SN74AHC1G02B-EP TI | Alldatasheet

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Technical content

SN74AHC1G02B-EP Enhanced Product, Single 2-Input Positive-NOR Gate

1 Features

  • Operating range 2V to 5.5V VCC
  • Low delay, 4.3ns typ. (25°C, 5V)
  • Latch-up performance exceeds 250mA per JESD 17
  • Supports defense and aerospace applications: – Controlled baseline – One assembly and test site – One fabrication site – Extended product life cycle – Product traceability

2 Applications

  • Enable or disable a digital signal
  • Controlling an indicator LED

3 Description

The SN74AHC1G02B-EP is a 2-input NOR Gate which performs the Boolean function Y = A + B in positive logic.

Package Information

PART NUMBER PACKAGE(1) PACKAGE SIZE(2) BODY SIZE(3) SN74AHC1G02B- EP DCK (SC-70, 5) 2.0mm × 2.1mm 2.0mm × 1.25mm (1) For more information, see the orderable addendum at the end of the data sheet. (2) The package size (length × width) is a nominal value and includes pins, where applicable (3) The body size (length × width) is a nominal value and does not include pins. A Y B Logic Diagram (Positive Logic) SN74AHC1G02B-EP SCASE74 – MARCH 2025 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA.

11 Mechanical, Packaging, and Orderable

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4 Pin Configuration and Functions

Figure 4-1. DCK Package 5-Pin SC70 (Top View) PIN TYPE(1) DESCRIPTION NAME NO. A 1 I Input A B 2 I Input B GND 3 — Ground Pin Y 4 O Output VCC 5 — Supply Pin (1) Signal Types: I = Input, O = Output, I/O = Input or Output www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 3 Product Folder Links: SN74AHC1G02B-EP

5 Specifications

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1) MIN MAX UNIT VCC Supply voltage –0.5 7 V VI Input voltage range -0.5 7 V VO Output voltage range -0.5 VCC + 0.5 V VO Voltage range applied to any output in the high-impedance or power-off state -0.5 4.6 V IIK Input clamp current(2) VI < 0 –20 mA IOK Output clamp current(2) VO < 0 or VO > VCC –20 20 mA IO Continuous output current VO = 0 to VCC –25 25 mA IO Continuous output current through VCC or GND –50 50 mA TJ Junction temperature 150 °C Tstg Storage temperature –65 150 °C (1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute maximum ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not sustain damage, but it may not be fully functional. Operating the device in this manner may affect device reliability, functionality, performance, and shorten the device lifetime. (2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

5.2 ESD Ratings

V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/ JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per ANSI/ESDA/ JEDEC JS-002(2) ±1000 (1) JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process. SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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5.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN MAX UNIT VCC Supply Voltage 2 5.5 V VIH high-level input voltage VCC= 2V 1.5 V VIH high-level input voltage VCC= 3V 2.1 V VIH high-level input voltage VCC= 5.5V 3.85 V VIL low-level input voltage VCC= 2V 0.5 V VIL low-level input voltage VCC= 3V 0.9 V VIL low-level input voltage VCC= 5.5V 1.65 V VI input voltage 0 5.5 V VO output voltage 0 VCC V IOH high-level output current VCC= 2V -50 μA IOH high-level output current VCC= 3.3V ± 0.3V -4 mA IOH high-level output current VCC= 5V ± 0.5V -8 mA IOL low-level output current VCC= 2V 50 μA IOL low-level output current VCC= 3.3V ± 0.3V 4 mA IOL low-level output current VCC= 5V ± 0.5V 8 mA Δt/Δv input transition rise or fall rate VCC= 3.3V ± 0.3V 100 nS/V Δt/Δv input transition rise or fall rate VCC= 5V ± 0.5V 20 nS/V TA Operating free-air temperature -55 125 °C

5.4 Thermal Information

THERMAL METRIC(1) UNIT RθJA RθJC(top) RθJB ΨJT ΨJB RθJC(bot) (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application note. www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 5 Product Folder Links: SN74AHC1G02B-EP

