DAC081C081 TI1 | Alldatasheet
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Technical content
VREF * DAC081C081 / DAC081C085 SCL SDA BUFFER VOUT 2.5k 100k
8 BIT DAC
ADR1* REF ADR0 * NOTE: ADR1 and VREF are for the DAC081C085 only. The DAC081C085 uses an external reference (VREF ), whereas, the DAC081C081 uses the supply (VA) as the reference. VA* Product Folder Sample & Buy T echnical Documents Tools & Software Support & Community An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 DAC081C08x8-BitMicroPowerDigital-to-AnalogConverterWithAnI2C-Compatible Interface
1 Features
1• Ensured Monotonicity to 8-bits
- Low Power Operation: 156 µA Maximum at 3.3 V
- Extended Power Supply Range (2.7 V to 5.5 V)
- I2C-Compatible 2-Wire Interface Which Supports Standard (100-kHz), Fast (400-kHz), and High- Speed (3.4-MHz) Modes
- Rail-to-Rail Voltage Output
- Very Small Package
- Resolution 8 Bits
- INL ±0.6 LSB (Maximum)
- DNL ±0.1 LSB (Maximum)
- Settling Time 4.5 μs (Maximum)
- Zero Code Error +10 mV (Maximum)
- Full-Scale Error −0.7 %FS (Maximum)
- Supply Power – Normal – 380 μW (3 V) – 730 μW (5 V) Typical – Power Down – 0.5 μW (3 V) – 0.9 μW (5 V) Typical
2 Applications
- Industrial Process Control
- Portable Instruments
- Digital Gain and Offset Adjustments
- Programmable Voltage and Current Sources
- Test Equipment
3 Description
The DAC081C08x device is an 8-bit, single-channel, voltage-output digital-to-analog converter (DAC) that operates from a 2.7-V to 5.5-V supply. The output amplifier allows rail-to-rail output swing and has an 4.5-µsec settling time. The DAC081C081 uses the supply voltage as the reference to provide the widest dynamic output range and typically consumes 132 µA while operating at 5 V. It is available in 6-lead SOT and WSON packages and provides three address options (pin selectable). As an alternative, the DAC081C085 provides nine I2C addressing options and uses an external reference. It has the same performance and settling time as the DAC081C081. It is available in an 8-lead VSSOP. The DAC081C081 and DAC081C085 use a 2-wire, I2C-compatible serial interface that operates in all three speed modes, including high-speed mode (3.4 MHz). An external address selection pin allows up to three DAC081C081 or nine DAC081C085 devices per 2-wire bus. Pin-compatible alternatives to the DAC081C081 are available that provide additional address options. Device Information(1) PART NUMBER PACKAGE BODY SIZE (NOM) DAC081C081 WSON (6) 2.20 mm × 2.50 mm SOT (6) 1.60 mm × 2.90 mm DAC081C085 VSSOP (8) 3.00 mm × 3.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Block Diagram
DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated Table of Contents
13 Mechanical, Packaging, and Orderable
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision D (March 2013) to Revision E Page
- Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Changes from Revision C (March 2013) to Revision D Page
DAC081C081,DAC081C085 www.ti.com SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 Product Folder Links: DAC081C081 DAC081C085 Submit Documentation FeedbackCopyright © 2008–2016, Texas Instruments Incorporated
5 Description (continued)
The DAC081C081 and DAC081C085 each have a 16-bit register that controls the mode of operation, the power- down condition, and the output voltage. A power-on reset circuit ensures that the DAC output powers up to zero volts. A power-down feature reduces power consumption to less than a microWatt. Their low power consumption and small packages make these DACs an excellent choice for use in battery-operated equipment. Each DAC operates over the extended industrial temperature range of −40°C to +125°C. The DAC081C081 and DAC081C085 are each part of a family of pin-compatible DACs that also provide 12- and 10-bit resolution. For 12-bit DACs see the DAC121C081 and DAC121C085. For 10-bit DACs see the DAC101C081 and DAC101C085.
