EVM4237ALPT

E4237 SEMTECH | Alldatasheet

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Revision 5 / November 30, 2005 E42X7 is a family of Dual Channel Parametric Measure- ment Units (PMU) designed for automated test equip- ment and instrumentation. Manufactured in a wide volt- age Bi-CMOS process, it is a monolithic solution for a per-pin PMU. The E42X7 family consists of three products: E4287

• 16.25V I/O range
• 4 current ranges up to ± 40 mA
• Analog mux for providing a FLASH TM programming level
• Driven guard pin E4257
• 16.25V I/O range
• 4 Current ranges up to ± 40 mA
• Small 9mm x 9mm footprint E4237
• 16.25VI/O range
• 2 current ranges up to ± 4 mA
• Low capacitance for use in relayless tester architectures Every member of the E42X7 family can drive capacitive loads of up to 300 pF with no external compensation components. A user selectable FORCE amplifier compensation switch allows users to add compensation components for stability with larger capacitive loads. Integrated voltage clamp circuitry provides a method for clamping DUT (Device Under Test) compliance voltage and protecting the DUT from damage. Each channel of the E42X7 also features an on-board window comparator that can be used to determine if a measurement value is within a user defined range for go/ no-go testing. Also included with the E42X7 are a number of integrated switches that allow the connection of a central “system” PMU to the E42X7 FORCE and SENSE pins and allow the E42X7 to provide “pull-up” or “pull-down” resistors and termination voltages for DUTs with open element outputs.
• Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)
• 4 Current Ranges ( ± 40 µA, ± 400 µA, ± 4 mA, ± 40 mA) (E4287, E4257)
• 2 Current Ranges ( ± 40 µA and ± 4 mA) (E4237)
• Wide Output Voltage Range – –3.25V to +13V @ RF pin across all ranges – –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C) – –1.25V to +11V @ FORCE (Range D)
• Low Power Dissipation
• FV Linearity to ± 0.025% FSVR
• Extremely Fast Settling Times offer reduced test times/increased tester thru-put.
• Central PMU Switches for External PMU, –4.75 V to +14.5V, ± 40 mA Ranges
• Switches for Pin Driver Super Voltages
• Driven Guard Output (E4287)
• Test Head Ground Reference
• Stable with up to 300 pF Capacitive Loading with no external compensation capacitors
• Switchable Compensation allows stability with up to 10 nF Capacitive Loading
• 14x14 mm, 80 Pin MQFP Package (E4287)
• Small, 9x9 mm, 64-Pad LPCC Package (E4237, E4257)
• Automated Test Equipment – Memory Testers – Logic Testers – Mixed Signal Testers – SOC Testers
• Instrumentation The E42X7 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per-pin.

2 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Functional Block Diagram HLV LLV HiZ LIMIT SELCOMP VINP IVMAX IVMIN IVMON REXT (1 OF 4) RF DUTNH GUARD DUT FORCE SENSE DUTNL EPMUF DUT GND EPMUS Channel 0 COMPARE VAOUT VA 700 VBOUT VB VC 700 SELC Channel 1 E4287 E4287, 4257 (1 OF 2) E4237 E4287

3 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4287 PIN Description emaNniP# niPn oitpircseD UMP ]1:0[PNIV1 1,05 .UMPehtfotnerrucroegatlovtuptuoehtsmargorphcihwtupniegatlovgolanA ]1:0[ECROF ]1:0[ESNES ]1:0[DRAUG 2,95 3,85 9,25 .egatlovrotnerrucsecrofhcihwniptuptuogolanA .egatlovsesneshcihwniptupnigolanA .tuptuodraugnevirD DNGTUD6 6 .slennahchtobottupniecnereferdnuorg)TUD(tseTrednUeciveD ,]1:0[*IF/VF ]1:0[*VM/IM 42,73 52,63 ,tnerrucgnicrofroegatlovgnicrofsiUMPehtrehtehwenimretedhcihwstupnilatigiD .egatlovgnirusaemrotnerrucgnirusaem ]1:0[1SR,0SR5 1,64,61,54 .segnartnerrucruofehtfoenotceleshcihwstupnilatigiD ,BR,AR,FR ]1:0[DR,CR ,45,8,35,4,75 5,65,6,55,7 .srotsiserehtotnipnommocFR.DhguorhtAsegnarotgnidnopserrocsrotsiserotsniP ]1:0[NIMVI ]1:0[XAMVI 87,36 97,26 ehtrofleveldlohserhtreppudnarewolehthsilbatsehcihwsegatlovtupnigolanA .rotarapmoctnemerusaem ]1:0[HNTUD ]1:0[LNTUD 91,24 22,93 reppuehtnahtsselsitnemerusaemTUDehtetacidnitahtstuptuorotarapmoclatigiD .)wolton(dlohserhtrewolehtnahtretaergdna)hgihton(dlohserht NOMVI5 7 egatlovderusaemehtrehtieforotinomemitlaerasedivorptahttuptuoegatlovgolanA .lennahcdetcelesehtrofleveltnerrucderusaemro ]1:0[NOMSID6 2,53. tuptuoNOMVIselbasidhcihwtupnilatigiD ,]1:0[VLH ]1:0[VLL 77,46 67,56 .levelpmalcegatlovreppuehtsehsilbatsetahtegatlovtupnigolanA .levelpmalcegatlovrewolehtsehsilbatsetahtegatlovtupnigolanA ]1:0[ZIH3 2,83 .ecnadepmihgihotnituptuoECROFehtsecalphcihwtupnilatigiD ,]1:0[1PMOC ]1:0[2PMOC 01,15 21,94 1PMOCneewtebdetcennocroticapaclanretxenaeriuqertahtsnipnoitasnepmoC .2PMOCdna ]1:0[PMOCLES7 2,43 .roticapacnoitasnepmoclanretxerolanretninastcelestupnilatigiD [0] refers to Channel 0, [1] refers to Channel 1

4 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4287 PIN Description (continued) emaNniP# niPn oitpircseD UMPlanretxE FUMPE0 7. slennahchtobottupniecrofUMPlanretxE SUMPE1 7. slennahchtobottupniesnesUMPlanretxE ]1:0[UMPILES7 1,44. ESNES/ECROFotUMPlanretnisehctiwstahttupnilatigiD ]1:0[UMPELES8 1,34. ESNES/ECROFotUMPlanretxesehctiwstahttupnilatigiD XUMgolanA ]1:0[AV0 3,13. tupnigolanahctiwsAegatloV ]1:0[TUOAV2 7,96. tuptuoAegatloV ]1:0[BV9 2,23. tupnigolanahctiwsBegatloV ]1:0[TUOBV3 7,86. tuptuoBegatloV ]1:0[CV8 2,33. tupnigolanahctiwsCegatloV ]1:0[CLES4 1,74. sehctiwsCtcelesotstupnilatigiD seilppuSrewoP ]1:0[CCV0 8,1,16,06. ylppusrewopgolanaevitisopUMP CCVS4 7. slennahchtobotylppusrewopgolanaevitisophctiwS ]1:0[EEV1 2,02,14,04. ylppusrewopgolanaevitageN DNGA7 6. slennahchtobotdnuorggolanA DDV3 1. slennahchtobotylppusrewoplatigidevitisoP DNGD8 4. slennahchtobotdnuorglatigiD [0] refers to Channel 0, [1] refers to Channel 1

