EVM4717DBG

EDGE4717D SEMTECH | Alldatasheet

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Technical content

TEST AND MEASUREMENT PRODUCTS 1 www.semtech.com Edge4717D Quad Channel, Per Pin Precision Measurement Unit Description Features

Applications

Revision 5 / October 14, 2005

• FV / MI Capability
• FI / MV Capability
• FV / MV Capability
• FI / MI Capability
• 4 Current Ranges ( ± 3.2 µA, ± 80 µA, ± 2 mA, ± 30 mA)
• –5.5V to 9.5V Nominal Output Range (Zero Current)
• –3.5 to 7.5V Nominal Output Range (Full Scale Current)
• On-board Voltage Clamps
• Internal Sample and Hold
• 228 Pin 23 mm x 23 mm TBGA Package The Edge4717D is a precision measurement unit designed for automated test equipment and instrumentation. Manufactured in a wide voltage CMOS process, it is a monolithic solution for a quad channel per pin PMU. Each channel of the Edge4717D features a PMU that can force or measure voltage over a typical 15V I/O range, and supports 4 current ranges: ± 3.2 µA, ± 80 µA, ± 2 mA, ± 30 mA. The Edge4717D has an on-board window comparator per channel that provides two bits of information — DUT too high and DUT too low. There is also a monitor pin which provides a real time analog signal proportional to either the voltage or current measured at the DUT. The Edge4717D is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per pin. On-board voltage clamps, with over-current detection, provide protection to the DUT and 4717D. The Edge4717D also has a sample-and-hold feature available for capturing DUT current or voltage measurements. The Edge4717D is a design improvement to the Edge4717 that features: – Increased FV/MV range – Improved over-current detection circuit functionality – LVTTL comparator outputs (pull-up resistors no longer required) – Improved HiZ switching characteristics – Improved Force Voltage Linearity
• Automated Test Equipment - Memory Testers - VLSI Testers - Mixed Signal Tester CHANNEL 0 COMPARATORS DETECTOR LOGIC VOLTAGE MONITOR SENSE FORCE OPEN_RLY SNK_MON SRC_MON FV / FI* MI / MV* IVMIN IVMAX DISABLE DUTGTL DUTLTH IVMON COMP_IN OVER-CURRENT DETECT OVER-CURRENT DETECT DUT_GND SRC_OUT SNK_OUT VINP HiZ REF ÷ 2.5 GUARD CHANNEL 1 COMPARATORS DETECTOR LOGIC VOLTAGE MONITOR SENSE FORCE OPEN_RLY SNK_MON SRC_MON FV / FI* MI / MV* DUTGTL DUTLTH IVMON OVER-CURRENT DETECT OVER-CURRENT DETECT SRC_OUT SNK_OUT VINP HiZ REF ÷ 2.5 GUARD CHANNEL 2 COMPARATORS DETECTOR LOGIC VOLTAGE MONITOR SENSE FORCE OPEN_RLY SNK_MON SRC_MON FV / FI* MI / MV* DUTGTL DUTLTH IVMON OVER-CURRENT DETECT OVER-CURRENT DETECT SRC_OUT SNK_OUT VINP HiZ REF ÷ 2.5 GUARD CHANNEL 3 COMPARATORS DETECTOR LOGIC VOLTAGE MONITOR SENSE FORCE OPEN_RLY SNK_MON SRC_MON FV / FI* MI / MV* DUTGTL DUTLTH IVMON OVER-CURRENT DETECT OVER-CURRENT DETECT SRC_OUT SNK_OUT VINP HiZ REF ÷ 2.5 GUARD IVMIN IVMAX DISABLE COMP_IN IVMIN IVMAX DISABLE COMP_IN IVMIN IVMAX DISABLE COMP_IN Functional Block Diagram

2 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com PIN Description emaNniP# niPn oitpircseD ]3:0[PNIV2 2V,12N,22H,91B ehtdna)edomVF(egatlovtuptuoehtsecrofhcihwtupniegatlovgolanA .)lennahcrepeno()edomIF(tnerructuptuo ]3:0[FER2 2U,12M,22G,91A ecnerefersiht;edomtnerrucecrofroftiucric5.2ybedividrofnipecnerefeR .V52.2ottesyllacipytsi ]3:0[ECROF2 U,2N,2J,2E. egatlovrotnerrucsecrofhcihwniptuptuogolanA ]3:0[ESNES3 U,3N,3J,3E. egatlovsesneshcihwniptupnigolanA ]3:0[*IF_VF7 1B,41A,11C,7A tnerrucgnicrofsiUMPehtrehtehwsenimretedhcihwtupnielbitapmocLTT .egatlovgnicrofro ]3:0[*VM_IM6 1C,41B,11B,9C gnirusaemsiUMPehtrehtehwsenimretedhcihwtupnielbitapmocLTT .egatlovgnirusaemrotnerruc ]3:0[0SR5 1B,21C,9B,7C. stupnitcelesegnartnerrucelbitapmocLTT ]3:0[1SR5 1A,21B,8A,6C. stupnitcelesegnartnerrucelbitapmocLTT ]3:0[NIMVI1 2U,02M,02H,71C ehtrofleveldlohserhtrewolehthsilbatsehcihwsegatlovtupnigolanA .rotarapmoctnemerusaem ]3:0[XAMVI0 2U,22N,12H,81C ehtrofleveldlohserhtreppuehthsilbatsehcihwsegatlovtupnigolanA .rotarapmoctnemerusaem ]3:0[NI_PMOC2 T,2M,2H,2D. rotarapmoctnemerusaemottupniegatlovgolanA ]3:0[HTL_TUD9 Y,01AA,21Y,31AA nahtsselsitnemerusaemTUDehtsetacidnitahttuptuorotarapmoclatigiD .dlohserhtreppueht ]3:0[LTG_TUD9 AA,11Y,21AA,41AA retaergsitnemerusaemTUDehtsetacidnitahttuptuorotarapmoclatigiD .dlohserhtrewolehtnaht ]3:0[ELBASID6 1B,31B,01B,6A .ecnadepmihgihnituptuoNOMVIsecalphcihwtupnielbitapmocLTT ]3:0[ZIH7 1A,31C,01A,7B .ecnadepmihgihotnituptuoECROFehtsecalptahttupnielbitapmocLTT ]3:0[AR3 V,3P,3K,3F. AegnaRotgnidnopserroctupnirotsiserlanretxE ]3:0[BR2 V,2P,2K,2F. BegnaRotgnidnopserroctupnirotsiserlanretxE ]3:0[CR1 V,1P,1K,1F. CegnaRotgnidnopserroctupnirotsiserlanretxE ]3:0[DR3 W,3R,3L,3G. DegnaRotgnidnopserroctupnirotsiserlanretxE ]3:0[NOM_KNS7 1AA,22R,22K,12F. pmalctnerrucknisottupniegatlovgolanA ]3:0[NOM_CRS6 1Y,22T,22L,22F. pmalctnerrucecruosottupniegatlovgolanA ]3:0[TUO_KNS1 R,1L,1G,1C. tuptuopmalC ]3:0[TUO_CRS1 U,1N,1J,1E. tuptuopmalC

