MA3864 ZARLINK | Alldatasheet

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This product is obsolete. This information is available for your convenience only. For more information on Zarlink’s obsolete products and replacement product lists, please visit http://products.zarlink.com/obsolete_products/

Symbol Parameter Conditions FT Basic Functionality VDD = 4.5V - 5.5V, FREQ = 1MHz VIL = VSS , VIH = VDD , VOL ≤ 1.5V, VOH ≥ 1.5V TEMP = -55°C to +125°C, GPS PATTERN SET GROUP A SUBGROUPS 7, 8A, 8B Figure 7: Functionality Subgroup Definition

1 Static characteristics specified in Table 4 at +25°C

2 Static characteristics specified in Table 4 at +125°C

3 Static characteristics specified in Table 4 at -55°C

7 Functional characteristics specified in Table 7 at +25°C

8A Functional characteristics specified in Table 7 at +125°C 8B Functional characteristics specified in Table 7 at -55°C

9 Switching characteristics specified in Table 5 at +25°C

10 Switching characteristics specified in Table 5 at +125°C

11 Switching characteristics specified in Table 5 at -55°C

Figure 8: Definition of Subgroups

Figure 11: Output Enable Operation 1. E = VIL 2. Address stable Q TGLQV TGHQZ G

OUTLINES AND PIN ASSIGNMENTS Figure 12: 28-Lead Ceramic DIL (Solder Seal) - Package Style C

28 VCC

23 A11

21 A10

D W A e b Z H A 1 15° M E C Seating Plane 114 2815 Ref Millimetres Inches A1 0.38 - 1.53 0.015 - 0.060 b 0.35 - 0.59 0.014 - 0.023 c 0.20 - 0.36 0.008 - 0.014 e1 - 15.24 Typ. - - 0.600 Typ. - H 4.71 - 5.38 0.185 - 0.212 XG404

Figure 13: 28-Lead Ceramic Flatpack (Solder Seal) - Package Style F E b e D L A Q c Pin 1 S Ref Millimetres Inches b 0.381 - 0.482 0.015 - 0.019 c 0.076 - 0.152 0.003 - 0.006 D 18.08 - 18.49 0.712 - 0.728 E 12.50 - 12.9 0.492 - 0.508 E2 9.45 - 9.85 0.372 - 0.388 e 1.143 - 1.40 0.045 - 0.055 L 8.00 - 9.27 0.315 - 0.365 XG543 1 E4

2 A12

14 GND

Total Dose Radiation Testing For product procured to guaranteed total dose radiation levels, each wafer lot will be approved when all sample devices from each lot pass the total dose radiation test. The sample devices will be subjected to the total dose radiation level (Cobalt-60 Source), defined by the ordering code, and must continue to meet the electrical parameters specified in the data sheet. Electrical tests, pre and post irradiation, will be read and recorded. GEC Plessey Semiconductors can provide radiation testing compliant with MIL-STD-883 test method 1019, Ionizing Radiation (Total Dose). Total Dose (Basic function) 1x105 Rad(Si) Total Dose (Function to specification) 1x10 6 Rad(Si) Transient Upset >1011 Rad(Si)/sec Neutron Hardness (Function to specification) >10 15 neutrons/cm2 Single Event Upset (GSO 10% worst case) 4.3x10 -11 errors/bitday Latch-up Not possible Figure 14: Typical Radiation Hardness Parameters

ORDERING INFORMATION

S R T Q Radiation Hard Processing 100 kRads (Si) Guaranteed 150 kRads (Si) Guaranteed 300 kRads (Si) Guaranteed For radiation levels above those stated please contact Marketing Radiation Tolerance C F Ceramic DIL (Solder Seal) Flatpack (Solder Seal) Package Type QA/QCI Process (See Section 9 Part 4) Test Process (See Section 9 Part 3) Assembly Process (See Section 9 Part 2) L C D E B S Rel 0 Rel 1 Rel 2 Rel 3/4/5/STACK Class B Class S Reliability Level x15Sx88nnxxxxxx T C TTL CMOS Unique Circuit Designator For details of reliability, QA/QC, test and assembly options, see ‘Manufacturing Capability and Quality Assurance Standards’ Section 9.

This publication is issued to provide information only which (unless agreed by the Company in writing) may not be used, applied or reproduced for any purpose nor form part of any order or contract nor to be regarded as a representation relating to the products or services concerned. No warranty or guarantee express or implied is made regarding the capability, performance or suitability of any product or service. The Company reserves the right to alter without prior knowledge the specification, design or price of any product or service. Information concerning possible methods of use is provided as a guide only and does not constitute any guarantee that such methods of use will be satisfactory in a specific piece of equipment. It is the user's responsibility to fully determine the performance and suitability of any equipment using such information and to ensure that any publication or data used is up to date and has not been superseded. These products are not suitable for use in any medical products whose failure to perform may result in significant injury or death to the user. All products and materials are sold and services provided subject to the Company's conditions of sale, which are available on request. HEADQUARTERS OPERATIONS GEC PLESSEY SEMICONDUCTORS Cheney Manor, Swindon, Wiltshire, SN2 2QW, United Kingdom. Tel: (0793) 518000 Fax: (0793) 518411 GEC PLESSEY SEMICONDUCTORS P.O. Box 660017,

1500 Green Hills Road, Scotts Valley,

California 95067-0017, United States of America. Tel: (408) 438 2900 Fax: (408) 438 5576 CUSTOMER SERVICE CENTRES

  • FRANCE & BENELUX Les Ulis Cedex Tel: (1) 64 46 23 45 Fax: (1) 64 46 06 07
  • GERMANY Munich Tel: (089) 3609 06-0 Fax: (089) 3609 06-55
  • ITALY Milan Tel: (02) 66040867 Fax: (02) 66040993
  • JAPAN Tokyo Tel: (03) 5276-5501 Fax: (03) 5276-5510
  • NORTH AMERICA Scotts Valley, USA Tel: (408) 438 2900 Fax: (408) 438 7023
  • SOUTH EAST ASIA Singapore Tel: (65) 3827708 Fax: (65) 3828872
  • SWEDEN Stockholm Tel: 46 8 702 97 70 Fax: 46 8 640 47 36
  • TAIWAN, ROC Taipei Tel: 886 2 5461260 Fax: 886 2 7190260
  • UK, EIRE, DENMARK, FINLAND & NORWAY Swindon, UK Tel: (0793) 518510 Fax: (0793) 518582 These are supported by Agents and Distributors in major countries world-wide. © GEC Plessey Semiconductors 1993 Publication No. DS3832-2.1 August 1993 TECHNICAL DOCUMENTATION - NOT FOR RESALE. PRINTED IN UNITED KINGDOM.