ADT7411ARQZ1

ADT7411_06 AD | Alldatasheet

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SPI®-/I2C®-Compatible, 10-Bit Digital Temperature Sensor and 8-Channel ADC ADT7411 Rev. B Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2006 Analog Devices, Inc. All rights reserved.

FEATURES

10-bit temperature-to-digital converter 10-bit 8-channel ADC DC input bandwidth Input range: 0 V to 2.25 V and 0 V to V DD Temperature range: −40°C to +120°C Temperature sensor accuracy of ±0.5°C Supply range: 2.7 V to 5.5 V Power-down current : <10 μA Internal 2.25 V REF option Double-buffered input logic I 2C, SPI, QSPI™, MICROWIRE™, and DSP compatible 4-wire serial interface SMBus packet error checking (PEC) compatible 16-lead QSOP

APPLICATIONS

Portable battery-powered instruments PCs Smart battery chargers Telecommunications systems electronic test equipment Domestic appliances Process controls PIN CONFIGURATION NC = NO CONNECT AIN5 NC CS D+/AIN1 VDD GND AIN6 AIN8 AIN4 SCL/SCLK INT/INT D–/AIN2 AIN3 DOUT/ADD SDA/DIN AIN7 TOP VIEW (Not to Scale) ADT7411 02882-005 Figure 1. GENERAL DESCRIPTION The ADT74111 combines a 10-bit temperature-to-digital converter and a 10-bit 8-channel ADC in a 16-lead QSOP . This includes a band gap temperature sensor and a 10-bit ADC to monitor and digitize the temperature reading to a resolution of 0.25°C. The ADT7411 operates from a single 2.7 V to 5.5 V supply. The input voltage on the ADC channels has a range of 0 V to 2.25 V and the input bandwidth is dc. The reference for the ADC channels is derived internally. The ADT7411 provides two serial interface options: a 4-wire serial interface compatible with SPI, QSPI, MICROWIRE, and DSP interface standards, and a 2-wire SMBus/I 2C interface. It features a standby mode that is controlled via the serial interface. The ADT7411’s wide supply voltage range, low supply current, and S PI-/I2C-compatible interface make it ideal for a variety of applications, including PCs, office equipment, and domestic appliances. 1 Protected by U.S. Patent Numbers: 6,169,442; 5,867,012; 5,764174.

Rev. B | Page 2 of 36 TABLE OF CONTENTS

REVISION HISTORY

12/06–Rev. A to Rev. B Changes to Internal T HIGH Limit Register (Read/Write) Changes to Internal TLOW Limit Register (Read/Write) Changes to External THIGH/AIN1 VHIGH Limit Register Changes to External T LOW/AIN1 VLOW Limit Register 3/04–Rev. 0 to Rev. A F 8/03–Revision 0: Initial Version

Rev. B | Page 3 of 36 SPECIFICATIONS VDD = 2.7 V to 5.5 V , GND = 0 V , unless otherwise noted. Temperature ranges are −40°C to +120°C. Table 1. Parameter1 Min Typ Max Unit Conditions/Comments ADC DC ACCURACY Maximum VDD = 5 V. Resolution 10 Bits Total Unadjusted Error (TUE) 2 3 % of FSR VDD = 2.7 V to 5.5 V. 2 % of FSR VDD = 3.3 V (±10%). Offset Error ±0.5 % of FSR Gain Error ±2 % of FSR ADC BANDWIDTH DC Hz ANALOG INPUTS Input Voltage Range 0 2.25 V AIN1 to AIN8. C4 = 0 in Control Configuration 3. 0 VDD V AIN1 to AIN8. C4 = 1 in Control Configuration 3. DC Leakage Current ±1 μA Input Capacitance 5 20 pF Input Resistance 10 MΩ THERMAL CHARACTERISTICS Internal reference used. Averaging on. Internal Temperature Sensor Accuracy @ VDD = 3.3 V ± 10% ±1.5 °C TA = 85°C. ±0.5 ±3 °C TA = 0°C to 85°C. Accuracy @ VDD = 5 V ± 5% ±2 ±3 °C TA = 0°C to 85°C. Resolution 10 Bits Equivalent to 0.25°C. Long-Term Drift 0.25 °C Drift over 10 years if part is operated at 55°C. External Temperature Sensor External transistor = 2N3906. Accuracy @ VDD = 3.3 V ± 10% ±1.5 °C TA = 85°C. ±3 °C TA = 0°C to 85°C. ±5 °C TA = −40°C to +120°C. Accuracy @ VDD = 5 V ± 5% ±2 ±3 °C TA = 0°C to 85°C. Resolution 10 Bits Equivalent to 0.25°C. Output Source Current 180 μA High level. 11 μA Low lev el. CONVERSION TIMES Single-channel mode. Slow ADC VDD/AIN 11.4 ms Averaging (16 samples) on. 712 μs Averaging off . Internal Temperature 11.4 ms Averaging (16 samples) on. 712 μs Averaging off . External Temperature 24.22 ms Averaging (16 samples) on. 1.51 ms Averaging off . Fast ADC VDD/AIN 712 μs Averaging (16 samples) on. 44.5 μs Averaging off . Internal Temperature 2.14 ms Averaging (16 samples) on. 134 μs Averaging off . External Temperature 14.25 ms Averaging (16 samples) on. 890 μs Averaging off .