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com PIN Description (continued) emaNniP# niPn oitpircseD ]3:0[YLR_NEPO0 1Y,11AA,31Y,41Y TUDdnaretsetneewtebsyalergnineporofdesusitahttuptuoniardnepO .noitidnoctnerruc-revonafoesacni ]3:0[NOMVI1 2T,22M,12G,81B ehtrehtieforotinomemitlaerasedivorptahttuptuoegatlovgolanA .leveltnerrucderusaemroegatlovderusaem ]3:0[EDOM_HCTL6 1A,21A,01C,6B -elpmasmorfsiROTINOMVIrehtehwfonoitanimretedrofxumaslortnoC .delpmastonrodloh-dna ]3:0[ELPMAS5 1C,31A,9A,8C .sniprotinomegatlov]3:0[ESNESehtnoegatlovehtgnilpmasrofdesU ]3:0[DRAUG1 T,1M,1H,1D. secartdraugrofdesunipdraugnevirD ]3:0[TSET8 1A,41C,11A,8B .dloh-dna-elpmasgnitsetrofxumrofniplortnoctupnilatigiD ]3:0[NI_TSET1 2V,02N,22J,91C. dloh-dna-elpmasehtgnitsetroftupnigolanA ]3:0[1PMOC ]3:0[2PMOC 02V,12P,02J,02D 91Y,02P,12J,12D noitcennocroticapaclanretxenaeriuqertahtsnipnoitasnepmoclanretnI .snipowtehtneewteb ]3:0[3PMOC8 1Y,12R,12K,12E noitcennocroticapaclanretxenaseriuqertahtnipnoitasnepmoclanretnI .dnuorgdnanipehtneewteb ]3:0[4PMOC7 1Y,02R,02K,02F noitcennocroticapaclanretxenaseriuqertahtnipnoitasnepmoclanretnI .tuptuoECROFdnanipehtneewteb DNG_TUD6 Y .enildnuorgTUDotdetcennocebdluohstahtnipecnerefertupnI sniPrewoP CCV, 22A,12A,2A,1A ,22B,12B,2B,1B ,1AA,02Y,3Y,02C,3C ,1BA,22AA,12AA,2AA 22BA,12BA,2BA .ylppusrewopgolanaevitisoP DDV5 1Y. )rotarapmoc(ylppuslatigidevitisoP EEV, 22C,12C,02B,02A ,2R,2L,2G,22E,22D ,22Y,12Y,22W,12W,2W ,02AA,91AA,81AA,51AA ,61BA,51BA,41BA,31BA 02BA,91BA,81BA,71BA .ylppusrewopgolanaevitageN DNG, 5B,4B,3B,5A,4A,3A ,2Y,1Y,1W,5C,4C,2C ,4AA,3AA,8Y,7Y,5Y,4Y ,3BA,8AA,7AA,6AA,5AA ,8BA,7BA,6BA,5BA,4BA 21BA,11BA,01BA,9BA .dnuorG CN, 02L,02G,3H,02E,3D ,02T,3T,22P,3M,12L 61AA,02W .)detcennocnuevael;snipdesunU(.noitcennoCoN

4 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com PIN Description (continued) Top View 23mm x 23mm 228 Pin TBGA A1 Ball Pad Indicator E4717

