LMP2012QML

LMP2012QML NSC | Alldatasheet

Document overview

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Technical content

Features

■ Available with radiation quarantee (For VS = 5V, Typical unless otherwise noted) ■ Low guaranteed VIO over temperature 60 µV ■ Low noise with no 1/f 35nV/ ■ High CMRR 90 dB ■ High PSRR 90 dB ■ High AVOL 85 dB ■ Wide gain-bandwidth product 3MHz ■ High slew rate 4V/µs ■ Rail-to-rail output 30mV ■ No external capacitors required

Applications

■ Attitude and Orbital Controls ■ Static Earth Sensing ■ Sun Sensors ■ Inertial Sensors ■ Pressure Sensors ■ Gyroscopes ■ Earth Observation Systems

Ordering Information

NS Part Number SMD Part Number NS Package Number Package Discription LMP2012WG-QMLV 5962-0620601VZA WG10A 10LD CERAMIC SOIC LMP2012WGLQMLV 5962L0620601VZA 50K rd(Si) WG10A 10LD CERAMIC SOIC Connection Diagram 10LD Ceramic SOIC 20182202 Top View See NS Package Number WG10A © 2008 National Semiconductor Corporation 201822 www.national.com LMP2012QML Dual Quad High Precision, Rail-to-Rail Output Operational Amplifier

Absolute Maximum Ratings (Note 1) Supply Voltage 5.8V Differential Input Voltage ±Supply Voltage Power Dissipation (Note 2) 714mW Maximum Junction Temperature (TJmax) 150°C Common-Mode Input Voltage −0.3 ≤ VCM ≤ VCC +0.3V Current at Input Pin 30 mA Current at Output Pin 30 mA Current at Power Supply Pin 50 mA Operating Temperature Range −55°C to +125°C Storage Temperature Range −55°C to +150°C Ceramic SOIC Lead Temperature (soldering 10 sec.) +260°C Thermal Resistance θJA Ceramic SOIC (Still Air) 175°C/W Ceramic SOIC (500LF/Min Air Flow) 115°C/W θJC Ceramic SOIC 12.3°C/W Package Weight Ceramic SOIC 220mg ESD Tolerance (Note 3) 4000V Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C)

1 Static tests at +25

2 Static tests at +125

3 Static tests at -55

4 Dynamic tests at +25

5 Dynamic tests at +125

6 Dynamic tests at -55

7 Functional tests at +25

8A Functional tests at +125 8B Functional tests at -55

9 Switching tests at +25

10 Switching tests at +125

11 Switching tests at -55

12 Setting time at +25

13 Setting time at +125

14 Setting time at -55

www.national.com 2 LMP2012QML

2.7V DC Parameters The following conditions apply, unless otherwise specified. V+ = 2.7V, V- = 0V, V CM = 1.35V, VO = 1.35V and RL > 1 MΩ. Symbol Parameter Conditions Notes Typ (Note 4) Min Max Units Sub- groups VIO Input Offset Voltage 0.8 36 μV 60 2, 3 Offset Calibration Time 0.5 10 ms 1 12 2, 3 IIB Input Bias Current −3 pA IIO Input Offset Current 6 pA CMRR Common Mode Rejection Ratio −0.3 ≤ VCM ≤ 0.9V 130 95 dB 0 ≤ VCM ≤ 0.9V 90 2, 3 PSRR Power Supply Rejection Ratio 120 95 dB 1 90 2, 3 AVOL Open Loop Voltage Gain RL = 10 kΩ 130 95 dB 90 2, 3 RL = 2 kΩ 124 90 1 85 2, 3 VO Output Swing RL = 10 kΩ to 1.35V VIN(diff) = ±0.5V 2.68 2.64 V 2.63 2, 3 0.033 0.060 1 0.075 2,3 RL = 2 kΩ to 1.35V VIN(diff) = ±0.5V 2.65 2.615 V 2.6 2, 3 0.061 0.085 1 0.105 2, 3 IO Output Current Sourcing, VO = 0V VIN(diff) = ±0.5V 12 5 mA 3 2, 3 Sinking, VO = 5V VIN(diff) = ±0.5V 18 5 1 3 2, 3 IS Supply Current per Channel 0.919 1.20 mA 1 1.50 2, 3 2.7V AC Parameters The following conditions apply, unless otherwise specified. V+ = 2.7V, V - = 0V, VCM = 1.35V, VO = 1.35V, and RL > 1 MΩ. Symbol Parameter Conditions Notes Typ (Note 4) Min Max Units Sub- groups GBW Gain-Bandwidth Product 3 1 5 MHz 4 SR Slew Rate 4 V/μs θm Phase Margin 60 Deg Gm Gain Margin −14 dB en Input-Referred Voltage Noise 35 nV/ enP-P Input-Referred Voltage Noise RS = 100Ω, DC to 10 Hz 850 nVPP trec Input Overload Recovery Time 50 ms 3 www.national.com LMP2012QML