Rev. B | Page 4 of 36 Parameter1 Min Typ Max Unit Conditions/Comments ROUND ROBIN UPDATE RATE2 Time to complete one measurement cycle thr ough all channels. Slow ADC @ 25°C Averaging On 125.4 ms AIN1 and AIN2 are selected on Pin 7 and Pin 8. Averaging Off 17.1 ms AIN1 and AIN2 are selected on Pin 7 and Pin 8. Averaging On 140.36 ms D+ and D– are selected on Pin 7 and Pin 8. Averaging Off 12.11 ms D+ and D− are selected on Pin 7 and Pin 8. Fast ADC @ 25°C Averaging On 9.26 ms AIN1 and AIN2 are selected on Pin 7 and Pin 8. Averaging Off 578.96 μs AIN1 and AIN2 are selected on Pin 7 and Pin 8. Averaging On 24.62 ms D+ and D− are selected on Pin 7 and Pin 8. Averaging Off 3.25 ms D+ and D− are selected on Pin 7 and Pin 8. ON-CHIP REFERENCE3 Reference Voltage 2.2662 2.28 2.2938 V Temperature Coefficient 80 ppm/°C DIGITAL INPUTS1, 3 Input Current ±1 μA VIN = 0 V to VDD. VIL, Input Low Voltage 0.8 V VIH, Input High Voltage 1.89 V Pin Capacitance 3 10 pF All digital inputs. SCL, SDA Glitch Rejection 50 ns Input filtering suppresses n oise spikes of less than 50 ns. DIGITAL OUTPUTS Output High Voltage, VOH 2.4 V ISOURCE = ISINK = 200 μA. Output Low Voltage, VOL 0.4 V IOL = 3 mA. Output High Current, IOH 1 mA VOH = 5 V. Output Capacitance, COUT 50 pF INT/INT Output Saturation Voltage 0.8 V IOUT = 4 mA. I2C TIMING CHARACTERISTICS4, 5 Serial Clock Period, t1 2.5 μs Fast-mode I2C. See Figure 2. Data In Setup Time to SCL High, t2 50 ns Data Out Stable after SCL Low, t3 0 ns See Figure 2. SDA Low Setup Time to SCL Low (Start Condition), t4 50 ns See Figure 2. SDA High Hold Time after SCL High (Stop Condition), t5 50 ns See Figure 2. SDA and SCL Fall Time, t6 300 ns See Figure 2. SDA and SCL Rise Time, t7 3006 ns See Figure 2. SPI TIMING CHARACTERISTICS1, 3, 7 CS to SCLK Setup Time, t1 0 ns See Figure 3. SCLK High Pulse Width, t2 50 ns See Figure 3. SCLK Low Pulse Width, t3 50 ns See Figure 3. Data Access Time after SCLK Falling Edge, t47 35 ns See Figure 3. Data Setup Time Prior to SCLK Rising Edge, t5 20 ns See Figure 3. Data Hold Time after SCLK Rising Edge, t6 0 ns See Figure 3. CS to SCLK Hold Time, t7 0 ns See Figure 3. CS to DOUT High Impedance, t8 40 ns See Figure 3.

