74F74 FAIRCHILD | Alldatasheet
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© 2000 Fairchild Semiconductor Corporation DS009469 www.fairchildsemi.com April 1988 Revised September 2000 74F74 Dual D-Type Positive Edge-Triggered Flip-Flop 74F74 Dual D-Type Positive Edge-Triggered Flip-Flop General Description The F74 is a dual D-type flip-flop with Direct Clear and Set inputs and complementary (Q, Q) outputs. Information at the input is transferred to the outputs on the positive edge of the clock pulse. Clock triggering occurs at a voltage level of the clock pulse and is not directly related to the transition time of the positive-going pulse. After the Clock Pulse input threshold voltage has been passed, the Data input is locked out and information present will not be transferred to the outputs until the next rising edge of the Clock Pulse input. Asynchronous Inputs: LOW input to S D sets Q to HIGH level LOW input to CD sets Q to LOW level Clear and Set are independent of clock Simultaneous LOW on CD and SD makes both Q and Q HIGH Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F74SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F74SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F74PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
www.fairchildsemi.com 2 74F74 Unit Loading/Fan Out Truth Table H (h) = HIGH Voltage Level L (l) = LOW Voltage Level X = Immaterial Q 0 = Previous Q (Q) before LOW-to-HIGH Clock Transition Lower case letters indicate the state of the referenced input or output one setup time prior to the LOW-to-HIGH clock transition. Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Pin Names Description U.L. Input I IH/IIL HIGH/LOW Output I OH /IOL D 1, D2 Data Inputs 1.0/1.0 20 µA/−0.6 mA CP 1, CP2 Clock Pulse Inputs (Active Rising Edge) 1.0/1.0 20 µA/−0.6 mA C D1 , CD2 Direct Clear Inputs (Active LOW) 1.0/3.0 20 µA/−1.8 mA SD1 , SD2 Direct Set Inputs (Active LOW) 1.0/3.0 20 µA/−1.8 mA Q 1, Q1, Q2, Q2 Outputs 50/33.3 −1 mA/20 mA Inputs Outputs SD C D CP D Q Q LHX X HL HLX X LH LLX X H H HH /c17 hH L HH /c17 lLH HHL X Q 0 Q 0
3 www.fairchildsemi.com 74F74 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) ESD Last Passing Voltage (Min) 4000V Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 VM i n IOH = −1 mA Voltage 5% V CC 2.7 I OH = −1 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 20 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max VIN = 0.5V (D, CP) −1.8 V IN = 0.5V (CD , SD ) IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V ICC Power Supply Current 10.5 16.0 mA Max
www.fairchildsemi.com 4 74F74 AC Operating Requirements Symbol Parameter TA = +25°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF Min Typ Max Min Max fMAX Maximum Clock Frequency 100 125 100 MHz ns ns Symbol Parameter TA = +25°CT A = 0°C to +70°C UnitsVCC = +5.0V V CC = +5.0V Min Max Min Max tS(H) Setup Time, HIGH or LOW 2.0 2.0 ns tS(L) D n to CPn 3.0 3.0 tH (H) Hold Time, HIGH or LOW 1.0 1.0 tH (L) D n to CPn 1.0 1.0 tW (H) CP n Pulse Width 4.0 4.0 ns tW (L) HIGH or LOW 5.0 5.0 tW (L) C Dn or SDn Pulse Width 4.0 4.0 ns LOW tREC Recovery Time 2.0 2.0 ns C Dn or SDn to CP
5 www.fairchildsemi.com 74F74 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A
www.fairchildsemi.com 6 74F74 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D
7 www.fairchildsemi.com 74F74 Dual D-Type Positive Edge-Triggered Flip-Flop Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD ’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com