5 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4287 PIN Description (continued)

80 Pin INT_TEP_MQFP Package

(w/Internal Heat Spreader) 14mm x 14mm X 2.0mm VEE[1] DUTNL[1] HIZ[1] FV/FI*[1] MI/MV*[1] DISMON[1] SELCOMP[1] VC[1] VB[1] VA[1] VA[0] VB[0] VC[0] SELCOMP[0] DISMON[0] MI/MV*[0] FV/FI*[0] HIZ[0] DUTNL[0] VEE[0] VCC[1] FORCE[1] SENSE[1] RF[1] RD[1] RC[1] RB[1] RA[1] GUARD[1] COMP1[1] VINP[1] COMP2[1] VDD SELC[1] RS1[1] RS0[1] SELIPMU[1] SELEPMU[1] DUTNH[1] VEE[1] VCC[0] FORCE[0] SENSE[0] RF[0] RD[0] RC[0] RB[0] RA[0] GUARD[0] COMP1[0] VINP[0] COMP2[0] DGND SELC[0] RS1[0] RS0[0] SELIPMU[0] SELEPMU[0] DUTNH[0] VEE[0] VCC[1] IVMAX[1] IVMIN[1] HLV[1] LLV[1] IVMON SVCC VBOUT[1] VAOUT[1] EPMUS EPMUF VAOUT[0] VBOUT[0] AGND DUTGND LLV[0] HLV[0] IVMIN[0] IVMAX[0] VCC[0] E4287AHF (Top View)

6 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4257 PIN Description [0] refers to Channel 0, [1] refers to Channel 1 emaNdaP# daPn oitpircseD UMPlanretnI ]1:0[PNIV0 4,9 .tnerrucroegatlov"ECROF"tuptuoehtsmargorphcihwtupniegatlovgolanA ]1:0[ECROF ]1:0[ESNES 84,1 74,2 .egatlovrotnerrucsecrofhcihwniptuptuogolanA .egatlovsesneshcihwniptupnigolanA DNGTUD9 5 .slennahchtobottupniecnereferdnuorg)TUD(tseTrednUeciveD ]1:0[*IF/VF ]1:0[*VM/IM 92,02 82,12 .tnerrucroegatlovgnicrofsiUMPehtrehtehwenimretedhcihwstupnilatigiD ]1:0[0SR ]1:0[1SR 63,31 73,21 .segnartnerrucruoffoenotcelestahtstupnilatigiD ,CR,BRAR ]1:0[FR,DR ,24,3,4,5,6,7 64,54,44,34 ehtotnipnommocFR.DhguorhtAsegnarotgnidnopserrocsrotsiserotsniP .srotsiser ]1:0[NIMVI ]1:0[XAMVI 15,26 05,36 ehtrofleveldlohserhtreppudnarewolehthsilbatsehcihwsegatlovtupnigolanA .rotarapmoctnemerusaem ]1:0[HNTUD ]1:0[LNTUD 33,61 13,81 dlohserhtreppuehtnahtsselsitnemerusaemTUDehtetacidnitahtstuptuolatigiD .)wolton(dlohserhtrewolehtnahtretaergdna)hgihton( NOMVI4 5 derusaemehtrehtieforotinomemitlaerasedivorptahttuptuoegatlovgolanA .lennahcdetcelesehtrofleveltnerrucderusaemroegatlov ]1:0[NOMSID7 2,22. tuptuoNOMVIselbasidhcihwtupnilatigiD ]1:0[VLH ]1:0[VLL 25,16 35,06 .levelpmalcegatlovreppuehtsehsilbatsetahttupniegatlovgolanA .levelpmalcegatlovrewolehtsehsilbatsetahttupniegatlovgolanA ]1:0[ZIH0 3,91 .ecnadepmihgihotnituptuoECROFehtsecalphcihwtupnilatigiD ,]1:0[1PMOC ]1:0[2PMOC 14,8 93,01 1PMOCneewtebdetcennocroticapaclanretxenaeriuqertahtsnipnoitasnepmoC .2PMOCdna ]1:0[PMOCLES6 2,32 .roticapacnoitasnepmoclanretxerolanretninastcelestupnilatigiD UMPlanretxE FUMPE7 5. slennahchtobottupniecrofUMPlanretxE SUMPE6 5. slennahchtobottupniesnesUMPlanretxE ]1:0[UMPILES5 3,41. ESNES/ECROFotUMPlanretnisehctiwstahttupnilatigiD ]1:0[UMPELES4 3,51. ESNES/ECROFotUMPlanretxesehctiwstahttupnilatigiD seilppuSrewoP ]1:0[CCV9 4,46. ylppusrewopgolanaevitisopUTP CCVS5 5. ylppusrewopgolanaevitisophctiwS ]1:0[EEV2 3,71. ylppusrewopgolanaevitageN DNGA8 5. dnuorggolanA DDV8 3. ylppusrewoplatigidevitisoP DNGD1 1. dnuorglatigiD edoiDlamrehT gnirtS 0CV 1CV .gnirtsedoidlamrehtehtfoedohtaCotdetcennoC .gnirtsedoidlamrehtehtfoedonAotdetcennoC

