ADIS16354 AD | Alldatasheet
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Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
FEATURES
Tri-axis gyroscope with digital range scaling ±75°/s, ±150°/s, ±300°/s settings 14-bit resolution Tri-axis accelerometer ±1.7 g measurement range, 14-bit resolution
350 Hz bandwidth
Factory calibrated sensitivity, bias, and alignment Calibration temperature range: −20°C to +70°C Operating temperature range: −40°C to +85°C Digitally controlled bias calibration Digitally controlled sample rate Digitally controlled filtering Programmable condition monitoring Auxiliary digital input/output Digitally activated self-test Programmable power management Embedded temperature sensor SPI-compatible serial interface Auxiliary 12-bit ADC input and DAC output Single-supply operation: 4.75 V to 5.25 V 2000 g shock survivability
APPLICATIONS
Platform control and stabilization Motion control and analysis Inertial measurement units General navigation Image stabilization Robotics FUNCTIONAL BLOCK DIAGRAM 07135-001 AUX_ADC AUX_DAC TEMPERATURE SENSORS SIGNAL CONDITIONING AND CONVERSION CALIBRATION AND DIGITAL PROCESSING POWER MANAGEMENT ALARMS SELF-TEST TRI-AXIS MEMS ANGULAR RATE SENSOR TRI-AXIS MEMS ACCELERATION SENSOR DIGITAL CONTROL SPI PORT AUX I/O GND DOUT DIO1 DIO2 SCLK DIN VCC CS RST ADIS16354 Figure 1. GENERAL DESCRIPTION The ADIS16354 iSensor™ is a complete triple axis gyroscope and triple axis accelerometer inertial sensing system. This sensor combines the Analog Devices, Inc., iMEMS® and mixed signal processing technology to produce a highly integrated solution, providing calibrated, digital inertial sensing. An SPI interface and simple output register structure allow for easy access to data and configuration controls. The SPI port provides access to the following embedded sensors: X-, Y-, and Z-axis angular rates; X-, Y-, and Z-axis linear accelera- tion; internal temperature; power supply; and auxiliary analog input. The inertial sensors are precision-aligned across axes, and are calibrated for offset and sensitivity over a temperature range of −20°C to +70°C. An embedded controller dynamically compensates for all major influences on the MEMS sensors, thus maintaining highly accurate sensor outputs without further testing, circuitry, or user intervention. The following programmable features simplify system integration:
- In-system autobias calibration
- Digital filtering and sample rate
- Self-test
- Power management
- Condition monitoring
- Auxiliary digital input/output This compact module is approximately 23 mm × 23 mm × 23 mm and provides a convenient flex-based connector system.
Rev. 0 | Page 2 of 28 TABLE OF CONTENTS
REVISION HISTORY
1/08—Revision 0: Initial Version
Rev. 0 | Page 3 of 28 SPECIFICATIONS TA = −40°C to +85°C, VCC = 5.0 V , angular rate = 0°/s, dynamic range = 300°/sec, ±1 g, unless otherwise noted. Table 1. Parameter Conditions Min Typ Max Unit GYROSCOPE SENSITIVITY Each axis Initial Sensitivity 25°C, dynamic range = ±300°/s 0.0725 0.07326 0.0740 °/s/LSB 25°C, dynamic range = ±150°/s 0.03663 °/s/LSB 25°C, dynamic range = ±75°/s 0.01832 °/s/LSB Temperature Coefficient See Figure 6, −20°C to +70°C 40 ppm/°C Gyroscope Axis Nonorthogonality 25°C, difference from 90° ideal ±0.05 Degree Gyroscope Axis Misalignment 25°C, relative to base-plate and guide pins ±0.5 Degree Nonlinearity Best fit straight line 0.1 % of FS GYROSCOPE BIAS In Run Bias Stability 25°C, 1 σ 0.015 °/s Angular Random Walk 25°C 4.2 °/√hr Temperature Coefficient See Figure 7, −20°C to +70°C 0.01 °/s/°C Linear Acceleration Effect