74VHC157 STMICROELECTRONICS | Alldatasheet
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QUAD 2 CHANNEL MULTIPLEXER PRELIMINARY DATA June 1999 n HIGH SPEED: tPD = 4.1 ns (TYP.) at VCC =5 V n LOW POWER DISSIPATION: ICC =4 µA (MAX.) at TA =2 5oC n HIGH NOISE IMMUNITY: VNIH =V NIL =2 8 %VCC (MIN.) n POWER DOWN PROTECTION ON INPUTS n SYMMETRICAL OUTPUT IMPEDANCE: OH |=IOL = 8 mA (MIN) n BALANCED PROPAGATION DELAYS: tPLH ≅ tPHL n OPERATING VOLTAGE RANGE: VCC (OPR)= 2V to 5.5V n PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 157
n IMPROVED LATCH-UP IMMUNITY n LOW NOISE: VOLP = 0.8V(Max.)
DESCRIPTION
The 74VHC157 is an high-speed CMOS QUAD 2-CHANNEL MULTIPLEXER fabricated with sub-micron silicon gate and double-layer metal wiring C 2MOS technology. It consists of four 2-input digital multiplexers with common select and strobe inputs. It is a non-inverting multiplexer. When the STROBE input is held high, selection of data is inhibited and all the outputs become low. The SELECT decoding determines whether the A or B inputs get routed to their corresponding Y outputs. Power down protection is provided on all inputs and 0 to 7V can be accepted on inputs with no regard to the supply voltage. This device can be used to interface 5V to 3V.All inputs and outputs are equipped with protection circuits against static discharge, giving them 2KV ESD immunity and transient excess voltage. PIN CONNECTION AND IEC LOGIC SYMBOLS (Micro Package) T (TSSOP Package) ORDER CODES : 74VHC157M 74VHC157T
X:”H” or ”L” PIN DESCRIPTION PIN No SYMBOL NAME AND FUNCTION
1 SELECT Common Data Select Input
2,5, 11, 14 1Ato4A Data Inputs From Source A 3,6, 10, 13 1Bto4B Data Inputs From Source B 4,7,9,12 1Yto4Y Multiplexer Outputs
15 STROBE Strobe Input
8 GND Ground (0V)
16 V CC Positive Supply Voltage
Symbol Parameter Value Unit VCC Supply Voltage -0.5to+7.0 V VI DC Input Voltage -0.5to+7.0 V VO DC Output Voltage -0.5toV CC +0 . 5 V IIK DC Input Diode Current -20 mA IOK DC Output Diode Current ± 20 mA IO DC Output Current ± 25 mA ICC or IGN D DC V CC or Ground Current ± 50 mA Tstg Storage Temperature -65 to+150 oC TL Lead Temperature (10 sec) 300 oC AbsoluteMaximum Ratingsarethose values beyond whichdam age to the device may occur. Functional operation un der these condition isnot implied. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Value Unit VCC Supply Voltage 2.0to5.5 V VI Input Voltage 0 to 5.5 V VO Output Voltage 0 toV CC V Top Operating Temperature -40 to+85 oC dt/dv Input Rise and Fall Time (see note 1) (VCC =3 . 3± 0.3V) (VCC =5 . 0± 0.5V) 0t o1 0 0 0t o2 0 ns/V ns/V 1) VINfrom 30% to70%of VCC DC SPECIFICATIONS Symbol Parameter Test Conditions Value Unit V CC (V) TA =2 5 o C -40 to 85 o C VIH High Level Input Voltage 2.0 1.5 1.5 V 3.0 to 5.5 0.7V CC 0.7VCC VIL Low Level Input Voltage 2.0 0.5 0.5 V 3.0 to 5.5 0.3V CC 0.3VCC VOH High Level Output Voltage 2.0 I O =-50µA1 . 