AD590 INTERSIL | Alldatasheet

Document overview

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Technical content

Features

  • Two-Terminal Device Voltage In/Current Out
  • Sensor Isolation From Case
  • Low Cost

Description

The AD590 is an integrated-circuit temperature transducer which produces an output current proportional to absolute tem- perature. The device acts as a high impedance constant current regulator, passing 1µA/ oK for supply voltages between +4V and +30V. Laser trimming of the chip's thin film resistors is used to calibrate the device to 298.2µA output at 298.2 oK (25oC). The AD590 should be used in any temperature-sensing application between -55oC to 150oC in which conventional electrical temperature sensors are currently employed. The inherent low cost of a monolithic integrated circuit combined with the elimination of support circuitry makes the AD590 an attractive alternative for many temperature measurement sit- uations. Linearization circuitry, precision voltage amplifiers, resistance measuring circuitry and cold junction compensa- tion are not needed in applying the AD590. In the simplest application, a resistor, a power source and any voltmeter can be used to measure temperature. In addition to temperature measurement, applications include temperature compensation or correction of discrete components, and biasing proportional to absolute temperature. The AD590 is particularly useful in remote sensing applica- tions. The device is insensitive to voltage drops over long lines due to its high-impedance current output. Any well insulated twisted pair is sufficient for operation hundreds of feet from the receiving circuitry. The output characteristics also make the AD590 easy to multiplex: the current can be switched by a CMOS multiplexer or the supply voltage can be switched by a logic gate output.

Ordering Information

(oC) TEMP. RANGE (oC) PACKAGE PKG. NO. AD590IH ±3.0 -55 to 150 3 Ld Metal Can (TO-52) T3.A AD590JH ±1.5 -55 to 150 3 Ld Metal Can (TO-52) T3.A Pinout AD590 (METAL CAN) Functional Diagram CASE + Q1 Q2 Q3 Q7 Q8 Q9 Q10 Q11 Q12 R1 260Ω R2 1040Ω C1 26pF R3 5kΩ R4 11kΩ R6 820Ω R5 146Ω 118 CHIP SUBSTRATE File Number 3171.1CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207| Copyright © Intersil Corporation 1999

Absolute Maximum Ratings TA = 25oC Thermal Information Rated Performance Temperature Range TO-52. . . . -55 oC to 150oC Operating Conditions Thermal Resistance (Typical, Note 1)θJA (oC/W) θJC (oC/W) CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. θJA is measured with the component mounted on an evaluation PC board in free air. Electrical SpecificationsTypical Values at TA = 25οC, V+ = 5V, Unless Otherwise Specified PARAMETER TEST CONDITIONS AD590I AD590J UNITS Nominal Output Current at 2oC (298.2oK) 298.2 298.2 µA Nominal Temperature Coefficient 1.0 1.0 µA/oK Calibration Error at 25oC Notes 1, 5 ±10.0 Max ±5.0 Max oC Absolute Error -55 oC to 150oC, Note 7 Without External Calibration Adjustment ±20.0 Max ±10.0 Max oC With External Calibration Adjustment ±5.8 Max ±3.0 Max oC Non-Linearity Note 6 ±3.0 Max ±1.5 Max oC Repeatability Notes 2, 6 ±0.1 Max ±0.1 Max oC Long Term Drift Notes 3, 6 ±0.1 Max ±0.1 Max oC/Month Current Noise 40 40 pA /√Hz Power Supply Rejection Case Isolation to Either Lead 10 10 1010 Ω Effective Shunt Capacitance 100 100 pF Electrical Turn-On Time Note 1 20 20 µs Reverse Bias Leakage Current Note 4 10 10 pA Power Supply Range +4 to +30 +4 to +30 V NOTES: 2. Does not include self heating effects. 3. Maximum deviation between 25 oC reading after temperature cycling between -55oC and 150oC. 4. Conditions constant +5V, constant 125oC. 5. Leakage current doubles every 10oC. 6. Mechanical strain on package may disturb calibration of device. 7. Guaranteed but not tested. 8. -55 oC Guaranteed by testing at 25oC and 150oC. AD590

  1. Maximum errors over all ranges are guaranteed based on the known behavior characteristic of the AD590. 2. For one-trim accuracy specifications, the 205oC span is assumed to be trimmed at 25oC; for all other spans, it is assumed that the device is trimmed at the midpoint. 3. For the 205oC span, it is assumed that the two-trim temperatures are in the vicinity of 0oC and 140oC; for all other spans, the specified trims are at the endpoints. 4. In precision applications, the actual errors encountered are usually dependent upon sources of error which are often overlooked in error budgets. These typically include: a. Trim error in the calibration technique used b. Repeatability error c. Long term drift errors Trim Error is usually the largest error source. This error arises from such causes as poor thermal coupling between the device to be calibrated and the reference sensor; refer- ence sensor errors; lack of adequate time for the device being calibrated to settle to the final temperature; radically different thermal resistances between the case and the sur- roundings (Rθ CA ) when trimming and when applying the device. Repeatability Errors arise from a strain hysteresis of the package. The magnitude of this error is solely a function of the magnitude of the temperature span over which the device is used. For example, thermal shocks between 0 oC and 100oC involve extremely low hysteresis and result in repeatability errors of less than±0.05oC. When the thermal- shock excursion is widened to -55oC to 150oC, the device will typIcally exhibit a repeatability error of±0.05oC (±0.10 guaranteed maximum). Long Term Drift Errors are related to the average operating temperature and the magnitude of the thermal-shocks experienced by the device. Extended use of the AD590 at temperatures above 100 oC typically results in long-term drift of±0.03oC per month; the guaranteed maximum is ±0.10oC per month. Continuous operation at temperatures below 100 oC induces no measurable drifts in the device. Besides the effects of operating temperature, the severity of thermal shocks incurred will also affect absolute stability. For thermal-shock excursions less than 100 oC, the drift is diffi- cult to measure (<0.03oC). However, for 200oC excursions, the device may drift by as much as±0.10oC after twenty such shocks. If severe, quick shocks are necessary in the application of the device, realistic simulated life tests are rec- ommended for a thorough evaluation of the error introduced by such shocks. J Grade Maximum Errors (oC) NUMBER OF TRIMS TEMPERATURE SPAN (oC) LOWEST TEMPERATURE IN SPAN ( oC) -55 -25 0 25 50 75 100 125 O n e 1 5 0 2 . 5 2 . 4 2 . 5 ----- Two 10 0.1 (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) 0.1 Two 25 0.2 0.1 (Note 10) (Note 10) (Note 10) (Note 10) 0.1 0.2 T w o 1 5 0 1 . 0 0 . 7 1 . 2 ----- NOTE: 10. Less than±0.05 oC. AD590

FIGURE 17. MULTIPLEXING SENSORS

DIE DIMENSIONS: 37 mils x 58 mils x 14 mils±1 mil METALLIZATION: Type: Aluminum 100% Thickness: 15kÅ ±1kÅ PASSIVATION: Type: PSG/Nitride PSG Thickness: 7kÅ ±1.4kÅ Nitride Thickness: 8kÅ ±1.2kÅ Metallization Mask Layout AD590 AD590 All Intersil semiconductor products are manufactured, assembled and tested underISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web sitehttp://www.intersil.com