5.5 Electrical Characteristics

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VCC TA = 25°C -40°C to 125°C UNIT MIN TYP MAX MIN TYP MAX VT+ Positive-going input threshold voltage Vcc = 3V 1.2 2.20 1.2 2.20 V VT+ Positive-going input VT+ Positive-going input VT- Negative-going input threshold voltage Vcc = 3V 0.9 1.9 0.9 1.9 V VT- Negative-going input VT- Negative-going input ΔVT Hysteresis (VT+ − VT−) Vcc = 3V 0.3 1.2 0.3 1.2 V VOH IOH= –50μA Vcc = 2V 1.9 1.9 V VOH IOH= –50μA Vcc = 3V 2.9 2.9 V VOH IOH= –50μA Vcc = 4.5V 4.4 4.4 V VOH IOH= –4mA Vcc = 3V 2.58 2.48 V VOH IOH= –8mA Vcc = 4.5V 3.94 3.8 V VOL IOH= 50μA Vcc = 2V 0.1 0.1 V VOL IOH= 50μA Vcc = 3V 0.1 0.1 V VOL IOH= 50μA Vcc = 4.5V 0.1 0.1 V VOL IOH= 4mA Vcc = 3V 0.36 0.44 V VOL IOH= 8mA Vcc = 4.5V 0.36 0.44 V II VI= 5.5V or GND 0 V to 5.5V -0.1 0.1 -1 1 µA ICC VI = VCC or GND, IO = 0 5.5V 1 4 µA Ci VI = VCC or GND 5V 1.7 10 pF CO VO = VCC or GND 5V 3 pF CPD Power dissipation capacitance 5V 5 14 22.4 pF SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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5.6 Switching Characteristics

over operating free-air temperature range (unless otherwise noted) PARAMETER FROM (INPUT) TO (OU TPU LOAD CAPACITANCE VCC -55°C to 125°C UNIT MIN TYP MAX TPLH A or B Y CL = 15pF 3.3V ± 0.3V 1 5 9.5 nS TPLH A or B Y CL = 50pF 3.3V ± 0.3V 1 7.5 13 nS TPLH A or B Y CL = 15pF 5V ± 0.5V 1 3.6 7 nS TPLH A or B Y CL = 50pF 5V ± 0.5V 1 5.1 7 nS TPHL A or B Y CL = 15pF 3.3V ± 0.3V 1 5 9.5 nS TPHL A or B Y CL = 50pF 3.3V ± 0.3V 1 7.5 13 nS TPHL A or B Y CL = 15pF 5V ± 0.5V 1 3.6 7 nS TPHL A or B Y CL = 50pF 5V ± 0.5V 1 5.1 7 nS TPLH A or B Y CL = 15pF 3.3V ± 0.3V 1 3.6 8.5 nS TPLH A or B Y CL = 15pF 5V ± 0.5V 1 2.5 6.5 nS TPLH A or B Y CL = 50pF 5V ± 0.5V 1.5 4.6 8.5 nS TPHL A or B Y CL = 15pF 3.3V ± 0.3V 1 3.6 8.5 nS TPHL A or B Y CL = 15pF 5V ± 0.5V 1 2.5 6.5 nS TPHL A or B Y CL = 50pF 5V ± 0.5V 1.5 4.6 8.5 nS TPLH A or B Y CL = 15pF 3.3V ± 0.3V 1 7 14 nS TPLH A or B Y CL = 50pF 3.3V ± 0.3V 1 9.5 17.5 nS TPLH A or B Y CL = 15pF 5V ± 0.5V 1 4.8 8.6 nS TPLH A or B Y CL = 50pF 5V ± 0.5V 1 6.3 11 nS TPHL A or B Y CL = 15pF 3.3V ± 0.3V 1 7 14 nS TPHL A or B Y CL = 50pF 3.3V ± 0.3V 1 9.5 17.5 nS TPHL A or B Y CL = 15pF 5V ± 0.5V 1 4.8 8.6 nS TPHL A or B Y CL = 50pF 5V ± 0.5V 1 6.3 11 nS

