CC2340R2_V02 TI | Alldatasheet
Document overview
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Technical content
CC2340R SimpleLink™ Family of 2.4GHz Wireless MCUs
1 Features
- Optimized 48MHz Arm® Cortex®-M0+ processor
- Up to 512KB of in-system programmable flash
- 12KB of ROM for bootloader and drivers
- Up to 64KB of ultra-low leakage SRAM. Full RAM retention in standby mode
- 2.4GHz RF transceiver compatible with Bluetooth® 5.3 Low Energy and IEEE 802.15.4 PHY and MAC
- Integrated balun
- Supports over-the-air upgrade (OTA)
- Serial wire debug (SWD) Low power consumption
- MCU consumption: – 2.6mA active mode, CoreMark® – 53μA/MHz running CoreMark® – < 710nA standby mode on CC2340R52 – 165nA shutdown mode, wake-up on pin
- Radio consumption: – 5.3mA RX – 5.1mA TX at 0dBm – < 11.0mA TX at +8dBm Wireless protocol support
- Bluetooth® 5.3 Low Energy
- Zigbee®
- Thread
- Proprietary systems High-performance radio
- –102dBm sensitivity for Bluetooth® Low Energy 125kbps
- –96.5dBm sensitivity for Bluetooth® Low Energy 1Mbps
- –98dBm sensitivity for IEEE 802.15.4 (2.4GHz)
- Output power up to +8dBm with temperature compensation Regulatory compliance
- Suitable for systems targeting compliance with these standards: – EN 300 328 (Europe) – FCC CFR47 Part 15 – ARIB STD-T66 (Japan) MCU peripherals
- Up to 26 I/O pads – 2 IO pads SWD, muxed with GPIOs – 2 IO pads LFXT, muxed with GPIOs – Up to 22 DIOs (analog or digital IOs)
- Up to 3 × 16-bit and 1× 24-bit general-purpose timers, quadrature decode mode support
- 12-bit ADC, 1.2Msps with external reference, 267ksps with internal reference, up to 12 external ADC inputs
- 1× low power comparator
- 1× UART
- 1× SPI
- 1× I2C
- Real-time clock (RTC)
- Integrated temperature and battery monitor
- Watchdog timer Security enablers
- AES 128-bit cryptographic accelerator
- Random number generator from on-chip analog noise Development tools and software
- LP-EM-CC2340R5 LaunchPad Development Kit
- SimpleLink™ Low Power F3 software development kit
- SmartRF™ Studio for simple radio configuration
- SysConfig system configuration tool Operating range
- On-chip buck DC/DC converter
- 1.71V to 3.8V single supply voltage
- Tj: –40°C up to +125°C RoHS-compliant package
- 5mm × 5mm RKP QFN40
- 4mm × 4mm RGE QFN24
- 2.2mm × 2.6mm YBG WCSP (Preview) CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.
2 Applications
- Medical – Home healthcare – blood glucose monitors, blood pressure monitor, CPAP machine, electronic thermometer – Patient monitoring and diagnostics – medical sensor patches – Personal care and fitness – electric toothbrush, wearable fitness & activity monitor
- Building automation – Building security systems – motion detector, electronic smart lock, door and window sensor, garage door system, gateway – HVAC – thermostat, wireless environmental sensor – Fire safety system – smoke and heat detector – Video surveillance – IP network camera
- Lighting – LED luminaire – Lighting control – daylight sensor, lighting sensor, wireless control
- Factory automation and control
- Retail automation & payment – electronic point of sale – Electronic shelf label
- Grid infrastructure – Smart meters – water meter, gas meter, electricity meter, and heat cost allocators – Grid communications – wireless communications – Long-range sensor
applications
– Other alternative energy – energy harvesting
- Communication equipment – Wired networking – wireless LAN or Wi-Fi access points, edge router
- Personal electronics – Connected peripherals – consumer wireless module, pointing devices, keyboards and keypads – Gaming – electronic and robotic toys – Wearables (non-medical) – smart trackers, smart clothing
3 Description
The CC2340R SimpleLink™ family of devices are 2.4GHz wireless microcontrollers (MCUs), targeting Bluetooth® 5.3 Low Energy, Zigbee, Thread, and Proprietary 2.4GHz applications. These devices are optimized for low-power wireless communication with Over the Air Download (OAD) support in Building automation (wireless sensors, lighting control, beacons), asset tracking, medical, retail EPOS (electronic point of sale), ESL (electronic shelf), and Personal electronics (toys, HID, stylus pens) markets. Highlighted features of this device include:
- Support for Bluetooth 5 features: high-speed mode (2Mbps PHY), long-range (LE Coded 125kbps and 500kbps PHYs), privacy 1.2.1 and channel selection algorithm #2, as well as backward compatibility and support for key features from the Bluetooth 4.2 and earlier Low Energy specifications.
- Fully qualified Bluetooth 5.3 software protocol stack included with the SimpleLink™ Low Power F3 software development kit (SDK)
- Zigbee® protocol stack support in the SimpleLink™ Low Power F3 software development kit (SDK)
- Thread protocol stack support in SIMPLELINK TI OPENTHREAD SDK (1)
- Ultra-low standby current less than 0.71μA with RTC operational and full RAM retention that enables significant battery life extension, especially for applications with longer sleep intervals.
- Integrated balun for reduced bill-of-material (BOM) board layout
- Excellent radio sensitivity and robustness (selectivity and blocking) performance for Bluetooth Low Energy (–102dBm for 125kbps LE Coded PHY, with integrated balun) The CC2340R family is part of the SimpleLink ™ MCU platform, which consists of Wi-Fi®, Bluetooth Low Energy, Thread, Zigbee, Sub-1GHz MCUs, and host MCUs that all share a common, easy-to-use development environment with a single-core software development kit (SDK) and rich tool set. A one-time integration of the SimpleLink™ platform enables you to add any combination of the portfolio’s devices into your design, allowing 100 percent code reuse when your design requirements change. For more information, visit the SimpleLink™ MCU platform. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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PART NUMBER(2) FLASH RAM TEMPERATURE RANGE PACKAGE STATUS CC2340R53E0RKPR 512KB 64KB –40°C–125°C QFN40 Released CC2340R53E0YBGR(1) 512KB 64KB –40°C–125°C WCSP Preview CC2340R53N0RKPR 512KB 64KB –40°C–85°C QFN40 Released CC2340R52E0RKPR 512KB 36KB –40°C–125°C QFN40 Released CC2340R52E0RGER 512KB 36KB –40°C–125°C QFN24 Released CC2340R52N0RKPR 512KB 36KB –40°C–85°C QFN40 Released CC2340R52N0RGER 512KB 36KB –40°C–85°C QFN24 Released CC2340R22E0RKPR 256KB 36KB –40°C–125°C QFN40 Released CC2340R22N0RKPR 256KB 36KB –40°C–85°C QFN40 Released CC2340R21E0RGER(1) 256KB 28KB –40°C–125°C QFN24 Preview CC2340R21N0RGER 256KB 28KB –40°C–85°C QFN24 Released (1) Available in a future release (2) For more information, see Section 12.
4 Functional Block Diagram
48 MHz
B A L U N 2.4GHz Radio Transceiver RF RAM Radio Digital Modem Accelerators PWR & CLK Mgmt. 1x UARTLGPT Timers 1x SPI 1x I2C RTC WDT Battery Monitor Temperature Sensor IOMUX | up to 26 GPIOs System Buses AES-128 System Buses µDMA (8 channel)
2.4 GHz
50 Ω 32.768 kHz LFXT 32.768 kHz LFOSC DC/DC Global LDO POR BOR ADC ADC Digital PLL PA LNA 12-bit ADC
1.2 Msps
Figure 4-1. CC2340R Family Block Diagram www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 3 Product Folder Links: CC2340R2 CC2340R5
7.16 Zigbee and Thread - IEEE 802.15.4-2006 2.4 7.17 Zigbee and Thread - IEEE 802.15.4-2006 2.4
12 Mechanical, Packaging, and Orderable
CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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5 Device Comparison
FLASH (KB) RAM + Cache (KB) GPIO PACKAGE SIZE 2.4GHz Prop. Bluetooth® LE ZigBee Thread 2.2 X 2.6 mm WCSP (24)
4 X 4 mm VQFN (24)
5 X 5 mm VQFN (40)
CC2340R53 ✓ ✓ ✓ ✓ 512 64 12-26 ✓ ✓ CC2340R52 ✓ ✓ ✓ ✓ 512 36 12-26 ✓ ✓ CC2340R22 ✓ ✓ ✓ ✓ 256 36 26 ✓ CC2340R21 ✓ ✓ ✓ 256 28 12 ✓ www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 5 Product Folder Links: CC2340R2 CC2340R5
6 Pin Configurations and Functions
6.1 Pin Diagrams
6.1.1 Pin Diagram—RKP Package (Top View)
DIO4_X32N27 DIO0_A5 DIO5_A229 DCDC30 DIO10 4 DIO9 3 DIO8 2 VDDR 1 DIO3_X32P26 RSTN25 DIO2_A324 DIO1_A423 DIO11 5 DIO12 6 DIO13 7 DIO23_A8 DIO22_A9 DIO25_A6 VDDD DIO21_A10 VDDS DIO16_SWDIO DIO20_A11 DIO19 DIO15 VDDS DIO14 DIO17_SWDCK DIO18 DIO24_A7 NC RFGND VDDS ANT VDDS DIO7_A0 VDDR X48P DIO6_A1 X48N Figure 6-1. RKP (5mm × 5mm) Pinout, 0.4mm Pitch (Top View) The following I/O pins marked in Figure 6-1 in bold have high-drive capabilities:
- Pin 6, DIO12
- Pin 11, DIO16_SWDIO
- Pin 12, DIO17_SWDCK
- Pin 13, DIO18
- Pin 14, DIO19
- Pin 20, DIO24_A7 The following I/O pins marked in Figure 6-1 in italics have analog capabilities:
- Pin 15, DIO20_A11
- Pin 16, DIO21_A10
- Pin 18, DIO22_A9
- Pin 19, DIO23_A8
- Pin 20, DIO24_A7
- Pin 21, DIO25_A6
- Pin 22, DIO0_A5
- Pin 23, DIO1_A4
- Pin 24, DIO2_A3
- Pin 29, DIO5_A2
- Pin 32, DIO6, A1
- Pin 33, DIO7_A0 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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6.1.2 Pin Diagram – RGE Package (Top View)
DIO4_X32N15 DCDC17 VDDS18 DIO11 4 DIO8 3 VDDR 2 ANT 1 DIO3_X32P14 RSTN13 DIO12 5 DIO13 6 VDDD DIO24_A7 DIO16_SWDIO VDDS DIO21_A10 DIO17_SWDCK DIO20_A11 X48P VDDS GND X48N DIO6_A1 VDDR Figure 6-2. RGE (4mm × 4mm) Pinout, 0.5mm Pitch (Top View) The following I/O pins marked in Figure 6-2 in bold have high-drive capabilities:
- Pin 5, DIO12
- Pin 7, DIO16_SWDIO
- Pin 8, DIO17_SWDCK
- Pin 12, DIO24_A7 The following I/O pins marked in Figure 6-2 in italics have analog capabilities:
- Pin 9, DIO20_A11
- Pin 10, DIO21_A10
- Pin 12, DIO24_A7
- Pin 19, DIO6_A1 www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: CC2340R2 CC2340R5
6.1.3 Pin Diagram—YBG Package (Top View)
Figure 6-3. Preview—YBG (2.2mm × 2.6mm) Pinout, 0.4mm Pitch (Top View) The following I/O pins marked in Figure 6-2 in bold have high-drive capabilities:
- Pin B2, DIO12
- Pin A1, DIO16_SWDIO
- Pin A2, DIO17_SWDCK
- Pin C4, DIO24_A7 The following I/O pins marked in Figure 6-2 in italics have analog capabilities:
- Pin A3, DIO20_A11
- Pin A4, DIO21_A10
- Pin C4, DIO24_A7
- Pin D3, DIO6_A1 Table 6-1. Pin Attributes (RKP, RGE, YBG, Packages) RKP PIN NUMBER RGE PIN NUMBER YBG PIN NUMBER SIGNAL NAME PIN NAME MUX ENCODING SIGNAL TYPE 39 1 F2 ANT ANT RF 30 17 E5 DCDC DCDC PWR CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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Table 6-1. Pin Attributes (RKP, RGE, YBG, Packages) (continued) RKP PIN NUMBER RGE PIN NUMBER YBG PIN NUMBER SIGNAL NAME PIN NAME MUX ENCODING SIGNAL TYPE 2 3 C2 DIO8 GPIO8 0 I/O SPI0SCLK 1 I/O UART0RTS 2 I/O T1C0N 3 I/O I2C0SDA 4 I/O T0C0N 5 I/O DTB3 7 I/O
3 DIO9 GPIO9 0 I/O
22 DIO0_A5 GPIO0 0 I/O
4 DIO10 GPIO10 0 I/O
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Table 6-1. Pin Attributes (RKP, RGE, YBG, Packages) (continued) RKP PIN NUMBER RGE PIN NUMBER YBG PIN NUMBER SIGNAL NAME PIN NAME MUX ENCODING SIGNAL TYPE
9 DIO14 GPIO14 0 I/O
10 DIO15 GPIO15 0 I/O
11 7 A1 DIO16_SWDIO GPIO16 0 I/O SPI0PICO 1 I/O UART0RXD 2 I/O I2C0SDA 3 I/O T1C2 4 I/O T1C0N 5 I/O DTB10 7 I/O 12 8 A2 DIO17_SWDCK GPIO17 0 I/O SPI0SCLK 1 I/O UART0TXD 2 I/O I2C0SCL 3 I/O T1C1N 4 I/O T0C2 5 I/O DTB11 7 I/O
13 B3 DIO18 GPIO18 0 I/O
14 DIO19 GPIO19 0 I/O
23 DIO1_A4 GPIO1 0 I/O