2.1k 41.5k 41.5k ADR1 SDA ADR0 VA GND VSSOP 3SCL 6 VREF VOUT DAC081C085 ADR0 SCL SDA VOUT VA GND SOT DAC081C081 ADR0 SCL SDA VOUT VA GND WSON DAC081C081 DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated
6 Pin Configuration and Functions
ADR0 1 6 1 Digital Input, three levels Tri-state Address Selection Input. Sets the two Least Significant Bits (A1 and A0) of the 7-bit slave address. (see Table 1) ADR1 — — 2 Digital Input, three levels Tri-state Address Selection Input. Sets Bits A6 and A3 of the 7-bit slave address. (see Table 1) GND 4 3 5 Ground Ground for all on-chip circuitry. PAD (WSON only) — — Ground Exposed die attach pad can be connected to ground or left floating. Soldering the pad to the PCB offers optimal thermal performance and enhances package self-alignment during reflow. SCL 2 5 3 Digital Input Serial Clock Input. SCL is used together with SDA to control the transfer of data in and out of the device. SDA 3 4 4 Digital Input/Output Serial Data bidirectional connection. Data is clocked into or out of the internal 16-bit register relative to the clock edges of SCL. This is an open drain data line that must be pulled to the supply (VA) by an external pullup resistor. VA 5 2 6 Supply Power supply input. For the SOT and WSON versions, this supply is used as the reference. Must be decoupled to GND. VOUT 6 1 8 Analog Output Analog Output Voltage VREF — — 7 Supply Unbufferred reference voltage. For the VSSOP-8, this supply is used as the reference. VREF must be free of noise and decoupled to GND.
DAC081C081,DAC081C085 www.ti.com SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 Product Folder Links: DAC081C081 DAC081C085 Submit Documentation FeedbackCopyright © 2008–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltages are measured with respect to GND = 0 V, unless otherwise specified. (3) If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications. (4) When the input voltage at any pin exceeds 5.5 V or is less than GND, the current at that pin should be limited to 10 mA. The 20-mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 10 mA to two. (5) The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by TJmax, the junction-to-ambient thermal resistance (RθJA), and the ambient temperature (TA), and can be calculated using the formula PDMAX = (TJmax − TA) / RθJA. The values for maximum power dissipation will be reached only when the device is operated in a severe fault condition (for example, when input or output pins are driven beyond the operating ratings, or the power supply polarity is reversed).
7 Specifications
7.1 Absolute Maximum Ratings
See (1)(2)(3) MIN MAX UNIT Supply voltage, VA −0.3 6.5 V Voltage on any Input Pin −0.3 6.5 V Input current at any pin(4) ±10 mA Package input current(4) ±20 mA Power consumption at TA = 25°C See (5) Junction temperature 150 °C Storage temperature, Tstg −65 150 °C
7.2 ESD Ratings
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 All pins except 2 and 3 ±2500 V Pins 2 and 3 ±5000 Charged-device model (CDM), per JEDEC specification JESD22-C101 All pins except 2 and 3 ±1000 Pins 2 and 3 ±1000 Machine model (MM) All pins except 2 and 3 ±250 Pins 2 and 3 ±350 DAC081C081 in DDC Package V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 All pins except 4 and 5 ±2500 V Pins 4 and 5 ±5000 Charged-device model (CDM), per JEDEC specification JESD22-C101 All pins except 4 and 5 ±1000 Pins 4 and 5 ±1000 Machine model (MM) All pins except 4 and 5 ±250 Pins 4 and 5 ±350 DAC081C085 in DGK Package V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 All pins except 3 and 4 ±2500 V Pins 3 and 4 ±5000 Charged-device model (CDM), per JEDEC specification JESD22-C101 All pins except 3 and 4 ±1000 Pins 3 and 4 ±1000 Machine model (MM) All pins except 3 and 4 ±250 Pins 3 and 4 ±350
DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated (1) All voltages are measured with respect to GND = 0 V, unless otherwise specified. (2) The inputs are protected as shown below. Input voltage magnitudes up to 5.5 V, regardless of VA, will not cause errors in the conversion result. For example, if VA is 3 V, the digital input pins can be driven with a 5V logic device.
