FB2040A PHILIPS | Alldatasheet

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/C0109 /C0110 /C0114 FB2040A 8-bit Futurebus+ transceiver Product specification IC19 Data Handbook

1995 May 25

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

21995 May 25 853-1801 15279

FEATURES

  • 8-bit BTL transceivers
  • Separate I/O on TTL A-port
  • Inverting
  • Drives heavily loaded backplanes with equivalent load impedances down to 10Ω .
  • High drive 100mA BTL open collector drivers on B-port
  • Allows incident wave switching in heavily loaded backplane buses
  • Reduced BTL voltage swing produces less noise and reduces power consumption
  • Built-in precision band-gap reference provides accurate receiver thresholds and improved noise immunity
  • Compatible with IEEE Futurebus+ or proprietary BTL backplanes
  • Controlled output ramp and multiple GND pins minimize ground bounce
  • Each BTL driver has a dedicated Bus GND for a signal return
  • Glitch-free power up/power down operation
  • Low ICC current
  • Tight output skew
  • Supports live insertion
  • Pins for the optional JTAG boundary scan function are provided
  • High density packaging in plastic Quad Flat Pack QUICK REFERENCE DATA SYMBOL PARAMETER TYPICAL UNIT tPLH tPHL Propagation delay AIn to Bn 4.4 3.1 ns tPLH tPHL Propagation delay Bn to AOn 3.4 3.2 ns C OB Output capacitance (B0 – B7 only) 4 pF IOL Output current (B0 – B7 only) 100 mA Standby 4 AIn to Bn (outputs Low or High) 4 ICC Supply current Bn to AOn (outputs Low) 22 mA Bn to AOn (outputs High) 12

ORDERING INFORMATION

VCC = 5V±10%; Tamb = 0°C to +70°C DRAWING NUMBER 52-pin Plastic Quad Flat Pack (QFP) FB2040BB SOT379-1 ABSOLUTE MAXIMUM RATINGS Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range. SYMBOL PARAMETER RATING UNIT VCC Supply voltage -0.5 to +7.0 V V Input voltage AI0 – AI7, OEB0, OEB1, OEA -1.2 to +7.0 VVIN Input voltage B0 – B7 -1.2 to +5.5 V IIN Input current -18 to +5.0 mA VOUT Voltage applied to output in High output state -0.5 to +VCC V IO Current applied to output in Low A0 – A7 48 mAIOUT output state B0 – B7 200 mA Tamb Operating free-air temperature range -40 to ++85 °C TSTG Storage temperature -65 to +150 °C

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 3

52 51 50 49 48 47 46 45 44 43 42 41 40 14 15 16 17 18 19 20 21 22 23 24 25 26 BUS GND BUS GND BUS GND BUS GND BUS GND BUS GND BUS GND LOGIC GND AI1 AI2 AO2 LOGIC GND AO3 LOGIC GND AI3 AI4 AO4 LOGIC GND AO5 LOGIC GND AI5 LOGIC GND AO6 BG GND TDO (option) TDI (option) AI6 BUS VCC BG V CC AO1 AO0 OEA TCK (option) TMS (option) BUS GND OEB1 BIAS V B0/B0 BUS VCC LOGIC VCC OEB0 8-Bit Transceiver FB2040A 52-lead PQFP AI0 NC AI7 AO7 SG00076