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Table 6-1. Pin Attributes (RKP, RGE, YBG, Packages) (continued) RKP PIN NUMBER RGE PIN NUMBER YBG PIN NUMBER SIGNAL NAME PIN NAME MUX ENCODING SIGNAL TYPE 15 9 A3 DIO20_A11 GPIO20 0 I/O LPCO 1 I/O UART0TXD 2 I/O UART0RXD 3 I/O T1C0 4 I/O SPI0POCI 5 I/O ANA11 6 ANALOG DTB14 7 I/O 16 10 A4 DIO21_A10 GPIO21 0 I/O UART0CTS 1 I/O T1C1N 2 I/O T0C1 3 I/O SPI0POCI 4 I/O LRFD1 5 I/O ANA10 6 ANALOG DTB15 7 I/O
18 DIO22_A9 GPIO22 0 I/O
19 DIO23_A8 GPIO23 0 I/O
20 12 C4 DIO24_A7 GPIO24 0 I/O SPI0SCLK 1 I/O T1C0 2 I/O T3C0 3 I/O T0PE 4 I/O I2C0SCL 5 I/O ANA7 6 ANALOG DTB5 7 I/O
21 DIO25_16 GPIO25 0 I/O
24 DIO2_A3 GPIO2 0 I/O
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Table 6-1. Pin Attributes (RKP, RGE, YBG, Packages) (continued) RKP PIN NUMBER RGE PIN NUMBER YBG PIN NUMBER SIGNAL NAME PIN NAME MUX ENCODING SIGNAL TYPE 26 14 C5 DIO3_X32P GPIO3 0 I/O LFCI 1 I/O T0C1N 2 I/O LRFD0 3 I/O T3C1 4 I/O T1C2 5 I/O LFXT_P 6 I/O DTB7 7 I/O 27 15 B5 DIO4_X32N GPIO4 0 I/O T0C2N 1 I/O UART0TXD 2 I/O LRFD1 3 I/O SPI0PICO 4 I/O T0C2 5 I/O LFXT_N 6 I/O DTB8 7 I/O
29 DIO5_A2 GPIO5 0 I/O
32 19 D3 DIO6_A1 GPIO6 0 I/O SPI0CSN 1 I/O I2C0SCL 2 I/O T1C2 3 I/O LRFD2 4 I/O UART0TXD 5 I/O ANA1 6 ANALOG DTB6 7 I/O
33 DIO7_A0 GPIO7 0 I/O
23 C1, C3, D4, F5 GND GND GND
37 NC NC NC
40 E2 RFGND RFGND GND
1, 34 2, 20 D1, D2 VDDR VDDR PWR 17, 31, 38, 8 11, 18, 24 B4, E3, E4 VDDS VDDS PWR 36 22 F3 X48N X48N I/O 35 21 F4 X48P X48P I/O CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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6.2 Signal Descriptions
Table 6-2. Analog Input Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN ANA0 ANALOG I ADC reference (negative terminal) or ADC channel 0 input ANA1 ANALOG I ADC reference (positive terminal) or ADC channel 1 input 32 19 D3 ANA2 ANALOG I ADC channel 2 input 29 ANA3 ANALOG I ADC channel 3 input 24 ANA4 ANALOG I ADC channel 4 input 23 ANA5 ANALOG I ADC channel 5 input 22 ANA6 ANALOG I ADC channel 6 input 21 ANA7 ANALOG I Low power comparator input (positive terminal) / ADC channel 7 input 20 12 C4 ANA8 ANALOG I Low power comparator input (positive or negative terminal) / ADC channel 8 input ANA9 ANALOG I ADC channel 9 input 18 ANA10 ANALOG I Low power comparator input (positive terminal) / ADC channel 10 input 16 10 A4 ANA11 ANALOG I ADC channel 11 input 15 9 A3 Table 6-3. Clock Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN CKMIN I/O I HFOSC tracking loop input 10 LFCI I/O I Low frequency clock input (LFXT bypass clock from pin) 26 14 C5 LFXT_N I/O I 32kHz crystal oscillator pin 2 27 15 B5 LFXT_P I/O I 32kHz crystal oscillator pin 1 26 14 C5 X48N I/O I 48MHz crystal oscillator pin 2 36 22 F3 X48P I/O I 48MHz crystal oscillator pin 1 35 21 F4 Table 6-4. DTB Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN DTB0 I/O O Digital test bus output 0 14 DTB1 I/O O Digital test bus output 1 18 DTB2 I/O O Digital test bus output 2 23 DTB3 I/O O Digital test bus output 3 2 3 C2 DTB4 I/O O Digital test bus output 4 7 6 DTB5 I/O O Digital test bus output 5 20 12 C4 DTB6 I/O O Digital test bus output6 32 19 D3 DTB7 I/O O Digital test bus output 7 26 14 C5 DTB8 I/O O Digital test bus output 8 27 15 B5 DTB9 I/O O Digital test bus output 9 5 4 B1 DTB10 I/O O Digital test bus output 10 11 7 A1 www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 13 Product Folder Links: CC2340R2 CC2340R5
Table 6-4. DTB Signal Descriptions (continued) SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN DTB11 I/O O Digital test bus output 11 12 8 A2 DTB12 I/O O Digital test bus output 12 13 B3 DTB13 I/O O Digital test bus output 13 6 5 B2 DTB14 I/O O Digital test bus output 14 15 9 A3 DTB15 I/O O Digital test bus output 15 16 10 A4 Table 6-5. GPIO Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN GPIO0 I/O I/O General-purpose input or output 22 GPIO1 I/O I/O General-purpose input or output 23 GPIO2 I/O I/O General-purpose input or output 24 GPIO3 I/O I/O General-purpose input or output 26 14 C5 GPIO4 I/O I/O General-purpose input or output 27 15 B5 GPIO5 I/O I/O General-purpose input or output 29 GPIO6 I/O I/O General-purpose input or output 32 19 D3 GPIO7 I/O I/O General-purpose input or output 33 GPIO8 I/O I/O General-purpose input or output 2 3 C2 GPIO9 I/O I/O General-purpose input or output 3 GPIO10 I/O I/O General-purpose input or output 4 GPIO11 I/O I/O General-purpose input or output 5 4 B1 GPIO12 I/O I/O General-purpose input or output 6 5 B2 GPIO13 I/O I/O General-purpose input or output 7 6 GPIO14 I/O I/O General-purpose input or output 9 GPIO15 I/O I/O General-purpose input or output 10 GPIO16 I/O I/O General-purpose input or output 11 7 A1 GPIO17 I/O I/O General-purpose input or output 12 8 A2 GPIO18 I/O I/O General-purpose input or output 13 B3 GPIO19 I/O I/O General-purpose input or output 14 GPIO20 I/O I/O General-purpose input or output 15 9 A3 GPIO21 I/O I/O General-purpose input or output 16 10 A4 GPIO22 I/O I/O General-purpose input or output 18 GPIO23 I/O I/O General-purpose input or output 19 GPIO24 I/O I/O General-purpose input or output 20 12 C4 GPIO25 I/O I/O General-purpose input or output 21 Table 6-6. Device Grounds SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN GND GND N/A Ground 23 C1, C3, D4, F5 RFGND GND N/A RF ground reference 40 E2 Table 6-7. I2C Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN I2C0SCL I/O I/O I2C clock 12, 20, 21, 32 12, 19, 8 A2, C4, D3 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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Table 6-7. I2C Signal Descriptions (continued) SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN I2C0SDA I/O I/O I2C data 11, 2, 22, 6 3, 5, 7 A1, B2, C2 Table 6-8. Low Power Comparator Output Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN LPCO I/O O Low power comparator output 13, 15, 4 9 A3, B3 Table 6-9. No Connect SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN NC NC N/A No connect 37 Table 6-10. Device Power SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN DCDC (1) PWR N/A Switch node of the internal DC/DC converter 30 17 E5 VDDD (1) PWR N/A Internal 1.28V regulator decoupling capacitor 28 16 D5 VDDR PWR N/A Internal supply, must be powered from the internal DC/DC converter or the internal LDO 1, 34 2, 20 D1, D2 VDDS PWR N/A 1.71V to 3.8V supply 17, 31, 38, 8 11, 18, 24 B4, E3, E4 (1) Do not supply external circuitry from this pin. Table 6-11. Reset Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN RSTN I/O I Global main device reset (active low) 25 13 A5 Table 6-12. Radio Digital Output Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN LRFD0 I/O O Radio Core Output 0 26, 5 14, 4 B1, C5 LRFD1 I/O O Radio Core Output 1 16, 27 10, 15 A4, B5 LRFD2 I/O O Radio Core Output 2 32 19 D3 LRFD3 I/O O Radio Core Digital Output 3 3 LRFD4 I/O O Radio Core Output 4 33 LRFD5 I/O O Radio Core Output 5 9 LRFD6 I/O O Radio Core Output 6 29 LRFD7 I/O O Radio Core Output 7 23 Table 6-13. RF Port SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN ANT RF I/O 50Ω RF port 39 1 F2 www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 15 Product Folder Links: CC2340R2 CC2340R5
Table 6-14. SPI Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN SPI0CSN I/O I/O SPI chip select 22, 32, 5 19, 4 B1, D3 SPI0PICO I/O I/O SPI peripheral in controller out 11, 14, 27, 6, 7 15, 5, 6, 7 A1, B2, B5 SPI0POCI I/O I/O SPI peripheral out controller in 15, 16, 21, 5, 6, 10, 4, 5, 6, 9 A3, A4, B1, B2 SPI0SCLK I/O I/O SPI clock 12, 13, 2, 20 12, 3, 8 A2, B3, C2, C4 Table 6-15. Timers Capture or Compare Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN T0C0 I/O I/O Capture or compare 0 from timer 5 4 B1 T0C1 I/O I/O Capture or compare 1 from timer 16 10 A4 T0C2 I/O I/O Capture or compare 2 from timer 12, 27 15, 8 A2, B5 T1C0 I/O I/O Capture or compare 0 from timer 15, 20 12, 9 A3, C4 T1C1 I/O I/O Capture or compare 1 from timer 6 5 B2 T1C2 I/O I/O Capture or compare 2 from timer 11, 26, 32 14, 19, 7 A1, C5, D3 T2C1 I/O I/O Capture or compare 1 from timer T2C2 I/O I/O Capture or compare 2 from timer T3C0 I/O I/O Capture or compare 0 from timer 13, 20, 3 12 B3, C4 T3C1 (1) I/O I/O Capture or compare 1 from timer 14, 23, 26, 33 14 C5 T3C2 I/O I/O Capture or compare 2 from timer 22, 9 (1) Timer 3 not available on CC2340R21. Table 6-16. Timers Complementary Output Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN T0C0N I/O O Complementary compare or PWM output 0 from timer 0 2, 7 3, 6 C2 T0C1N I/O O Complementary compare or PWM output 1 from timer 0 26 14 C5 T0C2N I/O O Complementary compare or PWM output 2 from timer 0 27 15 B5 T1C0N I/O O Complementary compare or PWM output 0 from timer 1 11, 2 3, 7 A1, C2 T1C1N I/O O Complementary compare or PWM output 1 from timer 1 12, 16 10, 8 A2, A4 T1C2N I/O O Complementary compare or PWM output 2 from timer 0 5, 9 4 B1 T2C0N I/O O Complementary compare or PWM output 0 from timer 2 10, 18 T2C1N I/O O Complementary compare or PWM output 1 from timer 2 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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Table 6-16. Timers Complementary Output Signal Descriptions (continued) SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN T2C2N I/O O Complementary compare or PWM output 2 from timer 2 T3C0N I/O O Complementary compare or PWM output 0 from timer 3 T3C1N I/O O Complementary compare or PWM output 1 from timer 3 T3C2N I/O O Complementary compare or PWM output 2 from timer 3 Table 6-17. Timers Fault Input Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN T1F I/O I Fault input for timer 1 23, 7, 9 6 Table 6-18. Timers Prescaler Event Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN T0PE I/O O Prescaler event output from timer 20, 24 12 C4 T2PE I/O O Prescaler event output from timer 14, 4 Table 6-19. UART Signal Descriptions SIGNAL NAME PIN TYPE SIGNAL DIRECTION DESCRIPTION RKP PIN RGE PIN YBG PIN UART0CTS I/O I UART clear-to-send input (active low) 16, 24 10 A4 UART0RTS I/O O UART request-to-send (active low) 2, 23 3 C2 UART0RXD I/O I UART receive data 10, 11, 15, 18, 6 5, 7, 9 A1, A3, B2 UART0TXD I/O O UART transmit data 12, 13, 15, 27, 32, 7
6.3 Connections for Unused Pins and Modules
Table 6-20. Connections for Unused Pins FUNCTION SIGNAL NAME ACCEPTABLE PRACTICE(1) PREFERRED PRACTICE(1) GPIO (digital) DIOn NC, GND, or VDDS NC SWD DIO16_SWDIO NC, GND, or VDDS GND or VDDS DIO17_SWDCK NC, GND, or VDDS GND or VDDS GPIO (digital or analog) DIOn_Am NC, GND, or VDDS NC 32.768-kHz crystal DIO3_X32P NC or GND NC DIO4_X32N DC/DC converter(2) DCDC NC NC VDDS VDDS VDDS (1) NC = No connect (2) When the DC/DC converter is not used, the inductor between DCDC and VDDR can be removed. VDDR must still be connected and the 10μF DCDC capacitor must be kept on the VDDR net. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 17 Product Folder Links: CC2340R2 CC2340R5
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1) (2) MIN MAX UNIT VDDS Supply voltage –0.3 4.1 V Voltage on any digital pin(3) –0.3 VDDS + 0.3, max 4.1 V Voltage on crystal oscillator pins X48P and X48N –0.3 1.24 V Vin_adc Voltage on ADC input 0 VDDS V Input level, RF pins 5 dBm Tstg Storage temperature –40 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to ground, unless otherwise noted. (3) Including analog capable DIOs.
