HV400MJ INTERSIL | Alldatasheet
Document overview
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Technical content
Features
- This Circuit is Processed in Accordance to MIL-STD- 883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- No Supply Current in Quiescent State
Applications
- Switch Mode Power Supplies
- DC/DC Converters
- Motor Controllers
- Uninterruptable Power Supplies
Description
The HV400MJ/883 is a single monolithic, non-inverting high current driver designed to drive large capacitive loads at high slew rates. The device is optimized for driving single or paral- lel connected N-Channel power MOSFETs with total gate charge from 5nC to >1000nC. It features two output stages pinned out separately allowing independent control of the MOSFET gate rise and fall times. The current sourcing output stage is an NPN capable of 6A. An SCR provides over 30A of current sinking. The HV400MJ/883 achieves rise and fall times of 54ns and 16ns respectively driving a 10,000pF load. Special features are included in this part to provide a simple, high speed gate drive circuit for power MOSFETs. The HV400MJ/883 requires no quiescent supply current, how- ever, the input current is approximately 15mA while in the high state. With the internal current steering diodes (Pin 7) and an external capacitor, both the timing and MOSFET gate power come from the same pulse transformer; no special external supply is required for high side switches. No high voltage diode is required to charge the bootstrap capacitor. The HV400MJ/883 in combination with the MOSFET and pulse transformer makes an isolated power switch building block for applications such as high side switches, secondary side regulation and synchronous rectification. The HV400MJ/883 is also suitable for driving IGBTs, MCTs, BJTs and small GTOs. The HV400MJ/883 is a type of buffer; it does not have input logic level switching threshold voltages. This single stage design achieves propagation delays of 20ns. The output NPN begins to source current when the voltage on Pin 2 is approximately 2V more positive than the voltage at Pin 8. The output SCR switches on when the input Pin 2 is 1V more negative than the voltage at Pins 3/6. Due to the use of the SCR for current sinking, once the output switches low, the input must not go high again until all the internal SCR charge has dissipated, 0.5µs - 1.5µs later.
Ordering Information
TEMP. RANGE ( oC) PACKAGE PKG. NO. HV400MJ/883 -55 to 125 8 Ld SBDIP D8.3 Pinout HV400MJ/883 (SBDIP) TOP VIEW Schematic SOURCE OUTPUT DIODES SINK OUTPUT V+ SUPPLY GND SINK OUTPUT GND INPUT D3 D2 R4D4 PIN 7 PIN 8 PIN 5 PIN 6 SCR PIN 4 PIN 3 PIN 1 PIN 2 File Number 3584.2
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
- θJA is measured with the component mounted on an evaluation PC board in free air.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS This Table Intentionally Left Blank. See AC Parameter on Table 3. TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
- Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
based upon data from multiple production runs which reflect lot to lot and within lot variation. TABLE 4. ELECTRICAL TEST REQUIREMENTS
- PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
VIH The differential voltage between the input (pin 2) to the output (pin 8) required to source 10mA VIL The differential voltage between the input (pin 2) to the output (pins 3, 6) required to sink 3mA IIH The current required to maintain the input (pin 2) high with IOUT = 0A IIHP The input (pin 2) current for a given pulsed output current IIL The current require to maintain the input (pin 2) low DC OUTPUT PARAMETERS VOH The output (pin 8) voltage with input (pin 2) = V+ IOP8 The pulsed peak source current form output (pin 8) IOL The output (pin 8) leakage current with the input (pin 2) = Ground VOL The output (pins 3, 6) voltage with the input (pin 2) = Ground IOP6 The pulsed peak sink current into output (pins 3, 6) IOH The output (pins 3, 6) leakage current with the input (pin 2) = V+ VF The forward voltage of diode D1 or D7 IR The reverse leakage current of diode D1 or D7 Q RR The time integral of the reverse current at turn off AC PARAMETERS (See Switching Time Specifications) TR The low to high transition of the output TF The high to low transition of the output TDR The output propagation delay from the input (pin 2) rising edge TDF The output propagation delay from the input (pin 2) falling edge TOR The minimum time required after an output high to low transition before the next input low to high transition HV400MJ/883