7.3 Recommended Operating Conditions
See (1) MIN NOM MAX UNIT Operating Temperature −40 TA 125 °C Supply Voltage, VA 2.7 5.5 V Reference Voltage, VREFIN 1 VA V Digital Input Voltage(2) 5.5 V Output Load 0 1500 pF (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. (2) Soldering process must comply with Reflow Temperature Profile specifications. Refer to http://www.ti.com/packaging. Reflow temperature profiles are different for lead-free packages.
7.4 Thermal Information
THERMAL METRIC(1)(2) DAC081C081 DAC081C085 UNITNGF (WSON) DDC (SOT) DGK (VSSOP)
6 PINS 6 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 190 250 240 °C/W
DAC081C081,DAC081C085 www.ti.com SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 Product Folder Links: DAC081C081 DAC081C085 Submit Documentation FeedbackCopyright © 2008–2016, Texas Instruments Incorporated (1) Typical figures are at TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average Outgoing Quality Level). (2) This parameter is ensured by design and/or characterization and is not tested in production.
7.5 Electrical Characteristics
The following specifications apply for VA = 2.7 V to 5.5 V, VREF = VA, CL = 200 pF to GND, input code range 3 to 252. All Maximum and Minimum limits apply for TMIN ≤ TA ≤ TMAX and all Typical limits are at TA = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP(1) MAX(1) UNIT STATIC PERFORMANCE INL Resolution 8 Bits Monotonicity 8 Bits Integral non-linearity 0.14 0.6 LSB −0.6 −0.14 LSB DNL Differential non-linearity 0.04 0.1 LSB −0.1 −0.02 LSB ZE Zero code error IOUT = 0 1.1 10 mV FSE Full-scale error IOUT = 0 −0.1 −0.7 %FSR GE Gain error All ones loaded to DAC register −0.2 −0.7 %FSR ZCED Zero code error drift −20 µV/°C TC GE Gain error tempco VA = 3 V −0.7 ppm FSR/°C VA = 5 V −1 ppm FSR/°C ANALOG OUTPUT CHARACTERISTICS (VOUT) Output voltage range(2) DAC081C085 0 VREF V DAC081C081 0 VA V ZCO Zero code output VA = 3 V, IOUT = 200 µA 1.3 mV VA = 5 V, IOUT = 200 µA 7 mV FSO Full-scale output VA = 3 V, IOUT = 200 µA 2.984 V VA = 5 V, IOUT = 200 µA 4.989 V IOS Output short circuit current (ISOURCE) VA = 3 V, VOUT = 0 V, input code = FFFh. 56 mA VA = 5 V, VOUT = 0 V, input code = FFFh. 69 mA IOS Output short circuit current (ISINK) VA = 3 V, VOUT = 3 V, input code = 000h. −52 mA VA = 5 V, VOUT = 5 V, input code = 000h. −75 mA IO Continuous output current(2) Available on the DAC output 11 mA CL Maximum load capacitance RL = ∞ 1500 pF RL = 2kΩ 1500 pF ZOUT DC output impedance 7.5 Ω
DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated Electrical Characteristics (continued) The following specifications apply for VA = 2.7 V to 5.5 V, VREF = VA, CL = 200 pF to GND, input code range 3 to 252. All Maximum and Minimum limits apply for TMIN ≤ TA ≤ TMAX and all Typical limits are at TA = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP(1) MAX(1) UNIT REFERENCE INPUT CHARACTERISTICS- (DAC081C085 only) VREF Input range minimum 1 0.2 V Input range maximum VA V Input impedance 120 kΩ LOGIC INPUT CHARACTERISTICS (SCL, SDA) VIH Input high voltage 0.7 × VA V VIL Input low voltage 0.3 × VA