DESCRIPTION

The FB2040A is an 8-bit bidirectional BTL transceiver and is intended to provide the electrical interface to a high performance wired-OR bus. The FB2040A is an inverting transceiver. The B-port drivers are Low-capacitance open collectors with controlled ramp and are designed to sink 100mA. Precision band gap references on the B-port insure very good noise margins by limiting the switching threshold to a narrow region centered at 1.55V. The B-port interfaces to “Backplane Transceiver Logic” (See the IEEE 1194.1 BTL standard). BTL features low power consumption by reducing voltage swing (1Vp-p, between 1V and 2V) and reduced capacitive loading by placing an internal series diode on the drivers. BTL also provides incident wave switching, a necessity for high performance backplanes. The A-port operates at TTL levels with separate I/O. The 3-state A-port drivers are enabled when OEA goes High after an extra 6ns delay which is built in to provide a break-before-make function. When OEA goes Low, A-port drivers become High impedance without any extra delay. During power on/off cycles, the A-port drivers are held in a High impedance state when V CC is below 2.5V. The B-port has two output enables, OEB0 and OEB1. When OEB0 is High and OEB1 is Low the output is enabled. When OEB0 is Low or if OEB1 is High, the B-port is inactive and is at the level of the backplane signal. To support live insertion, OEB0 is held Low during power on/off cycles to insure glitch free B port drivers. Proper bias for B port drivers during live insertion is provided by the BIAS V pin when at a 5V level while V CC is Low. If live insertion is not a requirement, the BIAS V pin should be tied to a VCC pin. The LOGIC GND and BUS GND pins are isolated in the package to minimize noise coupling between the BTL and TTL sides. These pins should be tied to a common ground external to the package. Each BTL driver has an associated BUS GND pin that acts as a signal return path and these BUS GND pins are internally isolated from each other. In the event of a ground return fault, a “hard” signal failure occurs instead of a pattern dependent error that may be very infrequent and impossible to trouble-shoot. The LOGIC V CC and BUS VCC pins are also isolated internally to minimize noise and may be externally decoupled separately or simply tied together. JTAG boundary scan pins are provided with signals TMS, TCK, TDI and TDO. TMS and TCK are no-connects (no bond wires) and TDI and TDO are shorted together internally. Boundary scan functionality is not implemented at this time.

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 4

SYMBOL PIN NUMBER TYPE NAME AND FUNCTION AI0 – AI7 51, 2, 3, 8, 9, 14, 18, 24 Input Data inputs (TTL) AO0 – AO7 50, 52, 4, 6, 10, 12, 16, 20Output 3-state outputs (TTL) B0 – B7 40, 38, 36, 34, 32, 30, 28, 26 I/O Data inputs/Open Collector outputs. High current drive (BTL) OEB0 46 Input Enables the B outputs when High OEB1 45 Input Enables the B outputs when Low OEA 47 Input Enables the A outputs when High BUS GND 41, 39, 37, 35, 33, 31, 29, 27GND Bus ground (0V) LOGIC GND 1, 5, 7, 11, 13, 15 GND Logic ground (0V) BUS V CC 23, 43 Power Positive supply voltage LOGIC V CC 49 Power Positive supply voltage BG V CC 17 Power Band Gap threshold voltage reference BG GND 19 GND Band Gap threshold voltage reference ground BIAS V 48 Power Live insertion pre-bias pin TMS 42 Input Test Mode Select (optional, if not implemented then no-connect) TCK 44 Input Test Clock (optional, if not implemented then no-connect) TDI 22 Input Test Data In (optional, if not implemented then shorted to TDO) TDO 21 Output Test Data Out (optional, if not implemented then shorted to TDI) NC 25 NC No Connect FUNCTION TABLE MODE INPUTS OUTPUTSMODE AIn Bn * OEB0 OEB1 OEA AOn Bn * L — H L L Z H AIn to Bn H — H L L Z LAIn to Bn L — H L H L H H — H L H H L Disable Bnoutputs X X L X X X HDisable Bn out uts X X X H X X H X L L X H H Input Bn to AOn X H X H H L InputBn to AOn X L X H H H Input X H L X H L Input Disable AOn outputs — X X X L Z X H** = Goes to level of pull-up voltage B* = Precaution should be taken to ensure B inputs do not float. If they do, they are equal to Low state.

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 5

RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNITSYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage Except B0–B7 2.0 VVIH High-level in ut voltage B0 – B7 1.62 1.55 V VIL Low-level input voltage Except B0–B7 0.8 VVIL Low -level in ut voltage B0 – B7 1.47 V IIK Input clamp current -18 mA IOH High-level output current AO0 – AO7 -3 mA IOL Low-level output current AO0 – AO7 24 mAIOL Low -level out ut current B0 – B7 100 mA C OB Output capacitance on B port 5 pF Tamb Operating free-air temperature range 0 +70 °C

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 6

(Future JTAG Boundary Scan option) NC = 25 LOGIC V CC =4 9 LOGIC GND = 1, 5, 7, 11, 13, 15 BUS V CC = 23, 43 BUS GND = 27, 29, 31, 33, 35, 37, 39, 41 BIAS V = 48 BG V CC =1 7 BG GND = 19 51AI0 50AO0 B040