5.7 Typical Characteristics

TA = 25°C (unless otherwise noted) V C C ( V ) ICC(nA) 1 0 2 0 3 0 4 0 5 0 6 0 7 0 8 0 2 5 ° C 1 2 5 ° C - 4 0 ° C Figure 5-1. Supply Current Across Supply Voltage IOH (mA) VOH (V) 4.3 4.35 4.4 4.45 4.5 4.55 4.6 4.65 4.7 4.75 4.8 4.85 4.9 4.95 -40°C 25°C 125°C Figure 5-2. Output Voltage vs Current in HIGH State; 5V Supply www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: SN74AHC1G02B-EP

5.7 Typical Characteristics (continued)

TA = 25°C (unless otherwise noted) IOL (mA) VOL (V) 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5 -40°C 25°C 125°C Figure 5-3. Output Voltage vs Current in LOW State; 5V Supply IOH (mA) VOH (V) 2.5 2.55 2.6 2.65 2.7 2.75 2.8 2.85 2.9 2.95 3.05 3.1 3.15 3.2 3.25 3.3 -40°C 25°C 125°C Figure 5-4. Output Voltage vs Current in HIGH State; 3.3V Supply IOL (mA) VOL (V) 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5 0.55 0.6 -40°C 25°C 125°C Figure 5-5. Output Voltage vs Current in LOW State; 3.3V Supply IOH (mA) VOH (V) 1.9 1.95 2.05 2.1 2.15 2.2 2.25 2.3 2.35 2.4 2.45 2.5 -40°C 25°C 125°C Figure 5-6. Output Voltage vs Current in HIGH State; 2.5V Supply IOL (mA) VOL (V) 0 2 4 6 8 10 12 14 16 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 -40°C 25°C 125°C Figure 5-7. Output Voltage vs Current in LOW State; 2.5V Supply SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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6 Parameter Measurement Information

Phase relationships between waveforms were chosen arbitrarily for the examples listed in the following table. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1MHz, ZO = 50Ω, tt < 2.5ns. The outputs are measured individually with one input transition per measurement. CL (1) From Output Under Test Test Point (1) CL includes probe and test-fixture capacitance. Figure 6-1. Load Circuit for Push-Pull Outputs 50%Input 50% VCC 0 V 50% 50% VOH VOL tPLH (1) tPHL (1) VOH VOL tPHL (1) tPLH (1) Output Output 50% 50% (1) The greater between tPLH and tPHL is the same as tpd. Figure 6-2. Voltage Waveforms Propagation Delays VOH VOL Output VCC 0 V Input tf (1)tr (1) 90% 10% 90% 10% tr (1) 90% 10% tf (1) 90% 10% (1) The greater between tr and tf is the same as tt. Figure 6-3. Voltage Waveforms, Input and Output Transition Times www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 9 Product Folder Links: SN74AHC1G02B-EP

7 Detailed Description

7.1 Overview

This device is a 2-input NOR Gate which performs the Boolean function Y = A + B in positive logic.

7.2 Functional Block Diagram

A Y B SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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7.3 Feature Description

7.3.1 Balanced CMOS Push-Pull Outputs

This device includes balanced CMOS push-pull outputs. The term balanced indicates that the device can sink and source similar currents. The drive capability of this device may create fast edges into light loads, so routing and load conditions should be considered to prevent ringing. Additionally, the outputs of this device are capable of driving larger currents than the device can sustain without being damaged. It is important to limit the output power of the device to avoid damage due to overcurrent. The electrical and thermal limits defined in the Absolute Maximum Ratings must be followed at all times. Unused push-pull CMOS outputs must be left disconnected.

