CD14538BMS INTERSIL | Alldatasheet

Document overview

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  • PDF pages: 9

Technical content

Features

  • High-Voltage Type (20V Rating)
  • Retriggerable/Resettable Capability
  • Trigger and Reset Propagation Delays Inde- pendent of RX, CX
  • Triggering From Leading or Trailing Edge
  • Q and Q Buffered Outputs Available
  • Separate Resets
  • Wide Range of Output-Pulse Widths
  • Schmitt-Trigger Input Allows Unlimited Rise and Fall Times On +TR and -TR Inputs
  • 100% Tested For Maximum Quiescent Cur- rent at 20V
  • Maximum Input Current of 1µA at 18V Over Full Package-Temperature Range: - 100nA at 18V and +25 oC
  • Noise Margin (Full Package-Temperature Range): - 1V at VDD = 5V - 2V at VDD = 10V - 2.5V at VDD = 15V
  • 5V, 10V and 15V Parametric Ratings
  • Standardized Symmetrical Output Charac- teristics
  • Meets All Requirements of JEDEC Tentative Standards No. 13B, “Standard Specifica- tions for Description of “B” Series CMOS Device’s

Applications

  • Pulse Delay and Timing
  • Pulse Shaping November 1994 File Number 3192 Pinout CD14538BMS TOP VIEW C X1 R XC X (1) RESET (1) +TR (1) -TR (1) VSS VDD R XC X (2) RESET (2) +TR (2) -TR (2) C X2 Functional Diagram MONO 1 MONO 2 CX1 RX1 VDD

21 RXCX(1)

15 14 RXCX(2) VDD CX2 RX2 +TR -TR RESET +TR -TR RESET VDD = 16 VSS = 8

TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS

  1. Go/No Go test with limits applied to inputs
  2. For accuracy, voltage is measured differentially to VDD. Limit

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS oC and +125oC limits guaranteed, 100% testing being implemented. TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

  1. All voltages referenced to device GND.
  2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized

on initial design release and upon design changes which would affect these characteristics. TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS NOTES: 1. All voltages referenced to device GND.

  1. See Table 2 for +25oC limit.

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)

TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25 O C TABLE 6. APPLICABLE SUBGROUPS NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2. TABLE 7. TOTAL DOSE IRRADIATION TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

  1. Each pin except VDD and GND will have a series resistor of 10K± 5%, VDD = 18V± 0.5V
  2. Each pin except VDD and GND will have a series resistor of 47K± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD

All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. TABLE 9. FUNCTIONAL TERMINAL CONNECTIONS

  1. A triggerable one-shot multivibrator has an output pulse width
  2. A non-triggerable one-shot multivibrator has a time period (T)

referenced from the application of the first trigger pulse. X could discharge into Pin 2 or 14. X should be provided as shown in Figure 1. originally desired pulse width. FIGURE 1. RAPID POWER-DOWN PROTECTION CIRCUIT FIGURE 2. ALTERNATE RAPID POWER-DOWN PROTECTION

51 OHMS

FIGURE 3. 1/2 OF DEVICE SHOWN

8 VSS

FIGURE 4. TYPICAL OUTPUT LOW (SINK) CURRENT FIGURE 5. MINIMUM OUTPUT LOW (SINK) CURRENT