7.2 ESD Ratings
VESD Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) All pins ±1000 V Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002(2) All pins ±500 V WCSP packages VESD Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) All pins TBD V Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002(2) All pins TBD V (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT CC2340xxxExxxxx devices (125 °C parts) Operating ambient temperature(1) (2) –40 125 °C Operating junction temperature(1) (2) –40 125 °C CC2340xxxNxxxxx devices (85 °C parts) Operating ambient temperature(1) (2) –40 85 °C Operating junction temperature(1) (2) –40 85 °C Operating supply voltage (VDDS) 1.71 3.8 V Rising supply voltage slew rate 0 100 mV/µs Falling supply voltage slew rate(3) 0 1 mV/µs (1) Operation at or near maximum operating temperature for extended durations will result in a reduction in lifetime. (2) For thermal resistance details, refer to Thermal Resistance Characteristics table in this document. (3) For small coin-cell batteries, with high worst-case end-of-life equivalent source resistance, a 10-µF VDDS input capacitor must be used to ensure compliance with this slew rate.
7.4 DCDC
When measured on the CC2340R5 reference design with Tc = 25 °C and DCDC enabled unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VDDS supply voltage for DCDC operation (1) (2) 2.2 3.0 3.8 V (1) When the supply voltage drops below the DCDC operation min voltage, the device automatically transitions to use GLDO regulator on-chip. (2) A 10uH and 10uF load capacitor are required on the VDDR voltage rail. They should be placed close to the DCDC output pin. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.5 Global LDO (GLDO)
When measured on the CC2340R5 reference design with Tc = 25 °C. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VDDS supply voltage for GLDO operation (1) 1.71 3.0 3.8 V (1) A 10 µF capacitor is recommended at VDDR pin.
7.6 Power Supply and Modules
over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VDDS_BOD Brownout rising threshold (1) 1.68 V Brownout falling threshold (1) 1.67 V POR power-on reset power-up level 1.5 V power-on reset power-down level 1.45 V (1) Brown-out Detector is trimmed at initial boot, value is kept until device is reset by a POR reset or the RSTN pin.
7.7 Battery Monitor
Measured on the CC2340R5 reference design with Tc = 25 °C, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Resolution 22 mV Range 1.7 3.8 V Accuracy VDDS = 3.0 V 30 mV
7.8 Temperature Sensor
Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CC2340xxxExxxxx devices (125 °C devices) Accuracy -40 °C to 125 °C -15/+9(1) °C CC2340xxxNxxxxx devices (85 °C devices) Accuracy -40 °C to 85 °C ±10(1) °C (1) Raw output from register. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 19 Product Folder Links: CC2340R2 CC2340R5
7.9 Power Consumption - Power Modes
When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, DCDC enabled, GLDO disabled, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Core Current Consumption with DCDC Icore Active MCU running CoreMark from Flash at 48 MHz 2.6 mA Icore Active MCU running CoreMark from Flash at 48MHz 53 µA / MHz Icore Idle Supply Systems and RAM powered, flash disabled, DMA disabled 0.8 mA Icore Idle Supply Systems and RAM powered, flash disabled, DMA enabled 0.8 mA Icore Idle Supply Systems and RAM powered, flash enabled, DMA disabled 1.1 mA Icore Idle Supply Systems and RAM powered, flash enabled, DMA enabled 1.2 mA Icore Standby RTC running, full RAM retention LFOSC, DCDC recharge current setting (ipeak = 1) 0.71 µA Icore Standby RTC running, full RAM retention LFXT, DCDC recharge current setting (ipeak = 1) 0.74 µA Core Current consumption with GLDO Icore Active MCU running CoreMark from Flash at 48 MHz 4.1 mA Icore Idle Supply Systems and RAM powered, flash disabled, DMA disabled 1.2 mA Icore Idle Supply Systems and RAM powered, flash disabled, DMA enabled 1.3 mA Icore Idle Supply Systems and RAM powered, flash enabled, DMA disabled 1.5 mA Icore Idle Supply Systems and RAM powered, flash enabled, DMA enabled 1.7 mA Icore Standby RTC running, full RAM retention LFOSC, default GLDO recharge current setting 1.1 µA Icore Standby RTC running, full RAM retention LFXT default GLDO recharge current setting 1.15 µA Reset, Shutdown Current Consumption Icore Reset Reset. RSTN pin asserted or VDDS below power-on-reset threshold 165 nA Icore Shutdown Shutdown measured in steady state. No clocks running, no retention, IO wakeup enabled 165 nA Peripheral Current Consumption Iperi RF Delta current, clock enabled, RF subsystem idle 40 µA Iperi Timers Delta current with clock enabled, module is idle, one LGPT timer 2.4 µA Iperi I2C Delta current with clock enabled, module is idle 10.6 µA Iperi SPI Delta current with clock enabled, module is idle 3.4 µA Iperi UART Delta current with clock enabled, module is idle 24.5 µA Iperi CRYPTO (AES) Delta current with clock enabled, module is idle 3.8 µA CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.10 Power Consumption - Radio Modes
When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V with DCDC enabled unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IRX Radio receive current 2440 MHz, 1 Mbps, GFSK, system bus off (1) 5.3 mA IRX Radio receive current 2440 MHz, 1 Mbps, GFSK, DCDC OFF, system bus off (1) 9 mA ITX Radio transmit current -8 dBm output power setting 2440 MHz system bus off (1) 4.5 mA ITX Radio transmit current 0 dBm output power setting 2440 MHz system bus off (1) 5.1 mA ITX Radio transmit current 0 dBm output power setting 2440 MHz DCDC OFF, system bus off (1) 9.0 mA ITX Radio transmit current +4 dBm output power setting 2440 MHz system bus off (1) 7.9 mA ITX Radio transmit current +6 dBm output power setting 2440 MHz system bus off (1) 8.9 mA ITX Radio transmit current +8 dBm output power setting 2440 MHz system bus off (1) 10.7 mA ITX Radio transmit current +8 dBm output power setting
2440 MHz DCDC OFF, system bus off (1) 19 mA
(1) System bus off refers to device idle mode, DMA disabled, flash disabled
7.11 Nonvolatile (Flash) Memory Characteristics
Over operating free-air temperature range and VDDS = 3.0 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Flash sector size 2 KB Supported flash erase cycles before failure, full bank(1) (2) 30 k Cycles Supported flash erase cycles before failure, single sector(3) 60 k Cycles Maximum number of write operations per row before sector erase(4) 83 Write Operations CC2340xxxExxxxx devices (125 °C devices) Flash retention 105 °C 11.4 Years Flash retention 125 °C 10 Years CC2340xxxNxxxxx devices (85°C devices) Flash retention 85 °C 11.4 Years Flash sector erase current Average delta current 1.2 mA Flash sector erase time(5) 0 erase cycles 2.2 ms Flash write current Average delta current, full sector at a time 1.7 mA Flash write time(5) full sector (2kB) at a time, 0 erase cycles 8.3 ms (1) A full bank erase is counted as a single erase cycle on each sector (2) Aborting flash during erase or program modes is not a safe operation. (3) Up to 16 customer-designated sectors can be individually erased an additional 30k times beyond the baseline bank limitation of 30k cycles (4) Each wordline is 2048 bits (or 256 bytes) wide. This limitation corresponds to sequential memory writes of 4 (3.1) bytes minimum per write over a whole wordline. If additional writes to the same wordline are required, a sector erase is required once the maximum number of write operations per row is reached. (5) This number is dependent on Flash aging and increases over time and erase cycles
7.12 Thermal Resistance Characteristics
UNIT (1)RKP (VQFN) RGE (VQFN)
40 PINS 24 PINS
RθJA Junction-to-ambient thermal resistance 31.8 40.1 ℃/W RθJC(top) Junction-to-case (top) thermal resistance 23.1 30.5 ℃/W RθJB Junction-to-board thermal resistance 12.7 17.2 ℃/W www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: CC2340R2 CC2340R5
7.12 Thermal Resistance Characteristics (continued)
UNIT (1)RKP (VQFN) RGE (VQFN) ψJT Junction-to-top characterization parameter 0.3 0.4 ℃/W ψJB Junction-to-board characterization parameter 12.7 17.1 ℃/W RθJC(bot) Junction-to-case (bottom) thermal resistance 3.3 3.4 ℃/W (1) °C/W = degrees Celsius per watt.
7.13 RF Frequency Bands
Over operating free-air temperature range (unless otherwise noted). PARAMETER MIN TYP MAX UNIT Frequency bands 2360 2510 MHz CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.14 Bluetooth Low Energy - Receive (RX)
When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF = 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 125 kbps (LE Coded) Receiver sensitivity BER = 10–3 –102 dBm Receiver saturation BER = 10–3 5 dBm Frequency error tolerance Difference between the incoming carrier frequency and the internally generated carrier frequency > (–250/ 250) (1) kHz Data rate error tolerance Difference between incoming data rate and the internally generated data rate (37-byte packets) > (–90 / 90) (1) ppm Data rate error tolerance Difference between incoming data rate and the internally generated data rate (255-byte packets) > (–90 / 90) (1) ppm Co-channel rejection(2) Wanted signal at –79 dBm, modulated interferer in channel, BER = 10–3 –6 dB Selectivity, ±1 MHz(2) Wanted signal at –79 dBm, modulated interferer at ±1 MHz, BER = 10–3 9 / 5 (3) dB Selectivity, ±2 MHz(2) Wanted signal at –79 dBm, modulated interferer at ±2 MHz, BER = 10–3 44 / 31 (3) dB Selectivity, ±3 MHz(2) Wanted signal at –79 dBm, modulated interferer at ±3 MHz, BER = 10–3 47 / 42 (3) dB Selectivity, ±4 MHz(2) Wanted signal at –79 dBm, modulated interferer at ±4 MHz, BER = 10–3 49 / 45 (3) dB Selectivity, ±6 MHz(2) Wanted signal at –79 dBm, modulated interferer at ≥ ±6 MHz, BER = 10–3 52 / 48 (3) dB Selectivity, ±7 MHz Wanted signal at –79 dBm, modulated interferer at ≥ ±7 MHz, BER = 10–3 54 / 49 (3) dB Selectivity, Image frequency(2) Wanted signal at –79 dBm, modulated interferer at image frequency, BER = 10–3 31 dB Selectivity, Image frequency ±1 MHz(2) Note that Image frequency + 1 MHz is the Co- channel –1 MHz. Wanted signal at –79 dBm, modulated interferer at ±1 MHz from image frequency, BER = 10–3 5 / 42 (3) dB 500 kbps (LE Coded) Receiver sensitivity BER = 10–3 –99 dBm Receiver saturation BER = 10–3 5 dBm Frequency error tolerance Difference between the incoming carrier frequency and the internally generated carrier frequency > (–250 / 250) (1) kHz Data rate error tolerance Difference between incoming data rate and the internally generated data rate (37-byte packets) > (–90/ 90) (1) ppm Data rate error tolerance Difference between incoming data rate and the internally generated data rate (255-byte packets) > (–90 / 90) (1) ppm Co-channel rejection(2) Wanted signal at –72 dBm, modulated interferer in channel, BER = 10–3 –4.5 dB Selectivity, ±1 MHz(2) Wanted signal at –72 dBm, modulated interferer at ±1 MHz, BER = 10–3 9 / 5 (3) dB Selectivity, ±2 MHz(2) Wanted signal at –72 dBm, modulated interferer at ±2 MHz, BER = 10–3 42 / 31 (3) dB Selectivity, ±3 MHz(2) Wanted signal at –72 dBm, modulated interferer at ±3 MHz, BER = 10–3 45 / 41 (3) dB Selectivity, ±4 MHz(2) Wanted signal at –72 dBm, modulated interferer at ±4 MHz, BER = 10–3 46 / 42 (3) dB Selectivity, ±6 MHz(2) Wanted signal at –72 dBm, modulated interferer at ≥ ±6 MHz, BER = 10–3 50 / 45 (3) dB Selectivity, ±7 MHz Wanted signal at –72 dBm, modulated interferer at ≥ ±7 MHz, BER = 10–3 51 / 46 (3) dB Selectivity, Image frequency(2) Wanted signal at –72 dBm, modulated interferer at image frequency, BER = 10–3 31 dB www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 23 Product Folder Links: CC2340R2 CC2340R5
7.14 Bluetooth Low Energy - Receive (RX) (continued)
When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF = 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Selectivity, Image frequency ±1 MHz(2) Note that Image frequency + 1 MHz is the Co- channel –1 MHz. Wanted signal at –72 dBm, modulated interferer at ±1 MHz from image frequency, BER = 10–3 5 / 41 (3) dB
1 Mbps (LE 1M)
