74F676 FAIRCHILD | Alldatasheet

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■ 16-bit parallel-to-serial conversion ■ 16-bit serial-in, serial-out ■ Chip select control ■ Slim 24 lead 300 mil package Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F676SC M24B 28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74F676PC N24A 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.600 Wide 74F676SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide

www.fairchildsemi.com 2 74F676 Unit Loading/Fan Out Functional Description The 16-bit shift register operates in one of three modes, as indicated in the Shift Register Operations Table. HOLD— a HIGH signal on the Chip Select (CS) input pre- vents clocking, and data is stored in the sixteen registers. Shift/Serial Load— data present on the SI pin shifts into the register on the falling edge of CP. Data enters the Q0 position and shifts toward Q15 on successive clocks, finally appearing on the SO pin. Parallel Load— data present on P0–P15 are entered into the register on the falling edge of CP. The SO output repre- sents the Q15 register output. To prevent false clocking, CP must be LOW during a LOW- to-HIGH transition of CS. Shift Register Operations Table H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial /c16 = HIGH-to-LOW Transition Block Diagram Pin Names Description U.L. Input IIH/IIL HIGH/LOW Output IOH /IOL P0–P15 Parallel Data Inputs 1.0/1.0 20 µA/−0.6 mA CS Chip Select Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA CP Clock Pulse Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA M Mode Select Input 1.0/1.0 20 µA/−0.6 mA SI Serial Data Input 1.0/1.0 20 µA/−0.6 mA SO Serial Output 50/33.3 −1 mA/20 mA Control Input Operating Mode CS MC P HXX H o l d LL /c16 Shift/Serial Load LH /c16 Parallel Load

3 www.fairchildsemi.com 74F676 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 VM i n IOH = −1 mA Voltage 5% V CC 2.7 I OH = −1 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 20 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA, Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV, Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max V IN = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V ICC Power Supply Current 72 mA Max

www.fairchildsemi.com 4 74F676 AC Operating Requirements Symbol Parameter TA = +25°CT A = −55°C to 125°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF C L = 50 pF Min Typ Max Min Max Min Max fMAX Maximum Clock Frequency 100 110 45 90 MHz Symbol Parameter TA = +25°CT A = −55°C to 125°CT A , VCC = ____ UnitsVCC = +5.0V V CC = +5.0V V CC = +5.0V Min Max Min Max Min Max tS(H) Setup Time, HIGH or LOW 4.0 4.0 4.0 tS(L) SI to CP 4.0 4.0 4.0 ns tH (H) Hold Time, HIGH or LOW 4.0 4.0 4.0 tH (L) SI to CP 4.0 4.0 4.0 tS(H) Setup Time, HIGH or LOW 3.0 3.0 3.0 tS(L) Pn to CP 3.0 3.0 3.0 ns tH (H) Hold Time, HIGH or LOW 4.0 4.0 4.0 tH (L) Pn to CP 4.0 4.0 4.0 tS(H) Setup Time, HIGH or LOW 8.0 8.0 8.0 tS(L) M to CP 8.0 8.0 8.0 ns tH (H) Hold Time, HIGH or LOW 2.0 2.0 2.0 tH (L) M to CP 2.0 2.0 2.0 tS(L) Setup Time, LOW 10.0 12.0 10.0 CS to CP ns tH (H) Hold Time, HIGH 10.0 10.0 10.0 CS to CP tW (H) CP Pulse Width 4.0 5.0 4.0 ns tW (L) HIGH or LOW 6.0 9.0 6.0

5 www.fairchildsemi.com 74F676 Physical Dimensions inches (millimeters) unless otherwise noted 28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.600 Wide Package Number N24A

www.fairchildsemi.com 6 74F676 16-Bit Serial/Parallel-In, Serial-Out Shift Register Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com