AN3376 NXP | Alldatasheet
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© Freescale Semiconductor, Inc., 2007. All rights reserved. AN3376 Rev 3, 08/2007 Freescale Semiconductor Application Note The MMA73x0L Analog Output Accelerometer Evaluation Boards by: Kimberly Tuck and John Young Systems and Applications Engineers Tempe, AZ INTRODUCTION This application note describes the MMA7360L (1.5g & 6g), MMA7340L (3g & 11g) and MMA7330L (4g & 12g) evaluation boards for Freescale’s multi-axis (X, Y , Z) analog output LGA-14 packaged 3x5x1 mm3 variable capacitance sensing accelerometers. This document provides the information about the evaluation board featuring the accelerometer devices. The operation of the MMA73x0L accelerometers are explained including the circuit descriptions and diagrams, showing the pin-outs with the corresponding functionality of the features. This document also includes a quick start guide using the evaluation board. The accelerometer evaluation boards are small circuit boards intended to be used for evaluating the accelerometers and developing prototypes quickly without requiring a PCB to be designed to accommodate for the small LGA package. It also provides a means for understanding the best mounting position and location of an accelerometer in the product with the provided board mounting points. Some examples of the applications for these accelerometers are the following: 3D-Gaming: Tilt and Motion Sensing, Event Recorder HDD MP3 Player: Freefall Detection Laptop PC: Freefall Detection, Anti-Theft Cell Phone: Image Stability, Text Scroll, Motion Dialing, E-Compass Pedometer: Motion Sensing PDA: Text Scroll Navigation and Dead Reckoning: E-Compass Tilt Compensation Robotics: Motion Sensing
DESCRIPTION
The MMA73x0L accelerometers are surface- micromachined integrated-circuit accelerometers. These devices consist of a capacitive sensing g-cell consisting of an X-Y and a Z cell all within a single package, which is sealed hermetically at the wafer level using a bulk micromachined cap wafer. The g-cell is the sensing element of the system which consists of polysilicon mechanical structures. Acceleration is detected when a displacement in X, Y, or Z is detected in the g-cells. The displacement creates a change in capacitance. The ASIC uses a switched capacitor technique to measure the g-cell capacitors and the acceleration data is extracted from a difference in the capacitance. The ASIC provides signal conditioning and filtering to convert the capacitance into a high level output voltage which is ratiometric and proportional to the acceleration. The g-cells are combined with the signal conditioning ASIC in a single integrated circuit package. Table 1. MMA73x0L Accelerometer Characteristics
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the output offset values of the device in all six orientations. Figure 1. Schematic Figure 2. Pin-Out and Polarity for MMA73x0L : Arrow indicates direction of package movement.
Figure 3. Static Acceleration Showing Output Offset Values VSS pins. VDD is the positive supply and VSS is the ground. towards the “on” position for the accelerometer to function. ideal for a battery powered products. Sleep mode is active low. turned off, providing significant reduction of operating current. pin on the MMA7330L and the MMA7340L.
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Table 2. g-Select Pin 10 Descriptions MMA7360L Table 3. g-Select Pin 10 Descriptions MMA7340L Table 4. g-Select Pin 10 Descriptions MMA7330L
- Connect the external power source to the Evaluation
and Gnd (Vss) using the solder pads.
- Turn the side on/off switch into the “on” position as
- Using a thin pointed tool turn the sleep mode dipswitch
Z outputs on the X, Y and Z output pads.
- Connect the X, Y and Z outputs to an oscilloscope to
a microcontroller or any other measuring device.
- The evaluation board has pads for interfacing to a
- The g-Select is shown in Figure 4 (SW2) in the lower of
pad “G_S” to access and change the g-mode.
- The “FF” solder pad will output a high signal when the
Figure 4. Evaluation Board Components
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