DS3668 NSC | Alldatasheet

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Y High impedance TTL compatible inputs Y High output currentÐ600 mA per output Y No output latch-up at 35V Y Low output ON voltage (550 mV typ @ 600 mA) Y High breakdown voltage (70V) Y Open collector outputs Y Output clamp diodes for inductive fly-back protection Y NPN inputs for minimal input currents (1 mA typical) Y Low operating power Y Standard 5V power supply Y Power up/down protection Y Fail-safe operation Y 2W power package Y Pin-for-pin compatible with SN75437 Connection Diagram Dual-In-Line Package TL/F/5225–1 Top View Truth Table IN EN OUT HH L LH Z HL Z LL Z H e High state L e Low state Z e High impedance state Order Number DS3668N See NS Package Number N16E C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.

Absolute Maximum Ratings (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Supply Voltage 7.0V Input Voltage 15V Output Voltage 70V Continuous Power Dissipation @ 25§C Free-Air (5) 2075 mW Storage Temperature Range b65§Ct o a150§C Lead Temperature (Soldering, 4 seconds) 260 Operating Conditions Min Max Units Supply Voltage 4.75 5.25 V Ambient Temperature 0 70 Electrical Characteristics (Notes 2 and 3) Symbol Parameter Conditions Min Typ Max Units VIH Input High Voltage 2.0 V VIL Input Low Voltage 0.8 V IIH Input High Current V IN e 5.25V, V CC e 5.25V 1.0 20 mA IIL Input Low Current V IN e 0.4V g10 mA VIK Input Clamp Voltage I I eb 12 mA b0.8 b1.5 V VOL Output Low Voltage I L e 300 mA 0.2 0.7 V IL e 600 mA (Note 4) 0.55 1.5 V ICEX Output Leakage Current V CE e 70V, V IN e 0.8V 100 mA VF Diode Forward Voltage I F e 800 mA 1.2 1.6 V IR Diode Leakage Current V R e 70V 100 mA ICC Supply Current All Inputs High 62 80 mA All Inputs Low 20 mA ITH Protection Circuit 1 1.4 AThreshold Current Switching Characteristics (Note 2) Symbol Parameter Conditions Min Typ Max Units tPHL Turn On Delay R L e 60X,V L e 30V 0.3 1.0 ms tPLH Turn Off Delay R L e 60X,V L e 30V 2 10.0 ms tFZ Protection Enable Delay 61 2 ms(after Detection of Fault) tRL Input Low Time for 1.0 msProtection Circuit Reset Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation. Note 2: Unless otherwise specified, min/max limits apply across the 0 §Ct o a70§C temperature range and the 4.75V to 5.25V power supply range. All typical values are for T A e 25§C and V CC e 5.0V. Note 3: All currents into device pins are shown as positive; all currents out of device pins are shown as negative; all voltages are referenced to ground, unless otherwise specified. All values shown as max or min are so classified on absolute value basis. Note 4: All sections of this quad circuit may conduct rated current simultaneously; however, power dissipation averaged over a short interval of time must fall within specified continuous dissipation ratings. Note 5: For operation over 25 §C free-air temperature, derate linearly to 1328 mW @ 70§C @ the rate of 16.6 mW/ §C.

TL/F/5225–2 *Includes probe and jig capacitance. Switching Waveforms TL/F/5225–3 Typical Application Stepping Motor Driver TL/F/5225–4*L1, L2, L3, L4 are the windings of a bifilar stepping motor. **VMOTOR is the supply voltage of the motor. Protection Circuit Block Diagram TL/F/5225–5

DS3668 Quad Fault Protected Peripheral Driver Physical Dimensions inches (millimeters) Molded Dual-In-Line Package (N) Order Number DS3668N LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failure to perform can into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life failure to perform, when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can effectiveness. be reasonably expected to result in a significant injury to the user. National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Japan Ltd.

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