38 B12

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 7

DC ELECTRICAL CHARACTERISTICS Over recommended operating free-air temperature range unless otherwise noted. SYMBOL PARAMETER TEST CONDITIONS 1 LIMITS UNITSYMBOL PARAMETER TEST CONDITIONS 1 MIN TYP 2 MAX UNIT IOH High level output currentB0 – B7 VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA IOFF Power-off output currentB0 – B7 VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA VOH High-level output voltageAO0 – AO73 VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA 2.5 2.85 V AO0 – AO73 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA 0.33 0.5 VOL Low-level output voltage B0 B7 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 80mA .75 1.0 1.10 V B0 – B7 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA 1.15 VIK Input clamp voltage VCC = MIN, II = IIK -1.2 V II Input current at maximum input voltage OEB0, OEB1 , OEA, AI0–AI7 VCC = MAX, VI = GND or 5.5V ±50 µA IIH High-level input current OEB0, OEB1 , OEA, AI0–AI7 VCC = MAX, VI = 2.7V 20 µAIIH High level in ut current B0 – B7 VCC = MAX, VI = 2.1V 100 µA IIL Low-level input current OEB0, OEB1 , OEA, AI0–AI7 VCC = MAX, VI = 0.5V -20 µAIIL Low level in ut current B0 – B7 VCC = MAX, VI = 0.75V -100 µA IOZH Off-state output currentAO0 – AO7 VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output currentAO0 – AO7 VCC = MAX, VO = 0.5V -50 µA IOS Short-circuit output current4 AO0 – AO7 only VCC = MAX, VO = 0.0V -30 -150 mA ICCZ (standby)VCC = MAX 19 30 ICCB, AIn to Bn VCC = MAX, outputs Low or High 40 60 ICC Supply current (total) ICCA, Bn to AOn VCC = MAX, outputs Low 22 35 mA ICCA, Bn to AOn VCC = MAX, outputs High 19 35 NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type. 2. All typical values are at VCC = 5V, TA = 25°C. 3. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side. 4. Not more than one output should be shorted at a time. For testing IOS , the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last.

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 8

AC ELECTRICAL CHARACTERISTICS A PORT LIMITS SYMBOL PARAMETER TEST CONDITION Tamb = +25°C, VCC = 5V, C L = 50pF, RL = 500Ω Tamb = 0 to 70°C, VCC = 5V±10%, C L = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay, Bn to AOn Waveform 1, 2 1.8 1.6 3.4 3.2 5.0 4.9 1.6 1.6 5.6 5.3 ns tPZH tPZL Output enable time, OEA to AOn Waveform 4, 5 1.0 1.0 5.0 5.0 1.5 1.5 5.5 5.5 ns tPHZ tPLZ Output disable time, OEA to AOn Waveform 4, 5 1.5 1.5 3.3 3.3 4.8 5.4 1.2 1.3 5.0 5.9 ns tTLH tTHL Transition time, AOn Port (10% to 90% or 90% to 10%) Test Circuit and Waveforms 1.5 1.5 2.2 2.4 3.5 3.5 1.0 1.0 4.5 4.5 ns tSK (o) Output skew between receivers in same package 1 Waveform 3 0.4 1.0 1.0 ns B PORT LIMITS SYMBOL PARAMETER TEST CONDITION Tamb = +25°C, VCC = 5V, C D = 30pF, RU = 9Ω Tamb = 0 to 70°C, VCC = 5V±10%, C D = 30pF, RU = 9Ω UNIT tPLH tPHL Propagation delay, AIn to Bn Waveform 1, 2 2.9 1.6 4.4 3.3 5.0 4.8 2.3 1.5 5.5 5.1 ns tPLH tPHL Enable/disable time, OEB0 to Bn Waveform 2 2.9 1.9 4.7 3.5 5.9 5.1 2.6 1.8 7.8 5.7 ns tPLH tPHL Enable/disable time, OEB1 to Bn Waveform 1 3.0 1.7 5.3 3.2 6.3 4.8 2.7 1.5 8.0 5.7 ns tTLH tTHL Transition time, Bn Port (1.3V to 1.8V) Test Circuit and Waveforms 1.0 0.5 1.4 1.1 3.0 3.0 1.0 0.5 3.0 3.0 ns tSK (o) Output skew between drivers in same package 1 Waveform 3 0.3 1.0 1.0 ns SYMBOL PARAMETER TEST CONDITION R U = 16.5Ω R U = 16.5Ω UNIT tPLH tPHL Propagation delay, AIn to Bn Waveform 1, 2 3.0 1.7 4.5 3.3 6.4 4.8 2.3 1.6 6.9 5.1 ns tPLH tPHL Enable/disable time, OEB0 to Bn Waveform 2 3.0 2.0 4.8 3.5 6.0 5.2 2.7 1.9 7.9 5.7 ns tPLH tPHL Enable/disable time, OEB1 to Bn Waveform 1 3.1 1.8 5.4 3.3 6.4 4.9 2.8 1.6 8.1 5.7 ns tTLH tTHL Transition time, Bn Port (1.3V to 1.8V) Test Circuit and Waveforms 1.0 0.5 1.5 1.1 3.0 3.0 1.0 0.5 3.0 3.0 ns tSK (o) Output skew between drivers in same package 1 Waveform 3 0.3 1.0 1.0 ns NOTES: 1.  tPN actual – tPM actual for any data input to output path compared to any other data input to output path where N and M are either LH or HL. Skew times are valid only under same test conditions (temperature, VCC , loading, etc.).

