MM74C00

MM54C00 NSC | Alldatasheet

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Y Wide supply voltage range 3V to 15V Y Guaranteed noise margin 1V Y High noise immunity 0.45 V CC (typ.) Y Low power consumption 10 nW/package (typ.) Y Low power Fan out of 2 TTL compatibility driving 74LConnection Diagrams Dual-In-Line Packages MM54C00/MM74C00 TL/F/5877–1 Top View Order Number MM54C00 or MM74C00 MM54C02/MM74C02 TL/F/5877–2 Top View Order Number MM54C02 or MM74C02 MM54C04/MM74C04 TL/F/5877–3 Top View Order Number MM54C04 or MM74C04 MM54C10/MM74C10 TL/F/5877–4 Top View Order Number MM54C10 or MM74C10 MM54C20/MM74C20 TL/F/5877–5 Top View Order Number MM54C20 or MM74C20 C1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Voltage at Any Pin b0.3V to V CC a 0.3V Operating Temperature Range 54C b55§Ct o a125§C 74C b40§Ct o a85§C Storage Temperature Range b65§Ct o a150§C Operating V CC Range 3.0V to 15V Maximum V CC Voltage 18V Power Dissipation (P D) Dual-In-Line 700 mW Small Outline 500 mW Lead Temperature (Soldering, 10 seconds) 300 Min/Max limits apply across the guaranteed temperature range unless otherwise noted Symbol Parameter Conditions Min Typ Max Units CMOS TO CMOS VIN(1) Logical ‘‘1’’ Input Voltage V CC e 5.0V 3.5 V VCC e 10V 8.0 V VIN(0) Logical ‘‘0’’ Input Voltage V CC e 5.0V 1.5 V VCC e 10V 2.0 V VOUT(1) Logical ‘‘1’’ Output Voltage V CC e 5.0V, I O eb 10 mA 4.5 V VCC e 10V, I O eb 10 mA 9.0 V VOUT(0) Logical ‘‘0’’ Output Voltage V CC e 5.0V, I O e 10 mA 0.5 V VCC e 10V, I O e 10 mA 1.0 V IIN(1) Logical ‘‘1’’ Input Current V CC e 15V, V IN e 15V 0.005 1.0 mA IIN(0) Logical ‘‘0’’ Input Current V CC e 15V, V IN e 0V b1.0 b0.005 mA ICC Supply Current V CC e 15V 0.01 15 mA LOW POWER TO CMOS VIN(1) Logical ‘‘1’’ Input Voltage 54C, V CC e 4.5V V CC b 1.5 V 74C, V CC e 4.75V V CC b 1.5 V VIN(0) Logical ‘‘0’’ Input Voltage 54C, V CC e 4.5V 0.8 V 74C, V CC e 4.75V 0.8 V VOUT(1) Logical ‘‘1’’ Output Voltage 54C, V CC e 4.5V, I O eb 10 mA 4.4 V 74C, V CC e 4.75V, I O eb 10 mA 4.4 V VOUT(0) Logical ‘‘0’’ Output Voltage 54C, V CC e 4.5V, I O e 10 mA 0.4 V 74C, V CC e 4.75V, I O e 10 mA 0.4 V CMOS TO LOW POWER VIN(1) Logical ‘‘1’’ Input Voltage 54C, V CC e 4.5V 4.0 V 74C, V CC e 4.75V 4.0 V VIN(0) Logical ‘‘0’’ Input Voltage 54C, V CC e 4.5V 1.0 V 74C, V CC e 4.75V 1.0 V VOUT(1) Logical ‘‘1’’ Output Voltage 54C, V CC e 4.5V, I O eb 360 mA 2.4 V 74C, V CC e 4.75V, I O eb 360 mA 2.4 V VOUT(0) Logical ‘‘0’’ Output Voltage 54C, V CC e 4.5V, I O e 360 mA 0.4 V 74C, V CC e 4.75V, I O e 360 mA 0.4 V OUTPUT DRIVE (see 54C/74C Family Characteristics Data Sheet) T A e 25§C (short circuit current) ISOURCE Output Source Current V CC e 5.0V, V IN(0) e 0V, V OUT e 0V b1.75 mA ISOURCE Output Source Current V CC e 10V, V IN(0) e 0V, V OUT e 0V b8.0 mA ISINK Output Sink Current V CC e 5.0V, V IN(1) e 5.0V, V OUT e VCC 1.75 mA ISINK Output Sink Current V CC e 10V, V IN(1) e 10V, V OUT e VCC 8.0 mA

