HD151TS304ARP RENESAS | Alldatasheet
Document overview
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- PDF pages: 12
Technical content
Features
- Supports 10 MHz to 60 MHz operation. (Designed for XIN = 24 MHz and 48 MHz)
- 1 copy of clock out with spread spectrum modulation @3.3 V
- 1 copy of reference clock @3.3 V
- Programmable spread spectrum modulation (±0.25%, ±0.5%, ±1.5% central spread modulation and spread spectrum disable mode.)
- SOP–8pin
- Pin to pin compatible with HD151TS304RP Key Specifications
- Supply voltages : VDD = 3.3 V±0.165 V
- Ta = 0 to 70°C operating range
- Clock output duty cycle = 50±5%
- Cycle to cycle jitter = ±250 ps typ.
- Output slew rate = 0.8V/ns min.
- Ordering Information Part Name Package Type Package Code Package Abbreviation Taping Abbreviation (Quantity) HD151TS304ARPEL SOP-8 pin (JEDEC) FP-8DC RP EL (2,500 pcs / Reel) Note: Please consult the sales office for the above package availability.
Rev.4.00, May.19.2003, page 2 of 12 Block Diagram Synthesizer Mode Control 1/n OSC SSC Modulator VDD CLKOUT SSCCLKOUT GND SEL0 XIN XOUT SEL1 1/m R=100 kΩ R=1 MΩ R=100 kΩ Pin Arrangement (Top view)
8 SEL11
7 CLKOUT
6 SEL0
5 XOUT
Rev.4.00, May.19.2003, page 3 of 12 SSC Function Table SEL1 :0 Spread Percentage 0 0 ±0.5% 0 1 ±1.5% 1 0 SSC OFF 1 1 ±0.25% Note: ±1.5% SSC is selected for default by internal pull-up & down resistors. Clock Frequency Table XIN(MHz) SSCCLKOUT(MHz) CLKOUT(MHz) 48 48 *1 48*2 24 24 *1 24*2 Notes: 1. With spread spectrum modulation. 2. Without spread spectrum modulation. Pin Descriptions Pin name No. Type Description GND 3 Ground GND pin VDD 2 Power Power supplies pin. Normally 3.3 V. CLKOUT 7 Output Normally 3.3 V reference clock output. SSCCLKOUT 1 Output Spread spectr um modulated clock output. XIN 4 Input Oscillator input. XOUT 5 Output Oscillator output. SEL0 6 Input SSC mode select pin. LVCMOS level input. Pull-up by internal resistor. (100 kΩ ). SEL1 8 Input SSC mode select pin. LVCMOS level input. Pull–down by internal resistor (100 kΩ ).
Rev.4.00, May.19.2003, page 4 of 12 Absolute Maximum Ratings Item Symbol Ratings Unit Conditions Supply voltage VDD –0.5 to 4.6 V Input voltage V I –0.5 to 4.6 V Output voltage *1 VO –0.5 to VDD+0.5 V Input clamp current I IK –50 mA V I < 0 Output clamp current I OK –50 mA V O < 0 Continuous output current I O ±50 mA V O = 0 to VDD Maximum power dissipation at Ta = 55°C (in still air) 0.7 W Storage temperature T stg –65 to +150 °C Notes: Stresses beyond those listed under “absolut e maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. Recommended Operating Conditions Item Symbol Min Typ Max Unit Conditions Supply voltage VDD 3.135 3.3 3.465 V DC input signal voltage –0.3 — VDD+0.3 V High level input voltage V IH 2.0 — VDD+0.3 V Low level input voltage V IL –0.3 — 0.8 V Operating temperature T a 0— 7 0 ° C Input clock duty cycle 45 50 55 %
Rev.4.00, May.19.2003, page 5 of 12 Ta = 0 to 70°C, VDD = 3.3 V±5% Item Symbol Min Typ Max Unit Test Conditions Input low voltage V IL —— 0 . 8 V Input high voltage V IH 2.0 — — V Input current I I —— ± 1 0 µ A V I = 0 V or 3.465 V, VDD = 3.465 V, XIN pin —— ± 1 0 0 V I = 0 V or 3.465 V, VDD = 3.465 V, SEL0, SEL1 pins Input slew rate 1 — 4 V / ns 20% – 80% Input capacitance C I — — 4 pF SEL0, SEL1 Operating current — 7 — mA XIN = 24 MHz, C L = 0 pF, VDD = 3.3 V Ta = 0 to 70°C, VDD = 3.3 V±5% Item Symbol Min Typ Max Unit Test Conditions VOH 3.1 — — V I OH = –1 mA, VDD = 3.3 VOutput voltage0 VOL —— 5 0 m V I OL = 1 mA, VDD = 3.3 V IOH — –30 — V OH = 1.5 VOutput current*1 IOL —3 0 — mA VOL = 1.5 V Note: 1. Parameters are target of desi gn. Not 100% tested in production.