V IIN Input current ±1 µA CIN Input pin capacitance(2) 3 pF VHYST Input hysteresis 0.1 × VA V LOGIC INPUT CHARACTERISTICS (ADR0, ADR1) VIH Input high voltage VA – 0.5 V VIL Input low voltage 0.5 V IIN Input current ±1 µA LOGIC OUTPUT CHARACTERISTICS (SDA) VOL Output low voltage ISINK = 3 mA 0.4 V ISINK = 6 mA 0.6 V IOZ High-impedence output leakage current ±1 µA POWER REQUIREMENTS VA Supply voltage minimum 2.7 V Supply voltage maximum 5.5 NORMAL -- VOUT SET TO MIDSCALE. 2-WIRE INTERFACE QUIET (SCL = SDA = VA) (OUTPUT UNLOADED) IST_VA-1 VA DAC081C081 supply current VA = 2.7 V to 3.6 V 105 156 µA VA = 4.5 V to 5.5 V 132 214 µA IST_VA-5 VA DAC081C085 supply current VA = 2.7 V to 3.6 V 86 118 µA VA = 4.5 V to 5.5 V 98 152 µA IST_VREF VREF supply current (DAC081C085 only) VA = 2.7 V to 3.6 V 37 43 µA VA = 4.5 V to 5.5 V 53 61 µA PST Power consumption (VA & VREF for DAC081C085) VA = 3 V 380 µW VA = 5 V 730 µW CONTINUOUS OPERATION -- 2-WIRE INTERFACE ACTIVELY ADDRESSING THE DAC AND WRITING TO THE DAC REGISTER (OUTPUT UNLOADED) ICO_VA-1 VA DAC081C081 supply current fSCL = 400 kHz VA = 2.7 V to
3.6 V 134 220 µA
VA = 4.5 V to
5.5 V 192 300 µA
fSCL = 3.4 MHz VA = 2.7 V to
3.6 V 225 320 µA
VA = 4.5 V to
5.5 V 374 500 µA
DAC081C081,DAC081C085 www.ti.com SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 Product Folder Links: DAC081C081 DAC081C085 Submit Documentation FeedbackCopyright © 2008–2016, Texas Instruments Incorporated Electrical Characteristics (continued) The following specifications apply for VA = 2.7 V to 5.5 V, VREF = VA, CL = 200 pF to GND, input code range 3 to 252. All Maximum and Minimum limits apply for TMIN ≤ TA ≤ TMAX and all Typical limits are at TA = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP(1) MAX(1) UNIT ICO_VA-5 VA DAC081C085 supply current fSCL = 400 kHz VA = 2.7 V to
3.6 V 101 155 µA
VA = 4.5 V to
5.5 V 142 220 µA
fSCL = 3.4 MHz VA = 2.7 V to
3.6 V 193 235 µA
VA = 4.5 V to
5.5 V 325 410 µA
ICO_VREF VREF supply current (DAC081C085 only) VA = 2.7 V to 3.6 V 33.5 55 µA VA = 4.5 V to 5.5 V 49.5 71.4 µA PCO Power consumption (VA and VREF for DAC081C085) fSCL = 400 kHz VA = 3 V 480 µW VA = 5 V 1.06 mW fSCL = 3.4 MHz VA = 3 V 810 µW VA = 5 V 2.06 mW POWER DOWN -- 2-WIRE INTERFACE QUIET (SCL = SDA = VA) AFTER PD MODE WRITTEN TO DAC REGISTER (OUTPUT UNLOADED) IPD Supply current (VA and VREF for DAC081C085) All power-down modes VA = 2.7 V to 3.6 V 0.13 1.52 µA VA = 4.5 V to 5.5 V 0.15 3.25 µA PPD Power consumption (VA and VREF for DAC081C085) All power-down modes VA = 3 V 0.5 µW VA = 5 V 0.9 µW
DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated (1) Cb refers to the capacitance of one bus line. Cb is expressed in pF units. (2) Typical figures are at TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average Outgoing Quality Level). (3) This parameter is ensured by design and/or characterization and is not tested in production. (4) Applies to the Multiplying DAC configuration. In this configuration, the reference is used as the analog input. The value loaded in the DAC Register will digitally attenuate the signal at Vout.