Symbol Parameter Conditions Min Typ Max Units MM54C00/MM74C00, MM54C02/MM74C02, MM54C04/MM74C04 tpd0,t pd1 Propagation Delay Time to V CC e 5.0V 50 90 ns Logical ‘‘1’’ or ‘‘0’’ VCC e 10V 30 60 ns CIN Input Capacitance (Note 2) 6.0 pF CPD Power Dissipation Capacitance (Note 3) Per Gate or Inverter 12 pF MM54C10/MM74C10 tpd0,t pd1 Propagation Delay Time to V CC e 5.0V 60 100 ns Logical ‘‘1’’ or ‘‘0’’ VCC e 10V 35 70 ns CIN Input Capacitance (Note 2) 7.0 pF CPD Power Dissipation Capacitance (Note 3) Per Gate 18 pF MM54C20/MM74C20 tpd0,t pd1 Propagation Delay Time to V CC e 5.0V 70 115 ns Logical ‘‘1’’ or ‘‘0’’ VCC e 10V 40 80 ns CIN Input Capacitance (Note 2) 9 pF CPD Power Dissipation Capacitance (Note 3) Per Gate 30 pF *AC Parameters are guaranteed by DC correlated testing. Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation. Note 2: Capacitance is guaranteed by periodic testing. Note 3: C PD determines the no load AC power consumption of any CMOS device. For complete explanation see 54C/74C Family Characteristics Application NoteÐAN-90. Typical Performance Characteristics Gate Transfer Characteristics Over Temperature vs V CC Guaranteed Noise Margin Power Dissipation vs Frequency MM54C02/MM74C02, MM54C00/MM74C00, MM54C04/MM74C04 TL/F/5877–6

Typical Performance Characteristics (Continued) Ambient Temperature Propagation Delay vs MM54C00/MM74C00, MM54C04/MM74C04 MM54C02/MM74C02, Ambient Temperature Propagation Delay vs MM54C00/MM74C00, MM54C04/MM74C04 MM54C02/MM74C02, Load Capacitance Propagation Delay Time vs MM54C00/MM74C00, MM54C04/MM74C04 MM54C02/MM74C02, TL/F/5877–7 Propagation Delay Time vs Load Capacitance MM54C10/MM74C10 TL/F/5877–8 Propagation Delay Time vs Load Capacitance MM54C20/MM74C20 TL/F/5877–9 Switching Time Waveforms and AC Test Circuit CMOS to CMOS TL/F/5877–10 TL/F/5877–11 Note: Delays measured with input t r,t f s 20 ns.

Physical Dimensions inches (millimeters) Ceramic Dual-In-Line Package (J) Order Number MM54C00J, MM54C02J, MM54C04J, MM54C10J, MM54C20J, MM74C00J, MM74C02J, MM74C04J, MM74C10J or MM74C20J

MM54C00/MM74C00, MM54C02/MM74C02, MM54C04/MM74C04, MM54C10/MM74C10, MM54C20/MM74C20 Physical Dimensions inches (millimeters) (Continued) Molded Dual-In-Line Package (N) Order Number MM54C00N, MM54C02N, MM54C04N, MM54C10N, MM54C20N, MM74C00N, MM74C02N, MM74C04N, MM74C10N or MM74C20N LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failure to perform can into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life failure to perform, when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can effectiveness. be reasonably expected to result in a significant injury to the user. National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Japan Ltd.

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