228 Pin TBGA

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 A B C D E F G H J K L M N P R T U V W Y AA AB AA1 AB1 VCC GUARD0 SRC_OUT0 RC0 SNK_OUT1 GUARD1 SRC_OUT1 RC1 SNK_OUT2 GUARD2 SRC_OUT2 RC2 SNK_OUT3 GUARD3 SRC_OUT3 RC3 GND VCC SNK_OUT0 GND VCC VCC AA2 AB2 VCC COMP_IN0 FORCE0 RB0 VEE COMP_IN1 FORCE1 RB1 VEE COMP_IN2 FORCE2 RB2 VEE COMP_IN3 FORCE3 RB3 VEE VCC GND GND VCC VCC AA3 AB3 GND NC SENSE0 RA0 RD0 NC SENSE1 RA1 RD1 NC SENSE2 RA2 RD2 NC SENSE3 RA3 RD3 GND VCC VCC GND GND AA4 AB4 GND GND GND GND GND GND AA5 AB5 GND GND GND GND GND GND AA6 AB6 DISABLE0 LTCH_MODE0 RS10 DUT_GND GND GND AA7 AB7 FV_FIN0 HIZ0 RS00 GND GND GND AA8 AB8 RS11 TEST0 SAMPLE0 GND GND GND AA9 AB9 SAMPLE1 RS01 MI_MVN0 DUT_LTH3 DUT_GTL3 GND A10 B10 C10 Y10 AA10 AB10 D10 E10 F10 G10 H10 J10 K10 L10 M10 N10 P10 R10 T10 U10 V10 W10 HIZ1 DISABLE1 LTCH_MODE1 OPEN_RLY3 DUT_LTH2 GND A11 B11 C11 Y11 AA11 AB11 D11 E11 F11 G11 H11 J11 K11 L11 M11 N11 P11 R11 T11 U11 V11 W11 TEST1 MI_MVN1 FV_FIN1 DUT_GTL2 OPEN_RLY2 GND A12 B12 C12 Y12 AA12 AB12 D12 E12 F12 G12 H12 J12 K12 L12 M12 N12 P12 R12 T12 U12 V12 W12 LTCH_MODE2 RS12 RS02 DUT_LTH1 DUT_GTL1 GND A13 B13 C13 Y13 AA13 AB13 D13 E13 F13 G13 H13 J13 K13 L13 M13 N13 P13 R13 T13 U13 V13 W13 SAMPLE2 DISABLE2 HIZ2 OPEN_RLY1 DUT_LTH0 VEE A14 B14 C14 Y14 AA14 AB14 D14 E14 F14 G14 H14 J14 K14 L14 M14 N14 P14 R14 T14 U14 V14 W14 FV_FIN2 MI_MVN2 TEST2 OPEN_RLY0 DUT_GTL0 VEE A15 B15 C15 Y15 AA15 AB15 D15 E15 F15 G15 H15 J15 K15 L15 M15 N15 P15 R15 T15 U15 V15 W15 RS13 RS03 SAMPLE3 VDD VEE VEE A16 B16 C16 Y16 AA16 AB16 D16 E16 F16 G16 H16 J16 K16 L16 M16 N16 P16 R16 T16 U16 V16 W16 LTCH_MODE3 DISABLE3 MI_MVN3 SRC_MON3 VEE A17 B17 C17 Y17 AA17 AB17 D17 E17 F17 G17 H17 J17 K17 L17 M17 N17 P17 R17 T17 U17 V17 W17 HIZ3 FV_FIN3 IV_MIN0 COMP43 SNK_MON3 VEE A18 B18 C18 Y18 AA18 AB18 D18 E18 F18 G18 H18 J18 K18 L18 M18 N18 P18 R18 T18 U18 V18 W18 TEST3 IVMON0 IV_MAX0 COMP33 VEE VEE A19 B19 C19 Y19 AA19 AB19 D19 E19 F19 G19 H19 J19 K19 L19 M19 N19 P19 R19 T19 U19 V19 W19 IREF0 VINP0 TEST_IN0 COMP23 VEE VEE A20 B20 C20 Y20 AA20 AB20 D20 E20 F20 G20 H20 J20 K20 L20 M20 N20 P20 R20 T20 U20 V20 W20 VEE COMP10 NC COMP40 HLD_CAP0 (NC) HLD_CAP1 (NC) IV_MIN1 COMP11 COMP41 NC IV_MIN2 TEST_IN2 COMP22 COMP42 HLD_CAP2(NC) HLD_CAP3(NC) IV_MAX3 COMP13 NC VEE VCC VCC VEE VEE A21 B21 C21 Y21 AA21 AB21 D21 E21 F21 G21 H21 J21 K21 L21 M21 N21 P21 R21 T21 U21 V21 W21 VCC COMP20 COMP30 SNK_MON0 IVMON1 IV_MAX1 COMP21 COMP31 IREF2 VINP2 COMP12 COMP32 IVMON3 IV_MIN3 TEST_IN3 VEE VCC VEE VEE VCC VCC A22 B22 C22 Y22 AA22 AB22 D22 E22 F22 G22 H22 J22 K22 L22 M22 N22 P22 R22 T22 U22 V22 W22 VCC VEE VEE SRC_MON0 IREF1 VINP1 TEST_IN1 SNK_MON1 SRC_MON1 IVMON2 IV_MAX2 NC SNK_MON2 SRC_MON2 IREF3 VINP3 VEE VCC VEE VEE VCC VCC

