DG201202 MAXIM | Alldatasheet

Document overview

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Technical content

SCOPE: QUAD SPST CMOS ANALOG SWITCHES Device Type Generic Number

01 DG201AA(x)/883B

02 DG202A(x)/883B

Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter Mil-Std-1835 Case Outline Package Code L CDFP4-F16 16 LEAD FLATPACK F16 K GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16 Z CQCC1-N20 20-Pin Ceramic LCC L20 Absolute Maximum Ratings Voltage Referenced to V- whiche ver occurs first Thermal Resistance, Junction to Case, Θ JC: Thermal Resistance, Junction to Ambient, Θ JA: Recommended Operating Conditions. NOTE 1: Signals on SX, DX, or INX exceeding V+ or V- are clamped by internal diodes, and are also internally current limited to 25mA. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Page 2 of 6

TABLE 1. ELECTRICAL TESTS

FIGURE 1: SWITCHING TIME TEST CIRCUIT: See Commercial Data Sheet TRUTH TABLE TERMINAL CONNECTION Device Type Logic Switch TERMINAL NUMBER DG201A & DG202 DG201A & DG202 01 0 ON J16 & F16 L20 01 1 OFF 1 IN 1 NC 02 0 OFF 2 D 1 IN1 02 1 ON 3 S 1 D1 4V - S 1

5 GND V-

ORDERING Information 8I N 4 S4

01 DG201AAK /883B 9 IN 3 D4

01 DG201AAL /883B 10 D 3 IN4

01 DG201AAZ /883B 11 S 3 NC

02 DG202AK /883B 12 NC IN 3

13 V+ D 3

14 S 2 S3

15 D 2 NC

16 IN 2 NC

18 S 2

19 D 2

20 IN 2

  1. Test Condition, A, B, C, or D.
  2. Interim and final electrical test requirements shall be specified in Table 2.
  3. Tests as specified in Table 2.
  4. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.

a. End-point electrical parameters shall be specified in Table 1.

  1. Test condition A, B, C, D.
  2. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.

TABLE 2. ELECTRICAL TEST REQUIREMENTS

  • PDA applies to Subgroup 1 only.

** Subgroups 10 and 11, if not tested shall be guaranteed to the limits of Table 1.