ADIS16300 AD | Alldatasheet
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Four Degrees of Freedom Inertial Sensor ADIS16300 Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
FEATURES
14-bit digital gyroscope with digital range scaling ±75°/sec, ±150°/sec, ±300°/sec settings Tri-axis, 14-bit digital accelerometer ±3 g measurement range 13-bit pitch and roll incline calculations
330 Hz bandwidth
Factory-calibrated sensitivity, bias, and axial alignment Digitally controlled bias calibration Digitally controlled sample rate, up to 819.2 SPS External clock input enables sample rates up to 1200 SPS Digitally controlled filtering Programmable condition monitoring Auxiliary digital input/output Digitally activated self-test Programmable power management Embedded temperature sensor SPI-compatible serial interface Auxiliary, 12-bit ADC input and DAC output Single-supply operation: 4.75 V to 5.25 V 2000 g shock survivability Operating temperature range: −40°C to +85°C
APPLICATIONS
A MEMS ANGULAR RATE SENSOR TEMPERATURE SENSOR SIGNAL CONDITIONING AND CONVERSION CALIBRATION AND DIGITAL PROCESSING DIGITAL CONTROL POWER MANAGEMENT OUTPUT REGISTERS AND SPI INTERFACE UX_ ADC AUX_ DAC RST CS SCLK DIN DOUT TRI-AXIS MEMS ACCELERATION SENSOR VCC GND DIO4 SELF-TEST ADIS16300 ALARMS DIO3DIO2 07842-001DIO1 Figure 1. GENERAL DESCRIPTION The ADIS16300 iSensor® is a complete inertial system that includes a yaw rate gyroscope and tri-axis accelerometer. Each sensor in the ADIS16300 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyro bias). As a result, each sensor has its own dynamic compensation for correction formulas that provide accurate sensor measurements over the specified power supply range of +4.75 V to +5.25 V . The ADIS16300 provides a simple, cost-effective method for integrating accurate, multi-axis, inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. An improved SPI interface and register structure provide faster data collection and configuration control. The ADIS16300, along with a flex interface, drops into current systems that use the ADIS1635x family, providing the opportunity to scale cost for systems that only require four degrees of freedom inertial sensing. This compact module is approximately 23 mm × 31 mm × 7.5 mm and provides a standard connector interface, which enables horizontal or vertical mounting.
Rev. 0 | Page 2 of 16 TABLE OF CONTENTS
REVISION HISTORY
10/08—Revision 0: Initial Version
Rev. 0 | Page 3 of 16 SPECIFICATIONS TA = −40°C to +85°C, VCC = 5.0 V , angular rate = 0°/sec, dynamic range = ±300°/sec, ±1 g, unless otherwise noted. Table 1. Parameter Test Conditions Min Typ Max Unit GYROSCOPE Dynamic Range ±300 ±375 °/sec Initial Sensitivity TA = 25°C, dynamic range = ±300°/sec 0.0495 0.05 0.0505 °/sec/LSB T A = 25°C, dynamic range = ±150°/sec 0.025 °/sec/LSB T A = 25°C, dynamic range = ±75°/sec 0.0125 °/sec/LSB Sensitivity Temperature Coefficient 400 ppm/°C Misalignment Reference to z-axis accelerometer, TA = 25°C 0.1 Degrees Axis-to-frame (package), TA = 25°C ±0.5 Degrees Nonlinearity Best fit straight line 0.1 % of FS Initial Bias Error TA = 25°C, ±1 σ ±3 °/sec In-Run Bias Stability TA = 25°C, 1 σ, SMPL_PRD = 0x01 0.007 °/sec Angular Random Walk TA = 25°C, 1 σ, SMPL_PRD = 0x01 1.9 °/√hr Bias Temperature Coefficient 0.1 °/sec/°C Linear Acceleration Effect on Bias Any axis, 1 σ (MSC_CTRL Bit [7] = 1) 0.05 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.25 °/sec/V Output Noise TA = 25°C, ±300°/sec range, no filtering 1.1 °/sec rms Rate Noise Density TA = 25°C, f = 25 Hz, ±300°/sec, no filtering 0.038 °/sec/√Hz rms 3 dB Bandwidth 330 Hz Sensor Resonant Frequency 14.5 kHz Self-Test Change in Output Response ±300°/sec range setting ±696 ±1400 ±2449 LSB ACCELEROMETERS Each axis Dynamic Range ±3 ±3.6 g Initial Sensitivity 25°C 0.594 0.6 0.606 mg/LSB Sensitivity Temperature Coefficient X axis and Y axis 250 ppm/°C Z axis 300 ppm/°C Misalignment Axis-to-axis, TA = 25°C, Δ = 90° ideal ±0.25 Degrees Axis-to-frame (package), TA = 25°C ±0.5 Degrees Nonlinearity Best fit straight line ±0.3 % of FS Initial Bias Error TA = 25°C, ±1 σ, X axis and Y axis ±60 mg T A = 25°C, ±1 σ, Z axis ±110 mg In-Run Bias Stability TA = 25°C, 1 σ, X axis and Y axis 0.048 mg T A = 25°C, 1 σ, Z axis 0.054 mg Velocity Random Walk TA = 25°C, 1 σ, X axis and Y axis 0.118 m/sec/√hr T A = 25°C, 1 σ, Z axis 0.164 m/sec/√hr Bias Temperature Coefficient X axis and Y axis 2.5 mg/°C Z axis 4.5 mg/°C Output Noise TA = 25°C, no filtering, X axis and Y axis 5 mg rms T A = 25°C, no filtering, Z axis 7.5 mg rms Noise Density TA = 25°C, no filtering, X axis and Y axis 0.2 mg/√Hz rms T A = 25°C, no filtering, Z axis 0.3 mg/√Hz rms 3 dB Bandwidth 330 Hz Sensor Resonant Frequency 5.5 kHz Self-Test Change in Output Response X axis and Y axis 500 1100 1700 LSB Z axis 90 450 860 LSB INCLINOMETER Sensitivity 0.044 °/LSB TEMPERATURE SENSOR Scale Factor TA = 25°C output = 0x0000 0.14 °C/LSB
Rev. 0 | Page 4 of 16 Parameter Conditions Min Typ Max Unit ADC INPUT Resolution 12 Bits Integral Nonlinearity ±2 LSB Differential Nonlinearity ±1 LSB Offset Error ±4 LSB Gain Error ±2 LSB Input Range 0 +3.3 V Input Capacitance During acquisition 20 pF DAC OUTPUT 5 kΩ/100 pF to GND Resolution 12 Bits Relative Accuracy For Code 101 to Code 4095 ±4 LSB Differential Nonlinearity ±1 LSB Offset Error ±5 mV Gain Error ±0.5 % Output Range 0 +3.3 V Output Impedance 2 Ω Output Settling Time 10 μs LOGIC INPUTS1 Input High Voltage, VINH 2.0 V Input Low Voltage, VINL 0.8 V CS signal to wake up from sleep mode 0.55 V CS Wake-Up Pulse Width 20 μs Logic 1 Input Current, IINH V IH = 3.3 V ±0.2 ±10 μA Logic 0 Input Current, IINL V IL = 0 V All Pins Except RST −40 −60 μA RST Pin −1 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS1 Output High Voltage, VOH I SOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL I SINK = 1.6 mA 0.4 V FLASH MEMORY Endurance2 10,000 Cycles Data Retention3 TJ = 85°C 20 Years FUNCTIONAL TIMES4 Time until data is available Power-On Start-up Time Normal mode, SMPL_PRD ≤ 0x09 180 ms Low power mode, SMPL_PRD ≥ 0x0A 245 ms Reset Recovery Time Normal mode, SMPL_PRD ≤ 0x09 55 ms Low power mode, SMPL_PRD ≥ 0x0A 120 ms Sleep Mode Recovery Time 2.5 ms Flash Memory Test Time Normal mode, SMPL_PRD ≤ 0x09 17 ms Low power mode, SMPL_PRD ≥ 0x0A 90 ms Automatic Self-Test Time 12 ms CONVERSION RATE SMPL_PRD = 0x01 to 0xFF 0.413 819.2 SPS Clock Accuracy ±3 % Sync Input Clock 1.2 kHz POWER SUPPLY Operating voltage range, VCC 4.75 5.0 5.25 V Power Supply Current Low power mode at 25°C 18 mA Normal mode at 25°C 42 mA Sleep mode at 25°C 500 μA 1 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 2 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 3 The retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature. 4 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may impact overall accuracy.
