FSL230D INTERSIL | Alldatasheet

Document overview

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Technical content

Features

  • 5A, 200V, rDS(ON) = 0.460Ω
  • Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si)
  • Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity for LET of 36MeV/mg/cm2 with VDS up to 80% of Rated Breakdown and VGS of 10V Off-Bias
  • Dose Rate - Typically Survives 3E9 RAD (Si)/s at 80% BVDSS - Typically Survives 2E12 if Current Limited to IDM
  • Photo Current - 3.0nA Per-RAD(Si)/s Typically
  • Neutron - Maintain Pre-RAD Specifications for 1E13 Neutrons/cm2 - Usable to 1E14 Neutrons/cm2 Formerly available as typeTA17637.

Description

The Discrete Products Operation of Intersil Corporation has developed a series of Radiation Hardened MOSFETs specif- ically designed for commercial and military space applica- tions. Enhanced Power MOSFET immunity to Single Event Effects (SEE), Single Event Gate Rupture (SEGR) in particu- lar, is combined with 100K RADS of total dose hardness to provide devices which are ideally suited to harsh space envi- ronments. The dose rate and neutron tolerance necessary for military applications have not been sacrificed. The Intersil portfolio of SEGR resistant radiation hardened MOSFETs includes N-Channel and P-Channel devices in a variety of voltage, current and on-resistance ratings. Numerous packaging options are also available. This MOSFET is an enhancement-mode silicon-gate power field-effect transistor of the vertical DMOS (VDMOS) struc- ture. It is specially designed and processed to be radiation tolerant. The MOSFET is well suited for applications exposed to radiation environments such as switching regula- tion, switching converters, motor drives, relay drivers and drivers for high-power bipolar switching transistors requiring high speed and low gate drive power. This type can be operated directly from integrated circuits. Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet. Symbol Package TO-205AF

Ordering Information

RAD LEVEL SCREENING LEVEL PART NUMBER/BRAND 10K Commercial FSL230D1 10K TXV FSL230D3 100K Commercial FSL230R1 100K TXV FSL230R3 100K Space FSL230R4 D G S S G D File Number 4032.3

Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified FSL230D, FSL230R UNITS Continuous Drain Current Maximum Power Dissipation (Distance >0.063in (1.6mm) from Case, 10s Max) 300 oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Electrical SpecificationsTC = 25oC, Unless Otherwise Specified PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS Drain to Source Breakdown Voltage BV DSS ID = 1mA, VGS = 0V 200 - - V Gate Threshold Voltage V GS(TH) VGS = VDS , ID = 1mA TC = -55oC - - 5.0 V TC = 25oC 1.5 - 4.0 V TC = 125oC 0.5 - - V Zero Gate Voltage Drain Current I DSS VDS = 160V, VGS = 0V TC = 25oC- - 2 5 µA TC = 125oC - - 250 µA Gate to Source Leakage Current I GSS VGS =±20V T C = 25oC - - 100 nA TC = 125oC - 200 nA Drain to Source On-State Voltage V DS(ON) VGS = 12V, ID = 5A - 2.42 V Drain to Source On Resistance r DS(ON)12 ID = 3A, VGS = 12V TC = 25oC - 0.340 0.460 Ω TC = 125oC - - 0.805 Ω Turn-On Delay Time t d(ON) VDD = 100V, ID = 5A, R L = 20Ω , VGS = 12V, R GS = 7.5Ω - - 65 ns Rise Time t r - - 150 ns Turn-Off Delay Time t d(OFF) - - 120 ns Fall Time t f - - 85 ns Total Gate Charge Q g(TOT) VGS = 0V to 20V V DD = 100V, ID = 5A - - 58 nC Gate Charge at 12V Q g(12) VGS = 0V to 12V - 31 38 nC Threshold Gate Charge Q g(TH) VGS = 0V to 2V - - 2.6 nC Gate Charge Source Q gs - 6.1 8.4 nC Gate Charge Drain Q gd -1 5 2 0 n C Plateau Voltage V (PLATEAU) ID = 5A, VDS = 15V - 7 - V Input Capacitance C ISS VDS = 25V, VGS = 0V, f = 1MHz - 800 - pF Output Capacitance C OSS - 180 - pF Reverse Transfer Capacitance C RSS -4 5-p F Thermal Resistance Junction to Case R θJC - - 5.0 oC/W Thermal Resistance Junction to Ambient RθJA - - 175 oC/W FSL230D, FSL230R

  1. Insitu Gamma bias must be sampled for both V
  2. Testing conducted at Brookhaven National Labs; sponsored by Naval Surface Warfare Center (NSWC), Crane, IN.
  3. Does not exhibit Single Event Burnout (SEB) or Single Event Gate Rupture (SEGR).