Switching Diagram and Test Circuit FIGURE 1. FIGURE 2. tDR tf 10% 90% tDF 10% 90% tr 10% INPUT OUTPUT VOUT tOR 10% 90% R L 100K OUTPUT C L 0.01µF R1 100 1W
3 AND 6
1.0µF 330µF 50V 4 5 15V GND INPUT (RISE AND FALL TIMES <10ns) 50Ω SOURCE 50V 12.8V 0.9V HV400MJ/883
Typical Design Information The information contained in this section has been developed through characterization by Intersil Corporation and is for use as application and design information only. No guarantee is implied. Circuit Operation The HV400MJ/883s operation is easily explained by refer- ring to the schematic. The control signal is applied to Pin 2. If the control signal is about 2V above Pin 8, the output NPN Q1 turns on charging the MOSFET gate from a capacitor connected to Pin 1. Resistor R4 helps keep the SCR off by applying a reverse bias to the SCR anode gate. When the control input drops about 1V below Pin 3/6, PNP Q2 turns on which triggers the SCR by driving both the anode and cathode gates. The SCR discharges the MOSFET gate and when its current becomes less than 10mA, it turns off. Transistor Q2 conducts any gate leakage currents, through resistors R1 and R2, once the SCR turns off. Figure 7 shows the output characteristics before the SCR turns on and after it turns off. When the SCR turns on, resistor R4 provides a path to remove Q1 base charge. Resistor R3 provides the base current for Q2 to reduce the turn off delay time. Resistors R1 and R2 reduce the SCR recovery time. The two diodes connected to the diode input Pin 7 provide some operation flexibility. With Pins 2 and 7 connected together, diode D1 provides a path to recharge the storage capacitor once the MOSFET gate is pulled high and, along with diodes D2 and D3, keeps Q1 from going into hard saturation which would increase delay times. Diode D7 would clamp the input near ground and provide a current path if an input DC blocking capacitor is used. Alternatively, Pin 7 can be connected to Pin 6 so that the SCR and NPN Q1 don’t have to pass reverse current if the output “rings” above the supply or below ground. When high performance diodes are required, Pin 7 can be left disconnected and external diodes substituted. The diodes in series with Pin 2 decoupled the input from the output during negative going transitions. The absence of input current turns off Q1 and allows Q2 to trigger the SCR. Diode D8 turns off Q2 once the SCR turns on pulling the out- put low, otherwise Q2 would saturate and slow down circuit operation. In addition, the diodes D2, D3 and D8 improve noise immunity by adding about 2.5V of input hysteresis. The HV400MJ/883 is capable of large output currents but only for brief durations due to power dissipation. Circuit Board Layout PC board layout is very important. Pins 3 and 6 should be connected together as should Pins 4 and 5. Otherwise the internal interconnect impedance is doubled and only half of the bond wires are used which would degrade the reliability. HV400MJ/883 Switching Test Circuit Parts List R1 100Ω , 1W Carbon Resistor R2 Wire R L 100kΩ , 1/8W Carbon Resistor C1 330µF , 50V Capacitor C2 1µF , 50V Capacitor C L 0.01µF , 50V Chip Capacitor D1 1N914 Diode J1, J2 PC Mount Banana Jack Johnson 108-0740-001 J3, J4 PC Mount SMA Connector Johnson EFJ142 U1 Intersil HV400MJ/883 I.C. R1J1 VCC C1 C2 D1J3 PULSE IN PULSE OUT GND C L R L J4 L L HV400MJ/883