7.6 AC and Timing Characteristics
The following specifications apply for VA = 2.7 V to 5.5 V, VREF = VA, RL = Infinity, CL = 200 pF to GND. All Maximum and Minimum limits apply for TMIN ≤ TA ≤ TMAX and all Typical limits are at TA = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS(1) MIN TYP(2) MAX(1)(2) UNIT ts Output voltage settling time(3) 40h to C0h code change RL = 2 kΩ, CL = 200 pF 3 4.5 µs SR Output slew rate 1 V/µs Glitch impulse Code change from 80h to 7Fh 12 nV-sec Digital feedthrough 0.5 nV-sec Multiplying bandwidth(4) VREF = 2.5 V ± 0.1 Vpp 160 kHz Total harmonic distortion(4) VREF = 2.5 V ± 0.1 Vpp input frequency = 10 kHz 70 dB tWU Wake-up time VA = 3 V 0.8 µsec VA = 5 V 0.5 µsec DIGITAL TIMING SPECS (SCL, SDA) fSCL Serial clock frequency Standard mode 100 kHz Fast mode 400 High-speed mode, Cb = 100 pF 3.4 MHz High-speed mode, Cb = 400 pF 1.7 tLOW SCL low time Standard mode 4.7 µs Fast mode 1.3 High-speed mode, Cb = 100 pF 160 ns High-speed mode, Cb = 400 pF 320 tHIGH SCL high time Standard mode 4 µs Fast mode 0.6 High-speed mode, Cb = 100 pF 60 ns High-speed mode, Cb = 400 pF 120 tSU;DAT Data set-up time Standard mode 250 nsFast mode 100 High-speed mode 10 tHD;DAT Data hold time Standard mode 0 3.45 µs Fast mode 0 0.9 High-speed mode, Cb = 100 pF 0 70 ns High-speed mode, Cb = 400 pF 0 150 tSU;STA Set-up time for a start or a repeated start condition Standard mode 4.7 µs Fast mode 0.6 High-speed mode 160 ns tHD;STA Hold time for a start or a repeated start condition Standard mode 4 µs Fast mode 0.6 High-speed mode 160 ns tBUF Bus free time between a stop and start condition Standard mode 4.7 µs Fast mode 1.3 tSU;STO Set-up time for a stop condition Standard mode 4 µs Fast mode 0.6 High-speed mode 160 ns
DAC081C081,DAC081C085 www.ti.com SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 Product Folder Links: DAC081C081 DAC081C085 Submit Documentation FeedbackCopyright © 2008–2016, Texas Instruments Incorporated AC and Timing Characteristics (continued) The following specifications apply for VA = 2.7 V to 5.5 V, VREF = VA, RL = Infinity, CL = 200 pF to GND. All Maximum and Minimum limits apply for TMIN ≤ TA ≤ TMAX and all Typical limits are at TA = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS(1) MIN TYP(2) MAX(1)(2) UNIT (5) Spike suppression filtering on SCL and SDA will supress spikes that are less than 50ns for standard-fast mode and less than 10ns for hs-mode. trDA Rise time of SDA signal Standard mode 1000 ns Fast mode 20 + 0.1 Cb 300 High-speed mode, Cb = 100 pF 10 80 High-speed mode, Cb = 400 pF 20 160 tfDA Fall time of SDA signal Standard mode 250 ns Fast mode 20 + 0.1 Cb 250 High-speed mode, Cb = 100 pF 10 80 High-speed mode, Cb = 400 pF 20 160 trCL Rise time of SCL signal Standard mode 1000 ns Fast mode 20 + 0.1 Cb 300 High-speed mode, Cb = 100 pF 10 40 High-speed mode, Cb = 400 pF 20 80 trCL1 Rise time of SCL signal after a repeated start condition and after an acknowledge bit. Standard mode 1000 ns Fast mode 20 + 0.1 Cb 300 High-speed mode, Cb = 100 pF 10 80 High-speed mode, Cb = 400 pF 20 160 tfCL Fall time of a SCL signal Standard mode 300 ns Fast mode 20 + 0.1 Cb 300 High-speed mode, Cb = 100 pF 10 40 High-speed mode, Cb = 400 pF 20 80 Cb Capacitive load for each bus line (SCL and SDA) 400 pF tSP Pulse width of spike suppressed(5)(3) Fast mode 50 ns High-speed mode 10 toutz SDA output delay (see Additional Timing Information: toutz) Fast mode 87 270 ns High-speed mode 38 60
7.7 Typical Characteristics
VREF = VA, fSCL = 3.4 MHz, TA = 25°C, Input Code Range 3 to 252, unless otherwise stated. Figure 3. INL Figure 4. DNL Figure 5. INL/DNL vs Temperature at VA = 3 V Figure 6. INL/DNL vs Temperature at VA = 5 V Figure 7. INL/DNL vs VREFIN at VA = 3 V Figure 8. INL/DNL vs VREFIN at VA = 5 V
VREF * DAC081C081 / DAC081C085 SCL SDA BUFFER VOUT 2.5k 100k ADR1* REF ADR0 * NOTE: ADR1 and VREF are for the DAC081C085 only. The DAC081C085 uses an external reference (VREF ), whereas, the DAC081C081 uses the supply (VA) as the reference. VA* DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated
8 Detailed Description
8.1 Overview
The DAC081C081 is fabricated on a CMOS process with an architecture that consists of switches and resistor strings that are followed by an output buffer.