2.7V DC Parameters – 50K Post Radiation Limits @ +25°C The following conditions apply, unless otherwise specified. V+ = 2.7V, V - = 0V, VCM = 1.35V, VO = 1.35V, and RL > 1 MΩ. Symbol Parameter Conditions Notes Typ Min Max Units Sub- groups IS Supply Current per Channel (Note 5) 1.75 mA 1 5V DC Parameters The following conditions apply, unless otherwise specified. V+ = 5V, V- = 0V, V CM = 2.5V, VO = 2.5V and RL > 1MΩ. Symbol Parameter Conditions Notes Typ (Note 4) Min Max Units Sub- groups VIO Input Offset Voltage 0.12 36 μV 60 2, 3 Offset Calibration Time 0.5 10 ms 1 12 2, 3 IIB Input Bias Current −3 pA IIO Input Offset Current 6 pA CMRR Common Mode Rejection Ratio −0.3 ≤ VCM ≤ 3.2 130 100 dB 0 ≤ VCM ≤ 3.2 90 2, 3 PSRR Power Supply Rejection Ratio 120 95 dB 1 90 2, 3 AVOL Open Loop Voltage Gain RL = 10 kΩ 130 105 dB 100 2, 3 RL = 2 kΩ 132 95 1 90 2, 3 VO Output Swing RL = 10 kΩ to 2.5V VIN(diff) = ±0.5V 4.978 4.92 V 4.91 2, 3 0.040 0.080 1 0.095 2, 3 RL = 2 kΩ to 2.5V VIN(diff) = ±0.5V 4.919 4.875 V 4.855 2, 3 0.091 0.125 1 0.150 2, 3 IO Output Current Sourcing, VO = 0V VIN(diff) = ±0.5V 15 8 mA 6 2, 3 Sourcing, VO = 5V VIN(diff) = ±0.5V 17 8 1 6 2, 3 IS Supply Current per Channel 0.930 1.20 mA 1 1.50 2, 3 www.national.com 4 LMP2012QML

The following conditions apply, unless otherwise specified. V+ = 2.7V, V - = 0V, VCM = 1.35V, VO = 1.35V, and RL > 1 MΩ. Symbol Parameter Conditions Notes Typ (Note 4) Min Max Units Sub- groups GBW Gain-Bandwidth Product 3 1 5 MHz 4 SR Slew Rate 4 V/μs θm Phase Margin 60 Deg Gm Gain Margin −15 dB en Input-Referred Voltage Noise 35 nV/ enP-P Input-Referred Voltage Noise RS = 100Ω, DC to 10 Hz 850 nVPP trec Input Overload Recovery Time 50 ms 5V DC Parameters – 50K Post Radiation Limits @ +25°C The following conditions apply, unless otherwise specified. V+ = 5V, V - = 0V, VCM = 2.5V, VO = 2.5V, and RL > 1 MΩ. Symbol Parameter Conditions Notes Typ Min Max Units Sub- groups IS Supply Current per Channel (Note 5) 1.75 mA 1 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/ θJA or the number given in the Absolute Maximum Ratings, whichever is lower. Note 3: Human body model, 1.5 kΩ in series with 100 pF. Note 4: Typical values represent the most likely parametric norm. Note 5: Pre and post irradiation limits are identical to those listed under DC electrical characteristics except as listed in the Post Radiation Limits Table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in Mil-Std-883, Method 1019 5 www.national.com LMP2012QML

Application Information

Using patented methods, the LMP2012 eliminates the 1/f noise present in other amplifiers. That noise, which increases as frequency decreases, is a major source of measurement error in all DC-coupled measurements. Low-frequency noise appears as a constantly-changing signal in series with any measurement being made. As a result, even when the mea- surement is made rapidly, this constantly-changing noise sig- nal will corrupt the result. The value of this noise signal can be surprisingly large. For example: If a conventional amplifier has a flat-band noise level of 10nV/ and a noise corner of 10 Hz, the RMS noise at 0.001 Hz is 1µV/ . This is equiv- alent to a 0.50 µV peak-to-peak error, in the frequency range 0.001 Hz to 1.0 Hz. In a circuit with a gain of 1000, this pro- duces a 0.50 mV peak-to-peak output error. This number of