7 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4257 PIN Description (continued) FORCE[1] SENSE[1] RF[1] RD[1] RC[1] RB[1] RA[1] COMP1[1] VINP[1] COMP2[1] VDD RS1[1] RS0[1] SELIPMU[1] SELEPMU[1] DUTNH[1] VCC[0] IVMAX[0] IVMIN[0] HLV[0] LLV[0] DUTGND AGND EPMUF EPMUS SVCC IVMON LLV[1] HLV[1] IVMIN[1] IVMAX[1] VCC[1] FORCE[0] SENSE[0] RF[0] RD[0] RC[0] RB[0] RA[0] COMP1[0] VINP[0] COMP2[0] DGND RS1[0] RS0[0] SELIPMU[0] SELEPMU[0] DUTNH[0] VEE[0] DUTNL[0] HIZ[0] FV/FI*[0] MI/MV*[0] DISMON[0] SELCOMP[0] VC0 VC1 SELCOMP[1] DISMON[1] MI/MV*[1] FV/FI*[1] HIZ[1] DUTNL[1] VEE[1] E4257ALP Top View FORCE[1] SENSE[1] RF[1] RD[1] RC[1] RB[1] RA[1] COMP1[1] VINP[1] COMP2[1] VDD RS1[1] RS0[1] SELIPMU[1] SELEPMU[1] DUTNH[1] VCC[1] IVMAX[1] IVMIN[1] HLV[1] LLV[1] IVMON SVCC EPMUS EPMUF AGND DUTGND LLV[0] HLV[0] IVMIN[0] IVMAX[0] VCC[0] FORCE[0] SENSE[0] RF[0] RD[0] RC[0] RB[0] RA[0] COMP1[0] VINP[0] COMP2[0] DGND RS1[0] RS0[0] SELIPMU[0] SELEPMU[0] DUTNH[0] VEE[1] DUTNL[1] HIZ[1] FV/FI*[1] MI/MV*[1] DISMON[1] SELCOMP[1] VC1 VC0 SELCOMP[0] DISMON[0] MI/MV*[0] FV/FI*[0] HIZ[0] DUTNL[0] VEE[0] EXPOSED THERMAL PAD (Connect to VEE) E4257ALP Bottom View 64-Pad LPCC 9mmx 9mm

8 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4237 PIN Description emaNdaP# daPn oitpircseD UMPlanretnI ]1:0[PNIV0 4,9 .tnerrucroegatlov"ECROF"tuptuoehtsmargorphcihwtupniegatlovgolanA ]1:0[ECROF ]1:0[ESNES 84,1 74,2 .egatlovrotnerrucsecrofhcihwniptuptuogolanA .egatlovsesneshcihwniptupnigolanA DNGTUD9 5 .slennahchtobottupniecnereferdnuorg)TUD(tseTrednUeciveD ]1:0[*IF/VF ]1:0[*VM/IM 92,02 82,12 .tnerrucroegatlovgnicrofsiUMPehtrehtehwenimretedhcihwstupnilatigiD ]1:0[SR7 3,21,63,31 .)yllanretxerehtegottcennoc(segnartnerrucowtfoenotcelestahtstupnilatigiD ]1:0[FR,CR,AR6 4,44,24,3,5,7 .srotsiserehtotnipnommocFR.CdnaAsegnarotgnidnopserrocsrotsiserotsniP ]1:0[NIMVI ]1:0[XAMVI 15,26 05,36 ehtrofleveldlohserhtreppudnarewolehthsilbatsehcihwsegatlovtupnigolanA .rotarapmoctnemerusaem ]1:0[HNTUD ]1:0[LNTUD 33,61 13,81 dlohserhtreppuehtnahtsselsitnemerusaemTUDehtetacidnitahtstuptuolatigiD .)wolton(dlohserhtrewolehtnahtretaergdna)hgihton( NOMVI4 5 derusaemehtrehtieforotinomemitlaerasedivorptahttuptuoegatlovgolanA .lennahcdetcelesehtrofleveltnerrucderusaemroegatlov ]1:0[NOMSID7 2,22. tuptuoNOMVIselbasidhcihwtupnilatigiD ]1:0[VLH ]1:0[VLL 25,16 35,06 .levelpmalcegatlovreppuehtsehsilbatsetahttupniegatlovgolanA .levelpmalcegatlovrewolehtsehsilbatsetahttupniegatlovgolanA ]1:0[ZIH0 3,91 .ecnadepmihgihotnituptuoECROFehtsecalphcihwtupnilatigiD ,]1:0[1PMOC ]1:0[2PMOC 14,8 93,01 1PMOCneewtebdetcennocroticapaclanretxenaeriuqertahtsnipnoitasnepmoC .2PMOCdna ]1:0[PMOCLES6 2,32 .roticapacnoitasnepmoclanretxerolanretninastcelestupnilatigiD UMPlanretxE FUMPE7 5. slennahchtobottupniecrofUMPlanretxE SUMPE6 5. slennahchtobottupniesnesUMPlanretxE ]1:0[UMPILES5 3,41. ESNES/ECROFotUMPlanretnisehctiwstahttupnilatigiD ]1:0[UMPELES4 3,51. ESNES/ECROFotUMPlanretxesehctiwstahttupnilatigiD seilppuSrewoP ]1:0[CCV9 4,46. ylppusrewopgolanaevitisopUTP CCVS5 5. ylppusrewopgolanaevitisophctiwS ]1:0[EEV2 3,71. ylppusrewopgolanaevitageN DNGA8 5. dnuorggolanA DDV8 3. ylppusrewoplatigidevitisoP DNGD1 1. dnuorglatigiD edoiDlamrehT gnirtS 0CV 1CV .gnirtsedoidlamrehtehtfoedohtaCotdetcennoC .gnirtsedoidlamrehtehtfoedonAotdetcennoC C/N5 4,34,6,4. detcennoctoN

9 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com E4237 PIN Description (continued) FORCE[1] SENSE[1] RF[1] N/C RC[1] N/C RA[1] COMP1[1] VINP[1] COMP2[1] VDD RS[1] RS[1] SELIPMU[1] SELEPMU[1] DUTNH[1] VCC[1] IVMAX[1] IVMIN[1] HLV[1] LLV[1] IVMON SVCC EPMUS EPMUF AGND DUTGND LLV[0] HLV[0] IVMIN[0] IVMAX[0] VCC[0] FORCE[0] SENSE[0] RF[0] N/C RC[0] N/C RA[0] COMP1[0] VINP[0] COMP2[0] DGND RS[0] RS[0] SELIPMU[0] SELEPMU[0] DUTNH[0] VEE[1] DUTNL[1] HIZ[1] FV/FI*[1] MI/MV*[1] DISMON[1] SELCOMP[1] VC1 VC0 SELCOMP[0] DISMON[0] MI/MV*[0] FV/FI*[0] HIZ[0] DUTNL[0] VEE[0] EXPOSED THERMAL PAD (Connect to VEE) E4237ALP Bottom View FORCE[1] SENSE[1] RF[1] N/C RC[1] N/C RA[1] COMP1[1] VINP[1] COMP2[1] VDD RS[1] RS[1] SELIPMU[1] SELEPMU[1] DUTNH[1] VCC[0] IVMAX[0] IVMIN[0] HLV[0] LLV[0] DUTGND AGND EPMUF EPMUS SVCC IVMON LLV[1] HLV[1] IVMIN[1] IVMAX[1] VCC[1] FORCE[0] SENSE[0] RF[0] N/C RC[0] N/C RA[0] COMP1[0] VINP[0] COMP2[0] DGND RS[0] RS[0] SELIPMU[0] SELEPMU[0] DUTNH[0] VEE[0] DUTNL[0] HIZ[0] FV/FI*[0] MI/MV*[0] DISMON[0] SELCOMP[0] VC0 VC1 SELCOMP[1] DISMON[1] MI/MV*[1] FV/FI*[1] HIZ[1] DUTNL[1] VEE[1] E4237ALP Top View 64-Pad LPCC 9mmx 9mm