Receiver sensitivity BER = 10–3 –96.5 dBm Receiver saturation BER = 10–3 5 dBm Frequency error tolerance Difference between the incoming carrier frequency and the internally generated carrier frequency > (–250/250) (1) kHz Data rate error tolerance Difference between incoming data rate and the internally generated data rate (37-byte packets) > (–90 / 90) (1) ppm Co-channel rejection(2) Wanted signal at –67 dBm, modulated interferer in channel, BER = 10–3 –6 dB Selectivity, ±1 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±1 MHz, BER = 10–3 7 / 5 (3) dB Selectivity, ±2 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±2 MHz,BER = 10–3 39 / 28 (3) dB Selectivity, ±3 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±3 MHz, BER = 10–3 38 / 38 (3) dB Selectivity, ±4 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±4 MHz, BER = 10–3 47 / 35 (3) dB Selectivity, ±5 MHz or more(2) Wanted signal at –67 dBm, modulated interferer at ≥ ±5 MHz, BER = 10–3 40 dB Selectivity, image frequency(2) Wanted signal at –67 dBm, modulated interferer at image frequency, BER = 10–3 28 dB Selectivity, image frequency ±1 MHz(2) Note that Image frequency + 1 MHz is the Co- channel –1 MHz. Wanted signal at –67 dBm, modulated interferer at ±1 MHz from image frequency, BER = 10–3 5 / 38 (3) dB Out-of-band blocking(4) 30 MHz to 2000 MHz –10 dBm Out-of-band blocking 2003 MHz to 2399 MHz –10 dBm Out-of-band blocking 2484 MHz to 2997 MHz –10 dBm Out-of-band blocking 3000 MHz to 12.75 GHz (excluding VCO frequency) –2 dBm Intermodulation Wanted signal at 2402 MHz, –64 dBm. Two interferers at 2405 and 2408 MHz respectively, at the given power level –37 dBm Spurious emissions, 30 to 1000 MHz(5) Measurement in a 50-Ω single-ended load. < –59 dBm Spurious emissions, 1 to 12.75 GHz(5) Measurement in a 50-Ω single-ended load. < –47 dBm RSSI dynamic range (6) 70 dB RSSI accuracy ±4 dB RSSI resolution 1 dB
2 Mbps (LE 2M)
Receiver sensitivity Measured at SMA connector, BER = 10–3 –92 dBm Receiver saturation Measured at SMA connector, BER = 10–3 2 dBm Frequency error tolerance Difference between the incoming carrier frequency and the internally generated carrier frequency > (–250 / 250) (1) kHz Data rate error tolerance Difference between incoming data rate and the internally generated data rate (37-byte packets) > (–90/ 90) (1) ppm Co-channel rejection(2) Wanted signal at –67 dBm, modulated interferer in channel,BER = 10–3 –8 dB Selectivity, ±2 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±2 MHz, Image frequency is at –2 MHz, BER = 10–3 9 / 5 (3) dB Selectivity, ±4 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±4 MHz, BER = 10–3 40 / 32 (3) dB CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF = 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Selectivity, ±6 MHz(2) Wanted signal at –67 dBm, modulated interferer at ±6 MHz, BER = 10–3 46 / 40 (3) dB Selectivity, image frequency(2) Wanted signal at –67 dBm, modulated interferer at image frequency, BER = 10–3 5 dB Selectivity, image frequency ±2 MHz(2) Note that Image frequency + 2 MHz is the Co-channel. Wanted signal at –67 dBm, modulated interferer at ±2 MHz from image frequency, BER = 10–3 –8 / 32 (3) dB Out-of-band blocking(4) 30 MHz to 2000 MHz –10 dBm Out-of-band blocking 2003 MHz to 2399 MHz –10 dBm Out-of-band blocking 2484 MHz to 2997 MHz –12 dBm Out-of-band blocking 3000 MHz to 12.75 GHz (excluding VCO frequency) –10 dBm Intermodulation Wanted signal at 2402 MHz, –64 dBm. Two interferers at 2408 and 2414 MHz respectively, at the given power level –38 dBm (1) Actual performance exceeding Bluetooth specification (2) Numbers given as I/C dB (3) X / Y, where X is +N MHz and Y is –N MHz (4) Excluding one exception at Fwanted / 2, per Bluetooth Specification (5) Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328 and EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan) (6) The device will saturate at -30dB. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 25 Product Folder Links: CC2340R2 CC2340R5
7.15 Bluetooth Low Energy - Transmit (TX)
When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF = 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT General Parameters Max output power Delivered to a single-ended 50-Ω load through integrated balun 8 dBm Output power programmable range Delivered to a single-ended 50-Ω load through integrated balun 28 dB CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.16 Zigbee and Thread - IEEE 802.15.4-2006 2.4 GHz (OQPSK DSSS1:8, 250 kbps) - RX Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF= 2440 MHz with DC/DC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT General Parameters Receiver sensitivity PER = 1% –98 dBm Receiver saturation PER = 1% > 3 dBm Adjacent channel rejection Wanted signal at –82 dBm, modulated interferer at ±5 MHz, PER = 1% 36 dB Alternate channel rejection Wanted signal at –82 dBm, modulated interferer at ±10 MHz, PER = 1% 55 dB Channel rejection, ±15 MHz or more Wanted signal at –82 dBm, undesired signal is IEEE 802.15.4 modulated channel, stepped through all channels 2405 to 2480 MHz, PER = 1% 59 dB Blocking and desensitization,
5 MHz from upper band edge
Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 57 dB Blocking and desensitization,
10 MHz from upper band edge
Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 63 dB Blocking and desensitization,
20 MHz from upper band edge
Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 63 dB Blocking and desensitization,
50 MHz from upper band edge
Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 66 dB Blocking and desensitization, –5 MHz from lower band edge Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 60 dB Blocking and desensitization, –10 MHz from lower band edge Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 60 dB Blocking and desensitization, –20 MHz from lower band edge Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 63 dB Blocking and desensitization, –50 MHz from lower band edge Wanted signal at –97 dBm (3 dB above the sensitivity level), CW jammer, PER = 1% 65 dB Spurious emissions, 30 MHz to 1000 MHz Measurement in a 50-Ω single-ended load(1) –64 dBm Spurious emissions, 1 GHz to 12.75 GHz Measurement in a 50-Ω single-ended load(1) –49 dBm Frequency error tolerance Difference between the incoming carrier frequency and the internally generated carrier frequency > 80 ppm Symbol rate error tolerance Difference between incoming symbol rate and the internally generated symbol rate > 80 ppm RSSI dynamic range 90 dB RSSI accuracy ±4 dB (1) Suitable for systems targeting compliance with EN 300 328, EN 300 440 class 2 (Europe), FCC CFR47, Part 15 (US) and ARIB STD-T-66 (Japan) www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 27 Product Folder Links: CC2340R2 CC2340R5
7.17 Zigbee and Thread - IEEE 802.15.4-2006 2.4 GHz (OQPSK DSSS1:8, 250 kbps) - TX Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF= 2440 MHz with DC/DC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT General Parameters Max output power (1) Delivered to a single-ended 50-Ω load through integrated balun 8 dBm Output power programmable range Delivered to a single-ended 50-Ω load through integrated balun 29 dB IEEE 802.15.4-2006 2.4 GHz (OQPSK DSSS1:8, 250 kbps) Error vector magnitude +8 dBm setting 2 % (1) To ensure margins for passing FCC band edge requirements at 2483.5 MHz, a lower than maximum output-power setting or less than 100% duty cycle may be used when operating at the upper 802.15.4 channel(s). CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.18 Proprietary Radio Modes
Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF= 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
2 Mbps GFSK (HID), 320 kHz deviation
Receiver sensitivity PER = 30.8%, Payload 37 bytes -89 dBm www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 29 Product Folder Links: CC2340R2 CC2340R5
7.19 2.4 GHz RX/TX CW When measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, fRF = 2440 MHz with DCDC enabled unless otherwise noted. All measurements are performed at the antenna input with a combined RX and TX path. All measurements are performed conducted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Spurious emissions and harmonics Spurious emissions(1) f < 1 GHz, outside restricted bands +8 dBm setting < –36 dBm f < 1 GHz, restricted bands ETSI < –54 dBm f < 1 GHz, restricted bands FCC < –55 dBm f > 1 GHz, including harmonics (ETSI) < –30 dBm Harmonics (1) Second harmonic < –42 dBm Third harmonic < –42 dBm (1) Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328 and EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan).
7.20 Timing and Switching Characteristics
7.20.1 Reset Timing
PARAMETER MIN TYP MAX UNIT RSTN low duration 1 µs
7.20.2 Wakeup Timing
Measured over operating free-air temperature with VDDS = 3.0 V (unless otherwise noted). The times listed here do not include any software overhead (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT MCU, Reset/Shutdown to Active(1) GLDO default charge current setting, VDDR capacitor fully charged (2) 350-450 µs MCU, Standby to Active MCU, Standby to Active (ready to execute code from flash). DCDC ON, default recharge current configuration 33-43 (3) µs MCU, Standby to Active MCU, Standby to Active (ready to execute code from flash). GLDO ON, default recharge current configuration 33-50 (3) µs MCU, Idle to Active Flash enabled in idle mode 3 µs MCU, Idle to Active Flash disabled in idle mode 14 µs (1) Wakeup time includes device ROM bootcode execution time. The wakeup time is dependent on remaining charge on VDDR capacitor when starting the device, and thus how long the device has been in Reset or Shutdown before starting up again. (2) This is the best case reset/shutdown to active time (including ROM bootcode operation), for the specified GLDO charge current setting considering the VDDR capacitor is fully charged and is not discharged during the reset and shutdown events; that is, when the device is in reset / shutdown modes for only a very short period of time (3) Depending on VDDR capacitor voltage level.
7.20.3 Clock Specifications
7.20.3.1 48 MHz Crystal Oscillator (HFXT) Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted.(4) PARAMETER MIN TYP MAX UNIT Crystal frequency 48 MHz ESR Equivalent series resistance 6 pF < CL ≤ 9 pF 20 60 Ω ESR Equivalent series resistance 5 pF < CL ≤ 6 pF 80 Ω CL Crystal load capacitance(1) 5 7(2) 9 pF CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.20.3.1 48 MHz Crystal Oscillator (HFXT) (continued) Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted.(4) PARAMETER MIN TYP MAX UNIT Start-up time (3) Until clock is qualified 200 µs (1) Adjustable load capacitance is integrated into the device. External load capacitors are required for systems targeting compliance with certain regulations. (2) On-chip default connected capacitance including reference design parasitic capacitance. Connected internal capacitance is changed through software in the SysConfig. (3) Start-up time using the TI-provided power driver. Start-up time may increase if driver is not used. (4) Tai-Saw TZ3908AAAO43 has been validated for CC2340R5 design. 7.20.3.2 48 MHz RC Oscillator (HFOSC) Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted. MIN TYP MAX UNIT Frequency 48 MHz Uncalibrated frequency accuracy ±3 % Calibrated frequency accuracy (1) ±0.25 % (1) Accuracy relative to the calibration source (HFXT) 7.20.3.3 32 kHz Crystal Oscillator (LFXT) Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted. MIN TYP MAX UNIT Crystal frequency 32.768 kHz Supported crystal load capacitance 6 12 pF ESR 30 100 kΩ 7.20.3.4 32 kHz RC Oscillator (LFOSC) Measured on the CC2340R5 reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted. MIN TYP MAX UNIT Calibrated frequency 32.768 (1) kHz (1) When using LFOSC as source for the low frequency system clock (LFCLK), the accuracy of the LFCLK-derived Real Time Clock (RTC) can be improved by measuring LFOSC relative to HFXT and compensating for the RTC tick speed. This functionality is available through the TI-provided Power driver.