Any axis, 1 σ (linear acceleration bias compensation enabled) 0.05 °/s/g Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.25 °/s/V GYROSCOPE NOISE PERFORMANCE Output Noise 25°C, ±300°/s range, 2-tap filter setting 0.60 °/s rms 25°C, ±150°/s range, 8-tap filter setting 0.35 °/s rms 25°C, ±75°/s range, 32-tap filter setting 0.17 °/s rms Rate Noise Density 25°C, f = 25 Hz, ±300°/s, no filtering 0.05 °/s/√Hz rms GYROSCOPE FREQUENCY RESPONSE 3 dB Bandwidth 350 Hz Sensor Resonant Frequency 14 kHz GYROSCOPE SELF-TEST STATE Change for Positive Stimulus ±300°/s range setting 432 723 1105 LSB Change for Negative Stimulus ±300°/s range setting −432 −723 −1105 LSB Internal Self-Test Cycle Time 35 ms ACCELEROMETER SENSITIVITY Each axis Dynamic Range ±1.7 g Initial Sensitivity 25°C 0.4578 0.4625 0.4672 mg/LSB Temperature Coefficient −20°C to +70°C 40 ppm/°C Axis Nonorthogonality 25°C, difference from 90° ideal ±0.2 Degree Axis Misalignment 25°C, relative to base-plate and guide pins ±0.5 Degree Nonlinearity Best fit straight line ±0.2 % of FS ACCELEROMETER BIAS Velocity Random Walk 25°C 0.135 m/s/√hr Temperature Coefficient 0.25 m g/°C ACCELEROMETER NOISE PERFORMANCE Output Noise 25°C, no filtering 4.7 mg rms Noise Density 25°C, no filtering 0.24 mg/√Hz rms ACCELEROMETER FREQUENCY RESPONSE 3 dB Bandwidth 350 Hz Sensor Resonant Frequency 5.5 kHz ACCELEROMETER SELF-TEST STATE Output Change When Active 434 744 1052 LSB TEMPERATURE SENSOR Output at 25°C 0 LSB Scale Factor 6.88 LSB/°C
Rev. 0 | Page 4 of 28 Parameter Conditions Min Typ Max Unit ADC INPUT Resolution 12 Bits Integral Nonlinearity ±2 LSB Differential Nonlinearity ±1 LSB Offset Error ±4 LSB Gain Error ±2 LSB Input Range 0 2.5 V Input Capacitance During acquisition 20 pF DAC OUTPUT 5 kΩ/100 pF to GND Resolution 12 Bits Relative Accuracy For Code 101 to Code 4095 ±4 LSB Differential Nonlinearity ±1 LSB Offset Error ±5 mV Gain Error ±0.5 % Output Range 2.5 V Output Impedance 2 Ω Output Settling Time 10 μs LOGIC INPUTS1 Input High Voltage, VINH 2.0 V Input Low Voltage, VINL 0.8 V For −CS signal when used to wake up from sleep mode 0.55 V Logic 1 Input Current, IINH V IH = 3.3 V ±0.2 ±10 μA Logic 0 Input Current, IINL V IL = 0 V All Except RST −40 −60 μA RST −1 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS1 Output High Voltage, VOH I SOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL I SINK = 1.6 mA 0.4 V SLEEP TIMER Timeout Period2 0.5 128 Sec FLASH MEMORY Endurance3 10,000 Cycles Data Retention4 TJ = 85°C 20 Years CONVERSION RATE Maximum Sample Rate SMPL_PRD = 0x01 819.2 SPS Minimum Sample Rate SMPL_PRD = 0xFF 0.413 SPS START-UP TIME5 Initial Power-Up 150 ms Sleep Mode Recovery 3 ms POWER SUPPLY Operating Voltage Range, VCC 4.75 5.0 5.25 V Power Supply Current Normal mode at 25°C 33 mA Fast mode at 25°C 57 mA Sleep mode at 25°C 500 μA 1 The digital I/O signals are driven by an internal 3.3 V supply and the inputs are 5 V tolerant. 2 Guaranteed by design. 3 Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +125°C. 4 Retention lifetime equivalent at junction temperature (TJ) 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature. 5 This is defined as the time from wake-up to the first conversion. This time does not include sensor settling time, which is dependent on the filter settings.
1 Extended exposure to temperatures outside the specified temperature
2 Although the device is capable of withstanding short-term exposure to
150°C, long-term exposure threatens internal mechanical integrity. Table 4. Package Characteristics
1 DNC
- CONNECTOR PINS ARE NOT VISIBLE FROM THE TOP VIEW.