8.2 Functional Block Diagram
8.3 Feature Description
8.3.1 DAC Section
For simplicity, a single resistor string is shown in Figure 20. This string consists of 256 equal-valued resistors with a switch at each junction of two resistors, plus a switch to ground. The code loaded into the DAC register determines which switch is closed, connecting the proper node to the amplifier. The input coding is straight binary with an ideal output voltage of Equation 1: VOUT = VREF × (D / 256) where
- D is the decimal equivalent of the binary code that is loaded into the DAC register. (1) D can take on any integer value between 0 and 255. This configuration ensures that the DAC is monotonic.
Figure 20. DAC Resistor String
8.3.2 Output Amplifier
amplifier are described in the Electrical Characteristics. code and full-scale outputs for given load currents are available in the Electrical Characteristics.
8.3.3 Reference Voltage
voltage source with low output impedance. VREF be kept as clean as possible. The Application and Implementation section describes a handful of ways to drive the reference appropriately. Refer to Using References as Power Supplies for details.
8.3.4 Power-On Reset
sequence is made to the DAC. the ADC performs as specified.
8.3.5 Simultaneous Reset
DACs will power-down simultaneously.
8.3.6 Additional Timing Information: toutz
Figure 21. Data Output Timing The toutz specification is typically 87 ns in standard-fast mode and 38 ns in Hs-Mode.
8.4 Device Functional Modes
8.4.1 Power-Down Modes
will be updated with the new 8-bit data value. The time to exit power-down (wake-up time) is typically 0.8 µs at 3 V and 0.5 µs at 5 V.
8.5 Programming
8.5.1 Serial Interface
capacitance and operating speed.
condition, this bit must be a NACK from the master.
8.5.2 Basic I2C Protocol
last data byte and creates a Stop condition on the bus. the same speed mode as before the repeated start condition. idle until a master generates a start condition. Figure 22. Basic Operation
8.5.3 Standard-Fast Mode
In standard-fast mode, the master generates a start condition by driving SDA from high to low while SCL is high. DAC081C081 NACKs the master. For a write operation, the master follows the ACK by sending the upper eight data bits to the DAC081C081. end communication, or generates a repeated start condition to communicate with another device on the bus.
(1) Pin-compatible alternatives to the DAC101C081 options are available with additional address options. condition to end communication on the bus, or a repeated start to communicate with another device on the bus.
8.5.4 High-Speed (Hs) Mode
increasing the bus speed and generating a repeated start condition (driving SDA low while SCL is pulled high). above in the "basic operation" diagram (see Figure 22). again before increasing the bus speed and switching to Hs-mode. Figure 23. Beginning Hs-Mode Communication
8.5.5 I2C Slave (Hardware) Address
the broadcast address, all the DAC081C081's and DAC081C085's will respond and update synchronously. Table 1. Slave Addresses
Table 1. Slave Addresses (continued)
8.5.6 Writing to the DAC Register
for a maximum DAC conversion rate of 188.9 kilo-conversions per second in Hs-mode. Figure 24. Typical Write to the DAC Register
8.5.7 Reading from the DAC Register
Figure 25. Typical Read from the DAC Register
8.6 Registers
8.6.1 DAC Register
Register, VOUT will update on the rising edge of the ACK following the lower data byte. Figure 26. DAC Register Contents
0.1 PF+10 PF
9 Application and Implementation
validate and test their design implementation to confirm system functionality.
