E521.02 ELMOS | Alldatasheet

Document overview

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Technical content

Features

  • High efficiency 5V DC/DC buck converter
  • Optional DC/DC boost converter
  • Wakeable HS-CAN transceiver (ISO11898-2 and -5)
  • Up to four LIN transceiver LIN 2.1, SAE-J2602 conformance
  • Operating range 2.5V up to 28V
  • Typ. 45µA sleep current consumption
  • Typ. 85µA standby current consumption with active DC/DC buck converter
  • Configurable µC watchdog (cycle time and type)
  • BUS pins ESD-protected 8kV according to IEC-61000-4-2
  • Package QFN44L7 with Booster Without Booster No. of LINs E521.12 E521.02 2 E521.13 E521.03 3 E521.14 E521.04 4

Applications

  • Body control units, gateways General Description The CAN/LIN SBC family with DC/DC voltage reg- ulator provides beside the CAN and LIN tran- ceivers the main µC power supply with a high effi- ciency DC/DC converter. An additional linear regu- lator can be used independently as peripheral sup- ply. All supplies are monitored and can signalize a fail event by SPI interface. The main DC/DC sup- ply monitor can generate a µC reset. System fail- ure can activate a fail-safe output signal for limp home support. The CAN/LIN SBC family provides SLEEP, STOP, ACTIVE and FAILSAFE states. The device is capable of detecting local and remote wake-up events which can be individually enabled via SPI. Typical Applications Circuit ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Functional Diagram ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1 Wake GND RSTN VDD1SENSE LXT WK RXDLIN1 TXDLIN1 CLK SDI SDO CSN INTN VDD2 GNDLIN LIN1 CANL CANH RXDCAN TXDCAN PGND Voltage Regulator VDDCAN FSON LIN Transceiver HS-CAN Transceiver RXDLINx TXDLINx LINx SWDM Reset generation VS VS VS Optional blocks LIN_ENx LIN Transceiver Fail safe lowside CONTROL MDRV ISEN PGND2 EN_BUK WULINx WUCAN EN_V2 EN_BST DC/DC Boost converter VS CAN_EN Watch dog VS ENVDD2 DC/DC Buck converter VIN VDD1 VDD1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Pin Configuration Note: Top view, not to scale Pin Description Pin Name Type Description

1 FSON O Fail safe output, open drain stage, low activ e

2 RSTN IO Reset output, low active, pull up

3 INTN IO

Interrupt output, low active, pull up Setup for bit SBC.CFG

4 TXDLIN4 I

LIN4 transmit data, pull up, optional E521.04/.14, only all other versions are not connected

5 RXDLIN4 O

E521.04/.14 only, all other versions are not connected

6 VDD1 S Voltage Supply 1

7 GND S Ground

8 TXDLIN3 I

LIN3 transmit data, pull up, optional E521.03/.04/.13/.14 only, all other versions are not connected ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1 ELA-0158 FSON RXDLIN1 TXDLIN1 LIN2 LIN1 LIN4 LIN3 SDI SDO SCK RXDCAN CSN MDRV VDD2 PGND2 ISEN VS WK n.c. LXT n.c. RSTN INTN TXDLIN4 RXDLIN4 VDD1 GND TXDLIN3 RXDLIN3 TXDLIN2 RXDLIN2 PGND VDD1SENSE CANL CANH VDDCAN GND VDD1 SWDM ENVDD2 TXDCAN VIN VIN GNDLIN

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Pin Name Type Description

9 RXDLIN3 O

E521.03/.04/.13/.14 only, all other versions are not connected

10 TXDLIN2 I LIN2 transmit data, pull up

11 RXDLIN2 O LIN2 receive data

12 TXDLIN1 I LIN1 transmit data, pull up

13 RXDLIN1 O LIN1 receive data

14 LIN1 IO LIN1 bus line

15 LIN2 IO LIN2 bus line

16 GND S LIN ground

17 LIN3 IO

LIN3 bus line, E521.03/.04/.13/.14 only, all other versions are not connected

18 LIN4 IO

LIN4 bus line, E521.04/.14 only, all other versions are not connected

19 CSN I SPI chip select, low active, pull up

20 SDI I SPI serial data input

21 SCK I SPI clock, pull down

22 SDO O SPI serial data output

23 RXDCAN O CAN receive data

24 TXDCAN I CAN transmit data, pull up

25 ENVDD2 I Enables VDD2

26 SWDM I

Must be connected to GND in application Enables software development function, pull down

27 GND S Ground

28 VDD1 S Voltage Supply 1

29 CANL IO CANL bus Line

30 CANH IO CANH bus Line

31 VDDCAN S HS-CAN supply

32 VDD1SENSE

VDD1 Sense Back to DCDC Buck Converter

33 PGND S DCDC Buck Converter Power Ground

34 LXT IO

Integrated Highside Switch Output ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Pin Name Type Description 35 n.c. Not connected

36 VIN S DCDC Supply

37 VIN S DCDC Supply

38 n.c. Not connected, leave open

39 VS S Battery supply voltage

40 WK I Local wake up input, pull up or pull down

41 PGND2 S

Power ground 2 (Boost Converter), E521.12/.13/.14 only, all other versions are not connected

42 ISEN I

Sense Input (Boost Converter), E521.12/.13/.14 only, all other versions are not connected

43 MDRV O

Main Gate Driver Output (Boost Converter), E521.12/.13/.14 only, all other versions are not connected

44 VDD2 S Peripheral voltage supply

  • EP S Exposed Pad. Connect to large copper ground plane for optimal heat dissipa- tion. Connect to GNDA and GNDD. Note: S = Supply, I/O = Input/Output ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

1 Absolute Maximum Ratings

Stresses beyond these absolute maximum ratings listed below may cause permanent damage to the device. These are stress ratings only; operation of the device at these or any other conditions beyond those listed in the operational sections of this document is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. All voltages with respect to ground. Currents flowing into terminals are positive, those drawn out of a terminal are negative. Description Condition Symbol Min Max Unit Voltage at VS 1) , 2) continuous V VS -0.3 40 V Voltage at VIN 1) , 2) continuous V VS -0.3 40 V Voltage at WK, FSON, ENVDD continuous V WK -0.3 40 V Voltage at LIN1..4, CANL, CANL continuous V CANL -27 40 V Voltage at LXT continuous V LXT -2 V VIN + 0.3 V Voltage at VDDCAN continuous V VDDCAN -0.3 5.5 V Voltage at SWDM continuous V SWDM -0.3 5.5 V Voltage at digital pins TXDLIN1..4, RXDLIN1..4, TXDCAN, RXDCAN continuous V TXDLIN -0.3 V VDD1 +0.3 V Voltage at VDD1 continuous V VDD1 -0.3 5.5 V Voltage at VDD2 continuous V VDD2 -5 40 V Current at WK continuous I WK -15 1 mA Current of VDD1 continuous I VDD1 -500 mA Current of VDD2, internally limited continuous I VDD2 -200 1 mA Current at ENVDD2 continuous I ENVDD2 -15 1 mA Maximum load at RXDCAN CRXDCAN,LOAD 10 pF Junction temperature continuous T JUNC -40 150 ° C Storage temperature continuous T STG -55 125 ° C 1) The device is implicitly protected against load dump 2) The device is implicitly protected against jump start ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

2 ESD Protection

Description Condition Symbol Min Max Unit ESD HBM protection pins VDD2, LINx, WK, CANH and CANL 1) VESD(HBM) -8 +8 kV ESD HBM protection all other pins 1) VESD(HBM) -2 +2 kV ESD system level protection pins VDD2, LINx, WK, CANH and CANL to ground VESD(IEC) -6 +6 kV ESD CDM Protection at all Pins VESD(CDM) -500 +500 V ESD CDM Protection at Edge Pins VESD(CDM)C -750 +750 V 1) Ω According to AEC-Q100-002 (HBM) chip level test, C=100pF, R=1.5k 2) Ω According to AEC-Q100-011 (CDM) chip level test, R=1 2) Ω Similar to IEC61000-4-2, C=150pF, R=330

3 Recommended Operating Conditions

Description Condition Symbol Min Typ Max Unit Functional range E521.02..04 V VS,FUNC 5.5 - 28 V Functional range E521.12..14 V VS,FUNC 2.5 - 28 V Limited functional range VS,FL,HR 28 - 40 V Ambient temperature TAMB -40 - 125 ° C ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4 Electrical Characteristics

(V VS = 5.5V to 28V, T AMB = -40° C to +125° C, unless otherwise noted. Typical values are at V VS = 12.0V and T AMB = +25° C. Positive currents flow into the device pins.)

4.1 Power Supply and References; pins VS, GND

No. Description Condition Symbol Min Typ Max Unit

1 Current consumption in SBC

mode SLEEP 1) SBC mode SLEEP, V S = V LIN = V WK = 13.5V, I VDD1 = 0mA, IVDD2 = 0mA, T J<40° C, Booster is off All wake up sources enabled I VS,SLEEP 45 110 µA 1a Current consumption in SBC mode SLEEP 1) SBC mode SLEEP, V S = V LIN = V WK = 13.5V, I VDD1 = 0mA, IVDD2 = 0mA, T J>40° C, Booster is off All wake up sources enabled I VS,SLEEP,40 65 150 µA

2 Current share for CAN wake up

capability in SBC mode SLEEP VS = 13.5V Not production tested IVS,CAN,SLEEP 5 10 µA

3 Current share for LIN wake up

capability in SBC mode SLEEP VS = 13.5V Not production tested IVS,LIN,SLEEP 2 5 µA Table 1: DC Characteristics SLEEP 1) not production tested ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit

1 Current consumption in SBC mode

SBC mode STOP, V VS = V LIN = V WK = 13.5V, I VDD1 = 0mA, CAN off, LIN off, VDD2 off, All wake up sources enabled, T J>40° IVS,STB,T<=125° C 100 170 µA 1a Current consumption in SBC mode STOP without booster SBC mode STOP, V VS = V LIN = V WK = 13.5V, I VDD1 = 0mA, CAN off, LIN off, VDD2 off, All wake up sources enabled, T J<40° IVS,STB,T<=40° C 85 140 µA

2 Additional current if VDD2 has

VVS = 13.5V, I VDD2 = -40mA IVS,VDD2 0.1*I VDD2 mA

3 Current consumption of VDD2

voltage regulator in case of low load of 0.2mA VVS = 13.5V, IVDD2 = -0.2mA IVS,VDD2,0.2mA 1 mA

4 Additional current in SBC mode

STOP if cyclic wake up enabled 1) STOP Mode, V VS = V LIN = V WK = 13.5V, Cyclic wake up enabled I VS,STB,CYCLIC 10 μA Table 2: DC Characteristics STOP No. Description Condition Symbol Min Typ Max Unit

1 NORMAL mode current

IVS,NOM 150 400 μA

2 Current consumption in active

VS,LIN,ACT,DOM 1.5 3 mA

3 Current consumption in active

LIN recessive I VS,LIN,ACT,REC 0.25 0.5 mA

4 Current consumption in active

CAN recessive I VDDCAN,CAN,ACT,REC 1 3 mA

5 Current consumption in active

VDDCAN,CAN,ACT,DOM 40 105 mA Table 3: DC Characteristics NORMAL 1) not production tested ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit

1 Power on threshold according to

VVS,PU 4 5 V

2 Power down threshold according

VVS,PD 2.0 2.5 V Table 4: DC Characteristics POR

4.1.1 Internal Time Base

No. Description Condition Symbol Min Typ Max Unit

1 Internal time base, started auto-

matically on demand. Most times specified are derived from this internal time base directly or by using prescalers. t OSC 0.875 1.125 μs Table 5: AC Characteristics

4.2 SBC Operating Modes

No. Description Condition Symbol Min Typ Max Unit 1 time out in SBC states INIT and RESTART tTO,INIT 230 256 290 ms 2 time out in SBC states INIT and RESTART for VDD1 start up VS rises above V ON- OFF,VS in before and not fallen below V ON-OFF_f,VS tTO,VDD1 1.4 1.5 1.8 s 3 duration for changes between SBC states detection of vaild state change condi- tion t MODE_CHANGE 8 µs

4 VS voltage threshold to be

exceeded in order to start timeout t TO,VDD1 1) VON-OFF,VS 6.3 6.6 6.9 V

5 VS voltage threshold to be under-

flow in order to deactivate timeout t TO,VDD1 1) VON-OFF_f,VS 5.75 6.05 6.35 V Table 6: AC Characteristics 1) Hysteresis is designed to 550mV, Not production tested ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 VDD1 current observation in STOP mode No. Description Condition Symbol Min Typ Max Unit

1 Timeout for whole system to enter

STOP mode and therefore to decrease current consumption SPI command for STOP mode sent t TRAN_STOP 2.3 2.6 3.2 ms

2 Threshold for VDD1 observation,

5V system. Upper limit ensures a safe voltage difference to VDD1 of 50mV using production test data for each particular IC. SBC mode STOP k1 VDD1,5V 4.625 V VDD1 - 50mV V