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com PIN Description (continued) Bottom View 23mm x 23mm 228 Pin TBGA A1 Ball Pad Indicator (see gold triangle located at the corner) A1A2A3A4A5A6A7A8A9A10A11A12A13A14A15A16A17A18A19A20A21A22 B1B2B3B4B5B6B7B8B9B10B11B12B13B14B15B16B17B18B19B20B21B22 C1C2C3C4C5C6C7C8C9C10C11C12C13C14C15C16C17C18C19C20C21C22 Y1Y2Y3Y4Y5Y6Y7Y8Y9Y10Y11Y12Y13Y14Y15Y16Y17Y18Y19Y20Y21Y22 AA1AA2AA3AA4AA5AA6AA7AA8AA9AA10AA11AA12AA13AA14AA15AA16AA17AA18AA19AA20AA21AA22 AB1AB2AB3AB4AB5AB6AB7AB8AB9AB10AB11AB12AB13AB14AB15AB16AB17AB18AB19AB20AB21AB22 D1D2D3D4D5D6D7D8D9D10D11D12D13D14D15D16D17D18D19D20D21D22 E1E2E3E4E5E6E7E8E9E10E11E12E13E14E15E16E17E18E19E20E21E22 F1F2F3F4F5F6F7F8F9F10F11F12F13F14F15F16F17F18F19F20F21F22 G1G2G3G4G5G6G7G8G9G10G11G12G13G14G15G16G17G18G19G20G21G22 H1H2H3H4H5H6H7H8H9H10H11H12H13H14H15H16H17H18H19H20H21H22 J1J2J3J4J5J6J7J8J9J10J11J12J13J14J15J16J17J18J19J20J21J22 K1K2K3K4K5K6K7K8K9K10K11K12K13K14K15K16K17K18K19K20K21K22 L1L2L3L4L5L6L7L8L9L10L11L12L13L14L15L16L17L18L19L20L21L22 M1M2M3M4M5M6M7M8M9M10M11M12M13M14M15M16M17M18M19M20M21M22 N1N2N3N4N5N6N7N8N9N10N11N12N13N14N15N16N17N18N19N20N21N22 P1P2P3P4P5P6P7P8P9P10P11P12P13P14P15P16P17P18P19P20P21P22 R1R2R3R4R5R6R7R8R9R10R11R12R13R14R15R16R17R18R19R20R21R22 T1T2T3T4T5T6T7T8T9T10T11T12T13T14T15T16T17T18T19T20T21T22 U1U2U3U4U5U6U7U8U9U10U11U12U13U14U15U16U17U18U19U20U21U22 V1V2V3V4V5V6V7V8V9V10V11V12V13V14V15V16V17V18V19V20V21V22 W1W2W3W4W5W6W7W8W9W10W11W12W13W14W15W16W17W18W19W20W21W22 VCC VCC VEE IREF0 TEST3 HIZ3 LTCH_MODE3 RS13 FV_FIN2 FV_FIN0 DISABLE0 GND GND GND VCC VCCSAMPLE2 SAMPLE1 RS11LTCH_MODE2 TEST1 HIZ1 VEE COMP20 COMP10 NC COMP_IN0 GUARD0 VEE COMP30 NC SENSE0 FORCE0 SRC_OUT0 SRC_MON0 SNK_MON0 COMP40 RA0 RB0 RC0 IREF1 IVMON1 HLD_CAP0 (NC) RD0 VEE SNK_OUT1 VINP1 IV_MAX1 IV_MIN1 NC COMP_IN1 GUARD1 TEST_IN1 COMP21 COMP11 SENSE1 FORCE1 SRC_OUT1 SNK_MON1 COMP31 COMP41 RA1 RB1 RC1 SRC_MON1 NC RD1 VEE SNK_OUT2 IVMON2 IREF2 IV_MIN2 NC COMP_IN2 GUARD2 IV_MAX2 VINP2 TEST_IN2 SENSE2 FORCE2 SRC_OUT2 NC COMP12 COMP22 RA2 RB2 RC2 SNK_MON2 COMP32 COMP42 RD2 VEE SNK_OUT3 SRC_MON2 IVMON3 NC COMP_IN3 GUARD3 IREF3 IV_MIN3 IV_MAX3 SENSE3 FORCE3 SRC_OUT3 VINP3 TEST_IN3 COMP13 RA3 RB3 RC3 VEE VEE NC RD3 VEE GND VCC VCC VEE VINP0 IVMONITOR0 FV_FIN3 DISABLE3 RS03 MI_MVN2 HIZ0 LTCH_MODE0 GND GND GND VCC VCCDISABLE2 RS01 TEST0RS12 MI_MVN1 DISABLE1 VEE VEE VCC TEST_IN0 IV_MAX0 IV_MIN0 MI_MVN3 SAMPLE3 TEST2 RS00 RS10 GND GND VCC GND SNK_OUT0HIZ2 MI_MVN0 SAMPLE0RS02 FV_FIN1 LTCH_MODE1 VEE VEE VCC COMP23 COMP33 COMP43 SRC_MON3 VDD OPEN_RLY0 GND DUT_GND GND GND VCC GND GNDOPEN_RLY1 DUT_LTH3 GNDDUT_LTH1 DUT_GTL2 OPEN_RLY3 VCC VCC VEE VEE VEE SNK_MON3 VEE DUT_GTL0 GND GND GND GND GND VCC VCCDUT_LTH0 DUT_GTL3 GNDDUT_GTL1 OPEN_RLY2 DUT_LTH2 VCC VCC VEE VEE VEE VEE VEE VEE VEE GND GND GND GND GND VCC VCCVEE GND GND GND GND GND A B C D E F G H J K L M N P R T U V W Y AA AB HLD_CAP1 (NC) HLD_CAP2 (NC) HLD_CAP3 (NC) 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1

• Force Voltage / Measure Current
• Force Current / Measure Voltage
• Force Voltage / Measure Voltage
• Force Current / Measure Current
• Measure Voltage / Force Disable The Edge4717D features a PMU (per channel) that can force or measure voltage over a 15V range and force or measure current over four distinct ranges:
• ± 3.2 µA
• ± 80 µA
• ± 2 mA
• ± 30 mA The Edge4717D features an on-board window comparator (per channel) that provides two bit measurement range classification. Also, a monitor pin, IVMON, is capable of outputting either a real time analog voltage signal which tracks the measured parameter, or a sampled value of the measurement parameter captured using the sample and hold circuitry. PMU Functionality The trapezoid in Figure 1 describes the current-voltage functionality of the PMU with VCC = 12V and VEE = –8V, in Range D.