9.1 Application Information
9.1.1 Bipolar Operation
output may be obtained with the circuit in Figure 27. This circuit will provide an output voltage range of ±5 Volts. A rail-to-rail amplifier should be used if the amplifier supplies are limited to ±5 V. Figure 27. Bipolar Operation
- D is the input code in decimal form. (2) With VA = 5V and R1 = R2, A list of rail-to-rail amplifiers suitable for this application are indicated in Table 2.
Table 2. Some Rail-to-Rail Amplifiers
9.1.2 DSP/Microprocessor Interfacing
to simplify the design process.
9.1.2.1 Interfacing to the 2-Wire Bus
threshold can be achieved. If used, RS is typically 51 Ω. Figure 28. Serial Interface Connection Diagram
9.1.2.2 Interfacing to a Hs-mode Bus
tighter timing specs. Please refer to the I2C Specification for further details.
9.2 Typical Application
Figure 29. Pressure Sensor Gain Adjust
9.2.1 Design Requirements
the pressure sensor output by adjusting the bias voltage to the bridge pressure sensor.
9.2.2 Detailed Design Procedure
times the output of the DAC081C081, thus providing the desired gain correction. times relative to the ratio of the ADC input divided by the DAC081C081 output voltage.
9.2.3 Application Curve
Figure 30. INL vs Input Code
10 Power Supply Recommendations
10.1 Using References as Power Supplies
the analog supply (VA) as the reference.
10.1.1 LM4132
reduce output noise. The LM4132 comes in a space-saving 5-pin SOT23. Figure 31. The LM4132 as a Power Supply
10.1.2 LM4050
DAC081C081. It is available in 4.096-V and 5-V versions and comes in a space-saving 3-pin SOT23. Figure 32. The LM4050 as a Power Supply
- VZ(min) and VZ(max) are the nominal LM4050 output voltages ± the LM4050 output tolerance over temperature,
- IZ(max) is the maximum allowable current through the LM4050,
- IZ(min) is the minimum current required by the LM4050 for proper regulation,
- and IDAC(max) is the maximum DAC081C081 supply current. (7)
10.1.3 LP3985
in a space-saving 5-pin SOT-23 and 5-bump DSBGA packages. Figure 33. Using the LP3985 Regulator understanding of the capacitor specification is required to ensure correct device operation.
10.1.4 LP2980
grade. It is available in 3-V, 3.3-V and 5-V versions, among others. Figure 34. Using the LP2980 Regulator
11 Layout
11.1 Layout Guidelines
separate analog and digital areas. The areas are defined by the locations of the analog and digital power planes. continuous return path below their traces. board. These clock and data lines should have controlled impedances.
11.2 Layout Example
Figure 35. Typical Layout
DAC081C081,DAC081C085 SNAS449E –FEBRUARY 2008–REVISED JANUARY 2016 www.ti.com Product Folder Links: DAC081C081 DAC081C085 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated
12 Device and Documentation Support
12.1 Device Support
12.1.1 Development Support
For development support, see the following:
- 12-Bit Micro Power Digital-to-Analog Converter with an I2C-Compatible Interface, DAC121C081
- 12-Bit Micro Pwr DAC w/ I2C-Compatible Interface & External Reference, DAC121C085
- 10-Bit Micro Power Digital-to-Analog Converter with an I2C-Compatible Interface, DAC101C081
- 10-Bit Micro Pwr DAC w/ I2C-Compatible Interface & External Reference, DAC101C085
12.1.2 Device Nomenclature
12.1.2.1 Specification Definitions
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB, which is VREF / 256 = VA / 256. DIGITAL FEEDTHROUGH is a measure of the energy injected into the analog output of the DAC from the digital inputs when the DAC output is not updated. It is measured with a full-scale code change on the data bus. FULL-SCALE ERROR is the difference between the actual output voltage with a full scale code (FFFh) loaded into the DAC and the value of VA x 255 / 256. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated from Zero and Full-Scale Errors as GE = FSE - ZE, where GE is Gain error, FSE is Full-Scale Error and ZE is Zero Error. GLITCH IMPULSEis the energy injected into the analog output when the input code to the DAC register changes. It is specified as the area of the glitch in nanovolt-seconds. INTEGRAL NON-LINEARITY (INL)is a measure of the deviation of each individual code from a straight line through the input to output transfer function. The deviation of any given code from this straight line is measured from the center of that code value. The end point method is used. INL for this product is specified over a limited range, per the Electrical Tables. LEAST SIGNIFICANT BIT (LSB) is the bit that has the smallest value or weight of all bits in a word. This value is LSB = VREF / 2n where VREF is the supply voltage for this product, and "n" is the DAC resolution in bits, which is 8 for the DAC081C081. MAXIMUM LOAD CAPACITANCEis the maximum capacitance that can be driven by the DAC with output stability maintained. MONOTONICITY is the condition of being monotonic, where the DAC has an output that never decreases when the input code increases. MOST SIGNIFICANT BIT (MSB) is the bit that has the largest value or weight of all bits in a word. Its value is 1/2 of VA. MULTIPLYING BANDWIDTH is the frequency at which the output amplitude falls 3dB below the input sine wave on VREFIN with a full-scale code loaded into the DAC. POWER EFFICIENCY is the ratio of the output current to the total supply current. The output current comes from the power supply. The difference between the supply and output currents is the power consumed by the device without a load. SETTLING TIME is the time for the output to settle to within 1/2 LSB of the final value after the input code is updated. TOTAL HARMONIC DISTORTION (THD)is the measure of the harmonics present at the output of the DACs with an ideal sine wave applied to VREFIN. THD is measured in dB. WAKE-UP TIME is the time for the output to exit power-down mode. This time is measured from the rising edge of SCL during the ACK bit of the lower data byte to the time the output voltage deviates from the
12.2 Related Links
resources, tools and software, and quick access to sample or buy. Table 3. Related Links
12.3 Community Resources
solve problems with fellow engineers. contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
during storage or handling to prevent electrostatic damage to the MOS gates.
12.6 Glossary
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
www.ti.com 8-Oct-2015 Addendum-Page 1 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/Ball Finish (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples DAC081C081CIMK/NOPB ACTIVE SOT DDC 6 1000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 X86C DAC081C081CIMKX/NOPB ACTIVE SOT DDC 6 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 X86C DAC081C081CISD/NOPB ACTIVE WSON NGF 6 1000 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 125 X89 DAC081C081CISDX/NOPB ACTIVE WSON NGF 6 4500 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 125 X89 DAC081C085CIMM/NOPB ACTIVE VSSOP DGK 8 1000 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 125 X92C DAC081C085CIMMX/NOPB ACTIVE VSSOP DGK 8 3500 Green (RoHS & no Sb/Br) CU SN Level-1-260C-UNLIM -40 to 125 X92C (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device.
www.ti.com 8-Oct-2015 Addendum-Page 2 (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
*All dimensions are nominal Device Package Type Package Drawing Pins SPQ Reel Diameter (mm) Reel Width W1 (mm) (mm) (mm) (mm) (mm) W (mm) Pin1 Quadrant DAC081C081CIMKX/NOP B DAC081C081CISDX/NOP B DAC081C085CIMM/NOP B DAC081C085CIMMX/NO PB PACKAGE MATERIALS INFORMATION www.ti.com 8-Oct-2015 Pack Materials-Page 1
*All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) DAC081C081CIMK/NOPB SOT DDC 6 1000 210.0 185.0 35.0 DAC081C081CIMKX/NOP B SOT DDC 6 3000 210.0 185.0 35.0 DAC081C081CISD/NOPB WSON NGF 6 1000 210.0 185.0 35.0 DAC081C081CISDX/NOP B WSON NGF 6 4500 367.0 367.0 35.0 DAC081C085CIMM/NOPB VSSOP DGK 8 1000 210.0 185.0 35.0 DAC081C085CIMMX/NOP B VSSOP DGK 8 3500 367.0 367.0 35.0 PACKAGE MATERIALS INFORMATION www.ti.com 8-Oct-2015 Pack Materials-Page 2
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