3 Minimum time VDD1 needs to stay

After this time DCDC is switched on for tON_REG,STOP in order to recharge VDD1 VDD1_CFG[7:6]= 0 4.7 6.4 ms

4 Minimum time VDD1 needs to stay

After this time DCDC is switched on for t ON_REG,STOP P in order to recharge VDD1 VDD1_CFG[7:6]= (default) 1 9.7 12.4 ms

5 Minimum time VDD1 needs to stay

After this time DCDC is switched on for tON_REG,STOP in order to recharge VDD1 VDD1_CFG[7:6]= 2 19.5 24.5 ms

6 Minimum time VDD1 needs to stay

After this time DCDC is switched on for tON_REG,STOP in order to recharge VDD1 VDD1_CFG[7:6]= 3 39.5 48.6 ms

7 On time of DCDC during regular

STOP mode t ON_REG,STOP 110 160 μs

8 Internal delay of DCDC after

tDEL,ON - 10 25 μs Table 7: Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.2.1 Configuration for transition behaviour to states FAILSAFE or RESTART

No. Description Condition Symbol Min Typ Max Unit

1 Pull down resistance active during

SBC_CFG.CFG SBC state INIT R INTN,SBC_CFG.CFG,PD 80 105 150 Ωk

2 Voltage level for detecting logic

SBC state INIT V INTN,SBC_CFG,L 0.7 V

3 Voltage level for detecting logic

SBC state INIT V INTN,SBC_CFG,H 2.6 V Table 8: DC Characteristics Software Development function; pin SWDM No. Description Condition Symbol Min Typ Max Unit

1 Voltage to be applied to pin

SWDM in order to enable software development function V ENABLE,SWDM 0.7 VDD1

2 Pull down resistance RPD,SWDM 80 120 200 Ωk

Table 9: DC Characteristics Over temperature behaviour No. Description Condition Symbol Min Typ Max Unit

1 CAN over temperature detected CAN enabled T

OT,CAN 150 ° C 2 LIN over temperature detected. Each LIN has its own sensor. LIN enabled T OT,LIN 150 ° C

3 VDD1 over temperature detected 1) VDD1 enabled T OT,VDD1 150 165 ° C

4 VDD1 over temperature detection

hysteresis 1) VDD1 enabled T OT,VDD1,HYST 40 ° C

5 VDD2 over temperature warning

VDD2 enabled T OT,VDD2,WARN 120 ° C

6 Temperature difference between

failure and warning threshold VDD2 enabled T OT,VDD2,FAIL to WARN 10 ° C

7 VDD2 over temperature detected VDD2 enabled T OT,VDD2,FAIL 140 180 ° C

8 Over temperature for aux. internal structures detected System in state NORMAL T OT,INT 140 ° C

9 Over temperature detection hys-

teresis, valid for all sensors except otherwise stated Temperature sensor enabled T OT,HYST 20 ° C Table 10: OT Characteristics 1) Not production tested ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 SPI communication; pins SCK, SDI, SDO, CSN No. Description Condition Symbol Min Typ Max Unit 1 High level input voltage VCSN,INH 0.7 VDD1 2 Low level input voltage VCSN,INL 0.3 VDD1

3 High level input current V CSN = V VDD1 ICSN,LEAK -1 0 1 μA

4 Pull up resistor V CSN = 0V R CSN,PU 120 Ωk

5 High level input voltage VSCK,INH 0.7 VDD1 6 Low level input voltage VSCK,INL 0.3 VDD1

7 Pull down resistor V SCK = V VDD1 RSCK,PD 120 Ωk

8 High level input voltage VSDI,INH 0.7 VDD1 9 Low level input voltage VSDI,INL 0.3 VDD1 10 Low level output voltage I SDO = 1mA V SDO,OUTL 0.4 V

11 High level output voltage I SDO = -1mA V SDO,OUTH VVDD1 -

0.4 V Table 11: DC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit

1 Serial clock cycle (1) SCK t SCYC 125 ns

2 SCK "H" pulse width (1) SCK t SHW 50 ns

3 SCK "L" pulse width (1) SCK t SLW 50 ns

4 data setup time (WR) (1) SDI t SDS 50 ns 5 data hold time (1) SDI t SDH 50 ns 6 access time (1) SDO t ACC 50 ns 7 output enable time (1) SDO t OE 50 ns 8 output disable time (1) SDO t OD 50 ns

9 SCK-CSN (1) CSN t SCC 50 ns

10 CSN "H" pulse (1)

Minimum time between two con- secutive SPI accesses CSN t CHW 5 us

11 CSN-SCK time (1) CSN t CSS 125 ns

12 output disable time (1) CSN t CSH 120 ns Table 12: AC Characteristics (1) not production tested

4.3 Watchdog; pin RSTN

No. Description Condition Symbol Min Typ Max Unit

1 Minimum watchdog time base

important for safe trigger area tWD,PER,MIN 0.85 t WD,PER

2 Maximum watchdog time base

important for safe trigger area tWD,PER,MAX 1.15 t WD,PER

3 First open window open window after

tWD,FOW 230 290 ms

4 Watchdog reset time tWD,RSTN 450 650 μs

Table 13: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.3.1 External Reset / Reset clamping

No. Description Condition Symbol Min Typ Max Unit 1 output low level I RSTN = 1mA VVDD1 > 3V VRSTN,OUTL 0.4 V 2 internal pull up resistor V RSTN = 0V R RSTN,PU 22 32 42 Ωk

3 Voltage level for detecting low at

VRSTN,INL 0.7 V

4 Voltage level for detecting high at

VRSTN,INH 2.6 V Table 14: DC Characteristics No. Description Condition Symbol Min Typ Max Unit 1 debounce time for external applied reset tRSTN,DEB 4 ms 2 time out for short detection to VDD1 tRSTN,TO,VDD 16 ms 3 time out for short detection to GND , can only be detected after tWD,RSTN or t VDD1,RSTN tWDRSTN,TO,GND 16 ms Table 15: AC Characteristics

4.4 Local wake up; pin WK

No. Description Condition Symbol Min Typ Max Unit

1 Threshold of local wake up, V WK

VWK rising V WK,TH,LH 0.6 0.8 VS

2 Threshold of local wake up, V WK

VWK falling V WK,TH,HL 0.5 0.7 VS

3 Pull up current V WK > V WK,TH,LH_max

VS - V WK > 1V IWK,PU -100 -10 µA

4 Pull down current V WK < V WK,TH,HL_min

VWK > 1V IWK_PD 10 100 µA

5 Leakage current VS = 12V,

VWK = 0V or VWK = V VS IWK_LEAK -2 +2 µA Table 16: DC Characteristics No. Description Condition Symbol Min Typ Max Unit

1 Local wake up debounce time Threshold crossing

tWK,DEB 20 30 µs Table 17: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.5 LIN Transceiver; pins LIN1 to LIN4, TXDLIN1 to TXDLIN4, RXDLIN1 to RXDLIN4, GND-

4.5.1 Characteristics

No. Description Condition Symbol Min Typ Max Unit 1 functional range LIN transceiver V LIN,VS 7 - 18 V 2 recessive output voltage TXDLINx = 1 VLIN,REC VVS -1V - V VS - 3 dominant output voltage TXD = 0, V VS = 7.0V, R LIN Ω = 0.5k to V VS VLIN,DOM - - 1.2 V 4 dominant output voltage TXDLINx = 0, V VS = 18V, R LIN Ω = 0.5k to VVS VLIN,DOM1 - - 2.0 V 5 receiver dominant level VLIN,THDOM - - 0.4 VS 6 receiver recessive level VLIN,THREC 0.6 - - VS

7 LIN bus center voltage V LINx,BUSCNT =

(V LINx,THDOM + VLINx,THREC ) / 2 VLIN,BUSCNT 0.475 - 0.525 VS 8 receiver hysteresis V LINx,THREC - V LIN,THDOM VLIN,HYS 0.02 - 0.175 VS 9 output current limitation V LINx = V VS,MAX = 18V I LIN,LIM 40 - 200 mA 10 pull up resistance RLIN,SLAVE 20 33 60 Ωk 11 leakage current flowing into pin LIN transmitter passive, 7V < V VS < 18V, 7V < V LINx < 18V, V LINx > V VS ILIN,BUSREC - - 20 μA 12 pull up current flowing out of pin LIN transmitter passive, 7V < V VS < 18V, VLINx = 0V ILIN,BUSDOM -1 - - mA 13 leakage current, ground discon- nected ( GND device = VS ) VVS = 13.5V, 0V < V LINx < 18V ILIN,NOGND -1 - 0.1 mA 14 leakage current, supply disconnec- ted VVS = 0V, 0V < V LINx < 18V ILIN - - 20 μA 15 leakage current, supply disconnec- ted, T J = 85° C, not production tested VVS = 0V, 0V < V LINx < 18V ILIN,85 - - 15 μA 16 clamping voltage, not production tested VVS = 0V, I LINx = 1mA VLIN,CLAMP 40 - V Table 18: DC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit 1 input capacitance, not production tested! 7V < V VS < 18V C LIN,PIN - - 30 pF 2a receive propagation delay t RXD,PDR ,t RXD,PDF - - 6 μs 2b receive propagation delay in FLASH mode 1) tRXD,PDR,FLASH , tRXD,PDF,FLASH - - 2.5 µs 3 receive propagation delay sym- metry tRXD,SYM -2 - 2 μs 4 wake up debounce time tLIN,WU 70 150 µs

5 Duty cycle 1 1) VLIN,THREC (max) =

0.744*V VS , VLIN,THDOM (max) = 0.581*V VS , V VS = 7- 18V, t BIT = 50us, DLIN,1 = t BUSREC (min)/ (2*t BIT ) DLIN,1 0.396 - - -

6 Duty cycle 2 1) VLIN,THREC (min) =

0.422*V VS , VLIN,THDOM (min) = 0.284*V VS , V VS = 7- 18V, t BIT = 50us, DLIN,2 = t BUS- REC (max)/(2*t BIT ) DLIN,2 - - 0.581 -

7 Duty cycle 3 1) V,LIN,THREC (max) =

0.778*V VS , VLIN,THDOM (max) = 0.616*V VS , V VS = 7- 18V, t BIT = 96us, DLIN,3 = t BUSREC (min)/ (2*t BIT ) DLIN,3 0.417 - - -

8 Duty cycle 4 1) VLIN,THREC (min) =

0.389*V VS , VLIN,THDOM (min) = 0.251*V VS , V VS = 7- 18V, t BIT = 96us, DLIN,4 = t BUS- REC (max)/(2*t BIT ) DLIN,4 - - 0.590 - 9 receive data baud rate 2) flash mode, V VS = 13V BLIN,RXD 250 kBd/s 10 transmit data baud rate 2) flash mode,C LIN = 200PF, R LIN = 0.5k Ω VVS = 13V BLIN,TXD 125 kBd/s Table 19: AC Characteristics 1) Bus load conditions (C LIN ,R LIN Ω Ω Ω ): 1nF, 1k or 6.8nF, 660 or 10nF, 500 2) Not production tested ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.5.2 LIN TXD/RXD

No. Description Condition Symbol Min Typ Max Unit 1 output low level range I RXD,LINx = 1mA V RXD,LINx,OUTL - - 0.4 V 2 output high level range I RXD,LINx = -1mA V RXD,LINx,OUTH VVDD1 - 0.4 - - V 3 input low voltage range VTXD,LINx,INL - - 0.3 VDD1 4 input high voltage range VTXD,LINx,INH 0.7 - - VDD1

5 Internal TXD pull up resistor V TXD,LINx = 0V R TXD,LINx,PU 80 110 150 Ωk

Table 20: DC Characteristics

4.5.3 LIN Failure detection and recovery

No. Description Condition Symbol Min Typ Max Unit 1 time out for txd dominant clamping failure t LIN,TXD,DOM 8.5 12.5 ms 2 time out for LIN dominant clamp- ing failure tLIN,BUS,DOM 8.5 12.5 ms Table 21: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 HS-CAN Transceiver; pins CANH, CANL, RXDCAN, TXDCAN, VDDCAN (V VS = 5.5V to 28V, T AMB = -40° C to +125° C, V CAN =-12V to +12V unless otherwise noted. Typical values are at V VS = 12.0V and T AMB = +25° C. Positive currents flow into the device pins.) No. Description Condition Symbol Min Typ Max Unit

1 CANH dominant output voltage VTXDCAN = 0V

RL Ω Ω = 50 to 65 VDOM_OUT_H 3.0 4.5 V

2 CANL dominant output voltage VTXDCAN = 0V

RL Ω Ω = 50 to 65 VDOM_OUT_L 0.5 2.0 V

3 Matching of dominant output

voltages (V VDDCAN - (V CANH + V CANL )) VTXDCAN = 0V RL Ω Ω = 50 to 65 VDOM_OUT_MATCH -400 400 mV

4 Differential bus dominant output

voltages (V CANH -V CANL ) VTXDCAN = 0V RL Ω Ω = 50 to 65 VDIFF_OUT_DOM 1.5 3.0 V