7.3.2 Standard CMOS Inputs

This device includes standard CMOS inputs. Standard CMOS inputs are high impedance and are typically modeled as a resistor in parallel with the input capacitance given in the Electrical Characteristics . The worst case resistance is calculated with the maximum input voltage, given in the Absolute Maximum Ratings, and the maximum input leakage current, given in the Electrical Characteristics, using Ohm's law (R = V ÷ I). Standard CMOS inputs require that input signals transition between valid logic states quickly, as defined by the input transition time or rate in the Recommended Operating Conditions table. Failing to meet this specification will result in excessive power consumption and could cause oscillations. More details can be found in Implications of Slow or Floating CMOS Inputs. Do not leave standard CMOS inputs floating at any time during operation. Unused inputs must be terminated at VCC or GND. If a system will not be actively driving an input at all times, then a pull-up or pull-down resistor can be added to provide a valid input voltage during these times. The resistor value will depend on multiple factors; a 10kΩ resistor, however, is recommended and will typically meet all requirements. www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 11 Product Folder Links: SN74AHC1G02B-EP

7.3.3 Clamp Diode Structure

As Figure 7-1 shows, the outputs to this device have both positive and negative clamping diodes, and the inputs to this device have negative clamping diodes only. CAUTION Voltages beyond the values specified in the Absolute Maximum Ratings table can cause damage to the device. The input and output voltage ratings may be exceeded if the input and output clamp- current ratings are observed. Figure 7-1. Electrical Placement of Clamping Diodes for Each Input and Output SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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7.4 Device Functional Modes

Table 7-1 lists the functional modes of the SN74AHC1G02B-EP. Table 7-1. Function Table INPUTS(1) OUTPUT YA B L L H H X L X H L (1) H = High Voltage Level, L = Low Voltage Level, X = Don't Care www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 13 Product Folder Links: SN74AHC1G02B-EP

8 Application and Implementation

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality.

8.1 Application Information

In this application, a couple of 2-input NOR gates are used to create an SR latch as shown in Figure 8-1. The SN74AHC1G02B-EP is used to drive the tamper indicator LED and provide one bit of data to the system controller. When the tamper switch outputs HIGH, the output Q becomes HIGH. This output remains HIGH until the system controller addresses the event and sends a HIGH signal to the R input which returns the Q output back to LOW.

8.2 Typical Application

R S Q Tamper Indicato r Figure 8-1. Typical Application Block Diagram SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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8.2.1 Design Requirements

8.2.1.1 Power Considerations

Ensure the desired supply voltage is within the range specified in the Recommended Operating Conditions . The supply voltage sets the device's electrical characteristics of the device as described in the Electrical Characteristics section. The positive voltage supply must be capable of sourcing current equal to the total current to be sourced by all outputs of the SN74AHC1G02B-EP plus the maximum static supply current, I CC, listed in the Electrical Characteristics, and any transient current required for switching. The logic device can only source as much current that is provided by the positive supply source. Ensure the maximum total current through V CC listed in the Absolute Maximum Ratings is not exceeded. The ground must be capable of sinking current equal to the total current to be sunk by all outputs of the SN74AHC1G02B-EP plus the maximum supply current, I CC, listed in the Electrical Characteristics , and any transient current required for switching. The logic device can only sink as much current that can be sunk into its ground connection. Ensure the maximum total current through GND listed in the Absolute Maximum Ratings is not exceeded. The SN74AHC1G02B-EP can drive a load with a total capacitance less than or equal to 50pF while still meeting all of the data sheet specifications. Larger capacitive loads can be applied; however, it is not recommended to exceed 50pF. The SN74AHC1G02B-EP can drive a load with total resistance described by RL ≥ VO / IO, with the output voltage and current defined in the Electrical Characteristics table with VOH and VOL. When outputting in the HIGH state, the output voltage in the equation is defined as the difference between the measured output voltage and the supply voltage at the VCC pin. Total power consumption can be calculated using the information provided in CMOS Power Consumption and Cpd Calculation. Thermal increase can be calculated using the information provided in Thermal Characteristics of Standard Linear and Logic (SLL) Packages and Devices. CAUTION The maximum junction temperature, TJ(max) listed in the Absolute Maximum Ratings, is an additional limitation to prevent damage to the device. Do not violate any values listed in the Absolute Maximum Ratings. These limits are provided to prevent damage to the device. www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 15 Product Folder Links: SN74AHC1G02B-EP