7.21 Peripheral Characteristics
7.21.1 UART
7.21.1.1 UART Characteristics
over operating free-air temperature range (unless otherwise noted) PARAMETER MIN TYP MAX UNIT UART rate 3 MBaud
7.21.2 SPI
7.21.2.1 SPI Characteristics
Using TI SPI driver, over operating free-air temperature range (unless otherwise noted). PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT fSCLK 1/tsclk SPI clock frequency Controller Mode and Peripheral Mode (1) 2.7V ≤ VDDS < 3.8V 12 MHz Controller Mode and Peripheral Mode (1) VDDS < 2.7V 8 MHz DCSCK SCK Duty Cycle 45 50 55 % (1) Assume interfacing with ideal SPI controller and SPI peripheral devices www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 31 Product Folder Links: CC2340R2 CC2340R5
7.21.2.2 SPI Controller Mode
Using TI SPI driver, over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT tSCLK_H/ L SCLK High or Low time (tSPI/2) - 1 tSPI/2 (tSPI/2) + 1 ns tCS.LEAD CS lead-time, CS active to clock 1 SCLK tCS.LAG CS lag time, Last clock to CS inactive 1 SCLK tCS.ACC CS access time, CS active to PICO data out 1 SCLK tCS.DIS CS disable time, CS inactive to PICO high impedance 1 SCLK tVALID.C O PICO output data valid time(1) SCLK edge to PICO valid,CL = 20 pF 13 ns tHD.CO PICO output data hold time(2) CL = 20 pF 0 ns (1) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge (2) Specifies how long data on the output is valid after the output changing SCLK clock edge
7.21.2.3 SPI Timing Diagrams - Controller Mode
(SPO = 0) POCI SCLK (SPO = 1) CS (inverted) CS PICO tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,CI tHD,CI tVALID,CO tHD,CO 1 / fSPI tSCLK_H/L tSCLK_H/L Controller Mode, SPH = 0 Figure 7-1. SPI Timing Diagram - Controller Mode, SPH = 0 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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(inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,CI tHD,CI tVALID,CO tHD,CO SCLK (SPO = 0) POCI SCLK (SPO = 1) PICO 1 / fSPI tSCLK_H/L tSCLK_H/L Controller Mode, SPH = 1 Figure 7-2. SPI Timing Diagram - Controller Mode, SPH = 1
7.21.2.4 SPI Peripheral Mode
Using TI SPI driver, over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT tCS.LEAD CS lead-time, CS active to clock 1 SCLK tCS.LAG CS lag time, Last clock to CS inactive 1 SCLK tCS.ACC CS access time, CS active to POCI data out VDDS = 3.3V 35 ns tCS.ACC CS access time, CS active to POCI data out VDDS = 1.8V 50 ns tCS.DIS CS disable time, CS inactive to POCI high impedance VDDS = 3.3V 35 ns tCS.DIS CS disable time, CS inactive to POCI high impedance VDDS = 1.8V 50 ns tSU.PI PICO input data setup time 13 ns tHD.PI PICO input data hold time 0 ns tVALID.P O POCI output data valid time(1) SCLK edge to POCI valid,CL = 20pF, 3.3V 35 ns tVALID.P O POCI output data valid time(1) SCLK edge to POCI valid,CL = 20pF, 1.8V 50 ns tHD.PO POCI output data hold time(2) CL = 20pF 0 ns (1) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge (2) Specifies how long data on the output is valid after the output changing SCLK clock edge www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 33 Product Folder Links: CC2340R2 CC2340R5
7.21.2.5 SPI Timing Diagrams - Peripheral Mode
(inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,PI tHD,PI tVALID,PO tHD,PO SCLK (SPO = 0) PICO SCLK (SPO = 1) POCI 1 / fSPI tSCLK_H/L tSCLK_H/L Peripheral Mode, SPH = 0 Figure 7-3. SPI Timing Diagram - Peripheral Mode, SPH = 0 CS (inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,PI tHD,PI tVALID,PO tHD,PO SCLK (SPO = 0) PICO SCLK (SPO = 1) POCI 1 / fSPI tSCLK_H/L tSCLK_H/L Peripheral Mode, SPH = 1 Figure 7-4. SPI Timing Diagram - Peripheral Mode, SPH = 1 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.21.3 I2C
7.21.3.1 I2C
Over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT fSCL SCL clock frequency 0 400 kHz tHD,STA Hold time (repeated) START fSCL = 100kHz 4.0 µs tHD,STA Hold time (repeated) START fSCL > 100kHz 0.6 µs tSU,STA Setup time for a repeated START fSCL = 100kHz 4.7 µs tSU,STA Setup time for a repeated START fSCL > 100kHz 0.6 µs tHD,DAT Data hold time 0 µs tSU,DAT Data setup time fSCL = 100kHz 250 ns tSU,DAT Data setup time fSCL > 100kHz 100 ns tSU,STO Setup time for STOP fSCL = 100kHz 4.0 µs tSU,STO Setup time for STOP fSCL > 100kHz 0.6 µs tBUF Bus free time between STOP and START conditions fSCL = 100kHz 4.7 µs tBUF Bus free time between STOP and START conditions fSCL > 100kHz 1.3 µs tSP Pulse duration of spikes suppressed by input deglitch filter 50 ns
7.21.3.2 I2C Timing Diagram
tSU,DAT tHD,STAtHD,STA tSU,STO tBUFtSU,STA tSPttHIGHtttLOWt tHD,DAT Figure 7-5. I2C Timing Diagram
7.21.4 GPIO
7.21.4.1 GPIO DC Characteristics
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TA = 25 °C, VDDS = 1.8 V GPIO pullup current Input mode, pullup enabled, Vpad = 0 V 39 66 109 µA GPIO pulldown current Input mode, pulldown enabled, Vpad = VDDS 10 21 40 µA GPIO low-to-high input transition, with hysteresis IH = 1, transition voltage for input read as 0 → 1 0.91 1.11 1.27 V GPIO high-to-low input transition, with hysteresis IH = 1, transition voltage for input read as 1 → 0 0.59 0.75 0.91 V GPIO input hysteresis IH = 1, difference between 0 → 1 and 1 → 0 points 0.26 0.35 0.44 V TA = 25 °C, VDDS = 3.0 V GPIO VOH at 10 mA load high-drive GPIOs only, max drive setting 2.47 V GPIO VOL at 10 mA load high-drive GPIOs only, max drive setting 0.25 V GPIO VOH at 2 mA load standard drive GPIOs 2.52 V www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 35 Product Folder Links: CC2340R2 CC2340R5
7.21.4.1 GPIO DC Characteristics (continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT GPIO VOL at 2 mA load standard drive GPIOs 0.20 V TA = 25 °C, VDDS = 3.8 V GPIO pullup current Input mode, pullup enabled, Vpad = 0 V 170 262 393 µA GPIO pulldown current Input mode, pulldown enabled, Vpad = VDDS 60 110 172 µA GPIO low-to-high input transition, with hysteresis IH = 1, transition voltage for input read as 0 → 1 1.76 1.98 2.27 V GPIO high-to-low input transition, with hysteresis IH = 1, transition voltage for input read as 1 → 0 1.26 1.52 1.79 V GPIO input hysteresis IH = 1, difference between 0 → 1 and 1 → 0 points 0.40 0.47 0.54 V TA = 25 °C VIH Lowest GPIO input voltage reliably interpreted as a High 0.8*VDDS V VIL Highest GPIO input voltage reliably interpreted as a Low 0.2*VDDS V CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.21.5 ADC
7.21.5.1 Analog-to-Digital Converter (ADC) Characteristics
Tc = 25°C, VDDS = 3.0V, unless otherwise noted.(2) Performance numbers require use of offset and gain adjustments in software by TI-provided ADC drivers. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ADC Power Supply and Input Range Conditions V(Ax) Analog input voltage range All ADC analog input pins Ax 0 VDDS V I(ADC) single- ended mode Operating supply current into VDDS terminal RES = 0x0 (12Bit mode), Fs = 1.2MSPS, Internal reference OFF (ADCREF_EN = 0), VeREF+ = VDDS 480 μA RES = 0x0 (12Bit mode), Fs = 266ksps, Internal reference ON (ADCREF_EN = 0), ADCREF = 2.5V 365 CI GPIO Input capacitance into a single terminal 5 7 pF RI GPIO Input MUX ON-resistance 0.5 1 kΩ ADC Switching Characteristics FS ADC REF ADC sampling frequency when using the internal ADC reference voltage ADCREF_EN = 1, RES = 0x0 (12-bit), VDDS = 1.71V to VDDSmax 267 (1) ksps FS ADC REF ADC sampling frequency when using the internal ADC reference voltage ADCREF_EN = 1, RES = 0x1 (10-bit), VDDS = 1.71V to VDDSmax 308 (1) ksps FS ADC REF ADC sampling frequency when using the internal ADC reference voltage ADCREF_EN = 1, RES = 0x2 (8-bit), VDDS = 1.71V to VDDSmax 400 (1) ksps FS EXTR EF ADC sampling frequency when using the external ADC reference voltage ADCREF_EN = 0, VeREF+ = VDDS, RES = 0x0 (12-bit), VDDS = 1.71V to VDDSmax 1.2 (1) Msps FS EXTR EF ADC sampling frequency when using the external ADC reference voltage ADCREF_EN = 0, VeREF+ = VDDS, RES = 0x1 (10-bit), VDDS = 1.71V to VDDSmax 1.33 (1) Msps FS EXTR EF ADC sampling frequency when using the external ADC reference voltage ADCREF_EN = 0, VeREF+ = VDDS, RES = 0x2 (8-bit), VDDS = 1.71V to VDDSmax 1.6 (1) Msps NCONVER T Clock cycles for conversion RES = 0x0 (12-bit) 14 cycles NCONVER T Clock cycles for conversion RES = 0x1 (10-bit) 12 cycles NCONVER T Clock cycles for conversion RES = 0x2 (8-bit) 9 cycles tSample Sampling time RES = 0x0 (12-bit), RS = 25 Ω, Cpext = 10 pF. +/- 0.5 LSB settling 250 ns tVSUPPLY/ 3(sample) Sample time required when Vsupply/3 channel is selected 20 µs ADC Linearity Parameters EI Integral linearity error (INL) for single-ended inputs 12-bit Mode, VR+ = VeREF+ = VDDS, VDDS=1.71-->3.8 +/- 2 LSB ED Differential linearity error (DNL) 12-bit Mode, VR+ = VeREF+ = VDDS, VDDS=1.71-->3.8 +/- 1 LSB EO Offset error 12-bit Mode, External reference, VR+ = VeREF+ = VDDS, VDDS=1.71-->3.8 1.98 LSB EO Offset error 12-bit Mode, Internal reference, VR+ = ADCREF = 2.5V 1.02 LSB EG Gain error External Reference, VR+ = VeREF+ = VDDS , VDD= 1.71-->3.8 +/- 2 LSB EG Gain error Internal reference, VR+ = ADCREF = 2.5V +/- 40 LSB ADC Dynamic Parameters ENOB Effective number of bits ADCREF_EN = 0, VeREF+ = VDDS =3.3V, VeREF-=0V, RES = 0x2 (8-bit) 8 bit ENOB Effective number of bits ADCREF_EN = 0, VeREF+ = VDDS =3.3V, VeREF-=0V, RES = 0x1 (10-bit) 9.9 bit www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 37 Product Folder Links: CC2340R2 CC2340R5
7.21.5.1 Analog-to-Digital Converter (ADC) Characteristics (continued)
Tc = 25°C, VDDS = 3.0V, unless otherwise noted.(2) Performance numbers require use of offset and gain adjustments in software by TI-provided ADC drivers. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ENOB Effective number of bits ADCREF_EN = 0, VeREF+ = VDDS =3.3V, VeREF-=0V, RES = 0x0 (12-bit) 11.2 bit ENOB Effective number of bits ADCREF_EN = 1, ADCREF_VSEL = {2.5V, 1.4V}, RES = 0x2 (8-bit) 8 bit ENOB Effective number of bits ADCREF_EN = 1, ADCREF_VSEL = {2.5V, 1.4V} , RES = 0x1 (10-bit) 9.6 bit ENOB Effective number of bits ADCREF_EN = 1, ADCREF_VSEL = {2.5V, 1.4V}, RES = 0x0 (12-bit) 10.4 bit ENOB Effective number of bits VDDS reference, RES = 0x0 (12-bit) 11.2 bit SINAD Signal-to-noise and distortion ratio ADCREF_EN = 0, VeREF+ = VDDS =3.3V, VeREF-=0V, RES = 0x0 (12-bit) 69.18 dB SINAD Signal-to-noise and distortion ratio ADCREF_EN = 1, ADCREF_VSEL = {2.5V, 1.4V}, RES = 0x0 (12-bit) 64.37 dB SINAD Signal-to-noise and distortion ratio VDDS reference, RES = 0x0 (12-bit) 69.18 dB ADC External Reference EXTREF Positive external reference voltage input ADCREF_EN=0, ADC reference sourced from external reference pin (VeREF+) 1.4 VDDS V EXTREF Negative external reference voltage input ADCREF_EN=0, ADC reference sourced from external reference pin (VeREF-) 0 V ADC Temperature Diode, Supply Monitor Temp_di ode Accurac y Temperature Error ADC input channel: Temp diode voltage, Error calculated in temperature range: -30C to +40C, with single point calibration (2) +/- 3 C ADC Internal Input: VSUPPLY / Accurac y Vsupply voltage divider accuracy for supply monitoring ADC input channel: Vsupply monitor +/- 1 % ADC Internal Input: IVsupply / 3 Vsupply voltage divider current consumption ADC input channel Vsupply monitor. Vsupply=VDDS=3.3V 10 µA ADC Internal and VDDS Reference VDDSR EF Positive ADC reference voltage ADC reference sourced from VDDS VDDS V ADCRE F Internal ADC Reference Voltage ADCREF_EN = 1, ADCREF_VSEL = 0, VDDS = 1.71V - VDDSmax 1.4 V ADCREF_EN = 1, ADCREF_VSEL = 1, VDDS = 2.7V - VDDSmax 2.5 V IADCREF Operating supply current into VDDA terminal with internal reference ON ADCREF_EN = 1, VDDA = 1.7V to VDDAmax, ADCREF_VSEL = {0,1} 80 µA tON Internal ADC Reference Voltage power on-time ADCREF_EN = 1 2 µs (1) Measured with 48MHz HFOSC (2) Using IEEE Std 1241-2010 for terminology and test methods CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.21.6 Comparators
7.21.6.1 Ultra-Low Power Comparator
Tc = 25°C, VDDS = 3.0V, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Input voltage range 0 VDDS V Clock frequency 32 KHz Voltage Divider Accuracy Input voltage range is between VDDS/4 and VDDS. 98% Offset Measured at VDDS / 2 (Errors seen when using two external inputs) ±27.3 mV Decision time Step from –50mV to 50mV 1 3 Clock Cycle Comparator enable time COMP_LP disable → enable, VIN+, VIN- from pins, Overdrive ≥ 20mV 70 µs Current consumption Including using VDDS/2 as internal reference at VIN– comparator terminal 370 nA
7.22 Typical Characteristics
All measurements in this section are done with T c = 25°C and V DDS = 3.0V, unless otherwise noted. See Recommended Operating Conditions for device limits. Values exceeding these limits are for reference only.