5 Recessive output voltage on

VTXDCAN = V VDD1 CAN NORMAL and LISTEN mode V REC_OUT 2.0 V VDDCAN / 3.0 V

6 Differential receiver threshold

V DIFF_TH 500 700 900 mV

7 Differential receiver threshold

voltage, CAN off and wake up detection capability enabled CAN off, wakeable V DIFF_TH_OFF 400 1150 mV

8 Differential receiver hysteresis

V DIFF_HYST 60 mV

9 Differential bus recessive output

voltages (V CANH - V CANL ) CAN recessive, no load V REC_OUT_OFF -100 50 mV 9a Recessive output voltage at CANH and CANL, low power mode CAN recessive, no load V REC,LP -100 100 mV

10 Short circuit output current on

VTXDCAN = 0V VCANL = 40V ISC_OUT_CANL 40 100 mA

11 Short circuit output current on

VTXDCAN = 0V VCANH = -5V ISC_OUT_CANH -100 -40 mA

12 Recessive bus current V TXDCAN = V VDD1

-27V < V CANH/L < 32V IREC_OUT -5 5 mA

13 Input leakage current on CANL

ΩGND with R = 0 Ωand R = 47k V CANH = V CANL = 5V ILEAK_IN -10 10 μA

14 Common mode input resistance R I_COM 15 35 Ωk

15 Differential input resistance R I_DIF 30 70 Ωk

15a Common mode input capacitance not production tested VTXDCAN = VDD1 C I_COM 20 pF 15b Differential input capacitance not production tested VTXDCAN = VDD1 C I_DIF 10 pF 15c Internal R in resistor matching of CANH and CANL Rin_matching -3 3 % ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit

16 Differential bus recessive output

voltages (V CANH - V CANL ) VTXDCAN = VDD1 V DIFF_OUT_REC_LOAD -5 5 mV 17 VDDCAN monitor threshold HS-CAN enabled V VDDCAN,UV 4.2 4.6 V

18 VDDCAN monitor threshold hys-

HS-CAN enabled V VDDCAN,UV,HYST 100 mV

19 CANH / CANL common mode

Table 22: DC Characteristics No. Description Condition Symbol Min Typ Max Unit

1 Data rate range to be transmitted

2 Delay TXDCAN to bus dominant

t CAN,D_TXD_BUS(dom) 25 110 ns

3 Delay TXDCAN to bus recessive

t CAN,D_TXD_BUS(rec) 10 95 ns

4 Delay bus to RXDCAN dominant

t CAN,D_BUS_RXD(dom) 15 115 ns

5 Delay bus to RXDCAN recessive

t CAN,D_BUS_RXD(rec) 35 160 ns

6 Propagation delay TXDCAN to

t CAN,PD_TXD_RXD 40 255 ns

7 Dominant time for wake up via bus CAN off,

enabled, VS = 12V t CAN,WAKE_BUS_DOM 0.75 5 μs

8 Recessive time for wake up via

CAN off, wake up capability enabled, VS = 12V t CAN,WAKE_BUS_REC 0.75 5 μs 9 wake up time out CAN_CFG.RC = 0, CAN_CFG.WU = 1 tCAN,WAKE2 0.5 2 ms 10 CAN activation time CAN_CFG.RC = 1 t CAN,ACTIVE 50 µs Table 23: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.5.4 TXDCAN and RXDCAN

No. Description Condition Symbol Min Typ Max Unit 1 output low level range I RXDCAN = 1mA V RXD,CAN,OUTL - - 0.4 V 2 output high level range I RXDCAN = -1mA V RXD,CAN,OUTH VVDD1 - 0.4 - - V 3 input low voltage range VTXD,CAN,INL - - 0.3 VDD1 4 input high voltage range VTXD,CAN,INH 0.7 - - VDD1

5 Internal TXDCAN pull up resistor VTXDCAN = 0V R TXD,CAN,PU 80 110 150 Ωk

Table 24: DC Characteristics

4.5.5 CAN Failure detection and recovery

No. Description Condition Symbol Min Typ Max Unit 1 time out for TXD dominant clamp- ing failure t CAN,TXD,DOM 1.4 1.9 ms 2 time out for BUS dominant clamp- ing failure tCAN,BUS,DOM 1.4 1.9 ms 3 duration of bus dominant or recessive time for CAN bus failure detection t BUS,FAIL 6 µs Table 25: AC Characteristics

4.6 Limp Home support; pin FSON

No. Description Condition Symbol Min Typ Max Unit 1 output low level I FSON = 1mA VVS > V VS,PD VFSON,OUTL 0.4 V Table 26: DC characteristics

4.7 Interrupt; pin INTN

No. Description Condition Symbol Min Typ Max Unit 1 output low level I INTN = 1mA VVDD1 > 3V VINTN,OUTL 0.4 V 2 pull up resistor V INTN = 0V R INTN,PU 80 105 150 Ωk Table 27: DC Characteristics No. Description Condition Symbol Min Typ Max Unit

1 Calculation time for interrupt

related state change condition detected Interrupt state change condition detected t INTN,SETUP 8 t OSC Table 28: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

4.8 DCDC Buck converter; pins VIN, VDD1, VDD1SENSE, LXT, PGND

No. Description Condition Symbol Min Typ Max Unit

1 VDD1 output voltage if enabled,

IVDD1 = -500mA, CVDD1 μ > 22 F, ESR Ω< 120m , V VIN > 5.5V VVDD1,5V 4.9 5.1 V

2 Quiescent current consumption of

DCDC buck converter in case of switched off, e.g. in SBC mode SLEEP V VIN = 13.5V DCDC off IVIN,DCDC_OFF 9 20 μA

3 Quiescent current consumption of

DCDC buck converter in case of switched on, e.g. in SBC mode NORMAL V VIN = 13.5V DCDC on Duty cycle = 0% I VIN,DCDC_ON 160 μA 4 reset threshold 1 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 0h, VDD1 falling V TH1,VDD1,RSTN 4.4 4.6 V 5 reset release threshold 1 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 0h, VDD1 rising V TH1,VDD1_r,RSTN 4.6 4.9 V 6 reset threshold 2 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 1h, VDD1 falling V TH2,VDD1,RSTN 3.8 4 V 7 reset release threshold 2 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 1h, VDD1 rising V TH2,VDD1_r,RSTN 4.0 4.25 V 8 reset threshold 3 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 2h, VDD1 falling V TH3,VDD1,RSTN 3.4 3.6 V 9 reset release threshold 3 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 2h, VDD1 rising V TH3,VDD1_r,RSTN 3.6 3.85 V 10 reset threshold 4 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 3h, VDD1 falling, default selection V TH4,VDD1,RSTN 3 3.2 V 11 reset release threshold 4 for VDD1 VDD1_CFG.THR_ 1:THR_0 = 3h, VDD1 rising V TH4,VDD1_r,RSTN 3.2 3.45 V

12 LXT internal over current protec-

VVIN > 5.5V I LXT 650 800 1100 mA 1) Hysteresis of reset thresholds is designed to > 150mV in 5V system Table 29: DC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit 1 reset delay time after release of VDD1 reset tRSTN,VDD1 4.5 6.5 ms

2 VDD1 under voltage debounce

tDEB,VDD1 10 50 μs 3 reset reaction time in case of under voltage condition tRR,VDD1,RSTN 14 20 μs Table 30: AC Characteristics

4.8.1 Pulse Frequency Modulated (PFM) Converter

No. Description Condition Symbol Min Typ Max Unit

1 Switch Minimum ON Time No over current

T ON,MIN 260 ns

2 Minimum ON Time Over current detec-

TON,OC 100 ns

3 Minimum OFF time without over

TOFF,MIN,NOM 520 ns

4 Nominal minimum OFF time after

TOFF,OC,NOM 1330 ns

5 Extended minimum OFF time after

TOFF,OC,EXT 2450 ns

6 Operation frequency depending on ratio

FOP 0 1.7 MHz 7 Peak Operation Frequency F OP,MAX 0.9 1.3 1.7 MHz Table 31: AC characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Low drop regulator; pins VDD2, ENVDD2 No. Description Condition Symbol Min Typ Max Unit

1 Parameter removed

2 output voltage range VDD2 enabled, 6V < V VS < 28V, IVDD2 > -100mA VVDD2,100mA 4.9 5.0 5.1 V 3 output current limitation V VDD2 = 0V, V VS = 28V IVDD2,LIM -220 -110 mA 4 information only, RDS of regulator for V VS = 5.5V VDD2 enabled, Determined for V VS = 5.5V Not production tested RDS VDD2,VS=5.5V 12 Ω 5 information only, RDS of regulator for V VS = 5.0V VDD2 enabled, Determined for V VS = 5.0V Not production tested RDS VDD2,VS=5.0V 13 Ω 6 information only, RDS of regulator for V VS = 4.5V VDD2 enabled, Determined for V VS = 4.5V Not production tested RDS VDD2,VS=4.5V 15 Ω 7 information only, RDS of regulator for V VS = 4.0V VDD2 enabled, Determined for V VS = 4.0V Not production tested RDS VDD2,VS=4.0V 17 Ω 8 information only, RDS of regulator for V VS = 3.5V VDD2 enabled, Determined for V VS = 3.5V Not production tested RDS VDD2,VS=3.5V 21 Ω 9 under voltage threshold falling VDD2 enabled V UV,THR 4.5 4.8 V 10 under voltage hysteresis VDD2 enabled V UV,HYS 100 mV 11 threshold of ENVDD2 rising VENVDD2 rising V ENVDD2,LH 0.6 0.8 VS 12 threshold of ENVDD2 falling VENVDD2 falling V ENVDD2,HL 0.5 0.7 VS Table 32: DC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 No. Description Condition Symbol Min Typ Max Unit 1 under voltage debounce time t DEB,UV 150 280 μs Table 33: AC Characteristics

4.9 DCDC Boost converter; pins MDRV, ISEN, PGND2

No. Description Condition Symbol Min Typ Max Unit

1 VS activation and output voltage

E521.12, .13, .14 only VVDD1 > tbd. V BOOST 6.0 6.5 7.0 V

2 Current sense threshold

E521.12, .13, .14 only VISEN 85 100 110 mV

3 Current sense input current

E521.12, .13, .14 only Booster disabled I ISEN -1 1 µA

4 Minimum Booster input voltage to

guarantee defined booster output voltage E521.12, .13, .14 only I load_VS < 600mA V Booster_input_min 3.25 V

5 Minimum Booster input voltage to

guarantee defined booster output voltage, current limited to lower value of than defined for V BAT_min E521.12, .13, .14 only Iload_VS < tbd. V Booster_input_min_2 2.5 V

6 Internal parasitic Resistance of the

E521.12, .13, .14 only RDC_L BOOST 30 Ωm

7 Pullup current at ISENSE-Pin dur-

E521.12, .13, .14 only Booster enabled R ISENSE 2 5 μA Table 34: DC Characteristics No. Description Condition Symbol Min Typ Max Unit 1 Minimum switch off-time TOFFMIN4 0.47 µs 2 Maximum switch on-time TONMAX4 8.4 µs

3 Minimum switch on-time TONMIN4 150 ns

Table 35: AC Characteristics ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5 Functional Description

5.1 Power Supply and References; pins VS, GND

Fig. 1: Operating Range Limitations

5.1.1 Internal Time Base

μMost times specified are derived from internal 1 s t ime base e.g. directly or by using prescalers based on this time base. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.2 SBC Operating Modes

The device provides the following states:

