GA75TS120U IRF | Alldatasheet
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VCES = 1200V VCE(on) typ. = 2.1V @VGE = 15V, IC = 75A Parameter Typ. Max. Units RθJC Thermal Resistance, Junction-to-Case - IGBT — 0.32 RθJC Thermal Resistance, Junction-to-Case - Diode — 0.35 °C/W RθCS Thermal Resistance, Case-to-Sink - Module 0.1 — Mounting Torque, Case-to-Heatsink — 4.0 N m Mounting Torque, Case-to-Terminal 1, 2 & 3 ➂ — 3.0 Weight of Module 200 — g Thermal / Mechanical Characteristics Ultra-FastTM Speed IGBT Absolute Maximum Ratings Parameter Max. Units VCES Collector-to-Emitter Voltage 1200 V IC @ TC = 25°C Continuous Collector Current 75 ICM Pulsed Collector Current ➀ 150 A ILM Peak Switching Current ➁ 150 IFM Peak Diode Forward Current 150 VGE Gate-to-Emitter Voltage ±20 V VISOL RMS Isolation Voltage, Any Terminal To Case, t = 1 min 2500 PD @ TC = 25°C Maximum Power Dissipation 390 W PD @ TC = 85°C Maximum Power Dissipation 200 TJ Operating Junction Temperature Range -40 to +150 °C TSTG Storage Temperature Range -40 to +125 UltraFast: Optimized for high operating frequencies 8-40 kHz in hard switching, >200 kHz in resonant mode Very low conduction and switching losses HEXFRED ™ antiparallel diodes with ultra- soft recovery Industry standard package UL approved Benefits Increased operating efficiency Direct mounting to heatsink Performance optimized for power conversion: UPS, SMPS, Welding Lower EMI, requires less snubbing PD - 50062A Generation 4 IGBT technology www.irf.com 1
2 www.irf.com Parameter Min. Typ. Max. Units Conditions Qg Total Gate Charge (turn-on) — 570 854 V CC = 400V Qge Gate - Emitter Charge (turn-on) — 96 144 nC I C = 85A Qgc Gate - Collector Charge (turn-on) — 189 283 T J = 25°C td(on) Turn-On Delay Time — 109 — RG1 = 15Ω, RG2 = 0Ω, tr Rise Time — 119 — ns I C = 75A td(off) Turn-Off Delay Time — 392 — VCC = 720V tf Fall Time — 402 — VGE = ±15V Eon Turn-On Switching Energy — 11 — mJ Inductor load Eoff (1) Turn-Off Switching Energy — 20 — Ets (1) Total Switching Energy — 31 45 Cies Input Capacitance — 12815 — VGE = 0V Coes Output Capacitance — 570 — pF V CC = 30V Cres Reverse Transfer Capacitance — 110 —ƒ = 1 MHz trr Diode Reverse Recovery Time — 174 — ns I C = 75A Irr Diode Peak ReverseCurrent — 107 — AR G1 = 15Ω Qrr Diode Recovery Charge — 9367 — nC R G2 = 0Ω di(rec)M/dt Diode Peak Rate of Fall of Recovery — 1491 — A/µs V CC = 720V During tb di/dt = 1300A/µs Parameter Min. Typ. Max. Units Conditions V(BR)CES Collector-to-Emitter Breakdown Voltage 1200 —— VGE = 0V, IC = 1mA VCE(on) Collector-to-Emitter Voltage — 2.1 3.1 V GE = 15V, IC = 75A — 1.9 — VV GE = 15V, IC = 75A, TJ = 125°C VGE(th) Gate Threshold Voltage 3.0 — 6.0 V CE = 6.0V, IC = 750µA ∆VGE(th)/∆TJ Temperature Coeff. of Threshold Voltage — -11 — mV/°CV CE = 6.0V, IC = 750µA gfe Forward Transconductance ➃ — 107 — SV CE = 25V, IC = 75A ICES Collector-to-Emitter Leaking Current —— 1.0 mA V GE = 0V, VCE = 1200V —— 10 V GE = 0V, VCE = 1200V, TJ = 125°C VFM Diode Forward Voltage - Maximum — 2.3 3.3 V I F = 75A, VGE = 0V — 2.1 — IF = 75A, VGE = 0V, TJ = 125°C IGES Gate-to-Emitter Leakage Current —— 250 nA V GE = ±20V Dynamic Characteristics - TJ = 125°C (unless otherwise specified) Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
www.irf.com 3 Fig. 1 - Typical Load Current vs. Frequency (Load Current = IRMS of fundamental) Fig. 2 - Typical Output Characteristics Fig. 3 - Typical Transfer Characteristics 0.1 100 1000 V , Gate-to-Emitter Voltage (V) I , Collector-to-Emitter Current (A) GE C /G20 V = 25V 80µs PULSE WIDTH CE /G20T = 25 CJ ° /G20T = 125 CJ ° 100 1000 1.0 1.5 2.0 2.5 V , Collector-to-Emitter Voltage (V) I , Collector Current (A) CE C /G20 V = 15V 80µs PULSE WIDTH GE /G20T = 25 CJ ° /G20T = 125 CJ ° 0.1 1 10 100 f, Frequency (KHz) LOAD CURRENT (A) 60% of rated voltage I Ideal diodes Square wave: For both: Duty cycle: 50% T = 125 ° C T = 90 ° C Gate drive as specified sink J Power Di ssi pat i on = W 83