7.22.1 MCU Current
V o l t a g e ( V ) Current (mA) 2 . 2 2 . 4 2 . 6 2 . 8 3 . 2 3 . 4 3 . 6 3 . 8 4 . 2 4 . 4 4 . 6 Figure 7-6. Active Mode (MCU) Current vs. Supply Voltage (VDDS) (Running CoreMark) T e m p e r a t u r e ( ° C ) Current (µA) - 4 0 - 2 0 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 1 0 1 1 Figure 7-7. Standby Mode (MCU) Current vs. Temperature ( RAM and partial register retention, RTC) www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 39 Product Folder Links: CC2340R2 CC2340R5
7.22.2 RX Current
T e m p e r a t u r e ( ° C ) Current [mA] - 4 0 - 2 5 - 1 0 5 2 0 3 5 5 0 6 5 8 0 9 5 1 1 0 1 2 5 4 . 9 5 . 1 5 . 2 5 . 3 5 . 4 5 . 5 5 . 6 5 . 7 5 . 8 5 . 9 6 . 1 6 . 2 6 . 3 6 . 4 Figure 7-8. RX Current vs. Temperature (BLE 1Mbps, 2.44GHz) V o l t a g e ( V ) Current (mA) 4 . 5 5 . 5 6 . 5 7 . 5 8 . 5 9 . 5 1 0 Figure 7-9. RX Current vs. Supply Voltage (VDDS) (BLE 1Mbps, 2.44GHz) CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.22.3 TX Current
T e m p e r a t u r e ( ° C ) Current (mA) - 4 0 - 2 5 - 1 0 5 2 0 3 5 5 0 6 5 8 0 9 5 1 1 0 1 2 5 4 . 5 4 . 7 4 . 9 5 . 1 5 . 3 5 . 5 5 . 7 5 . 9 6 . 1 6 . 3 6 . 5 Figure 7-10. TX Current vs. Temperature (BLE 1Mbps, 2.44GHz, 0dBm) T e m p e r a t u r e ( ° C ) Current [mA] - 4 0 - 2 5 - 1 0 5 2 0 3 5 5 0 6 5 8 0 9 5 1 1 0 1 2 5 9 . 4 9 . 8 1 0 . 2 1 0 . 6 1 1 1 1 . 4 1 1 . 8 1 2 . 2 1 2 . 6 1 3 1 3 . 4 Figure 7-11. TX Current vs. Temperature (BLE 1Mbps, 2.44GHz, +8dBm) Figure 7-12. TX Current vs. Supply Voltage, VDDS (BLE 1Mbps, 2.44GHz, 0dBm) V o l t a g e ( V ) Current (mA) 8 . 5 9 . 5 1 0 . 5 1 1 . 5 1 2 . 5 1 3 . 5 1 4 . 5 1 5 . 5 1 6 . 5 1 7 . 5 1 8 . 5 1 9 . 5 Figure 7-13. TX Current vs. Supply Voltage, VDDS (BLE 1Mbps, 2.44GHz, +8dBm) www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 41 Product Folder Links: CC2340R2 CC2340R5
Table 7-1 shows typical TX current and output power for different output power settings. Table 7-1. Typical TX Current and Output Power 2.4 GHz, VDDS = 3.0 V, DCDC=On, Temperature = 25 °C (Measured on LP-EM-CC2340R5) txPowerTable Index TX Power Setting [dBm] (SmartRF Studio) Typical Output Power [dBm] Typical Current Consumption [mA] 13 8 7.7 10.7 12 7 7.1 9.5 11 6 6.3 8.9 10 5 5.5 8.3 9 4 4.5 7.9 8 3 3.7 7.5 7 2 2.4 7.1 6 1 1.0 5.4 5 0 0.4 5.1 4 -4 -3.1 4.8 3 -8 -7.3 4.5 2 -12 -10.9 4.2 1 -16 -15.1 4.0 0 -20 -19.0 3.8 CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.22.4 RX Performance
F r e q u e n c y ( M H z ) Sensitivity (dBm) 2 3 6 0 2 3 8 0 2 4 0 0 2 4 2 0 2 4 4 0 2 4 6 0 2 4 8 0 2 5 0 0 - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 - 9 2 - 9 1 Figure 7-14. Sensitivity vs. Frequency (BLE 1Mbps) F r e q u e n c y ( M H z ) Power (dBm) 2 4 0 0 2 4 0 8 2 4 1 6 2 4 2 4 2 4 3 2 2 4 4 0 2 4 4 8 2 4 5 6 2 4 6 4 2 4 7 2 2 4 8 0 - 1 0 2 - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 - 9 2 Figure 7-15. Sensitivity vs. Frequency (IEEE
802.15.4 PHY )
Figure 7-16. Sensitivity vs. Temperature (BLE 1Mbps, 2.44GHz) T e m p e r a t u r e ( ° C ) Sensitivity (dBm) - 4 0 - 2 0 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 - 1 0 3 - 1 0 2 - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 Figure 7-17. Sensitivity vs. Temperature (IEEE 802.15.4 PHY, 2.44GHz) V o l t a g e ( V ) Sensitivity (dBm) - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 - 9 2 - 9 1 Figure 7-18. Sensitivity vs. Supply Voltage (VDDS) (BLE 1Mbps, 2.44GHz) V o l t a g e ( V ) Sensitivity (dBm) - 1 0 2 - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 - 9 2 Figure 7-19. Sensitivity vs. Supply Voltage (VDDS) (IEEE 802.15.4 PHY, 2.44GHz) www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 43 Product Folder Links: CC2340R2 CC2340R5
V o l t a g e ( V ) Sensitivity (dBm) - 1 0 1 - 1 0 0 - 9 9 - 9 8 - 9 7 - 9 6 - 9 5 - 9 4 - 9 3 - 9 2 - 9 1 Figure 7-20. Sensitivity vs. Supply Voltage (VDDS) (BLE 1Mbps, 2.44GHz, DCDC Off) CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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7.22.5 TX Performance
T e m p e r a t u r e ( ° C ) Output Power (dBm) - 4 0 - 2 0 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 - 2 - 1 . 5 - 1 - 0 . 5 0 . 5 1 . 5 Figure 7-21. Output Power vs. Temperature (BLE 1Mbps, 2.44GHz, 0dBm) T e m p e r a t u r e ( ° C ) Output Power (dBm) - 4 0 - 2 0 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 6 . 5 7 . 5 8 . 5 9 . 5 1 0 Figure 7-22. Output Power vs. Temperature (BLE 1Mbps, 2.44GHz, +8dBm) V o l t a g e ( V ) Power (dBm) - 2 - 1 . 5 - 1 - 0 . 5 0 . 5 1 . 5 Figure 7-23. Output Power vs. Supply Voltage (VDDS) (BLE 1Mbps, 2.44GHz, 0dBm) V o l t a g e ( V ) Output Power (dBm) 6 . 5 7 . 5 8 . 5 9 . 5 1 0 Figure 7-24. Output Power vs. Supply Voltage (VDDS) (BLE 1Mbps, 2.44GHz, +8dBm) F r e q u e n c y ( M H z ) Power (dBm) 2 3 6 0 2 3 8 0 2 4 0 0 2 4 2 0 2 4 4 0 2 4 6 0 2 4 8 0 2 5 0 0 - 2 - 1 . 5 - 1 - 0 . 5 0 . 5 1 . 5 Figure 7-25. Output Power vs. Frequency (BLE 1Mbps, 0dBm) F r e q u e n c y ( M H z ) Output Power (dBm) 2 3 6 0 2 3 8 0 2 4 0 0 2 4 2 0 2 4 4 0 2 4 6 0 2 4 8 0 2 5 0 0 6 . 5 7 . 5 8 . 5 9 . 5 1 0 Figure 7-26. Output Power vs. Frequency (BLE 1Mbps, +8dBm) www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 45 Product Folder Links: CC2340R2 CC2340R5
7.22.6 ADC Performance
F r e q u e n c y [ k H z ] ENOB [bit] 0.01 0.02 0.05 0.1 0.2 0.3 0.5 1 0 1 0 . 4 1 0 . 8 1 1 . 2 1 1 . 6 1 2 1 2 . 4 Figure 7-27. ENOB vs. Input Frequency (Internal Reference) Figure 7-28. ENOB vs. Sampling Frequency (Vin= 3V Sine Wave, Internal Reference, Fin=Fs/10) Figure 7-29. ENOB vs. Input Frequency (External Reference = 3.0V) F r e q u e n c y ( k H z ) ENOB (bit) 0.1 0.2 0.5 100 200 500 1000 1200 1 0 1 0 . 1 1 0 . 2 1 0 . 3 1 0 . 4 1 0 . 5 1 0 . 6 1 0 . 7 1 0 . 8 1 0 . 9 1 1 1 1 . 1 1 1 . 2 1 1 . 3 1 1 . 4 1 1 . 5 Figure 7-30. ENOB vs. Sampling Frequency (Vin = 3V Sine Wave, External Reference = 3.0V, Fin=Fs/10 Figure 7-31. INL vs. ADC Code (Vin= 3V Sine Wave, Internal Reference, 200ksps) A D C C o d e DNL (LSB) 0 5 1 2 1 0 2 4 1 5 3 6 2 0 4 8 2 5 6 0 3 0 7 2 3 5 8 4 4 0 9 5 - 0 . 4 - 0 . 3 - 0 . 2 - 0 . 1 0 . 1 0 . 2 0 . 3 0 . 4 0 . 5 0 . 6 Figure 7-32. DNL vs. ADC Code (Vin= 3V Sine Wave, Internal Reference, 200ksps) CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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8 Detailed Description
8.1 Overview
Section 4 shows the core modules of the CC2340R device.
8.2 System CPU
The CC2340R SimpleLink™ Wireless MCU contains an Arm® Cortex®-M0+ system CPU, which runs the application, the protocol stacks, and the radio. The Cortex-M0+ processor is built on a highly area and power optimized 32-bit processor core, with a 2-stage pipeline Von Neumann architecture. The processor delivers exceptional energy efficiency through a small but powerful instruction set and extensively optimized design, providing high-end processing hardware including a single-cycle multiplier. The Cortex-M0+ processor offers multiple benefits to developers including:
- Ultra-low power, energy efficient operation
- Deterministic, high-performance interrupt handling for time-critical applications
- Upward compatibility with the Cortex-M processors family The Cortex-M0+ processor provides the excellent performance expected of a modern 32-bit architecture core, with higher code density than other 8-bit and 16-bit microcontrollers. Its features include the following:
- ARMv6-M architecture optimized for small-footprint embedded applications
- Subset of Arm Thumb/Thumb-2 mixed 16- and 32-bit instructions delivers the high performance expected of a 32-bit Arm
- Single-cycle multiply instruction
- VTOR supporting offset of the vector table base address
- Serial Wire debug with HW break-point comparators
- Ultra-low-power consumption with integrated sleep modes
- SysTick timer
- 48MHz operation
- 0.99DMIPS/MHz Additionally, the CC2340R devices are compatible with all ARM tools and software.
8.3 Radio (RF Core)
The low-power RF Core (LRF) implements a high performance and highly flexible RF sub system containing RF and baseband circuitry in addition to a software defined digital radio (LRFD). LRFD provides a high-level, command-based API to the main CPU and handles all of the timing critical and low-level details of many different radio PHYs. Several signals are also available to control external circuitry such as RF switches or range extenders autonomously. The software-defined modem is not programmable by customers but is instead loaded with precompiled images provided in the radio driver in the SimpleLink™ Low Power F3 software development kit (SDK) for the CC23xx devices. This mechanism allows the radio platform to be updated for support of future versions of standards with over-the-air (OTA) updates while still using the same silicon. LRFD stores the code images in the RF SRAM and does not make use of any ROM memory, thus image loading from NV memory only occurs once after boot and also, no patching is required when exiting power modes. 8.3.1 Bluetooth 5.3 Low Energy The RF Core offers full support for Bluetooth 5.3 Low Energy, including the high-speed 2Mbps physical layer and the 500kbps and 125kbps long range PHYs (Coded PHY) through the TI provided Bluetooth 5.3 stack or through a high-level Bluetooth API. The new high-speed mode allows data transfers up to 2Mbps, twice the speed of Bluetooth 4.2 and five times the speed of Bluetooth 4.0, without increasing power consumption. In addition to faster speeds, this mode offers significant improvements in energy efficiency and wireless coexistence with reduced radio communication time. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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Bluetooth 5.3 also enables unparalleled flexibility for adjustment of speed and range based on application needs, which capitalizes on the high-speed or long-range modes respectively. Data transfers are now possible at 2Mbps, enabling the development of applications using voice, audio, imaging, and data logging that were not previously an option using Bluetooth low energy. With high-speed mode, existing applications deliver faster responses, richer engagement, and longer battery life. Bluetooth 5.3 enables fast, reliable firmware updates. 8.3.2 802.15.4 (Thread and Zigbee) Through a dedicated IEEE radio API, the RF Core supports the 2.4GHz IEEE 802.15.4-2011 physical layer (2 Mchips per second Offset-QPSK with DSSS 1:8), used in Thread and Zigbee protocols. TI also provides royalty-free protocol stacks for Thread and Zigbee, enabling a robust end-to end solution.
8.4 Memory
Up to 512KB nonvolatile (Flash) memory provides storage for code and data. The flash memory is in-system programmable and erasable. A special flash memory sector must contain a Customer Configuration section (CCFG) that is used by boot ROM and TI provided drivers to configure the device. This configuration is done through the ccfg.c source file that is included in all TI provided examples. Up to 64KB ultra-low leakage system static RAM (SRAM) can be used for both storage of data and execution of code. Retention of SRAM contents in Standby power mode is enabled by default and included in Standby mode power consumption numbers. System SRAM is always initialized to zeroes upon code execution during boot. The ROM includes device bootcode firmware handling initial device trimming operations, security configurations, and device lifecycle management. The ROM also contains a serial (SPI and UART) bootloader that can be used for the initial programming of the device. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 49 Product Folder Links: CC2340R2 CC2340R5
8.5 Cryptography
The CC2340R device comes with AES-128 cryptography hardware accelerator, reducing code footprint and execution time for cryptographic operations. It also has the benefit of being lower power and improves availability and responsiveness of the system because the cryptography operations run in a background hardware thread. The AES hardware accelerators supports the following block cipher modes and message authentication codes:
- AES ECB encrypt
- AES CBC encrypt
- AES CTR encrypt/decrypt
- AES CBC-MAC
- AES GCM
- AEC CCM (uses a combination of CTR + CBC-MAC hardware via software drivers) The AES hardware accelerator can be fed with plaintext/ciphertext from either CPU or using DMA. Sustained throughput of one 16 byte ECB block per 23 cycles is possible corresponding to > 30Mbps. The CC2340R device supports Random Number Generation (RNG) using on-chip analog noise as the non-deterministic noise source for the purpose of generating a seed for a cryptographically secure counter deterministic random bit generator (CTR-DRBG) that in turn is used to generate random numbers for keys, initialization vectors (IVs), and other random number requirements. Hardware acceleration of AES CTR-DRBG is supported. The CC2340R device includes a complete SHA 256 library in ROM, reducing the code footprint of the application. Uses cases may include generating digests for use in digital signature algorithms, data integrity checks, and password storage. Together with a large selection of open-source cryptography libraries provided with the Software Development Kit (SDK), this allows for secure and future proof IoT applications to be easily built on top of the platform.
8.6 Timers
A large selection of timers are available as part of the CC2340R device. These timers are:
- Real-Time Clock (RTC) The RTC is a 67-bit, 2-channel timer running on the LFCLK system clock. The RTC is active in STANDBY and ACTIVE power states. When the device enters the RESET or SHUTDOWN state the RTC is reset. The RTC accumulates time elapsed since reset on each LFCLK. The RTC counter is incremented by LFINC at a rate of 32.768kHz. LFINC indicates the period of LFCLK in μs, with an additional granularity of 16 fractional bits. The counter can be read from two 32-bit registers. RTC.TIME8U has a range of approximately 9.5 hours with an LSB representing 8 microseconds. RTC.TIME524M has a range of approximately 71.4 years with an LSB representing 524 milliseconds. There is hardware synchronization between the system timer (SYSTIM) and the RTC so that the multichannel and higher resolution SYSTIM remains in synchronization with the RTC’s time base. The RTC has two channels: one compare channel and one capture channel and is capable of waking the device out of the standby power state. The RTC compare channel is typically used only by system software and only during the standby power state.
