ADV453 AD | Alldatasheet
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L1 Scope. This specification covers the detail requirements for Class B microcircuits in accordance with 1.2.1 of MIL-STD-883, provisions for the use of MIL-STD-883 in conjunction with complaint non-JAN devices. The device is a 40 MHz Monolithic 256 x 24 Color Palette RAM-DAC. 1.2 Part Number. ‘The complete part number per Table } of this specification is as follows: Device Part Number -1 ADV453TQ/883B -2 ADV453TE/883B 1.2.3 Case Outline. See Appendix 1 of General Specification ADI-M-1000: package outline: | 3 | (X) Package Description Lead Finish 2 Q Q-40 40-Lead Dual-In-Line Package Hot Solder DIP wy E E-44A 44-Lead LCC Hot Solder DIP oc G 1.3 Absolute Maximum Ratings. 3 Supply Voltage (Vqq) «oe see e ce eee ence ee eee eee eee ee eee eeeenteretreeereeess $70V 8 Storage Temperature cece b eet e sete eee eens een een ee eeeeteese sence s OSE to +150°C z 1.5 Thermal Characteristics. 2 ‘Thermal Resistance @j¢ = See MIL-M-38510 Appendix C 5 Oj, = 120°C/W for Q 2 Oj, = 50°CW for E . REV.B DIGITAL-TO-ANALOG CONVERTERS 8-197
ADV453—SPECIFICATIONS = ec Limit Group A (-55°C = T, = +1258°C Test Symbol | Min | Max | Subgroups | unless otherwise noted) Relative Accuracy (Each DAC) Integral Nonlinearity (Ip LSB Se em ec be fd faeaipriar tae he} tar | — ee [Dewltirwcnsmee ce | fw fe) [Bil Owertah vanes [You [24 | [23 [tom =eoiga fv [Det Owrttom Vows [von | [0 [423 [tae =32mk fv ee [Ponsa Our rain’ eDan | a [eo [corse cartes |S [fas | Output Current [teat Reie wut [re | [ek Lew Rave mink | [005 [ae | [ist fed | [| | [| Out oe? NS [Seren [ar] "fw fe fer ——— 5 —J Fc [Ree iuh Gwew a | | 0 fu Power Supply Rejection Ratio 1,2,3 | Vag = 5.0 V sea eel | (0.5 V 1 kHz Sinewave Applied to Va,) [Societe ee [een | [socnwetie fy) faa |r [RD AscteDetwdie uf?) [smn | | [RB awreDanvakd uf fm) oicgniv i brteiw st fee | > — so] fein Pe 8-198 DIGITAL-TO-ANALOG CONVERTERS REV.B
Test Symbol Subgroups | unless otherwise noted) ‘Units [WrieDeaSewpTine [wv ia | [sian | tm [WiteDanHodting sf [| om | os [Piet snd ConmalSewpTine fw (7 | [emu | | [Pistand GonmatHowTine fu (3 | [amu [fm [ceckGrcetin® ft | [Stn ms [CiockPube Width Hien Tine [wm (7 | [9100 | [=| [Cock Pube With tow Tine [tw [7 | [91001 | [amos Ourpur Dey dts | «90 [cuK=emne [| [Amlog OurpurRisoFalTine [tw | [@ [ln [cuk-emme [| [Pine Dea? tw Cf [fm *Tested on initial release and after any redesign which may affect this parameter. on These tests are done on a pass/fail basis only. Minimum and/or maximum conditions (as appropriate) are used as input conditions. ac “Digital input values are 0 to 3 V, with input rise/fall time, < 3.ns measured between the 10% and 90% points. Timing reference points are at $0% for inputsan Ld ‘outputs. See Figure 1. & Ww fo} oO fo} fo} Zz fe) in io E a REV.B DIGITAL-TO-ANALOG CONVERTERS 8-199
3.2.1 Functional Block Diagram and Terminal Assignments. ry PS aouUST Yner O O—O oy ©) come mi > Bs as CI] mG set. LO -Om =O [2] coud patie P< ine omy ree" eS L] BY) ety Bee dee ers oxee our Lo I iteit) ea oO omme bodes ono oor AD WA cr Q Package (DIP) E Package (LCC) wo Gf Lat rs aowusr H o Gl fa] Yn asessacisis v2 [3] [38] Van 6S 4 az inane oa [| [37] cour i o [3] [36] 10R oer ul 2 10 bs [6] [35] 106 on : pao ve [7] [94] tne ann 10 ‘58 on o” (a [33] 108 Va tt 38 @ND ha sat |] owe |] ee Vas a] AOVASS Fal] van Pras (Motto Seale) Ba 7 [1a] (rot to Seale) [90] Van Pee 2 Vay s [ial [25] Van Ps 15 1 Va vs fal ba] ae Pee x0 Wn a Flas ras7 2m na Bo Toe naanae ne re es reg B5i8 “de aT po [i] [23] ctock. ou [i fa] ame oto [20] [23] BLANK 8-200 DIGITAL-TO-ANALOG CONVERTERS REV. B
Table 2. Electrical Test Requirements
4.3.2 Group C and D Inspections
a. Endpoint electrical parameters shall be as specified in Table 2 herein.
5.1 Packaging Requirements z
- Typical with full scale 1OG = 26.67 mA.
EDGE OF CLOCK TO THE SOx POMT OF FULL SCALE TRANSITION.
2 SETTUNG TIME @) MEASURED FROM THE 50% POINT OF FULL SCALE
TRANSITION To THE OUTPUT REMAINWG WITHIN st.
- OUTPUT RISEFAL TIME (hy) MEASURED BETWEEN THE 10% AND 90% PORTS
Figure 1. Timing Diagrams