  • OFF
  • INIT
  • NORMAL
  • STOP
  • SLEEP
  • RESTART
  • FAILSAFE Transition between states is performed at the latest t STATE_CHANGE after valid condition detected. Fig. 2: SBC State Diagram *) Watchdog and cyclic wake up use one timer. It is possible to use one at the same time only. A change between cyclic wake up and watchdog does not reset timer. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register Name Address Description SBC_CFG 0x01 SBC configuration register. WU_SRC 0x04 Wake up source register. Wake up source i s cleared if register is read via SPI. SPI_FAIL 0x05 SPI programming failure register. Regis ter is cleared by reading via SPI. VDD_STAT 0x1A VDD1, VDD2 and VDDCAN status informatio n. Table 36: RegisterTable Register SBC_CFG (0x01) MSB LSB Content CLAMP - BOOST FSON CFG STATE2 STATE1 STATE0 Reset value 0 0 0 0 0 0 0 0 Access R R R/W R R/W R/W R/W R/W Bit Description CLAMP : 1.. External reset shorter than t WDRSTN,TO,GND will not lead to FSON set 0.. External reset leads to FSON set immediately Info: Bit can be written in register FSON_CFGx. BOOST : 1.. Enable booster for low voltage at pin VS 0.. Do not enable booster for low voltage at pin VS FSON : 1.. FSON is active 0.. FSON is not active CFG : SBC state transition in case of watchdog failure 0.. FAILSAFE 1.. RESTART STATE2 ... STATE0 000.. OFF 001.. INIT (cannot be set by SPI) 010.. NORMAL 011.. STOP 100.. RESTART 101.. FAILSAFE 110.. SLEEP 111.. reserved Table 37: SBC configuration register. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WU_SRC (0x04) MSB LSB Content LIN4 LIN3 LIN2 LIN1 CAN VDD1 WD WK Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description LIN4 : 1... wake up from LIN4 detected LIN3 : 1... wake up from LIN3 detected LIN2 : 1... wake up from LIN2 detected LIN1 : 1... wake up from LIN1 detected CAN : 1... wake up from CAN detected VDD1 : 1... wake up in STOP mode due to VDD1 current limitation exceeded WD : 1... cyclic wake up in STOP mode WK : 1... wake up from local wake up pin WK detected Table 38: Wake up source register. Wake up source is cleared if register is read. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register SPI_FAIL (0x05) MSB LSB Content LIN4 LIN3 LIN2 LIN1 CAN - WD FSM Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description Register is cleared by reading via SPI LIN4 : 1.. LIN4 is reason for interrupt, e.g. configuration of LIN4 in case of not beeing in SBC state NORMAL 0.. LIN4 is not reason for interrupt LIN3 : 1.. LIN3 is reason for interrupt, e.g. configuration of LIN3 in case of not beeing in SBC state NORMAL 0.. LIN3 is not reason for interrupt LIN2 : 1.. LIN2 is reason for interrupt, e.g. configuration of LIN2 in case of not beeing in SBC state NORMAL 0.. LIN2 is not reason for interrupt LIN1 : 1.. LIN1 is reason for interrupt, e.g. configuration of LIN1 in case of not beeing in SBC state NORMAL 0.. LIN1 is not reason for interrupt CAN : 1.. CAN is reason for interrupt, e.g. configuration of CAN in case of not beeing in SBC state NORMAL 0.. CAN is not reason for interrupt WD : 1.. Watchdog is reason for interrupt, e.g. configuration of WD in case of not beeing in SBC state NORMAL 0.. Watchdog is not reason for interrupt FSM : 1.. State machine is reason for interrupt, e.g. trying to change into SBC state SLEEP with pending wake up 0.. State machine is not reason for interrupt Table 39: SPI programming failure register. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register VDD_STAT (0x1A) MSB LSB Content VDD2 ON VDD2_EN PIN VDD2OC VDD2 UV - VDDCAN UV VDD1 UV - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description VDD2 ON : 1.. Linear voltage regulator VDD2 enabled 0.. Linear voltage regulator VDD2 disabled VDD2_EN PIN : 1.. ENVDD2 set to logic level 1 0.. ENVDD2 set to logic level 0 VDD2OC : 1.. VDD2 over current detected 0.. VDD2 over current not detected VDD2 UV : 1.. VDD2 under voltage detected 0.. VDD2 under voltage not detected VDDCAN UV : 1.. VDDCAN under voltage detected 0.. VDDCAN under voltage not detected VDD1 UV : 1.. VDD1 under voltage detected 0.. VDD1 under voltage not detected Table 40: VDD1, VDD2 and VDDCAN status information. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.2.1 OFF state

The OFF mode is the unsupplied state. This mode is left automatically if V VS > V S,PU . It is entered automatically if V VS < V S,PD .

5.2.2 INIT state

The SBC is set to state INIT after V VS,PU is exceeded. The DCDC buck converter VDD1 is switched on. The default reset threshold V TH4,VDD1,RSTN is active. Pin RSTN is set to L. After reaching reset threshold reset delay time t RSTN,VDD1 is applied. Then pin RSTN is set to H. In case of VDD1 does not start up beyond its reset level state transition to state FAILSAFE is performed after tTO,VDD1 . This function helps to prevent higher or even short currents to VDD1 for longer times. Transition from SBC state INIT to SBC state NORMAL must be initiated by SPI within t TO,INIT . t TO,INIT starts with rising edge of RSTN . The reset output pin RSTN is bidirectional and can be overwritten by the external µC. In case of an internal reset extended by an external reset the timeout t WDRSTN,TO,GND becomes active at the end of the internal reset duration. If the timeout is exceeded SBC changes to state FAILSAFE and FSON is set.

5.2.3 NORMAL state

State NORMAL is expected to be the main state. All configuration registers are accessable and watchdog is run- ning. Watchdog, CAN, VDD2, WK, FSON and LINs can be configured. Low power state STOP and very low power state SLEEP can be entered via SPI. If a watchdog trigger failure occurs or RSTN is overwritten externally or VDD1 drops below the configurable reset threshold state is changed to FAILSAFE or RESTART depending on configuration of bit SBC_CFG.CFG.

5.2.4 STOP state

LIN and CAN transceivers are off but can be wakeable. Watchdog cyclic wake up timer can be active. Configuration must be performed in state NORMAL in registers WD_CFG1 and WD_CFG2 prior entering state STOP as described for watchdog configuration change. Occurence of cyclic wake up generates an interrupt. VDD2 regulator can be active depending on pin ENVDD2 or bit VDD2_CFG.ON. If RSTN is overwritten externally the state changed to FAILSAFE or RESTART mode depending on configuration of bit SBC_CFG.CFG. Hence the regulator is enabled every t1 n an external reset is detectable only after that time only.

5.2.5 VDD1 current observation in SBC state STOP

A low current consumption is expected in SBC state STOP. To save current DCDC is switched off after an initial time t TRAN,STOP . DCDC is enabled periodically for regular recharge phase t ON_REG,STOP every reload time t1 n. Reload time can be configured in register VDD1_CFG. The undervoltage detection remains active. In case of current consumption is too high voltage drops below undervoltage threshold k1 VDD1 and regulator is enabled for t TRAN,STOP . If this happens more than once within t1 n state is changed to SBC state NORMAL and an interrupt is generated. Otherwise SBC remains in state STOP. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 System behaviour concerning V VDD1 strongly depends on value of external capacitor. It is recommended to calculate value of external capacitor with knowledge of overall system STOP state current consumption and adding a safety margin in order to ensure SBC state STOP can be reached and kept. Accessing register VDD1_CFG is not allowed in SBC state FAILSAFE. Fig. 3: Transition to and from SBC state STOP with current observation on VDD1

5.2.6 SLEEP state

LIN and CAN transceivers are off but can be wakeable. VDD1 voltage regulator is off and reset signal at RSTN is generated. VDD2 regulator can be active depending on pin ENVDD2 or bit VDD2_CFG.ON. A transition to state SLEEP with all wake up sources disabled is prohibited. The transistion is ignored, SPI failure bit is set and an interrupt is generated. Wake up event causes a transition to state RESTART. Watchdog can be configured to wake up device in state SLEEP.

5.2.7 RESTART state

State RESTART is an intermediate state being reached in case of failure conditions or wake up from states SLEEP or FAILSAFE. State can be left to NORMAL using SPI command within limited amount of time t TO,INIT . Otherwise state FAILSAFE is entered automatically.

5.2.8 FAILSAFE state

State FAILSAFE is entered in case of failure condition present only. Pin FSON is activated automatically. VDD1 reg- ulator is switched off. Pin RSTN is set to low. VDD2 regulator can be active depending on pin ENVDD2 . ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 With entering state FAILSAFE all wake up capabilities are enabled. In case of a wake up condition state RESTART is entered. In case of an overtemperature failure state RESTART is entered when overtemperature condition vanishes.

5.2.9 Configuration for transition behaviour to modes FAILSAFE or RESTART

Transition behaviour in case of failure either to SBC state FAILSAFE or to SBC state RESTART can be setup using external circuitry connected to pin INTN . Setup of behaviour is performed in state INIT at the end of SBC active RSTN time t RSTN,VDD1 . At this particular point voltage at INTN is sensed back. Desired behaviour is stored in register SBC_CFG.CFG. For setup purposes during time of determination neither internal normal pull up resistor nor internal low side driver are active in INTN stage. Instead of an internal pull down resistor is active. There are two possible cases: 1. External pull up present: Detect logic level high 2. No external pull up present: Detect logic level low Diagram Fig. 4 shows principal implementation of INTN stage. T 1N and T 1P are used for normal operation. For setup phase both T 1N and T 1P are switched off and pull down controlled by T 2N is enabled. Recommendation for selection of external pull up resistance towards VDD1 System with V VDD1 /uni2266 Ω Ω =5V: Select value of 85k , e.g. 68k Fig. 4: INTN internal structure with support for setup SBC_CFG.CFG Implementation of INTN stage for normal operation and setup of SBC_CFG.CFG. An alternative way to change RESTART/FAILSAFE behaviour in case of a failure is setting bit SBC_CFG.CFG via SPI. But there are some limitations: 1. Bit SBC_CFG.CFG can not be set to L via SPI if an external pull up exists at pin INTN . 2. Bit SBC_CFG.CFG can be written in states STOP and NORMAL only. 3. Bit SBC_CFG.CFG is cleared in states RESTART and FAILSAFE. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.2.10 Software Development function; pin SWDM

High active pin SWDM determines activation of software development function. The only way to enable software development function is a high level of pin SWDM with internal release of pin RSTN in SBC states INIT or RESTART. In final application pin SWDM must be connected to electrical ground. With software development function enabled following changes apply to system behaviour: 1. no watchdog related reset at pin RSTN is generated 2. automatic watchdog related transitions to states FAILSAFE or RESTART are not performed 3. external events at RSTN are ignored 4. exceeding of timeout t TO,INIT is ignored All failures are signaled as usual in SPI status register. All other functional blocks behave as described. Setting pin SWDM to low logic level disables software development function.

5.2.11 Over temperature behaviour

IC implements 8 independent temperature sensors: 1. LIN1 2. LIN2 3. LIN3 4. LIN4 5. HS-CAN 6. VDD2 voltage regulator 7. VDD1 DCDC buck converter 8. Internal aux. structures In case of over temperature detected in LIN or CAN transceivers corresponding interface is switched off and an interrupt is set. VDD2 voltage regulator features both warning and over temperature shutdown functionality including interrupt gen- eration. VDD1 over temperature detection results in an external reset at RSTN . In case of internal auxiliary structures report an over temperature situation system changes to SBC state FAILSAFE. If overtemperature vanishes device will enter SBC state RESTART. Register Name Address Description OT_STAT 0x1F Over temperature detection status regist er. Table 41: RegisterTable ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register OT_STAT (0x1F) MSB LSB Content LIN4 LIN3 LIN2 LIN1 CAN VDD2 VDD1 AUX Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description LIN4 : 1.. LIN4 over temperature detected 0.. LIN4 over temperature not detected LIN3 : 1.. LIN3 over temperature detected 0.. LIN3 over temperature not detected LIN2 : 1.. LIN2 over temperature detected 0.. LIN2 over temperature not detected LIN1 : 1.. LIN1 over temperature detected 0.. LIN1 over temperature not detected CAN : 1.. CAN over temperature detected 0.. CAN over temperature not detected VDD2 : 1.. VDD2 over temperature detected 0.. VDD2 over temperature not detected VDD1 : 1.. VDD1 over temperature detected 0.. VDD1 over temperature not detected AUX : 1.. Over temperature in other internal aux. structures detected 0.. Over temperature in other internal aux. structures not detected Table 42: Over temperature detection status register. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.3 SPI communication; pins SCK, SDI, SDO, CSN

The SPI interface is used for:

  • storing-/and reading CAN data-/timing and system configurations
  • reading diagnosis register By setting CSN to low level, the communication can be achieved and by setting to high level leads to disabling the communication (in this case, pin SDO is high impedance). During the transmission data shifts are controlled by the serial clock signal (SCK) according to the following rules:
  • data is shifted MSB first, LSB last
  • data is shifted out on the rising edge of SCK and is sampled on the falling edge of SCK
  • data transmission length is always 16 Bit SPI write is performed setting MSB Bit A7 of address value to 1. During read Bit A7 needs to be 0. Fig. 5: SPI access Bit RW
  • 1: write access
  • 0: read access Fig. 6: SPI Timing diagram SPI timing diagram. For configuration of write and read access check corresponding diagrams. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.4 Watchdog; pin RSTN

Design implements watchdog functionality that can be used in window or timeout mode. Watchdog mode depends on system state.