• Force Voltage/Measure Current
• Force Current/Measure Voltage
• Force Voltage/Measure Voltage
• Force Current/Measure Current Each PMU channel can force or measure voltage over a 16.25V range and force or measure current over four distinct ranges: E4257, E4287 E4237 ± 40 µA ± 40 µA ± 400 µA ± 4 mA ± 4 mA ± 40 mA The E42X7 also features integrated voltage clamp/over- voltage detection circuitry that provides over-voltage protection to the DUT (Device Under Test) during normal operation. Short-circuit protection circuitry protects the E42X7 by limiting the maximum output current to a specified value over the full-scale current for a particular range. The E4287 features an integrated analog MUX that is intended to be used to toggle the “driver high level” supplied to a pin electronics driver between normal logic levels and a super voltage level which is suitable for programming devices that require a “third-level” such as FLASH TM. The E4287 also features a pin (per channel), GUARD, which can be used to drive the guard traces of a FORCE/ SENSE pair. By surrounding FORCE and SENSE traces with guard traces which connect to the GUARD pin, an effective method to achieve minimal leakage can be achieved. The E42X7 also includes a test head ground (DUTGND) referencing features which allow the force voltage function to be referenced to a separate ground reference other than the ground (GND) power used for the device. Also included with the E42X7 are a number of integrated switches that allow the device to be configured to:
• Connect a central “system” PMU to the DUT through the FORCE and SENSE pins of the E42X7.
• Provide a ~4.5KΩ pull-up resistor to the programmed force voltage level, which allows devices with unipolar open-element outputs (i.e., open drain) to be tested without providing a designated pull-up or pull-down on a load board. PPMU Functionality The trapezoid in Figure 1 describes the V/I functionality of the E42X7’s internal PMU when a DUT is connected to the FORCE or RF pins (a functional schematic of the E42X7 can be viewed in Figure 2).

Figure 1. PMU Functionality/Range at the

Figure 2. PMU Functionality/Range at the FORCE and RF Pins NOTE: Switch impedance shown for typical values.

Table 4. SELIPMU Functionality modes of operation related to these three input pins. independent for each channel of the E4287 and E4257. together externally on the E4237.

11 C A m4±4 21=CR Ω

Table 7. IVMON Functionality programmed voltage or current can be applied to the DUT. Figure 2) is configured as a unity gain buffer. Table 5. SELEPMU Functionality functionality is described in Table 6. Table 6. Analog Mux Functionality (E4287 only) state. DISMON functionality is described in Table 7.

Table 9. Nominal VIVMON/Imeasured Relationship comparator, or routed to the IVMON pin. instrument amplifier that senses the voltage across REXT. at the FORCE or RF pins is displayed in Table 8. Table 8. Nominal Forced Current/VVINP Relationship window comparator or routed to the IVMON pin.

voltage limiting functionality. is being made (see Window Comparator section). order to protect internal PMU circuitry from damage. measurement as shown in Table 10. Table 10. Comparator Output Truth Table

16 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Circuit Description (continued) Force Amp. REXT FORCE RF ~4.5K Ω Typ.VINP + On-Chip “Termination” Mode When the E42X7 is placed in FV mode and the internal PMU is not selected (SELIPMU = 0), it can be placed in “termination” mode by setting the HiZ input to logic “0”. When configured in this manner, the E42X7 can be used to provide an ~4.5KΩ “pull-up” or “pull-down” resistor at the FORCE pin to the termination voltage programmed by V VINP for testing devices with unipolar “open-element” outputs (i.e. open drain). External PMU The E42X7 features on-chip routing and switches for connecting an external PMU to the FORCE and SENSE pins of each channel. The EPMUF pin is the “External PMU Force” input and is connected to the FORCE pin through an on-chip 40 Ω , 40 mA switch. The EPMUS pin is the “External PMU Sense” input and is used to connect the external PMU ’s sense line to the E42X7’s SENSE pin through an on-chip high impedance switch. The on-chip switches used for routing the external PMU are located in a separate on-chip well that can be sepeartely powered from the core on-chip PMU circuitry using SVCC. This allows the voltage range of the external PMU to be greater than that of the core PMU without increasing core PMU power dissipation. NOTE: When using SVCC > VCC to extend the range of the external PMU, care must be taken to ensure that the RF pin voltage does NOT exceed VCC. This can be accomplished by setting SELIPMU=0 to disconnect the RF pin from FORCE, and will also disconnect the internal sense circuitry from the SENSE pin to protect it from over-voltage. The internal PMU should be disabled (HiZ=1) in order to prevent it from initiating pull-up mode. REXT Selection The E42X7 is designed for the full-scale voltage drop across REXT (RA, RB, RC, RD) to be ± 0.5V. Resistor values can be chosen that will enable the E42X7 to operate with full-scale current ranges other than those specified provided the voltage swing across REXT does not exceed ± 0.5V and the full-scale current for each range does not exceed those specified in this datasheet. Thermal Diode String The E42X7 features an internal diode string connected between the VC[0] and VC[1] pins that can be used to perform device junction temperature measurements as shown in the figure below. VC[0] VC[1] SELC = 0 Temperature Coefficient= –4.841mV/˚C 100 µA External Current Source Tj[˚C] = 0.00162 VC[1] – VC[0] 3(0.813 –

effect of this error can be significantly reduced. Figure 3. Graphical Representation of IVMON switches, and the “termination” mode switches. Power to these switches is provided by the SVCC supply. the FORCE pin voltage exceeds VCC.

1. VEE ≤ GND ≤ VDD ≤ VCC ≤ SVCC at all times
2. VEE ≤ All Analog Inputs ≤ VCC
3. GND ≤ All Digital Inputs ≤ VDD

ensure that power up requirements are not violated.

Figure 4. Power Supply Protection Scheme

19 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Required External Components Per PMU

Application Information

(470 pF , Optional) 12.4 kΩ 1.24 kΩ 124 Ω 12.4 Ω RB RC RD COMP1 COMP2 E4257, E4287 E4257, E4287 VCC VDD VDDVCC 0.1 µF 0.1 µF0.1 µF VEE RF VEE Actual decoupling capacitor values depend on the system environment.