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 9

AIn, Bn OEB1 AOn, Bn VMVM VMVM tPLH tPHL VMVM VM VM tPHL tPLH AOn, Bn AIn, Bn AOn, Bn VM VM tSK (o) AOn OEA VMVM tPLZ VM VOL +0.3VAOn OEA VM VM VM VOH -0.3V OV tPHZtPZH NOTE: VM = 1.55V for Bn, VM = 1.5V for all others. AIn, Bn OEB0 Waveform 1. Propagation Delay for Data or Output Enable to Output Waveform 2. Propagation Delay for Data or Output Enable to Output Waveform 3. Output Skews Waveform 4. 3-State Output Enable Time to High Level and Output Disable Time from High Level Waveform 5. 3-State Output Enable Time to Low Level and Output Disable Time from Low Level SG00078

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 10

TEST CIRCUIT AND WAVEFORMS 2.5ns 2.5ns500ns 500ns INPUT PULSE REQUIREMENTS Rep. RateAmplitude t TLH tTHL 1MHz3.0V 2.5ns Input Pulse Definitions VM = 1.55V for Bn, VM = 1.5V for all others. VCC Family FB+ D.U.T.PULSE GENERATOR 7.0V R L R LC LR T VIN VOUT Test Circuit for 3-State Outputs on A Port TEST SWITCH SWITCH POSITION tPLZ, tPZL All other closed open DEFINITIONS: R L = Load Resistor; see AC CHARACTERISTICS for value. C L = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. R T = Termination resistance should be equal to ZOUT of pulse generators. C D = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. R U = Pull up resistor; see AC CHARACTERISTICS for value. tW 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE LOW V LOW V tTHL (tf) tTLH (tr) tW BIAS V tWLow V 0.0V tTLH (tr) tTHL (tf) A Port 1MHz2.0V 2.5ns1.0VB Port VCC D.U.T.PULSE GENERATOR R U C DR T VIN VOUT Test Circuit for Outputs on B Port BIAS V 2.0V (for RU = 9 Ω ) 2.1V (for RU = 16.5 Ω ) SG00059 VIN VIN

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 11

QFP52: plastic quad flat package; 52 leads (lead length 1.6 mm); body 10 x 10 x 2.0 mm SOT379-1

Philips Semiconductors Product specification FB2040A8-bit Futurebus+ transceiver

1995 May 25 12

Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Disclaimers Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Philips Semiconductors

811 East Arques Avenue

P.O. Box 3409 Sunnyvale, California 94088–3409 Telephone 800-234-7381  Copyright Philips Electronics North America Corporation 1998 All rights reserved. Printed in U.S.A. print code Date of release: 08-98 Document order number: /C0109 /C0110 /C0114 Data sheet status Objective specification Preliminary specification Product specification Product status Development Qualification Production Definition [1] This data sheet contains the design target or goal specifications for product development. Specification may change in any manner without notice. This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make chages at any time without notice in order to improve design and supply the best possible product. This data sheet contains final specifications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product. Data sheet status [1] Please consult the most recently issued datasheet before initiating or completing a design.