8.2.1.2 Input Considerations

Input signals must cross VIL(max) to be considered a logic LOW, and VIH(min) to be considered a logic HIGH. Do not exceed the maximum input voltage range found in the Absolute Maximum Ratings. Unused inputs must be terminated to either V CC or ground. The unused inputs can be directly terminated if the input is completely unused, or they can be connected with a pull-up or pull-down resistor if the input will be used sometimes, but not always. A pull-up resistor is used for a default state of HIGH, and a pull-down resistor is used for a default state of LOW. The drive current of the controller, leakage current into the SN74AHC1G02B-EP (as specified in the Electrical Characteristics), and the desired input transition rate limits the resistor size. A 10k Ω resistor value is often used due to these factors. The SN74AHC1G02B-EP has CMOS inputs and thus requires fast input transitions to operate correctly, as defined in the Recommended Operating Conditions table. Slow input transitions can cause oscillations, additional power consumption, and reduction in device reliability. Refer to the Feature Description section for additional information regarding the inputs for this device.

8.2.1.3 Output Considerations

The positive supply voltage is used to produce the output HIGH voltage. Drawing current from the output will decrease the output voltage as specified by the V OH specification in the Electrical Characteristics. The ground voltage is used to produce the output LOW voltage. Sinking current into the output will increase the output voltage as specified by the VOL specification in the Electrical Characteristics. Push-pull outputs that could be in opposite states, even for a very short time period, should never be connected directly together. This can cause excessive current and damage to the device. Two channels within the same device with the same input signals can be connected in parallel for additional output drive strength. Unused outputs can be left floating. Do not connect outputs directly to VCC or ground. Refer to the Feature Description section for additional information regarding the outputs for this device. SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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8.2.2 Detailed Design Procedure

  1. Add a decoupling capacitor from VCC to GND. The capacitor needs to be placed physically close to the device and electrically close to both the VCC and GND pins. An example layout is shown in the Layout section. 2. Ensure the capacitive load at the output is ≤ 50pF. This is not a hard limit; by design, however, it will optimize performance. This can be accomplished by providing short, appropriately sized traces from the SN74AHC1G02B-EP to one or more of the receiving devices. 3. Ensure the resistive load at the output is larger than (VCC / IO(max))Ω. Doing this will prevent the maximum output current from the Absolute Maximum Ratings from being violated. Most CMOS inputs have a resistive load measured in MΩ; much larger than the minimum calculated previously. 4. Thermal issues are rarely a concern for logic gates; the power consumption and thermal increase, however, can be calculated using the steps provided in the application report, CMOS Power Consumption and Cpd Calculation.

8.2.3 Application Curves

R S Q Figure 8-2. Application Timing Diagram

8.3 Power Supply Recommendations

The power supply can be any voltage between the minimum and maximum supply voltage rating listed in the Recommended Operating Conditions. Each V CC terminal should have a good bypass capacitor to prevent power disturbance. For the SN74AHC1G02B-EP, a 0.1 μF bypass capacitor is recommended. To reject different frequencies of noise, use multiple bypass capacitors in parallel. Capacitors with values of 0.1μF and 1μF are commonly used in parallel.

8.4 Layout

8.4.1 Layout Guidelines

  • Bypass capacitor placement – Place near the positive supply terminal of the device – Provide an electrically short ground return path – Use wide traces to minimize impedance – Keep the device, capacitors, and traces on the same side of the board whenever possible
  • Signal trace geometry – 8mil to 12mil trace width – Lengths less than 12cm to minimize transmission line effects – Avoid 90° corners for signal traces – Use an unbroken ground plane below signal traces – Flood fill areas around signal traces with ground – For traces longer than 12cm
  • Use impedance controlled traces
  • Source-terminate using a series damping resistor near the output
  • Avoid branches; buffer signals that must branch separately www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 17 Product Folder Links: SN74AHC1G02B-EP