20 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Application Information (continued) An application of the E42X7 is as a Per-Pin Parametric Measurement Unit (PPMU) in ATE as shown in the figure below. IVMON is connected to an external ADC to perform measurements for either MI or MV. Such measurements can also be used to calibrate the inputs to the comparator. Typically, IVMONs from multiple PMUs are connected to a single ADC where DISMON is used to select a PPMU. DUT Pin DCL

4287 PPMU

DISMON[0:1] FS A Device Under Test (DUT) may be connected to the PPMU either ‘locally” or ‘remotely’ to the pin electronics: Local Pin Electronics: Remote Pin Electronics (via Relays) DUT Pin REXT RF FS FORCE SENSE SYSTEM PMU PPMU Pin Electronics Inductors REXT RF FS FORCE SENSE GUARD PPMU SYSTEM PMU Pin Electronics DUT Pin Note: FORCE must be connected to RF in order to ensure voltage limiting functionality Per Pin PMU Connecting the PMU to a DUT Pin

21 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Application Information (continued) Use of Switches for Super Voltage (E4287 ONLY) An application of the E42X7 switches and switch matrices is to connect their PMU and an external PMU to a DUT pin and to switch a pin electronics driver ’s levels to a Super Voltage as shown below. In many applications, the external PMU’s range may need to exceed that of a pin’s PMU (a pin’s PMU range may be restricted in order to save power). For example, VEE = –5.0V, VCC = +8.25V, SVCC = +14.75V would permit a PMU range of –3.25V, +6.5V, super voltage of +12V, and an external PMU range of –4.75V, +14.5V (SELIPMU = 0). E4287 ONLY PIN'S DRIVER DUT PIN SELEPMU SELIPMU DVH DVHH DVL SELC PPMU IVMON ADC E4287 OUTPUT WAVEFORM: F S F S SYSTEM PMU DVH DVHH (Super Voltage) DVL 1000 pF 1000 pF NOTE: Switch impedance is shown for typical value

22 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com PIN Descriptions (with Internal Heat Spreader) 12˚ 12˚ A e 6˚ ± 4˚ A L A1 A2 θ b.17 MAX .25 –C– LEAD COMPLANARITY SEATING PLANE STANDOFF ddd M C A–B S D S ccc C .20 RAD. TYP . 20 RAD. TYP . .SMID. LOT AX AM5 3.2 A1 xaM52.0 A2 50.–/01.+0 0.2 D5 2.±0 0.61 D1 01.±0 0.41 E5 2.±0 0.61 E1 01.±0 0.41 L0 1.–/51.+8 8. eC ISAB5 6. b5 0.±0 3. θ ˚7–˚0 dddX AM2 1. cccX AM0 1. NOTES: 1) All dimensions in mm. 2) Dimensions shown are nominal with tol. as indicated. 3) L/F: EFTEC 64T copper or equivalent, 0.127 mm (.005”) or 0.15 mm (.006”) THICK. 4) Foot length “L” is measured at gage plane at 0.25 above the seating plane. D –A– E N –D– –B–

23 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com 64-Pad LPCC Package 9mm x 9mm D2/2 E2/2 N x K N x L (DATUM B) (DATUM A) e (ND–1) x e PIN 1 N N–1 DETAIL B b bbb M C A B D D/2 E A B E/2 aaa C2 x aaa C2 x INDEX AREA (D/2 x E/2) TOP VIEW BOTTOM VIEW

24 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com .feRN IMM ONX AM A0 8.00 9.00 0.1 A1 02 0.05 0.0 A3 .feR02.0 b8 1.05 2.00 3.0 D0 9.80 0.90 1.9 2D0 5.75 6.70 8.7 E0 9.80 0.90 1.9 2E0 5.75 6.70 8.7 e. CSB05.0 k0 2.0 –– x 2/b –– L5 3.00 4.05 4.0 N4 6 DN6 1 EN6 1 NOITISOPDNAMROFFOSECNARELOT aaa5 1.0 bbb0 1.0 ccc0 1.0 NOTES: 1) Dimensioning and tolerancing conform to ASME Y14.5M-1994. 2) All dimensions are in millimeters. Angles are in degrees. 3) N is the total number of terminals. 4) The terminal #1 identifier and terminal numbering convention shall conform to JESD 95-1 SPP-012. Details of terminal #1 identifier are optional, but must be located within the zone indicated. The terminal #1 identifier may be either a mold or marked feature. 5) Dimension b applies to metallized terminal and is measured between 0.25mm and 0.30mm from terminal tip. Dimension L1 is the terminal pull back from package E up to 0.1mm is acceptable. L1 is optional. 6) ND and NE refer to the number of terminals on each D and E side respectively. 7) Depopulation is possible in a symmetrical fashion. 8) Bilateral coplanarity zone applies to exposed heat slug (if any) as well as the terminals. L e e/2 TERMINAL TIP NOTE IS OPTIONAL (DATUM A OR B) C 0.08 C // ccc C SEATING PLANE A3A SIDE VIEW TERMINAL/SIDE Detail B

25 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Absolute Maximum Ratings Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those “recommended” in the operational sections of this specification is not implied. Exposure to conditions above those “recommended” for extended periods may affect device reliability. Recommended Operating Conditions Parameter Symbol Min Typ Max Units Positive Analog Power Supply (relative to GND) VCC 8 10 15 V Negative Analog Power Supply (relative to GND) VEE –5.25 –5 –4.75 V Total Analog Power Supply (S)VCC – VEE 12.75 15 20.25 V Positive Analog Switch Power Supply SVCC VCC 15 V Digital Power Supply (relative to GND) VDD 3.0 3.3 3.6 V Junction Temperature Tj 25 85 ˚C Thermal Resistance of Package (Junction to Case) θJC E4287 Junction to Top of Package 5 ˚C/W E4237, E4257 Junction to Top of Package 12.7 ˚C/W E4237 , E4257 Junction to Exposed Heat Slug 0.4 ˚C/W (Bottom, Center) Parameter Symbol Min Typ Max Units Positive Power Supply (relative to GND) VCC, SVCC 1 6 V Negative Power Supply (relative to GND) V E E –6.5 V Total Power Supply (S)VCC – VEE –0.5 22.5 V Digital Power Supply (relative to GND) VDD –0.5 4.5 V Digital Inputs DI –0.5 VDD + 0.5 V Analog Inputs AI VEE – .5 VCC + .5 V Upper/Lower Voltage Limit Input to FORCE Pin Difference |HLV, LLV – VFORCE| 01 7 V Storage Temperature T S –55 +125 ˚C Junction Temperature TJ –65 +125 ˚C Soldering Temperature TSOL 2 6 0 ˚C