0.001 Hz might appear unreasonably low, but when a data

acquisition system is operating for 17 minutes, it has been on long enough to include this error. In this same time, the LMP2012 will only have a 0.21 mV output error. This is smaller by 2.4 x. Keep in mind that this 1/f error gets even larger at lower frequencies. At the extreme, many people try to reduce this error by integrating or taking several samples of the same signal. This is also doomed to failure because the 1/f nature of this noise means that taking longer samples just moves the measurement into lower frequencies where the noise level is even higher. The LMP2012 eliminates this source of error. The noise level is constant with frequency so that reducing the bandwidth re- duces the errors caused by noise. OVERLOAD RECOVERY The LMP2012 recovers from input overload much faster than most chopper-stabilized op amps. Recovery from driving the amplifier to 2X the full scale output, only requires about 40 ms. Many chopper-stabilized amplifiers will take from 250 ms to several seconds to recover from this same overload. This is because large capacitors are used to store the unadjusted offset voltage. 20182216 FIGURE 1. The wide bandwidth of the LMP2012 enhances performance when it is used as an amplifier to drive loads that inject tran- sients back into the output. ADCs (Analog-to-Digital Convert- ers) and multiplexers are examples of this type of load. To simulate this type of load, a pulse generator producing a 1V peak square wave was connected to the output through a 10 pF capacitor. (Figure 1) The typical time for the output to re- cover to 1% of the applied pulse is 80 ns. To recover to 0.1% requires 860ns. This rapid recovery is due to the wide band- width of the output stage and large total GBW. NO EXTERNAL CAPACITORS REQUIRED The LMP2012 does not need external capacitors. This elimi- nates the problems caused by capacitor leakage and dielec- tric absorption, which can cause delays of several seconds from turn-on until the amplifier's error has settled. MORE BENEFITS The LMP2012 offers the benefits mentioned above and more. It has a rail-to-rail output and consumes only 950 µA of supply current while providing excellent DC and AC electrical per- formance. In DC performance, the LMP2012 achieves 130 dB of CMRR, 120 dB of PSRR and 130 dB of open loop gain. In AC performance, the LMP2012 provides 3 MHz of gain-band- width product and 4 V/µs of slew rate. HOW THE LMP2012 WORKS The LMP2012 uses new, patented techniques to achieve the high DC accuracy traditionally associated with chopper-sta- bilized amplifiers without the major drawbacks produced by chopping. The LMP2012 continuously monitors the input off- set and corrects this error. The conventional chopping pro- cess produces many mixing products, both sums and differences, between the chopping frequency and the incom- ing signal frequency. This mixing causes large amounts of distortion, particularly when the signal frequency approaches the chopping frequency. Even without an incoming signal, the chopper harmonics mix with each other to produce even more trash. If this sounds unlikely or difficult to understand, look at the plot (Figure 2), of the output of a typical (MAX432) chop- per-stabilized op amp. This is the output when there is no incoming signal, just the amplifier in a gain of -10 with the input grounded. The chopper is operating at about 150 Hz; the rest is mixing products. Add an input signal and the noise gets much worse. Compare this plot with Figure 3 of the LMP2012. This data was taken under the exact same conditions. The auto-zero action is visible at about 30 kHz but note the ab- sence of mixing products at other frequencies. As a result, the LMP2012 has very low distortion of 0.02% and very low mix- ing products. 20182217 FIGURE 2. www.national.com 6 LMP2012QML

analog input amplifier for a 12-bit A/D converter, the over- all conversion error over full operation temperature and 30 years life of the part (operating at 50°C) would be less than 5 LSBs. B) Fast large-signal settling time to 0.01% of final value (1.4 μs) allows 12 bit accuracy at 100 KH Z or more sampling rate. C) No flicker (1/f) noise means unsurpassed data accuracy over any measurement period of time, no matter how long. Consider the following op amp performance, based on a typical low-noise, high-performance commercially- available device, for comparison: Op amp flatband noise = 8nV/ 1/f corner frequency = 100 Hz AV = 2000 Measurement time = 100 sec Bandwidth = 2 Hz This example will result in about 2.2 mV PP (1.9 LSB) of output noise contribution due to the op amp alone, com- pared to about 594 μVPP (less than 0.5 LSB) when that op amp is replaced with the LMP2012 which has no 1/f contribution. If the measurement time is increased from 100 seconds to 1 hour, the improvement realized by using the LMP2012 would be a factor of about 4.8 times (2.86 mVPP compared to 596 μV when LMP2012 is used) main- ly because the LMP2012 accuracy is not compromised by increasing the observation time. D) Rail-to-Rail output swing maximizes the ADC dynamic range in 5-Volt single-supply converter applications. Be- low are some typical block diagrams showing the LMP2012 used as an ADC amplifier (Figure 7 and Figure 8). 20182222 FIGURE 8. 9 www.national.com LMP2012QML

Revision History

Date Released Revision Section Originator Changes 03/19/07 A Initial Release B. Petcher/B. Brown Initial Release 10/17/08 B Electrical Section Robert Eddy Added typical parameters to 2.7V and 5V AC Electrical Sections. Revision A will be Archived. www.national.com 10 LMP2012QML

Physical Dimensions inches (millimeters) unless otherwise noted 10-Pin Ceramic SOIC 11 www.national.com LMP2012QML

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