Rev.4.00, May.19.2003, page 6 of 12 Ta = 25°C, VDD = 3.3 V, CL = 15 pF Item Symbol Min Typ Max Unit Test Conditions Notes — | 250 | | 300 | SSCCLKOUT,
24 MHz
— | 250 | | 300 | SSCCLKOUT,
48 MHz
SEL1:0 = 10 Fig1 — | 250 | | 300 | SSCCLKOUT, — | 250 | | 300 | SSCCLKOUT, SSC= ±0.25% SEL1:0 = 11 Fig1 — | 250 | | 300 | SSCCLKOUT, — | 250 | | 300 | SSCCLKOUT, SSC= ±1.5% SEL1:0 = 01 Fig1 Cycle to cycle jitter *1, 2 tCCS ps CLKOUT,
24 MHz & 48MHz
23.8 — 24.2 SSCCLKOUT, XIN = 24 MHz 47.3 — 48.7 SSCCLKOUT, XIN = 48 MHz SSCOFF SEL1:0 = 10 23.7 — 24.3 SSCCLKOUT, XIN = 24 MHz 47.2 — 48.8 SSCCLKOUT, XIN = 48 MHz SSC= ±0.25% SEL1:0 = 11 23.4 — 24.6 SSCCLKOUT, XIN = 24 MHz 46.6 — 49.4 SSCCLKOUT, XIN = 48 MHz SSC= ±1.5% SEL1:0 = 01 23.8 — 24.2 CLKOUT, *1, 2 47.3 — 48.7 MHz CLKOUT, tSL 0.8 — — V/ns @48 MHz CLKOUT 0.4 V to 2.4 V Clock duty cycle 45 50 55 % Output impedance —4 0— Ω Spread spectrum modulation frequency — 33 — KHz @48 MHz SSCCLKOUT Input clock frequency 10 — 60 MHz Stabilization time *1,3 ——2 m s Notes: 1. Parameters are target of design. Not 100% tested in production. 2. Cycle to cycle jitter and output frequenc y are included spread spectrum modulation. 3. Stabilization time is the time required for the integrat ed circuit to obtain phase lock of its input signal after power up.
Rev.4.00, May.19.2003, page 7 of 12 SSCCLKOUT (or CLKOUT) tcycle n t = (tcycle n) - (tcycle n+1)CCS tcycle n+1 Figure 1 Cycle to cycle jitter
Rev.4.00, May.19.2003, page 8 of 12
Application Information
- Recommended Circuit Configuration The power supply circuit of the optimal performance on the application of a system should refer to Fig. 2. VDD decoupling is important to both reduce Jitter and EMI radiation. The C1 decoupling capacitor should be placed as close to the VDD pin as possible, otherwise the increased trace inductance will negate its decoupling capability. The C2 decoupling capacitor shown should be a tantalum type.
(Crystal or Reference input) (Crystal or Not connection) Notes: C1 = High frequency supply decoupling capacitor. (0.1 µF recommended) C2 = Low frequency supply decoupling capacitor. (22 µF tantalum type recommended) R1, R2 = Match value to line impedance. (22 Ω Reference value) Figure 2 Recommended circuit configuration
Rev.4.00, May.19.2003, page 9 of 12 2. Example Board Layout Configuration G P G G 0.1 µF 22 µF FB VDD (+3.3 V Supply) GNote: Via to GND plane R1, R2 = Match value to line impedance. FB = Ferrite bead. (22 Ω Reference value) Figure 3 Example Board Layout
Rev.4.00, May.19.2003, page 10 of 12 3. Example of TS300 EMI Solution IC’s Application TS30XTS30X System BUSSystem BU S MemoryM em ory GraphicsG raphics System Cont.System C ont. SSCSSC CLKOUTC LKO U T Spread SpectrumSpread Spectrum Modulated ClockM odulated C lock CPU & ASICC PU & ASIC XTALXTAL Ref.R ef. ClockC lock XINXIN XOUTXO U T 3.3 V CMOS level ref. Clock 3.3 V C M O S level ref. C lock Fig 4 Ref. Clock Input Example TS30XTS30X System BUSSystem BU S MemoryM em ory GraphicsG raphics System Cont.System C ont. SSCSSC CLKOUTC LKO U T Spread SpectrumSpread Spectrum Modulated ClockM odulated C lock CPU & ASICC PU & ASIC XINXIN XOUTXO U TXTALXTAL Fig 5 XTAL Ref. Clock Input Example
Rev.4.00, May.19.2003, page 11 of 12 Package Dimensions Package Code JEDEC JEITA Mass (reference value) FP-8DC Conforms 0.085 g *Dimension including the plating thickness Base material dimension
1.75 Max
4.90 0.25 0.15 0˚ – 8˚ M 8 5 1 4 1.27 3.95 0.40 ± 0.06 *0.42 ± 0.08
5.3 Max
0.75 Max
0.14+ 0.11 – 0.04 0.20 ± 0.03 *0.22 ± 0.03 0.60+ 0.67 – 0.20 6.10+ 0.10 – 0.30 1.08 As of January, 2003 Unit: mm
Rev.4.00, May.19.2003, page 12 of 12 Keep safety first in your circuit designs! 1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corporation product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corporation or a third party. 2. Renesas Technology Corporation assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corporation without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Renesas Technology Corporation assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Renesas Technology Corporation by various means, including the Renesas Technology Corporation Semiconductor home page (http://www.renesas.com). 4. When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. Renesas Technology Corporation assumes no responsibility for any damage, liability or other loss resulting from the information contained herein. 5. Renesas Technology Corporation semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corporation is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corporation for further details on these materials or the products contained therein. Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan http://www.renesas.com Copyright © 2003. Renesas Technology Corporation, All rights reserved. Printed in Japan. Colophon 0.0