Figure 1. PMU Functionality resistor values and current ranges, is shown in Table 2.

01 B A µ08= BRK 52 Ω

10 C A m2K 1=CR Ω

11 D A m03= DR0 4 Ω

NOTE: Negative current is defined as current flowing into PMU from DUT.

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com Circuit Description (continued) FORCE/SENSE FORCE is an analog output which either forces a current or forces a voltage, depending on which operating mode is selected. In FV mode, the voltage forced is equivalent to the voltage applied to the VINP pin. In FI mode, the current forced is mapped to the input as described in the Force Current section. FORCE can be placed in a high- impedance state through the setting of the HIZ input pin. When the HIZ input pin is set to logical “0”, the Edge4717D FORCE output will be controlled by the internal driver amplifier, and the Edge4717D will force a user-defined current or voltage (depending upon the setting of FV/FI*) at the FORCE pin. When HIZ is set to logical “1”, the FORCE output is placed into a low-leakage, high impedance state. SENSE is a high impedance analog input which measures the DUT voltage in the MV operating mode. (FORCE and SENSE are brought out to separate pins to allow remote sensing.) IVMON IVMON is a real time analog voltage output which tracks the sensed parameter. In the MV mode (MI/MV* = 0), the output voltage displayed at IVMON is a 1:1 mapping of the SENSE voltage. In the MI mode (MI/MV* = 1), IVMON follows the equation: IVMON = I(measured) * REXT Using nominal values for the external resistors (RA, RB, and RC), a voltage at IVMON of +2V corresponds to Imax, and –2V corresponds to Imin of the selected current range. For Range D, +1.2V corresponds to Imax and –1.2V corresponds to Imin. The IVMON pin can also be placed into a high impedance state by using the DISABLE input (see Table 3). Table 3. Sample and Hold The Edge4717D features a sample and hold circuit (per channel) which can be used to capture the corresponding voltage value of the sensed parameter (MI or MV) to be displayed at IVMON. The output of the sample and hold is internally connected to IVMON through a latch controlled by LTCH_MODE. The setting of LTCH_MODE determines whether the data at IVMON comes from the sample and hold circuit or directly from the sensed parameter (see Table 4). Table 4. Note: No update is performed on the sample-and-hold. Sample and Hold Testing An analog MUX in the 4717D allows for testing of the sample-and-hold circuit. The MUX control pin, TEST, is a TTL compatible input whose operation is described in Table 5. To test the sample and hold circuitry, an analog signal can be applied to the TEST_IN pin and sampled. elbasiD* VM/IMr etemaraPdesneS 1X e cnadepmIhgiH 00 e gatloVderusaeM 01 t nerruCderusaeM EDOM_HCTLe lpmaSe tatSdloH_dna-elpmaS 0X t nerapsnarT 1) egdEgnillaF(a taDelpmaS 10 a taDdloH 11 t nerapsnarT

8 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com Table 5. Test Head Ground Reference The Edge4717D features a test head ground referencing feature which allows the force voltage function to be referenced to a separate ground reference other than the ground (GND) power used for the device. The test head ground should be connected to the DUT_GND pin of the Edge4717D. The maximum allowed variation between DUT_GND and GND is ± 250 mV. Force Voltage Mode In the FV mode (FV/FI* = 1), VINP is a high impedance, analog voltage input that maps directly to the voltage forced at the FORCE pin. Measure Current Mode In the MI mode (MI/MV* = 1), a current monitor is connected in series with the PMU forcing amplifier. This monitor generates a voltage that is proportional to the current passing through it, and is brought out to IVMON. This voltage (corresponding to the measured current) can also be tested by the on-board window comparator. Force Current Mode In the FI mode (FV/FI* = 0), VINP is a high impedance, analog voltage input that is converted into a current at the FORCE pin (see Figure 1) using the following relationship: Forced Current = where VREF is the reference voltage input at the REF pin which is nominally set at 2.25V. (Positive current is de- fined as current flowing out of the PMU.) Table 6 de- scribes the relationship between the voltage applied to VINP and the current at FORCE for Ranges A, B, and C. Circuit Description (continued) VINP – VREF (REXT * 2.5) TSETn oitcnuF 0n oitarepOlamroN 1 -elpmasrofdesuNI_TSET gnitsetdloh-dna Table 6. In the Force Current mode, the voltage at VINP is divided by 2.5 internally on the chip, so that a ± 2V range is used internally for forcing currents on Ranges A, B, and C. Range D uses a ± 1.2V range across REXT for forcing currents. Measure Voltage Mode In the MV mode (MI/MV* = 0), DUT voltage is measured via the SENSE input pin. This measured voltage can be displayed on the IVMON pin and tested using the internal window comparator. Comparator The Edge4717D features an on-board window compara- tor which provides two-bit measurement range classifica- tion. IVMAX and IVMIN are high impedance analog inputs that establish the upper and lower thresholds for the win- dow comparator. COMP_IN is the window comparator in- put pin. COMP_IN should be connected to IVMON on each channel if it is desired to use the comparator to indicate PMU measurements. In the MI mode, an I/V MAX input of +2V will set the upper threshold of the window comparator to a voltage corresponding to +FSC (full-scale current), and an I/V MIN input of –2V will set the lower threshold to a voltage corresponding to –FSC for Ranges A, B, and C. Similarly for Range D, –1.2V corresponds to sinking full-scale current, and +1.2V corresponds to sourcing full-scale current (positive current is defined as current flowing out of the PMU). DUTGTL the DUTLTH are LVTTL compatible outputs which indicate the range of the measured parameter in relation to IVMIN and IVMAX. Comparator functionality is sum- marized in Table 7. PNIVt nerruCdecroFgnidnopserroC V5.5+FERV ≥ )C,B,AsegnaR,elacS-lluF(xamI V5.3+FERV ≥ )DegnaR,elacS-lluF(xamI FERV0 V5.3–FERV ≤ )DegnaR,elacS-lluF(nimI V5.5–FERV ≤ )C,B,AsegnaR,elacS-lluF(nimI

