74F537

74F537 FAIRCHILD | Alldatasheet

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© 1999 Fairchild Semiconductor Corporation DS009550 www.fairchildsemi.com April 1988 Revised August 1999 74F537 1-of-10 Decoder with 3-STATE Outputs 74F537 1-of-10 Decoder with 3-STATE Outputs General Description The 74F537 is one-of-ten decoder/demultiplexer with four active HIGH BCD inputs and ten mutually exclusive out- puts. A polarity control input determines whether the out- puts are active LOW or active HIGH. The 74F537 has 3- STATE outputs, and a HIGH signal on the Output Enable (OE ) input forces all outputs to the high impedance state. Two input enables, active HIGH E2 and active LOW E1, are available for demultiplexing data to the selected output in either non-inverted or inverted form. Input codes greater than BCD nine cause all outputs to go to the inactive state (i.e., same polarity as the P input). Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F537SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74F537PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

www.fairchildsemi.com 2 74F537 Unit Loading/Fan Out Truth Table H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance Pin Names Description U.L. Input I IH/IIL HIGH/LOW Output I OH /IOL A0–A3 Address Inputs 1.0/1.0 20 µA/−0.6 mA E1 Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA E2 Enable Input (Active HIGH) 1.0/1.0 20 µA/−0.6 mA OE Output Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA P Polarity Control Input 1.0/1.0 20 µA/−0.6 mA O 0–O 9 3-STATE Outputs 150/40 (33.3) −3 mA/24 mA (20 mA) Function Inputs Outputs OE E1 E2 A 3 A 2 A 1 A 0 O 0 O 1 O 2 O 3 O 4 O 5 O 6 O 7 O 8 O 9 H i g h I m p e d a n c e HXXXXXX ZZZZZZZZZZ D i s a b l e LHXXXXX Outputs Equal P InputLXLXXXX A c t i v e H I G H LLHLLLLHLLLLLLLLL O u t p u t LLHLLLHLHLLLLLLLL (P = L ) LLHLLHLLLHLLLLLLL LLHLLH HLLLHLLLLLL LLHLHLLLLLLHLLLLL LLHLHLHLLLLLHLLLL LLHLH HLLLLLLLHLLL LLHLH H HLLLLLLLHLL LLH HLLLLLLLLLLLHL LLH HLLHLLLLLLLLLH LLH HX HXLLLLLLLLLL LLH H HXXLLLLLLLLLL A c t i v e L O W LLHLLLLL HHHHHHHHH O u t p u t L LHL L LHHLHHHHHHHH (P = H ) L LHL LHLHHLHHHHHHH L LHL LHHHHHLHHHHHH L LHLHL LHHHHLHHHHH L LHLHLHHHHHHLHHHH L LHLHHLHHHHHHLHHH L LHLHHHHHHHHHHLHH L LHHL L LHHHHHHHHLH L LHHL LHHHHHHHHHHL L LHHXHXHHHHHHHHHH L LHHHXXHHHHHHHHHH

3 www.fairchildsemi.com 74F537 Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.

www.fairchildsemi.com 4 74F537 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 VM i n IOH = −1 mA Voltage 10% V CC 2.4 I OH = −3 mA 5% V CC 2.7 I OH = −1 mA 5% V CC 2.7 I OH = −3 mA VOL Output LOW Voltage 10% V CC 0.5 V Min I OL = 24 mA IIH Input HIGH Current 5.0 µAM a x V IN = 2.7V IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max V IN = 0.5V IOZH Output Leakage Current 50 µAM a x V OUT = 2.7V IOZL Output Leakage Current −50 µAM a x V OUT = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V IZZ Bus Drainage Test 500 µA0 . 0 V V OUT = 5.25V ICCH Power Supply Current 56 mA Max V O = HIGH ICCZ Power Supply Current 44 66 mA Max V O = HIGH Z

5 www.fairchildsemi.com 74F537 Symbol Parameter TA = +25°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF Min Typ Max Min Max ns ns ns

www.fairchildsemi.com 6 74F537 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M20B

7 www.fairchildsemi.com 74F537 1-of-10 Decoder with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N20A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com