5.4.1 Time out mode

The time out mode is an easier and less secure type of the watchdog modes. A closed window does not exist. The watchdog trigger can be applied at any time within the watchdog cycle. A watchdog trigger is detected as a write access to the register WD_TRIG. The bit TRIG_BIT mu st toggle. A correct watchdog trigger starts a new window period. The period can be configured in registers WD_CFG1 and WD_CFG2 in the range from 4ms up to 1024ms using formula 4ms*(1+PER[7:0]). In case of an incorrect watchdog trigger the SBC will enter states RESTART or FAILSAFE depending on configura- tion in SBC_CFG. A watchdog failure generates a reset setting the pin RSTN to L for t WD,RSTN . The first period always starts with 256ms. The first TRIG_BIT must be H. Fig. 7: watchdog time out mode Fig. 8: watchdog time out mode without trigger

5.4.2 Window mode

The window mode is the secure type of the watchdog modes. It consists of a closed and an open window. A closed window is 50% of the configured watchdog period. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 A triggering of the watchdog is only allowed in the open window. A watchdog trigger is detected as a write access to register WD_TRIG. The bit TRIG_BIT must toggle. A correct watchdog trigger starts a new window period. The period can be configured in registers WD_CFG1 and WD_CFG2 in the range from 4ms up to 1024ms using formula 4ms*(1+PER[7:0]). In case of an incorrect watchdog trigger the SBC will enter SBC state RESTART or FAILSAFE depending on config- uration in register SBC_CFG. A watchdog generates a reset setting the pin RSTN to low for t WD,RSTN . The first period always starts with 256ms. The first TRIG_BIT must be high. Fig. 9: watchdog window mode Fig. 10: watchdog window mode no trigger in FOW Behaviour of watchdog in case of missing trigger in open window. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 11: watchdog window mode trigger in closed window Behaviour of watchdog in case of trigger in closed window. Fig. 12: watchdog window mode no trigger in open window Behaviour of watchdog in case of missing trigger in open window. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 13: safe trigger area

5.4.3 Configuration

The configuration of watchdog is allowed in SBC state NORMAL only. Registers WD_CFG1 and WD_CFG2 must be written within one watchdog cycle. The corresponding bits of WD_CFG1 and WD_CFG2 as well as WD_PER1 and WD_PER2 must be equal. Only in this case the configuration is valid. The configuration currently used can be read in registers WD_CFG and WD_PER. Register Name Address Description WD_CFG 0x08 Current watchdog configuration. Change of configuration has to be performed using WD_CFG1 and WD_CFG2 including correct watchdog trigger afterwards within one watchdog cycle in SBC state NORMAL WD_CFG1 0x09 Watchdog configuration register 1 WD_CFG2 0x0A Watchdog configuration register 2 WD_STAT 0x0B Watchdog status register WD_PER 0x0C Current watchdog period. Change of period has to be performed using WD_PER1 and WD_PER2 including correct watchdog trigger afterwards within one watchdog cycle. WD_TRIG 0x0D Watchdog trigger register WD_PER1 0x0E Watchdog period register 1 WD_PER2 0x0F Watchdog period register 2 Table 43: Watchdog RegisterTable ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WD_CFG (0x08) MSB LSB Content TBASE WD CWK1 CWK0 MODE - - - Reset value 0 0 0 0 1 0 0 0 Access R R R R R R R R Bit Description TBASE : In SBC state NORMAL: 1.. Output time base at RXDLIN1 on 0.. Output time base at RXDLIN1 off WD : In SBC state STOP, overwrites CWK1: 1.. Watchdog on 0.. Watchdog off CWK1 : In SBC states STOP: 1.. Cyclic wake up on 0.. Cyclic wake up off CWK0 : In SBC state SLEEP: 1.. Cyclic wake up on 0.. Cyclic wake up off MODE : 1.. Time out mode 0.. Window mode Table 44: Current watchdog configuration. Change of configuration has to be performed using WD_CFG1 and WD_CFG2 including correct watchdog trigger afterwards within one watchdog cycle in SBC mode NORMAL Register WD_CFG1 (0x09) MSB LSB Content TBASE WD CWK1 CWK0 MODE - - - Reset value 0 0 0 0 1 0 0 0 Access R/W R/W R/W R/W R/W R R R Bit Description TBASE : In SBC state NORMAL: 1.. Output time base at RXDLIN1 on 0.. Output time base at RXDLIN1 off WD : In SBC state STOP, overwrites CWK1: 1.. Watchdog on, 0.. Watchdog off CWK1 : In SBC states STOP: 1.. Cyclic wake up on 0.. Cyclic wake up off CWK0 : In SBC state SLEEP: 1.. Cyclic wake up on 0.. Cyclic wake up off MODE : 1.. Time out mode 0.. Window mode Table 45: Watchdog configuration register 1 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WD_CFG2 (0x0A) MSB LSB Content - - - MODE CWK0 CWK1 WD TBASE Reset value 0 0 0 1 0 0 0 0 Access R R R R/W R/W R/W R/W R/W Bit Description MODE : 1.. Time out mode 0.. Window mode CWK0 : In SBC state SLEEP: 1.. Cyclic wake up on 0.. Cyclic wake up off CWK1 : In SBC states STOP: 1.. Cyclic wake up on 0.. Cyclic wake up off WD : In SBC state STOP, overwrites CWK1: 1.. Watchdog on 0.. Watchdog off TBASE : In SBC state NORMAL: 1.. Output time base at RXDLIN1 on 0.. Output time base at RXDLIN1 off Table 46: Watchdog configuration register 2 Register WD_STAT (0x0B) MSB LSB Content - - - - - - SWDM WDRSTN Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description SWDM : 1.. Software development function enabled 0.. Software development function disabled WDRSTN : 1.. Watchdog failure event occurred 0.. No watchdog failure event occured Table 47: watchdog status register ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WD_TRIG (0x0D) MSB LSB Content - - - - - - - TRIG Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R W Bit Description TRIG : Watchdog trigger, expects alternating content After watchdog enable first bit TRIG must be 1 Table 48: watchdog trigger register Register WD_PER (0x0C) MSB LSB Content PER[7] PER[6] PER[5] PER[4] PER[3] PER[2] PER[1] PE R[0] Reset value 0 0 1 1 1 1 1 1 Access R R R R R R R R Bit Description PER[7] : Current watchdog period setup PER[6] : Current watchdog period setup PER[5] : Current watchdog period setup PER[4] : Current watchdog period setup PER[3] : Current watchdog period setup PER[2] : Current watchdog period setup PER[1] : Current watchdog period setup PER[0] : Current watchdog period setup Table 49: Current watchdog period. Change of period has to be performed using WD_PER1 and WD_PER2 includ- ing correct watchdog trigger afterwards within one watchdog cycle. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WD_PER1 (0x0E) MSB LSB Content PER[7] PER[6] PER[5] PER[4] PER[3] PER[2] PER[1] PE R[0] Access R/W R/W R/W R/W R/W R/W R/W R/W Bit Description PER[7] : Watchdog period setup PER[6] : Watchdog period setup PER[5] : Watchdog period setup PER[4] : Watchdog period setup PER[3] : Watchdog period setup PER[2] : Watchdog period setup PER[1] : Watchdog period setup PER[0] : Watchdog period setup Table 50: Watchdog period register 1 Register WD_PER2 (0x0F) MSB LSB Content PER[0] PER[1] PER[2] PER[3] PER[4] PER[5] PER[6] PE R[7] Access R/W R/W R/W R/W R/W R/W R/W R/W Bit Description PER[0] : Watchdog period setup PER[1] : Watchdog period setup PER[2] : Watchdog period setup PER[3] : Watchdog period setup PER[4] : Watchdog period setup PER[5] : Watchdog period setup PER[6] : Watchdog period setup PER[7] : Watchdog period setup Table 51: Watchdog period register 2. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.4.4 Watchdog timing adjustment

For very exact watchdog trigger requirements an internal time base with target frequency of 7.8125 kHz can be con- nected to pin RXDLIN1 . This function can be enabled accessing register WD_CFG.TBASE with correct access valid for watchdog configura- tion. Function needs to disabled via SPI again in order to receive messages using LIN1 again. period minimum period maximum period 4096 us * (WD_PER + 1) (period - 256 us) /1.1 (period + 256 us) /0.88 Table 52: Watchdog period and accuracy ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.4.5 External Reset / Reset clamping

If RSTN is overwritten externally seven cases have to be distinguished. Please also check figure Fig. 14 for details. 1. The SBC wants to give a reset and an external sou rce pulls the RSTN line down. After the time the SBC want to release the RSTN a timeout t WDRSTN,TO,GND starts. If no timeout occurs (first section in figure Fig. 14) SBC state and FSON remain unchanged. 2. If the timeout occurs and the SBC detects a RSTN clamp to GND the SBC switches to either state FAILSAFE or to state RESTART depending on configuration of bit SBC_CFG.CFG and the FSON pin is set (second section in figure Fig. 14). 3. The SBC wants to give a reset and an external sou rce pulls the RSTN line up dominantly. At the time SBC usu- ally releases the reset a clamp to VDD1 is detected. So SBC holds down the reset and starts timeout tWDRSTN,TO,VDD1 . If the dominant pull up releases while the timeout runs the SBC gives a regular reset and FSON remains unchanged (third section in figure Fig. 14). 4. If the dominant pull up does not release while th e timeout runs SBC switches to either state FAILSAFE or to state RESTART depending on configuration of bit SBC_CFG.CFG and FSON is set (fourth section in figure Fig. 14). 5. The SBC does not want to give a reset and an exte rnal source pulls down pin RSTN . There are two configura- tions. Configuration one is SBC_CFG.CLAMP is set to one. This causes timeout t WDRSTN,TO,GND starting. If no timeout occurs ( fifth section in figure Fig. 14) the state is changed to RESTART and FSON is unchanged. 6. If the timeout occurs and the SBC detects a RSTN clamp to GND the SBC switches either to mode FAILSAFE or to mode RESTART depending on configuration of bit SBC_CFG.CFG and pin FSON is set (Sixth section in figure Fig. 14). 7. Configuration two is SBC_CFG.CLAMP is set to zero . No timeout starts and the SBC detects a RSTN clamp to GND as soon as an external clamp to GND occurs. In case of this the SBC switches to either mode FAILSAFE or to mode RESTART depending on configuration of bit SBC_CFG.CFG and pin FSON is set (Seventh section in figure Fig. 14). Fig. 14: Different RSTN behaviour Behaviour of RSTN and configuration options

5.5 Local wake up; pin WK

The device can be woken up from states SLEEP and FAILSAFE via pin WK with either a rising or a falling edge. The edge sensitivity can be configured in register WK_CFG. To suppress glitches the input pin is debounced with tWK,DEB. The wake up event is signaled at pin INTN if it is configured in register WK_CFG. If the local wake up is not used in application, the pin WK has to be connected to pin VS. A transition into state SLEEP is prohibited with a pending wake up request. The request must be cleared via SPI reading register WU_SRC. Register Name Address Description WK_CFG 0x10 configuration register of pin WK. Register is writeable in SBC state NORMAL only. In SBC states INIT, RESTART or FAILSAFE all bits are set to H. Table 53: WK RegisterTable ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register WK_CFG (0x10) MSB LSB Content - - - - - - FALL RISE Reset value 0 0 0 0 0 0 1 1 Access R R R R R R R/W R/W Bit Description FALL : A falling edge at pin WK leads to a wake up event. RISE : A rising edge at pin WK leads to a wake up event. 1) Table 54: configuration register of pin WK 1) In SBC states INIT, RESTART or FAILSAFE all bits are set to H. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.6 LIN Transceiver; pins LIN1 to LIN4, TXDLIN1 to TXDLIN4, RXDLIN1 to RXDLIN4, GND-

5.6.1 Characteristics

The LIN BUS physical interface is implemented as a LIN 2.1 standard high-voltage single wire interface (ISO 9141) for baud rates from 2.4kBds to 20.4kBds. The LIN bus has two logical values; the dominant state (BUS voltage near GND) represents logical LOW level and the recessive state (BUS voltage near VS) represents logical HIGH level. In Ωthe recessive state the BUS is pulled high by an internal pull-up resistor (typ. 30 k ) and a diode in series, so no external pull-up components are required for slave applications. Master applications require an additional external pull-up resistor and a series diode. The LIN protocol output data stream on the TXD signal is converted into the LIN bus signal through a current limited, wave-shaping low-side driver with control as outlined by the LIN Physical Layer Specification Revision 2.1. The receiver converts the data stream from the bus and outputs it to RXD. Fig. 15: LIN transceiver physical layer timing The LIN transceiver can handle a bus voltage swing from +40V down to ground and survives -27V. The device also prevents back feed current through the LIN pin to the supply pin in case of a ground shift / loss or supply voltage disconnection. In sleep mode the LIN block requires a very low quiescent current by using a special wake up comparator allowing the remote wakeup via the LIN bus. The sleep mode can be activated during recessive or dominant level of LIN bus line. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.6.2 LIN Flash Mode

A Flash mode allows an increasing of the transmit baud rate up to 115kBds and the receiver baud rate up to 250kBds. The feature is configured in register LINx_CFG.