1 Extended exposure to temperatures outside the specified temperature
2 Although the device is capable of withstanding short-term exposure to
150°C, long-term exposure threatens internal mechanical integrity. Table 4. Package Characteristics
1 DIO3
- CONNECTOR PINS ARE NOT VISIBLE FROM THE TOP VIEW.
- THIS REPRESENTATION DISPLAYS THE TOP VIEW PINOUT
FOR THE MATING SOCKET CONNECTOR. Figure 5. Pin Configuration ADIS16300 MATING CONNECTOR INCLUDED. Figure 6. Device Orientation, Mounting, and Interface Diagrams Table 5. Pin Function Descriptions 1 DIO3 I/O Configurable Digital Input/Output. 2 DIO4/CLKIN I/O Configurable Digital Input/Output or Sync Clock Input. 4 DOUT O SPI Data Output. Clocks output on SCLK falling edge. 5 DIN I SPI Data Input. Clocks input on SCLK rising edge. 7 DIO1 I/O Configurable Digital Input/Output. 9 DIO2 I/O Configurable Digital Input/Output. 10, 11, 12 VCC S Power Supply. 13, 14, 15 GND S Power Ground. 20 AUX_DAC O Auxiliary, 12-Bit DAC Output. 21 AUX_ADC I Auxiliary, 12-Bit ADC Input. 1 S is supply, O is output, I is input, N/A is not applicable.
matically updates the flash memory (50 ms). See Table 12. tion for the data ready function (see Table 17). 0x3E00) starts the burst mode read sequence. Table 12. GLOB_CMD Table 13. SMPL_PRD an internal sample period of 6.7 ms (sample rate = 149 SPS). ization can help determine performance trade-offs. seconds, as an example of the programmable sleep time option. Table 14. SLP_CNT establish a 129-tap setting. Figure 15. Bartlett Window FIR Frequency Response
(DIN = 0xB902) for a measurement range to ±150°/sec. Table 15. SENS_AVG DIO3 and DIO4 as outputs, with DIO3 set low and DIO4 set high. Table 16. GPIO_CTRL Table 17. MSC_CTRL both bytes to take effect at the same time. Table 18. AUX_DAC Table 19. Setting AUX_DAC = 1V
Table 20. Manual Self-Test Example Sequence 0xB802 SENS_AVG[7:0] = 0x02, 4-tap averaging filter. 0xB502 MSC_CTRL[9] = 1, gyroscope negative self-test. load into the DIAG_STAT[6] register. Table 21. DIAG_STAT Bit Descriptions trigger threshold and polarity configurations. Table 25 gives an example of how to configure a static alarm. the sample period time, established by the SMPL_PRD register.
Table 22. ALM_MAG1, ALM_MAG2 Table 23. ALM_SMPL1, ALM_SMPL2 Table 24. ALM_CTRL Bit Designations
0000 Disable
0001 Power supply output
0010 Gyroscope output
0011 Not used
0100 Not used
0101 X-axis accelerometer output
0110 Y-axis accelerometer output
0111 Z-axis accelerometer output
1000 Gyroscopes temperature output
1001 X-axis inclinometer output
1010 Y- axis inclinometer output
1011 Auxiliary ADC input
1 Incline outputs always use filtered data in this comparison. Table 25. Alarm Configuration Example 1 Static level comparison, filtered data. DIO2 output indicator, positive polarity. Alarm 1 is true if XACCL_OUT > 0.5 g. Alarm 2 is true if XACCL_OUT < −0.5 g. Table 26. Alarm Configuration Example 2 Rate of change comparison, unfiltered data. DIO2 output indicator, positive polarity. Alarm 1 rate of change period = 9.77 ms. Alarm 2 rate of change period = 97.7 ms. Alarm 1 is true if XACCL_OUT > 0.5 g. Alarm 2 is true if XACCL_OUT < −0.5 g.
2.20 THRU HOLE
1.27 BSC
Figure 16. 24-Lead Module with Connector Interface registered trademarks are the prop erty of their respective owners.