ADXC1500 (Rev. SpC)
Document overview
- Manufacturer or author: Analog Devices, Inc.
- PDF pages: 2
Technical content
and Dual-Axis Accelerometer Data Sheet ADXC1500 Rev. SpC Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Tel: 781.329.4700 ©2016–2018 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com
FEATURES
Combined gyroscope and dual-axis, low g accelerometer Temperature compensated, high precision bias, and sensitivity performance ±30 mg accelerometer bias stability over temperature ±2°/sec gyroscope null stability over temperature 2.5 mg rms typical accelerometer noise at 35.6 Hz 0.1°/sec rms typical gyroscope noise at 35.6 Hz Gyroscope: linear acceleration rejection of 0.03°/sec/g Acceleration: ±32 g overload performance SPI digital output with a 16-bit data-word and a 4-bit CRC Comprehensive electromechanical fail-safe features 6 kHz data update rate Programmable filter response <16 mA quiescent current draw
3.3 V or 5 V operation
−40°C to +105°C temperature range 16-lead inverted cavity SOIC package for robust EMI performance Qualified for automotive applications
APPLICATIONS
Electronic stability control Chassis control GENERAL DESCRIPTION The ADXC1500 is a yaw rate gyroscope and dual-axis accelerometer combined in a single package. It is designed for electronic stability control (ESC) and other high performance applications that require yaw rate and acceleration signals simultan- eously. An internal temperature sensor compensates offset and sensitivity performance, providing excellent stability over the −40°C to +105°C temperature range. A digital serial port interface (SPI) transmits the yaw rate and acceleration data to a host microcontroller. A 4-bit cyclical redundancy check (CRC) provides fault coverage for the transmitted SPI data, and internal fault detection routines ensure the integrity of all reported yaw rates and acceleration data. A fully integrated electromechanical continuous self test (CST) routine provides run-time diagnostic capability for assessing the health of each MEMS element. An advanced gyroscope sensor design rejects the linear accel- eration effects of shock and vibration, enabling the ADXC1500 to operate in harsh environments. The accelerometer signal chain is designed to prevent overload conditions from occurring in these same harsh environments. The ADXC1500 is designed to operate at either 3.3 V or 5 V. At less than 16 mA current consumption, the ADXC1500 can be used in energy sensitive applications. FUNCTIONAL BLOCK DIAGRAM ACCELERATION SENSOR DIE GYROSCOPE SENSOR DIE XY SENSOR Z SENSOR MISO MOSI ADXC1500 SCLK CS CP Z-AXIS GYROSCOPE VSA VSD AVDD DVDD AGND DGND VSIO VCM RESONATOR AFE TRIM AND SELF TEST XY AFE Σ-Δ MOD Σ-Δ MOD TEMP SENSOR Σ-Δ MOD SPI INTERFACE HIGH VOLTAGE GENERATION CORIOLIS AFE Σ-Δ MOD BAND- PASS FILTER VOLTAGE REGULATION ALUPHASE- LOCKED LOOP NVM CLOCK GENERATION REGISTERS/MEMORY Z AFE Σ-Δ MOD SYSTEM CONTROLLER SYNC TPA TPB TEST/DEBUG 13032-001 Figure 1. For more information about the ADXC1500, contact the Analog Devices, Inc., Customer Interaction Center at http://www.analog.com/technical_support to connect with a technical support specialist.
Rev. SpC | Page 2 of 2 NOTES ©2016–2018 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D13032F-0-6/18(SpC)