The bootstrap capacitor should hold at least 10x the charge of the MOSFET and should be connected between Pins 1 and 4/5 with minimum pin lengths and spacings. Likewise, the HV400MJ/883 should be as close to the MOSFET as possible. Any long PC traces (parasitic inductances) between the MOSFET gate and Pins 8 or 3/6 or between the source and Pins 4/5 should be avoided. Inductance between the HV400MJ/883 and the MOSFET limit the MOSFET switching time. If they are too large, the HV400MJ/883 may operate erratically as discussed below. Cross Conduction Faults It is possible to have both Q1 and the SCR on at the same time resulting in very large cross conduction currents. The SCR has larger current capacity so the output goes low and the storage capacitor is discharged. The conditions that cause cross conduction and precautions are discussed below. Minimum Off Time The SCR requires a recovery time before voltage can be reapplied without it switching back on. Figure 13 shows how this SCR recovery time, called “minimum off time” (t OR ), is a function of the load capacitance. If the input voltage goes high before this recovery time is complete, the SCR will switch back on. Note that reverse current flowing through the SCR, for example due to load inductance ringing, extends the minimum off time. Since the minimum off time is really dependent upon how much stored charge remains in the SCR when the anode (Pin 3/6) is taken positive, it may vary for different applications. Figure 13 indirectly shows that the minimum off time increases with larger currents. It also increases at elevated temperatures as shown in Figure 14. Excessive ringing increases the minimum off time since the stored charge doesn’t begin to dissipate until the current drops below 10mA for the last time. Rising anode voltage acts on the internal SCR capacitance to generate its own triggering current. The excess stored charge increases this capacitance. Faster rise times and/or higher voltages also increase the amount of internal trigger current from the inter- nal capacitance so applications with larger dV/dt require longer minimum off times. The minimum off time must be considered for all occur- rences of SCR current. For example, in a half bridge switch mode power supply, there are two MOSFETs connected to the transformer primary. Assume that the high side MOSFET switch is off. When the low side MOSFET switch is turned on, the HV400MJ/883 driving the high side MOSFET will have to sink gate current from C GD and will have to source gate current when the low side MOSFET switches back off. Both of these current pulses will try to flow through Pin 3/6 since the Pin 8 output is turned off. Sourcing current from Pins 3/6 through the SCR is possible, the Pin 3/6 voltage becoming negative with respect to Pins 4/5 (See Figure 8). But a better practice would be to connect a Schottky diode between Pins 4/5 (anode) and 3/6 (cathode) so reverse cur- rent does not flow through the SCR. False SCR Triggering The SCR may be triggered inadvertently. The output may overshoot the input due to inductive loading or over driving the output NPN (allowing it to saturate). Whenever Pin 6 is more positive than Pin 2 by 1V, the SCR is triggered on. Also, if the output rises too rapidly, greater than 0.5V/ns, the SCR may self trigger. Both issues are resolved by minimiz- ing the load inductance and inserting sufficient resistance, usually 0.1Ω to 10Ω , between Pin 8 and the load. A very fast negative going input voltage can result in minimum off times of about 2.5µs. If the output can not keep up with the falling input, the stored charge of diode D4 is transferred into the base of Q2. This excess charge in Q2 must have time to dissipate. Otherwise, when Pin 3/6 goes positive, Q2 will turn on and trigger the SCR. An external diode in series with Pin 2, as shown in Figure 1, will prevent D4 from discharging into the base of Q2 but that will also reduce the output voltage by the forward voltage of that diode. Internal Diodes The internal diodes connected to Pin 7 are provided for convenience but may not be suitable for large currents. Since they are part of the integrated circuit, they are physically small, operate at high current densities, and have long recovery times. Figure 15 shows that their forward characteristics degrade above 100mA. In addition, Figure 16 shows their reverse recovery charge as a function of forward current. The product of this charge, the applied reverse voltage and the frequency is the additional power dissipation due