- THIS REPRESENTATION DISPLAYS THE TOP VIEW PINOUT
FOR THE MATING SOCKET CONNECTOR. Figure 4. Pin Configuration, Connector Top View Table 5. Pin Function Descriptions
3 SCLK I SPI Serial Clock
4 DOUT O SPI Data Output
5 DIN I SPI Data Input
6 CS I SPI Chip Select
7 DIO1 I/O Digital Input/Output
8 RST I Reset
9 DIO2 I/O Digital Input/Output
20 AUX_DAC O Auxiliary, 12-Bit, DAC Output
21 AUX_ADC I Auxiliary, 12-Bit, ADC Input
1 S = supply, O = output, I = input. Figure 5. Pin Configuration, Connector Top View
Table 6. Output Register Bit Map registers are updated with new data, the ND bit goes to a 1 state. After the output data is read, it returns to a 0 state. all of the necessary details for accessing each register’s data. cycle for the XGYRO_OUT register. Table 7. Data Output Register Information 1 Assumes that the scaling is set to 300°/s. 2 Typical condition, 25°C = 0 LSB. Table 8. Output Coding Example, XGYRO_OUT, YGYRO_OUT, and ZGYRO_OUT 1, 2 1 The binary output includes the data bits for the output registers, which, in this case, are D0 to D13, per Table 6. Bits assigned EA and ND are not included. 2 Zero offset null performance is assumed.
Table 9. Output Coding Example, XACCL_OUT, YACCL_OUT, and ZACCL_OUT 1, 2 1 The binary output includes the data bits for the output registers, which, in this case, are D0 to D13, per Table 6. Bits assigned EA and ND are not included. 2 Zero offset null performance is assumed. Figure 29. Example Read Cycle
- Calibration
- Global commands
- Operational control
- Sample rate
- Power management
- Digital filtering
- Dynamic range
- DAC output
- Digital input/output
- Operational status and diagnostics
- Self-test
- Status conditions
- Alarms CONTROL REGISTER STRUCTURE The ADIS16354 uses a temporary, RAM-based memory struc- ture to facilitate the control registers listed in Table 10. The operational configuration is stored in a flash memory structure that automatically loads into the control registers during the start-up sequence. Each nonvolatile register has a corresponding flash memory location for storing the latest configuration contents. The contents of each nonvolatile register must be stored to flash manually. Note that the contents of these registers are nonvolatile after they are stored to flash. The flash update command, available in the COMMAND register, provides this function. The ENDURANCE register provides a counter, which allows for reliability manage- ment against the flash memory’s write cycle specification.
Table 10. Control Register Mapping 1 The contents of the lower byte are nonvolatile; the contents of the upper byte are volatile.
ADIS16354 provides bias correction registers for all six sensors. Table 11. Gyroscope Bias Correction Registers Table 12. Gyroscope Bias Correction Register Bits Table 13. Accelerometer Bias Correction Registers Table 14. Accelerometer Bias Correction Register Bits This step reduces the 0.18°/s error term to 0.00315°/s. single register write command starts this process (see Table 16). appropriate bias correction factors for all three gyroscope sensors. This command requires approximately 30 seconds to complete. initiated by writing a 1 to its assigned bit. voltage to be within specification for the duration of the event. update error = 0, if successful).
Table 15. COMMAND Register Definition Table 16. COMMAND Bit Descriptions second. The contents of this register are nonvolatile. Table 17. SMPL_PRD Register Definition Table 18. SMPL_PRD Bit Descriptions The sample rate setting also affects the power dissipation. (sample rate, serial transfer rate) and power dissipation. programmable shutdown period and indefinite shutdown. line down to a 0 state, then returning it to a 1 state. signal must be raised to a 1 before the command takes effect. contents of SLP_CNT are volatile. Table 19. SLP_CNT Register Definition 1 Scale is the weight of each LSB in the lower byte of this register. Table 20. SLP_CNT Bit Descriptions
Figure 30. Bartlett Window FIR Frequency Response the SENS/AVG register are nonvolatile. Table 21. SENS/AVG Register Definition Table 22. SENS/AVG Bit Descriptions The auxiliary DAC provides a 12-bit level adjustment function. offers a rail-to-rail buffered output that has a range of 0 V to 2.5 V . set after every reset and power cycle event. Table 23. AUX_DAC Register Definition Table 24. AUX_DAC Bit Descriptions on the value in the AUX-DAC register. ity of both input (read) and output (write) operations. Bit 8 and Bit 9 of this register. Table 25. GPIO_CTRL Register Definition Table 26. GPIO_CTRL Bit Descriptions The contents of the GPIO_CTRL register are volatile.