4 www.irf.com Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case Fig. 5 - Typical Collector-to-Emitter Voltage vs. Junction Temperature Fig. 4 - Maximum Collector Current vs. Case Temperature 25 50 75 100 125 150 T , Case Temperature ( C) Maximum DC Collector Current(A) C ° -60 -40 -20 0 20 40 60 80 100 120 140 160 1.0 2.0 3.0 T , Junction Temperature ( C) V , Collector-to-Emitter Voltage(V) J ° CE /G20 V = 15V 80 us PULSE WIDTH GE /G20I = A150C /G20I = A75C /G20I = A37.5C 0.01 0.1 0.0001 0.001 0.01 0.1 1 10 100 1000 thJCTherm al Response (Z ) t , Rectan gular Pulse Duration (sec) A D = 0.50 0.20 0.10 0.05 0.02
0.01 SING LE PULSE
(THERMAL RESPONSE) P DM Notes: 1. Duty factor D = t / t 2. Peak T = P x Z + T 1 2 J DM thJC C = 37A
www.irf.com 5 Fig. 7 - Typical Capacitance vs. Collector-to-Emitter Voltage Fig. 8 - Typical Gate Charge vs. Gate-to-Emitter Voltage Fig. 9 - Typical Switching Losses vs. Gate Resistance Fig. 10 - Typical Switching Losses vs. Junction Temperature 1 10 100 5000 10000 15000 20000 25000 V , Collector-to-Emitter Voltage (V) C, Capacitance (pF) CE /G20 V C C C 0V, C C C f = 1MHz + C + C C SHORTED GE ies ge gc , ce res gc oes ce gc 0 200 400 600 Q , Total Gate Charge (nC) V , Gate-to-Emitter Voltage (V) G GE /G20 V = 400V I = 75A CC C 10 20 30 40 50 R , Gate Resistance (Ohm) Total Switching Losses (mJ) G /G20 V = 720V V = 15V T = 25 C I = 75A CC GE J C -60 -40 -20 0 20 40 60 80 100 120 140 160 100 T , Junction Temperature ( C ) Total Switching Losses (mJ) J ° /G20 R = 15Ohm V = 15V V = 720V G GE CC /G20I = A150C /G20I = A75C /G20I = A37.5C= 37A RG1=15Ω;RG2 = 0 Ω TC = 125°C ( Ω ) 85 A
6 www.irf.com Fig. 11 - Typical Switching Losses vs. Collector-to-Emitter Current Fig. 12 - Reverse Bias SOA Fig. 13 - Typical Forward Voltage Drop vs. Instantaneous Forward Current Fig. 14 - Typical Stored Charge vs. dif/dt 0 20 40 60 80 100 120 140 160 I , Collector Current (A) Total Switching Losses (mJ) C /G20 R = 15Ohm T = 150 C V = 720V V = 15V G J CC GE 0 200 400 600 800 1000 1200 1400 100 150 200 /G20 V = 20V T = 125 C V measured at terminal(Peak Voltage) GE J CE o /G20 SAFE OPERATING AREA V , Collector-to-Emitter Voltage (V) I , Collector Current (A) CE C 100 1000 FM FInstantaneous Forward Current - I (A) Forward Volta ge Drop - V (V ) T = 125 °C T = 25 °C J J 4000 8000 12000 16000 500 1000 1500 2000 fdi /dt - (A/ µs) RRQ - (nC) I = 150A I = 75A I = 37A F F F R J J V = 720V T = 125 °C T = 25 °C RG1=15Ω;RG2 = 0 Ω TC = 125°C
www.irf.com 7 Fig. 15 - Typical Reverse Recovery vs. dif/dt Fig. 16 - Typical Recovery Current vs. dif/dt 100 150 200 250 500 1000 1500 2000 trr - (ns) fdi /dt - (A/ µs) I = 150A I = 75A I = 37AF F F R J J V = 720V T = 125 °C T = 25 °C 120 160 200 500 1000 1500 2000 fdi /dt - (A/ µs) RRMI - (A) I = 150A I = 75A I = 37A F F F R J J V = 720V T = 125 °C T = 25 °C
8 www.irf.com Ic Vce t1 t2 90% Ic10% Vce td(off) tf Ic 5% Ic t1+5µS Vce ic dt 90% Vge +Vge ∫Eoff = Fig. 17b - Test Waveforms for Circuit of Fig. 18a, Defining Eoff, td(off), tf ∫ Vce ie dt 5% Vce Ic IpkVcc 10% Ic Vce t1 t2 DUT VOLTAGE AND CURRENT GATE VOLTAGE D.U.T. +Vg10% +Vg 90% Ic trtd(on) DIODE REVERSE RECOVERY ENERGY tx Eon = Erec = Vd id dt t4t3 DIODE RECOVERY W AVEFORMS Ic Vpk 10% Vcc Irr 10% Irr Vcc trr Qr r = trr tx id dt Fig. 17a - Test Circuit for Measurement of ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf Fig. 17c - Test Waveforms for Circuit of Fig. 18a, Defining Eon, td(on), tr Fig. 17d - Test Waveforms for Circuit of Fig. 18a, Defining Erec, trr, Qrr, Irr Vd Ic dt Vce Ic dt Ic dt Vce Ic dt
Figure 18. Clamped Inductive Load Test Circuit Figure 19. Pulsed Collector Current
4 X IC @25°C
10 www.irf.com Case Outline — INT -A-PAK Notes: ➀ Repetitive rating; VGE = 20V, pulse width limited by max. junction temperature. ➁ See fig. 17 ➂ For screws M5x0.8 ➃ Pulse width 50µs; single shot. Dimensions are shown in millimeters (inches) IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630 IR TAIWAN: 16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936 Data and specifications subject to change without notice. 4/00