26 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics Power Supplies 100 500 1000 Force Pin, FI/MV Mode Force Pin, FV/MI Mode IVMON Pin, FV/MI and FI/MV Modes PSRR [dB] Noise Frequency [kHz] Parameter Symbol Min Typ Max Units Total Chip Power Supply Consumption (Quiescent, No-Load) Positive Supply Current (VCC) ICC 10 25 mA Negative Supply Current (VEE) IEE –25 –10 mA Digital Supply Current (VDD) IDD 3.5 mA Positive Switch Supply Current (SVCC) SICC 1 mA Power Supply Rejection Ratio (see plot below for AC PSRR) FV/MI Mode FV/MI PSRR FORCE Pin (DC) 70 dB IVMON Pin (DC) 70 dB FI/MV Mode FI/MV PSRR FORCE Pin (DC) 70 dB IVMON Pin (DC) 70 dB

27 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Force Voltage DC Characteristics (continued) Parameter Symbol Min Typ Max Units Input Voltage Range @ VINP VVINP VEE + 1.75 VCC – 1.75 V Input Leakage Current IVINP –200 0 +200 nA Output Forcing Voltage RF Pin (±Full-Scale Current) VRF VEE + 2 VCC – 2V FORCE Pin (E4257, E4287) VFORCE Ranges A, B, C (±Full-Scale Current) VEE + 2 VCC – 2V Range D Sourcing Full-Scale Current VEE + 2 VCC – 4V Zero Current VEE + 2 VCC – 2V Sinking Full-Scale Current VEE + 4 VCC – 2V FORCE Pin (E4237) Range A (±Full-Scale Current) VEE + 2 VCC – 2V Range C Sourcing Full-Scale Current VEE + 2 VCC – 4V Zero Current VEE + 2 VCC – 2V Sinking Full-Scale Current VEE + 4 VCC – 2V Force Amplifier Short Circuit Current Limit I SC, ISK Range A ±0.5 ±1.6 mA Range B ±0.8 ±15 mA Range C ±9 ±45 mA Range D ±45 ±160 mA Voltage Accuracy Offset Vos –50 50 mV Gain FV Gain 0.985 1.015 V/V Linearity FV INL –0.01 +0.01 %FSVR Temperature Dependence (Note 1) Temperature Coefficient of Offset ∆ Vos/ ∆ T1 7 µV/˚C Temperature Coefficient of Gain ∆ FVGain/∆ T 1 ppm/ ˚C Capacitive Loading Range at FORCE CLOAD SELCOMP = 0 0 300 pF SELCOMP = 1, CCOMP = 470 pF 0 10 nF

28 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) Measure Current Parameter Symbol Min Typ Max Units Current Measurement Range IMEASURE Range A –40 40 µA Range B (E4257, E4287) –400 400 µA Range C –44 m A Range D (E4257, E4287) –40 40 mA Current Measurement Accuracy Measure Current Offset VOS –100 100 mV Gain (Note 5) MI Gain 3.91 4.15 V/V Linearity MI INL –0.05 0.05 % FSCR Common Mode Error (Note 2) CM Error –5.5 5.5 mV/V Common Mode Linearity ∆CM Error –.05 0.05 %FSCR Temperature Dependence (Note 1) Temperature Coefficient of Offset ∆ Vos/ ∆ T 60 ppm/ ˚C Temperature Coefficient of Gain ∆MI Gain/∆T Ranges A, B, C 30 ppm/ ˚C Range D 360 ppm/ ˚C

29 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) Force Current Parameter Symbol Min Typ Max Units Input Voltage Range @ VINP VVINP –2.5 2.5 V Input Leakage Current IIVIN –200 0 +200 nA Output Forcing Current IFORCE Range A –40 40 µA Range B (E4257, E4287) –400 400 µA Range C –44 m A Range D (E4257, E4287) –40 40 mA Compliance Voltage Range RF Pin (± Full-Scale Current) VRF VEE + 2 VCC – 2V FORCE Pin (E4257, E4287) VFORCE Ranges A, B, C (±Full-Scale Current) VEE + 2 VCC – 2V Range D Sourcing Full-Scale Current VEE + 2 VCC – 4V Zero Current VEE + 2 VCC – 2V Sinking Full-Scale Current VEE + 4 VCC – 2V FORCE Pin (E4237) VEE + 2 VCC – 2V Range A (±Full-Scale Current) Range C Sourcing Full-Scale Current VEE + 2 VCC – 4V Zero Current VEE + 2 VCC – 2V Sinking Full-Scale Current VEE + 4 VCC – 2V Current Accuracy Offset Ios –5 5 % FSR Gain (Note 4) FI Gain Ranges A, B, C 0.241 0.256 V/V Range D 0.234 0.256 V/V Linearity FI INL Range A –0.07 0.05 %FSCR Ranges B, C, D (Spec at ±0.05% FSCR) –0.05 0.05 %FSCR Common Mode Error CM Error –0.15 0.15 %FSCR/V Common Mode Linearity ∆CM Error –.05 0.05 %FSCR Temperature Dependence (Note 1) Temperature Coefficient of Offset ∆ Ios/∆ T 15 ppm/ ˚C Temperature Coefficient of Gain ∆FI Gain/∆T Ranges A, B, C 2 ppm/ ˚C Range D 20 ppm/ ˚C Capacitive Loading Range at FORCE CLOAD SELCOMP = 0 0 300 pF SELCOMP = 1, CCOMP = 470 pF 0 10 nF

30 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) Digital Inputs (FV/FI, MI/MV, RS0, RS1, SELIPMU, SELEPMU, SELC, SELCOMP , HiZ, DISMON) Measure Voltage Parameter Symbol Min Typ Max Units Input Low Level VIL 0.8 V Input High Level VIH 2.4 V Input Leakage Current IIN –200 +200 nA Parameter Symbol Min Typ Max Units Voltage Measurement Range VSENSE VEE + 2 VCC – 2V Voltage Measurement Accuracy Measure Voltage Offset Vos –50 50 mV Gain MV Gain .985 1.015 V/V Linearity MV INL –0.01 +0.01 %FSVR Temperature Dependence (Note 1) Temperature Coefficient of Offset ∆ Vos/ ∆ T1 0 µV/˚C Temperature Coefficient of Gain ∆ MV Gain/∆ T 1 ppm/ ˚C

