APT30DQ120B MICROSEMI | Alldatasheet
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Technical content
Low Losses Low Noise Switching Cooler Operation Higher Reliability Systems Increased System Power Density PRODUCT FEATURES Ultrafast Recovery Times Soft Recovery Characteristics Popular TO-247 Package or Surface Mount D Low Forward Voltage Low Leakage Current Avalanche Energy Rated PRODUCT APPLICATIONS Anti-Parallel Diode -Switchmode Power Supply -Inverters Free Wheeling Diode -Motor Controllers -Converters -Inverters Snubber Diode PFC ULTRAFAST SOFT RECOVERY RECTIFIER DIODE 1200V 30A APT30DQ120B APT30DQ120S APT30DQ120BG* APT30DQ120SG* *G Denotes RoHS Compliant, Pb Free Terminal Finish. MAXIMUM RATINGS All Ratings: T C = 25°C unless otherwise specifi ed. STATIC ELECTRICAL CHARACTERISTICS Symbol VF IRM CT UNIT Volts µA pF MIN TYP MAX 2.8 3.3 3.4 2.1 100 500 Characteristic / Test Conditions Forward Voltage Maximum Reverse Leakage Current Junction Capacitance, VR = 200V IF = 30A IF = 60A IF = 30A, TJ = 125°C VR = 1200V VR = 1200V, TJ = 125°C Characteristic / Test Conditions Maximum D.C. Reverse Voltage Maximum Peak Repetitive Reverse Voltage Maximum Working Peak Reverse Voltage Maximum Average Forward Current (T C = 103°C, Duty Cycle = 0.5) RMS Forward Current (Square wave, 50% duty) Non-Repetitive Forward Surge Current (TJ = 45°C, 8.3ms) Avalanche Energy (1A, 40mH) Operating and StorageTemperature Range Lead Temperature for 10 Sec. Symbol VR VRRM VRWM IF(AV) IF(RMS) IFSM EAVL TJ,TSTG TL UNIT Volts Amps mJ APT30DQ120B_S(G) 1200 210 -55 to 175 300 1 - Cathode 2 - Anode Back of Case -Cathode 1 2 TO-247 D3PAK 1 2 (S) (B) Microsemi Website - http://www.microsemi.com
FIGURE 1. MAXIMUM EFFECTIVE TRANSIENT THERMAL IMPEDANCE, JUNCTION-TO-CASE vs. PULSE DURATION Microsemi reserves the right to change, without notice, the specifi cations and information contained herein.
diF/dt - Rate of Diode Current Change Through Zero Crossing. IRRM - Maximum Reverse Recovery Current. Qrr - Area Under the Curve Defined by IRRM and trr. line through IRRM and 0.25 IRRM passes through zero. Figure 9. Diode Test Circuit
0.25 IRRM
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