Rev. B | Page 6 of 36 FUNCTIONAL BLOCK DIAGRAM 7D+/AIN1 8D–/AIN2 9AIN3 14AIN4 2AIN5 1AIN6 16AIN7 15AIN8 VDD VALUE REGISTER SDA/DIN GND VDD SCL/SCLK DOUT/ADD CS ADDRESS POINTER REGISTER DIGITAL MUX THIGH LIMIT REGISTERS LIMIT COMPARATOR TLOW LIMIT REGISTERS VDD LIMIT REGISTERS AINHIGH LIMIT REGISTERS AINLOW LIMIT REGISTERS CONTROL CONFIG. 1 REGISTER CONTROL CONFIG. 2 REGISTER CONTROL CONFIG. 3 REGISTER INTERRUPT MASK REGISTERS STATUS REGISTERS ON-CHIP TEMPERATURE SENSOR INTERNAL TEMPERATURE VALUE REGISTER EXTERNAL TEMPERATURE VALUE REGISTER VDD SENSOR ADT7411 ANALOG MUX A-TO-D CONVERTER INT/INT AIN4 VALUE REGISTER AIN3 VALUE REGISTER AIN2 VALUE REGISTER AIN1 VALUE REGISTER AIN7 VALUE REGISTER AIN6 VALUE REGISTER AIN5 VALUE REGISTER SPI/SMBus INTERFACE AIN8 VALUE REGISTER DIGITAL MUX 02882-001 Figure 5.

1 Values relate to package being used on a 4-layer board.

2 Junction-to-case resistance is applicable to components featuring a

Table 3. I2C Address Selection

Figure 6. Pin Configuration Table 4. Pin Function Descriptions 1 AIN6 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD. 2 AIN5 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD. serial clocks. It is recommended that this pin be tied high to VDD when operating the serial interface in I2C mode. 5 GND Ground Reference Point for All Circuitry on the Part. Analog and digital ground. 6 V DD Positive Supply Voltage, 2.7 V to 5.5 V. The supply should be decoupled to ground. 7 D+/AIN1 Positive Connection to External Temperature Sensor/A nalog Input. Single-ended analog input channel. Input range is 0 V to 2.25 V or 0 V to 5 V. 8 D−/AIN2 Negative Connection to External Temperature Sensor/Anal og Input. Single-ended analog input channel. Input range is 0 V to 2.25 V or 0 V to 5 V. 9 AIN3 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD. temperature, VDD, or AIN limits are exceeded. Default is active low. Open-drain output needs a pull-up resistor. falling edge of SCLK. Open-drain output needs a pull-up resistor. effect on the I2C serial bus address. drain configuration needs a pull-up resistor. clocked into a register on the rising edge of SCLK. An open-drain configuration needs a pull-up resistor. 14 AIN4 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD. 15 AIN8 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD. 16 AIN7 Analog Input. Single-ended analog input channel . Input range is 0 V to 2.25 V or 0 V to VDD.

Rev. B | Page 9 of 36 TERMINOLOGY Relative Accuracy Relative accuracy or integral nonlinearity (INL) is a measure of th e maximum deviation, in LSBs, from a straight line passing through the endpoints of the ADC transfer function. A typical INL vs. code plot can be seen in Figure 10. Tot a l Una dju ste d E r ror ( T UE ) Total unadjusted error is a comprehensive specification that in cludes the sum of the relative accuracy error, gain error, and offset error under a specified set of conditions. Offset Error This is a measure of the offset error of the ADC. It can be ne gative or positive. It is expressed in mV . Gain Error This is a measure of the span error of the ADC. It is the de viation in slope of the actual ADC transfer characteristic from the ideal expressed as a percentage of the full-scale range. Offset Error Drift This is a measure of the change in offset error with changes in t emperature. It is expressed in ppm of full-scale range/°C. Gain Error Drift This is a measure of the change in gain error with changes in t emperature. It is expressed in ppm of full-scale range/°C. Long-Term Temperature Drift This is a measure of the change in temperature error with the p assage of time. It is expressed in degrees Celsius. The concept of long-term stability has been used for many years to describe by what amount an IC’s parameter would shift during its lifetime. This is a concept that has been typically applied to both voltage references and monolithic temperature sensors. Unfortunately, ICs cannot be evaluated at room temperature (25°C) for 10 years or so to determine this shift. As a result, manufacturers typically perform accelerated lifetime testing of ICs by operating ICs at elevated temperatures (between 125°C and 150°C) over a shorter period (typically between 500 hours and 1,000 hours). Because of this operation, the lifetime of an IC is significantly accelerated due to the increase in rates of reaction within the semiconductor material. DC Power Supply Rejection Ratio (PSRR) The power supply rejection ratio (PSRR) is defined as the ratio o f the power in the ADC output at full-scale frequency f to the power of a 100 mV sine wave applied to the VDD supply of frequency fs. PSRR (dB) = 10 log(Pf/Pfs) where: Pf is th e power at frequency f in ADC output. Pfs is th e power at frequency fs coupled into the V DD supply. Round Robin This term describes the ADT7411 cycling through the available m easurement channels in sequence, taking a measurement on each channel.