- System Timer (SYSTIM) The SYSTIM is a 34-bit, 5-channel wrap-around timer with a per-channel selectable 32b slice with either a 1μs resolution and 1h11m35s range or 250ns resolution and 17m54s range. All channels support both capture and single-shot compare (posting an event) operation. One channel is reserved for system software, three channels are reserved for radio software and one channel is freely available to user applications. For software convenience, a hardware synchronization mechanism automatically ensures that the RTC and SYSTIM share a common time base (albeit with different resolutions/spans). Another software convenience CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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feature is that SYSTIM qualifies any submitted compare values so that the timer channel will immediately trigger if the submitted event is in the immediate past (4.294s with 1μs resolution and 1.049s with 250ns resolution).
- General Purpose Timers (LGPT) The CC2340R device provides up to four LGPTs with 3 × 16 bit timers and 1× 24 bit timer, all running up to 48MHz. The LGPTs support a wide range of features such as: – Three capture/compare channels – One-shot or periodic counting – Pulse width modulation (PWM) – Time counting between edges and edge counting – Input filter implemented on each of the channels for all timers – IR generation feature available on Timer-0 and Timer-1 – Dead band feature available on Timer-1 The timer capture/compare and PWM signals are connected to IOs through the IO controller module (IOC) and the internal timer event connections to CPU, DMA, and other peripherals are through the event fabric, which allows the timers to interact with signals such as GPIO inputs, other timers, DMA and ADC. Two LGPTs (2× 16-bit timers) support quadrature decoder mode to enable buffered decoding of quadrature- encoded sensor signals. The LGPTs are available in device Active and Idle power modes. Table 8-1. Timer Comparison Feature Timer 0 Timer 1 Timer 2 Timer 3 Counter Width 16-bit 16-bit 16-bit 24-bit Quadrature Decoder Yes No Yes No Park Mode on Fault No Yes No No Programmable Dead- Band Insertion No Yes No No
- Table 8-2. Timer Availability Part Number Timer 0 Timer 1 Timer 2 Timer 3 CC2340R21 Yes Yes No No CC2340R22 Yes Yes Yes Yes CC2340R52 Yes Yes Yes Yes CC2340R53 Yes Yes Yes Yes
- Watchdog timer The watchdog timer is used to regain control if the system operates incorrectly due to software errors. Upon counter expiry, the watchdog timer resets the device when periodic monitoring of the system components and tasks fails to verify proper functionality. The watchdog timer runs on a 32kHz clock rate and operates in device active, idle, and standby modes and cannot be stopped once enabled.
8.7 Serial Peripherals and I/O
The CC2340R device provides 1xUART, 1xSPI, and 1xI2C serial peripherals. The SPI module supports both SPI controller and peripheral up to 12MHz with configurable phase and polarity. The UART module implements universal asynchronous receiver and transmitter functions. They support flexible baud-rate generation up to a maximum of 3Mbps and IRDA SIR mode of operation. The I2C module is used to communicate with devices compatible with the I 2C standard. The I 2C interface can handle 100kHz and 400kHz operation and can serve as both controller and target. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 51 Product Folder Links: CC2340R2 CC2340R5
The I/O controller (IOC) controls the digital I/O pins and contains multiplexer circuitry to allow a set of peripherals to be assigned to I/O pins in a fixed manner over DIOs. All digital I/Os are interrupt and wake-up capable, have a programmable pullup and pulldown function, and can generate an interrupt on a negative or positive edge (configurable). When configured as an output, pins can function as either push-pull, open-drain, or open-source. Some GPIOs have high-drive capabilities, which are marked in bold in Pin Configurations and Functions. For more information, see the CC23xx SimpleLink™ Wireless MCU Technical Reference Manual.
8.8 Battery and Temperature Monitor
A combined temperature and battery voltage monitor is available in the CC2340R device. The battery and temperature monitor allows an application to continuously monitor on-chip temperature and supply voltage and respond to changes in environmental conditions as needed. The module contains window comparators to interrupt the system CPU when temperature or supply voltage go outside defined windows. These events can also be used to wake up the device from Standby mode through the Always-On (AON) event fabric. 8.9 µDMA The device includes a direct memory access (µDMA) controller. The µDMA controller provides a way to offload data-transfer tasks from the system CPU, thus allowing for more efficient use of the processor and the available bus bandwidth. The µDMA controller can perform a transfer between memory and peripherals. The µDMA controller has dedicated channels for each supported on-chip module and can be programmed to automatically perform transfers between peripherals and memory when the peripheral is ready to transfer more data. Some features of the µDMA controller include the following (this is not an exhaustive list):
- Channel operation of up to 8 channels, with 6 channels having dedicated peripheral interface and 2 channels having ability to be triggered via configurable events.
- Transfer modes: memory-to-memory, memory-to-peripheral, peripheral-to-memory, and peripheral-to-peripheral
- Data sizes of 8, 16, and 32 bits
- Ping-pong mode for continuous streaming of data
8.10 Debug
On-chip debug is supported through the serial wire debug (SWD) interface, which is an ARM bi-directional 2-wire protocol that communicates with the JTAG Test Access Port (TAP) controller and allows for complete debug functionality. SWD is fully compatible with Texas Instruments' XDS family of debug probes. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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8.11 Power Management
To minimize power consumption, the CC2340R supports a number of power modes and power management features (see Table 8-3). Table 8-3. Power Modes MODE SOFTWARE CONFIGURABLE POWER MODES (1) RESET PIN HELDACTIVE IDLE STANDBY SHUTDOWN CPU Active Off Off Off Off Flash On Available Off Off Off SRAM On On Retention Off Off Radio Available Available Off Off Off Supply System On On Duty Cycled Off Off CPU register retention Full Full Full (2) No No SRAM retention Full Full Full Off Off
48 MHz high-speed clock
(HFCLK) HFOSC (tracks HFXT) HFOSC (tracks HFXT) Off Off Off 32 kHz low-speed clock (LFCLK) LFXT or LFOSC LFXT or LFOSC LFXT or LFOSC Off Off Peripherals Available Available IOC, BATMON, RTC, LPCOMP Off Off Wake-up on RTC N/A Available Available Off Off Wake-up on pin edge N/A Available Available Available Off Wake-up on reset pin On On On On On Brownout detector (BOD) On On Duty Cycled Off Off Power-on reset (POR) On On On On On Watchdog timer (WDT) Available Available Available Off Off (1) “Available” indicates that the specific IP or feature can be enabled by user application in the corresponding device operating modes. “On” indicates that the specific IP or feature is turned on irrespective of the user application configuration of the device in the corresponding device operating mode. “Off” indicates that the specific IP or feature is turned off and not available for the user application in the corresponding device operating mode. (2) Software-based retention of CPU registers with context save and restore when entering and exiting standby power mode In the Active mode, both of MCU and AON power domains are powered. Clock gating is used to minimize power consumption. Clock gating to peripherals/subsystems is controlled manually by the CPU. In Idle mode the CPU is in sleep but selected peripherals and subsystems (such as the radio) can be active. Infrastructure (Flash, ROM, SRAM, bus) clock gating is possible depending on state of the DMA and debug subsystem. In Standby mode, only the always-on (AON) domain is active. An external wake-up event, RTC event, or comparator event (LP-COMP) is required to bring the device back to active mode. Pin Reset will also drive the device from Standby to Active. MCU peripherals with retention do not need to be reconfigured when waking up again, and the CPU continues execution from where it went into standby mode. All GPIOs are latched in standby mode. In Shutdown mode, the device is entirely turned off (including the AON domain), and the I/Os are latched with the value they had before entering shutdown mode. A change of state on any I/O pin defined as a wake from shutdown pin wakes up the device and functions as a reset trigger. The CPU can differentiate between reset in this way and reset-by-reset pin or power-on reset by reading the reset status register. The only state retained in this mode are the latched I/O state, 3V register bank, and the flash memory contents. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 53 Product Folder Links: CC2340R2 CC2340R5
The power, RF and clock management for the CC2340R device require specific configuration and handling by software for optimized performance. This configuration and handling is implemented in the TI-provided drivers that are part of the CC2340R software development kit (SDK). Therefore, TI highly recommends using this software framework for all application development on the device. The complete SDK with FreeRTOS, device drivers, and examples are offered free of charge in source code.
8.12 Clock Systems
The CC2340R device has the following internal system clocks. The 48MHz HFCLK is used as the main system (MCU and peripherals) clock. This is driven by the internal 48MHz RC Oscillator (HFOSC), which can track its accuracy against an external 48MHz crystal (HFXT). Radio operation requires an external 48MHz crystal. The 32.768kHz LFCLK is used as the internal low-frequency system clock. It is used for the RTC, the watchdog timer (if enabled in standby power mode), and to synchronize the radio timer before or after Standby power mode. LFCLK can be driven by the internal 32.8kHz RC Oscillator (LFOSC), a 32.768kHz watch-type crystal, or clock input in LFXT bypass mode. When using a crystal or the internal RC oscillator, the device can output the 32kHz LFCLK signal to other devices, thereby reducing the overall system cost.
8.13 Network Processor
Depending on the product configuration, the CC2340R device can function as a wireless network processor (WNP), a device running the wireless protocol stack with the application running on a separate host MCU, or as a system-on-chip (SoC), with the application and protocol stack running on the system CPU inside the device. In the first case, the external host MCU communicates with the device using SPI or UART. In the second case, the application must be written according to the application framework supplied with the wireless protocol stack. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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9 Application, Implementation, and Layout
Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality.
9.1 Reference Designs
The following reference designs should be followed closely when implementing designs using the CC2340R devices. Special attention must be paid to RF component placement, decoupling capacitors, and DCDC regulator components, as well as ground connections for all of these. LP-EM-CC2340R5 Design Files The CC2340R5 LaunchPad Design Files contain detailed schematics and layouts to build application-specific boards using the CC2340R devices in the 5mm x 5mm RKP package. LP-EM-CC2340R5- RGE-4x4-IS24 Design Files The CC2340R5 RGE 4x4 LaunchPad Design Files contain detailed schematics and layouts to build application-specific boards using the CC2340R devices in the 4mm x 4mm RGE package. The CC2340R5x and CC2340R2x devices in RGE packages are pin-to-pin compatible. Sub-1 GHz and
2.4 GHz Antenna Kit for
LaunchPad™ Development Kit and SensorTag The antenna kit allows real-life testing to identify the optimal antenna for your application. The antenna kit includes 16 antennas for frequencies from 169MHz to 2.4GHz, including:
- PCB antennas
- Helical antennas
- Chip antennas
- Dual-band antennas for 868MHz and 915MHz combined with 2.4GHz The antenna kit includes a JSC cable to connect to the Wireless MCU LaunchPad Development Kits and SensorTags. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 55 Product Folder Links: CC2340R2 CC2340R5
9.2 Junction Temperature Calculation
This section shows the different techniques for calculating the junction temperature under various operating conditions. For more details, see Semiconductor and IC Package Thermal Metrics. There are two recommended ways to derive the junction temperature from other measured temperatures: 1. From package temperature: T J = ψ JT × P + T case (1) 2. From board temperature: T J = ψ JB × P + T board (2) P is the power dissipated from the device and can be calculated by multiplying current consumption with supply voltage. Thermal resistance coefficients are found in Thermal Resistance Characteristics. Example: In this example, we assume a simple use case where the radio is transmitting continuously at 0dBm output power. Let us assume we want to maintain a junction temperature equal or less than 85°C and the supply voltage is 3V. Using Equation 1, the temperature difference between the top of the case and junction temperature is calculated. To calculate P, look up the current consumption for Tx at 85°C. At 85°C the current The maximum case temperature to maintain and junction temperature of 85°C is then calculated as: T case < T j − 0.4 ° C W × 23.4 m W = 84.99 ° C (3) For various application use cases, current consumption for other modules may have to be added to calculate the appropriate power dissipation. For example, the MCU may be running simultaneously as the radio, peripheral modules may be enabled, and so on. Typically, the easiest way to find the peak current consumption, and thus the peak power dissipation in the device, is to measure as described in the Measuring CC13xx and CC26xx Current Consumption application report. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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10 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device, generate code, and develop solutions are listed as follows.