Table 8. Over-Current Detection Circuit Functionality specifying the overall accuracy of the application. amplifier, it is very linear in nature. effect of this error can be significantly reduced.

1 A/N

Table 7. Comparator Truth Table on range selected using RS0 and RS1 inputs) is ≤ 2V.

Figure 2. Graphical Representation of

1. VEE ≤ GND ≤ VDD ≤ VCC at all times

Figure 3. Functional Schematic is not damaged when SRC_MON > SNK_MON.

12 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com

Application Information

Figure 4. Required External Components (Per Channel) on the actual system environment.

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com

Package Information

A B C D E F G H J K L M N P R T U V W Y AA AB e e Detail B Top View Bottom View Corner D E 0.10 –A– –B– 45 degree 0.5 mm Chamfer (4 PLCS) The entire top-side of the E4717D package is constructed of copper, which offers a path of high thermal conductivity for cooling.

14 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com Package Information (continued) Detail A P c A / / ccc C aaa C –C– b g g

0.30 S C A S B S

0.10 S C

.FER. NIM. MON. XAM A5 2.14 .15 5.1 1A0 4.00 5.00 6.0 D0 8.220 0.320 2.32 1DC SB00.12 E0 8.220 0.320 2.32 1EC SB00.12 b5 25.05 6.05 77.0 c5 8.00 9.05 9.0 M2 2 N8 22 aaa5 1.0 ccc5 2.0 eP YT00.1 g5 3.0 P5 1.0 NOTES: 1. All dimensions are in millimeters. 2. “e” represents the basic solder ball grid pitch. 3. “M” represents the basic solder ball matrix size, and symbol “N” is the maximum allowable number of balls after depopulating. 4. “b” is measured at the maximum solder ball diameter (after reflow) parallel to primary datum –C– . 5. Dimension “aaa” is measured parallel to primary datum –C– . 6. Primary datum –C– and seating plane are defined by the spherical crowns of the solder balls. 7. Package surface shall be black oxide. 8. Cavity depth varies with die thickness. 9. Substrate material base is copper. 10. Bilateral tolerance zone is applied to each side of package body. 11. 45 degree 0.5 mm Chamfer corner and white dot for Pin 1 identification.

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com Recommended Operating Conditions Absolute Maximum Ratings retemaraPl obmySn iMp yTx aMs tinU ylppuSrewoPgolanAevitisoPC CV5 .112 15 .21V ylppuSrewoPgolanAevitageNE EV5 .8– 8– 5.7– V ylppuSrewoPgolanAlatoTE EV–CCV9 10 21 2V ylppuSrewoPlatigiDD DV0 .33 .35 2.5V erutarepmeTesaCC T5 25 6+C ˚ egakcaPfoecnatsiseRlamrehT )esaCotnoitcnuJ( θ cj 3.0W /C˚ retemaraPl obmySn iMp yTx aMs tinU ylppuSrewoPevitisoPC CV5 1+V ylppuSrewoPevitageNE EV5 1– V ylppuSrewoPlatoTE EV–CCV0 2 2V ylppuSrewoPlatigiDD DV0 7 +V stupnIlatigiD 5.– 0.7V stupnIgolanA 5.–EEV5 .+CCVV erutarepmeTegarotS 55– 521+C ˚ erutarepmeTesaC 001C ˚ erutarepmeTgniredloS 062C ˚ Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

16 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com DC Characteristics retemaraPl obmySn iMp yTx aMs tinU seilppuSrewoP )daoL-oN(noitpmusnoCylppuSrewoP ylppuSevitisoP ylppuSevitageN ylppuS"latigiD" CCI EEI DDI Am Am Am oitaRnoitcejeRylppuSrewoP )edomdloHnitpecxe(tuptuOgolanAynaotCCV zHM1 zHk005 zHk001 RRSP Bd Bd Bd )edomdloHnitpecxe(tuptuOgolanAynaotEEV zHM1 zHk005 zHk001 Bd Bd Bd )edomdloHnitpecxe(tuptuOgolanAynaotDDV zHM1< 06B d )edoMdloH(NOMVIotCCV zHM1 zHk005 zHk001 zH002 6.0 Bd Bd Bd Bd )edoMdloH(NOMVIotEEV zHM1 zHk005 zHk001 zH002 7.1 Bd Bd Bd Bd )edoMdloH(NOMVIotDDV zHM1< 06B d edoMegatloVecroF egnaRegatloVtupnI tnerruCegakaeLtupnI PNIV kaelI 0.2+EEV 1– 0 0.2–CCV V Aµ tnerruCelacS-lluFevitisoP(egatloVgnicroFtuptuO Rhguorht TXE ) ECROFV5 .2+EEV5 .4–CCVV RhguorhttnerruC0(egatloVgnicroFtuptuO TXE )E CROFV5 .2+EEV5 .2–CCVV tnerruCelacS-lluFevitageN(egatloVgnicroFtuptuO Rhguorht TXE ) ECROFV5 .4+EEV5 .2–CCVV ycaruccAegatloV tesffO niaG ytiraeniL SOV niaG LNIVF 002– 589. 520.0– 10. 002 510.1 520.0+ Vm V/V RVSF%