Figure 19. Temperature Sensor Response to Thermal Shock

Rev. B | Page 13 of 36 THEORY OF OPERATION After the power-up calibration routine, the ADT7411 goes into idle mode. In this mode, the device is not performing any measurements and is fully powered up. To begin monitoring, write to the Control Configuration 1 r egister (Address 18h) and set Bit C0 = 1. The ADT7411 goes into its power-up default measurement mode, which is round robin. The device performs measurements in the following channel sequence: 1. VDD channel 2. I nternal temperature sensor channel 3. E xternal temperature sensor channel (or AIN1 and AIN2 if external diode is not set up) 4. AIN3 5. AIN4 6. AIN5 7. AIN6 8. AIN7 9. AIN8 Once it finishes taking measurements on the AIN8 channel, the de vice immediately loops back to start taking measurements on the VDD channel and repeats the same cycle as before. This loop continues until the monitoring is stopped by resetting Bit C0 of the Control Configuration 1 register to 0. It is also possible to continue monitoring as well as switching to single-channel mode by writing to the Control Configuration 2 register (Address 19h) and setting Bit C4 = 1. Further explanations of the single-channel and round robin measurement modes are given in the Single-Channel Measurement and Round Robin M easurement sections. All measurement channels have a veraging enabled on them at power-up. Averaging forces the device to take an average of 16 readings before giving a final measured result. To disable averaging and consequently decrease the conversion time by a factor of 16, set C5 = 1 in the Control Configuration 2 register. There are eight single-ended analog input channels on the ADT7411: AI N1 to AIN8. AIN1 and AIN2 are multiplexed with the external temperature sensors D+ and D− terminals. Bits C1 and C2 of the Control Configuration 1 register (Address 18h) are used to select between AIN1/2 and the external temperature sensor. The input range on the analog input channels is dependent on whether the ADC reference used is the internal V REF or VDD. To meet linearity specifications, it is recommended that the maximum VDD value is 5 V . Bit C4 of the Control Configuration 3 register is used to select between the internal reference and VDD as the analog inputs’ ADC reference. The dual serial interface defaults to the I2C protocol on power- up. To select and lock in the SPI protocol, follow the selection process as described in the Serial Interface Selection section. The I 2C protocol cannot be locked in, while the SPI protocol on selection is automatically locked in. The interface can only be switched back to I 2C when the device is powered off and on. When using I2C, the CS pin should be tied to either VDD or GND. There are a number of different operating modes on the ADT7411 de vices and all of them can be controlled by the configuration registers. These features consist of enabling and disabling interrupts, polarity of the INT/INT pin, enabling and disabling the averaging on the measurement channels, SMBus timeout, and software reset. POWER-UP CALIBRATION It is recommended that no communication to the part is initiated until approximately 5 ms after VDD has settled to within 10% of its final value. It is generally accepted that most systems take a maximum of 50 ms to power up. Power-up time is directly related to the amount of decoupling on the voltage supply line. During the 5 ms after V DD has settled, the part is performing a calibration routine; any communication to the device interrupts this routine and can cause erroneous temperature measurements. If it is not possible to have V DD at its nominal value by the time 50 ms elapses or that communication to the device starts prior to V DD settling, then it is recommended that a measurement be taken on the VDD channel before a temperature measurement is taken. The VDD measurement is used to calibrate out any temperature measurement error due to different supply voltage values. CONVERSION SPEED The internal oscillator circuit used by the ADC has the capability to output two different clock frequencies. This means that the ADC is capable of running at two different speeds when doing a conversion on a measurement channel. Therefore, the time taken to perform a conversion on a channel can be reduced by setting C0 of the Control Configuration 3 register (Address 1Ah). This increases the ADC clock speed from 1.4 Hz to 22 kHz. At the higher clock speed, the analog filters on the D+ and D− input pins (external temperature sensor) are switched off. This is why the power-up default setting is to have the ADC working at the slow speed. The typical times for fast and slow ADC speeds are given in Table 1. The ADT7411 powers up with averaging on. This means every cha nnel is measured 16 times and internally averaged to reduce noise. The conversion time can also be reduced by turning the averaging off. This is done by setting Bit C5 of the Control Configuration 2 register (Address 19h) to a 1.