to the diodes. For stored charge calculations, use the peak forward current within 100ns of the application of reverse bias. In addition to the extra power dissipation, the capacitance of these diodes may extend the switching delay times. Power Dissipation Calculations The power required to drive the MOSFET is the product of its total gate charge times the gate supply voltage (maximum voltage on HV400MJ/883 Pin 1, 2 or 7) times the frequency. Assuming that the MOSFET gate resistance is negligible, this power is dissipated within the HV400MJ/883. If resistors are placed between the HV400MJ/883 and the MOSFET, then some of the power is dissipated in the resistors, the per- centage depending upon the ratio of resistors to HV400MJ/883 output impedance. There are two other sources of power dissipation to consider. First there is the power in R3 which is the product of the input Pin 2 current and voltage (with no output current) times the duty cycle. Second is the product of the Pin 7 diode stored charge, which is dependent upon the forward current, times the applied diode reverse voltage times the frequency. This information is available from Figure 3 and Figure 16 in this data sheet. HV400MJ/883
balance the transformer volt-second product over a cycle. to output or ground maximum rating should be observed. out of phase such as in a half-bridge configuration. least 10 times the equivalent MOSFET gate capacitance. circuit would be similar to the switching time test circuit. performance in a given application. FIGURE 3. UNIPOLAR DRIVE FIGURE 4. BIPOLAR DRIVE WITH DC BLOCKING CAPACITOR
Burn-In Circuit (Dynamic) Q1 C3 0.1µF FX 0.1µF 0.001µF 0.1µF 0.01µF NOTES: 13. Q1, Q2 = SK9505 or Equivalent. (One Pair Per Board Column) 14. FX = 12.5kHz, 50% Duty Cycle. VIL = 0.8V (Max) VIH = +4V (Min) HV400MJ/883
DIE DIMENSIONS: 1700 x 1820 x 483µm METALLIZATION: Type: 1% Cu, 99% Al Thickness: 16kÅ ± 2kÅ SUBSTRATE POTENTIAL (POWERED UP): Unbiased WORST CASE CURRENT DENSITY: 8.2 x 104 A/cm2 during 1µs pulse with -35A output current, through 8µm wide line 14kA thick. GLASSIVATION: Type: Silox Thickness: 12kÅ ± 2kÅ Type: Nitride Thickness: 3.5kÅ ± 2.5kÅ TRANSISTOR COUNT: PROCESS: HFSB Linear Dielectric Isolation Metallization Mask Layout HV400MJ/883 V+ (1) INPUT (2) SINK OUTPUT (3) GROUND (4) (5) GROUND (6) SINK OUTPUT (7) DIODES (8) SOURCE OUTPUT (8) SOURCE OUTPUT HV400MJ/883
All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web sitehttp://www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111 ASIA Intersil (Taiwan) Ltd. Taiwan Limited 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029 Ceramic Dual-In-Line Metal Seal Packages (SBDIP) NOTES: 1. Index area: A notch or a pin one identification mark shall be locat- ed adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark. 2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied. 3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness. 4. Corner leads (1, N,N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2. 5. Dimension Q shall be measured from the seating plane to the base plane. 6. Measure dimension S1 at all four corners. 7. Measure dimension S2 from the top of the ceramic body to the nearest metallization or lead. 8. N is the maximum number of terminal positions. 9. Braze fillets shall be concave. 10. Dimensioning and tolerancing per ANSI Y14.5M - 1982. 11. Controlling dimension: INCH. bbb C A - BS c Q L A SEATING BASE D PLANE PLANE S S -D--A- -C- eA -B- aaa C A - BM DS Sccc C A - BM DS S D E b A e M (c) (b) SECTION A-A BASE LEAD FINISH METAL eA/2 M A D8.3 MIL-STD-1835 CDIP2-T8 (D-4, CONFIGURATION C)
8 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE
A - 0.200 - 5.08 - b 0.014 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 - b3 0.023 0.045 0.58 1.14 4 c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3 E 0.220 0.310 5.59 7.87 - e 0.100 BSC 2.54 BSC - eA 0.300 BSC 7.62 BSC - eA/2 0.150 BSC 3.81 BSC - L 0.125 0.200 3.18 5.08 - Q 0.015 0.060 0.38 1.52 5 S1 0.005 - 0.13 - 6 S2 0.005 - 0.13 - 7 α 90o 105o 90o 105o - aaa - 0.015 - 0.38 - bbb - 0.030 - 0.76 - ccc - 0.010 - 0.25 - M - 0.0015 - 0.038 2 N8 8 8 Rev. 0 4/94 HV400MJ/883