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com DC Characteristics (continued) retemaraPl obmySn iMp yTx aMs tinU edoMtnerruCerusaeM egnaRtnemerusaeMtnerruC AegnaR BegnaR CegnaR DegnaR I ERUSAEM 2.3– 08– 03– 2.3 Aµ Aµ Am Am ycaruccAtnemerusaeMtnerruC )NOMVI@(tesffO )1etoN(niaG ytiraeniL C,B,AsegnaR DegnaR SOV niaG LNIIM 051– 589. 80.– 08– 051 510.1 80. 08+ Vm V/V RCSF% Aµ rorrEedoMnommoC ytiraeniLedoMnommoC V57.4–CCVotV5.4+EEV=ECROF ecnadepmItuptuONOMVI tnerruCegakaeLNOMVI )V5.2–CCVOTV5.2+EEV=NOMVI( rorrEMC LNIMC R TUO I KAEL 5.5– 50.– 001– 005 5.5 50. 001 V/Vm RCSF% Ω An edoMtnerruCecroF egnaRegatloVtupnI tnerruCegakaeLtupnI egnaRegatloVtupnIFER tnerruCegakaeLFER PNIV I KAEL FERV I KAEL 5.5–FERV 1– 0 5.5+FERV 5.2 V Aµ V Aµ tnerruCgnicroFtuptuO AegnaR BegnaR CegnaR DegnaR I ECROF 2.3– 08– 03– 2.3 Aµ Aµ Am Am egnaRegatloVecnailpmoC tnerruCelacS-lluFevitisoP tnerruC0 tnerruCelacS-lluFevitageN ECROFV 5.2+EEV 5.2+EEV 0.3+EEV 0.3–CCV 5.2–CCV 5.2–CCV V V V ycaruccAtnerruC tesffO )2etoN(niaG ytiraeniL C,B,AsegnaR DegnaR SOI niaG LNIIF 6.3– 583. 80.– 08– 6.3 514. 80. 08+ RCSF% V/V RCSF% Aµ rorrEedoMnommoC ytiraeniLedoMnommoC V5.4–CCVotV5.4+EEV=ECROF rorrEMC LNIMC 5.5– 50.– 5.5 50. V/Vm RCSF%

18 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com DC Characteristics (continued) retemaraPl obmySn iMp yTx aMs tinU edoMegatloVerusaeM egnaRtnemerusaeMegatloVE SNESV5 .2+EEV5 .2–CCVV ycaruccAtnemerusaeMegatloV tesffO niaG ytiraeniL ZiHnitnerruCegakaeLdenibmoCESNES/ECROF )V5.2–CCVotV5.2+EEV=ESNES/ECROF,0=*IF/VF( ecnadepmItuptuONOMVI tnerruCegakaeLNOMVI )V5.2–CCVotV5.2+EEV=NOMVI( SOV niaG LNIVM I KAEL R TUO I KAEL 002– 589. 520.– 01– 001– 10.± 005 002 510.1 520. 001 Vm V/V RVSF% An Ω An ,1SR,0SR,*VM/IM,*IF/VF(stupnIlatigiD )ELPMAS,EDOM_HCTL,ZiH,TSET,ELBASID leveLwoLtupnIL IV8 .0V leveLhgiHtupnIH IV0 .2V tnerruCegakaeLtupnIk aelI1 – 01 A µ spmalCegatloV egnaR –NOM_KNS NOM_CRS 5.0 .61V spmalCfoecnadepmItuptuOevitceffER TUO 01 Ω egnaRegatloVpmalCkniSN OM_KNS5 .2+EEV0 .2–CCVV egnaRegatloVpmalCecruoSN OM_CRS0 .2+EEV5 .2–CCVV tnerruCegakaeLNOM_CRSI KAEL 1– 1A µ tnerruCegakaeLNOM_KNSI KAEL 1– 1A µ tnerruCtnatsnoCAm5@ytiraeniLL NIPMALC0 04.– 004.+R VSF% tnerruCtnatsnoCAm5@tesffOS OV0 51– 051+V m spmalCegatloVUMPP )tnerruCreggirTYLR_NEPO(timiLtpurretnItnerruC I PMALC 535 9A m egnaRgnitimiLtnerruCspmalCegatloVUMPPI TIMIL 535 9A m Am1@niPYLR_NEPOrofegatloVwoLtuptuOV LO 005V m tnerruCegakaeLNI_TSETI KAEL 1– 1A µ V5@tnerruCegakaeLYLR_NEPOI KAEL 1– 1A µ tiucriCdloHdnaelpmaS rorrEytiraeniLL NIH&S5 20.– 10.5 20.R VSF% petSdloHV SH 610 2V m )3etoN(petSdloHfooCpmeT ∆ /V ∆ C˚ 05C ˚/Vµ )3etoN(NOMVIfoecnadepmItuptuOR TUO 005 Ω