8.4.2 Layout Example

≥ W W W ≥ 5W WORST BETTER BEST Figure 8-3. Example Trace Corners for Improved Signal Integrity GND V CC GND VCC 0.1 F Figure 8-4. Example Bypass Capacitor Placement for TSSOP and Similar Packages 0.1 F VCC GND 1 20 10 11 9 12 GNDVCC GND Figure 8-5. Example Bypass Capacitor Placement for WQFN and Similar Packages GND GND VCC 0.1 F VCC Figure 8-6. Example Bypass Capacitor Placement for SOT, SC70 and Similar Packages Long controlled-impedance trace Receiving PortTransmitting Port Figure 8-7. Example Damping Resistor Placement for Improved Signal Integrity SN74AHC1G02B-EP SCASE74 – MARCH 2025 www.ti.com

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9 Device and Documentation Support

TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device, generate code, and develop solutions are listed below.

9.1 Documentation Support

9.1.1 Related Documentation

For related documentation, see the following:

  • Texas Instruments, CMOS Power Consumption and Cpd Calculation application report
  • Texas Instruments, Designing With Logic application report
  • Texas Instruments, Thermal Characteristics of Standard Linear and Logic (SLL) Packages and Devices application report

9.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

9.3 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

9.4 Trademarks

TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners.

9.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

9.6 Glossary

TI Glossary This glossary lists and explains terms, acronyms, and definitions. DATE REVISION NOTES March 2025 * Initial Release

11 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. www.ti.com SN74AHC1G02B-EP SCASE74 – MARCH 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 19 Product Folder Links: SN74AHC1G02B-EP

www.ti.com 10-Apr-2025 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead finish/ Ball material (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples CAHC1G02BMDCKREP ACTIVE SC70 DCK 5 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -55 to 125 CGC Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1

www.ti.com PACKAGE OUTLINE C 0.22

0.08 TYP

0.15 2.4 1.8 2X 0.65 1.3

1.1 MAX

0.1

0.0 TYP

5X 0.33 0.15 NOTE 5

0.1 C A B

0.46

0.26 TYP

0 TYP

1.3 4X 0 -12 4X 4 -15 A 2.15 1.85 B1.4 1.1 (0.9) (0.15) (0.1) SOT - 1.1 max heightDCK0005A SMALL OUTLINE TRANSISTOR 4214834/G 11/2024 NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. Refernce JEDEC MO-203. 4. Support pin may differ or may not be present. 5. Lead width does not comply with JEDEC. 6. Body dimensions do not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not exceed 0.25mm per side 0.1 C SCALE 5.600

www.ti.com EXAMPLE BOARD LAYOUT

0.07 MAX

0.07 MIN

5X (0.95) 5X (0.4) (2.2) (1.3) 2X (0.65) (R0.05) TYP 4214834/G 11/2024 SOT - 1.1 max heightDCK0005A SMALL OUTLINE TRANSISTOR NOTES: (continued) 7. Publication IPC-7351 may have alternate designs. 8. Solder mask tolerances between and around signal pads can vary based on board fabrication site. SYMM LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE:18X PKG 3 4 SOLDER MASK OPENING METAL UNDER SOLDER MASK SOLDER MASK DEFINED EXPOSED METAL METALSOLDER MASK OPENING NON SOLDER MASK DEFINED (PREFERRED) SOLDER MASK DETAILS EXPOSED METAL

www.ti.com EXAMPLE STENCIL DESIGN (2.2) (1.3) 2X(0.65) 5X (0.95) 5X (0.4) (R0.05) TYP SOT - 1.1 max heightDCK0005A SMALL OUTLINE TRANSISTOR 4214834/G 11/2024 NOTES: (continued) 9. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. 10. Board assembly site may have different recommendations for stencil design. SOLDER PASTE EXAMPLE BASED ON 0.125 THICK STENCIL SCALE:18X SYMM PKG 3 4

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