FIGURE 1. SINGLE EVENT EFFECTS SAFE OPERATING AREA FIGURE 2. DRAIN INDUCTANCE REQUIRED TO LIMIT

FIGURE 3. MAXIMUM CONTINUOUS DRAIN CURRENT vs FIGURE 4. FORWARD BIAS SAFE OPERATING AREA FIGURE 5. BASIC GATE CHARGE WAVEFORM FIGURE 6. NORMALIZED r DS(ON) vs JUNCTION TEMPERATURE FIGURE 7. NORMALIZED MAXIMUM TRANSIENT THERMAL RESPONSE

0.1 ID , DRAIN CURRENT (A)

Screening is performed in accordance with the latest revision in effect of MIL-S-19500, (Screening Information Table). Delta Tests and Limits (JANTXV Equivalent, JANS Equivalent)TC = 25oC, Unless Otherwise Specified PARAMETER SYMBOL TEST CONDITIONS MAX UNITS Gate to Source Leakage Current I GSS VGS =±20V ±20 (Note 7) nA Zero Gate Voltage Drain Current I DSS VDS = 80% Rated Value ±25 (Note 7) µA Drain to Source On Resistance r DS(ON) TC = 25oC at Rated ID ±20% (Note 8) Ω Gate Threshold Voltage V GS(TH) ID = 1.0mA ±20% (Note 8) V NOTES: 7. Or 100% of Initial Reading (whichever is greater). 8. Of Initial Reading. Screening Information TEST JANTXV EQUIVALENT JANS EQUIVALENT Gate Stress V GS = 30V, t = 250µsV GS = 30V, t = 250µs Pind Optional Required Pre Burn-In Tests (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25 oC) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) Steady State Gate Bias (Gate Stress) MIL-STD-750, Method 1042, Condition B VGS = 80% of Rated Value, TA = 150oC, Time = 48 hours MIL-STD-750, Method 1042, Condition B VGS = 80% of Rated Value, TA = 150oC, Time = 48 hours Interim Electrical Tests (Note 9) All Delta Parameters Listed in the Delta Tests and Limits Table All Delta Parameters Listed in the Delta Tests and Limits Table Steady State Reverse Bias (Drain Stress) MIL-STD-750, Method 1042, Condition A VDS = 80% of Rated Value, TA = 150oC, Time = 160 hours MIL-STD-750, Method 1042, Condition A VDS = 80% of Rated Value, TA = 150oC, Time = 240 hours PDA 10% 5% Final Electrical Tests (Note 9) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3 NOTE: 9. Test limits are identical pre and post burn-in. Additional Screening Tests PARAMETER SYMBOL TEST CONDITIONS MAX UNITS Safe Operating Area SOA V DS = 160V, t = 10ms 0.65 A Unclamped Inductive Switching I AS VGS(PEAK) = 15V, L = 0.1mH 15 A Thermal Response ΔVSD tH = 10ms; VH = 25V; IH = 2A 125 mV Thermal Impedance ΔVSD tH = 500ms; VH = 25V; IH = 1A 250 mV FSL230D, FSL230R

