HS-302RH INTERSIL | Alldatasheet

Document overview

  • Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
  • PDF pages: 16

Technical content

Features

  • This Circuit is Processed in Accordance to Mil-Std- 883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
  • Radiation Hardened - Functional Total Dose Exceeds 1 x 10

5 RAD Si

  • Pin for Pin Compatible with Intersil HI-3XX Series Analog Switches
  • Analog Signal Range 15V
  • Low Leakage
  • L o w R ON
  • No Latch Up
  • Versions for 5V and 15V Digital Systems
  • Low Operating Power
  • Military Temperature Range -55 oC to +125oC

Applications

  • Sample and Hold i.e. Low Leakage Switching
  • Op Amp Gain Switching i.e. Low ON Resistance
  • Switched Capacitor Filters
  • Low Level Switching Circuits
  • Satellites
  • Nuclear Reactor Controls
  • Military Environments September 1995 HS-302RH/883S, HS-303RH/883S, HS-306RH/883S, HS-307RH/883S, HS-384RH/883S, HS-390RH/883S Radiation Hardened CMOS Analog Switches Spec Number 518526 File Number 3067.1

HS1-306RH/Sample (Note 1) +25 oC Sample 14 Lead SBDIP HS9-306RH/Sample (Note 1) +25 oC Sample 14 Lead Ceramic Flatpack HS1-307RH/883S -55 oC to +125oC Intersil /883 Class S Equivalent 14 Lead SBDIP HS9-307RH/883S -55 oC to +125oC Intersil /883 Class S Equivalent 14 Lead Ceramic Flatpack HS1-307RH/Sample +25 oC Sample 14 Lead SBDIP HS9-307RH/Sample +25 oC Sample 14 Lead Ceramic Flatpack HS1-384RH/883S (Note 1) -55 oC to +125oC Intersil /883 Class S Equivalent 16 Lead SBDIP HS9-384RH/883S (Note 1) -55 oC to +125oC Intersil /883 Class S Equivalent 16 Lead Ceramic Flatpack HS1-384RH/Sample (Note 1) +25 oC Sample 16 Lead SBDIP HS9-384RH/Sample (Note 1) +25 oC Sample 16 Lead Ceramic Flatpack HS1-390RH/883S -55 oC to +125oC Intersil /883 Class S Equivalent 16 Lead SBDIP HS9-390RH/883S -55 oC to +125oC Intersil /883 Class S Equivalent 16 Lead Ceramic Flatpack HS1-390RH/Sample +25 oC Sample 16 Lead SBDIP HS9-390RH/Sample +25 oC Sample 16 Lead Ceramic Flatpack NOTE: 1. Not recommended for new design. Pinouts(Switch States are for Logic “1” Inputs)

14 LEAD CERAMIC DUAL-IN-LINE

METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T14 TOP VIEW

16 LEAD CERAMIC DUAL-IN-LINE

METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T16 TOP VIEW DUAL DPST HS-302RH/883S HS-306RH/883S DUAL SPDT HS-303RH/883S HS-307RH/883S DUAL DPST HS-384RH/883S DUAL SPDT HS-390RH/883S Ordering Information (Continued) PART NUMBER TEMPERATURE RANGE SCREENING LEVEL PACKAGE NC GND IN1 IN2 S2S1 LOGIC SWITCH 1 - 4

0 OFF

0 OFF ON

1 ON OFF

14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK)

16 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK)

Pinouts(Switch States are for Logic “1” Inputs) (Continued) NC GND IN1 IN2 LOGIC SWITCH 1 - 4 LOGIC SW1 AND SW2 SW3 AND SW4 LOGIC SW1 AND SW2 SW3 AND SW4

of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. TABLE 1. HS-302RH/303RH/384RH/390RH/883S DC ELECTRICAL PERFORMANCE CHARACTERISTICS

TABLE 1. HS-306RH/307RH/883S DC ELECTRICAL PERFORMANCE CHARACTERISTICS TABLE 1. HS-302RH/303RH/384RH/390RH/883S DC ELECTRICAL PERFORMANCE CHARACTERISTICS

TABLE 2. HS-302RH/303RH/384RH/390RH/883S AC ELECTRICAL PERFORMANCE CHARACTERISTICS TABLE 2. HS-306RH/307RH/883S AC ELECTRICAL PERFORMANCE CHARACTERISTICS TABLE 1. HS-306RH/307RH/883S DC ELECTRICAL PERFORMANCE CHARACTERISTICS

TABLE 3. HS-302RH/303RH/306RH/307RH/384RH/390RH/883S characterization based upon data from multiple production runs which reflect lot to lot and within lot variation. TABLE 4. HS-302RH/303RH/384RH/390RH/883S DC POST 100K RAD (Si) ELECTRICAL CHARACTERISTICS

TABLE 4. HS-306/307RH/883S DC POST 100K RAD (Si) ELECTRICAL CHARACTERISTICS TABLE 5. HS-302RH/303RH/384RH/390RH/883S DC POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS

TABLE 5. HS-306RH/307RH/883S DC POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS TABLE 5. HS-302RH/303RH/384RH/390RH/883S DC POST BURN-IN DELTA ELECTRICAL CHARACTERISTICS

TABLE 6. APPLICABLE SUBGROUPS

  1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.