31 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) Force & Sense Switches Parameter Symbol Min Typ Max Units Internal Force Switches On-Resistance RONRF _FORCE E4257, E4287 40 50 Ω E4237 400 500 External Force Switches Usable Input Voltage Range @ EPMUF VEPMUF VEE SVCC V Usable Input Current Range @ EPMUF IEPMUF –40 40 mA On-resistance RONEPMUF 40 50 Ω Leakage Current @ EPMUF 10 Switch Open (SELEPMU = 0) Ileak –10 10 nA Switch Closed (SELEPMU = 1) Ileak –10 nA Input Capacitance SELEPMU = 1) EPMUF 120 pF External Sense Switches Usable Input Voltage Range @ EPMUS VEPMUS VEE SVCC V Usable Input Current Range @ EPMUS IEPMUS –4 4 mA On-resistance RONEPMUS 1 1.8 k Ω Leakage Current Switch Open (SELEPMU = 0) Ileak –10 10 nA Switch Closed (SELEPMU = 1) Ileak –10 10 nA HiZ (Switches Open) Leakage Current (Note 3) Ileak @ FORCE = VEE + 2V to VCC – 2V –10 10 nA @ RF = VEE + 2V to VCC – 2V –10 10 nA @ SENSE = VEE + 2V to VCC –2V –10 10 nA FORCE Pin Capacitance (Note 3) CFORCE SELIPMU = SELEPMU = 0 (E4257, E4287) 0 35 110 pF SELIPMU = SELEPMU = 0 (E4237) 0 13 20 pF SELIPMU = 1, SELEPMU = 0 (E4257, E4287) 0 110 pF SELIPMU = 1, SELEPMU = 0 (E4237) 0 110 pF SENSE Pin Capacitance (Note 3) CSENSE 0 3 pF Internal Pull-Up Current Capability IRPU –66 m A Internal Pull-Up Resistance (Switch & Resistor) RPU 2.5 4.5 6 k Ω

32 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) Voltage Clamp Analog MUX (E4287 ONLY) IVMON Parameter Symbol Min Typ Max Units Usable Input Voltage Range (VA, VB, VC) Vin VEE SVCC V MUX ""Super Voltage"" Input Channel 0 to Channel

1 Difference

VVC[0] – VVC[1] –1.5 SVCC V Switch On-Resistance @ 500 µA RON_MUX 1300 2000 Ω On-Resistance Variability (Across full VEE to SVCC Range) ∆RON_MUX 500 Ω Leakage Current ILEAK –MUX 100 nA Parameter Symbol Min Typ Max Units Leakage (both IVMON switches open) ILEAK_IVMON –20 +20 nA IVMON Output Switch Impedance RIVMONSW 0.3 1.2 k Ω IVMON Output Current Capability IIVMON –44 m A IVMON Output Capacitance (both IVMON switches open) CIVMON 0 5 pF Parameter Symbol Min Typ Max Units Upper Voltage Limit Input Range HLV LLV + 1.0 VCC – 1.675 V Lower Voltage Limit Input Range (Note 6) LLV VEE + 1.675 VCC – 6V Upper/Lower Voltage Limit Input to FORCE |HLV, LLV – VFORCE| 0 16.5 V Pin Difference Upper/Lower Voltage Limit Input Current IHLV, ILLV –200 +200 nA Voltage Limiting Accuracy Upper Voltage Limit (HLV) VLIMIT+ HLV – 0.325 HLV + 0.325 V Lower Voltage Limit (LLV) VLIMIT – LLV – 0.325 LLV + 0.325 V Voltage clamp Current Limiting |ICLAMP| 42 150 mA FORCE Pin Short Circuit Protection Threshold Vprotect HLV HLV + 0.5 HLV + 2.5 V LLV LLV – 2.5 LLV – 0.5 V

33 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com DC Characteristics (continued) DUTNL, DUTNH Comparator DC Characteristic specifications are guaranteed over full Recommended Operating Condition ranges unless otherwise noted. Note 1: Temperature coefficients are valid over a 25 ˚C to 85˚C junction temperature range unless otherwise noted. Note 2: The mV/V units shown are derived as follows: ( ∆offset current * range resistance) / ∆output force voltage. Note 3: SELIPMU = SELEPMU = FV/FI = 0. Note 4: FI Gain = Note 5: MI Gain = Note 6: VCC – 6V is the maximum LLV voltage that will clamp full-scale current on Range D. LLV will clamp full-scale current for ranges A, B, and C all the way up to HLV – 1V. Test Head Remote Ground Driven Guard (E4287 ONLY) :snoitinifeDtinU egnaRegatloVelacS-lluF=RVSF :niPECROFt nerruCoreZ@)seilppusxam(V52.61=RVSF tnerruCelacS-lluF@)seilppusxam(V52.21=RVSF :niPFRe gnaRtnerruCeritnEssorcA)seilppusxam(V52.61=RVSF egnaRtnerruCelacS-lluF=RCSF :AegnaR :BegnaR :CegnaR :DegnaR Aµ08 Aµ008 Am8 Am08 Parameter Symbol Min Typ Max Units IVMAX Voltage Range IVMAX VEE + 1.75 VCC – 1.75 V IVMIN Voltage Range IVMIN VEE + 1.75 VCC – 1.75 V Comparator Offset (IVMIN, IVMAX) Vos –100 +100 mV Input Bias Current at IVMIN, IVMAX Ibias –200 +200 nA Parameter Symbol Min Typ Max Units Output Low Level (DUTNH (L)) @ |IOL| = 1.6 mA VOL 400 mV Output High Level (DUTNH (L)) @ | IOH| = 400 µA VOH 2.4 V Parameter Symbol Min Typ Max Units DUTGND Voltage Range (referenced to GND) DUTGND –250 250 mV DUTGND Leakage Current Ileak –200 +200 nA Parameter Symbol Min Typ Max Units GUARD - SENSE @ DUTGND = 0V, VSENSE = 5V VDIFF -100 100 mV (∆IFORCE x REXT) ∆VVINP ∆VIVMON (∆IFORCE x REXT)

34 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com AC Characteristics Force Voltage/Measure Current Parameter Symbol Min Typ Max Units Force Output Voltage Settling Time (Note 2) FVtsettle CFORCE/SENSE = 100 pF, SELCOMP = 0 To ±0.025% FSVR Range A 25 105 µs Range B (E4257, E4287) 25 95 µs Range C 25 85 µs Range D (E4257, E4287) 15 75 µs To ±0.1% FSVR Range A 17 95 µs Range B (E4257, E4287) 17 85 µs Range C 17 75 µs Range D (E4257, E4287) 10 65 µs CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF To ±0.025% FSVR Range A 115 200 µs Range B (E4257, E4287) 35 120 µs Range C 30 110 µs Range D (E4257, E4287) 30 100 µs To ±0.1% FSVR Range A 75 130 µs Range B (E4257, E4287) 25 110 µs Range C 20 100 µs Range D (E4257, E4287) 20 90 µs Measure Current Settling Time (Note 4) MItsettle CFORCE/SENSE = 100 pF, SELCOMP = 0 To ±0.05% FSCR Range A 105 550 µs Range B (E4257, E4287) 40 195 µs Range C 30 150 µs Range D (E4257, E4287) 40 100 µs To ±0.1% FSCR Range A 75 200 µs Range B (E4257, E4287) 35 125 µs Range C 25 100 µs Range D (E4257, E4287) 30 75 µs CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF To ±0.05% FSCR Range A 230 420 µs Range B (E4257, E4287) 50 200 µs Range C 40 175 µs Range D (E4257, E4287) 45 150 µs To ±0.1% FSCR Range A 200 270 µs Range B (E4257, E4287) 40 150 µs Range C 30 125 µs Range D (E4257, E4287) 40 100 µs

