers also. FILT[2:0] DESCRIPTION 000 Tilt debounce filtering is disabled. T he device updates portrait/landscape every reading at the rate set by AMSR[2:0] or AWSR[1:0] 001 2 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 010 3 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 011 4 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 100 5 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 101 6 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 110 7 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register. 111 8 measurement samples at the rate set by AMSR[2:0] or AWSR[1:0] have to match before the device updates portrait/ landscape data in TILT (0x03) register.
Freescale Semiconductor 21 MMA7660FC $09: Tap/Pulse Detection Register (Read/Write) PDET NOTE: If XDA = YDA = ZDA = 0, samples per second is 120 samples/second, and Auto-Wake/Sleep feature is enabled, the tap interrupt will reset the sleep counter. XDA 1: X-axis is disabled for tap detection 0: X-axis is enabled for tap detection YDA 1: Y-axis is disabled for tap detection 0: Y-axis is enabled for tap detection ZDA 1: Z-axis is disabled for tap detection 0: Z-axis is enabled for tap detection $0A: PD: Tap/Pulse Debounce Count Register (Read/Write) D7 D6 D5 D4 D3 D2 D1 D0 ZDA YDA XDA PDTH[4] PDTH[3] PDTH[2] PDTH[1] PDTH[0] 0 0 000000 PDTH[4:0] DESCRIPTION 00000 Tap detection threshold is ±1 count00001
00010 Tap detection threshold is ±2 counts
00011 Tap detection threshold is ±3 counts
11101 Tap detection threshold is ±29 counts
11110 Tap detection threshold is ±30 counts
11111 Tap detection threshold is ±31 counts
PD[7] PD[6] PD[5] PD[4] PD[3] PD[2] PD[1] PD[0] 00000000 PD[4:0] DESCRIPTION 00000000 The tap detection debounce filtering requires 2 adjacent tap det ection tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 0.52 ms.00000001 00000010 Tap detection debounce filtering requires 3 adjacent tap detect ion tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 0.78 ms. 00000011 Tap detection debounce filtering requires 4 adjacent tap detect ion tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 1.04 ms. 11111101 Tap detection debounce filtering requires 254 adjacent tap detec tion tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 66.04 ms. 11111110 Tap detection debounce filtering requires 255 adjacent tap detec tion tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 66.3 ms. 11111111 Tap detection debounce filtering requires 256 adjacent tap detec tion tests to be the same to trigger a tap event and set the Tap bit in the TILT (0x03) register, and optionally set an interrupt if PDINT is set in the INTSU (0x06) register. Tap detection response time is nominally 66.56 ms.
Freescale Semiconductor 25 MMA7660FC APPENDIX A – PACKAGE REQUIREMENTS FOR MMA7660FC Minimum Recommended Footprint for Surface Mounted Applications Surface mount board layout is a critical portion of the total design. The footprint for the surface mount packages must be the correct size to ensure proper solder connection interface between the board and the package. With the correct footprint, the packages will self-align when subjected to a solder reflow process. It is always recommended to design boards with a solder mask layer to avoid bridging and shorting between solder pads. Soldering And Mounting Guidelines for the DFN Accelerometer Sensor to a PC Board These guidelines are for soldering and mounting the Dual Flat No-Lead (DFN) package inertial sensors to printed circuit boards (PCBs). The purpose is to minimize the stress on the package after board mounting. The MMA7660 digital output accelerometer uses the DFN package platform. This section describes suggested methods of soldering these devices to the PC board for consumer applications. Pages 31, 32, and 33 show the package outline drawing for the package. Overview of Soldering Considerations Information provided here is based on experiments executed on DFN devices. They do not represent exact conditions present at a customer site. Hence, information herein should be used as guidance only and process and design optimizations are recommended to develop an application specific solution. It should be noted that with the proper PCB footprint and solder stencil designs the package will self-align during the solder reflow process. The following are the recommended guidelines to follow for mounting DFN sensors for consumer applications. Halogen Content This package is designed to be Halogen Free, exceeding most industry and customer standards. Halogen Free means that no homogeneous material within the assembly package shall contain chlorine (Cl) in excess of 700 ppm or 0.07% weight/weight or bromine (Br) in excess of 900 ppm or 0.09% weight/weight. Note: Halogen Free is only compliant to the MMA7660FC, not to the packaging material. PCB Mounting Recommendations 1. The PCB land should be designed with Non Solder Mask Defined (NSMD) as shown in Figure 16 and Figure 17. 2. No additional via pattern underneath package. 3. PCB land pad is 0.825 mm x 0.3 mm as shown in Figure 16 and Figure 17. 4. Do not solder down smaller side tabs on either end of the package. 5. The solder mask opening is equal to the size of the PCB land pad plus 0.15 mm. 6. The stencil aperture size is equal to the PCB land pad – minus 0.03 mm total. 7. Stencil thickness should be 75 μm. 8. Do not place any components or vias at a distance less t han 2 mm from the package land area. This may cause additional package stress if it is too close to the package land area. 9. Signal traces connected to pads should be as symmetric as possible. Put dummy traces on NC pads in order to have same length of exposed trace for all pads. Signal traces with 0.15 mm width and minimum 0.5 mm length for all PCB land pads near the package are recommended as shown in Figure 16 and Figure 17. Wider trace can be continued after the 0.5 mm zone. 10. Use a standard pick and place process and equipment. Do not use a hand soldering process. 11. It is recommended to use a no clean solder paste. 12. Do not use a screw down or stacking to fix the PCB into an enclosure because this could bend the PCB putting stress on the package. 13. The PCB should be rated for the multiple lead-f ree reflow condition with max 260°C temperature. 14. No copper traces on top layer of PCB under the package . This will cause planarity issues with board mount. Freescale DFN sensors are compliant with Restrictions on Hazardous Substances (RoHS), having halide free molding compound (green) and lead-free terminations. These terminations are compatible with tin-lead (Sn-Pb) as well as tin-silver- copper (Sn-Ag-Cu) solder paste soldering processes. Reflow profiles applicable to those processes can be used successfully for soldering the devices.