along with their appropriate control registers. Table 27. Status and Diagnostic Functions DIO2) as a data-ready indicator signal. Table 28. MSC_CTRL Register Definition Table 29. MSC_CTRL Bit Descriptions
- Start the process by writing a 1 to Bit 10 in the MSC_CTRL
- Check the result by reading Bit 5 of the STATUS register.
indicate which of the six sensors it is associated with. definitions for self-test are listed in Table 28 and Table 29. back to zero, before beginning to increment again. Table 30. ENDURANCE Register Definition
appropriate register access and bit assignment for each flag. output register update cycle. Table 31. STATUS Register Definition Table 32. STATUS Bit Descriptions
- All output data registers are available for monitoring as the source data.
- The source data can be filtered or unfiltered.
- Comparisons can be static or dynamic (rate of change).
- The threshold levels and times are configurable.
- Comparison can be greater than or less than. The ALM_MAG1 register and the ALM_MAG2 register both establish the threshold level for detecting events. These registers take on the format of the source data and provide a bit for establishing the greater than/less than comparison direction. When making dynamic comparisons, the ALM_SMPL1 register and the ALM_SMPL2 register establish the number of averages taken for the source data as a reference for comparison. In this configuration, each subsequent source data sample is subtracted from the previous one, establishing an instantaneous delta. The ALM_CTRL register controls the source data selection, static/ dynamic selection, filtering selection, and digital input/output usage for the alarms. The rate of change calculation is ettings. /ALM_MAG2 ALM_MAG1 toaccording with comparing by determined is alarm change of Rate ) ( ) 1 (1 sM Y n y n yNY CC N nDS C DS − += where: N DS is the number of samples in ALM_SMPL1 and ALM_SMPL2. y(n) is the sampled output data. M C is the magnitude for comparison in ALM_MAG1 and ALM_MAG2. Y C is the factor to compare with MC.
Table 33. ALM_MAG1 and ALM_MAG2 Register Definitions Table 34. ALM_MAG1 and ALM_MAG2 Bit Descriptions Table 35. ALM_SMPL1 and ALM_SMPL2 Register Definitions Table 36. ALM_SMPL1 and ALM_SMPL2 Bit Descriptions Table 37. ALM_CTRL Register Definition Table 38. ALM_CTRL Bit Descriptions
0000 Disable
0001 Power supply output
0010 X-axis gyroscope output
0011 Y-axis gyroscope output
0100 Z-axis gyroscope output
0101 X-axis accelerometer output
0110 Y-axis accelerometer output
0111 Z-axis accelerometer output
1000 X-axis gyroscope temperature output
1001 Y-axis gyroscope temperature output
1010 Z-axis gyroscope temperature output
1011 Auxiliary ADC input
attachment of the body, followed by the electrical connection. normal solder reflow processes. The ADIS16354 is designed for simple mechanical attachment. provides alignment pinholes, one on each side. which is attached to a flexible circuit extension. family. In this case, the part number starts with CLM-112-02. mental stresses, such as temperature cycling and vibration. mating connector are on the same surface (plane). ADIS16354, placing all of the stress on the flexible circuit. and then to remove the mechanical attachment hardware.
2 EACH
Figure 31. Mechanical Attachment
0.500 BSC
DRAWING FOR CLM SERIES SOCKET. HAVE LESS BEND/STRESS RELIEF IN THE FLEX. Figure 32. Hole Locations
14.00 BSC
1.65 BSC
4.162 BSC
Figure 33. 24-Lead Module with Connector Interface
Rev. 0 | Page 26 of 28 NOTES
Rev. 0 | Page 27 of 28 NOTES
Rev. 0 | Page 28 of 28 NOTES ©2008 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D07135-0-1/08(0)