ADIS16060 AD | Alldatasheet
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Technical content
Yaw Rate Gyroscope with SPI ADIS16060 Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
FEATURES
Complete angular rate digital gyroscope 14-bit resolution Scalable measurement range Initial range: ±80°/sec (typical) Increase range with external resistor Z-axis (yaw rate) response SPI digital output interface High vibration rejection over wide frequency 2000 g-powered shock survivability 1 kHz bandwidth Selectable using external capacitor Externally controlled self-test Internal temperature sensor output Dual auxiliary 14-bit ADC inputs Absolute rate output for precision applications
5 V single-supply operation
8.2 mm × 8.2 mm × 5.2 mm package −40°C to +105°C operation RoHS compliant
APPLICATIONS
The ADIS16060 is a yaw rate gyroscope with an integrated serial peripheral interface (SPI). It features an externally selectable bandwidth response and scalable dynamic range. The SPI port provides access to the rate sensor, an internal temperature sensor, and two external analog signals (using internal ADC). The digital data available at the SPI port is proportional to the angular rate about the axis that is normal to the top surface of the package. An additional output pin provides a precision voltage reference. A digital self-test function electromechanically excites the sensor to test the operation of the sensor and the signal-conditioning circuits. The ADIS16060 is available in an 8.2 mm × 8.2 mm × 5.2 mm, 16-terminal, peripheral land grid array (LGA) package. FUNCTIONAL BLOCK DIAGRAM RATE SENSOR SCLK VCCFILT RATE GND ADIS16060 DIN DOUT MSEL1 MUX MSEL2 14-BIT ADC DIGITAL CONTROL AIN1 AIN2 TEMPERATURE SENSOR 07103-001 Figure 1.
Rev. 0 | Page 2 of 12 TABLE OF CONTENTS
REVISION HISTORY
1/08—Revision 0: Initial Version
Rev. 0 | Page 3 of 12 SPECIFICATIONS TA = 25°C, VCC = 5 V , angular rate = 0°/sec, COUT = 0.01 μF, ±1 g, unless otherwise noted. Table 1. Parameter Conditions Min1 Typ Max Unit SENSITIVITY Dynamic Range2 Full-scale range over specifications range ±50 ±80 °/sec Initial Clockwise rotation is positive output, TA = −40°C to +85°C 0.0110 0.0122 0.0134 °/sec/LSB Change Over Temperature3 VCC = 4.75 V to 5.25 V ±3 % Nonlinearity Best fit straight line 0.1 °/sec NULL Initial Nominal 0°/sec output is 8192 LSB −44 +44 °/sec Change Over Temperature3 VCC = 4.75 V to 5.25 V ±0.11 °/sec/°C Turn-On Time Power on to ±0.5°/sec of final value 10 ms Linear Acceleration Effect Any axis ±0.1 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V ±0.5 °/sec/V NOISE PERFORMANCE Rate Noise Density @ 25°C 0.04 °/sec/√Hz FREQUENCY RESPONSE 3 dB Bandwidth (User-Selectable)4 COUT = 0 μF 1 1000 Hz Sensor Resonant Frequency 14.5 kHz SELF-TEST RESPONSE Positive Self-Test5 See Table 5 +6226 LSB Negative Self-Test5 See Table 5 −6226 LSB TEMPERATURE SENSOR Reading at 298 K 7700 8192 8684 LSB Scale Factor Proportional to absolute temperature 0.034 K/LSB LOGIC INPUTS Input High Voltage, VINH 0.7 × VCC V Input Low Voltage, VINL 0.8 V Input Current, IIN Typically 10 nA −1 +1 μA Input Capacitance, CIN (DIN) 8 pF Input Capacitance, CIN (MSEL1, MSEL2 ) 5 pF ANALOG INPUTS For VIN < VCC Resolution 14 Bits Integral Nonlinearity Best fit straight line −6 +6 LSB Differential Nonlinearity No missing codes to 13 bits −1 +6 LSB Offset Error −10 +10 mV Offset Error Temperature Drift ±0.3 ppm/°C Gain Error −40 +40 mV Gain Error Temperature Drift ±0.3 ppm/°C Input Voltage Range 0 VCC V Leakage Current 1 nA DIGITAL OUTPUTS Output High Voltage, VOH ISOURCE = 500 μA VCC − 0.3 V Output Low Voltage, VOL ISINK = 500 μA 0.4 V CONVERSION RATE Conversion Time 10 μs Throughput Rate 100 kSPS
Rev. 0 | Page 4 of 12 Parameter Conditions Min 1 Typ Max Unit POWER SUPPLY All at TA = −40°C to +85°C VCC 4.75 5 5.25 V VCC Quiescent Supply Current VCC @ 5 V, 50 kSPS sample rate 4.3 6.5 mA Power Dissipation VCC @ 5 V, 50 kSPS sample rate 22 33 mW TEMPERATURE RANGE Operation −40 +105 °C 1 All minimum and maximum specifications are guaranteed. Typical specifications are neither tested nor guaranteed. 2 Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V supply. 3 Defined as the output change from ambient to maximum temperature, or ambient to minimum temperature. 4 Frequency at which the response is 3 dB down from dc response. Bandwidth = 1/(2 × π × 200 kΩ × COUT). For COUT = 0.01 μF, bandwidth = 80 Hz. 5 Self-test response varies with temperature.
Rev. 0 | Page 6 of 12 ABSOLUTE MAXIMUM RATINGS Table 3. Parameter Rating Acceleration (Any Axis, Unpowered, 0.5 ms) 2000 g Acceleration (Any Axis, Powered, 0.5 ms) 2000 g VCC to GND −0.3 V to +6.0 V VCC to GND −0.3 V to VCC + 0.3 V Analog Input Voltage to GND −0.3 V to VCC + 0.3 V Digital Input Voltage to GND −0.3 V to +7.0 V Digital Output Voltage to GND −0.3 V to VCC + 0.3 V Operating Temperature Range −40°C to +105°C Storage Temperature Range −65°C to +150°C Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Drops onto hard surfaces can cause shocks of greater than 2000 g and exceed the absolute maximum rating of the device. Care should be exercised in handling the device to avoid damage. ESD CAUTION
- THIS IS NOT AN ACTUAL “TOP VIEW,” AS THE PINS ARE NOT VISIBLE FROM THE
PROVIDED FOR PCB LAYOUT PURPOSES.
0.6700 BSC
3.6865 BSC
0.5000 BSC
1.000 BSC
5.010 BSC
7.373 BSC
Figure 4. Pin Configuration Figure 5. Second-Level Assembly Pad Layout Table 4. Pin Function Descriptions 5 RATE O Buffered Analog Output. Represents the angular rate signal. 6 FILT I External Capacitor Connection to Control Bandwidth. 8 AIN1 I External Analog Input Channel 1. 9 AIN2 I External Analog Input Channel 2. 15 MSEL2 I SPI, Mode Select 2. Used for data input functions. 16 MSEL1 I SPI, Mode Select 1. Used for data output functions. 1 I = input; O = output; S = power supply.
SPI handles all digital I/O communication in the ADIS16060. line is used when configuring the sensor (DIN). the necessary timing details for the input configuration sequence. considerations for reading output data. assumed), resulting in a digital rate output of 6552 codes. preparation for the next conversion cycle. Table 5. DIN Configuration Bit Assignments
0.873 BSC
0.797 BSC
Figure 15. 16-Terminal Stacked Land Grid Array [LGA] registered trademarks are the property of their respective owners.