AD590 RENESAS | Alldatasheet
Document overview
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Technical content
Features
- Two-Terminal Device Voltage In/Current Out
- Sensor Isolation From Case
- Low Cost
Description
The AD590 is an integrated-c ircuit temperature transducer which produces an output current proportional to absolute temperature. The device acts as a high impedance constant current regulator, passing 1A/ oK for supply voltages between +4V and +30V. Laser trimming of the chip's thin film resistors is used to calibrate the device to 298.2 A output at 298.2 oK (25oC). The AD590 should be used in any temperature-sensing application between -55 oC to 150 oC in which conventional electrical temperature sensors are currently employed. The inherent low cost of a monolithic integrated circuit combined with the elimination of support circuitry makes the AD590 an attractive alternative for many temperature measurement situations. Linearization ci rcuitry, precision voltage amplifiers, resistance measuring circuitry and cold junction compensation are not needed in applying the AD590. In the simplest application, a resistor, a power source and any voltmeter can be used to measure temperature. In addition to temperature measurement, applications include temperature compensation or correction of discrete components, and biasing proportional to absolute temperature. The AD590 is particularly useful in remote sensing applications. The device is insensitive to voltage drops over long lines due to its high-impedance current output. Any well insulated twisted pair is suffic ient for operation hundreds of feet from the receiving circui try. The output characteristics also make the AD590 easy to multiplex: the current can be switched by a CMOS multiplexe r or the supply voltage can be switched by a logic gate output.
Ordering Information
(oC) TEMP. RANGE (oC) PACKAGE PKG. NO. AD590JH 1.5 -55× to 150× 3 Ld Metal Can (TO-52) T3.A Pinout AD590 (METAL CAN) Functional Diagram CASE + Q1 Q2 Q3 Q7 Q8 Q9 Q10 Q11 Q12 R1 260 R2 1040 C1 26pF R3 5k R4 11k R6 820 R5 146 118 CHIP SUBSTRATE NOT RECOMMENDED FOR NEW DESIGNS NO RECOMMENDED REPLACEMENT Call Central Applications 1-888-INTERSIL or email: centapp@intersil.com
FN3171 Rev.3.00 Page 2 of 10 January 2002 Absolute Maximum Ratings TA = 25oC Thermal Information Rated Performance Temperature Range TO-52 . -55×oC to 150×oC Operating Conditions Thermal Resistance (Typical, Note 1) JA (oC/W) JC (oC/W) CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress o nly rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. JA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications Typical Values at TA = 25C, V+ = 5V, Unless Otherwise Specified PARAMETER TEST CONDITIONS AD590I AD590J UNITS Nominal Output Current at 25oC (298.2oK) 298.2 298.2 A Nominal Temperature Coefficient 1.0 1.0 A/oK Calibration Error at 25oC Notes 1, 5 10.0 Max 5.0 Max oC Absolute Error -55× oC to 150×oC, Note 7 Without External Calibration Adjustment 20.0 Max 10.0 Max oC With External Calibration Adjustment 5.8 Max 3.0 Max oC Non-Linearity Note 6 3.0 Max 1.5 Max oC Repeatability Notes 2, 6 0.1 Max 0.1 Max oC Long Term Drift Notes 3, 6 0.1 Max 0.1 Max oC/Month Current Noise 40 40 pA Hz Power Supply Rejection Case Isolation to Either Lead 10 10 1010 Effective Shunt Capacitance 100 100 pF Electrical Turn-On Time Note 1 20 20 s Reverse Bias Leakage Current Note 4 10 10 pA Power Supply Range +4 to +30 +4 to +30 V NOTES: 2. Does not include self heating effects. 3. Maximum deviation between 25 oC reading after temperature cycling between -55oC and 150oC. 4. Conditions constant +5V, constant 125 oC. 5. Leakage current doubles every 10 oC. 6. Mechanical strain on package ma y disturb calibration of device. 7. Guaranteed but not tested. 8. -55 oC Guaranteed by testing at 25oC and 150oC.
FN3171 Rev.3.00 Page 5 of 10 January 2002 NOTES 1. Maximum errors over all ranges are guaranteed based on the known behavior characteristic of the AD590. 2. For one-trim accuracy specifications, the 205oC span is assumed to be trimmed at 25 oC; for all other spans, it is assumed that the device is trimmed at the midpoint. 3. For the 205 oC span, it is assumed that the two-trim temperatures are in the vicinity of 0 oC and 140 oC; for all other spans, the specified trims are at the endpoints. 4. In precision applications, the actual errors encountered are usually dependent upon sources of error which are often overlooked in error budgets. These typically include: a. Trim error in the calibration technique used b. Repeatability error c. Long term drift errors Trim Error is usually the largest error source. This error arises from such causes as poor thermal coupling between the device to be calibrated and the reference sensor; reference sensor errors; lack of adequate time for the device being calibrated to settle to the fina l temperature; radically different thermal resistances between t he case and the surroundings (RCA) when trimming and when applying the device. Repeatability Errors arise from a strain hysteresis of the package. The magnitude of this error is solely a function of the magnitude of the temp erature span over which the device is used. For example, thermal shocks between 0 oC and 100 oC involve extremely low hysteresis and result in repeatability errors of less than 0.05oC. When the thermal-shock excursion is widened to -55 oC to 150 oC, the device will typically exhibit a repeatability error of 0.05oC ( 0.10 guaranteed maximum). Long Term Drift Errors are related to the average operating temperature and the magnitu de of the thermal-shocks experienced by the device. Extended use of the AD590 at temperatures above 100 oC typically results in long-term drift of 0.03oC per month; the guaranteed maximum is 0.10oC per month. Continuous operation at temperatures below 100 oC induces no measurable drifts in the device. Besides the effects of operating temperature, th e severity of thermal shocks incurred will also affect absol ute stability. Fo r thermal-shock excursions less than 100 oC, the drift is difficult to measure (<0.03oC). However, for 200 oC excursions, the device may drift by as much as 0.10oC after twenty such shocks. If severe, quick shocks are necessary in the application of the device, realistic simulated life tests are recommended for a thorough evaluation of the error introduced by such shocks. J Grade Maximum Errors (oC) NUMBER OF TRIMS TEMPERATURE SPAN (oC) LOWEST TEMPERATURE IN SPAN (×oC) -55 -25 0 25 50 75 100 125 Two 10 0.1 (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) 0.1 Two 25 0.2 0.1 (Note 10) (Note 10) (Note 10) (Note 10) 0.1 0.2 NOTE: 10. Less than 0.05 oC.
needed). A six-bit digital word will select one of 64 sensors. FIGURE 17. MULTIPLEXING SENSORS
FN3171 Rev.3.00 Page 10 of 10 January 2002 AD590 Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/en/support/qualandreliability.html Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com For additional products, see www.intersil.com/en/products.html © Copyright Intersil Americas LLC 2002. All Rights Reserved. All trademarks and registered trademarks are the property of their respective owners. Die Characteristics DIE DIMENSIONS: 37 mils x 58 mils x 14 mils 1 mil METALLIZATION: Type: Aluminum 100% Thickness: 15kÅ 1kÅ PASSIVATION: Type: PSG/Nitride PSG Thickness: 7kÅ 1.4kÅ Nitride Thickness: 8kÅ 1.2kÅ Metallization Mask Layout AD590