BFY420_11 INFINEON | Alldatasheet

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IFAG IMM RPD D HIR 1 of 4 V2, February 2011 HiRel NPN Silicon RF Transistor  HiRel Discrete and Microwave Semiconductor  For High Gain Low Noise Amplifiers  For Oscillators up to 10 GHz  Noise Figure F = 1.1 dB at 1.8 GHz Outstanding Gms = 21dB at 1.8 GHz  Hermetically sealed microwave package  Transition Frequency fT = 22 GHz  SIEGET25-Line Infineon Technologies Grounded Emitter Transistor-

25 GHz fT-Line

ESA/SCC Detail Spec. No.: 5611/008 Type Variant No. 02 ESD: Electrostatic discharge sensitive device, observe handling precautions! Type Marking Ordering Code Pin Configuration 1 2 3 4 Package BFY420 (ql) - see below C E B E Micro-X (ql) Quality Level: P: Professional Quality H: High Rel Quality S: Space Quality ES: ESA Space Quality (see order instructions for ordering example) 1 2

IFAG IMM RPD D HIR 2 of 4 V2, February 2011 Maximum Ratings Parameter Symbol Values Unit Collector-emitter voltage VCEO 4.5 V Collector-base voltage VCBO 15 V Emitter-base voltage VEBO 1.5 V Collector current IC 35 mA Base current IB 3.0 mA Total power dissipation, TS  129°C 1), 2) Ptot 160 mW Junction temperature Tj 175 C Operating temperature range Top -65...+175 C Storage temperature range Tstg -65...+175 C Thermal Resistance Junction-soldering point 2) Rth JS < 285 K/W Notes.: 1) At TS = + 129 °C. For TS > + 129 °C derating is required. 2) TS is measured on the collector lead at the soldering point to the pcb.

Electrical Characteristics

at TA=25°C; unless otherwise specified Parameter Symbol Values Unit min. typ. max. DC Characteristics Collector-base cutoff current VCB = 5 V, IE = 0 ICBO - nA Collector-emitter cutoff current 1.) VCE = 4.5 V, IB = 1.0µA ICEX - - 200 (t.b.d.) µA Emitter-base cuttoff current VEB = 1.5 V, IC = 0 IEBO - DC current gain IC = 5 mA, VCE = 1 V hFE 50 90 150 - Notes: 1.) This Test assures V(BR)CE0 > 4.5V

IFAG IMM RPD D HIR 3 of 4 V2, February 2011 Electrical Characteristics (continued) Parameter Symbol Values Unit min. typ. max. AC Characteristics Transition frequency IC = 30mA, VCE = 3 V, f = 2.0 GHz fT GHz Collector-base capacitance VCB = 2 V, VBE = vbe = 0, f = 1 MHz CCB - 0.14 0.9 pF Collector-emitter capacitance VCE = 2 V, VBE = vbe = 0, f = 1 MHz CCE - 0.46 0.85 pF Emitter-base capacitance VEB = 0.5V, VCB = vcb = 0, f = 1 MHz CEB - 0.67 3.0 pF Noise Figure IC = 5 mA, VCE = 2 V, f = 1.8 GHz, ZS = Zsopt F - 1.1 1.7 dB Insertion power gain IC = 20 mA, VCE = 2 V, f = 1.8 GHz ZS = ZL = 50  |S21e|2 14 18 - dB Power gain IC = 20 mA, VCE = 2 V, f = 1.8 GHz ZS = ZSopt , ZL = ZLopt Gms 1.) - 21 - dB 1dB Compression point IC = 20 mA, VCE = 2 V, f = 1.8 GHz ZS = ZSopt , ZL = ZLopt P-1dB - 12 - dBm Notes.: G S S ms  21

IFAG IMM RPD D HIR 4 of 4 V2, February 2011 Micro-X Package Edition 2011-02 Published by Infineon Technologies AG

85579 Neubiberg, Germany

© Infineon Technologies AG 2011 All Rights Reserved. Attention please! The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie“). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of an third party. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.