transfer characteristic is shown in Figure 24. Figure 24. Transfer Function

1 LSB = Reference (V)/1024

Internal reference used. Therefore, VREF = 2.25 V . Figure 25. Top Level Structure of Int ernal Temperature Sensor Figure 26. Equivalent Analog Input ESD Circuit eight bits long while the AIN conversion result is 10 bits long. ADC and the results stored in the various value registers.

limits. These temperature limits are stored in on-chip registers. guaranteed operating temperature range of the device. possible using an external sensor. defaults on power-up with the averaging enabled. measured each time the part runs a round robin sequence. immediately after the serial communication has finished. Figure 27. ADT7411 Interrupt Structure

a channel along with the internal, external, and AIN channels. Bit C2 to all 0s in the Control Configuration 2 register. how the transfer function works. Table 5. VDD Data Format, VREF = 2.25 V reference is used as the reference for the ADC. the device loops around for another measurement cycle. internal temperature sensor, is measured in each conversion cycle. typical times at 25°C are given in Table 1. write operation is completed.

the internal temperature offset register. diode sensor or diode-connected transistor. unsuitable for mass production. in VBE when the device is operated at two different currents. q is t he charge on the carrier. T is t he absolute temperature in Kelvin. he ratio of the two currents. could equally well be a discrete transistor. recommended as the external transistor. onsiderations section for more information on C1. performed by averaging the results of 16 measurement cycles. avoided, this distance can be 4 inches to 8 inches.

1. Ro ute the D+ and D− tracks close together, in parallel,

plane under the tracks if possible. recommended (see Figure 28).

10 MIL

Figure 28. Arrangement of Signal Tracks

1. Try to minimize the number of copper/solder joints, which

D− path and at the same temperature. voltages are about 3 μV/°C of temperature difference.

Figure 30. Phase 2 of 10-Bit Read Table 7. ADT7411 Registers limit event is corrected. It is also reset by a software reset. Table 8. Interrupt Status 1 Register 1 Default settings at power-up.

D0 1 when internal temperature value exceeds THIGH limit. limit causes an out-of-limit event. D1 1 when internal temperature value exceeds TLOW limit. the set limit causes an out-of-limit event. is 1 when external temperature value exceeds THIGH limit. D3 1 when external temperature value exceeds TLOW limit. limit set causes an out-of-limit event. D4 1 indicates a fault (open or short) for the external temp sensor. out-of-limit event is corrected. It is also reset by a software reset. Table 10. Interrupt Status 2 Register 1 Default settings at power-up. the corresponding VLOW limit. the corresponding VLOW limit. the corresponding VLOW limit. the corresponding VLOW limit. also the two LSBs of the 10-bit supply voltage reading. Table 12. Internal Temperature/VDD LSBs 1 Default settings at power-up. selected by Bit 1 and Bit 2 of the Control Configuration 1 register. Table 14. External Temperature and AIN1to AIN4 LSBs 1 Default settings at power-up.

in Register 0Ch to Register 0Fh. Table 16. AIN5 to AIN8 LSBs 1 Default settings at power-up. eight MSBs of the 10-bit value are stored in this register. Table 18. VDD Value MSBs 1 Loaded with VDD value after power-up. format. This register stores the eight MSBs of the 10-bit value. Table 19. Internal Temperature Value MSBs 1 Default settings at power-up. the 10-bit value are stored in this register. Table 20. External Temperature Value/Analo 1 Default settings at power-up. full 10-bit conversion result of the analog value on the AIN2 pin. Table 21. AIN2 MSBs 1 Default settings at power-up. full 10-bit conversion result of the analog value on the AIN3 pin. Table 22. AIN3 MSBs 1 Default settings at power-up. conversion result of the analog value on the AIN4 pin. Table 23. AIN4 MSBs 1 Default settings at power-up. analog value on the AIN5 pin. Table 24. AIN5 MSBs 1 Default settings at power-up.