5.6.3 LIN Wake Up

The device can be woken up remotely using corresponding pin LINx . The wake up capability can be switched on in corresponding register LINx_CFG. In state FAILSAFE this feature is enabled regardless of configuration. When a wake up is recognized, the corresponding flag in register WU_SRC is set. The device supports two different behaviours. 1. A falling edge at pin LIN followed by a dominant bus level V LIN,DOM maintained for a time period t LIN,WU results in a remote wake up request. 2. A falling edge at pin LIN followed by a dominant bus level V LIN,DOM maintained for a time period t LIN,WU , followed by a rising edge results in a remote wake up request. Fig. 16: LIN wake up in mode SLEEP ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 17: LIN wake up in mode INIT Fig. 18: LIN wake up at rising edge in mode SLEEP ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 19: LIN wake up at rising edge in mode INIT

5.6.4 LIN Failure detection and recovery

All local or bus failures are signaled in register LINx_STAT. There are two possibilities to recover the normal operation after a failure:

  • Sending two SPI commands for LIN Normal Mode, first disable receiver, second enable receiver
  • If RXD is dominant while TXD is recessive since LIN receives dominant bus levels again without driving the bus dominant by itself TXD Dominant clamping failure This failure can only be detected if the LINx transmitter is enabled, e.g. if bit TR in register LINx_CFG is set to high. If TXDx is clamped dominant for longer than t LIN,TXD,DOM the transmitter is disabled and a failure flag is set. RXD dominant clamping failure This failure can be detected if the receiver is enabled, e.g. if bit TR in register LINx_CFG is set. If RXDx is clamped to dominant level for 4 consecutive LINx cycles the transmitter is disabled and a failure flag is set. RXD recessive clamping failure This failure can be detected if the receiver is enabled, e.g. bit TR in register LINx_CFG is set. If RXDx is clamped to recessive level for 4 consecutive LINx cycles the transmitter is disabled and a failure flag is set. BUS dominant clamping failure This failure can be detected if the receiver is enabled, e.g. if bit TR in register LINx_CFG is set. If LINx is clamped to low for longer than t LIN,BUS,DOM a failure flag is set. The transmitter is not disabled. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 OT failure If OT occurs transmitter is disabled and a failure flag is set. The transmitter is enabled if the temperature falls below its threshold and if the conditions for the failure recovery are present. TXD to RXD clamping failure This failure can only be detected if the transmitter is enabled. Pin TXDLINx is set to low that LINx becomes domin- ant. Afterwards pin RXDLINx is set to low too controlled by the receiver. In case of error c52ondition present pin TXDLINx can not be released to high because the driver of RXDLINx is much stronger. If TXDLINx is clamped dominant for longer than t LIN,TXD,DOM the transmitter is disabled and a failure flag is set.

5.6.5 LIN Configuration

All configuration registers are writeable in state NORMAL only . Register Name Address Description LIN_CFG 0x06 Shortcut to LIN1-4 TR and RC configurati on bits LIN1_CFG 0x20 Configuration register for LIN1 LIN_INT 0x21 LIN interrupt register LIN1_STAT 0x22 Status register for LIN1 LIN2_CFG 0x24 Configuration register for LIN2 LIN2_STAT 0x26 Status register for LIN2 LIN3_CFG 0x28 Configuration register for LIN3 LIN3_STAT 0x2A Status register for LIN3 LIN4_CFG 0x2C Configuration register for LIN4 LIN4_STAT 0x2E Status register for LIN4 Table 55: LIN RegisterTable Register LIN_INT (0x21) MSB LSB Content LIN4 LIN3 LIN2 LIN1 - - - - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description LIN4 : 1.. LIN4 is reason for interrupt 0.. LIN4 is not reason for interrupt LIN3 : 1.. LIN3 is reason for interrupt 0.. LIN3 is not reason for interrupt LIN2 : 1.. LIN2 is reason for interrupt 0.. LIN2 is not reason for interrupt LIN1 : 1.. LIN1 is reason for interrupt 0.. LIN1 is not reason for interrupt Table 56: LIN interrupt register ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN1_CFG (0x20) MSB LSB Content - FAILINT FLASH WUINT WUCFG WU TR RC Reset value 0 0 0 0 1 1 0 0 Access R R/W R/W R/W R/W R/W R/W R/W Bit Description FAILINT : 0...Interrupt disabled for LIN failures FLASH : The FLASH mode deactivates filtering and provides a baud rate of up to 125kBaud for transmitting and 250kBaud for receiving. 1...Flash mode enabled 0...Flash mode disabled WUINT : 1...Interrupt enabled if WU is detected 0...Interrupt disabled if WU is detected WUCFG : 1... Wake up is performed with next rising edge after LIN wake up debounce time 0.. Wake up is performed after LIN wake up debounce time WU : 1...Wake up capability enabled, could only be set if RC and TR are not set. This is locked by hardware. 0...Wake up capability disabled TR : 1...Transmitter enabled, RC is enabled automatically, WU is cleared 0...Transmitter disabled RC : 1...receiver enabled, read bus only, WU is cleared 0...receiver disabled Table 57: Configuration register for LIN1 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN1_STAT (0x22) MSB LSB Content - Bus short TXDDOM BUSDOM RXDREC RXDDOM - - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description Bus short : 1...LIN short circuit detected 0...LIN short circuit not detected TXDDOM : 1...TXD permanent dominant clamping timeout exceeded 0...TXD permanent dominant clamping timeout not exceeded BUSDOM : 1...LIN permanent dominant clamping timeout exceeded 0...LIN permanent dominant clamping timeout not exceeded RXDREC : 1...RXD permanent recessive clamping timeout exceeded 0...RXD permanent recessive clamping timeout not exceeded RXDDOM : 1...RXD permanent dominant clamping timeout exceeded 0...RXD permanent dominant clamping timeout not exceeded Table 58: Status register for LIN1 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN2_CFG (0x24) MSB LSB Content - FAILINT FLASH WUINT WUCFG WU TR RC Reset value 0 0 0 0 1 1 0 0 Access R R/W R/W R/W R/W R/W R/W R/W Bit Description FAILINT : 0...Interrupt disabled for LIN failures FLASH : The FLASH mode deactivates filtering and provides a baud rate of up to 125kBaud for transmitting and 250kBaud for receiving. 1...Flash mode enabled 0...Flash mode disabled WUINT : 1...Interrupt enabled if WU is detected 0...Interrupt disabled if WU is detected WUCFG : 1... Wake up is performed with next rising edge after LIN wake up debounce time 0.. Wake up is performed after LIN wake up debounce time WU : 1...Wake up capability enabled, could only be set if RC and TR are not set. This is locked by hardware. 0...Wake up capability disabled TR : 1...Transmitter enabled, RC is enabled automatically, WU is cleared 0...Transmitter disabled RC : 1...receiver enabled, read bus only, WU is cleared 0...receiver disabled Table 59: Configuration register for LIN2 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN2_STAT (0x26) MSB LSB Content - Bus short TXDDOM BUSDOM RXDREC RXDDOM - - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description Bus short : 1...LIN short circuit detected 0...LIN short circuit not detected TXDDOM : 1...TXD permanent dominant clamping timeout exceeded 0...TXD permanent dominant clamping timeout not exceeded BUSDOM : 1...LIN permanent dominant clamping timeout exceeded 0...LIN permanent dominant clamping timeout not exceeded RXDREC : 1...RXD permanent recessive clamping timeout exceeded 0...RXD permanent recessive clamping timeout not exceeded RXDDOM : 1...RXD permanent dominant clamping timeout exceeded 0...RXD permanent dominant clamping timeout not exceeded Table 60: Status register for LIN2 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN3_CFG (0x28) - should not be used with E521.02 and E521.12 MSB LSB Content - FAILINT FLASH WUINT WUCFG WU TR RC Reset value 0 0 0 0 1 1 0 0 Access R R/W R/W R/W R/W R/W R/W R/W Bit Description FAILINT : 0...Interrupt disabled for LIN failures FLASH : The FLASH mode deactivates filtering and provides a baud rate of up to 125kBaud for transmitting and 250kBaud for receiving. 1...Flash mode enabled 0...Flash mode disabled WUINT : 1...Interrupt enabled if WU is detected 0...Interrupt disabled if WU is detected WUCFG : 1... Wake up is performed with next rising edge after LIN wake up debounce time 0.. Wake up is performed after LIN wake up debounce time WU : 1...Wake up capability enabled, could only be set if RC and TR are not set. This is locked by hardware. 0...Wake up capability disabled TR : 1...Transmitter enabled, RC is enabled automatically, WU is cleared 0...Transmitter disabled RC : 1...receiver enabled, read bus only, WU is cleared 0...receiver disabled Table 61: Configuration register for LIN3 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN3_STAT (0x2A) - should not be used with E521.02 and E521.12 MSB LSB Content - Bus short TXDDOM BUSDOM RXDREC RXDDOM - - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description Bus short : 1...LIN short circuit detected 0...LIN short circuit not detected TXDDOM : 1...TXD permanent dominant clamping timeout exceeded 0...TXD permanent dominant clamping timeout not exceeded BUSDOM : 1...LIN permanent dominant clamping timeout exceeded 0...LIN permanent dominant clamping timeout not exceeded RXDREC : 1...RXD permanent recessive clamping timeout exceeded 0...RXD permanent recessive clamping timeout not exceeded RXDDOM : 1...RXD permanent dominant clamping timeout exceeded 0...RXD permanent dominant clamping timeout not exceeded Table 62: Status register for LIN3 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN4_CFG (0x2C) - should not be used with E521.02, E521.03, E521.12 and E521.13 MSB LSB Content - FAILINT FLASH WUINT WUCFG WU TR RC Reset value 0 0 0 0 1 1 0 0 Access R R/W R/W R/W R/W R/W R/W R/W Bit Description FAILINT : 0...Interrupt disabled for LIN failures FLASH : The FLASH mode deactivates filtering and provides a baud rate of up to 125kBaud for transmitting and 250kBaud for receiving. 1...Flash mode enabled 0...Flash mode disabled WUINT : 1...Interrupt enabled if WU is detected 0...Interrupt disabled if WU is detected WUCFG : 1... Wake up is performed with next rising edge after LIN wake up debounce time 0.. Wake up is performed after LIN wake up debounce time WU : 1...Wake up capability enabled, could only be set if RC and TR are not set. This is locked by hardware. 0...Wake up capability disabled TR : 1...Transmitter enabled, RC is enabled automatically, WU is cleared 0...Transmitter disabled RC : 1...receiver enabled, read bus only, WU is cleared 0...receiver disabled Table 63: Configuration register for LIN4 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register LIN4_STAT (0x2E) - should not be used with E521.02, E521.03, E521.12 and E521.13 MSB LSB Content - Bus short TXDDOM BUSDOM RXDREC RXDDOM - - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description Bus short : 1...LIN short circuit detected 0...LIN short circuit not detected TXDDOM : 1...TXD permanent dominant clamping timeout exceeded 0...TXD permanent dominant clamping timeout not exceeded BUSDOM : 1...LIN permanent dominant clamping timeout exceeded 0...LIN permanent dominant clamping timeout not exceeded RXDREC : 1...RXD permanent recessive clamping timeout exceeded 0...RXD permanent recessive clamping timeout not exceeded RXDDOM : 1...RXD permanent dominant clamping timeout exceeded 0...RXD permanent dominant clamping timeout not exceeded Table 64: Status register for LIN4 Register LIN_CFG (0x06) MSB LSB Content TR4 RC4 TR3 RC3 TR2 RC2 TR1 RC1 Reset value 0 0 0 0 0 0 0 0 Access R/W R/W R/W R/W R/W R/W R/W R/W TR3 : Same as LIN3_CFG.TR. Should set to 0 with E521.02 and E521.12 RC3 : Same as LIN3_CFG.RC. Should set to 0 with E521.02 and E521.12 TR2 : Same as LIN2_CFG.TR RC2 : Same as LIN2_CFG.RC TR1 : Same as LIN1_CFG.TR RC1 : Same as LIN1_CFG.RC Table 65: Shortcut to LIN1-4 TR and RC configuration bits ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.7 HS-CAN Transceiver; pins CANH, CANL, RXDCAN, TXDCAN, VDDCAN

The HS-CAN transceiver is compatible to ISO 11898-5. CANH and CANL interface the CAN protocol controller to HS-CAN physical layer wires. Data rate can be selected up to 1MegBaud. Fig. 20: HS-CAN Bus timing

5.7.1 CAN Wake up

The device is capable detecting wake up pattern at the CAN bus if configured. A wake up pattern ideally consists of four consecutive symbols dominant, recessive, dominant and recessive. The dominant bus states have to be longer than t CAN,WAKE_BUS_DOM and the recessive bus states have to be longer than t CAN,WAKE_BUS_REC . The pattern must be applied within t WAKE2 . When the wake up pattern is recognized, the corresponding flag in register WU_SRC is set.Pin INTN is set low if bit CAN_CFG.WUINT was set high. Pin RXDCAN is set to low until bit CAN_CFG.RC is set high or register WU_SRC is read. Fig. 21: Remote Wakeup Pattern ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.7.2 CAN Failure detection and recovery

All CAN related local or bus failures are signaled in register CAN_STAT. There are two possibilities to recover the normal operation after a failure:

