2SK3868 TOSHIBA | Alldatasheet

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TOSHIBA Field Effect Transistor Silicon N Channel MOS Type ( p -MOSVI) 2SK3868 Switching Regulator Applications

  • Low drain-source ON resistance: RDS (ON) = 1.3ƒ¶ (typ.)
  • High forward transfer admittance: |Yfs| = 3S (typ.)
  • Low leakage current: IDSS = 100 ƒÊA (VDS = 500 V)
  • Enhancement-mode: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA) Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Drain-source voltage VDSS 500 V Drain-gate voltage (RGS = 20 kΩ ) VDGR 500 V Gate-source voltage VGSS ±30 V DC (Note 1) ID 5 Drain current Pulse (t = 1 ms) (Note 1) IDP 20 A Drain power dissipation (Tc = 25°C) PD 35 W Single pulse avalanche energy (Note 2) EAS 180 mJ Avalanche current IAR 5 A Repetitive avalanche energy (Note 3) EAR 3.5 mJ Channel temperature Tch 150 °C Storage temperature range Tstg -55~150 °C Thermal Characteristics Characteristics Symbol Max Unit Thermal resistance, channel to case Rth (ch -c) 3.57 °C/W Thermal resistance, channel to ambient Rth (ch -a) 62.5 °C/W Note 1: Please use devices on conditions that the channel temperature is below 150°C. Note 2: VDD = 90 V, Tch = 25°C(initial), L = 12.2 mH, IAR = 5 A, RG = 25 Ω Note 3: Repetitive rating: Pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution. Unit: mm 1: Gate 2: Drain 3: Source JEDEC ? JEITA SC-67 TOSHIBA 2-10U1B Weight : 1.7 g (typ.)

Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = ±25 V, VDS = 0 V   ±10 µA Gate-source breakdown voltage V (BR) GSS IG = ±10 µA, VDS = 0 V ±30   V Drain cut-off current IDSS VDS = 500 V, VGS = 0 V   100 µA Drain-source breakdown voltage V (BR) DSS ID = 10 mA, VGS = 0 V 500   V Gate threshold voltage Vth VDS = 10 V, ID = 1 mA 2.0  4.0 V Drain-source ON resistance RDS (ON) VGS = 10 V, ID = 2.5 A  1.3 1.7 Ω Forward transfer admittance Yfs  VDS = 10 V, ID = 2.5 A 1.5 3.0  S Input capacitance Ciss  550  Reverse transfer capacitance Crss  7  Output capacitance Coss VDS = 25 V, VGS = 0 V, f = 1 MHz  70  pF Rise time tr  10  Turn-on time ton  20  Fall time tf  10  Switching time Turn-off time toff  50  ns Total gate charge Qg  16  Gate-source charge Qgs  10  Gate-drain charge Qgd VDD ∼ − 400 V, VGS = 10 V, ID = 5 A  6  nC Source-Drain Ratings and Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Continuous drain reverse current (Note 1) IDR    5 A Pulse drain reverse current (Note 1) IDRP    20 A Forward voltage (diode) VDSF IDR = 5 A, VGS = 0 V   − 1.7 V Reverse recovery time trr  150  ns Reverse recovery charge Qrr IDR = 5 A, VGS = 0 V, dIDR/dt = 100 A/µs  0.3  µC Marking RL = 90 Ω 0 V 10 V VGS VDD ∼ − 225 V ID = 2.5 A VOUT 15 Ω Duty < = 1%, tw = 10 µs Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. K3868 Part No. (or abbreviation code)