10.1 Device Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to all part numbers and/or date-code. Each device has one of three prefixes/identifications: X, P, or null (no prefix) (for example, X is in preview; therefore, an X prefix/identification is assigned). Device development evolutionary flow: X Experimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow. P Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical specifications. null Production version of the silicon die that is fully qualified. Production devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies. Predictions show that prototype devices (X or P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used. TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type (for example, RKP). For orderable part numbers of devices in the RHB (5-mm x 5-mm) package type, see the Package Option Addendum of this document, the Device Information in Section 3, the TI website (www.ti.com), or contact your TI sales representative. CC2340 R 5 2 E 0 RKP R PREFIX X = Experimental Device Blank = Qualified Device DEVICE SimpleLink™ 2.4GHz Wireless MCU CONFIGURATION R = Regular (+8dBm) FLASH SIZE 2 = 256KB 5 = 512KB R = Large Reel PACKAGE RKP = 5mm x 5mm QFN RGE = 4mm x 4mm QFN YBG = 2.2mm x 2.6mm WCSP TEMPERATURE E = 125°C Ambient N = 85°C Ambient PRODUCT REVISION SRAM SIZE 1 = 28KB 2 = 36KB 3 = 64KB Figure 10-1. Device Nomenclature
10.2 Tools and Software
The CC2340R device is supported by a variety of software and hardware development tools. Development Kit CC2340R5 LaunchPad™ Development Kit The CC2340R5 LaunchPad™ Development Kit enables development of high- performance wireless applications that benefit from low-power operation. The kit features the CC2340R53 SimpleLink Wireless MCU, which allows you to quickly evaluate and prototype 2.4GHz wireless applications such as Bluetooth 5 Low Energy, Zigbee, and www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 57 Product Folder Links: CC2340R2 CC2340R5
Thread. The kit works with the LaunchPad ecosystem, enabling additional functionality like sensors, display, and more. Software SimpleLink™ Low Power F3 software development kit (SDK) The SimpleLink™ Low Power F3 software development kit (SDK) provides a complete package for the development of wireless applications on the CC2340R family of devices. The SDK includes a comprehensive software package for the CC2340R device, including the following protocol stacks:
- Bluetooth Low Energy 5.3
- Zigbee 3.x The SimpleLink Low Power F3 SDK is part of TI’s SimpleLink MCU platform, offering a single development environment that delivers flexible hardware, software, and tool options for customers developing wired and wireless applications. For more information about the SimpleLink MCU Platform, visit https://www.ti.com/simplelink. Development Tools Code Composer Studio™ Integrated Development Environment (IDE) Code Composer Studio is an integrated development environment (IDE) that supports TI's Microcontroller and Embedded Processors portfolio. Code Composer Studio comprises a suite of tools used to develop and debug embedded applications. It includes an optimizing C/C++ compiler, source code editor, project build environment, debugger, profiler, and many other features. The intuitive IDE provides a single user interface taking you through each step of the application development flow. Familiar tools and interfaces allow users to get started faster than ever before. CCS has support for all SimpleLink Wireless MCUs and includes support for EnergyTrace™ software (application energy usage profiling). Code Composer Studio is provided free of charge when used in conjunction with the XDS debuggers included on a LaunchPad Development Kit. Code Composer Studio™ Cloud IDE Code Composer Studio (CCS) Cloud is a web-based IDE that allows you to create, edit, and build CCS projects. After you have successfully built your project, you can download and run on your connected LaunchPad. Basic debugging, including features like setting breakpoints and viewing variable values, is now supported with CCS Cloud. IAR Embedded Workbench® for Arm® IAR Embedded Workbench ® is a set of development tools for building and debugging embedded system applications using Assembler, C and C++. It provides a completely integrated development environment that includes a project manager, editor, and build tools. IAR has support for all SimpleLink Wireless MCUs. It offers broad debugger support, including XDS110, IAR I-jet™, and Segger J-Link™. IAR is also supported out-of-the-box on most software examples provided as part of the SimpleLink SDK. SmartRF™ Studio SmartRF™ Studio is a Windows® application that can be used to evaluate and configure SimpleLink Wireless MCUs from Texas Instruments. The application will help designers of RF systems to easily evaluate the radio at an early stage in the design process. It is especially useful for generation of configuration register values and for practical testing and debugging of the RF system. SmartRF Studio can be used either as a standalone application or together with applicable evaluation boards or debug probes for the RF device. Features of the SmartRF Studio include:
- Link tests - send and receive packets between nodes
- Antenna and radiation tests - set the radio in continuous wave TX and RX states CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
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- Export radio configuration code for use with the TI SimpleLink SDK RF driver
- Custom GPIO configuration for signaling and control of external switches UniFlash UniFlash is a standalone tool used to program on-chip flash memory on TI MCUs. UniFlash has a GUI, command line, and scripting interface. UniFlash is available free of charge.
10.2.1 SimpleLink™ Microcontroller Platform
The SimpleLink microcontroller platform sets a new standard for developers with the broadest portfolio of wired and wireless Arm® MCUs (System-on-Chip) in a single software development environment. Delivering flexible hardware, software and tool options for your IoT applications. Invest once in the SimpleLink software development kit and use throughout your entire portfolio. Learn more at ti.com/simplelink.
10.3 Documentation Support
To receive notification of documentation updates on data sheets, errata, application notes and similar, navigate to the device product folder ( CC2340R5). In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. The current documentation that describes the MCU, related peripherals, and other technical collateral is listed as follows. TI Resource Explorer TI Resource Explorer Software examples, libraries, executables, and documentation are available for your device and development board. Errata CC2340R Silicon Errata The silicon errata describes the known exceptions to the functional specifications for each silicon revision of the device and description on how to recognize a device revision. Application Reports All application reports for the CC2340R devices are found on the device product folder ( CC2340R2 or CC2340R5). Technical Reference Manual (TRM) CC23xx SimpleLink™ Wireless MCU TRM The TRM provides a detailed description of all modules and peripherals available in the device family.
10.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
10.5 Trademarks
SimpleLink™, LaunchPad™, Code Composer Studio™, EnergyTrace™, and TI E2E™ are trademarks of Texas Instruments. I-jet™ is a trademark of IAR Systems AB. J-Link™ is a trademark of SEGGER Microcontroller Systems GmbH. Arm® and Cortex® are registered trademarks of Arm Limited (or its subsidiaries) in the US and/or elsewhere. Bluetooth® is a registered trademark of Bluetooth SIG. CoreMark® is a registered trademark of Embedded Microprocessor Benchmark Consortium Corporation. www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 59 Product Folder Links: CC2340R2 CC2340R5
Wi-Fi® is a registered trademark of Wi-Fi Alliance. IAR Embedded Workbench® is a registered trademark of IAR Systems AB. Windows® is a registered trademark of Microsoft Corporation. All trademarks are the property of their respective owners.
10.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
10.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions. NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision D (June 2024) to Revision E (September 2024) Page Changes from Revision C (June 2023) to Revision D (June 2024) Page CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
60 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated
Product Folder Links: CC2340R2 CC2340R5
www.ti.com CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 61 Product Folder Links: CC2340R2 CC2340R5
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. CC2340R2, CC2340R5 SWRS272E – APRIL 2023 – REVISED SEPTEMBER 2024 www.ti.com
62 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated
Product Folder Links: CC2340R2 CC2340R5
www.ti.com PACKAGE OUTLINE C
0.5 MAX
0.20 0.14 TYP
1.6 TYP
0.4 TYP
28X 0.27 0.23 B E A D 4230507/A 02/2024 DSBGA - 0.5 mm max heightYBG0028-C01 DIE SIZE BALL GRID ARRAY D: Max = 2.622 mm, Min = 2.582 mm E: Max = 2.206 mm, Min = 2.166 mm NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. BALL A1 CORNER SEATING PLANE 0.05 C A 1 2 3
0.015 C A B
B C D E F SCALE 5.000
www.ti.com EXAMPLE BOARD LAYOUT 0.05 MIN0.05 MAX 28X ( 0.23) (0.4) TYP (0.4) TYP ( 0.23) SOLDER MASK OPENING ( 0.23) METAL 4230507/A 02/2024 DSBGA - 0.5 mm max heightYBG0028-C01 DIE SIZE BALL GRID ARRAY NOTES: (continued) 3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints. See Texas Instruments Literature No. SNVA009 (www.ti.com/lit/snva009). SOLDER MASK DETAILS NOT TO SCALE SYMM SYMM C 1 2 3 4 A B D E F LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE: 30X NON-SOLDER MASK DEFINED (PREFERRED) EXPOSED METAL SOLDER MASK OPENING SOLDER MASK DEFINED METAL UNDER SOLDER MASK EXPOSED METAL
www.ti.com EXAMPLE STENCIL DESIGN (0.4) TYP (0.4) TYP 28X ( 0.25) (R0.05) TYP 4230507/A 02/2024 DSBGA - 0.5 mm max heightYBG0028-C01 DIE SIZE BALL GRID ARRAY NOTES: (continued) 4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. C 1 2 3 4 A B D E F SYMM SYMM SOLDER PASTE EXAMPLE BASED ON 0.1 mm THICK STENCIL SCALE: 30X METAL TYP
www.ti.com 25-Dec-2024 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead finish/ Ball material (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples CC2340R21N0RGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CC2340 R21 Samples CC2340R22E0RKPR ACTIVE VQFN RKP 40 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 CC2340 R22 Samples CC2340R22N0RKPR ACTIVE VQFN RKP 40 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CC2340 R22 Samples CC2340R52E0RGER ACTIVE VQFN RGE 24 3000 RoHS & Green Call TI | NIPDAU Level-3-260C-168 HR -40 to 125 CC2340 R52 Samples CC2340R52E0RKPR ACTIVE VQFN RKP 40 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 CC2340 R52 Samples CC2340R52N0RGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CC2340 R52 Samples CC2340R52N0RKPR ACTIVE VQFN RKP 40 3000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CC2340 R52 Samples CC2340R53E0RKPR ACTIVE VQFN RKP 40 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 CC2340 R53 Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. Addendum-Page 1
www.ti.com 25-Dec-2024 (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF CC2340R5 :
- Automotive : CC2340R5-Q1 NOTE: Qualified Version Definitions:
- Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects Addendum-Page 2
PACKAGE MATERIALS INFORMATION www.ti.com 26-Dec-2024 TAPE AND REEL INFORMATION Reel Width (W1) REEL DIMENSIONS A0B0K0WDimension designed to accommodate the component lengthDimension designed to accommodate the component thicknessOverall width of the carrier tapePitch between successive cavity centersDimension designed to accommodate the component width TAPE DIMENSIONSK0 P1B0WA0Cavity QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE Pocket QuadrantsSprocket HolesQ1Q1Q2Q2Q3Q3Q4Q4User Direction of Feed P1ReelDiameter *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Reel Diameter (mm) Reel Width W1 (mm) (mm) (mm) (mm) (mm) W (mm) Pin1 Quadrant Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION www.ti.com 26-Dec-2024 TAPE AND REEL BOX DIMENSIONS Width (mm) W LH *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) CC2340R21N0RGER VQFN RGE 24 3000 367.0 367.0 35.0 CC2340R22E0RKPR VQFN RKP 40 3000 367.0 367.0 35.0 CC2340R22N0RKPR VQFN RKP 40 3000 367.0 367.0 35.0 CC2340R52E0RGER VQFN RGE 24 3000 367.0 367.0 35.0 CC2340R52E0RKPR VQFN RKP 40 3000 367.0 367.0 35.0 CC2340R52N0RGER VQFN RGE 24 3000 367.0 367.0 35.0 CC2340R52N0RKPR VQFN RKP 40 3000 367.0 367.0 35.0 CC2340R53E0RKPR VQFN RKP 40 3000 367.0 367.0 35.0 Pack Materials-Page 2
www.ti.com GENERIC PACKAGE VIEW This image is a representation of the package family, actual package may vary. Refer to the product data sheet for package details. VQFN - 1 mm max heightRKP 40 PLASTIC QUAD FLATPACK - NO LEAD5 x 5, 0.4 mm pitch 4229305/A
NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance. PACKAGE OUTLINE 4219083/A 03/2021 www.ti.com VQFN - 1 mm max height PLASTIC QUAD FLATPACK- NO LEAD RKP0040B A 0.08 C
0.1 C A B
0.05 C B SYMM SYMM PIN 1 INDEX AREA 5.1 4.9 5.1 4.9 0.05 0.00
1 MAX
C (0.1) TYP 3.6 3.4 36X 0.4 3.6 PIN1 ID (OPTIONAL) 40X 0.5 0.3 40X 0.25 0.151 11 20 3140
NOTES: (continued) 4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271) . 5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown on this view. It is recommended that vias under paste be filled, plugged or tented. EXAMPLE BOARD LAYOUT 4219083/A 03/2021 www.ti.com VQFN - 1 mm max heightRKP0040B PLASTIC QUAD FLATPACK- NO LEAD SYMM SYMM LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE: 15X SOLDER MASK DETAILS NON- SOLDER MASK DEFINED (PREFERRED) SOLDER MASK DEFINED
0.05 MAX
0.05 MIN
( 3.5) (4.8) 2X (4.8) 36X (0.4) 40X (0.6) 40X (0.2) 2X (0.6) 2X (0.9) (Ø 0.2) VIA TYP (R 0.05) TYP 11 20 3140
NOTES: (continued) 6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. EXAMPLE STENCIL DESIGN 4219083/A 03/2021 www.ti.com VQFN - 1 mm max heightRKP0040B PLASTIC QUAD FLATPACK- NO LEAD SOLDER PASTE EXAMPLE BASED ON 0.125 mm THICK STENCIL EXPOSED PAD 74% PRINTED COVERAGE BY AREA SCALE: 15X SYMM SYMM ( 1) (4.8) 2X (4.8) 36X (0.4) 40X (0.6) 40X (0.2) (R 0.05) TYP 11 20 3140 (1.2) 2X (1.2)
Images above are just a representation of the package family, actual package may vary. Refer to the product data sheet for package details. RGE 24 VQFN - 1 mm max height PLASTIC QUAD FLATPACK - NO LEAD 4204104/H
www.ti.com PACKAGE OUTLINE C SEE TERMINAL DETAIL 24X 0.3 0.2 2.45 0.1 24X 0.5 0.3 (0.2) TYP 0.05 0.00 20X 0.5 2.5 2X 2.5 A 4.1 3.9 B 4.1 3.9 0.3 0.2 0.5 0.3 VQFN - 1 mm max heightRGE0024B PLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017 PIN 1 INDEX AREA 0.08 C SEATING PLANE 6 13 7 12 24 19 (OPTIONAL) PIN 1 ID 0.05 EXPOSED THERMAL PAD
25 SYMM
NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance. SCALE 3.000 DETAIL OPTIONAL TERMINAL TYPICAL
www.ti.com EXAMPLE BOARD LAYOUT
0.07 MIN
0.07 MAX
24X (0.25) 24X (0.6) ( 0.2) TYP VIA 20X (0.5) (3.8) (3.8) ( 2.45) (R0.05) TYP (0.975) TYP VQFN - 1 mm max heightRGE0024B PLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017 SYMM 7 12 1924 SYMM LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE:15X NOTES: (continued) 4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271). 5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown on this view. It is recommended that vias under paste be filled, plugged or tented. SOLDER MASK OPENING METAL UNDER SOLDER MASK SOLDER MASK DEFINED EXPOSED METAL METAL SOLDER MASK OPENINGSOLDER MASK DETAILS NON SOLDER MASK DEFINED (PREFERRED) EXPOSED METAL
www.ti.com EXAMPLE STENCIL DESIGN 24X (0.6) 24X (0.25) 20X (0.5) (3.8) (3.8) 4X ( 1.08) (0.64) TYP (0.64) TYP (R0.05) TYP VQFN - 1 mm max heightRGE0024B PLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017 NOTES: (continued) 6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. SYMM METAL TYP SOLDER PASTE EXAMPLE BASED ON 0.125 mm THICK STENCIL EXPOSED PAD 25 78% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE SCALE:20X SYMM 7 12 1924
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