  • Sending the SPI command for CAN Normal Operation Mode
  • If RXD is dominant while TXD is recessive TXD Dominant clamping failure This failure can only be detected if the transmitter is enabled, e.g. bit TR in register CAN_CFG is set to high. If TXD- CAN is clamped dominant for longer than t CAN,TXD,DOM the transmitter is disabled and a failure flag is set. RXD dominant clamping failure This failure can be detected if the receiver is enabled, e.g. bit RC or TR in register CAN_CFG is set. If RXDCAN is clamped low for 4 consecutive CAN cycles the transmitter is disabled and a failure flag is set. RXD recessive clamping failure This failure can be detected if the receiver is enabled, e.g. bit RC or TR in register CAN_CFG is set. If RXDCAN is clamped recessive level for 4 consecutive CAN cycles the transmitter is disabled and a failure flag is set. BUS dominant clamping failure This failure can be detected if the receiver is enabled, e.g. bit RC or TR in register CAN_CFG is set. If CAN is clamped dominant for longer than t CAN,BUS,DOM a failure flag is set. The transmitter is not disabled. TXD to RXD clamping failure This failure can only be detected if the transmitter is enabled. Pin TXDCAN is set to low that CAN becomes domin- ant. Afterwards pin RXDCAN is set to low too controlled by the receiver. In case of error condition present pin TXD- CAN can not be released to high because the driver of RXDCAN is much stronger. If TXDCAN is clamped domin- ant for longer than t CAN,TXD,DOM the transmitter is disabled and a failure flag is set. OT failure If OT occurs the transmitter is disabled and a failure flag is set. The transmitter is enabled again if the temperature falls below its threshold and the conditions for the failure recovery are present. CANH to GND clamping failure This failure can be detected if the transmitter is enabled, e.g. bit TR in register CAN_CFG is set. If the short is present for 4 consecutive CAN cycles of at least t BUS,FAIL a failure flag is set. The transmitter is not disabled. The fail- ure is cleared if CANH is not clamped to GND anymore. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 CANL to GND clamping failure This failure can be detected if the transmitter is enabled, e.g. bit TR in register CAN_CFG is set. If the short is present for 4 consecutive CAN cycles of at least t BUS,FAIL a failure flag is set. The transmitter is not disabled. The fail- ure is cleared if CANH is not clamped to GND anymore. CANH to VDDCAN/VS clamping failure This failure can be detected if the transmitter is enabled, e.g. bit TR in register CAN_CFG is set. If the short is present for 4 consecutive CAN cycles of at least t BUS,FAIL a failure flag is set. The transmitter is not disabled. The fail- ure is cleared if CANH is not clamped to VDDCAN/VS anymore. CANL to VCC/VS clamping failure This failure can be detected if the transmitter is enabled, e.g. bit RC or TR in register CAN_CFG is set. If the short is present for 4 consecutive CAN cycles of at least t BUS,FAIL a failure flag is set. The transmitter is not disabled. The failure is cleared if CANH is not clamped to VDDCAN/VS anymore.

5.7.3 CAN Configuration

Register Name Address Description CAN_CFG 0x30 Configuration register for CAN CAN_STAT 0x32 Status register for CAN Table 66: CAN RegisterTable Register CAN_CFG (0x30) MSB LSB Content - FAILINT - WUINT BF WU TR RC Reset value 0 0 0 1 0 1 0 0 Access R R/W R R/W R/W R/W R/W R/W Bit Description FAILINTEN : 1...interrupt enabled for CAN failures 0...interrupt disabled for CAN failures WUINT : 1...interrupt enabled if WU is detected 0...interrupt disabled if WU is detected BF : 1.. CAN bus short failure detection enabled 0.. CAN bus short failure detection disabled WU : 1...wake up capability enabled, only valid if RC and TR are 0 0...wake up capability disabled TR : 1...transmitter enabled, RC is enabled automatically, WU is masked 0...transmitter disabled RC : 1...receiver enabled, listen only, WU is masked 0...receiver disabled Table 67: Configuration register for CAN ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register CAN_STAT (0x32) MSB LSB Content CHVCC CHGND CLVCC CLGND RXDREC RXDDOM BUSDOM TXDD OM Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description CHVCC : 1.. CANH to VCC or VS clamping detected 0.. CANH to VCC or VS clamping not detected CHGND : 1.. CANH to GND clamping detected 0.. CANH to GND clamping not detected CLVCC : 1.. CANL to VCC or VS clamping detected 0.. CANL to VCC or VS clamping not detected CLGND : 1.. CANL to GND clamping detected 0.. CANL to GND clamping not detected RXDREC : 1.. RXD permanent recessive clamping timeout exceeded 0.. RXD permanent recessive clamping timeout not exceeded RXDDOM : 1.. RXD permanent dominant clamping timeout exceeded 0.. RXD permanent dominant clamping timeout not exceeded BUSDOM : 1.. CAN permanent dominant clamping timeout exceeded 0.. CAN permanent dominant clamping timeout not exceeded TXDDOM : 1.. TXD permanent dominant clamping timeout exceeded 0.. TXD permanent dominant clamping timeout not exceeded Table 68: Status register for CAN ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.8 Limp Home support; pin FSON

SBC features limp home support using pin FSON . In order to activate output pin FSON using SPI command. Both registers FSON_CFG1 and FSON_CFG2 need to be accessed within one watchdog period for system safety reasons. If contents of registers is equal pin FSON is activated when watchdog is triggered. Otherwise no change is made. Register Name Address Description FSON_STAT 0x02 FSON status register. FSON_CFG1 0x1B FSON configuration register 1 FSON_CFG2 0x1C FSON configuration register 2 Table 69: FSON RegisterTable Register FSON_CFG1 (0x1B) MSB LSB Content CLAMP - - SPI - - - - Reset value 1 0 0 0 0 0 0 0 Access R/W R R R/W R R R R Bit Description CLAMP : 1.. External reset shorter than t WDRSTN,TO,GND will not lead to FSON set 0.. External reset leads to FSON set immediately SPI : 1.. Activate FSON 0.. Deactivate FSON Table 70: FSON configuration register 1 Register FSON_CFG2 (0x1C) MSB LSB Content - - - - SPI - - CLAMP Reset value 0 0 0 0 0 0 0 1 Access R R R R R/W R R R/W Bit Description SPI : 1.. Activate FSON 0.. Deactivate FSON CLAMP : 1.. External reset shorter than t WDRSTN,TO,GND will not lead to FSON set 0.. External reset leads to FSON set immediately Table 71: FSON configuration register 2 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register FSON_STAT (0x02) MSB LSB Content - VDD1UV WD OT INITTO RSTNSC FSON_SPI FSON_INT Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description VDD1UV : 1.. VDD1 under voltage detected 0.. VDD1 under voltage not detected WD : 1..Watchdog trigger failure detected 0..Watchdog trigger failure not detected OT : 1..Over temperature detected 0..Over temperature not detected INITTO : 1..Timeout in mode INIT detected 0..Timeout in mode INIT not detected RSTNSC : 1.. RSTN clamped low externally 0.. RSTN not clamped low externally FSON_SPI : 1.. FSON activated via SPI 0.. FSON not activated via SPI FSON_INT : 1.. FSON activated due to FAILSAFE condition detected 0.. FSON not activated due to no FAILSAFE condition detected Table 72: FSON status register. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.8.1 Activation of FSON

FSON is activated in following cases: 1. SBC init mode not left within time t TO,INIT 2. VDD1 time out t TO,VDD1 3. Activated by SPI command accessing FSON_CFG1.FSON _SPI and FSON_CFG2.FSON_SPI within one watch- dog cycle 4. Permanent clamping of RSTN to GND 5. Permanent clamping of RSTN to VDD1 6. External Reset on RSTN (partly configurable withS BC_CFG.CLAMP) 7. Over temperature 8. Watchdog failure Fig. 22: Activation of FSON Activation sources for limp home output FSON

5.8.2 Deactivation of FSON

FSON is deactivated in following cases: 1. µ µ C sent deactivation command via SPI AND SBC is in state NORMAL AND C sent correct watchdog trigger 2. VS falls below VS VS,PD ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 23: Deactivation of FSON Deactivation sources for limp home output FSON

5.9 Interrupt; pin INTN

The interrupt pin is driven low if the following interrupt sources/conditions occur:

  • wake up event at CAN, LIN or WK, cyclic wake up
  • over temperature warning
  • over temperature shut down
  • under voltage at VDD1 or VDD2
  • communication failures at CAN or LIN Interrupts can be enabled in configuration registers of the corresponding modules. For over temperature and under voltage the appearance and disappearance is signaled via an interrupt. Therefore after SPI reading of interrupt source pin INTN is not blocked if the interrupt condition is still active. In order to evaluate detailed reason for interrupt read corresponding status registers. Register Name Address Description INT 0x03 Interrupt status register VDD_STAT 0x1A VDD1, VDD2 and VDDCAN status informatio n. Table 73: INTN RegisterTable ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Register INT (0x03) MSB LSB Content CAN LIN WAKE VDDx OTWARN OT FSM/SPI - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description CAN : 1... HS-CAN interface is reason for interrupt LIN : 1... At least one of the LIN interfaces is reason for interrupt WAKE : 1... Wake up event is reason for interrupt VDDx : 1... Under voltage condition is reason for interrupt OTWARN : 1... Over temperature warning level crossing is reason for interrupt OT : 1... Over temperature shutdown level crossing is reason for interrupt FSM/SPI : 1... FSM or SPI are reasons for interrupt Table 74: Interrupt status register Register VDD_STAT (0x1A) MSB LSB Content VDD2 ON VDD2 ENA PAD VDD2OC VDD2 UV - VDDCAN UV VDD1 UV - Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R Bit Description VDD2 ON : 1..Linear voltage regulator VDD2 enabled 0..Linear voltage regulator VDD2 disabled VDD2 ENA PAD : 1.. ENVDD2 set to logic level 1 0.. ENVDD2 set to logic level 0 VDD2OC : 1.. VDD2 over current detected 0.. VDD2 over current not detected VDD2 UV : 1.. VDD2 under voltage detected 0.. VDD2 under voltage not detected VDDCAN UV : 1.. VDDCAN under voltage detected. If CAN is not activated, this bit is high without generating a interrupt in this case. 0.. VDDCAN under voltage not detected VDD1 UV : 1.. VDD1 under voltage detected 0.. VDD1 under voltage not detected Table 75: VDD1, VDD2 and VDDCAN status information. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Fig. 24: Interrupt and status register dependency In case of interrupt detailed information can be read from device in order to evaluate reason for interrupt. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.10 DCDC Buck converter; pins VIN, VDD1, VDD1SENSE, LXT, PGND

Register Name Address Description VDD1_CFG 0x14 VDD1 configuration register Writing register in SBC state FAILSAFE is not allowed Table 76: VDD1 RegisterTable Register VDD1_CFG (0x14) MSB LSB Content t1_1 t1_0 IDLE - - STOP THR_1 THR_0 Reset value 0 1 1 0 0 0 0 0 Access R/W R/W R/W R R R R/W R/W Bit Description t1_1 : configuration of time t1 for SBC mode STOP observation t1_0 : configuration of time t1 for SBC mode STOP observation 00...5ms 01...10ms 10...20ms 11...40ms IDLE : 1.. activate IDLE prevention 0.. deactivate IDLE prevention IDLE detected:

  • DCDC on
  • DCDC reports IDLE
  • V(VDD1) < typ. 0.98*VDD1 nom STOP : selection of behaviour in state stop 1..in case of high current consumption state remains in STOP 0..in case of high current consumption state is changed to NORMAL THR_1 : selection of reset threshold THR_0 : selection of reset threshold 00...V TH1,VDD1,RSTN 01...V TH2,VDD1,RSTN 10...V TH3,VDD1,RSTN 11...V TH4,VDD1,RSTN Table 77: VDD1 configuration register Remark: Register Writing register in SBC state FAILSAFE is not allowed ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.10.1 General Description

The DCDC buck converter is a fixed output voltage step-down converter intended for automotive and general bat- tery driven applications, featuring open loop stability and short current limitation for the integrated driver transistor. The device is offered in a 5V output voltage version providing up to 500mA output current. The modulation scheme is based on Pulse Frequency Modulation. For operation a clock signal is not needed, providing minimum ON/OFF time regulation for the internal switch. Internal current measurement allows to reduce the ON time below the given nominal ON time to prevent excessive current flow in the inductor.

5.10.2 Pulse Frequency Modulated Converter

The following sub chapters provide descriptions of the blocks implemented to control the output voltage. The regu- lation principle provides an adaptive operation frequency of typ. up to 1.3MHz, depending on V VIN / V VDD1 voltage ratio and load conditions. PFM Control Logic PFM control logic generates the timings necessary to control the converter based on a combination of output voltage, temperature and measured switch current. It provides adaptive frequency, depending on input voltage to output voltage ratio in the range of 0Hz up to typ. >1.3MHz. Internal Power Switch The internal highside power switch connects VIN and LXT controlled by PFM control logic. The highside power switch current is limited providing saturation protection to the inductor and to prevent over cur- rent damage to the application. It allows startup of the converter without soft-start measures.