Tc = − 55°C 100 ID = 5 A 1.2 2.5 4 0 2 4 6 10 VGS = 4 V 4.5 4.75 5.25 5.5 DRAIN-SOURCE VOLTAGE VDS (V) ID – VDS DRAIN CURRENT I D (A) COMMON SOURCE Tc = 25°C PULSE TEST GATE-SOURCE VOLTAGE VGS (V) ID – VGS DRAIN CURRENT I D (A) COMMON SOURCE VDS = 20 V PULSE TEST DRAIN-SOURCE VOLTAGE VDS ( V) GATE-SOURCE VOLTAGE VGS (V) VDS – VGS COMMON SOURCE Tc = 25Ž PULSE TEST 4.5 5.5 DRAIN-SOURCE VOLTAGE VDS (V) ID – VDS DRAIN CURRENT I D (A) COMMON SOURCE Tc = 25°C PULSE TEST VGS = 4 V 0.1 0.1 Tc = − 55°C Yfs  – ID COMMON SOURCE VDS = 20 V PULSE TEST FORWARD TRANSFER ADMITTANCE Yfs (S) 100 DRAIN CURRENT ID (A) 0.1 0.01 0.1 VGS = 10 V¤15V DRAIN CURRENT ID (A) RDS (ON) – ID DRAIN-SOURCE ON RESISTANCE RDS (ON) (m Ω ) COMMON SOURCE Tc = 25°C PULSE TEST 8 12 4.75 5.25

0.1 100 1000 10000 1 3 5 10 30 100 Ciss Coss Crss DRAIN-SOURCE VOLTAGE VDS (V) CAPACITANCE C (pF) COMMON SOURCE VGS = 0 V f = 1 MHz Tc = 25°C 0.1 − 0.8 0.3 0.5 − 1.2 − 2.0 − 1.6 VGS = 0, − 1,1 V − 0.4 DRAIN-SOURCE VOLTAGE VDS (V) DRAIN REVERSE CURRENT IDR (A) COMMON SOURCE Tc = 25°C PULSE TEST − 80 − 40 0 40 80 120 160 GATE THRESHOLD VOLTAGE Vth (V) CASE TEMPERATURE Tc ( °C) Vth – Tc COMMON SOURCE VDS = 10 V ID = 1 mA PULSE TEST 160 40 80 120 0 ID = 5A 1.2 2.5 CASE TEMPERATURE Tc ( °C) RDS (ON) – Tc DRAIN-SOURCE ON RESISTANCE RDS (ON) (m Ω ) COMMON SOURCE VGS = 10 V PULSE TEST DRAIN POWER DISSIPATION PD (W) CASE TEMPERATURE Tc ( °C) 0 40 80 120 160 200 DRAIN-SOURCE VOLTAGE VDS (V) 0 5 10 VDD = 100 V VDS VGS 400 200 15 25 500 200 100 300 400 GATE-SOURCE VOLTAGE VGS (V) TOTAL GATE CHARGE Qg (nC) DYNAMIC INPUT / OUTPUT CHARACTERISTICS COMMON SOURCE ID = 5 A Tc = 25°C PULSE TEST IDR – VDS CAPACITANCE – VDS PD – Tc

CHANNEL TEMPERATURE (INITIAL) Tch ( °C) EAS – Tch AVALANCHE ENERGY EAS (mJ) 0.01 10ƒÊ 0.1 Duty=0.5 0.2 0.1 0.05 0.02 0.01 0.001 rth – tw PULSE WIDTH t w (s) NORMALIZED TRANSIENT THERMAL IMPEDANCE r th (t) /Rth (ch -c) T PDM t Duty = t/T Rth (ch-c) = 3.57°C/W SINGLE PULSE − 15 V 15 V TEST CIRCUIT WAVE FORM IAR BVDSS VDD VDS RG = 25 Ω VDD = 90 V, L = 12.2mH  ⋅⋅⋅= VDDBVDSS BVDSS2IL ? AS 0.1 100 10 1000 100 0.01 DRAIN-SOURCE VOLTAGE VDS (V) SAFE OPERATING AREA ¦ SINGLE NONREPETITIVE PULSE Tc=25Ž CURVES MUST BE DERATED LINEARLY WITH INCREASE IN TEMPERATURE. ID max (PULSED) * ID max (CONTINUOUS) * DC OPERATION Tc = 25°C 100 µs * 1 ms * VDSS max DRAIN CURRENT I D (A)

  • The information contained herein is subject to change without notice.
  • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others.
  • TOSHIBA is continually working to improve the quali ty and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA prod ucts, to comply with the standards of safety in making a safe design for the entire system , and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “ Handling Guide for S emiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc..
  • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, indus trial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ( “Unintended Usage ”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of saf ety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer’s own risk.
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