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PRODUCT RELIABILITY REPORT FOR DS3644, Rev A3 Maxim Integrated Products

4401 South Beltwood Parkway

Dallas, TX 75244-3292 Prepared by: Don Lipps Manager, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email: don.lipps@maxim-ic.com ph: 972-371-3739 fax: 972-371-6016 Rev B, 1/3/08

Conclusion: DS3644, Rev A3 The following qualification successfully meets the quality and reliability standards required of all Maxim products: Device Description: A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated. AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts AfT = Acceleration factor due to Temperature tu = Time at use temperature (e.g. 55°C) ts = Time at stress temperature (e.g. 125°C) k = Boltzmann’s Constant (8.617 x 10-5 eV/°K) Tu = Temperature at Use (°K) Ts = Temperature at Stress (°K) Ea = Activation Energy (e.g. 0.7 ev) The activation energy of the failure mechanism is derived from either internal studies or industry accepted standards, or activation energy of 0.7ev will be used whenever actual failure mechanisms or their activation energies are unknown. All deratings will be done from the stress ambient temperature to the use ambient temperature. An exponential model will be used to determine the acceleration factor for failure mechanisms, which are voltage accelerated. AfV = exp(B*(Vs - Vu)) AfV = Acceleration factor due to Voltage Vs = Stress Voltage (e.g. 7.0 volts) Vu = Maximum Operating Voltage (e.g. 5.5 volts) The Constant, B, related to the failure mechanism is derived from either internal studies or industry accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are unknown. All deratings will be done from the stress voltage to the maximum operating voltage. Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). In addition, Maxim's continuous reliability monitor program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html. The failure rate, Fr, is related to the acceleration during life test by: Fr = X/(ts * AfV * AfT * N * 2) X = Chi-Sq statistical upper limit N = Life test sample size Rev B, 1/3/08

The calculated failure rate for this device/process is: Only data from Operating Life or similar stresses are used for this calculation. The parameters used to calculate this failure rate are as follows: Cf: 60% Ea: 0.7 B: 0 Tu: 25 Vu: 3.6 °C Volts The reliability data follows. At the start of this data is the device information. The next section is the detailed reliability data for each stress. The reliability data section includes the latest data available and may contain some generic data. Product Number denotes specific product data. Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. Bold FITS: 1.1MTTF (YRS): 103071FAILURE RATE: FAILS: 0DEVICE HOURS: 827321919 Device Information: Process: SA E35X-0.5um, 5V CMOS with embedded Array EEPROM, embedded RSE EEPROM, 18V CMOS, VNPN, P2-P1 Cap, LVMOSCAP, HVMOSCAP, Varactor Cap, CrSi R's & Laser Fuses, 3LM. Number of Transistors: 142536 Passivation: TEOS Oxide-Nitride Passivation Die Size: 187 x 155 Interconnect: Aluminum / 0.5% Co pper Gate Oxide Thickness: 120 Å ESD HBM DESCRIPTION READPOINCONDITION QTY FAILSDATE CODE/PRODUCT/LOT FA# 1JESD22-A114 HBM 500 VOLTS 30ESD SENSITIVITY PUL'S1004 DS3644 WS046549D 1JESD22-A114 HBM 1000 VOLTS 30ESD SENSITIVITY PUL'S1004 DS3644 WS046549D 1JESD22-A114 HBM 2000 VOLTS 30ESD SENSITIVITY PUL'S1004 DS3644 WS046549D 1JESD22-A114 HBM 4000 VOLTS 30ESD SENSITIVITY PUL'S1004 DS3644 WS046549D 1JESD22-A114 HBM 8000 VOLTS 33ESD SENSITIVITY PUL'S1004 No FADS3644 WS046549D 3Total: LATCH-UP DESCRIPTION READPOINCONDITION QTY FAILSDATE CODE/PRODUCT/LOT FA# JESD78A, I-TEST 125C 6 0LATCH-UP I 1004 DS3644 WS046549D JESD78A, V-SUPPLY TEST 125C 60LATCH-UP V 1004 DS3644 WS046549D 0Total: Rev B, 1/3/08

DESCRIPTION READPOINCONDITION QTY FAILSDATE CODE/PRODUCT/LOT FA# 1000125C, 4.6 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0839 WJ942986TDS2784 1000125C, 4.6 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0843 WJ941766ODS2784 1000125C, 4.6 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0848 WJ943239LCDS2784 1000125C, 5.5 VOLTS 77 0HIGH TEMP OP LIFE HRS0914 WJ944804ADS2780 1000125C, 5.5 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0916 WJ943240ICDS2784 1000125C, 5.5 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0916 WJ945481ADS2784 192125C, 3.6 VOLTS 45 0HIGH TEMP OP LIFE HRS0922 WJ946542ADS36A92 192125C, 4.5V (PSA) & 9.2V (PSB) 45 0HIGH TEMP OP LIFE HRS0932 WJ946441PMAX17043 192125C, 4.2 VOLTS 77 0HIGH TEMP OP LIFE HRS0933 QJ917612BCDS1873 1000125C, 5.5 V (PSA) & 15.0 V (PSB) 77 0HIGH TEMP OP LIFE HRS0937 WJ046898JCDS2784 1000125C, 5.5 V (PSA) & 15.0 V (PSB) 80 0HIGH TEMP OP LIFE HRS0940 WJ048759ADS2784 192125C, 4.2 VOLTS 77 0HIGH TEMP OP LIFE HRS0946 WJ048840ADS1876 408150C, 3.6 VOLTS 45 0HIGH TEMP OP LIFE HRS0948 WJ946344EDS1091L 408150C, 3.6 VOLTS 45 0HIGH TEMP OP LIFE HRS0948 WJ946344EDS1091L 1000125C, 5.5 V (PSA) & 15.0 V (PSB) 80 0HIGH TEMP OP LIFE HRS0951 WJ049559ADS2784 192125C, 3.6V (PSA) & 3.3V (PSB) 45 0HIGH TEMP OP LIFE HRS1004 DS3644 WS046549D 0Total: FITS: 1.1MTTF (YRS): 103071FAILURE RATE: FAILS: 0DEVICE HOURS: 827321919 Rev B, 1/3/08