5.10.3 Application / Implementation Hints

Output voltage ripple is strongly dependent on peripheral elements chosen (L LXT and C VDD1SENSE ) and their parasitic behavior. ESR of output capacitance C VDD1SENSE must be suitable to ensure a small ripple for proper regulation (see recommended operating conditions). The ripple voltage can be calculated by VRIPPLE,VDD1SENSE = R ESR,COUT * I RIPPLE,L_LXT The DC resistance of L LXT reduces the efficiency but does not affect the output voltage ripple. (Though a high resist- ance can generate a significant thermal power within the inductor). Furthermore higher DC resistance will also increase the minimum input voltage requirements for nominal output voltage. The free-wheeling diode must have a low forward voltage as well as a low reverse recovery time. Parasitic capacit- ance of this diode decreases the overall efficiency and causes current spikes when the driver turns on (consider this behaviour for EMI). For low power requirements on VDD1 consider the leakage of the freewheeling diode at nominal converter output voltage. Leakage current will contribute to the overall output current of the converter. A reverse polarity diode for VIN is recommended. In EMC sensitive environments additional decoupling measures at VIN are recommended. ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.10.4 VDD1 under-voltage monitor

If VDD1 < V THx,VDD1_f,RSTN a reset is generated and pin RSTN is set to L. SBC enters state RESTART or FAILSAFE depending on SBC_CFG.CFG. If VDD1 > V THx,VDD1,RSTN reset will be enlarged and RSTN will be held L for t RSTN,VDD1 . After that RSTN is set to H. To prevent high or short current events VDD1 is monitored. If VDD1 < V THx,VDD1,RSTN timeout t TO,VDD1 is started. If timeout exceeds SBC is set to state FAILSAFE and regulator is switched off. If VDD1 > V THx,VDD1,RSTN timeout is reset. Timeout is enabled only if VS > V ON-OFF,VS . Otherwise VDD1 will not reach its output value.

5.11 Low drop regulator; pins VDD2, ENVDD2

The on chip low drop voltage regulator (LDO) provides a voltage of typically 5.0V at pin VDD2 . LDO can be active in SBC operating states NORMAL, STOP, SLEEP, RESTART or FAILSAFE. It can be activated via SPI or via pin ENVDD2 . VS related pin ENVDD2 has higher priority. In order to save system current ENVDD2 does not implement pull down functionality. If the external pin ENVDD2 is low the SPI register determines status of LDO. Otherwise if the pin ENVDD2 is high the LDO is activated independently of the contents of the register VDD2_CFG.ON. In case of external deactivation of VDD2 using pin ENVDD2 LDO is switched off as well as SPI register is reset to off state. Register VDD2_CFG can be written in state NORMAL only. It is cleared in state FAILSAFE. The LDO is limited in output current. Current limitation is always activated. Over voltage protection against VS and reverse polarity protection are implemented. An over temperature protection using both warning and shutdown levels is implemented. In case of over temperat- ure detection an interrupt is generated. Voltage supervision including interrupt generation is implemented. Register Name Address Description VDD2_CFG 0x18 VDD2 configuration register Table 78: VDD2 RegisterTable Register VDD2_CFG (0x18) MSB LSB Content - - - - - - - ON Reset value 0 0 0 0 0 0 0 0 Access R R R R R R R R/W Bit Description ON : 1... enables regulator Table 79: VDD2 configuration register ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

5.12 DCDC Boost converter; pins MDRV, ISEN, PGND2

For applications relevant during startup, an optional input voltage boost converter can be added. The boost con- verter activates if the supply voltage at pin VS falls below the V BOOST level. Then the gate driver sets active level on pin MDRV driving the gate of external power-MOS-switch for either maximum ON-time T ONMAX4 or till the current reaches the threshold V ISEN sensing on shunt at pin ISEN. After switching off at pin MDRV the next switch on will be only after expiration minimum OFF-time T OFFMIN4 . Each switch on event holds the pin MDRV active at least for the minimum ON-time T ONMIN4 regardless of current sense level at pin ISEN. So the boost converter is self oscillating. It can also be deactivated if pin ISEN is not connected to external Rsense and externally pulled up between 2V and VDD1 level. Booster activation is controlled using SBC_CFG.BOOST. In default setup booster set to off. Fig. 25: Functional diagram Booster ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1 VDD1 (nominal 5V) HSD L LSD VREF1 VISEN G A T E C T R L LEVEL- SHIFTER P F M VDD (nominal 3.3V) VREF2 + Lsup Rsup SUPPLY PARASITICS V V R S E N S E EXTERN FET ISENSE C BOOST_OUT CBOOST_IN D1 D2 COMP1 COMP2 BOOST ON If VDD1 > 4.5V & No POR BOOSTER BOOST S Option1 to suppress distortions caused by supply parasitics Option2 D1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

6 Register Table

Register Name Address Description SBC_CFG 0x01 SBC configuration register. FSON_STAT 0x02 FSON status register. INT 0x03 Interrupt status register WU_SRC 0x04 Wake up source register. Wake up source is cleared if register is read. SPI_FAIL 0x05 SPI programming failure register. Register is cleared by reading via SPI. LIN_CFG 0x06 Shortcut to LIN1-4 TR and RC configuration bits WD_CFG 0x08 Current watchdog configuration. Change of configuration has to be performed using WD_CFG1 and WD_CFG2 including correct watchdog trigger afterwards within one watchdog cycle in SBC mode NORMAL WD_CFG1 0x09 Watchdog configuration register 1 WD_CFG2 0x0A Watchdog configuration register 2 WD_STAT 0x0B watchdog status register WD_PER 0x0C Current watchdog period. Change of period has to be performed using WD_PER1 and WD_PER2 including correct watchdog trigger afterwards within one watchdog cycle. WD_TRIG 0x0D watchdog trigger register WD_PER1 0x0E Watchdog period register 1 WD_PER2 0x0F Watchdog period register 2. WK_CFG 0x10 configuration register of pin WK. Register is writeable in SBC state NORMAL only. In SBC states INIT, RESTART or FAILSAFE all bits are set to H. VDD1_CFG 0x14 VDD1 configuration register. Writing re gister in SBC state FAILSAFE is not allowed VDD2_CFG 0x18 VDD2 configuration register VDD_STAT 0x1A VDD1, VDD2 and VDDCAN status information. SPI_STAT 0x1B Status register with respect to FSM. OT_STAT 0x1F Over temperature detection status register. LIN1_CFG 0x20 Configuration register for LIN1 LIN_INT 0x21 LIN interrupt register LIN1_STAT 0x22 Status register for LIN1 LIN2_CFG 0x24 Configuration register for LIN2 LIN2_STAT 0x26 Status register for LIN2 LIN3_CFG 0x28 Configuration register for LIN3 LIN3_STAT 0x2A Status register for LIN3 LIN4_CFG 0x2C Configuration register for LIN4 LIN4_STAT 0x2E Status register for LIN4 CAN_CFG 0x30 Configuration register for CAN CAN_STAT 0x32 Status register for CAN Table 80: Register Table ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

7 Applications Information

7.1 Overview

boost functionality. The following chapters show typical operating circuits of these two use cases.

7.2 Typical Operating Circuit with booster

Table 81. External Components ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products.

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Description Condition Symbol Min Typ Max Unit VS, VIN buffer capacitance to ground Effective ESR o f C3, C 4 shall be Ω< 300m C3 10 22 - μF VS, VIN filter capacitance to ground Effective ESR o f C3, C 4 shall be Ω< 300m C4 100 nF WK Optional LP filter capacitance for WK C WK 22 nF LP filter resistor for pin WK RWK 1 3.3 10 Ωk VDD1 Inductance at LXT to output voltage I VDD1 < 500mA L 2 18 33 82 μH Serial Resistance of LXT Inductance I VDD1 < 500mA R L2 0.1 0.6 Ω Relative Saturation Current of LXT Inductor Saturation current relative to maximum application current I VDD1 IL2,SAT 130 % Freewheeling Diode Forward Voltage e.g. MBR Forward current 1.3 x I(VDD1) T AMB = 25° C VD2 0.6 1 V Reverse Recovery Time of Freewheel- ing Diode Forward current 1.3 x I(VDD1) T AMB = 25° C tD2,rec 10 25 ns Peak to peak voltage ripple at VDD1SENSE for regulation, regulation ripple included in 2% toler- ance window for VDD1 V VDD1SENSE,RIPP LE 10 100 mV VDD1SENSE Decoupling resistor R SER 50 60 140 Ωm VDD1_1 external buffer capacitor Effective ESR of C5, C 6, C 7, C 8 shall Ωbe < 10m C5 10 μF VDD1_1 external filter capacitor Effective ESR of C5, C 6, C 7, C 8 shall Ωbe < 10m C6 33 nF VDD1_2 external buffer capacitor Effective ESR of C5, C 6, C 7, C 8 shall Ωbe < 10m C7 10 μF VDD1_2 external filter capacitor Effective ESR of C5, C 6, C 7, C 8 shall Ωbe < 10m C8 33 nF VDDCAN VDDCAN external buffer capacitor ESR < TBD C 9 10 μF VDDCAN external filter capacitor ESR < TBD C 10 33 nF ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 Description Condition Symbol Min Typ Max Unit VDD2 External buffer capacitor for VDD2 ΩESR > 200m C 11 2.2 22 μF External filter capacitor close to pin VDD2 C 12 100 nF External filter capacitor close to external connector if used as external sensor sup- ply (global pin) C 13 4.7 nF Booster (optional) Booster inductance I sat depends on R sense selection L1 2.2 μH Booster diode, e.g. SS24 D2 Booster input buffer capacitance C 2 50 100 - μF Booster input filter capacitance C 1 TBD nF Booster output buffer capacitance I LOAD_VS < 600mA ΩESR < 50m C3 50 - μF Booster output filter capacitance C 4 TBD nF Current sense resistance I sat_Lboost > 1.8A R 1_60 60 Ωm Current sense resistance I sat_Lboost > 3.6A R 1_30 30 Ωm RDSon of the external FET V VDD1 > 4.5V R DSON,T1 30 Ωm Total gate charge of the external FET V DS = 5V VGS = 5V ID = 3.6A Vth < 3V Qb BOOST_ext_FET 10 nC Maximal forward current of the external Booster diode D1, D2 I AV(SKD_BOOST) 3.6 A Maximal forward voltage of the external Booster diode D1, D2 @ 3.6A V F(SKD_BOOST) 500 mV ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016

8 Package Information

The E521.14 device family is available in a Pb free, RoHs compliant, QFN44L7 plastic package according to JEDEC MO-220 K.01 VKKD-3. The package is classified to Moisture Sensitivity Level 3 (MSL 3) according to JEDEC J-STD-020C with a soldering peak temperature of (260+5)° C. Note: Thermal resistance junction to ambient R th,ja is typ. 24 ° C/W, based on JEDEC standard JESD-51-2, JESD- 51-5 and JESD-51-7. Description Symbol mm inch min typ max min typ max Thickness of terminal leads, including lead finish A3 -- 0.20 REF -- -- 0.0079 REF -- Package length / width D Lead pitch e -- 0.5 BSC -- -- 0.020 BSC -- Number of terminal positions N 44 44 Note: the mm values are valid, the inch values contains rounding errors ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1 WARNING – Life Support Applications Policy Elmos Semiconductor AG is continually working to improve th e quality and reliability of its products. Nevertheless, se miconductor devices in general can malfunction or fail due to their inherent electr ical sensitivity and vulnerability to physical stress. It i s the responsibility of the buyer, when utilizing Elmos Semiconductor AG products, to observe standards of safety, and to avoid situations in which malfun ction or failure of an Elmos Semiconductor AG Product could cause loss of human lif e, body injury or damage to property. In development your des igns, please ensure that Elmos Semiconductor AG products are used within specified operating ranges as set forth in the most recent pr oduct specifica- tions. General Disclaimer Information furnished by Elmos Semiconductor AG is believe d to be accurate and reliable. However, no responsibility is assumed by Elmos Semiconductor AG for its use, nor for any infringements of pa tents or other rights of third parties, which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Elmos Semiconductor AG. Elmos Semiconductor AG reserves the right to make changes to this document or the products contained th erein without prior notice, to improve performance, reliab ility, or manufacturabil- ity . Application Disclaimer Circuit diagrams may contain components not manufactured b y Elmos Semiconductor AG, which are included as means of illu strating typical applications. Consequently, complete information suffic ient for construction purposes is not necessarily given. Th e information in the applica- tion examples has been carefully checked and is believed to b e entirely reliable. However, no responsibility is assumed for inaccuracies. Fur- thermore, such information does not convey to the purchaser of the semiconductor devices described any license under th e patent rights of Elmos Semiconductor AG or others.

CAN/LIN SBC Family with DC/DC Voltage Regulator E521 .02/03/04/12/13/14 PRODUCTION DATA – Mar 7, 2016 ELMOS Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet QM-No.: 25DS0093E.0 1 Contact Information Headquarters Elmos Semiconductor AG Heinrich-Hertz-Str. 1 • D-44227 Dortmund (Germany) ℡: +492317549100 /envelopeback: sales-germany@elmos.com /globe1: www.elmos.com Sales and Application Support Office North America Elmos NA. Inc.

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