HS-2420RH INTERSIL | Alldatasheet

Document overview

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  • PDF pages: 13

Technical content

Features

  • Maximum Acquisition Time (Maximum Over Temperature)
  • TTL Compatible Control Input

5 RAD(SI)

  • No Latch-Up

Applications

  • Data Acquisition Systems
  • D to A Deglitcher
  • Auto Zero Systems
  • Peak Detector
  • Gated Op Amp

Ordering Information

HS1-2420RH-Q -55 oC to +125oC 14 Lead CerDIP July 1995

14 LEAD CERAMIC DUAL-IN-LINE

FRIT SEAL PACKAGE (CerDIP) MIL-STD-1835, GDIP1-T14 TOP VIEW IN- IN+ OFFSET ADJUST OFFSET ADJUST NC OUTPUT SAMPLE/HOLD GND NC HOLD CAPACITOR NC NC CONTROL1

14 Pin DIP

NOTE: Pin Numbers Correspond to DIP Package Only. OFFSET ADJUST 34 5 OUTPUT HOLD CAPACITOR - INPUT + INPUT SAMPLE/ HOLD CONTROL V-GND 513 HS-2420RH Spec Number 518855 File Number 3554.1 Pinout

of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS

  1. VERROR = VOUT (VS/H = 0V) - VOUT (VS/H = 4V)

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS parameters are characterized upon initial design release and upon design changes which would affect these characteristics. TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)

TABLE 4. DC ELECTRICAL PERFORMANCE CHARACTERISTICS POST 100KRAD

  1. VERROR = VOUT (VS/H = 0V) - VOUT (VS/H = 4V)

TABLE 5. BURN-IN DELTA PARAMETERS (T A = +25oC) TABLE 6. APPLICABLE SUBGROUPS NOTE: Alternate Group A testing may be exercised in accordance with Method 5005 of MIL-STD-883.

Intersil Space Level Product Flow -Q Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) (Note 1) GAMMA Radiation Verification (Each Wafer) Method 1019,

4 Samples/Wafer, 0 Rejects

100% Die Attach 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method 2011 Sample - Die Shear Monitor, Method 2019 or 2027 100% Internal Visual Inspection, Method 2010, Condition A CSI and/or GSI Pre-Cap (Note 7) 100% Temperature Cycle, Method 1010, Condition C,

10 Cycles

100% Constant Acceleration, Method 2001, Condition per Method 5004 100% PIND, Method 2020, Condition A 100% External Visual 100% Serialization 100% Initial Electrical Test (T0) 100% Static Burn-In, Condition A, 240 Hours, +125 oC or Equivalent, Method 1015 100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% PDA, Method 5004 (Note 2) 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% Radiographic (X-Ray), Method 2012 (Note 3) 100% External Visual, Method 2009 Sample - Group A, Method 5005 (Note 4) Sample - Group B, Method 5005 (Note 5) Sample - Group C, Method 5005 (Notes 5, 6) 100% Data Package Generation (Note 8) CSI and/or GSI Final (Note 7) NOTES: 1. Modified SEM Inspection, not compliant to MIL-STD-883, Method 2018. This device does not meet the Class S minimum metal step coverage of 50%. The metal does meet the current density requirement of <2E5A/cm2. Data provided upon request. 2. Failures from subgroup 1 and deltas are used for calculating PDA. The maximum allowable PDA = 5%. 3. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004. 4. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. separate line items for Group B test, Group B samples, Group D test and Group D samples. 6. Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the P.O. should include a separate line item for Group D generic data. Generic data is not guaranteed to be available and is therefore not available in all cases. separate line items for CSI Pre-Cap inspection, CSI Final Inspection, GSI Pre-Cap inspection, and/or GSI Final Inspection. 8. Data Package Contents: Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quantity). Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage. GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil. X-Ray report and film. Includes penetrometer measurements. Screening, Electrical, and Group A attributes (Screening attributes begin after package seal). Lot Serial Number Sheet (Good units serial number and lot number). Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. Group B and D attributes and/or Generic data is included when required by the P.O. The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. Spec Number 518855 HS-2420RH

All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web sitehttp://www.intersil.com HS-2420RH Metallization Topology DIE DIMENSIONS: 97 mils x 61 mils x 19 mils METALLIZATION: Type: Al Thickness: 16k Å ±2kÅ GLASSIVATION: Type: Silox Thickness: 14k Å ±2kÅ WORST CASE CURRENT DENSITY: 2.0 x 105A/cm2 TRANSISTOR COUNT: 78 PROCESS: Bipolar-DI Metallization Mask Layout HS-2420RH +IN (2) OFF ADJ (3) OFF ADJ (4) V- (5) (7) OUT (9) (11) HOLD CAP (13) GND -IN (1) S/H CONTROL (14) Spec Number 518855