Rad Hard Data Packages - Intersil Power Transistors TXV Equivalent 1. Rad Hard TXV Equivalent - Standard Data Package A. Certificate of Compliance B. Assembly Flow Chart C. Preconditioning - Attributes Data Sheet D. Group A - Attributes Data Sheet E. Group B - Attributes Data Sheet F. Group C - Attributes Data Sheet G. Group D - Attributes Data Sheet 2. Rad Hard TXV Equivalent - Optional Data Package A. Certificate of Compliance B. Assembly Flow Chart C. Preconditioning - Attributes Data Sheet - Precondition Lot Traveler - Pre and Post Burn-In Read and Record Data D. Group A - Attributes Data Sheet - Group A Lot Traveler E. Group B - Attributes Data Sheet - Group B Lot Traveler - Pre and Post Read and Record Data for Intermittent Operating Life (Subgroup B3) - Bond Strength Data (Subgroup B3) - Pre and Post High Temperature Operating Life Read and Record Data (Subgroup B6) F. Group C - Attributes Data Sheet - Group C Lot Traveler - Pre and Post Read and Record Data for Intermittent Operating Life (Subgroup C6) - Bond Strength Data (Subgroup C6) G. Group D - Attributes Data Sheet - Group D Lot Traveler - Pre and Post RAD Read and Record Data Class S - Equivalents 1. Rad Hard “S” Equivalent - Standard Data Package A. Certificate of Compliance B. Serialization Records C. Assembly Flow Chart D. SEM Photos and Report E. Preconditioning Attributes Data Sheet Hi-Rel Lot Traveler HTRB - Hi Temp Gate Stress Post Reverse Bias Data and Delta Data HTRB - Hi Temp Drain Stress Post Reverse Bias Delta Data F. Group A - Attributes Data Sheet G. Group B - Attributes Data Sheet H. Group C - Attributes Data Sheet I. Group D - Attributes Data Sheet 2. Rad Hard Max. “S” Equivalent - Optional Data Package A. Certificate of Compliance B. Serialization Records C. Assembly Flow Chart D. SEM Photos and Report E. Preconditioning - Attributes Data Sheet - Hi-Rel Lot Traveler - HTRB - Hi Temp Gate Stress Post Reverse Bias Data and Delta Data - HTRB - Hi Temp Drain Stress Post Reverse Bias Delta Data - X-Ray and X-Ray Report F. Group A - Attributes Data Sheet - Hi-Rel Lot Traveler - Subgroups A2, A3, A4, A5 and A7 Data G. Group B - Attributes Data Sheet - Hi-Rel Lot Traveler - Subgroups B1, B3, B4, B5 and B6 Data H. Group C - Attributes Data Sheet - Hi-Rel Lot Traveler - Subgroups C1, C2, C3 and C6 Data I. Group D - Attributes Data Sheet - Hi-Rel Lot Traveler - Pre and Post Radiation Data FSL230D, FSL230R

All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web sitehttp://www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee

1130 Brussels, Belgium

TEL: (32) 2.724.2111 ASIA Intersil (Taiwan) Ltd. Taiwan Limited 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029 FSL230D, FSL230R TO-205AF

3 LEAD JEDEC TO-205AF HERMETIC METAL CAN PACKAGE

L A Ø b ØD 1 ØD h e SEATING PLANE 90o j k P 45o SYMBOL INCHES MILLIMETERS NOTESMIN MAX MIN MAX A 0.160 0.180 4.07 4.57 - Øb 0.016 0.021 0.41 0.53 2, 3 ØD 0.350 0.370 8.89 9.39 - ØD 1 0.315 0.335 8.01 8.50 - e 0.095 0.105 2.42 2.66 4 e1 0.190 0.210 4.83 5.33 4 e2 0.095 0.105 2.42 2.66 4 h 0.010 0.020 0.26 0.50 - j 0.028 0.034 0.72 0.86 - k 0.029 0.045 0.74 1.14 - L 0.500 0.560 12.70 14.22 3 P 0.075 - 1.91 - 5 NOTES: 1. These dimensions are within allowable dimensions of Rev. E of JEDEC TO-205AF outline dated 11-82. 2. Lead dimension (without solder). 3. Solder coating may vary along lead length, add typically 0.002 inches (0.05mm) for solder coating. 4. Position of lead to be measured 0.100 inches (2.54mm) from bottom of seating plane. 5. This zone controlled for automatic handling. The variation in actual diameter within this zone shall not exceed 0.010 inches (0.254mm). 6. Lead no. 3 butt welded to stem base. 7. Controlling dimension: Inch. 8. Revision 3 dated 6-94.