35 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com Force Voltage/Measure Current (continued) AC Characteristics (continued) Parameter Symbol Min Typ Max Units Force Amplifier Slew Rate SR 0.9 1 V/ µs I/V Monitor (Note 3) DISABLE True to VMON Disable Time tz 750 ns DISABLE False to IVMON Enable Time toe 1.5 µs Slew Rate ∆ V/∆ t 5 6.7 V/ µs Voltage Clamp Activation Time (Note 5) tA 6 µs Recovery Time (Note 5) tR 6 µs Overshoot Vovershoot 0.5 V Force Amp HiZ True to FORCE Disable Time (Note 3) tz 10 µs HiZ False to FORCE Enable Time (Note 3) toe 45 µs

36 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com AC Characteristics (continued) Force Current/Measure Voltage Parameter Symbol Min Typ Max Units Force Output Current Settling Time (Note 2) FItsettle CFORCE/SENSE = 100 pF, SELCOMP = 0 To ±0.05% FSCR Range A 320 575 µs Range B (E4257, E4287) 45 185 µs Range C 30 135 µs Range D (E4257, E4287) 30 85 µs To ±0.1% FSCR Range A 270 450 µs Range B (E4257, E4287) 35 175 µs Range C 25 125 µs Range D (E4257, E4287) 20 75 µs CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF To ±0.05% FSCR Range A 540 700 µs Range B (E4257, E4287) 70 250 µs Range C 30 200 µs Range D (E4257, E4287) 40 150 µs To ±0.1% FSCR Range A 490 650 µs Range B (E4257, E4287) 60 200 µs Range C 25 150 µs Range D (E4257, E4287) 30 95 µs Measure Voltage Settling Time (Note 4) MVtsettle CFORCE/SENSE = 100 pF, SELCOMP = 0 To ±0.025% FSVR Range A 270 425 µs Range B (E4257, E4287) 40 175 µs Range C 22 70 µs Range D (E4257, E4287) 20 60 µs To ±0.1% FSVR Range A 205 350 µs Range B (E4257, E4287) 25 100 µs Range C 15 60 µs Range D (E4257, E4287) 10 50 µs CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF To ±0.025% FSVR Range A 490 620 µs Range B (E4257, E4287) 60 195 µs Range C 25 80 µs Range D (E4257, E4287) 30 70 µs To ±0.1% FSVR Range A 400 510 µs Range B (E4257, E4287) 45 175 µs Range C 15 70 µs Range D (E4257, E4287) 20 60 µs

37 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com AC Characteristics (continued) Comparator Force Current/Measure Voltage (continued) Parameter Symbol Min Typ Max Units Force Amplifier Slew Rate SR 0.9 1 V/ µs I/V Monitor (Note 3) DISABLE True to VMON Disable Time tz 750 ns DISABLE False to IVMON Enable Time toe 1.5 µs Slew Rate ∆ V/∆ t 5 6.7 V/ µs Voltage Clamp Activation Time (Note 5) tA 6 µs Recovery Time (Note 5) tR 6 µs Overshoot Vovershoot 0.5 V Force Amp HiZ True to FORCE Disable Time (Note 3) tz 10 µs HiZ False to FORCE Enable Time (Note 3) toe 45 µs Parameter Symbol Min Typ Max Units Propagation Delay (Note 6) tpd(+), (-) >3V Swing Minimum Pulse Width 2 µs (3V swing, IVMAX/IVMIN set to 50%) Maximum Toggle Rate 166 kHz

38 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com AC Characteristics (continued) :snoitinifeDtinU egnaRegatloVelacS-lluF=RVSF :niPECROFt nerruCoreZ@)seilppusxam(V52.61=RVSF tnerruCelacS-lluF@)seilppusxam(V52.21=RVSF :niPFRe gnaRtnerruCeritnEssorcA)seilppusxam(V52.61=RVSF egnaRtnerruCelacS-lluF=RCSF :AegnaR :BegnaR :CegnaR :DegnaR Aµ08 Aµ008 Am8 Am08 100% 100% 1.5V1.5V 0.8V 10% 10% tpd1 tpd2 Output Input Note 1: Settling times are not production tested. Guaranteed by characterization. Note 2: Measured from full-scale step at VINP to FORCE output. Note 3: Test Conditions: 1. 15 pF load on output 2. input signal has 5 ns rise/fall time 3. tpd is defined as the difference between the time when the input crosses 1.5V to when the output changes 10% (of the total change) from the initial voltage level. (see timing diagram below). Note 4: Measured from full-scale step at VINP to IVMON output. Note 5: Clamp activation/recovery time indicates the delay between when the clamps are actually engaged or disengaged and when clamping is indicated with the comparator outputs. Note 6: Comparator Propagation Delay Measurements. HiZ=1, MI/MV*=0, SELIPMU=1, input signal applied to FORCE/SENSE. 100% 50% DUTNH DUTNL IVMIN, IVMAX SR = 1V/µs Tpd(+) Tpd( –) VFORCE/SENSE

39 2005 Semtech Corp. / Rev. 5, 11/30/05 TEST AND MEASUREMENT PRODUCTS E4237/E4257/E4287 www.semtech.com

Ordering Information

Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 rebmuNledoMe gakcaP TFHA7824EP FQM_PET_tnI,niP08,mm0.2x41x41 )redaerpStaeHlanretnIhtiw( TFHA7824MVEe ludoMnoitaulavE7824egdE rebmuNledoMe gakcaP TPLA7324EC CPL,daP-46,mm9xmm9 T-TPLA7324E) leeR&epaT(CCPL,daP-46mm9xmm9 TPLA7324MVEe ludoMnoitaulavE7324egdE rebmuNledoMe gakcaP TPLA7524EC CPL,daP-46,mm9xmm9 T-TPLA7524E) leeR&epaT(CCPL,daP-46mm9xmm9 TPLA7524MVEe ludoMnoitaulavE7524egdE Pb This product is lead-free.