DG508509 MAXIM | Alldatasheet
Document overview
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- PDF pages: 4
Technical content
SCOPE: MONOLITHIC CMOS, ANALOG MULTIPLEXER Device Type Generic Number
01 DG508AA(x)/883B
02 DG509AA(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 Case Outline Package Code K GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16 L CDFP4-16 16 LEAD FLATPACK F16 P GDIP1-T16 or CDIP2-T16 16 LEAD Sidebraze R16 Z CQCC1-N20 20-Pin Ceramic LCC L20 Absolute Maximum Ratings Voltage Referenced to V- or 20mA (whichever occur s first) A=+70°C Thermal Resistance, Junction to Case, Θ JC: Thermal Resistance, Junction to Ambient, Θ JA: Recommended Operating Conditions. NOTE 1: Signals on S, D, IN exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current to maximum current ratings. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Page 2 of 6
TABLE 1. ELECTRICAL TESTS
TABLE 1. ELECTRICAL TESTS NOTE 2: ID(ON) is leakage from driver into “on” switch. and MAX339. Minimum operating voltage for DG508ADY and DG509ADY is ±9V.
17 V+ S1B
18 GND V+
19 A2 GND
20 A1 A1
- Test Condition, A, B, C, or D.
- Interim and final electrical test requirements shall be specified in Table 2.
- Tests as specified in Table 2.
- Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
a. End-point electrical parameters shall be specified in Table 1.
- Test condition A, B, C, D.
- Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
- PDA applies to Subgroup 1 only.