CD41063BMN

CD40161BM NSC | Alldatasheet

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Technical content

Features

Y Wide supply voltage range 3.0V to 15V Y High noise immunity 0.45 V DD (typ.) Y Low power TTL fan out of 2 driving 74L compatibility or 1 driving 74LS Y Internal look-ahead for fast counting schemes Y Carry output for N-bit cascading Y Load control line Y Synchronously programmable Y Equivalent to MC14160B, MC14161B, MC14162B, MC14163B Y Equivalent to MM74C160, MM74C161, MM74C162, MM74C163 Connection Diagram Dual-In-Line Package TL/F/5986–1 Top View Order Number CD40160B, CD40161B, CD40162B or CD40163B C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.

Absolute Maximum Ratings (Notes1&2 ) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. DC Supply Voltage (V DD) b0.5 to a18 V DC Input Voltage (V IN) b0.5 to V DD a0.5 V DC Storage Temperature Range (T S) b65§Ct o a150§C Power Dissipation (P D) Dual-In-Line 700 mW Small Outline 500 mW Lead Temperature (Soldering, 10 seconds) 260 Recommended Operating Conditions (Note 2) DC Supply Voltage (V DD) 3 Vt o1 5V DC Input Voltage (V IN) 0 Vt oV DD VDC Operating Temperature Range (T A) CD40XXXBM b55§Ct o a125§C CD40XXXBC b40§Ct o a85§C Limits Symbol Parameter Conditions b55§C a25§C a125§C Units Min Max Min Typ Max Min Max IDD Quiescent Device V DD e 5V 5 5 150 mA Current V DD e 10V 10 10 300 mA VDD e 15V 20 20 600 mA VOL Low Level Output lIOl k 1 mA Voltage V DD e 5V 0.05 0.05 0.05 V VDD e 10V 0.05 0.05 0.05 V VDD e 15V 0.05 0.05 0.05 V VOH High Level Output lIOl k 1 mA Voltage V DD e 5V 4.95 4.95 5 4.95 V VDD e 10V 9.95 9.95 10 9.95 V VDD e 15V 14.95 14.95 15 14.95 V Voltage V DDe10V, V Oe1V or 9V 3.0 3.0 3.0 V Voltage V DDe10V, V Oe1V or 9V 7.0 7.0 7.0 V IIN Input Current V DDe15V, V INe0V b0.10 b10b5 b0.10 b1.0 mA VDDe15V, V INe15V 0.10 10 b5 0.10 1.0 mA Limits Symbol Parameter Conditions b40§C a25§C a85§C Units Min Max Min Typ Max Min Max IDD Quiescent Device Current V DD e 5V 20 20 150 mA VDD e 10V 40 40 300 mA VDD e 15V 80 80 600 mA VOL Low Level Output lIOl k 1 mA Voltage V DD e 5V 0.05 0.05 0.05 V VDD e 10V 0.05 0.05 0.05 V VDD e 15V 0.05 0.05 0.05 V VOH High Level Output lIOl k 1 mA Voltage V DD e 5V 4.95 4.95 5 4.95 V VDD e 10V 9.95 9.95 10 0.95 V VDD e 15V 14.95 14.95 15 14.95 V Voltage V DDe10V, V Oe1V or 9V 3.0 3.0 3.0 V

Symbol Parameter Conditions b40§C a25§C a85§C Units Min Max Min Typ Max Min Max Voltage V DDe10V, V Oe1V or 9V 7.0 7.0 7.0 V IIN Input Current V DDe15V, V INe0V b0.30 b10b5 b0.30 b1.0 mA VDDe15V, V INe15V 0.30 10 b5 0.30 1.0 mA Symbol Parameter Conditions Min Typ Max Units tPHL or t PLH Propagation Delay Time from V DD e 5V 250 400 ns Clock to Q V DD e 10V 100 160 ns VDD e 15V 80 130 ns tPHL or t PLH Propagation Delay Time from V DD e 5V 290 450 ns Clock to Carry Out V DD e 10V 120 190 ns VDD e 15V 100 160 ns tPHL or t PLH Propagation Delay Time from T V DD e 5V 180 290 ns Enable to Carry Out V DD e 10V 70 130 ns VDD e 15V 60 110 ns tPHL Propagation Time from Clear to Q V DD e 5V 190 300 ns (CD40160B, CD40161B Only) V DD e 10V 80 150 ns VDD e 15V 70 120 ns tSU Minimum Time Prior to Clock that V DD e 5V 120 ns Data or Load must be Present V DD e 10V 30 ns VDD e 15V 25 ns tSU Minimum Time Prior to Clock that V DD e 5V 170 280 ns Enable P or T must be Present V DD e 10V 70 120 ns VDD e 15V 60 100 ns tSU Minimum Time Prior to Clock that V DD e 5V 120 190 ns Clear must be Present (CD40162B, V DD e 10V 50 80 ns CD40163B Only) V DD e 15V 40 70 ns tWL or t WH Maximum Clock Pulse Width V DD e 5V 125 250 ns VDD e 10V 45 90 ns VDD e 15V 35 70 ns tRCL or t FCL Maximum Clock Rise or Fall Time V DD e 5V 15 ms VDD e 10V 5.0 ms VDD e 15V 5.0 ms fCL Maximum Clock Frequency V DD e 5V 2 4 MHz VDD e 10V 5.5 11 MHz VDD e 15V 7 14 MHz tTHL or t TLH Transition Time All Outputs VDD e 5V 100 200 ns VDD e 10V 50 100 ns VDD e 15V 40 80 ns CIN Average Input Capacitance Any Input 5.0 7.5 pF CPD Power Dissipation Capacity (Note 4) 95 pF *AC Parameters are guaranteed by DC correlated testing. Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed; they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provides conditions for actual device operation. Note 2: V SS e 0V unless otherwise specified. Note 3: IOH and I OL are tested one output at a time. Note 4: CPD determines the no load AC power consumption of any CMOS device. For complete explanation see 54C/74C Family Characteristics application note, AN-90.

CD40160B, CD40162B Clear is Synchronous for the CD40162B TL/F/5986–2 CD40161B, CD40163B Clear is Synchronous for the CD40163B TL/F/5986–3

CD40160B, . . . CD40162B Decade Counters TL/F/5986–4 CD40161B, . . . CD40163B Binary Counters TL/F/5986–5 Switching Time Waveforms TL/F/5986–6 Note 1: All input pulses are from generators having the following characteristics: t r e tf e 20 ns, PRR s 1 MHz, duty cycle s 50%, Z OUT & 50X. Note 2: All times are measured from 50% to 50%. Cascading Packages TL/F/5986–7

Physical Dimensions inches (millimeters) Ceramic Dual-In-Line Package (J) Order Number CD40160BMJ, CD40160BCJ, CD40161BMJ, CD40161BCJ, CD40162BMJ, CD40162BCJ, CD40163BMJ or CD40163BCJ

CD40160BM/BC Decade Counter with Asynchronous, CD40162BM/BC Synchronous Clear CD40161BM/BC Binary Counter with Asynchronous, CD40163BM/BC Synchronous Clear Physical Dimensions inches (millimeters) (Continued) Molded Dual-In-Line Package (N) Order Number CD40160BMN, CD40160BCN, CD40161BMN, CD40161BCN, CD40162BMN, CD40162BCN, CD41063BMN or CD40163BCN LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failure to perform can into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life failure to perform, when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can effectiveness. be reasonably expected to result in a significant injury to the user. National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Japan Ltd.

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