Freescale Semiconductor 28 MMA7660FC APPENDIX C - MMA7660FC ACQUISITION CODE TABLE 6-bit result Binary 2's Comp g value Angle X or Y Angle Z 0 0 0 0.000g 0.00° 90.00° 1 1 1 0.047g 2.69° 87.31° 2 10 2 0.094g 5.38° 84.62° 3 11 3 0.141g 8.08° 81.92° 4 100 4 0.188g 10.81° 79.19° 5 101 5 0.234g 13.55° Z-axis must be in the range 76.45° 6 110 6 0.281g 16.33° 73.67° 7 111 7 0.328g 19.16° 70.84° 8 1000 8 0.375g 22.02° 67.98° 9 1001 9 0.422g 24.95° 65.05° 10 1010 10 0.469g 27.95° 62.05° 11 1011 11 0.516g 31.04° 58.96° 12 1100 12 0.563g 34.23° 55.77° 13 1101 13 0.609g 37.54° 52.46° 14 1110 14 0.656g 41.01° 48.99° 15 1111 15 0.703g 44.68° 45.32° 16 10000 16 0.750g 48.59° 41.41° 17 10001 17 0.797g 52.83° 37.17° 18 10010 18 0.844g 57.54° 32.46° 19 10011 19 0.891g 62.95° 27.05° 20 10100 20 0.938g 69.64° 20.36° 21 10101 21 0.984g 79.86° 10.14° 22 10110 22 1.031g 23 10111 23 1.078g 24 11000 24 1.125g 25 11001 25 1.172g 26 11010 26 1.219g 27 11011 27 1.266g 28 11100 28 1.313g Shaken 29 11101 29 1.359g Shaken 30 11110 30 1.406g Shaken 31 11111 31 1.453g Shaken 60 111100 -4 -0.188g -10.81° -79.19° 59 111011 -5 -0.234g -13.55° -76.45° 58 111010 -6 -0.281g -16.33° -73.67° 57 111001 -7 -0.328g -19.16° -70.84° 56 111000 -8 -0.375g -22.02° -67.98° 55 110111 -9 -0.422g -24.95° -65.05° 54 110110 -10 -0.469g -27.95° -62.05° 53 110101 -11 -0.516g -31.04° -58.96° 52 110100 -12 -0.563g -34.23° -55.77° 51 110011 -13 -0.609g -37.54° -52.46° 50 110010 -14 -0.656g -41.01° -48.99°
Freescale Semiconductor 29 MMA7660FC APPENDIX C - MMA7660FC ACQUISITION CODE TABLE, continued 49 110001 -15 -0.703g -44.68° -45.32° 48 110000 -16 -0.750g -48.59° -41.41° 47 101111 -17 -0.797g -52.83° -37.17° 46 101110 -18 -0.844g -57.54° -32.46° 45 101101 -19 -0.891g -62.95° -27.05° 44 101100 -20 -0.938g -69.64° -20.36° 43 101011 -21 -0.984g -79.86° -10.14° 42 101010 -22 -1.031g 41 101001 -23 -1.078g 40 101000 -24 -1.125g 39 100111 -25 -1.172g 38 100110 -26 -1.219g 37 100101 -27 -1.266g 36 100100 -28 -1.313g Shaken 35 100011 -29 -1.359g Shaken 34 100010 -30 -1.406g Shaken 33 100001 -31 -1.453g Shaken 32 100000 -32 -1.500g Shaken
This section includes information about I2C AC Characteristics. Table 1. I2C AC Characteristics
- Parameters tested 100% at final test at room temperature; limits at -40°C and +85°C, verified by characterization, not test in production.
- Limits verified by characterization, not tested in production.
Freescale Semiconductor 31 MMA7660FC PACKAGE DIMENSIONS
Freescale Semiconductor 32 MMA7660FC PACKAGE DIMENSIONS
Freescale Semiconductor 33 MMA7660FC PACKAGE DIMENSIONS
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