9 2 . 0 1 . 9 V 3.0 I O =-50µA2 . 9 3 . 0 2 . 9 4.5 I O =-50µA4 . 4 4 . 5 4 . 4 3.0 I O =-4 mA 2.58 2.48 4.5 I O =-8 mA 3.94 3.8 VOL Low Level Output Voltage 2.0 I O =50µA 0.0 0.1 0.1 V 3.0 I O =50µA 0.0 0.1 0.1 4.5 I O =50µA 0.0 0.1 0.1 3.0 I O =4mA 0.36 0.44 4.5 I O =8mA 0.36 0.44 II Input Leakage Current 0 to5.5 V I=5. 5 Vo rGN D ±0.1 ±1.0 µA ICC Quiescent Supply Current
5.5 V I=V CC orGND 4 40 µA
CAPACITIVE CHARACTERISTICS Symbol Parameter Test Conditions Value Unit TA =2 5 o C -40 to 85 o C CIN Input Capacitance 4 10 10 pF CPD Power Dissipation Capacitance (note 1) 20 pF 1) CPD isdefined as thevalue of the IC’sinternal equivalent capacitance whichis calculated fromthe operating current consumption without load. (Referto Test Circuit).Average operating current can be obtained bythe followingequation. ICC (opr) = CPD • VCC • fIN+ICC /4 (per Channel) AC ELECTRICAL CHARACTERISTICS (Input tr =tf=3 ns) Symbol Parameter Test Condition Value Unit V CC (V) C L (pF) TA =2 5 o C -40 to 85 o C tPLH tPHL Propagation Delay Time A, B to Y tPLH tPHL Propagation Delay Time SELECT to Y 3.3 tPLH tPHL Propagation Delay Time STROBE to Y (*) Voltag erange is 3.3V± 0.3V (**) Voltagerange is 5V± 0.5V 74VHC157
DYNAMIC SWITCHING CHARACTERISTICS Symbol Parameter Test Conditions Value Unit V CC (V) TA =2 5 o C -40 to 85 o C VOLP Dynamic Low Voltage Quiet Output (note 1, 2) 5.0 CL =5 0p F 0.3 0.8 V VOLV -0.8 -0.3 VIHD Dynamic High Voltage Input (note 1, 3) 5.0 3.5 VILD Dynamic Low Voltage Input (note 1, 3) 5.0 1.5 1) Worst case package. 2) Max num ber of outputs defined as (n). Datainputs aredriven 0V to 5.0V, (n -1) outputs switching andone output at GND. 3) Max num ber of datainputs (n) switching. (n-1) switching 0V to5.0V. Inputs under test switching: 5.0V to threshold (V ILD),0V tothreshold (VIHD),f=1MHz. TEST CIRCUIT CL = 15/50 pF or equivalent (includes jig and probe capacitance) RT =Z OUT of pulse generator (typically50Ω ) 74VHC157
WAVEFORM 1: PROPAGATION DELAYS FOR INVERTING CONDITIONS WAVEFORM 2: PROPAGATION DELAYS FOR NON-INVERTING CONDITIONS 74VHC157
DIM. mm inch A 1.75 0.068 a1 0.1 0.2 0.004 0.007 a2 1.65 0.064 b 0.35 0.46 0.013 0.018 b1 0.19 0.25 0.007 0.010 C 0.5 0.019 c1 45 (typ.) D 9.8 10 0.385 0.393 E 5.8 6.2 0.228 0.244 e 1.27 0.050 e3 8.89 0.350 F 3.8 4.0 0.149 0.157 G 4.6 5.3 0.181 0.208 L 0.5 1.27 0.019 0.050 M 0.62 0.024 S 8 (max.) P013H SO-16 MECHANICAL DATA 74VHC157
DIM. mm inch A 1.1 0.433 b 0.19 0.30 0.0075 0.0118 c 0.09 0.20 0.0035 0.0079 e 0.65 BSC 0.0256 BSC o 4o 8o 0o 4o 8o c Eb A2A D PIN 1 IDENTIFICATION LKe TSSOP16 MECHANICAL DATA 74VHC157
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