analog value on the AIN6 pin. Table 25. AIN6 MSBs 1 Default settings at power-up. analog value on the AIN7 pin. Table 26. AIN7 MSBs 1 Default settings at power-up. the analog value on the AIN8 pin. Table 27. AIN8 MSBs 1 Default settings at power-up. used to set up some of the operating modes of the ADT7411. Table 28. Control Configuration 1 1 Default settings at power-up. C3 Reserved. Write 1 only to this bit. C5 0: Enable INT/INT output. C6 Configures INT/INT output polarity. operational. To power up the part again, write 0 to this bit. used to set up some of the operating modes of the ADT7411. Table 30. Control Configuration 2 1 Default settings at power-up.

sensor/AIN1, AIN2 to AIN8 for conversion. The default is VDD. 0001 = Internal Temperature Sensor. onversion cycle. Default is round robin. annels 16 times. This bit disables this averaging. Channels affected are temperature, analog inputs, and VDD. master SCL does not lock up the SDA line. reset. All registers reset to their default settings. used to set up some of the operating modes of the ADT7411. Table 32. Control Configuration 3 1 Default settings at power-up. C0 Selects between fast and normal ADC conversion speeds. C1:C2 Reserved. Only write 0s. C3 Reserved. Write only 1 to this bit. C5:C7 Reserved. Only write 0s. Table 34. Interrupt Mask 1 1 Default settings at power-up.

Table 36. Interrupt Mask 2 1 Default settings at power-up. transfer function of the channel can be moved up or down. register, the temperature resolution is 1°C. Table 38. Internal Temperature Offset 1 Default settings at power-up. transfer function of the channel can be moved up or down. register, the temperature resolution is 1°C. Table 39. External Temperature Offset 1 Default settings at power-up. Table 40. VDD VHIGH Limit 1 Default settings at power-up. value has to be less than or equal to the value in this register. The default value is 2.7 V . Table 41. VDD VLOW Limit 1 Default settings at power-up. causes an interrupt and activates the INT/INT output (if enabled). Table 42. Internal THIGH Limit 1 Default settings at power-up.

causes an interrupt and activates the INT/INT output (if enabled). to be more negative than or equal to the value in this register. Because it is an 8-bit register, the temperature resolution is 1°C. Table 43. Internal TLOW Limit 1 Default settings at power-up. resolution is 1°C. The default value is −1°C. this limit register is full-scale voltage. Table 44. AIN1 V 1 Default settings at power-up. resolution is 1°C. The default value is 0°C. this limit register is 0 V . Table 45. AIN1 V 1 Default settings at power-up. value is full-scale voltage. Table 46. AIN2 VHIGH Limit 1 Default settings at power-up.

Table 47. AIN2 V 1 Default settings at power-up. value is full-scale voltage. Table 48. AIN3 V 1 Default settings at power-up. Table 49. AIN3 VLOW Limit 1 Default settings at power-up. value is full-scale voltage. Table 50. AIN4 V 1 Default settings at power-up. Table 51. AIN4 V 1 Default settings at power-up. value is full-scale voltage. Table 52. AIN5 VHIGH Limit 1 Default settings at power-up. Table 53. AIN5 V 1 Default settings at power-up.

value is full-scale voltage. Table 54. AIN6 V 1 Default settings at power-up. Table 55. AIN6 V 1 Default settings at power-up. value is full-scale voltage. Table 56. AIN7 VHIGH Limit 1 Default settings at power-up. Table 57. AIN7 V 1 Default settings at power-up. Table 58. AIN8 V 1 Default settings at power-up. Table 59. AIN8 VLOW Limit 1 Default settings at power-up. number for this part. ADT7411 = 02h. This register contains the manufacturer’s identification number. Analog Devices, Inc. is 41h.

reads from the slave device.

1. Da ta is sent over the serial bus in sequences of nine clock

high during the 10th clock pulse to assert a stop condition. subsequently be changed without starting a new operation. effect on the I2C serial bus address. repeatedly loaded until the last data byte is sent. Figure 36. The register address was previously set up by a

Figure 44. 16-Lead Shrink Small Outline Package [QSOP]

Rev. B | Page 36 of 36 NOTES Purchase of licensed I2C components of Analog Devices, Inc. or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I2C Patent Rights to use these components in an I2C system, provided that the system conforms to the I2C Standard Specification as defined by Philips. ©2006 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. C02882-0-12/06(B)