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com DC Characteristics (continued) IVMON VEXT VEXT VINP – REF retemaraPl obmySn iMp yTx aMs tinU noitcetorPtiucriCtrohS )3etoN(timiLtnerruCpmA-pOgnicroFI XAM 535 7A m dnuorGdaeHtseT/drauGnevirD ESNES–DRAUG 0=DNG_TUD@ V5=ESNES V FFID 001– 001+V m egnaRegatloVDNGotDNG_TUDV SO 052– 052+V m tnerruCegakaeLDNG_TUDI KAEL 1– 1A µ rotarapmoC egnaRegatloVXAMVIX AMVI5 7.1+EEV5 7.1–CCVV egnaRegatloVNIMVIN IMVI5 7.1+EEV5 7.1–CCVV )XAMVI,NIMVI(tesffOrotarapmoCV SO 001– 001+V m )NI_PMOC,XAMVI,NIMVI(tatnerruCsaiBtupnII saib 1– 1+A µ )LTGTUD,HTLTUD(stuptuOlatigiD )daolDBT(leveLwoLtuptuOV LO 004V m )daolDBT(leveLhgiHtuptuOV HO 4.2D DVV Note 1: Gain = , where VEXT is the voltage across REXT, which corresponds to measured current. Note 2: Gain = , REF = 2.25V nominal, VEXT is the voltage across REXT, which corresponds to forced current. Note 3: Guaranteed by design and characterization. Not production tested. Unit Definitions: FSCR = Full Scale Current Range Range A, ± 3.2 µA Range B, ± 80 µA Range C, ± 2 mA Range D, ± 30 mA FSVR = Full Scale Voltage Range FV mode, no current = 14V minimum FV mode, current load = 12V minimum MV mode = 14V minimum

20 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com AC Characteristics retemaraPl obmySn iMp yTx aMs tinU tnerruCerusaeM/egatloVecroF )1etoN(emiTgniltteSegatloVtuptuOECROF )petsV01fo%1.0oT( AEGNAR D,C,BSEGNAR t elttes 003 sm sµ )1etoN(emiTgniltteStnerruCderusaeM )petsRCSFfo%1.0oT( AEGNAR D,C,BSEGNAR t elttes 003 sm sµ )1etoN(ytilibatS noitarepOelbatSrofegnaRgnidaoLeviticapaCC DAOL 00 1F n pmAecroF emiTyrevoceRnoitarutaS emiTelbasiDECROFoteurTZiH emiTelbanEECROFoteslaFZiH t rs tz t eo sµ sµ sµ egatloVerusaeM/tnerruCecroF )1etoN(emiTgniltteStnerruCtuptuOECROF )petsRCSFfo%1.0oT( AEGNAR D,C,BSEGNAR t elttes 003 sm sµ )1etoN(emiTgniltteSegatloV)erusaeM(ESNES )petsV01fo%1.0oT( AEGNAR D,C,BSEGNAR t elttes 003 sm sµ )1etoN(ytilibatS noitarepOelbatSrofegnaRgnidaoLeviticapaCC DAOL 00 1F n pmAecroF emiTyrevoceRnoitarutaS emiTelbasiDECROFoteurTZiH emiTelbanEECROFoteslaFZiH t rs tz t eo sµ sµ sµ rotinoMV/I emiTelbanEt eo 005s n emiTelbasiDt z 005s n

TEST AND MEASUREMENT PRODUCTS  2005 Semtech Corp. / Rev. 5, 10/14/05 Edge4717D www.semtech.com AC Test Conditions: COMP3 = 120 pF to Ground; COMP4 = 120 pF to FORCE; Capacitor between COMP1 and COMP2 = 120 pF; Load at FORCE/SENSE combined output = 100 pF . Note 1: Guaranteed by design and characterization. Not production tested. Note 2: Sample and Hold Circuit Acquisition Time (t AQ) and Settling Time (tHSETTLE) are described below: AC Characteristics (continued) VHS tAQ tHSETTLE VCC – 4.5 VEE + 4.5 CONDITIONS: LTCH_MODE = 1 IVMON = 100 pF to GND SAMPLE IVMON retemaraPl obmySn iMp yTx aMs tinU tiucriCdloHdnaelpmaS etaRpoorD ∆ /V ∆t 04s /Vm )eulaVdelpmaSfo%520.0ot(emiTnoitisiuqcAt QA 10 1s µ )2,1setoN(emiTgniltteSedoMdloH edoMegatloVerusaeM petSV01fo%1.0oT petSV01fo%520.0oT t ELTTESH 8.0 4.1 5.1 sµ sµ )2,1setoN(edoMtnerruCerusaeM petSV4fo%1.0oT petSV4fo%520.0oT t ELTTESH 3.1 8.1 sµ fsµ srotarapmoC yaleDnoitagaporPd pt5 2s µ

22 2005 Semtech Corp. / Rev. 5, 10/14/05 TEST AND MEASUREMENT PRODUCTS Edge4717D www.semtech.com

Ordering Information

Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 rebmuNledoMe gakcaP GBD7174EA GBTmm32xmm32niP822 GBD7174MVEd raoBnoitaulavED7174egdE This device is ESD sensitive. Care should be taken when handling and installing this device to avoid damaging it.