HS-302RH/303RH/306RH/307RH/384RH/390RH/883S Intersil Space Level Product Flow Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019,

4 Samples/Wafer, 0 Rejects

100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method 2011 Sample - Die Shear Monitor, Method 2019 or 2027 100% Internal Visual Inspection, Method 2010, Condition A 100% Temperature Cycle, Method 1010, Condition C,

10 Cycles

100% Constant Acceleration, Method 2001, Condition per Method 5004 100% PIND, Method 2020, Condition A 100% External Visual 100% Serialization 100% Initial Electrical Test (T0) 100% Static Burn-In 1, Condition A or B, 72hrs. min., +125 oC min. 100% Interim Electrical Test (T1) 100% Delta Calculation (T0-T1) 100% PDA, Method 5004 (Note 1) 100% Dynamic Burn-In, Condition D, 240 hrs., +125 oCo r Equivalent, Method 1015 100% Interim Electrical Test (T2) 100% Delta Calculation (T0-T2) 100% PDA, Method 5004 (Note 1) 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% Radiographic, Method 2012 (Note 2) 100% External Visual, Method 2009 Sample - Group A, Method 5005 (Note 3) Sample - Group B, Method 5005 Sample - Group D, Method 5005 100% Data Package Generation (Note 4) NOTES: 1. Failures from subgroup 1, 7 and deltas are used for calculating PDA. The maximum allowable PDA = 5% with no more than 3% of the failures from subgroup 7. 2. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004. 3. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. 4. Data Package Contents:

  • Cover Sheet (Intersil Name and/or Logo, P .O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan- tity).
  • Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage.
  • GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil.
  • X-Ray report and film. Includes penetrometer measurements.
  • Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
  • Lot Serial Number Sheet (Good units serial number and lot number).
  • Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. (See Table 6)
  • Group B and D attributes and/or Generic data.
  • The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. Spec Number 518526

HS-302RH/303RH/306RH/307RH/384RH/390RH/883S Irradiation Circuits HS-302RH/303RH/883S HS-384RH/390RH/883S NOTES: 2. V1 = +15V± 10% 3. V2 = -15V± 10% 4. V3 = +5V± 10% 5. All irradiation testing is performed in the 14 pin package. HS-306RH/307RH/883S NOTES: 2. V1 = +15V± 10% 3. V2 = -15V± 10% 4. V3 = +12V± 10% 5. All irradiation testing is performed in the 14 pin package. Burn-In Circuits STATIC CONFIGURATION HS-302RH/303RH/306RH/307RH/883S NOTES: 1. R = 10KΩ± 5%, 1/4W (4 per position) 2. C = 0.01µF minimum (per position) or 0.1µF minimum per row 3. D = IN4002 (or equivalent) 5. VA = +15.5V± 0.5V for 306RH/307RH 6. VA = +5.5V± 0.5V for 302RH/303RH STATIC CONFIGURATION HS-384RH/390RH/883S NOTES: 1. R = 10KΩ± 5%, 1/4W (4 per position) 2. C = 0.01µF minimum (per position) or 0.1µF minimum per row 3. D = IN4002 (or equivalent) V+NC GND V- IN1 IN2 S2S1 R4 R5 V+NC GND V- IN1 IN2 S2S1 R4 R5 NC 1 R R R R C D C D V-VA V+ VA R R R R D D C C Spec Number 518526

HS-302RH/303RH/306RH/307RH/384RH/390RH/883S DYNAMIC CONFIGURATION HS-302RH/303RH/883S NOTES: 1. R = 10KΩ± 5%, 1/4W (4 per position) 2. C = 0.01µF minimum (per position) or 0.1µF minimum per row 3. D = IN4002 (or equivalent) 4. F = 100kHz square wave, 50% duty cycle, VL = 0.8V max., VH = 5.5V± 0.5V DYNAMIC CONFIGURATION HS-306RH/307RH/883S NOTES: 1. R = 10KΩ± 5%, 1/4W (4 per position) 2. C = 0.01µF minimum (per position) or 0.1µF minimum per row 3. D = IN4002 (or equivalent) 4. F = 100kHz square wave, 50% duty cycle, VL = 0.8V max., VH = 14V± 1V DYNAMIC CONFIGURATION HS-384RH/390RH/883S NOTES: 1. R = 10KΩ± 5%, 1/4W (4 per position) 2. C = 0.01µF minimum (per position) or 0.1µF minimum per row 3. D = IN4002 (or equivalent) 4. F = 100kHz square wave, 50% duty cycle, VL = 0.8V max., VH = +5.5V±0.5V Burn-In Circuits (Continued) R R R R C D C D V-FV + NC 1 R R R R C D C D V-FV + NC R R R R D D C C F Spec Number 518526

HS-302RH/303RH/306RH/307RH/384RH/390RH/883S Metallization Topology DIE DIMENSIONS: Die Size: 2130 x 1930µm Die Thickness: 11±1 mils METALLIZATION: Type: Al, 12.5kÅ ± 2kÅ Back: Gold GLASSIVATION: Type: SiO2 Thickness: 8kÅ ± 1kÅ WORST CASE CURRENT DENSITY: 1.732e05 A/cm2 SUBSTRATE POTENTIAL: Unbiased PROCESS: DI Linear Metal Gate CMOS Metallization Mask Layout HS-302RH/303RH/306RH/307RH/883S HS-384RH/390RH/883S IN1 NC GND IN2 IN1 GND IN2 Spec Number 518526

All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with- out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web sitehttp://www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee

1130 Brussels, Belgium

TEL: (32) 2.724.2111 ASIA Intersil (Taiwan) Ltd. 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029 HS-302RH/303RH/306RH/307RH/384RH/390RH/883S Spec Number